CN115839957A - Method, device and equipment for detecting interlayer defect of display module and storage medium - Google Patents
Method, device and equipment for detecting interlayer defect of display module and storage medium Download PDFInfo
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Abstract
The invention discloses a method, a device, equipment and a medium for detecting interlayer defects of a display module, wherein the method comprises the following steps: acquiring at least 2 images to be detected of a display module to be detected through at least 2 camera devices, wherein the at least 2 camera devices are arranged on the same horizontal line relative to the display module to be detected; carrying out defect detection on at least 2 images to be detected to obtain defect positions in the at least 2 images to be detected; and determining the position of the detected defect in the display module according to the defect position of the detected defect in at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer. By adopting the invention, the accuracy of detecting the interlayer defects of the display module can be improved.
Description
Technical Field
The invention relates to the technical field of industrial machine vision, in particular to a method and a device for detecting interlayer defects of a display module, computer equipment and a computer readable storage medium.
Background
The display panel is assembled by multiple layers of materials in the manufacturing process, and comprises the following components from outside to inside in sequence: the touch control display panel comprises cover plate glass, a touch control functional layer, a display layer and a backlight plate. The assembly of each layer inevitably introduces some dust or foreign matters. If dust or foreign matter occurs in a layer of the display panel, the layer is treated as a defective product.
In the related art, in order to detect whether there are defects such as dust or foreign matter in each layer of the display panel, most of the existing production lines use manual spot inspection by means of a microscope, or use automated detection methods such as spectral confocal detection, laser confocal scanning, multi-field imaging defect feature classification, and the like to detect. The detection methods have the defects that the requirements on detection conditions are not high, the detection speed is not low or the detection effect is not good, the detection methods are easily interfered by surface dust, and interlayer defects are not easy to distinguish.
That is, the method of detecting interlayer defects such as an ash layer and a foreign substance existing in the interlayer of the display panel has a problem of insufficient accuracy.
Disclosure of Invention
In view of the foregoing, it is desirable to provide a method and an apparatus for detecting interlayer defects of a display module, a computer device, and a computer readable storage medium.
In a first aspect of the present invention, a method for detecting interlayer defects of a display module is provided, the method comprising:
acquiring at least 2 images to be detected of a display module to be detected through at least 2 camera devices, wherein the at least 2 camera devices are arranged on the same horizontal line relative to the display module to be detected;
performing defect detection on the at least 2 images to be detected to obtain defect positions in the at least 2 images to be detected;
and determining the position of the detected defect in the display module according to the defect position of the detected defect in the at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer.
Optionally, the at least 2 image capturing devices include a first image capturing device and a second image capturing device;
the step of obtaining the defect positions in the at least 2 images to be detected further comprises: acquiring a first defect position in a first image to be detected acquired by a first camera device, and acquiring a second defect position in a second image to be detected acquired by a second camera device, wherein the first defect position and the second defect position are coordinate positions in the same coordinate system;
the step of determining the position of the detected defect in the display module according to the defect position of the detected defect in the at least 2 images to be detected further comprises: determining whether defect offset exists according to the first defect position and the second defect position, and if so, determining the offset according to the first defect position and the second defect position; and determining the position of the defect in the display module according to the offset.
Optionally, an included angle is formed between the 2 camera devices and the display module to be detected in the horizontal direction of the same horizontal line, and the included angle ranges from 10 degrees to 160 degrees; the 2 camera devices focus on the same point on the display module to be detected.
Optionally, after the step of determining whether there is a defect offset according to the first defect position and the second defect position, the method further includes: if the defect deviation does not exist, determining that the defect is on the surface layer of the display module;
the step of determining the position of the defect in the display module according to the offset further comprises: if the offset meets the first offset range, determining that the defect is in an interlayer of the display module; if the offset meets a second offset range, determining that the defect is on a cg layer of the display module; the first deviation range and the second deviation range are determined according to the thickness of the display module to be detected and the angle of an included angle between the first camera device and the second camera device, and the first deviation range is smaller than the second deviation range.
Optionally, the first light source and the first camera device are arranged correspondingly, and form a transmission field image on the opposite side of the display module to be detected, and the second light source and the second camera device are arranged correspondingly, and form a transmission field image on the opposite side of the display module to be detected;
the step of waiting to examine the image through 2 at least camera device acquirement at least 2 of waiting to detect display module still includes: the first light source and the second light source flicker alternately, a first image to be detected is acquired through the first camera device when the first light source flickers, and a second image to be detected is acquired through the second camera device when the second light source flickers.
Optionally, the method further includes: performing camera calibration on the first camera device and the second camera device, and respectively acquiring calibration conversion matrixes corresponding to the first camera device and the second camera device;
the method comprises the steps of acquiring a first defect position in a first image to be detected acquired by a first camera device, acquiring a second defect position in a second image to be detected acquired by a second camera device, wherein the first defect position and the second defect position are coordinate positions under the same coordinate system, and the method further comprises the following steps: the method comprises the steps of identifying defects of a first image to be detected, and converting coordinate positions of the identified defects based on a calibration conversion matrix corresponding to a first camera device to obtain first defect positions; and identifying the defects of the second image to be detected, and converting the coordinate positions of the identified defects based on the calibration conversion matrix corresponding to the second camera device to obtain the second defect position.
In a second aspect of the present invention, there is provided an apparatus for detecting interlayer defects of a display module, the apparatus comprising:
the image acquisition module is used for acquiring at least 2 images to be detected of the display module to be detected through at least 2 camera devices, and the at least 2 camera devices are arranged on the same horizontal line relative to the display module to be detected;
the defect identification module is used for carrying out defect detection on the at least 2 images to be detected to obtain defect positions in the at least 2 images to be detected;
and the defect interlayer position confirmation module is used for determining the position of the detected defect in the display module according to the detected defect in the defect positions of the at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer.
Optionally, the at least 2 image capturing devices include a first image capturing device and a second image capturing device;
the defect identification module is further used for acquiring a first defect position in a first image to be detected acquired by the first camera device and a second defect position in a second image to be detected acquired by the second camera device, and the first defect position and the second defect position are coordinate positions in the same coordinate system;
the defect interlayer position confirming module is further used for determining whether defect offset exists according to the first defect position and the second defect position, and if yes, determining the offset according to the first defect position and the second defect position; and determining the position of the defect in the display module according to the offset.
In a third aspect of the present invention, there is provided a computer device, which includes a memory and a processor, wherein the memory has an executable code, and when the executable code runs on the processor, the method for detecting interlayer defects of a display module as described above is implemented.
In a fourth aspect of the present invention, a computer-readable storage medium is provided, where the computer-readable storage medium is used for storing a computer program, and the computer program is used for executing the method for detecting interlayer defects of a display module set as described above.
The embodiment of the invention has the following beneficial effects:
after the method and the device for detecting interlayer defects of the display module, the computer equipment and the computer-readable storage medium are adopted, when the interlayer defects of the display module are detected, at least 2 camera devices arranged on the same horizontal line relative to the display module to be detected are used for obtaining the image to be detected of the display module to be detected, and then at least 2 images to be detected are subjected to defect detection to obtain the defect positions in the at least 2 images to be detected; and determining the positions of the detected defects in the display module to be surface layers, interlayers and/or cg layers according to the detected defects in the at least 2 images to be detected, wherein the positions of the defects in the at least 2 images to be detected are consistent or have deviation. That is to say, because the display module has certain thickness, the position that leads to the defect in different layer positions in the image that different camera device gathered is different, consequently can detect the defect position of confirming the intermediate layer defect according to the defect position in the image that detects different to improve the accuracy that the intermediate layer defect detected.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Wherein:
FIG. 1 is a schematic flow chart illustrating a method for detecting interlayer defects of a display module according to an embodiment;
FIG. 2 is a diagram illustrating an exemplary embodiment of a system for detecting interlayer defects in a display module;
FIG. 3 is a schematic diagram illustrating the relationship between the offset and the thickness of the display module and the angle of the camera device in one embodiment;
FIG. 4 is a schematic diagram illustrating the relationship between the offset and the thickness of the display module and the angle of the camera device in one embodiment;
FIG. 5 is a schematic diagram illustrating an exemplary embodiment of an apparatus for detecting interlayer defects in a display module;
fig. 6 is a schematic structural diagram of a computer device for executing the method for detecting interlayer defects of a display module according to an embodiment.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In this embodiment, in order to detect interlayer defects in display templates such as a display panel, a method for detecting interlayer defects of a display module is provided, which can detect and locate interlayer defects of the display module, and improve the accuracy of detecting interlayer defects of the display module. Specifically, the detection method for the interlayer defect of the display module can be applied to application scenes of detecting whether the interlayer defect exists in the produced display module in scenes such as industrial production and the like, can be part of defect detection, can also be independent interlayer defect detection, and can also be part of production of the display module.
Specifically, referring to fig. 1, fig. 1 shows a schematic flow chart of an implementation of the method for detecting interlayer defects of a display module. The method for detecting interlayer defects of the display module comprises the following steps of S101-S103 shown in FIG. 1:
step S101: at least 2 of waiting to detect the display module assembly to be detected are obtained through at least 2 camera device, at least 2 camera device set up for wait to detect the same water flat line of display module assembly.
On the production line or on the product detection platform, when the display module to be detected runs to the detection position, the image to be detected of the display module to be detected is obtained through the camera device so as to detect the defects, particularly interlayer defects, in the display module to be detected. The display module to be detected can be a liquid crystal display panel, a display screen and other display modules, the display module comprises a plurality of layers, wherein the plurality of layers possibly have defects in the generation process or have foreign matters or defects among the plurality of layers, and the interlayer defects of the display module can be detected in the production process or after the production is finished.
Specifically, be provided with 2 at least camera device above waiting to detect the motion platform of display module assembly, for example, set up the different positions above the detection position on motion platform, it focuses on detecting the position to focus on the same point on detecting the position. First camera device and second camera device all can cover and wait to detect display module assembly, and its field of vision is at least partly/whole coincidence.
In a specific embodiment, the at least 2 image capturing devices include a first image capturing device and a second image capturing device, which respectively form a certain angle with the horizontal direction (the horizontal line where the moving platform is located, the moving direction) of the same horizontal line of the display module to be detected, and an included angle is formed between the 2 image capturing devices, and the included angle ranges from 10 degrees to 160 degrees. Preferably, the angle of the included angle is not suitable too small or too large for achieving a good defect detection effect. In the application scenario shown in fig. 2, the angles between the image capturing devices 1 and 2 and the horizontal line (the movement direction) are 45 degrees.
Further, in this embodiment, in order to cooperate with at least 2 image capturing devices to capture an image, a light source corresponding to each image capturing device is also provided. Specifically, the first light source and the first camera device are arranged correspondingly, and transmission field imaging is formed on the opposite side of the display module to be detected, and the second light source and the second camera device are arranged correspondingly, and transmission field imaging is formed on the opposite side of the display module to be detected. For example, in a scene as shown in fig. 2, the light source 1 corresponds to the imaging device 1, and the light source 2 corresponds to the imaging device 2. When the collection waits to detect the image of display module assembly, first light source and second light source scintillation in turn, through first camera device collection first waiting to detect the image when first light source scintillation, through the second camera device collection second waiting to detect the image when the second light source scintillation. That is to say, wait to detect display module assembly when detecting the position, light source 1 and 2 scintillation in turn of light source, camera device 1 and camera device 2 cooperation light source scan image line by line in proper order simultaneously, and camera device 1 gathers simultaneously with camera device 2 and waits to detect the image.
In another embodiment, the light source and the camera device may not form a transmission field image on different sides, or the light source may be formed by lighting from the front, or a plurality of light sources are used to light the display module for detection, so that different defect types can be detected, and the adaptation range of interlayer defect detection is improved.
Step S102: and carrying out defect detection on the at least 2 images to be detected to obtain the defect positions in the at least 2 images to be detected.
After the image to be detected is obtained, defect detection can be further performed on the image to be detected, and if the defect is detected, the defect and the corresponding coordinate position (defect position) of the defect in the image to be detected are further obtained.
Specifically, a first defect position in a first image to be detected acquired by a first camera device is acquired, and a second defect position in a second image to be detected acquired by a second camera device is acquired. In this case, since it is difficult to keep the positions of the cameras consistent during the mounting process, the cameras 1 and 2 need to be calibrated before defect detection. And establishing a relation by calibrating the positions of the two camera devices. In the calibration process, the camera device 1 and the camera device 2 shoot the same high-precision calibration plate, feature points of a plurality of areas are selected on the calibration plate, and the two camera devices perform calibration conversion of the position relation through the feature points. That is, the positional relationship between the two imaging devices needs to be calibrated to the same coordinate system, and the positional deviation value of the same defect in the two imaging devices can be calculated based on the positional relationship. That is, the first defect position and the second defect position are coordinate positions in the same coordinate system; specifically, camera calibration is performed on a first camera device and a second camera device, and calibration conversion matrixes corresponding to the first camera device and the second camera device are respectively obtained; the method comprises the steps of acquiring a first defect position in a first image to be detected acquired by a first camera device, acquiring a second defect position in a second image to be detected acquired by a second camera device, wherein the first defect position and the second defect position are coordinate positions under the same coordinate system, and the method further comprises the following steps: the method comprises the steps of identifying defects of a first image to be detected, and converting coordinate positions of the identified defects based on a calibration conversion matrix corresponding to a first camera device to obtain first defect positions; and identifying the defects of the second image to be detected, and converting the coordinate positions of the identified defects based on the calibration conversion matrix corresponding to the second camera device to obtain the second defect position.
Step S103: and determining the position of the detected defect in the display module according to the defect position of the detected defect in the at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer.
After the defect is acquired in each image to be detected, the position of the defect in the image to be detected collected in different camera devices is possibly different because the defect is possibly on different layers of the display module to be detected and because the camera devices and the angle existing between the display module to be detected are different. For example, if the defect is on the surface layer of the display module, the position of the defect in the to-be-detected image corresponding to different cameras is the same, whereas if the defect is on the interlayer of the display module, the position of the defect in the to-be-detected image corresponding to different cameras may be shifted. Therefore, which layer of the display module the defect is on can be judged according to the position of the defect in different images to be detected.
Specifically, the position of the detected defect in the display module is determined according to the defect position of the detected defect in the at least 2 images to be detected, that is, whether defect deviation exists is determined according to the first defect position and the second defect position, and if yes, the deviation amount is determined according to the first defect position and the second defect position; and then determining the position of the defect in the display module according to the offset. Wherein, the position of defect place includes the top layer, intermediate layer, the cg layer of display module assembly. And wherein the interlayer further comprises a specific interlayer.
Specifically, referring to fig. 2, if the defect is on the upper surface of the display module, i.e. on the sensor layer, due to the way of the opposite side lighting, the coordinate positions of the defect in the image capturing device 1 and the image capturing device 2 are the same, i.e. there is a shift between the first defect position and the second defect position. If the defect is in the interlayer of the display module, the coordinate positions of the defects in the images acquired by the camera device 1 and the camera device 2 can be shifted along the movement direction due to the angle of the camera device, that is, the position of the first defect corresponding to the defect and the position of the second defect can be shifted. If the defect is on the cg layer of the display module, the coordinate position of the defect in the images collected by the cameras 1 and 2 will be shifted along the moving direction, and the shift will be the largest. Therefore, in the present embodiment, in the case of an offset, which layer of the display module the defect is on can be determined according to the magnitude of the offset. Therefore, the defects can be determined to be on the upper surface layer or the lower surface layer of the display module or on the interlayer of the display module, the interference of the defects on the upper surface layer and the lower surface layer on the interlayer defect detection can be well filtered, and the accuracy of interlayer defect detection is improved.
Specifically, whether defect offset exists is determined according to a first defect position and a second defect position, and if yes, the offset is determined according to the first defect position and the second defect position; determining the position of the defect in the display module according to the offset; if not, determining that the defect is on the surface layer of the display module.
Further, in the case of defect offset, the offset may be determined according to a difference between the first defect position and the second defect position, and then the position of the defect in the display module is determined according to the magnitude of the offset. Specifically, if the offset meets a first offset range, determining that the defect is in an interlayer of the display module; if the offset meets a second offset range, determining that the defect is on a cg layer of the display module; the first offset range and the second offset range are determined according to the thickness of the display module to be detected and the angle of an included angle between the first camera device and the second camera device, and the first offset range is smaller than the second offset range.
In a specific embodiment, as shown in fig. 3-4, a schematic diagram of the relationship between the offset amount and the thickness of the display module and the addition of the camera is provided. Suppose that the thickness of the display module to be detected is a, the refractive index difference between different media is not considered under an ideal state, and under the example that the included angle between the camera device and the display module to be detected is 45 degrees, when the same object is at the bottommost layer, the deviation is the largest in the images shot by the two camera devices, and the distance is 2a. When the included angle between the camera device and the display module to be detected is 30 degrees, the deviation is the largest in the pictures shot by the two camera devices when the same object is at the bottom layer, and the distance is 1.154a. The time difference between 30 degrees of the camera device and 45 degrees of the camera device is 0.85a. The thickness of the product is 0.72mm, and the pixel precision is 0.014mm/pixel. The image pickup device was shifted by 102 pixels at 45 degrees. The imaging device is shifted by 59 pixels at 30 degrees. That is, the larger the angle between the image pickup devices, the larger the deviation value of the defect in both image pickup devices. The larger the thickness of the display module detected simultaneously is, the larger the deviation value of different layer defects in the two camera devices is. The larger the pixel accuracy of the image pickup device, the larger the deviation value of the defect in the image. The accuracy of interlayer defect detection can be improved by increasing the angle of the camera device and the precision of the camera device.
Further, as shown in fig. 5, this embodiment further provides a device for detecting interlayer defects of a display module, where the device includes:
the image acquisition module 101 is configured to acquire at least 2 images to be detected of the display module to be detected through at least 2 cameras, where the at least 2 cameras are arranged on the same horizontal line relative to the display module to be detected;
the defect identification module 102 is configured to perform defect detection on the at least 2 images to be detected, and acquire defect positions in the at least 2 images to be detected;
and the defect interlayer position confirmation module 103 is used for determining the position of the detected defect in the display module according to the defect position of the detected defect in the at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer.
Optionally, in an embodiment, the at least 2 image capturing devices include a first image capturing device and a second image capturing device; the defect identification module 102 is further configured to obtain a first defect position in a first image to be detected acquired by a first camera device, and obtain a second defect position in a second image to be detected acquired by a second camera device, where the first defect position and the second defect position are coordinate positions in the same coordinate system; the defect interlayer position confirmation module 103 is further configured to determine whether a defect offset exists according to the first defect position and the second defect position, and if so, determine an offset according to the first defect position and the second defect position; and determining the position of the defect in the display module according to the offset.
Optionally, in an embodiment, an included angle is formed between the 2 camera devices and the display module to be detected in the horizontal direction of the same horizontal line, and the included angle ranges from 10 degrees to 160 degrees; the 2 camera devices focus on the same point on the display module to be detected.
Optionally, in an embodiment, the defect interlayer position determining module 103 is further configured to determine that the defect is on the surface layer of the display module when there is no defect offset.
Optionally, in an embodiment, the defect interlayer position determining module 103 is further configured to determine that the defect is in an interlayer of the display module when the offset amount satisfies the first offset range; determining that the defect is on a cg layer of the display module when the offset meets a second offset range; the first offset range and the second offset range are determined according to the thickness of the display module to be detected and the angle of an included angle between the first camera device and the second camera device, and the first offset range is smaller than the second offset range.
Optionally, in an embodiment, the first light source and the first camera device are correspondingly disposed and form a transmission field image on the opposite side of the display module to be detected, and the second light source and the second camera device are correspondingly disposed and form a transmission field image on the opposite side of the display module to be detected; the image acquisition module 101 is further configured to alternately flash the first light source and the second light source, acquire a first image to be detected through the first camera device when the first light source flashes, and acquire a second image to be detected through the second camera device when the second light source flashes.
Optionally, in an embodiment, as shown in fig. 5, the apparatus further includes a camera calibration module 104, configured to perform camera calibration on the first camera device and the second camera device, and obtain calibration transformation matrices corresponding to the first camera device and the second camera device respectively;
optionally, in an embodiment, the defect identifying module 102 is further configured to perform defect identification on the first image to be detected, and perform coordinate position conversion on the identified defect based on a calibration conversion matrix corresponding to the first camera device to obtain a first defect position; and identifying the defects of the second image to be detected, and converting the coordinate positions of the identified defects based on the calibration conversion matrix corresponding to the second camera device to obtain the second defect position.
Fig. 6 shows an internal structure diagram of a computer device for implementing the method for detecting interlayer defects of a display module according to an embodiment). The computer device may specifically be a terminal, and may also be a server. As shown in fig. 6, the computer device includes a processor, a memory, and a network interface connected by a system bus. Wherein the memory includes a non-volatile storage medium and an internal memory. The non-volatile storage medium of the computer device stores an operating system and may also store a computer program which, when executed by the processor, causes the processor to carry out the above-mentioned method. The internal memory may also have a computer program stored thereon, which, when executed by the processor, causes the processor to perform the method described above. Those skilled in the art will appreciate that the architecture shown in fig. 6 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
After the method and the device for detecting interlayer defects of the display module, the computer equipment and the computer-readable storage medium are adopted, when the display module is subjected to interlayer defect detection, at least 2 camera devices arranged on the same horizontal line relative to the display module to be detected are used for acquiring the image to be detected of the display module to be detected, and then at least 2 images to be detected are subjected to defect detection to acquire the defect positions in the at least 2 images to be detected; and determining the position of the detected defect in the display module to be a surface layer, an interlayer and/or a cg layer according to the fact that the positions of the detected defect in the at least 2 images to be detected are consistent or have offset. That is to say, because the display module has certain thickness, the position that leads to the defect in different layer positions in the image that different camera device gathered is different, consequently can detect the defect position of confirming the sandwich defect according to the defect position in the image of waiting to detect to improve the accuracy of sandwich defect detection.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by a computer program, which can be stored in a non-volatile computer-readable storage medium, and can include the processes of the embodiments of the methods described above when the program is executed. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically Programmable ROM (EPROM), electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous Link DRAM (SLDRAM), rambus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
All possible combinations of the technical features in the above embodiments may not be described for the sake of brevity, but should be considered as being within the scope of the present disclosure as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A method for detecting interlayer defects of a display module is characterized by comprising the following steps:
acquiring at least 2 images to be detected of a display module to be detected through at least 2 camera devices, wherein the at least 2 camera devices are arranged on the same horizontal line relative to the display module to be detected;
performing defect detection on the at least 2 images to be detected to obtain defect positions in the at least 2 images to be detected;
and determining the position of the detected defect in the display module according to the defect position of the detected defect in the at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer.
2. The method for detecting interlayer defects of a display module according to claim 1, wherein the at least 2 image capturing devices comprise a first image capturing device and a second image capturing device;
the step of obtaining the defect positions in the at least 2 images to be detected further comprises:
acquiring a first defect position in a first image to be detected acquired by a first camera device, and acquiring a second defect position in a second image to be detected acquired by a second camera device, wherein the first defect position and the second defect position are coordinate positions in the same coordinate system;
the step of determining the position of the detected defect in the display module according to the defect position of the detected defect in the at least 2 images to be detected further comprises:
determining whether defect offset exists according to the first defect position and the second defect position, and if so, determining the offset according to the first defect position and the second defect position;
and determining the position of the defect in the display module according to the offset.
3. The method for detecting interlayer defects of a display module according to claim 2, wherein the 2 cameras and the display module to be detected form an included angle in the horizontal direction of the same horizontal line, and the included angle ranges from 10 degrees to 160 degrees;
the 2 camera devices focus on the same point on the display module to be detected.
4. The method for detecting interlayer defects of a display module according to claim 2, wherein after the step of determining whether the defect offset exists according to the first defect position and the second defect position, the method further comprises:
if the defect deviation does not exist, determining that the defect is on the surface layer of the display module;
the step of determining the position of the defect in the display module according to the offset further comprises:
if the offset meets a first offset range, determining that the defect is in an interlayer of the display module;
if the offset meets a second offset range, determining that the defect is on a cg layer of the display module;
the first offset range and the second offset range are determined according to the thickness of the display module to be detected and the angle of an included angle between the first camera device and the second camera device, and the first offset range is smaller than the second offset range.
5. The method for detecting interlayer defects of a display module according to claim 2, wherein a first light source is arranged corresponding to the first camera device and forms a transmission field image on the opposite side of the display module to be detected, and a second light source is arranged corresponding to the second camera device and forms a transmission field image on the opposite side of the display module to be detected;
the step of waiting to detect the image is examined to at least 2 of waiting to detect display module group is acquireed through at least 2 camera device, still includes:
the first light source and the second light source flicker alternately, a first image to be detected is acquired through the first camera device when the first light source flickers, and a second image to be detected is acquired through the second camera device when the second light source flickers.
6. The method for detecting interlayer defects of a display module according to claim 2,
the method further comprises the following steps:
calibrating cameras of the first camera device and the second camera device, and respectively acquiring calibration conversion matrixes corresponding to the first camera device and the second camera device;
the method comprises the steps of acquiring a first defect position in a first image to be detected acquired by a first camera device, acquiring a second defect position in a second image to be detected acquired by a second camera device, wherein the first defect position and the second defect position are coordinate positions under the same coordinate system, and the method further comprises the following steps:
identifying defects of the first image to be detected, and converting the coordinate positions of the identified defects based on a calibration conversion matrix corresponding to the first camera device to obtain first defect positions;
and identifying the defects of the second image to be detected, and converting the coordinate positions of the identified defects based on the calibration conversion matrix corresponding to the second camera device to obtain the second defect position.
7. The utility model provides a detection device of display module assembly intermediate layer defect which characterized in that, the device includes:
the image acquisition module is used for acquiring at least 2 images to be detected of the display module to be detected through at least 2 camera devices, and the at least 2 camera devices are arranged on the same horizontal line relative to the display module to be detected;
the defect identification module is used for carrying out defect detection on the at least 2 images to be detected to obtain defect positions in the at least 2 images to be detected;
and the defect interlayer position confirmation module is used for determining the position of the detected defect in the display module according to the defect position of the detected defect in the at least 2 images to be detected, wherein the position of the defect in the display module comprises a surface layer, an interlayer and/or a cg layer.
8. The apparatus according to claim 7, wherein the at least 2 cameras comprise a first camera and a second camera;
the defect identification module is further used for acquiring a first defect position in a first image to be detected acquired by the first camera device and a second defect position in a second image to be detected acquired by the second camera device, and the first defect position and the second defect position are coordinate positions in the same coordinate system;
the defect interlayer position confirming module is further used for determining whether defect offset exists according to the first defect position and the second defect position, and if yes, determining the offset according to the first defect position and the second defect position; and determining the position of the defect in the display module according to the offset.
9. A computer-readable storage medium storing a computer program for executing the method for detecting interlayer defects of a display module set according to any one of claims 1 to 6.
10. A computer device, comprising a memory and a processor, wherein the memory has an executable code, and when the executable code runs on the processor, the method for detecting interlayer defects of a display module according to any one of claims 1 to 6 is implemented.
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