CN115694355A - Battery piece PID test method - Google Patents
Battery piece PID test method Download PDFInfo
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- CN115694355A CN115694355A CN202110842095.1A CN202110842095A CN115694355A CN 115694355 A CN115694355 A CN 115694355A CN 202110842095 A CN202110842095 A CN 202110842095A CN 115694355 A CN115694355 A CN 115694355A
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- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The application provides a PID (proportion integration differentiation) testing method of a battery piece, which comprises the steps of electrically connecting a conductive piece with a testing piece to be tested, wherein the testing piece to be tested comprises the battery piece to be tested and a sodium ion layer, and electrically connecting the conductive piece with a power supply device; heating the test piece to be tested to ensure that the power supply device outputs direct current voltage to the conductive piece after the test piece to be tested reaches a preset temperature, and closing the power supply device after the preset time is reached; detaching the battery piece to be tested from the test piece to be tested; testing the electrical parameters of the disassembled cell to be tested, and calculating to obtain an attenuation value; irradiating the battery piece to be tested for a first preset time by adopting an ambient light source in a preset environment to recover the efficiency of the battery, and then testing the photovoltaic efficiency of the battery piece to be tested to obtain a group of attenuation values of the battery piece to be tested; and repeating the steps on the same battery piece to be tested to obtain a plurality of groups of attenuation values of the battery piece to be tested. The PID testing method for the battery piece can solve the problem that the PID testing method in the prior art is low in accuracy.
Description
[ technical field ] A method for producing a semiconductor device
The invention relates to the technical field of photovoltaic cells, in particular to a cell PID test method.
[ background of the invention ]
The PID effect (Potential Induced Degradation) is collectively referred to as Potential Induced attenuation. In order to prevent the risk of electric shock and inhibit electrochemical corrosion of the frame of the photovoltaic module, the frame of the module is usually grounded, so that a potential difference is formed between the cell and the frame of the module in the photovoltaic module, and the potential difference can cause the efficiency of the module to be attenuated, thereby influencing the photovoltaic conversion efficiency of the solar cell. Specifically, the attenuation is mainly caused by that sodium ions contained in glass serving as an encapsulation material cause leakage current between the glass and the encapsulation material under the driving action of the potential difference, a large amount of charges are accumulated on the surface of a cell, so that the passivation effect of the surface of the cell is poor, and the electrical performance of the solar cell is reduced. In order to solve the problem, various methods for resisting the PID effect are designed by each photovoltaic manufacturer, and in order to verify the effectiveness of each method for resisting the PID effect, a PID attenuation test needs to be carried out on the solar cell.
In the prior art, the PID attenuation test is usually carried out on an individual cell, but the accuracy of the test result obtained by carrying out the PID test on a single cell is not high.
[ summary of the invention ]
In view of this, the present application provides a method for testing PID of a battery slice, so as to solve the problem in the prior art that the accuracy of the PID testing method is not high.
The application provides a battery piece PID test method, which comprises the following steps:
s1, electrically connecting a conductive piece with a test piece to be tested, wherein the test piece to be tested comprises a battery piece to be tested and a sodium ion layer, and electrically connecting the conductive piece with a power supply device; s2, heating the test piece to be tested to enable the power supply device to output direct-current voltage to the conductive piece after the test piece to be tested reaches a preset temperature, and turning off the power supply device after the preset time is reached; s3, detaching the battery piece to be tested from the test piece to be tested; s4, testing the electrical parameters of the disassembled battery piece to be tested, and calculating to obtain an attenuation value; s5, irradiating the battery piece to be tested for a first preset time by adopting an ambient light source in a preset environment to recover the efficiency of the battery, and then testing the photovoltaic efficiency of the battery piece to be tested to obtain a group of attenuation values of the battery piece to be tested; and repeating the steps S1-S5 on the same battery piece to be tested to obtain a plurality of groups of attenuation values of the battery piece to be tested.
After adopting above-mentioned technical scheme, beneficial effect is:
by carrying out PID test for a plurality of times through the test piece to be tested, the test error caused by additional factors or misoperation in single test can be avoided, and a more accurate and reliable PID test result can be obtained.
Additional features and advantages of embodiments of the present application will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by the practice of embodiments of the present application. The objectives and other advantages of the embodiments of the application will be realized and attained by the structure particularly pointed out in the written description and drawings.
[ description of the drawings ]
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive labor.
FIG. 1 is a flow chart of a PID testing method provided in an embodiment of the present application;
fig. 2 is a structural diagram of a PID testing apparatus according to an embodiment of the present application.
Reference numerals:
100-potential induced degradation testing device for solar cell;
1-a test piece to be tested;
11-a first glass piece;
12-a first film element;
13-a battery piece to be tested;
14-a second film member;
15-a protective element;
2-extruding the module;
21-a metal plate;
22-a drive member;
3-a voltage loading module;
31-a power supply;
32-a conductive member;
33-displacement module.
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and together with the description, serve to explain the principles of the application.
[ detailed description ] A
In order to better understand the technical solution of the present application, the following detailed description is made with reference to the accompanying drawings.
It should be understood that the embodiments described are only a few embodiments of the present application, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The terminology used in the embodiments of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in the examples of this application and the appended claims, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It should be understood that the term "and/or" as used herein is merely one type of association that describes an associated object, meaning that three relationships may exist, e.g., a and/or B may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" herein generally indicates that the former and latter related objects are in an "or" relationship.
It should be noted that the directional terms such as "upper", "lower", "left", "right", etc. described in the embodiments of the present application are described in the angles shown in the drawings, and should not be construed as limiting the embodiments of the present application. In addition, in this context, it will also be understood that when an element is referred to as being "on" or "under" another element, it can be directly on "or" under "the other element or be indirectly on" or "under" the other element via an intermediate element.
The following describes a specific embodiment of the structure of the PID testing method for a battery cell according to the embodiment of the present application.
The application provides a battery piece PID test method, which comprises the following steps:
s1, electrically connecting a conductive piece with a test piece to be tested, wherein the test piece to be tested comprises a battery piece to be tested and a sodium ion layer, and electrically connecting the conductive piece with a power supply device;
in the step S1, the test piece to be tested includes a battery piece to be tested and a sodium ion layer, and the sodium ion layer may be glass containing sodium ions, a brine layer containing sodium ions, or the like. Specific examples are given below:
(1) The battery piece to be tested, the adhesive film and the glass are stacked in sequence, the battery piece to be tested and the glass are connected through the conductive piece, the power supply device conducts electricity to the battery piece to be tested and the glass through the conductive piece, so that potential difference is generated between the battery piece to be tested and the glass, and the adhesive film can be made of high polymer materials such as EVA (ethylene-vinyl acetate copolymer), POE (polyolefin elastomer), EPE (expandable polyethylene) and the like.
(2) The battery piece to be tested is attached to the metal plate, the sodium ion solution is arranged on any surface of the battery piece to be tested, the battery piece to be tested and the metal plate are connected through the conductive piece, and the power supply device is used for electrifying the battery piece to be tested and the metal plate through the conductive piece, so that potential difference is generated between the battery piece to be tested and the metal plate.
(3) The method comprises the following steps of stacking a first glass piece, a first adhesive film piece, a battery piece to be tested, a second adhesive film piece and a protection piece in sequence to form a testing piece to be tested, wherein the protection piece can be glass or a back plate, the testing piece to be tested is clamped between two grounding metal plates, the anode and the cathode of the battery piece to be tested are connected through a conductive piece, a power supply device is powered on the anode and the cathode of the battery piece to be tested through the conductive piece, potential differences are generated between the front surface and the back surface of the battery piece to be tested and the two metal plates respectively, and then the front surface and the back surface of the battery piece to be tested are subjected to attenuation testing simultaneously.
In one embodiment, the conductive member is connected to the positive main grid and/or the negative main grid of the battery piece to be tested, the conductive member may be a metal wire or a metal sheet, and since at least a part of the conductive member is clamped in the test piece to be tested, the thinner the thickness of the conductive member, the flatter the whole test piece to be tested, and the test precision can be correspondingly improved. The power supply device is used for applying a voltage of-3000V to-9000V to the conducting element, and in one embodiment, the voltage value output by the power supply device is-6000V and-7500V. A grounded metal plate can be arranged on one surface of the sodium ion layer far away from the battery piece to be tested, and the metal plate can be an aluminum plate, a copper plate or a metal plate containing at least one of aluminum or copper.
When stacking the battery piece to be tested and the sodium ion layer, the surface of the battery piece to be tested with low PID attenuation can be arranged towards the ambient light source, for example: when the battery piece to be tested is a P-type battery, arranging the front side of the P-type battery towards an ambient light source; when the battery piece to be tested is an N-type battery, arranging the back surface of the N-type battery towards an ambient light source; and when the battery piece to be tested is a back contact battery, arranging the front side of the back contact battery towards an ambient light source.
S2, heating a to-be-tested piece to enable the power supply device to output direct-current voltage to the conductive piece after the to-be-tested piece reaches a preset temperature, and turning off the power supply device after preset time is reached;
in the step S2, the test piece to be tested is maintained at a temperature of 45 to 60 degrees celsius during the heating process, then the power supply device outputs a dc voltage to the conductive piece, and turns off the power supply device after a predetermined time is reached, the power supply device may be a common dc power supply, the power supply device may provide a positive bias or a negative bias as required, where the voltage is limited to prevent the test piece to be tested from being punctured by an excessively high voltage, and besides, when the loading voltage is excessively high, the recovery degree after the battery is attenuated is small, and there is a difference with the component end. The voltage output by the power supply device to the conductive piece is between-3000V and-9000V, and in one embodiment, the power supply device outputs a voltage of-6000V or-7500V. The duration of the voltage applied to the conductive member by the power supply device can be 3.5 hours, 4 hours or 5 hours, and the power supply device is turned off when the loading time reaches the expected value.
S3, detaching the battery piece to be tested from the test piece to be tested;
in the step S3, the cell to be tested is removed from the test piece to be tested, and the cell to be tested can be shielded to some extent in the removal process, because the cell to be tested can recover to some extent the photovoltaic conversion efficiency after being illuminated by some extent after the attenuation step, the cell to be tested is found in the industry only through experiments, and no specific theory is provided. Therefore, in order to avoid the influence of the light restoration effect, in this embodiment, the light-shielding treatment is performed on the battery piece to be tested when the battery piece to be tested is taken out.
In one embodiment, the battery piece to be tested is taken out of the test piece to be tested and placed in the dark box, and the step S4 is performed on the battery piece to be tested within a second preset time, where the second preset time may be 1 hour.
S4, testing the electrical parameters of the disassembled cell to be tested, and calculating to obtain an attenuation value;
in the step S4, an I-V tester can be used to measure and calculate the cell to be tested removed in the sampling step, the data is measured and calculated to obtain the front and/or back photovoltaic conversion efficiency of the attenuated cell to be tested, and the attenuation value is obtained by subtracting the photovoltaic conversion efficiency of the attenuated cell to be tested from the photovoltaic conversion efficiency of the initial cell to be tested, wherein the I-V tester has been calibrated and verified before use to ensure the accuracy of the I-V tester. The photovoltaic conversion efficiency of the initial cell to be measured can be measured and calculated by using an I-V testing machine in any step before the attenuation step, so that the data is more accurate; the photovoltaic conversion efficiency value calibrated when the battery piece to be tested leaves the factory can be directly taken as the photovoltaic conversion efficiency of the initial battery piece to be tested, so that the test time can be saved, and the test efficiency can be improved.
S5, irradiating the battery piece to be tested for a first preset time by adopting an ambient light source in a preset environment to recover the efficiency of the battery to 99-100% of the initial efficiency, and then carrying out photovoltaic efficiency test on the battery piece to be tested to obtain a group of attenuation values of the battery piece to be tested, wherein the group of attenuation values can be any one of attenuation values of the front surface and the back surface of the battery, can also be two attenuation values of the front surface and the back surface of the battery, and can also be a plurality of attenuation values of the battery; in the process of irradiating the cell to be tested by adopting an ambient light source, the preset environment can be 1000W/m 2 And 55-65 ℃; the first preset time may be 20 to 30 minutes.
And repeating the steps S1-S5 to obtain multiple groups of attenuation values of the battery piece to be tested.
In one embodiment, the foregoing S1-S5 steps are repeated 2-4 times. In this way, multiple sets of data can be obtained.
In one embodiment, the test method further includes, after obtaining the plurality of sets of attenuation values, calculating differences between the plurality of sets of attenuation values, specifically calculating differences between opposite attenuation values in the plurality of sets of attenuation values, such as differences between a plurality of sets of front side attenuation values and/or differences between a plurality of sets of back side attenuation values, and if the differences between the plurality of sets of attenuation values are smaller than a preset value, using a mean value of any one or more sets of attenuation values in the plurality of sets of attenuation values; and if the difference value of the plurality of groups of attenuation values is larger than a preset value, checking the power supply device and/or the preset temperature.
It can be understood that when the difference value of the plurality of groups of attenuation values is smaller than the preset value, more accurate data can be obtained by calculating the average value, and the inaccuracy of the test result caused by the power supply device and the preset temperature error can be found in time by the above means.
In order to facilitate the attenuation test on the front side and the back side of the cell to be tested simultaneously, the first glass piece, the first adhesive film piece, the cell to be tested, the second adhesive film piece and the protection piece can be stacked in sequence to form the test piece to be tested, wherein the protection piece can be glass or a back plate, and therefore the attenuation test can be carried out on the front side and the back side of the cell to be tested simultaneously.
Some experimental data are given below:
in examples one to three, N-type solar cells were tested.
The first embodiment is as follows:
in the first embodiment, the PID test method in the present application is used to perform a PID test on an N-type battery piece to be tested, and the specific test steps are as follows:
a connecting step, arranging two grounded metal plates, electrically connecting a conductive piece with the anode and the cathode of the battery piece to be tested, and electrically connecting the conductive piece with a power supply device; stacking, namely stacking a first glass piece, a first adhesive film piece, a cell piece to be tested, a second adhesive film piece and a protection piece in sequence to form a test piece to be tested, and enabling the first glass piece and the protection piece to be respectively attached to the two metal plates, wherein the first adhesive film piece of the test piece to be tested is POE material, and the second adhesive film piece of the test piece to be tested is EVA material; the protection member is a back plate, in one embodiment, the back plate has a three-layer structure of a polyvinyl fluoride (PVF) film, a PET (polyethylene terephthalate) film and a PVF film, the outer protection layer of the polyvinyl fluoride film has good environmental corrosion resistance, and the middle layer of the polyvinyl fluoride film is a PET polyester film and has good insulating property. The attenuation step, namely enabling the power supply device to output direct current voltage to the conductive piece after the test piece to be tested reaches a preset temperature, and turning off the power supply device after the preset time is reached, wherein the power supply device outputs voltage of-6000V or-7500V and keeps the voltage for 5 hours after the test piece to be tested reaches 50 ℃; a sampling step, namely detaching the battery piece to be tested from the test piece to be tested; testing, namely testing the electrical parameters of the disassembled battery piece to be tested, and calculating to obtain a front side attenuation value of the battery; a recovery step at 1000W/m 2 Illuminating for 20-30 minutes at 55-65 ℃, and then carrying out photovoltaic efficiency test on the cell to be tested; and repeating the connecting step, the stacking step, the attenuating step, the sampling step, the testing step and the recovering step on the same battery piece to be tested to obtain a plurality of groups of battery front attenuation values of the battery piece to be tested.
Table one: n type battery PID test efficiency difference meter (1)
Example two:
in the second embodiment, the PID testing method in the present application is used to perform PID testing on the N-type cell to be tested, and the specific testing steps are as follows:
the test conditions differ from those of example one in that in the attenuation step, the test piece to be tested was supplied with a voltage of-7500V for 3.5 hours after reaching 50 ℃.
A second table: n type battery PID testing efficiency difference meter (2)
Example three:
in the third embodiment, the PID test method in the present application is used to perform PID test on the N-type battery piece to be tested, and the specific test steps are as follows:
the test conditions differ from those of example one in that: in the stacking step, a first adhesive film piece of the test piece to be tested is made of an EPE material, and a second adhesive film piece of the test piece to be tested is made of an EVA material; in the attenuation step, the power supply device outputs a voltage of-6000V or-7500V after the temperature of the test piece to be tested reaches 50 ℃ and keeps the voltage for 4 hours.
Table three: n type battery PID testing efficiency difference meter (3)
According to the table I to the table III, the same N-type solar cell is tested for multiple times under different loading voltages, loading time and different adhesive film layer conditions, the difference values of multiple groups of attenuation values obtained through the multiple tests are within 1%, wherein the efficiency attenuation difference value calculation method is that the first group of attenuation values are subtracted from the second group of attenuation values; the PID testing method provided by the application has good consistency and stability on the testing result of the N-type battery under various different testing conditions.
In examples four to five, P-type solar cells were tested. Because the P-type solar cell has no recovery capability, the same P-type solar cell cannot be tested, recovered and secondarily tested. Therefore, a plurality of P-type solar cells with similar parameters are tested below to verify the availability of the PID testing method of the present application to P-type solar cells.
Example four:
in the fourth embodiment, the PID testing method in the present application is used to perform PID testing on the P-type battery piece to be tested, and the specific testing steps are as follows:
a connecting step, arranging two grounded metal plates, electrically connecting a conductive piece with the anode and the cathode of the battery piece to be tested, and electrically connecting the conductive piece with a power supply device; stacking, namely sequentially stacking a first glass piece, a first adhesive film piece, a battery piece to be tested, a second adhesive film piece and a protection piece to form a test piece to be tested, and enabling the first glass piece and the protection piece to be respectively attached to the two metal plates, wherein the first adhesive film piece and the second adhesive film piece of the test piece to be tested are both made of EVA materials, and the protection piece is a back plate; an attenuation step, namely enabling the power supply device to output direct current voltage to the conductive piece after the test piece to be tested reaches a preset temperature, and turning off the power supply device after the preset temperature is reached, wherein the power supply device outputs a voltage of-6000V and keeps the voltage for 4 or 5 hours after the test piece to be tested reaches 50 ℃; a sampling step, namely detaching the battery piece to be tested from the test piece to be tested; testing, namely testing the electrical parameters of the disassembled battery piece to be tested, and calculating to obtain an attenuation value; and performing the connecting step, the stacking step, the attenuating step, the sampling step, the testing step and the recovering step on another cell to be tested, and repeating the steps to finally obtain multiple groups of attenuation values of the multiple cells to be tested.
Table four: p type battery front and back PID test efficiency difference meter (1)
Example five:
in the fifth embodiment, the PID testing method in the present application is used to perform PID testing on the P-type battery piece to be tested, and the specific testing steps are as follows:
the test conditions differ compared to example four in that: in the attenuation step, the power supply device outputs a voltage of-6000V after the temperature of the test piece to be tested reaches 50 ℃, the voltage is kept for 4 hours, and the protection piece is replaced by a glass material from the back plate.
Table five: p type battery front and back PID test efficiency difference meter (2)
It can be known from the above tables three to five that the difference of the multiple test results of the multiple P-type solar cells under different loading voltages, loading times and different conditions of the adhesive film layers is still less than 5%, which proves that the PID test method provided by the present application has higher consistency and accuracy to the PID test result of the P-type solar cell to a certain extent.
Referring to fig. 2, the present application further provides a potential induced degradation testing apparatus 100 for a solar cell, which includes a pressing module 2 and a voltage loading module 3.
For example, the test module for testing the electrical performance parameters of the battery piece to be tested may be any test machine capable of testing the battery piece to be tested to obtain the photovoltaic conversion efficiency thereof, and in one embodiment, the test machine is a test machine conforming to the iets 62804-1 standard.
Referring to fig. 2, the test device 1 to be tested includes a protection member 15, a second adhesive film member 14, a cell 13 to be tested, a first adhesive film member 12 and a first glass member 11, which are sequentially disposed from bottom to top, wherein the first adhesive film member 12 and the second adhesive film member 14 may be made of polymer films such as EVA (ethylene vinyl acetate), POE (polyolefin elastomer), etc., the first glass member 11 may be made of ultra-white glass, and the protection member 15 may be made of glass, a transparent backplane or a white backplane.
It should be noted that the materials and structures of the first glass member 11, the first adhesive film member 12, the cell piece 13 to be tested, the second adhesive film member 14 and the protection member 15 in the test piece 1 should be as consistent as possible with those of the solar cell module, but different from the module, the test piece 1 to be tested is not laminated and can be separated from each other, so that more accurate test results can be obtained and the test efficiency is higher.
The extrusion module 2 comprises two metal plates 21 which are oppositely arranged up and down and grounded, the metal plates 21 can be made of aluminum or copper or any alloy containing at least one of the aluminum and the copper, the test piece 1 to be tested is placed between the two metal plates 21, and the two metal plates 21 are respectively abutted with the first glass piece 11 and the protection piece 15. In one embodiment, the metal plate 21 may be an aluminum plate of 1 kg to 10 kg, and the aluminum plate with a certain weight may be pre-pressed to the test piece 1 by its own weight to prevent the test piece 1 from shifting or tilting. Except the above-mentioned static pressure is produced to the dead weight of the aluminum plate in order to compress tightly the test piece 1 to be measured, can also add driving piece 22 in the extrusion module 2, this driving piece 22 can be motor torque dynamic control or pneumatic means control, driving piece 22 is connected with two metal sheets 21, driving piece 22 is used for changing the distance between two metal sheets 21 in order to compress tightly the test piece 1 to be measured, obviously, this kind of mode is higher to the extrusion precision and the extrusion degree of consistency of the test piece 1 to be measured in order to simulate the state of solar module end better. In the testing process, the extrusion precision and the extrusion uniformity required by the test piece 1 to be tested can be adjusted by adjusting the weight of the aluminum plate.
The voltage loading module 3 includes a power supply 31 and a conductive member 32, the conductive member 32 is electrically connected to the positive electrode and the negative electrode of the battery piece 13 to be tested, and the conductive member 32 is further electrically connected to the output end of the power supply 31. The conductive member 32 may be an ultra-thin metal sheet, and because the testing device 1 to be tested is pressed to a certain extent during testing to simulate the state of the solar module after lamination, in order to prevent the portion of the testing device 1 to be tested contacting with the conductive member 32 from generating a large stress during pressing, and also in order to reduce the influence of the conductive member 32 clamped in the testing device 1 to be tested on the electrical parameters of the testing device 1 itself, the thin metal sheet is selected as the conductive member as much as possible, so as to improve the stability and accuracy of the detection.
The material of the ultra-thin metal sheet may include at least one of iron, copper and silver, the thickness of the ultra-thin metal sheet is less than 100 micrometers, and the shape of the metal sheet is not limited, in one embodiment, the thickness of the conductive member 32 is between 30 micrometers and 50 micrometers, and in another embodiment, the shape of the metal sheet is fork-shaped, which is similar to the shape of the main grid of the battery. The conductive member 32 is electrically connected to the positive electrode and the negative electrode of the battery piece 13 to be tested, in one embodiment, the conductive member 32 is connected to the main gate of the battery piece 13 to be tested, and the contact area of the conductive member 32 with the positive electrode or the negative electrode of the battery is smaller than the area of the main gate of the battery piece 13 to be tested. The contact area of the conductive piece and the front surface of the battery piece to be tested accounts for 1-3% of the area of the front surface of the battery piece to be tested, and/or the contact area of the conductive piece and the back surface of the battery piece to be tested accounts for 1-3% of the area of the back surface of the battery piece to be tested. The reason for limiting the areas of the conductive parts on the front and back surfaces of the battery piece to be tested is that the conductive parts are generally opaque, and if the range of the conductive parts covering the front and back surfaces of the battery piece to be tested is too wide, the power generation efficiency of the battery piece to be tested can be obviously influenced, so that the accuracy of a result during testing is influenced.
It should be noted that, the electrodes of the back contact battery are all arranged on the back surface of the back contact battery, so the conductive component does not need to be arranged on the front surface of the back contact battery, and only needs to be connected with the positive electrode and the negative electrode on the back surface of the back contact battery, and the contact area of the conductive component and the back surface thereof accounts for 1% -3% of the area of the back surface thereof.
The power supply 31 may be any device capable of providing a dc voltage, and in one embodiment, the power supply 31 may provide a voltage between negative 10kv and positive 10kv, and may precisely adjust the voltage according to actual requirements.
In one embodiment, the voltage loading module further includes a displacement module 33, and the displacement module 33 is used for moving the conductive member to contact with the front surface and/or the back surface of the battery piece to be tested. The displacement module 33 can be a driving structure such as a telescopic cylinder and a manipulator, and can make the conductive piece contact with or separate from the front and/or back of the battery piece to be tested in preset time, so that the degree of automation in the testing process and the displacement precision of the conductive piece can be remarkably improved by arranging the displacement module 33, and the precision in the testing process is further improved.
In one embodiment, the device 100 for testing potential induced degradation of a solar cell further includes a temperature and humidity control module, which is used for controlling temperature and humidity of the testing device. This atmospheric control module can be controlled testing arrangement's temperature and humidity simultaneously, also can independent control temperature or humidity. The temperature and humidity environment of PID test standard can be better simulated by arranging the temperature and humidity control module, and the detection accuracy is improved.
In one embodiment, the extrusion module 2 may further include a temperature monitoring module, the temperature monitoring module is connected to the metal plate 21, the temperature monitoring module is configured to monitor the temperature of the metal plate 21, and the temperature monitoring module may be any device capable of detecting the temperature of the metal plate 21, so that when the temperature of the metal plate 21 reaches a preset value, the temperature monitoring module may transmit data to the control cabinet to perform the next operation.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. A method for testing PID of a battery piece is characterized by comprising the following steps:
s1, electrically connecting a conductive piece with a test piece to be tested, wherein the test piece to be tested comprises a battery piece to be tested and a sodium ion layer, and electrically connecting the conductive piece with a power supply device;
s2, heating a to-be-tested piece to enable the power supply device to output direct-current voltage to the conductive piece after the to-be-tested piece reaches a preset temperature, and turning off the power supply device after preset time is reached;
s3, detaching the battery piece to be tested from the test piece to be tested;
s4, testing the electrical parameters of the disassembled battery piece to be tested, and calculating to obtain an attenuation value;
s5, irradiating the battery piece to be tested for a first preset time by adopting an ambient light source in a preset environment to recover the efficiency of the battery, and then testing the photovoltaic efficiency of the battery piece to be tested to obtain a group of attenuation values of the battery piece to be tested;
and repeating the steps S1-S5 on the same battery piece to be tested to obtain multiple groups of attenuation values of the battery piece to be tested.
2. The method for testing the PID of the battery piece according to claim 1, wherein the steps S1-S5 are repeated 2-4 times.
3. The PID testing method of claim 1 or 2, further comprising calculating differences of a plurality of sets of attenuation values after obtaining the plurality of sets of attenuation values, and if the differences of the plurality of sets of attenuation values are smaller than a preset value, using a mean value of any one or more sets of the attenuation values; and if the difference value of the plurality of groups of attenuation values is smaller than a preset value, checking the power supply device and/or the preset temperature.
4. The PID testing method of the battery piece according to claim 1,
when the battery piece to be tested is a P-type battery, arranging the front side of the P-type battery towards an ambient light source; or
When the battery piece to be tested is an N-type battery, arranging the back surface of the N-type battery towards an ambient light source; or
And when the battery piece to be tested is a back contact battery, arranging the front side of the back contact battery towards an ambient light source.
5. The PID testing method of claim 1, wherein when the battery piece to be tested is detached from the testing piece, a shielding piece is placed on a surface of the battery piece to be tested, which faces a light source during testing, so as to shield the battery piece to be tested.
6. The PID testing method of claim 1, wherein the battery piece to be tested is detached from the testing piece and placed in a dark box, and the step S4 is performed on the battery piece to be tested within a second preset time.
7. The method for testing battery piece PID of claim 6, wherein the second predetermined time is less than 1 hour.
8. The method for testing the PID of the battery piece according to claim 1, wherein the DC voltage value is-3000V to-9000V in the process that the power supply device outputs the DC voltage.
9. The PID testing method of claim 1, wherein the preset temperature is 45-60 ℃ during heating of the test piece to be tested.
10. The PID testing method of claim 1, wherein the preset environment is 1000W/m during the irradiation of the battery piece to be tested with the environment light source 2 And 55-65 ℃; and/or
The first preset time is 20-30 minutes.
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| CN202110842095.1A CN115694355A (en) | 2021-07-26 | 2021-07-26 | Battery piece PID test method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118311441A (en) * | 2024-06-07 | 2024-07-09 | 青岛艾诺仪器有限公司 | Power supply control method for adjusting self-discharge test speed of battery and battery test device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118311441A (en) * | 2024-06-07 | 2024-07-09 | 青岛艾诺仪器有限公司 | Power supply control method for adjusting self-discharge test speed of battery and battery test device |
| CN118311441B (en) * | 2024-06-07 | 2024-08-13 | 青岛艾诺仪器有限公司 | Power supply control method for adjusting self-discharge test speed of battery and battery test device |
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