CN115210752A - 缺陷检测方法及装置、模型训练方法及装置及电子设备 - Google Patents

缺陷检测方法及装置、模型训练方法及装置及电子设备 Download PDF

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Publication number
CN115210752A
CN115210752A CN202180000097.4A CN202180000097A CN115210752A CN 115210752 A CN115210752 A CN 115210752A CN 202180000097 A CN202180000097 A CN 202180000097A CN 115210752 A CN115210752 A CN 115210752A
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training
model
rounds
data set
learning rate
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CN202180000097.4A
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Inventor
王耀平
李昭月
杨浩东
张美娟
柴栋
王洪
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BOE Technology Group Co Ltd
Beijing Zhongxiangying Technology Co Ltd
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BOE Technology Group Co Ltd
Beijing Zhongxiangying Technology Co Ltd
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Publication of CN115210752A publication Critical patent/CN115210752A/zh
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00Geometric image transformations in the plane of the image
    • G06T3/40Scaling of whole images or parts thereof, e.g. expanding or contracting
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/60Analysis of geometric attributes
    • G06T7/62Analysis of geometric attributes of area, perimeter, diameter or volume
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20081Training; Learning
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20084Artificial neural networks [ANN]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30164Workpiece; Machine component

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Geometry (AREA)
  • Image Analysis (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)

Abstract

本公开涉及缺陷检测技术领域,具体涉及一种缺陷检测方法及装置、模型训练方法及装置及电子设备,方法包括:获取包含缺陷产品数据的样本数据集,并识别样本数据集的特征信息,特征信息包括样本数据集的样本数量;获取初始模型,其中,初始模型为神经网络模型;基于特征信息配置训练参数;利用样本数据集,并根据训练参数对初始模型进行训练得到目标模型;将样本数据集对应的产品的真实数据输入到目标模型中得到产品的缺陷信息;其中,训练参数包括以下至少一种:学习率下降策略、训练总轮数和测试策略,其中学习率下降策略包括学习率下降次数和下降时的轮数;测试策略包括测试次数和测试时的轮数。本方案节约了人力资源。

Description

PCT国内申请,说明书已公开。

Claims (51)

  1. PCT国内申请,权利要求书已公开。
CN202180000097.4A 2021-01-28 2021-01-28 缺陷检测方法及装置、模型训练方法及装置及电子设备 Pending CN115210752A (zh)

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US (1) US20230206420A1 (zh)
EP (1) EP4141786A4 (zh)
JP (1) JP2024504529A (zh)
KR (1) KR20230135038A (zh)
CN (1) CN115210752A (zh)
WO (1) WO2022160222A1 (zh)

Cited By (1)

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Publication number Priority date Publication date Assignee Title
CN118094106A (zh) * 2024-04-02 2024-05-28 安徽农业大学 一种微调机制迁移学习的齿轮箱故障诊断方法

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US20230125983A1 (en) * 2021-10-26 2023-04-27 Capital One Services, Llc Systems and methods for detecting and managing sensitive information
CN115359307B (zh) * 2022-10-24 2023-01-03 成都诺比侃科技有限公司 一种基于大数据的接触网验损缺陷数据管理方法及***
WO2024087000A1 (en) * 2022-10-25 2024-05-02 Huawei Technologies Co., Ltd. Methods and apparatuses for articifical intelligence or machine learning training
CN116990450B (zh) * 2023-07-18 2024-04-26 欧几里德(苏州)医疗科技有限公司 一种角膜塑形镜的缺陷检测方法及***
CN117150298B (zh) * 2023-09-01 2024-06-07 中国电建集团江西省水电工程局有限公司 基于深度学习的地铁fas火灾报警***的调试方法

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WO2018090355A1 (zh) * 2016-11-21 2018-05-24 中国科学院自动化研究所 图像自动裁剪方法
CN106645180A (zh) * 2017-02-06 2017-05-10 东旭科技集团有限公司 检查基板玻璃缺陷的方法、现场终端及服务器
CN108961238A (zh) * 2018-07-02 2018-12-07 北京百度网讯科技有限公司 显示屏质量检测方法、装置、电子设备及存储介质
CN109559298A (zh) * 2018-11-14 2019-04-02 电子科技大学中山学院 一种基于深度学习的乳液泵缺陷检测的方法
CN110675789B (zh) * 2019-09-29 2021-09-14 联想(北京)有限公司 一种信息处理方法、***及计算机存储介质

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118094106A (zh) * 2024-04-02 2024-05-28 安徽农业大学 一种微调机制迁移学习的齿轮箱故障诊断方法

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KR20230135038A (ko) 2023-09-22
EP4141786A1 (en) 2023-03-01
WO2022160222A1 (zh) 2022-08-04
JP2024504529A (ja) 2024-02-01
EP4141786A4 (en) 2023-08-09
US20230206420A1 (en) 2023-06-29

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