CN115541971B - System and method for detecting communication TTL level sent by semiconductor tester - Google Patents
System and method for detecting communication TTL level sent by semiconductor tester Download PDFInfo
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- CN115541971B CN115541971B CN202211473171.7A CN202211473171A CN115541971B CN 115541971 B CN115541971 B CN 115541971B CN 202211473171 A CN202211473171 A CN 202211473171A CN 115541971 B CN115541971 B CN 115541971B
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract
The invention discloses a system and a method for detecting communication TTL level sent by a semiconductor tester, wherein the system comprises a plurality of test branches, each test branch comprises a TTL signal interface, an indicator lamp I, a pull-up resistor, an indicator lamp II and a pull-down resistor, and the indicator lamp I and the indicator lamp II are connected to the TTL signal interface in parallel; one end of the pull-up resistor is connected with the anode of the power supply, and the other end of the pull-up resistor is connected with the first indicator lamp; one end of the pull-down resistor is connected with the grounding end, and the other end of the pull-down resistor is connected with the first indicator lamp. The invention has the advantages of convenient debugging and simple operation, and can detect signals in batch, reduce the labor intensity and reduce the cost.
Description
Technical Field
The invention relates to a communication TTL level detection system and method sent by a semiconductor tester, belonging to the technical field of semiconductor testing.
Background
The existing semiconductor tester adopts two methods, one is to use an oscilloscope to detect the actual waveform, and the other is to directly connect a sorting machine to detect the signal.
According to the scheme of the oscilloscope, due to the limitation of the number of the channels of the oscilloscope, different signal lines need to be selected one by one to complete the detection of signals of all the channels, generally, one testing machine has at least 32 TTL signals, so that the test points of the probe need to be replaced continuously, the testing time is long, a tester can do tedious actions repeatedly, and certain technical bases are required for the tester to operate the oscilloscope and see the waveform.
Utilize the sorter to detect, the sorter price is more expensive on the one hand, in addition because the inconvenient removal of the weight of equipment itself has caused the restriction to the detection of volume production in-process anytime and anywhere.
Disclosure of Invention
The invention aims to: aiming at the defects of long test time and high cost in the prior art, the invention provides a communication TTL level detection system and a communication TTL level detection method sent by a semiconductor test machine, which can realize the rapid completion of the detection of such signals. And can detect at any time and any place.
The technical scheme is as follows: in order to realize the purpose, the invention adopts the technical scheme that:
a communication TTL level detection system sent by a semiconductor testing machine comprises a plurality of testing branches, wherein each testing branch comprises a TTL signal interface, a first indicator lamp, a pull-up resistor, a second indicator lamp and a pull-down resistor, and the first indicator lamp and the second indicator lamp are connected to the TTL signal interface in parallel; one end of the pull-up resistor is connected with the anode of the power supply, and the other end of the pull-up resistor is connected with the first indicator light; one end of the pull-down resistor is connected with the grounding end, and the other end of the pull-down resistor is connected with the first indicator lamp.
Preferably: when the TTL signal voltage output by the TTL signal interface is high voltage, the TTL signal voltage with the high voltage is equal to the voltage of the anode of the power supply; and when the TTL signal voltage output by the TTL signal interface is low voltage, the low-voltage TTL signal voltage is equal to the voltage of the grounding end.
Preferably: the number of the test branches is at least 32.
Preferably: the first indicator light and the second indicator light are both light emitting diodes.
A method for detecting communication TTL level sent by a semiconductor tester adopts a communication TTL level detection system sent by the semiconductor tester, and comprises the following steps:
step 1, connecting different pins of a tester with TTL signal interfaces of different test branches;
step 2, if the low level set by the tester is effective, under the default condition, the TTL signal is high voltage, the voltage of the high voltage TTL signal and the voltage of the power supply anode are the same voltage value, under the condition, the indicator light is in a non-lighting state, and the indicator light is in a lighting state; then entering step 3;
step 5, clicking a sending button on the test machine software, and sending a high-level TTL signal to a TTL signal interface by the test machine; the high-level TTL signal can not drive the first indicator lamp connected with the pull-up resistor, but can drive the second indicator lamp connected with the pull-down resistor, the high-level TTL signal becomes the voltage of the positive electrode of the power supply, the first indicator lamp becomes a turned-off state at the moment, and the second indicator lamp becomes a luminous state; and judging whether the function of the high-level effective circuit for sending the TTL signals of the tester is correct or not by checking the state changes of the indicator lamp I and the indicator lamp II.
Preferably: and sequentially sending TTL signals of different pins, and finishing the judgment of all the TTL signals through the state changes of the indicator lamp I and the indicator lamp II of the test branch corresponding to the different pins.
Compared with the prior art, the invention has the following beneficial effects:
the invention utilizes the signal of low level to judge that the signal is low level by driving the signal lamp of pull-up resistor to emit light instead of driving the signal lamp of pull-down resistor. The signal at high level is determined by driving the signal lamp connected to the pull-up resistor to emit light, instead of driving the signal lamp connected to the pull-down resistor to emit light. Therefore, the invention not only has convenient debugging and simple operation, but also can detect signals in batch, reduce the labor intensity and reduce the cost.
Drawings
Fig. 1 is a schematic diagram of TTL signal detection.
Fig. 2 is a schematic diagram of a detection system according to an embodiment of the invention.
Detailed Description
The present invention is further illustrated by the following description in conjunction with the accompanying drawings and the specific embodiments, it is to be understood that these examples are given solely for the purpose of illustration and are not intended as a definition of the limits of the invention, since various equivalent modifications will occur to those skilled in the art upon reading the present invention and fall within the limits of the appended claims.
A communication TTL level detection system sent by a semiconductor tester is shown in figures 1 and 2 and comprises a plurality of test branches, wherein the number of the test branches is at least 32, and the number of the branches is more than or equal to the number of pins of a TTL signal of the semiconductor tester. As shown in fig. 1, the test branch includes a TTL signal interface, a first indicator light, a pull-up resistor, a second indicator light, and a pull-down resistor, where the first indicator light and the second indicator light are connected in parallel to the TTL signal interface. The first indicator light and the second indicator light are both light emitting diodes. One end of the pull-up resistor is connected with the positive electrode of the power supply, and the other end of the pull-up resistor is connected with the first indicator lamp. One end of the pull-down resistor is connected with the grounding end, and the other end of the pull-down resistor is connected with the first indicator lamp. And when the TTL signal voltage output by the TTL signal interface is high voltage, the high-voltage TTL signal voltage is equal to the voltage of the anode of the power supply. And when the TTL signal voltage output by the TTL signal interface is low voltage, the low-voltage TTL signal voltage is equal to the voltage of the grounding end.
The invention utilizes the signal of low level, can not drive the second signal lamp connected with the pull-down resistor, but can drive the signal lamp of the pull-up resistor to illuminate the first signal lamp, to judge the signal is low level; that is, in fig. 1, the first indicator light (forward led) connected to the pull-up resistor is turned on, and the second indicator light (forward led) connected to the pull-down resistor is turned off, so that the TTL signal is determined to be a low-level signal (a voltage close to GND).
The signal of high level is judged by utilizing the signal of high level, the signal lamp I connected with the pull-up resistor can not be driven, and the signal lamp connected with the pull-down resistor can be driven to emit light II; that is, in fig. 1, the first indicator light (forward led) next to the pull-up resistor is turned off, and the second indicator light (forward led) next to the pull-down resistor is turned on, so that it is determined that the TTL signal is a high level signal (voltage close to VCC).
A method for detecting communication TTL level sent by a semiconductor tester adopts a communication TTL level detection system sent by the semiconductor tester, and comprises the following steps:
and step 1, connecting different pins of the tester with TTL signal interfaces of different test branches.
And 2, if the low level set by the tester is effective, under the default condition, the TTL signal is high voltage, the voltage of the high voltage TTL signal and the voltage of the positive electrode of the power supply are the same voltage value, and under the condition, the indicator lamp is in a non-lighting state, and the indicator lamp is in a lighting state. Then step 3 is entered.
And 3, clicking a sending button on the tester software, and sending a low-level TTL signal to a TTL signal interface by the tester. The low-level TTL signal can not drive the indicator light II connected with the pull-down resistor, but can drive the indicator light I of the pull-up resistor, the low-level TTL signal is changed into the voltage of the grounding end, at the moment, the indicator light I can be in a luminous state, and the indicator light II is changed into a turn-off state. And judging whether the function of the low-level effective circuit of the test machine for sending the TTL signal is correct or not by checking the state change of the indicator lamp I and the indicator lamp II.
And 4, if the high level set by the tester is effective, under the default condition, the TTL signal is low voltage, the voltage of the low voltage TTL signal and the voltage of the grounding end are the same voltage value, under the condition, the indicator lamp is in a luminous state, and the indicator lamp is in a non-luminous state. Then step 5 is entered.
And 5, clicking a sending button on the tester software, and sending a high-level TTL signal to a TTL signal interface by the tester. The high-level TTL signal can not drive the first indicator lamp connected with the pull-up resistor, but can drive the second indicator lamp connected with the pull-down resistor, the high-level TTL signal becomes the voltage of the positive electrode of the power supply, the first indicator lamp becomes a turned-off state at the moment, and the second indicator lamp becomes a luminous state. And judging whether the function of the high-level effective circuit for sending the TTL signals of the tester is correct or not by checking the state change of the indicator lamp I and the indicator lamp II.
And 6, repeating the steps 2-5, sequentially sending TTL signals of different pins, and finishing the judgment of all TTL signals through the state changes of the indicator lamp I and the indicator lamp II of the test branch corresponding to different pins.
The above description is only of the preferred embodiments of the present invention, and it should be noted that: it will be apparent to those skilled in the art that various modifications and adaptations can be made without departing from the principles of the invention, and such modifications and adaptations are intended to be within the scope of the invention.
Claims (4)
1. A communication TTL level detection method sent by a semiconductor tester adopts a communication TTL level detection system sent by the semiconductor tester, and is characterized in that: the communication TTL level detection system sent by the semiconductor testing machine comprises a plurality of test branches, each test branch comprises a TTL signal interface, an indicator light I, a pull-up resistor, an indicator light II and a pull-down resistor, and the indicator light I and the indicator light II are connected to the TTL signal interfaces in parallel; one end of the pull-up resistor is connected with the anode of the power supply, and the other end of the pull-up resistor is connected with the first indicator lamp; one end of the pull-down resistor is connected with the grounding end, and the other end of the pull-down resistor is connected with the second indicator lamp;
when the TTL signal voltage output by the TTL signal interface is high voltage, the high-voltage TTL signal voltage is equal to the voltage of the positive electrode of the power supply; when the voltage of the TTL signal output by the TTL signal interface is low voltage, the voltage of the low-voltage TTL signal is equal to the voltage of the grounding terminal;
the signal lamp connected with the pull-down resistor can not be driven by a low-level signal, but can be driven by the pull-up resistor to emit light, so that the signal is judged to be at a low level; the signal is judged to be high level by using the signal of high level, which can not drive the signal lamp connected with the pull-up resistor, but can drive the signal lamp connected with the pull-down resistor to emit light, and the method comprises the following steps:
step 1, connecting different pins of a tester with TTL signal interfaces of different test branches;
step 2, if the low level set by the tester is effective, under the default condition, the TTL signal is high voltage, the voltage of the high voltage TTL signal and the voltage of the power supply anode are the same voltage value, under the condition, the indicator light is in a non-lighting state, and the indicator light is in a lighting state; then entering step 3;
step 3, clicking a sending button on the test machine software, and sending a low-level TTL signal to a TTL signal interface by the test machine; the low-level TTL signal can not drive an indicator lamp II connected with a pull-down resistor, but can drive an indicator lamp I connected with a pull-up resistor, the low-level TTL signal is changed into the voltage of a grounding end, the indicator lamp I can be in a light-emitting state at the moment, and the indicator lamp II is changed into a light-out state; judging whether the function of a low-level effective circuit for sending TTL signals of the tester is correct or not by checking the state changes of the indicator lamp I and the indicator lamp II;
step 4, if the high level set by the tester is effective, under the default condition, the TTL signal is low voltage, the voltage of the low voltage TTL signal and the voltage of the grounding end are the same voltage value, under the condition, the indicator light is in a light-emitting state, and the indicator light is in a non-light state; then entering step 5;
step 5, clicking a sending button on the test machine software, and sending a high-level TTL signal to a TTL signal interface by the test machine; the high-level TTL signal can not drive the first indicator light connected with the pull-up resistor, but can drive the second indicator light connected with the pull-down resistor, the high-level TTL signal becomes the voltage of the positive pole of the power supply, at the moment, the first indicator light becomes a turned-off state, and the second indicator light becomes a luminous state; and judging whether the function of the high-level effective circuit for sending the TTL signals of the tester is correct or not by checking the state change of the indicator lamp I and the indicator lamp II.
2. The method of claim 1, wherein the TTL level detection is transmitted to the semiconductor tester as: the number of the test branches is at least 32.
3. The method of claim 2, wherein the TTL level detection is sent from the semiconductor tester: the first indicator light and the second indicator light are both light emitting diodes.
4. The method of claim 3, wherein the TTL level detection is sent from the semiconductor tester: and sequentially sending TTL signals of different pins, and finishing the judgment of all the TTL signals through the state changes of the indicator lamp I and the indicator lamp II of the test branch corresponding to the different pins.
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| US6573753B1 (en) * | 2001-07-20 | 2003-06-03 | Cypress Semiconductor Corporation | Microcontroller input/output nodes with both programmable pull-up and pull-down resistive loads and programmable drive strength |
| DE10201779A1 (en) * | 2002-01-17 | 2003-07-31 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Control gear for light emitting diodes |
| JP2006140710A (en) * | 2004-11-11 | 2006-06-01 | Fujitsu Ten Ltd | Device and system for communication, and arbitrating method for communication |
| WO2008146073A1 (en) * | 2007-06-01 | 2008-12-04 | Nokia Corporation | Disconnection detection of electronic devices |
| CN103344908A (en) * | 2013-06-26 | 2013-10-09 | 黄宇嵩 | Four-state level measuring set |
| CN205003195U (en) * | 2015-09-06 | 2016-01-27 | 湖南铁道职业技术学院 | Logic level indicating circuit |
| CN106535413A (en) * | 2016-12-21 | 2017-03-22 | 西南交通大学 | LED indication lamp monitoring system |
| CN106771777B (en) * | 2017-01-20 | 2023-02-24 | 江苏恒力化纤股份有限公司 | Inverter driving signal detection device of frequency converter |
| CN107091981A (en) * | 2017-06-15 | 2017-08-25 | 深圳市沃特沃德股份有限公司 | Indicator lamp controls the test system of drive circuit |
| CN216483383U (en) * | 2021-09-22 | 2022-05-10 | 成都声浮科技有限公司 | Ultrasonic water meter mainboard test fixture system |
| CN217060798U (en) * | 2022-03-21 | 2022-07-26 | 章鱼博士智能技术(上海)有限公司 | TTL level signal acquisition circuit |
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Address after: 210000 floor 2, building 26, South Park, Jiangsu Kecheng science and Technology Industrial Park, No. 19, Lanhua Road, Pukou District, Nanjing, Jiangsu Province Applicant after: Nanjing Hongtai Semiconductor Technology Co.,Ltd. Address before: 210000 floor 2, building 26, South Park, Jiangsu Kecheng science and Technology Industrial Park, No. 19, Lanhua Road, Pukou District, Nanjing, Jiangsu Province Applicant before: Nanjing Hongtai Semiconductor Technology Co.,Ltd. |
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