CN115792414A - Spherical scanning test system - Google Patents
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- CN115792414A CN115792414A CN202211616558.3A CN202211616558A CN115792414A CN 115792414 A CN115792414 A CN 115792414A CN 202211616558 A CN202211616558 A CN 202211616558A CN 115792414 A CN115792414 A CN 115792414A
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Abstract
The invention provides a spherical surface scanning test system, wherein a probe is arranged on a scanning mechanism, a rotary table is used for bearing an antenna to be tested and driving the antenna to be tested to rotate horizontally, and the probe comprises: the device comprises a first probe and a second probe, wherein the number of the first probe is at least two, the testing frequency band of the first probe is not higher than 67GHz, and the testing frequency band of the second probe is different from that of the first probe; and the scanning mechanism is used for driving the probe to do circular arc motion in the vertical direction, so that the probe can carry out wireless communication on the antenna to be tested at different positions of a circular arc track, and spherical scanning test is carried out on the antenna to be tested by matching with the rotation of the rotary table. When the system is applied to a scene with a very large test frequency band span, the test complexity and the test efficiency can be considered at the same time.
Description
Technical Field
The invention relates to the technical field of communication, in particular to a spherical scanning test system.
Background
The antenna test is that a probe with known characteristics is used for sampling on a certain surface of a near field region or a far field region of the antenna to obtain the amplitude and phase distribution of the field, if the near field region is sampled, the far field characteristics of the antenna to be tested are obtained through strict mathematical transformation, and if the far field region is sampled, the far field characteristics of the antenna to be tested can be directly obtained. According to different sampling surfaces, the method is divided into plane scanning, cylindrical scanning and spherical scanning. In the spherical scanning, the probe moves around the virtual sphere of the antenna to be tested and samples, and the test coordinate system of the spherical scanning is shown in fig. 1.
A present spherical scanning test system is in a multi-probe form, and one of the specific structures is as follows: the probes are fixedly arranged on the scanning mechanism at equal intervals, the positions of the probes correspond to different theta angles in a spherical scanning coordinate system, the antenna to be detected is arranged on the rotary table, and the rotating center of the rotary table is located at the origin of the coordinate system. When the turntable drives the antenna to be tested to rotate horizontally, the spherical scanning test of the antenna to be tested can be realized. The spherical scanning test system uses a plurality of probes, and the test efficiency is high. In some practical test scenarios, the span of the required test frequency band is very large, that is, the antenna to be tested needs to be tested in different test frequency bands, and the working frequency band of one probe is limited, so that the probes in different test frequency bands need to be replaced in the test. In addition, in order to be compatible with probes of different frequencies, the radio frequency link becomes large and complex, which also increases the cost.
At present, a spherical scanning test system is in a single-probe form, and one specific structure is as follows: the single probe is arranged on the scanning mechanism, the scanning mechanism can drive the probe to do circular arc motion in the vertical direction so as to reach different theta angles in a spherical scanning coordinate system, the antenna to be tested is arranged on the rotary table, and when the rotary table drives the antenna to be tested to rotate in the horizontal plane, the spherical scanning test of the antenna to be tested can be realized. In this sphere scanning test system, because the probe only has one, the change of the probe of the different test frequency channels of being convenient for, and then realize the test demand that the test frequency channel span is big, however, because only a probe samples, efficiency of software testing is extremely low.
In summary, when the existing spherical scanning test system is applied to a scene with a very large test frequency range span, both the test complexity and the test efficiency cannot be taken into consideration.
Disclosure of Invention
In view of this, the present invention provides a spherical scanning test system to solve the technical problem that the existing spherical scanning test system cannot consider both the test complexity and the test efficiency when applied in a scenario with a very large test frequency span.
In a first aspect, an embodiment of the present invention provides a spherical scanning test system, including: a probe, a scanning mechanism and a turntable;
the probe install in scanning mechanism is last, the revolving stage is used for bearing the antenna that awaits measuring, and drives the antenna that awaits measuring carries out the horizontal plane and rotates, wherein, the probe includes: the device comprises a first probe and a second probe, wherein the number of the first probe is at least two, the testing frequency band of the first probe is not higher than 67GHz, and the testing frequency band of the second probe is different from that of the first probe;
the scanning mechanism is used for driving the probe to do circular arc motion in the vertical direction, wireless communication of the probe on the antenna to be tested is achieved at different positions of a circular arc track, and spherical surface scanning testing is conducted on the antenna to be tested by matching rotation of the rotary table.
Further, when the number of the first probes is multiple, the multiple first probes are mounted on the scanning mechanism at equal intervals.
Further, the first probe is used for completing a scanning test with the antenna to be tested as a sphere center and with an angle theta of 0-X degrees on the antenna to be tested under the driving of the scanning mechanism, wherein theta represents an included angle between a connecting line between the first probe and the sphere center and a line perpendicular to the position of the sphere center and the turntable, and X is an arbitrary value larger than 0;
the number of the second probes is 1, the second probes are detachably mounted on the scanning mechanism, the second probes are used for completing scanning test with the antenna to be tested as a sphere center and the angle range of theta of the antenna to be tested is 0-Y degrees under the driving of the scanning mechanism, and Y is any value larger than 0.
Further, the scanning mechanism includes: a first scanning mechanism and a second scanning mechanism;
the first probe is arranged on the first scanning mechanism, and the second probe is arranged on the second scanning mechanism;
the first scanning mechanism is used for driving the first probe to do circular arc motion in the vertical direction, so that the first probe can scan and test the antenna to be tested on a circular arc track, and spherical scanning and testing can be performed on the antenna to be tested in a testing frequency band corresponding to the first probe by matching with the rotation of the rotary table;
the second scanning mechanism is used for driving the second probe to do circular arc motion in the vertical direction, so that the second probe can scan and test the to-be-tested antenna on a circular arc track, and spherical scanning and testing can be performed on the to-be-tested antenna at a testing frequency band corresponding to the second probe by matching with rotation of the rotary table.
Furthermore, the first scanning mechanism and the second scanning mechanism are both arc-shaped guide rails which are fixedly connected or integrated.
Furthermore, the first scanning mechanism and the second scanning mechanism jointly form an axisymmetric arc-shaped guide rail.
Further, the second probe is detachably arranged on the scanning mechanism through a probe pointing adjusting mechanism;
and the probe pointing adjusting mechanism is used for adjusting the pointing direction of the second probe so as to enable the pointing direction of the second probe to be aligned with the phase center of the antenna to be tested.
Further, the method also comprises the following steps: testing the instrument;
each first probe and each second probe are respectively connected with the test instrument.
Furthermore, the test instrument is connected with at least two first probes through a radio frequency switch, and the radio frequency switch is used for switching each first probe so as to realize a sampling mode that each first probe scans one by one.
Furthermore, each first probe is connected to a port of the test instrument, so as to implement a sampling mode in which each first probe simultaneously scans in parallel.
Further, the method also comprises the following steps: an anechoic chamber;
the probe, the scanning mechanism and the rotary table are arranged in the anechoic chamber, and the anechoic chamber is used for providing an electromagnetic environment required by testing.
Further, the test frequency band of the first probe is not higher than 40GHz.
Furthermore, the test frequency band of the second probe is not lower than 40GHz.
In an embodiment of the present invention, a spherical scanning test system is provided, including: a probe, a scanning mechanism and a turntable; the probe is installed on scanning mechanism, and the revolving stage is used for bearing the antenna that awaits measuring to drive the antenna that awaits measuring and carry out the horizontal plane rotation, wherein, the probe includes: the device comprises a first probe and a second probe, wherein the number of the first probe is at least two, the testing frequency band of the first probe is not higher than 67GHz, and the testing frequency band of the second probe is different from that of the first probe; and the scanning mechanism is used for driving the probe to do circular arc motion in the vertical direction, so that the probe can carry out wireless communication on the antenna to be tested at different positions of a circular arc track, and spherical scanning test is carried out on the antenna to be tested by matching with the rotation of the rotary table. According to the description, when the spherical scanning test system is applied to a scene with a very large test frequency band span, at least two first probes can carry out efficient test on the antenna to be tested at the test frequency band which is not higher than 67GHz, when the antenna to be tested needs to be tested at other test frequency bands, the second probe can be used, when the scanning mechanism drives the second probe to move to a lower spatial position, the second probe can be conveniently replaced, the spherical scanning test system is simple and convenient, the test complexity and the test efficiency can be considered, and the technical problem that when the existing spherical scanning test system is applied to a scene with a very large test frequency band span, the test complexity and the test efficiency cannot be considered is solved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic diagram of a spherical scanning test coordinate system.
Fig. 2 is a schematic structural diagram of a spherical scanning test system according to an embodiment of the present invention.
Fig. 3 is a schematic top view of another spherical scanning test system according to an embodiment of the present invention.
Icon: 11-a probe; 12-a scanning mechanism; 13-a turntable; 14-a test meter; 15-anechoic chamber; 111-a first probe; 112-a second probe; 121-a first scanning mechanism; 122-second scanning mechanism.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the following embodiments, and it should be apparent that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
When the traditional spherical scanning test system is applied to a scene with a very large test frequency band span, the test complexity and the test efficiency cannot be considered at the same time.
Therefore, when the spherical scanning test system is applied to a scene with a very large test frequency band span, at least two first probes can perform arc-shaped track simultaneous scanning communication on the antenna to be tested at a test frequency band which is not higher than 67GHz, the test efficiency is high, when the antenna to be tested needs to be tested at other test frequency bands, only the second probe moving to the bottom of the scanning mechanism needs to be replaced, the spherical scanning test system is simple and convenient, and the test complexity and the test efficiency can be considered at the same time.
For the understanding of the present embodiment, a spherical scan test system disclosed in the present embodiment will be described in detail first.
For the understanding of the present embodiment, a detailed description will be given to a spherical scanning test system disclosed in the present embodiment.
Fig. 2 is a schematic structural diagram of a spherical scanning test system according to an embodiment of the present invention, as shown in fig. 2, including: a probe 11, a scanning mechanism 12, and a turn table 13;
and the scanning mechanism 12 is used for driving the probe 11 to make circular arc motion in the vertical direction, so that the probe 11 performs wireless communication on the antenna to be tested at different positions of a circular arc track, and the spherical scanning test is performed on the antenna to be tested by matching with the rotation of the rotary table 13.
Specifically, the test frequency band of the first probe 111, that is, the frequency band not higher than 67GHz, can cover a commonly used test frequency band, for example, ka band, ku band, and the like, in the related art, the commercial frequency band of the 5G FR2 is currently up to 52.6GHz, and the commercial frequency band of the satellite communication is currently up to 40GHz, so that when at least two first probes 111 are mounted on the scanning mechanism 12, the replacement is generally not required, and thus, the complexity of the replacement operation can be avoided, because the number of the first probes 111 is at least two, even when the lowermost first probe 111 is moved to the lowest position of the scanning mechanism 12, the positions of the other first probes 111 are still high, and the number is large, and the replacement is inconvenient, therefore, in the design, the test frequency band covered by the at least two first probes 111 is not higher than 67GHz, and the first probe 111 is not replaced in the later test. On the other hand, the working frequency band division of the test instrument, the radio frequency device, the radio frequency cable, the radio frequency connector and the like can be divided by 67GHz, tests in a frequency band lower than 67GHz can share the same test instrument, the radio frequency device, the radio frequency cable, the radio frequency connector and the like, but the radio frequency device, the radio frequency cable and the radio frequency connector are difficult to be compatible to a higher frequency band, in addition, tests in a frequency band higher than 67GHz may need to add an expensive frequency converter (mixer), and the complexity and the cost of the system are improved.
In addition, the number of the first probes 111 is required to be at least two, so that the simultaneous scanning communication of the at least two first probes 111 to the antenna to be tested can be realized, and the testing efficiency is improved.
In particular, the first probe 111 may be fixedly mounted on a moving member that slides on a track of the scanning mechanism 12.
The test frequency band of the second probe 112 is different from the test frequency band of the first probe 111, when the antenna to be tested needs to be tested in other test frequency bands, only the second probe 112 moving to the bottom of the scanning mechanism 12 needs to be replaced, and in addition, the number of the second probe 112 is one (described below), so that the complexity of replacement operation is further reduced, and the complexity of testing is reduced.
The horizontal rotation may be 360 ° rotation.
In an embodiment of the present invention, a spherical scanning test system is provided, including: a probe 11, a scanning mechanism 12, and a turn table 13; probe 11 installs on scanning mechanism 12, and revolving stage 13 is used for bearing the antenna that awaits measuring to drive the antenna that awaits measuring and carry out the horizontal plane rotation, wherein, probe 11 includes: the device comprises a first probe 111 and a second probe 112, wherein the number of the first probe 111 is at least two, the testing frequency band of the first probe 111 is not higher than 67GHz, and the testing frequency band of the second probe 112 is different from that of the first probe 111; and the scanning mechanism 12 is used for driving the probe 11 to make circular arc motion in the vertical direction, so that the probe 11 performs wireless communication on the antenna to be tested at different positions of a circular arc track, and spherical scanning test is performed on the antenna to be tested by matching with the rotation of the rotary table 13. It can be known from the above description that when the spherical scanning test system of the present invention is applied in a scene with a very large test frequency band span, at least two first probes 111 can perform a high-efficiency test on the test frequency band of the antenna to be tested at a frequency not higher than 67GHz, and then a second probe can be used.
The foregoing has outlined rather broadly the spherical scan test system of the present invention and the detailed description thereof that follows may be better understood.
In an alternative embodiment of the present invention, when the number of the first probes 111 is plural, the plural first probes 111 are mounted on the scanning mechanism 12 at equal intervals.
In an optional embodiment of the present invention, the first probe 111 is configured to perform a scan test on the antenna to be tested with the antenna to be tested as a center of a sphere and with an angle θ ranging from 0 ° to X °, where θ represents an included angle between a connection line between the first probe and the center of the sphere and a line perpendicular to the turntable at the center of the sphere, and X is set according to a test requirement of spherical scan.
Specifically, the number of the first probes 111 is large, so that the test efficiency can be improved.
In an optional embodiment of the present invention, further comprising: a test meter 14;
each of the first probe 111 and the second probe 112 is connected to the test meter 14.
Specifically, the test instrument 14 may be a vector network analyzer, and each probe 11 is connected to a port of the vector network analyzer.
In an alternative embodiment of the present invention, the test instrument 14 is connected to at least two first probes 111 through a radio frequency switch, and the radio frequency switch is used for switching each first probe 111 to realize a sampling mode of each first probe 111 scanning one by one.
In an optional embodiment of the present invention, each first probe 111 is connected to a port of the test instrument 14, so as to implement a sampling mode in which each first probe 111 scans in parallel at the same time.
Specifically, the sampling mode of simultaneous parallel scanning communication of at least two first probes 111 can greatly increase the testing speed.
In an alternative embodiment of the present invention, when the at least two first probes 111 are simultaneously scan-tested in parallel, the at least two first probes 111 are simultaneously sampled in parallel and continuously.
Specifically, the way of simultaneously and continuously sampling by the at least two first probes 111 in parallel is as follows: the at least two first probes 111 are scan-tested in parallel in a state of continuous motion, that is, continuously sampling while moving, and the continuous sampling can further improve the testing efficiency.
In an optional embodiment of the present invention, the number of the second probes 112 is 1, and the second probes 112 are detachably mounted on the scanning mechanism 12, the second probes 112 are configured to complete a scanning test with the antenna to be tested as a sphere center and perform an angle θ range of 0 ° to Y ° on the antenna to be tested under the driving of the scanning mechanism 12, θ represents an included angle between a connection line between the first probe and the sphere center and a line perpendicular to the turntable at the sphere center position, Y is set according to a test requirement of spherical scanning, and a value of Y may be different from a value of X.
Specifically, the number of the second probes 112 is 1, which is different from the test frequency band of the first probe 111, and is generally an unusual test frequency band, such as a lower S-band, a C-band, an X-band, or a higher E-band, a W-band, or a higher test frequency band (e.g., above 110 GHz), and the second probe 112 is detachably mounted on the scanning mechanism 12, so as to be convenient for replacement, and is suitable for testing different unusual test frequency bands.
In an alternative embodiment of the present invention, the second probe 112 is detachably mounted to the scanning mechanism 12 by a probe pointing adjustment mechanism;
and the probe pointing adjusting mechanism is used for adjusting the pointing direction of the second probe 112 so that the pointing direction of the second probe 112 is aligned with the phase center of the antenna to be measured.
Optionally, the probe pointing adjustment mechanism comprises any of: universal joints and multiaxial joints.
Specifically, in the spherical scanning test, the phase center of the antenna to be tested needs to be placed at the center of the test system, i.e., the spherical center of the spherical coordinate system. In some test scenarios, the phase center of the antenna under test may not be at this center position, for reasons that may include: the device under test (on which the antenna under test is disposed) is too large to move; the device to be tested is provided with a plurality of antennas to be tested, and the antennas to be tested are positioned at different positions of the device to be tested. In this case, the probe pointing direction adjustment mechanism can be used to adjust the pointing direction of the second probe 112 to align the phase center of the antenna to be tested, so as to avoid testing errors.
It can be understood that since the first probe 111 is not adjusted conveniently, the pointing direction thereof may always be directed to the center of the test system, and accordingly, the device under test needs to be placed at the center position when performing a test using the first probe 111.
In an alternative embodiment of the present invention, the scanning mechanism 12 comprises: a first scanning mechanism 121 and a second scanning mechanism 122;
the first probe 111 is mounted on the first scanning mechanism 121, and the second probe 112 is mounted on the second scanning mechanism 122;
the first scanning mechanism 121 is configured to drive the first probe 111 to perform circular arc motion in the vertical direction, so that the first probe 111 performs a scanning test on an arc track of the antenna to be tested, and the rotation of the rotary table 13 is matched to perform a spherical scanning test on the antenna to be tested in a test frequency band corresponding to the first probe 111;
the second scanning mechanism 122 is configured to drive the second probe 112 to perform circular arc motion in the vertical direction, so that the second probe 112 performs scanning test on the to-be-tested antenna on a circular arc track, and the rotation of the rotary table 13 is matched to perform spherical scanning test on the to-be-tested antenna in a test frequency band corresponding to the second probe 112.
In an alternative embodiment of the present invention, the first scanning mechanism 121 and the second scanning mechanism 122 are both circular arc-shaped guide rails, and both are fixedly connected or integrated into a whole.
In an alternative embodiment of the present invention, referring to fig. 2, the first scanning mechanism 121 and the second scanning mechanism 122 together form an axisymmetric circular arc-shaped guide rail.
Specifically, the axisymmetrical circular arc-shaped guide rail formed by the first scanning mechanism 121 and the second scanning mechanism 122 is convenient to process and build, and is relatively stable.
In fig. 2, the first scanning mechanism 121 and the second scanning mechanism 122 form an axisymmetric arc-shaped guide rail, that is, the included angle between the first scanning mechanism 121 and the second scanning mechanism 122 in the phi direction in the test coordinate system is 180 °. In addition, if the testing site is not large enough, the first scanning mechanism 121 and the second scanning mechanism 122 may not be arc-shaped guide rails with axial symmetry, that is, the included angle between the first scanning mechanism 121 and the second scanning mechanism 122 in the phi direction in the testing coordinate system may be any angle, and may be adaptively adjusted according to the size of the testing site. For example, referring to fig. 3, when the anechoic chamber 15 is limited in field, the first scanning mechanism 121 and the second scanning mechanism 122 are set so that the angle in the phi direction in the test coordinate system is 90 °.
In an optional embodiment of the present invention, further comprising: an anechoic chamber 15;
the probe 11, the scanning mechanism 12 and the turntable 13 are disposed in an anechoic chamber 15, and the anechoic chamber 15 is used for providing an electromagnetic environment required for testing.
In an alternative embodiment of the present invention, the frequency band for testing the first probe 111 is not higher than 40GHz, and the frequency band for testing the second probe 112 is not lower than 40GHz.
The test frequency band not higher than 40GHz is a more common test frequency band, the test frequency band not lower than 40GHz is an uncommon test frequency band, when the test frequency band of the second probe 112 is not lower than 40GHz, the second probe 112 is connected with the test instrument 14 through a mixer, and the mixer is arranged to reduce line loss.
The foregoing details specifically introduce the spherical scanning test system of the present invention, and the following describes the spherical scanning test system of the present invention as a whole by a specific embodiment:
as shown in fig. 2, the spherical scanning test system includes: an anechoic chamber 15 for providing a test environment; the scanning mechanism 12 includes: a circular arc-shaped guide rail; the first probe 111 and the second probe 112 are mounted on the scanning mechanism 12 and can move on a circular arc guide rail of the scanning mechanism 12; a one-dimensional rotary table 13 which can rotate on a horizontal plane; the test meters 14 (the number of the test meters 14 is not limited to 1 shown in the figure, and may include two or more, adapted according to the test requirements and the meter parameters).
The number of the first probes 111 is 4, the first probes 111 are arranged at equal intervals, and the first probes 111 are used for testing a common frequency band, so that the first probes 111 select antennas capable of covering the test common frequency band to reduce replacement or avoid replacement. The 4 first probes 111 are respectively connected with four ports of the vector network analyzer, parallel sampling can be performed (namely, the 4 first probes 111 simultaneously receive signals of the antenna to be tested), and the testing efficiency is greatly improved. The 4 first probes 111 can slide on the scanning mechanism 12 at the same time and sample continuously (while moving, sample continuously), and the continuous sampling further improves the testing efficiency. In this embodiment, the 4 first probes 111 are used to complete the scanning of the θ angle range from 0 ° to 90 °, and the rotation of the turntable 13 at 360 ° is matched to realize the sampling of the upper hemispherical surface of the antenna to be measured.
The number of the second probes 112 is 1, the second probes 112 are used for testing of the unusual frequency band or the high frequency, and the second probes 112 are replaceable to facilitate replacement when the second probes 112 slide to a lower position on the scanning mechanism 12. Especially for larger test systems, the size of the scanning mechanism 12 may be high, which avoids the problem of inconvenient replacement. The second probe 112 may also sample continuously, improving testing efficiency. In this embodiment, the second probe 112 is used to complete the scanning of the θ angle range from 0 ° to 90 °, and the rotation of the turntable 13 at 360 ° is matched to realize the sampling of the upper hemisphere of the antenna to be measured.
In this embodiment, the scanning mechanism 12 may be an integrated semicircular arc track, and is divided into two sections (i.e., an included angle between two sections of the scanning mechanism 12 in the tangential direction at the connection position is 180 degrees) with a pitch angle of 0 ° as a boundary, and the two sections of the scanning mechanism are respectively used for the motion scanning of the two groups of probes 11. The above-described symmetrical structure of the scanning mechanism 12 is easy to manufacture and construct, and is also relatively stable.
The spherical scanning test system can give consideration to both the test efficiency and the flexibility of test frequency band adjustment in one test system, two groups of probes share different sections of one track, the mechanical structure is simple and stable, the test efficiency can be improved by arranging the first probe, and the second probe can be adapted to test products with wider frequency bands.
In addition, in the description of the embodiments of the present invention, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and these modifications or substitutions do not depart from the spirit of the corresponding technical solutions of the embodiments of the present invention.
Claims (13)
1. A spherical scanning test system, comprising: a probe, a scanning mechanism and a turntable;
the probe install in scanning mechanism is last, the revolving stage is used for bearing the antenna that awaits measuring, and drives the antenna that awaits measuring carries out the horizontal plane and rotates, wherein, the probe includes: the device comprises a first probe and a second probe, wherein the number of the first probe is at least two, the testing frequency band of the first probe is not higher than 67GHz, and the testing frequency band of the second probe is different from that of the first probe;
the scanning mechanism is used for driving the probe to do circular arc motion in the vertical direction, wireless communication of the probe on the antenna to be tested is achieved at different positions of a circular arc track, and spherical surface scanning testing is conducted on the antenna to be tested by matching rotation of the rotary table.
2. The spherical surface scanning test system of claim 1, wherein when the number of the first probes is plural, the plural first probes are mounted on the scanning mechanism at equal intervals.
3. The spherical scanning test system according to claim 1, wherein the first probe is configured to perform, under the driving of the scanning mechanism, a scanning test with an angle θ ranging from 0 ° to X ° on the antenna to be tested, taking the antenna to be tested as a spherical center, where θ represents an included angle between a connection line between the first probe and the spherical center and a line perpendicular to the spherical center and the turntable, and X is an arbitrary value greater than 0;
the number of the second probes is 1, the second probes are detachably mounted on the scanning mechanism, the second probes are used for completing scanning test with the antenna to be tested as a sphere center and carrying out theta angle range of 0-Y degrees on the antenna to be tested under the driving of the scanning mechanism, and Y is any value larger than 0.
4. The spherical scan test system of claim 1, wherein the scanning mechanism comprises: a first scanning mechanism and a second scanning mechanism;
the first probe is arranged on the first scanning mechanism, and the second probe is arranged on the second scanning mechanism;
the first scanning mechanism is used for driving the first probe to do circular arc motion in the vertical direction, so that the first probe can scan and test the antenna to be tested on a circular arc track, and spherical scanning and testing can be performed on the antenna to be tested in a testing frequency band corresponding to the first probe by matching with the rotation of the rotary table;
the second scanning mechanism is used for driving the second probe to do circular arc motion in the vertical direction, so that the second probe can scan and test the to-be-tested antenna on a circular arc track, and spherical scanning and testing can be performed on the to-be-tested antenna at a testing frequency band corresponding to the second probe by matching with rotation of the rotary table.
5. The spherical scanning test system of claim 4, wherein the first scanning mechanism and the second scanning mechanism are both circular arc-shaped guide rails, and are fixedly connected or integrated.
6. The spherical scanning test system of claim 5 wherein the first and second scanning mechanisms together form an axisymmetric circular arc shaped guide.
7. The spherical scanning test system of claim 1 wherein said second probe is removably mounted to said scanning mechanism by a probe pointing adjustment mechanism;
and the probe pointing adjusting mechanism is used for adjusting the pointing direction of the second probe so as to enable the pointing direction of the second probe to be aligned with the phase center of the antenna to be tested.
8. The spherical scan test system of claim 1, further comprising: testing the instrument;
each first probe and each second probe are respectively connected with the test instrument.
9. The spherical scanning test system according to claim 8, wherein said test meter is connected to at least two of said first probes through a radio frequency switch, said radio frequency switch being configured to switch each of said first probes to implement a sampling mode in which each of said first probes scans one by one.
10. The spherical scanning test system of claim 8, wherein each of the first probes is connected to a port of the test instrument, respectively, to implement a sampling mode in which each of the first probes scans concurrently in parallel.
11. The spherical scan test system of claim 1, further comprising: an anechoic chamber;
the probe, the scanning mechanism and the rotary table are arranged in the anechoic chamber, and the anechoic chamber is used for providing an electromagnetic environment required by testing.
12. The spherical scanning test system of claim 1, wherein the test frequency band of the first probe is not higher than 40GHz.
13. The spherical scanning test system of claim 1, wherein the second probe has a test frequency band not lower than 40GHz.
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| CN202211616558.3A CN115792414A (en) | 2022-12-15 | 2022-12-15 | Spherical scanning test system |
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| CN202211616558.3A CN115792414A (en) | 2022-12-15 | 2022-12-15 | Spherical scanning test system |
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| CN202211616558.3A Pending CN115792414A (en) | 2022-12-15 | 2022-12-15 | Spherical scanning test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116366175A (en) * | 2023-05-26 | 2023-06-30 | 北京星河亮点技术股份有限公司 | Power measurement method, device, system, electronic equipment and storage medium |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116366175A (en) * | 2023-05-26 | 2023-06-30 | 北京星河亮点技术股份有限公司 | Power measurement method, device, system, electronic equipment and storage medium |
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