CN115436744A - S parameter testing system based on TDD technology - Google Patents
S parameter testing system based on TDD technology Download PDFInfo
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- CN115436744A CN115436744A CN202211026704.7A CN202211026704A CN115436744A CN 115436744 A CN115436744 A CN 115436744A CN 202211026704 A CN202211026704 A CN 202211026704A CN 115436744 A CN115436744 A CN 115436744A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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Abstract
The invention discloses an S parameter testing system based on TDD technology, comprising: the data master control center: the system comprises a server, a data processing unit and a data processing unit, wherein the server is used for sending software control instructions and data; a test module: the data master control center is connected with the test equipment and used for receiving the data uploaded by the test equipment and sending test information to the test equipment; a triggering module: connecting a trigger device and sending trigger information to a data master control center; NG area: for collecting products that do not meet the test criteria. This kind of S parameter test system based on TDD technique, many produce the line down, every is produced the line and all has different processes, and every process all has the possibility to produce the problem of stopping the line at random to influence and produce the line test equipment rate of utilization, a plurality of production lines use same equipment, and a plurality of trigger device that design are connected on test equipment, can improve equipment utilization ratio, and the idle condition of many equipments can not appear and take place.
Description
Technical Field
The invention relates to the technical field of product parameter testing systems, in particular to an S parameter testing system based on a TDD technology.
Background
With the increasing proliferation of the communication market, the market size is gradually enlarged. The method has the advantages that the maximum benefit is generated in limited resources, cost reduction and efficiency improvement are realized, due to the periodicity of product productivity, the dynamic property is generated on equipment, the equipment cannot meet the productivity in a peak period, and a lot of equipment is idle in a slack season, so that great waste is caused. TDD (Time Division Duplexing) is one of duplex technologies used in mobile communication technology, and corresponds to FDD, as a technology for distinguishing a radio channel in Time during downlink operation in a frame period and continuing uplink operation, and is a duplex mode of a communication system for separating a reception channel from a transmission channel in the mobile communication system. But different time slots in the time domain can be used in the test to transmit data out to the corresponding user. The data are transmitted to the cloud platform, the computing capacity, the big data processing capacity and the data mining capacity of big data integrated by the cloud platform can be greatly utilized, an analysis report of a tested product is obtained, one person tests a traditional device, the production line is abnormal, the device is in an idle state, and the device utilization rate is reduced, so that the S parameter testing system based on the TDD technology is improved.
Disclosure of Invention
In order to solve the technical problems, the invention provides the following technical scheme:
the invention relates to a S parameter testing system based on TDD technology, comprising:
the data master control center: the system comprises a server, a data processing unit and a data processing unit, wherein the server is used for sending software control instructions and data;
a test module: the data master control center is connected with the test equipment and used for receiving the data uploaded by the test equipment and sending test information to the test equipment;
a trigger module: connecting a trigger device and sending trigger information to a data master control center;
NG area: for collecting products that do not meet the test criteria.
As a preferred technical solution of the present invention, the data total control center includes a data storage module and a data display module, and the data total control center is connected to each trigger device respectively.
As a preferred technical solution of the present invention, the trigger device includes flip-flops, and the flip-flops are all connected in series with the test module.
As a preferred technical scheme of the invention, the test module waits for an instruction of the data master control center, when the instruction is received, the collected data is uploaded to a computer according to a certain sequencing rule, the computer performs data sampling according to a decoding rule, and the obtained data is stored.
As a preferred technical solution of the present invention, the trigger device obtains a product test condition determined by the test device, and after the test device determines the product test condition according to the data condition, the determined result is sent to the trigger, so as to provide preparation for the next step of the trigger.
As a preferred technical scheme of the invention, when the testing equipment detects the product, after the product is installed in place, the computer end receives the corresponding production line number, matches the corresponding product performance data in the memory, judges the performance of the tested product according to the performance index of the product, displays the performance parameter data in a curve mode, and uploads the parameter result to the server of the data master control center.
As a preferred technical solution of the present invention, after the test module finishes the detection, the trigger is triggered, if there is no quality problem, the system prompts the next group of product detection, and if there is quality problem, the product continues to be detected again on the installation jig or the trigger moves the installation jig to the NG area.
The beneficial effects of the invention are:
1. according to the S parameter testing system based on the TDD technology, under a plurality of production lines, each production line has different processes, and each process has the possibility of randomly generating a wire stopping problem, so that the utilization rate of production line testing equipment is influenced;
2. the S parameter testing system based on the TDD technology has the advantages that the product performance can be accurately detected, the product standard can be accurately grasped, the NG area is set, products which do not accord with the standard can be uniformly collected, the detected parameter data can be collected, and the basis can be found for later analysis.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention.
In the drawings:
FIG. 1 is a system diagram of an S-parameter testing system based on TDD technology;
fig. 2 is a flowchart of a testing system of an S parameter testing system based on TDD technology according to the present invention.
Detailed Description
The preferred embodiments of the present invention will be described in conjunction with the accompanying drawings, and it will be understood that they are described herein for the purpose of illustration and explanation and not limitation.
Example (b): as shown in fig. 1-2, the S parameter testing system based on TDD technology of the present invention includes:
the data master control center: the system comprises a server, a data processing unit and a data processing unit, wherein the server is used for sending software control instructions and data;
a test module: the data master control center is connected with the test equipment and used for receiving the data uploaded by the test equipment and sending test information to the test equipment;
a triggering module: connecting a trigger device and sending trigger information to a data master control center;
NG area: for collecting products that do not meet the test criteria.
The data master control center comprises a data storage module and a data display module, and the data master control center is connected with each trigger device respectively.
The trigger equipment comprises triggers which are all connected with the test module in series.
The testing module waits for an instruction of the data master control center, when the instruction is received, the collected data are uploaded to the computer according to a certain sequencing rule, the computer performs data sampling according to a decoding rule, and the obtained data are stored.
The trigger equipment acquires the product test condition judged by the test equipment, and after the test equipment judges the data condition, the judged result is sent to the trigger to provide preparation for the next step of the trigger.
When the product is detected by the testing equipment and installed in place, the computer end receives the corresponding production line number, matches the corresponding product performance data in the memory, judges the performance of the tested product according to the performance index of the product, displays the performance parameter data in a curve mode, and uploads the parameter result to the server of the data master control center.
And after the detection of the test module is finished, the trigger is touched, if no quality problem exists, the system prompts the next group of product detection, and if the quality problem exists, the product continues to be arranged on the installation jig for re-detection or the trigger moves the product to an NG area.
After the products on the production line are installed firstly, the computer end receives corresponding production line numbers, corresponding product performance data are matched in the memory, after the test module finishes the detection according to the performance indexes of the products, the trigger is triggered, if no quality problem exists, the system prompts the next group of product detection, if the quality problem exists, the products continue to be installed on the installation jig, the re-detection is carried out or the trigger moves the products to an NG area, the product performance after the test is judged, the performance parameter data are displayed in a curve mode, and the parameter results are uploaded to a server of a data master control center
Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (7)
1. An S parameter testing system based on TDD technology is characterized by comprising:
the data master control center: the system comprises a server, a data processing unit and a data processing unit, wherein the server is used for sending software control instructions and data;
a test module: the data master control center is connected with the test equipment and used for receiving the data uploaded by the test equipment and sending test information to the test equipment;
a trigger module: connecting a trigger device and sending trigger information to a data master control center;
NG area: for collecting products that do not meet the test criteria.
2. The TDD technology-based S parameter testing system of claim 1, wherein the data total control center comprises a data storage module and a data display module, and the data total control center is connected to each trigger device respectively.
3. The TDD technology-based S-parameter testing system of claim 1, wherein said trigger devices comprise flip-flops, and said flip-flops are connected in series with the testing module.
4. The TDD technology-based S parameter testing system of claim 1, wherein the testing module waits for an instruction from a data master control center, and when receiving the instruction, uploads the collected data to the computer according to a certain ordering rule, and the computer samples the data according to a decoding rule and stores the obtained data.
5. The TDD technology-based S parameter testing system of claim 1, wherein the trigger device obtains the product test condition determined by the test device, and after the test device determines according to the data condition, the determined result is sent to the trigger to prepare for the next step of the trigger.
6. The TDD technology-based S parameter testing system of claim 1, wherein when the testing device detects a product, after the product is installed in place, the computer receives a corresponding pipeline number, matches corresponding product performance data in the memory, determines the product performance after testing according to the product performance index, displays the performance parameter data in a curve mode, and uploads the parameter result to the server of the data master control center.
7. The TDD technology-based S parameter testing system of claim 1, wherein said testing module triggers the trigger after completing the testing, if there is no quality problem, the system prompts the next set of product testing, if there is quality problem, the product continues to be tested again on the installation fixture or the trigger moves it to NG area.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202211026704.7A CN115436744A (en) | 2022-08-25 | 2022-08-25 | S parameter testing system based on TDD technology |
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| CN202211026704.7A CN115436744A (en) | 2022-08-25 | 2022-08-25 | S parameter testing system based on TDD technology |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116760484A (en) * | 2023-08-22 | 2023-09-15 | 北京唯得科技有限公司 | Test system, method, medium and equipment of TDD system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116760484A (en) * | 2023-08-22 | 2023-09-15 | 北京唯得科技有限公司 | Test system, method, medium and equipment of TDD system |
| CN116760484B (en) * | 2023-08-22 | 2023-10-17 | 北京唯得科技有限公司 | Test system, method, medium and equipment of TDD system |
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