CN115184803A

CN115184803A - Off-line testing device and testing method

Info

Publication number: CN115184803A
Application number: CN202210879940.7A
Authority: CN
Inventors: 李鑫; 刘思; 曹辉
Original assignee: Rept Battero Energy Co Ltd
Current assignee: Rept Battero Energy Co Ltd
Priority date: 2022-07-25
Filing date: 2022-07-25
Publication date: 2022-10-14

Abstract

The invention relates to an off-line testing device and a testing method, which comprises the following steps: a box body; the electric main board is arranged in the box body, a plurality of test modules are fixedly arranged on the electric main board, the test functions of the test modules are different, the test modules are provided with input interfaces, and the input interfaces are fixedly arranged on the box body; and part of the test module comprises a switch piece arranged on the box body, and when the test component is connected to the input interface, the test component is tested by closing or opening the switch piece. According to the off-line testing device and the testing method, different function tests can be respectively carried out on the testing parts by the plurality of testing modules, so that multifunctional tests of the testing parts by one off-line testing device are realized, and meanwhile, the electric main board, the testing modules, the input interface and other parts are arranged on the box body and are convenient to carry and move, so that the problems that a wiring harness tool is single in function and not easy to carry can be solved.

Description

Off-line testing device and testing method

Technical Field

The invention relates to the technical field of battery testing, in particular to an off-line testing device and an off-line testing method.

Background

Along with the growing lithium battery industry, the demand for pure electric commercial vehicles and non-standard vehicle types in the market is more and more urgent, so that the newly developed battery systems are more and more in variety, and the products are more and more diversified.

However, in the related art, the battery system products are not highly standardized, the requirements for test equipment are also higher and higher, the same type of offline test equipment cannot be adapted to offline tests of multiple types of battery system products, the offline test performed by the traditional harness tool seriously affects the production rhythm, and the harness tool is single in function, low in fault tolerance rate, not easy to carry and not easy to maintain.

Therefore, there is a need for a new offline testing device and testing method to overcome at least one of the above problems.

Disclosure of Invention

The embodiment of the invention provides an offline testing device and an offline testing method, and aims to solve the problems that a wire harness tool in the related technology is single in function and not easy to carry.

In a first aspect, a device for testing a wire under test is provided, which comprises: a box body; the electric main board is arranged in the box body, a plurality of test modules are fixedly arranged on the electric main board, the test functions of the test modules are different, the test modules are provided with input interfaces, and the input interfaces are fixedly arranged on the box body; and part of the test module comprises a switch piece arranged on the box body, and when the test component is connected to the input interface, the test component is tested by closing or opening the switch piece.

In some embodiments, the testing module further includes an indicator light, the indicator light is fixedly arranged on the box body, and the indicator light is connected with the switch member.

In some embodiments, the plurality of test modules include a power supply module, the power supply module includes a power supply switch, a key wake-up switch, a dc charging wake-up switch, and an ac wake-up test switch, which are independent of each other, and the power supply switch, the key wake-up switch, the dc charging wake-up switch, and the ac wake-up test switch are respectively connected to different input interfaces.

In some embodiments, the plurality of test modules include a charging module, the charging module includes a dc charging confirmation switch and an ac charging confirmation switch that are independent of each other, and the dc charging confirmation switch Guan Jianfen is respectively connected to different input interfaces; when the direct current charging confirmation switch is disconnected, the charging module simulates an open-circuit fault of a direct current charging confirmation signal; when the direct current charging confirmation switch part is closed, the charging module simulates normal handshake of a direct current charging confirmation signal.

In some embodiments, the charging module further comprises a first temperature sensing switch element and a second temperature sensing switch element, the charging module simulates a temperature sensing open circuit fault when the first temperature sensing switch element is turned off, and the charging module normally tests temperature when the first temperature sensing switch element is turned on; when the second temperature-sensitive switch part is closed, the charging module simulates a temperature-sensitive short-circuit fault.

In some embodiments, the charging module further comprises an electronic lock forward rotation switch piece and an electronic lock reverse rotation switch piece which are independent of each other, and the electronic lock forward rotation switch piece and the electronic lock reverse rotation switch piece are both connected with indicator lights; when the electronic lock forward rotation switch piece is closed, the charging module simulates the forward rotation of the electronic lock, and the corresponding indicator lamp emits light; when the forward rotation switch piece of the electronic lock is disconnected, the charging module simulates the open-circuit fault of the electronic lock, and the corresponding indicator lamp does not emit light.

In some embodiments, the plurality of test modules include a debugging diagnosis module, the debugging diagnosis module includes a plurality of CAN box interfaces, and the plurality of CAN box interfaces and the corresponding input interfaces are respectively connected through mutually independent CAN switch pieces of the whole vehicle, an internal CAN switch piece and a charging CAN switch piece.

In some embodiments, the plurality of test modules comprises: the BCU debugging module comprises a BCU power supply switch piece and a BCU key awakening switch piece which are independent of each other, and the BCU power supply switch piece and the BCU key awakening switch Guan Jianfen are respectively connected with different input interfaces correspondingly; and the BMU debugging module comprises a BMU power supply switch piece and a BMU key awakening switch piece which are independent of each other, and the BMU power supply switch piece and the BMU key awakening switch Guan Jianfen are respectively connected with different input interfaces correspondingly.

In some embodiments, the plurality of test modules comprises: the relay diagnosis module comprises a high-voltage source interface, and the high-voltage source interface is connected with the corresponding input interface through a relay test switch piece; and the insulation test module comprises a plurality of resistors which are mutually connected in series, the resistance values of the plurality of resistors are different, and two ends of each resistor are connected to different input interfaces.

In some embodiments, the plurality of test modules comprises: the DCDC external output module comprises a DCDC external output switch piece, the DCDC external output switch piece is connected with an indicator light, when the DCDC external output switch piece is closed and the corresponding indicator light emits light, the DCDC external output is normal, otherwise, the DCDC external output is abnormal; and the analog & digital signal module comprises a DO signal test switching piece and an indicator light connected with the DO signal test switching piece, when the DO signal test switching piece is closed and the corresponding indicator light emits light, the DO signal is normally output, otherwise, the output is abnormal.

In a second aspect, a testing method using the offline testing apparatus is provided, which includes the following steps: and inserting the test component to an input interface corresponding to the test module, and carrying out corresponding test or fault simulation on the test component.

The technical scheme provided by the invention has the beneficial effects that:

the embodiment of the invention provides an offline testing device and an offline testing method, because a plurality of testing modules are arranged on an electric mainboard, the testing modules can respectively carry out different function tests on testing components, so that the multifunctional testing of the testing components by one offline testing device is realized, and meanwhile, the electric mainboard, the testing modules, an input interface and other components are all arranged on a box body and are convenient to carry and move, so that the problems that a wire harness tool has a single function and is difficult to carry can be solved.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

Fig. 1 is a schematic exploded perspective view of an under-line testing apparatus according to an embodiment of the present invention;

FIG. 2 is a schematic combination diagram of an offline testing apparatus according to an embodiment of the present invention;

FIG. 3 is a schematic structural diagram of a main panel according to an embodiment of the present invention;

FIG. 4 is a schematic structural diagram of a side panel according to an embodiment of the present invention;

fig. 5 is a schematic diagram of a hardware connection of an offline testing apparatus according to an embodiment of the present invention;

FIG. 6 is a schematic diagram of a distribution of test modules according to an embodiment of the present invention;

fig. 7 is a schematic structural diagram of a power supply module according to an embodiment of the present invention;

fig. 8 is a schematic structural diagram of a charging module according to an embodiment of the present invention;

fig. 9 is a schematic structural diagram of a debug diagnosis module according to an embodiment of the present invention;

fig. 10 is a schematic structural diagram of a BCU debug module according to an embodiment of the present invention;

fig. 11 is a schematic structural diagram of a BMU debugging module according to an embodiment of the present invention;

fig. 12 is a schematic structural diagram of a relay diagnostic module according to an embodiment of the present invention;

FIG. 13 is a schematic structural diagram of an insulation test module according to an embodiment of the present invention;

fig. 14 is a schematic structural diagram of a DCDC external output module according to an embodiment of the present invention;

fig. 15 is a schematic structural diagram of an analog & digital signal module according to an embodiment of the present invention.

In the figure: 1. a box body; 11. a main panel; 12. a side panel; 2. an electrical motherboard; 3. an input interface; 4. an indicator light; 5. overhauling the interface; 6. a test module; 61. a power supply module; 611. a power supply switching element; 612. the key wakes up the switching element; 613. the DC charging wakes up the switch element; 614. the AC awakens the test switch element;

62. a charging module; 621. a DC charging confirmation switch; 6211. a first direct current charging confirmation switch part; 6212. a second direct current charging confirmation switch; 622. an AC charging confirmation switch; 6221. an alternating current charging confirmation switch element I; 6222. a second AC charging confirmation switch; 6223. an alternating current charging confirmation switch element III;

623. a first temperature sensitive switch element; 624. a second temperature sensitive switching element; 625. a third temperature sensitive switching element; 626. a fourth temperature sensitive switching element; 627. a forward rotation switch member of the electronic lock; 628. an electronic lock reverse switch member; 63. debugging a diagnostic module; 631. a CAN box interface; 6311. a whole vehicle CAN box interface; 6312. an internal CAN box interface I; 6313. a charging CAN box interface; 6314. an internal CAN box interface II; 632. the whole vehicle CAN switch part; 6321. a first CAN switch of the whole vehicle; 6322. a second CAN switch of the whole vehicle; 633. an internal CAN switch; 6331. an internal CAN switch element I; 6332. an internal CAN switch element II; 6333. an internal CAN switch element III; 6334. an internal CAN switch element IV; 634. charging the CAN switch element; 6341. a charging CAN switch element I; 6342. a second charging CAN switch element;

64. a BCU debugging module; 641. a BCU power supply switch; 642. the BCU key wakes up the switching element; 643. b, debugging a DB9 interface by a BCU; 65. a BMU debugging module; 651. a BMU power supply switching device; 652. the BMU key wakes up the switch; 653. debugging a DB9 interface by a BMU; 66. a relay diagnostic module; 661. a first relay test switch part; 662. a second relay test switch part; 663. a relay testing switch element III; 664. a fourth relay test switch component; 67. an insulation test module; 68. a DCDC external output module; 681. the DCDC outputs a switching piece to the outside; 69. analog & digital signal modules; 691. a first DO signal test switch; 692. a second DO signal test switch; 693. a DO signal test switch element III; 694. a DO signal test switch element IV; 695. a DO signal test switch element V; 696. a DO signal test switch element six; 697. a DO signal test switch element seven; 698. the DO signal tests switch member eight.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, belong to the protection scope of the present invention.

The embodiment of the invention provides an offline testing device and an offline testing method, which can solve the problems that a wire harness tool in the related technology is single in function and not easy to carry.

Referring to fig. 1 to 4, an offline testing apparatus according to an embodiment of the present invention may include: the box body 1, wherein the box body 1 is a square structure, which can have a main panel 11 and a side panel 12, and a cavity is arranged in the box body 1; the electric main board 2 is installed in the box body 1, the electric main board 2 is located in the cavity, the electric main board 2 is fixedly provided with a plurality of test modules 6, the test functions of the test modules 6 are different, that is, the test modules 6 can realize different function tests on test parts, the hardware of the test modules 6 can be independently arranged or crossly arranged, that is, can be provided with shared elements, in the embodiment, the hardware of each test module 6 is preferably independently arranged, so that the test is independent, and the test of any module does not affect other modules; the test module 6 is provided with an input interface 3, the input interface 3 is fixedly arranged on the box body 1, wherein the input interface 3 is used for a test component (DUT) to insert, and the input interface 3 can be arranged on the main panel 11 or the side panel 12; part of the test module 6 comprises a switch piece mounted on the box body 1, and when the test component is connected to the input interface 3, the test component can be tested by closing or opening the switch piece. That is, a part (one or more) of the test modules 6 is provided with a switch, and different test modes are controlled by controlling on and off of the switch; some of the test modules 6 may not be provided with a switch, and after the test components are inserted into the input interface 3, the relevant tests can be performed.

In this embodiment, it is preferable that the switch member is disposed on the main panel 11, and the input interface 3 is disposed on the side panel 12, so that the switch member disposed on the main panel 11 faces the operator, and is convenient for operation, and the input interface 3 is disposed on the side surface, so as to facilitate left-right or front-back insertion of the test component.

Because electrical mainboard 2 is last to have set up a plurality of test module 6, a plurality of test module 6 can carry out different functional test to the test part respectively, realize a test device that rolls off the production line to the multi-functional test of test part, simultaneously, components such as electrical mainboard 2, test module 6 and input interface 3 all install on box 1, portable and removal, consequently, can solve the problem that pencil frock function is single, difficult to carry.

In some embodiments, referring to fig. 1, the testing module 6 may further include an indicator light 4, the indicator light 4 is fixedly disposed on the box body 1, preferably on the main panel 11, for easy viewing, and the indicator light 4 is connected to the switch member; through setting up pilot lamp 4, when carrying out corresponding test, can whether the corresponding test of suggestion tester is qualified through pilot lamp 4.

Wherein, the indicator light 4 can be selected from a light emitting diode (red yellow green blue Bai Junke) which is matched with a current limiting resistor of 1-2K ohm, and the metal film resistance precision is not less than 1 percent FSR. The switch component is preferably a single-pole double-throw 220V ship-shaped switch or a MOS tube, a triode or a field effect tube with the voltage withstanding 60 VDC. The case 1 may be a sheet metal case 1 having a thickness of 1mm, plastic, or a material having plasticity.

Further, referring to fig. 1 and 5, the test module 6 may further include a service interface 5, the service interface 5 preferably uses a voltage-resistant DC1000V hard plastic base, and a multimeter is inserted into the service interface 5 to perform secondary verification on the test component, that is, to confirm again a test result corresponding to the test component, such as a fault simulation or a normal state. The service interface 5 CAN also be inserted into other devices, such as a high voltage source, an oscilloscope, a CAN box, and other test accessories.

Referring to fig. 6 and 7, in some embodiments, the plurality of test modules 6 may include a power supply module 61, wherein the power supply module 61 has LDOs (low dropout linear regulators), the LDOs may be selected from commercially available (12V, 9V, 5V, 3.3V, etc.), the accuracy of the selection is determined according to the power supply range of the DUT, and LDOs of different specifications may be integrated in parallel on the electrical motherboard 2, and the accuracy of the output of the LDO is not lower than 1% fsr. The power supply module 61 may include a power supply switch 611, a key wake-up switch 612, a dc charge wake-up switch 613, and an ac wake-up test switch 614, which are independent from each other, where the power supply switch 611, the key wake-up switch 612, the dc charge wake-up switch 613, and the ac wake-up test switch 614 are all referred to as the above switches, and the circuits where the power supply switch 611, the key wake-up switch 612, the dc charge wake-up switch 613, and the ac wake-up test switch 614 are located are independent from each other and do not interfere with each other, and the power supply switch 611, the key wake-up switch 612, the dc charge wake-up switch 613, and the ac wake-up test switch 614 are respectively connected to different input interfaces 3; each switch piece can be correspondingly connected with one input interface 3, and different input interfaces 3 carry out different function tests.

Closing the power switch 611 may give the DUT a normal power function and opening the power switch 611 may cut off the DUT power function. Normal voltage of power supply: the 12V system is 9-16V, and the 24V system is 18-32V. The close key wake-up switch 612 may give the DUT a normal key wake-up and the open key wake-up switch 612 may switch off the DUT key wake-up. Waking up normal voltage: the 12V system is 9-16V, and the 24V system is 18-32V. The switch 613 can be turned on to wake up the DUT by dc charging, and the switch 613 can be turned off to wake up the DUT by dc charging. Waking up normal voltage: the 12V system is 9-16V, and the 24V system is 18-32V. Closing the ac wake-up test switching element 614 may give the DUT an ac wake-up test and opening the ac wake-up test switching element 614 may shut off the DUT ac wake-up test. And (3) awakening normal voltage: the 12V system is 9-16V, and the 24V system is 18-32V. The secondary verification can be carried out by using a universal meter to measure through the overhaul interface 5; the power supply switch 611, the key wake-up switch 612, the dc charging wake-up switch 613 and the ac wake-up test switch 614 are correspondingly connected to the corresponding service interface 5.

Referring to fig. 6 and 8, based on the above technical solution, the plurality of test modules 6 may further include a charging module 62, where the charging module 62 may include a dc charging confirmation switch 621 and an ac charging confirmation switch 622 that are independent from each other, and the dc charging confirmation switch 621 and the ac charging confirmation switch 622 are respectively connected to different input interfaces 3 correspondingly; when the dc charging confirmation switch 621 is turned off, the charging module 62 simulates an open-circuit fault of a dc charging confirmation signal; when the dc charging confirmation switch 621 is closed, the charging module 62 simulates normal handshake of a dc charging confirmation signal. The switching element is executed during normal detection, and the details of the test and fault simulation are as follows:

the module can simulate 2 direct current charging confirmation signals (CC 2_1&CC2 \ u 2) and 3 alternating current charging confirmation signals (CC _1&CC \2 &CC \ u 3). The lines of the 2 direct current charging confirmation signals are independent from each other, the direct current charging confirmation signal CC2_1 can be provided with a first direct current charging confirmation switch 6211, the direct current charging confirmation signal CC2_2 can be provided with a second direct current charging confirmation switch 6212,3, the lines of the alternating current charging confirmation signal are also independent from each other, the alternating current charging confirmation signal CC _1 is provided with a first alternating current charging confirmation switch 6221, the alternating current charging confirmation signal CC _2 is provided with a second alternating current charging confirmation switch 6222, and the alternating current charging confirmation signal CC _3 is provided with a third alternating current charging confirmation switch 6223.

The first dc charging confirmation switch 6211 corresponding to the open CC2_1 may simulate an open fault of the CC2_1 confirmation signal, and the first dc charging confirmation switch 6211 may simulate a normal handshake of the confirmation signal. The second dc charging confirmation switch 6212 that opens the signal corresponding to CC2_2 may simulate an open fault of the CC2_2 confirmation signal, and the second dc charging confirmation switch 6212 may simulate a normal handshake of the confirmation signal. The ac charging confirmation switch element one 6221 that opens the CC _1 corresponding signal may simulate the open fault of the CC _1 confirmation signal, and the ac charging confirmation switch element one 6221 that closes may simulate the normal handshake of the confirmation signal. The second ac charging confirmation switch 6222, which is open from the CC _2 corresponding signal, may simulate the open fault of the CC _2 confirmation signal, and the second ac charging confirmation switch 6222 may simulate the normal handshake of the confirmation signal. The ac charging confirmation switch element tri 6223 that opens the CC _3 corresponding signal may simulate the open fault of the CC _3 confirmation signal, and the ac charging confirmation switch element tri 6223 that closes may simulate the normal handshake of the confirmation signal. The secondary verification can be carried out by using a multimeter to measure through the overhaul interface 5. The first direct-current charging confirmation switch part 6211, the second direct-current charging confirmation switch part 6212, the first alternating-current charging confirmation switch part 6221, the second alternating-current charging confirmation switch part 6222 and the third alternating-current charging confirmation switch part 6223 are correspondingly connected with the corresponding maintenance interfaces 5.

Referring to fig. 6 and 8, further, the charging module 62 may further include a first temperature-sensing switch 623 and a second temperature-sensing switch 624, when the first temperature-sensing switch 623 is opened, the charging module 62 simulates a first temperature-sensing open-circuit fault, and when the first temperature-sensing switch 623 is closed, the charging module 62 normally tests a first temperature; when the second temperature-sensitive switch 624 is closed, the charging module 62 simulates a temperature-sensitive short-circuit fault.

In this embodiment, the charging module 62 may further include a third temperature-sensing switch 625 and a fourth temperature-sensing switch 626, and the first temperature-sensing switch 623, the second temperature-sensing switch 624, the third temperature-sensing switch 625 and the fourth temperature-sensing switch 626 may all be independently connected to the corresponding input interface 3, so as to simulate four temperature senses T1 to T4.

The first temperature-sensitive switch 623 is disconnected to simulate T1& T3 temperature-sensitive open-circuit faults, and the temperature is minus 40 +/-2 ℃; the first temperature-sensitive switch 623 is closed, and T1& T3 can be normally tested, wherein the temperature is 25 +/-2 ℃; wherein, T1 and T3 can be independently tested and do not interfere with each other. Closing the second temperature sensitive switch 624 may simulate a T1& T3 temperature sensitive short circuit fault at a temperature of 215 ± 2 ℃. The T2 and T4 temperature-sensitive open-circuit fault can be simulated by disconnecting the fourth temperature-sensitive switch 626, wherein the temperature is minus 40 +/-2 ℃; the fourth temperature-sensitive switch 626 is closed, so that T2& T4 can be normally tested, and the temperature is 25 +/-2 ℃; t2 and T4 can also be independently tested and do not interfere with each other. Closing the third temperature sensitive switch 625 simulates a T2& T4 temperature sensitive short circuit fault at a temperature of 215 ± 2 ℃.

Referring to fig. 6 and 8, further, the charging module 62 may further include an electronic lock forward rotation switch component 627 and an electronic lock reverse rotation switch component 628 which are independent from each other, and the indicator lamp 4 is connected to both the electronic lock forward rotation switch component 627 and the electronic lock reverse rotation switch component 628; when the electronic lock forward rotation switch component 627 is closed, the charging module 62 simulates forward rotation of the electronic lock, and normally, the corresponding indicator lamp 4 emits light; when the electronic lock forward rotation switch component 627 is turned off, the charging module 62 simulates an electronic lock open-circuit fault, and normally the corresponding indicator lamp 4 does not emit light. When the electronic lock reverse switch 628 is closed, the charging module 62 simulates the electronic lock reverse rotation, and normally the corresponding indicator light 4 is illuminated; when the electronic lock reverse switch 628 is open, the charging module 62 simulates an electronic lock open fault and the corresponding indicator light 4 is normally not illuminated.

The secondary verification can be carried out by using a multimeter to measure through the overhaul interface 5.

Referring to fig. 6 and 9, based on the above technical solution, the plurality of test modules 6 may further include a debugging diagnosis module 63, the debugging diagnosis module 63 includes a plurality of CAN box interfaces 631, where the plurality of CAN box interfaces 631 may include an independent entire vehicle CAN box interface 6311, a first internal CAN box interface 6312, a charging CAN box interface 6313, and a second internal CAN box interface 6314, and the plurality of CAN box interfaces 631 and the corresponding input interfaces 3 are connected through an entire vehicle CAN switch 632, an internal CAN switch 633, and a charging CAN switch 634, which are independent of each other, respectively.

In this embodiment, the module CAN test four ways of CAN and four ways of CAN _ H open circuit and CAN _ L open circuit. During testing, the CAN cassettes are inserted into the corresponding CAN cassette interfaces 631 and the test components are inserted into the input interface 3 of the side panel 12.

The whole vehicle CAN switch 632 comprises a whole vehicle CAN switch first 6321 and a whole vehicle CAN switch second 6322, wherein the whole vehicle CAN switch first 6321 is connected to ACAN _ L, and the whole vehicle CAN switch second 6322 is connected to ACAN _ H. The internal CAN switch 633 comprises a first internal CAN switch 6331, a second internal CAN switch 6332, a third internal CAN switch 6333 and a fourth internal CAN switch 6334, wherein the first internal CAN switch 6331 is connected to the first internal CAN box interface 6312 and the internal CAN _ L, and the second internal CAN switch 6332 is connected to the first internal CAN box interface 6312 and the internal CAN _ H; an internal CAN switch element III 6333 is connected with an internal CAN box interface II 6314 and the other internal CAN _ L, and an internal CAN switch element IV 6334 is connected with an internal CAN box interface II 6314 and the other internal CAN _ H.

The charging CAN switch 634 includes a first charging CAN switch 6341 and a second charging CAN switch 6342, the first charging CAN switch 6341 is connected to the charging CAN _ L, and the second charging CAN switch 6342 is connected to the charging CAN _ H. Closing the whole vehicle CAN switch member I6321 and the whole vehicle CAN switch member II 6322 to normally test a whole vehicle CAN loop; the whole vehicle CAN has no error frame and sends a message, the voltage to ground of the whole vehicle CAN _ L is about 2.5V, and the voltage to ground of the whole vehicle CAN1_ H is about 2.5V. The whole vehicle CAN switch I6321 is disconnected, so that the whole vehicle CAN _ L open-circuit fault CAN be simulated; and the voltage to ground of the whole CAN _ L is 0V. The whole vehicle CAN switch second 6322 is disconnected, so that the whole vehicle CAN _ H open-circuit fault CAN be simulated; the voltage to ground of the whole vehicle CAN _ H is 0V.

The internal CAN1 loop CAN be normally tested by closing the internal CAN switch one 6331 and the internal CAN switch two 6332. The internal CAN1 has no error frame and sends out a message, the voltage to ground of the internal CAN1_ L is about 2.5V, and the voltage to ground of the internal CAN1_ H is about 2.5V. When the internal CAN switch I6331 is disconnected, the open-circuit fault of the internal CAN1_ L CAN be simulated; the internal CAN1_ L is 0V in voltage to ground. When the internal CAN switch II 6332 is disconnected, the open-circuit fault of the internal CAN1_ H CAN be simulated; the internal CAN1_ H is at 0V to ground. The charging CAN loop CAN be normally tested by closing the first charging CAN switch 6341 and the second charging CAN switch 6342; the internal CAN has no error frame and sends a message, the voltage to the ground of the charging CAN _ L is about 2.5V, and the voltage to the ground of the charging CAN _ H is about 2.5V. .

The charging CAN switch element I6341 is disconnected, so that the charging CAN _ L open-circuit fault CAN be simulated; the charging CAN _ L is 0V to ground. The charging CAN switch element II 6342 is disconnected, so that the open-circuit fault of the charging CAN _ H CAN be simulated; the charge CAN _ H is 0V to ground. An internal CAN2 loop CAN be normally tested by closing an internal CAN switch three 6333 and an internal CAN switch four 6334; the internal CAN2 has no error frame and sends a message, the voltage to the ground of the internal CAN2_ L is about 2.5V, and the voltage to the ground of the internal CAN2_ H is about 2.5V. An internal CAN2_ L open-circuit fault CAN be simulated by disconnecting the internal CAN switch element III 6333; the internal CAN2_ L is at 0V to ground. Opening the internal CAN switch four 6334 CAN simulate an internal CAN2_ H open fault; the internal CAN2_ H is at 0V to ground. Above also CAN use the universal meter to measure through maintenance interface 5 and carry out the secondary verification, maintenance interface 5 CAN be foretell CAN box interface 631.

Referring to fig. 6 and 10, based on the above technical solution, the plurality of test modules 6 may further include: BCU debugging module 64, BCU debugging module 64 includes mutually independent BCU power supply switch 641 and BCU key wake-up switch 642, BCU power supply switch 641 with BCU key wake-up switch 642 correspond respectively with different input interface 3 is connected. The BCU debug module 64 provided in this embodiment can complete the single board BCU communication and power supply test. The method specifically comprises the following steps:

closing the BCU power switch 641 may give the BCU a normal power function and opening the BCU power switch 641 may cut off the DUT power function. And (3) power supply normal voltage: the 12V system is 9-16V, and the 24V system is 18-32V. Closing the BCU key wake switch 642 may give the BCU a normal key wake and opening the BCU key wake switch 642 may turn off the DUT key wake. Waking up normal voltage: the 12V system is 9-16V, and the 24V system is 18-32V.

BCU debug module 64 may also include a BCU debug DB9 interface 643 connected to a corresponding input interface 3, where BCU debug DB9 interface 643 may normally test the internal CAN loop and termination status. The secondary verification can be performed through the overhaul interface 5 by using multimeter measurement, and the overhaul interface 5 can be a BCU debugging DB9 interface 643 or other interfaces.

Referring to fig. 11, the plurality of test modules 6 may further include: the BMU debugging module 65, the BMU debugging module 65 includes a BMU power supply switch 651 and a BMU key wake-up switch 652 that are independent of each other, and the BMU power supply switch 651 and the BMU key wake-up switch 652 are respectively connected to different input interfaces 3 correspondingly. The BMU debugging module 65 provided in this embodiment can complete single board BMU communication and power supply test. The method specifically comprises the following steps:

closing the BMU power switch 651 may give the BMU a normal power function, and opening the BMU power switch 651 may cut off the DUT power function. And (3) power supply normal voltage: the 12V system is 9-16V, and the 24V system is 18-32V. Closing the BMU key wake switch 652 may give the BMU a normal key wake up and opening the BMU key wake up switch 652 may turn off the DUT key wake up. Waking up normal voltage: the 12V system is 9-16V, and the 24V system is 18-32V. The BMU debug module 65 may further include a BMU debug DB9 interface 653 connected to the corresponding input interface 3, and the BMU debug DB9 interface 653 may normally test the internal CAN loop and the terminal status. The secondary verification can be performed by using multimeter measurement through the maintenance interface 5, and the maintenance interface 5 can be a BMU debugging DB9 interface 653 or other interfaces.

Referring to fig. 6 and 12, based on the above technical solution, the plurality of test modules 6 may further include: the relay diagnosis module 66 comprises a high-voltage source interface, and the high-voltage source interface is connected with the corresponding input interface 3 through a relay test switch part; the high-voltage source interface is used for inserting a high-voltage source of a test accessory, and the input interface 3 is used for inserting a test component.

In this embodiment, the relay diagnostic module 66 may perform testing, adhesion, and open-circuit fault simulation on the two relays. The high-voltage source interface comprises an HV + input 1 interface, an HV-input 1 interface, an HV + input 2 interface and an HV-input 2 interface which are arranged on the main panel 11. The relay testing switch part comprises a first relay testing switch part 661, a second relay testing switch part 662, a third relay testing switch part 663 and a fourth relay testing switch part 664.

The test accessory high voltage source HV + & HV-output is connected to the HV + input 1 interface and the HV-input 1 interface of the main panel 11, respectively. And closing the first relay test switch part 661, measuring the voltage between the HV + output and the HV-input 1 on the main panel 11 minus the voltage between the HV + input 1 and the HV-input 1, and judging that the relay is normal when the voltage difference is less than 15V.

And closing the first relay test switch part 661, measuring the voltage between the HV + output and the HV-input 1 on the main panel 11 minus the voltage between the HV + input 1 and the HV-input 1, and judging that the relay is open-circuited when the voltage difference is more than 15V. And (3) disconnecting the first relay test switch part 661, measuring the voltage between the HV + output and the HV-input 1 on the main panel 11 minus the voltage between the HV + input 1 and the HV-input 1, and judging that the relay is stuck when the voltage difference is less than 15V. And closing the second relay test switch 662, measuring the voltage between the HV-output and the HV + input 1 on the main panel 11, and subtracting the voltage between the HV + input 1 and the HV-input 1, wherein the relay is judged to be normal when the voltage difference is less than 15V.

And closing the second relay test switch 662, measuring the voltage between the HV-output and the HV + input 1 on the main panel 11 minus the voltage between the HV + input 1 and the HV-input 1, and judging that the relay is open-circuited when the voltage difference is more than 15V. And the second relay test switch 662 is disconnected, the voltage between the HV-output and the HV + input 1 on the main panel 11 is measured, the voltage between the HV + input 1 and the HV-input 1 is subtracted, and the relay adhesion can be judged when the voltage difference is less than 15V. The test accessory high voltage source HV + HV-output is connected to the HV + input 2 interface, the HV-input 2 interface, respectively, of the main panel 11.

And the third relay testing switch 663 is disconnected, the fourth relay testing switch 664 is closed, the voltage between the HV + input 2 and the detection point 1 on the main panel 11 is measured to be the voltage between the HV + input 2 and the HV-input 2, and the relay between the detection point 1 and the HV + input 2 can be judged to be normal. And (3) disconnecting the third relay test switch part 663, closing the fourth relay test switch part 664, and measuring the voltage between the HV + input 2 and the detection point 1 on the main panel 11 to be 0, so that the relay adhesion between the detection point 1 and the HV + input 2 or the relay open circuit between the detection point 2 and the HV-input 2 can be judged.

And closing the third relay testing switch 663, opening the fourth relay testing switch 664, and measuring the voltage between the HV-input 2 and the detection point 2 on the main panel 11 to be the voltage between the HV + input 2 and the HV-input 2, namely judging that the relay between the detection point 2 and the HV-input 2 is normal. And closing the third relay testing switch component 663, disconnecting the fourth relay testing switch component 664, and measuring the voltage between the HV-input 2 and the detection point 2 on the main panel 11 to be 0, so that the relay adhesion between the detection point 2 and the HV-input 2 or the relay open circuit between the detection point 1 and the HV + input 2 can be judged. The voltage can be measured by the universal meter through the overhaul interface 5 for secondary verification, and the overhaul interface 5 can be a high-voltage source interface for plugging a test accessory high-voltage source.

And as shown in fig. 13, the plurality of test modules 6 may further include: the insulation testing module 67 includes a plurality of resistors connected in series, the resistances of the plurality of resistors are different, and two ends of each resistor are connected to different input interfaces 3, in this embodiment, the input interfaces 3 may be disposed on the main panel 11 or the side panel 12. The insulation test module 67 may have 7 resistors, the resistances of the resistors are 1K ohm, 50K ohm, 100K ohm, 1M ohm, 5M ohm, 10M ohm and 100M ohm, and the input interface 3 of the insulation test module 67 may include an R0 interface, an R1 interface, an R2 interface, an R3 interface, an R4 interface, an R5 interface, an R6 interface and an R7 interface.

In this embodiment, the insulation test module 67 can test insulation resistance, insulation low failure, and insulation upper limit overflow.

And the testing component is inserted into the R1 interface and the R2 interface, so that whether the insulation resistance value meets 50K omega can be tested, and the insulation is normal if the error is less than or equal to 20%. And the testing component is inserted into the R2 interface and the R3 interface, so that whether the insulation resistance value meets 100K omega can be tested, and the insulation is normal if the error is less than or equal to 20%. And the testing component is inserted into the R3 interface and the R4 interface, so that whether the insulation resistance value meets 5M omega can be tested, and the insulation is normal if the error is less than or equal to 20%. And the testing component is inserted into the R4 interface and the R5 interface, so that whether the insulation resistance value meets 10M omega can be tested, and the insulation is normal if the error is less than or equal to 20%. And the test part is inserted into the R0 interface and the R1 interface, so that whether the insulation resistance value meets 1K omega can be tested, and if the error is less than or equal to 20%, the insulation is normal and an insulation fault alarm is given out. And the test part is inserted into the R6 interface and the R7 interface, so that whether the insulation resistance value meets 100M omega can be tested, the insulation is normal if the error is less than or equal to 20%, and the display sampling full value can also be judged to be normal.

Referring to fig. 6 and 14, based on the above technical solution, the plurality of test modules 6 may further include: the DCDC external output module 68, and the DCDC external output module 68 may detect the external output of the DCDC module; the DCDC external output module 68 includes a DCDC external output switch 681, the DCDC external output switch 681 is connected to the indicator lamp 4, when the DCDC external output switch 681 is closed and the corresponding indicator lamp 4 emits light, the DCDC external output is normal, otherwise, the DCDC external output is abnormal; the voltage can also be measured by a multimeter through the overhaul interface 5 for secondary verification.

And as shown in fig. 15, the plurality of test modules 6 may further include an analog & digital signal module 69, which may include a DO signal test switch and an indicator lamp 4 connected to the DO signal test switch, when the DO signal test switch is closed and the corresponding indicator lamp 4 emits light, a DO (digital output) signal is normally output (the DUT outputs a DO signal of 1), otherwise, the output is not normal.

In this embodiment, the analog & digital signal module 69 may perform analog signal & digital signal input/output detection. The DO signal test switch part comprises a first DO signal test switch part 691, a second DO signal test switch part 692, a third DO signal test switch part 693, a fourth DO signal test switch part 694, a fifth DO signal test switch part 695, a sixth DO signal test switch part 696, a seventh DO signal test switch part 697 and an eighth DO signal test switch part 698 which are independent of each other.

And (3) when the first DO signal test switch 691 is closed, the light emitting diode emits light, the DO1 output is normal (the DO1 digital signal output by the DUT is 1), and if the DO1 output is not normal, the voltage can be measured by using a multimeter through the overhaul interface 5 for secondary verification. The voltage difference between the voltage between DO1 and GNG and the low-voltage power supply voltage is less than 1% of the power supply voltage, and the normal state is obtained.

And (3) closing a second DO signal test switch 692, enabling the light emitting diode to emit light, enabling the DI1 to be normally input, enabling the DUT to detect that the DI1 is the digital signal 1, and otherwise, enabling the DUT to be abnormal and using a multimeter to measure voltage through the overhaul interface 5 to perform secondary verification. The voltage difference between the voltage between DI1 and GND and the low-voltage power supply voltage is less than 1% of the power supply voltage, namely the normal state is obtained.

And (3) a DO signal test switch element III 693 is closed, the light emitting diode emits light, the DO2 output is normal (the DO2 digital signal output by the DUT is 1), and if the DO2 output is not normal, the voltage can be measured by using a multimeter through the overhaul interface 5 for secondary verification. The voltage difference between the voltage between DO2 and GNG and the low-voltage power supply voltage is less than 1% of the power supply voltage, and the normal state is obtained.

And (3) closing the DO signal test switch part four 694, enabling the light emitting diode to emit light, enabling DI2 to be normally input, enabling the DUT to detect that DI2 is the digital signal 1, and otherwise, enabling the DUT to be abnormal and using a multimeter to measure voltage through the overhaul interface 5 to carry out secondary verification. The voltage difference between the voltage between DI2& GNG and the low-voltage supply voltage is less than 1% of the supply voltage, namely the normal state is obtained.

And a DO signal is closed to test the five 695 of the switch, the light emitting diode emits light, the DI3 input is normal, the DI3 is detected by the DUT to be a digital signal 1, and if the DI3 is not normal, the voltage can be measured by using a multimeter through the overhaul interface 5 for secondary verification. The voltage difference between the voltage between DI3& GNG and the low-voltage supply voltage is less than 1% of the supply voltage, namely the normal state is obtained.

And a DO signal is closed to test a switch element six 696, the light emitting diode emits light, the DI3 (comprising a 10K pull-down resistor) is normally input, the DUT detects that the DI3 is a digital signal 0, and if the DI3 is not normal, the voltage can be measured by using a multimeter through the overhaul interface 5 for secondary verification. The voltage difference between the voltage between DI3 (containing 10K pull-down) and GND and the low-voltage power supply voltage is less than 1% of the power supply voltage, and the normal operation is achieved.

And a DO signal is closed to test the switching element seven 697, the light emitting diode emits light, the DI2 input is normal, the DUT detects that the DI2 is a digital signal 0, and if the DI2 is not normal, the voltage can be measured by using a universal meter through the overhaul interface 5 for secondary verification. The voltage difference between the voltage between DI2& power supply and the low-voltage power supply voltage is less than 1% of the power supply voltage, namely the normal state is obtained.

And closing a DO signal test switch part eight 698, enabling the light emitting diode to emit light, enabling DI1 to be normally input, enabling the DUT to detect that DI1 is a digital signal 0, and otherwise, enabling the DUT to be abnormal and using a multimeter to measure voltage through the overhaul interface 5 to carry out secondary verification. The voltage difference between the voltage between DI1& power supply and the low-voltage power supply voltage is less than 1% of the power supply voltage, namely the normal state is obtained.

The offline testing (EOL) device provided by the embodiment of the invention is suitable for single electric box testing, single control box testing, single high-voltage box testing and battery system testing. The system can effectively carry out the delivery of the single-box test system according to the delivery rate requirement of the customer; and the defect of material accumulation caused by system test shipment can be effectively avoided by breaking the conventional process. The test efficiency is improved, meanwhile, fault simulation can be carried out to verify whether the fault of the battery system is reported by mistake or not again, and software bugs can be rapidly and effectively prevented from flowing out. Meanwhile, the method is also beneficial for testers to encounter hardware faults of the battery system in the test process, and the faults can be rapidly checked, so that the testers can make judgment more clearly. The off-line testing device is convenient to carry, overhaul, fault simulation and testing efficiency improvement in the actual use process, so that the device can be applied to the commercial vehicle and passenger vehicle system shipment projects.

The device not only ensures the full function of the DUT to be normally off-line detected, but also integrates the fault simulation function, is far superior to a wire harness tool in terms of function, and has high flexibility, low cost and strong expansibility which are superior to market off-line test equipment on the premise of ensuring the function; the problems that the efficiency of testing on the offline testing site is low, the fault locking is slow, the fault cannot be simulated, the single-box testing system cannot be shipped, and the system materials are accumulated can be solved. The effect and benefit produced by the off-line testing device in the practical application process are as follows: (1) the complexity of the traditional wire harness device is avoided, and the effect of avoiding complexity and simplification is achieved; (2) the application range is wider, the single-box test, the single-control-box test, the single-high-voltage-box test and the battery system test are covered, and the traditional wire harness device is only suitable for components of the same connector; (3) the test is rapid, the production beat is improved, and the functional integration level is higher; (4) the battery system fault simulation can quickly and effectively detect the fault; (5) is convenient to carry and easy to overhaul.

The embodiment of the invention also provides a testing method using the off-line testing device, which comprises the following steps: and inserting the test component into the input interface 3 corresponding to the test module 6, and performing corresponding test or fault simulation on the test component.

Further, when the test unit is tested using the power supply module 61, the verification mode for DUT power input is as follows: (1) the light emitting diodes corresponding to the main panel emit light. (2) Further verification, the universal meter is used for measuring the input voltage of the main panel power supply as follows: 12V system, 12 plus or minus 0.1V;24V system, 24 + -0.1V. (3) After any awakening source is provided and the CAN box is connected with the main panel communication port, the DUT sends a message and CAN read a sampling value: 12V system, 12 plus or minus 0.1V;24V system, 24 + -0.1V.

The verification mode for the DUT wakeup input is as follows: (1) the light emitting diodes corresponding to the main panel emit light. (2) Further verification, the main panel wake-up input voltage measured by a multimeter is as follows: 12V system, 12 plus or minus 0.1V;24V system, 24 + -0.1V. (3) After any awakening source is provided, the DUT has a message to send out after the CAN box is connected with the main panel communication port.

Further, when the test component uses the charging module 62 for testing, for the CC2-1 acknowledge signal, when not normally connected, it is measured that: 12V system: 12 ± 0.1v,24v system: 24V plus or minus 0.1V; when connected normally, measured: 12V system: 6. + -. 0.1V,24V system: 12V. + -. 0.1V. For the CC2-2 confirmation signal, when not normally connected, it is measured that: 12V system: 12 ± 0.1v,24v system: 24V plus or minus 0.1V; when connected normally, measured: 12V system: 6. + -. 0.1V,24V system: 12V. + -. 0.1V. For the CC-1 (16A) confirmation signal, when not normally connected, the following were measured: 12V system: 12 ± 0.1v,24v system: 24V plus or minus 0.1V; when connected normally, measured: 12V system: 3.8 ± 0.1v,24v system: 7.6V. + -. 0.1V. For the CC-2 (32A) confirmation signal, when not normally connected, the following were measured: 12V system: 12 ± 0.1v,24v system: 24V plus or minus 0.1V; when connected normally, measured: 12V system: 7.2. + -. 0.1V,24V system: 14.4V. + -. 0.1V. For the CC-3 (63A) confirmation signal, when not normally connected, the following were measured: 12V system: 12 ± 0.1v,24v system: 24V plus or minus 0.1V; when connected normally, measured: 12V system: 9.2 ± 0.1v,24v system: 18.4V. + -. 0.1V.

For the four-way temperature senses T1 to T4: when in normal connection, the CAN box is used for connecting the main panel communication interface, and the temperature sampling value read on the DUT is 25 ℃; when abnormal short circuit occurs, connecting a CAN box with a main panel communication interface, and reading a temperature sampling value on a DUT to be 215 ℃; when abnormal open circuit occurs, the CAN box is connected with the main panel communication interface, and the temperature sampling value read from the DUT is-40 ℃.

Further, for the positive and negative rotation of the electronic lock: when the electronic lock forward rotation switch component 627 is closed, the charging module 62 simulates the forward rotation of the electronic lock, and the corresponding indicator lamp 4 emits light normally; when the electronic lock forward rotation switch component 627 is turned off, the charging module 62 simulates an electronic lock open-circuit fault, and normally the corresponding indicator lamp 4 does not emit light. When the electronic lock reverse switch 628 is closed, the charging module 62 simulates the electronic lock reverse rotation, and normally the corresponding indicator light 4 is illuminated; when the electronic lock reverse switch 628 is open, the charging module 62 simulates an electronic lock open fault and the corresponding indicator light 4 is normally not illuminated.

Further, when the test component uses the debugging diagnosis module 63 to perform testing, when power is not supplied, a universal meter is used for measuring the terminal resistance between the ACAN _ H and the ACAN _ L as 120 Ω +/-1%, the terminal resistance between the CHCN _ H and the CHCN _ L as 120 Ω +/-1% and the terminal resistance between the internal CAN _ H and the internal CAN _ L as 60 Ω +/-1% on the main panel communication interface. When power is supplied, the CAN box is connected with the main panel communication port and is connected with an external accessory direct-current power supply, and the DUT sends normal messages such as battery sampling and state information; a multimeter is used for measuring the voltage between the ACAN _ H and the ACAN _ L to be 0-1V, CHCAN _ H and CHCAN _ L to be 0-1V and the voltage between the internal CAN _ H and the internal CAN _ L to be 0-1V.

Further, when the test component uses the BCU debugging module 64 for testing, a universal meter is used for measuring the terminal resistance between the CAN _ H and the CAN _ L by the main panel communication interface when the power is not supplied, wherein the terminal resistance is 120 omega +/-1%. When power is supplied, the CAN box is connected with the main panel communication port and is connected with an external accessory direct-current power supply, and the DUT sends normal messages such as battery sampling and state information.

Further, when the test component uses the BMU debugging module 65 to test, when power is not supplied, a universal meter is used for measuring the terminal resistance between the CAN _ H and the CAN _ L by the main panel communication interface to be 120 omega +/-1%. When power is supplied, the CAN box is connected with the main panel communication port and is connected with an external accessory direct-current power supply, and the DUT sends normal messages such as battery sampling and state information.

Further, when the test component uses the relay diagnosis module 66 to perform a test, the high voltage source is connected to the corresponding HV + HV-on the main panel, the CAN box is connected to the main panel communication interface, and the high voltage sampling value HV + HV- = the high voltage source output voltage ± 1% is read on the DUT. The high-voltage source is connected to the corresponding HV1+ & HV 1-on the main panel, the CAN box is connected to the main panel communication interface, and a high-voltage sampling value HV + & HV- = output voltage of the high-voltage source +/-1% is read on the DUT. The high voltage source connection on the main panel corresponds to HV2+ & HV2-, the CAN box is connected with the main panel communication interface, two switches between HV2+ and HV 2-are closed, and a high voltage sampling value HV + & HV- = high voltage source output voltage +/-1% is read on the DUT.

And (3) opening the switch HV2+ and the detection point 1, closing the switch HV 2-and the detection point 2, and measuring the voltage between the HV2+ and the detection point 1 = the output voltage +/-1% of the high-voltage source, so that the relay between the detection point 1 and the HV + input 2 can be judged to be normal. And (3) disconnecting the switch HV2+ and the detection point 1, closing the switch HV 2-and the detection point 2, and measuring the voltage between the HV + input 2 and the detection point 1 to be 0V, so that the relay adhesion between the detection point 1 and the HV + input 2 or the relay open circuit between the detection point 2 and the HV-input 2 can be judged. And closing the switch HV2+ and the detection point 1, opening the switch HV 2-and the detection point 2, measuring the voltage = +/-1% of the output voltage of the high-voltage source between the HV 2-and the detection point 2, and judging that the relay between the detection point 2 and the HV-input 2 is normal. Closing the switch HV2+ and the detection point 1, closing the switch HV 2-and the detection point 2, and measuring the voltage between the HV-input 2 and the detection point 2 to be 0V, so that the relay adhesion between the detection point 2 and the HV-input 2 or the relay open circuit between the detection point 1 and the HV + input 2 can be judged.

Further, when the test part is tested by using the insulation test module 67, and the DUT is connected to R0 to R1 on the side panel, the CAN box is connected to the main panel communication interface, and the insulation sample value is read on the DUT to be 1K ± 20%. When the DUT is connected to the side panel from R1 to R2, the CAN box is used to connect the main panel communication interface, and the insulation sampling value read from the DUT is 50K +/-20%. When the DUT is connected to the side panel from R2 to R3, the CAN box is used to connect the main panel communication interface, and the insulation sampling value read on the DUT is 100K +/-20%. When the DUT is connected with R3-R4 on the side panel, the CAN box is used for connecting the main panel communication interface, and the insulation sampling value read on the DUT is 1M +/-20%. When the DUT is connected with R4-R5 on the side panel, the CAN box is used for connecting the main panel communication interface, and the insulation sampling value read on the DUT is 5M +/-20%. When the DUT is connected to the side panel from R5 to R6, the CAN box is used to connect the main panel communication interface, and the insulation sampling value read from the DUT is 10M +/-20%. When the DUT is connected with R6-R7 on the side panel, the CAN box is used for connecting the main panel communication interface, and the insulation sampling value read on the DUT is 100M +/-20%.

Further, when the test component uses the DCDC to test the external output module 68, the test component is inserted into the input interface 3 corresponding to the side panel, and a universal meter can be used to measure the voltage at the output port of the main panel; for a 12V system: 12 ± 0.1V, for a 24V system: 24 + -0.1V.

Further, when the test component uses the analog & digital signal module 69 for testing, when the output of the DO module is 1 during power supply, a universal meter is used for measuring the voltage of a corresponding port on the main panel to be a 12V system: 12. + -. 0.1V,24V System: 24 + -0.1V. When the output of the DO module is 0 during power supply, a universal meter is used for measuring the voltage of a corresponding port on the main panel to be a 12V system: 0. + -. 0.1V,24V system: 0 +/-0.1V. When the AI module input is the high level during power supply, use the universal meter to measure corresponding port voltage at the main panel and be 12V system: 0-16V. + -. 0.1V,24V system: 0 to 32V plus or minus 0.1V.

In the description of the present invention, it should be noted that the terms "upper", "lower", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, which are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and operate, and thus, should not be construed as limiting the present invention. Unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are intended to be inclusive and mean, for example, that they may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

It is noted that, in the present invention, relational terms such as "first" and "second", and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising a … …" does not exclude the presence of another identical element in a process, method, article, or apparatus that comprises the element.

The foregoing are merely exemplary embodiments of the present invention, which enable those skilled in the art to understand or practice the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. An offline testing device, comprising:

a box body (1);

the electric main board (2) is installed in the box body (1), a plurality of test modules (6) are fixedly arranged on the electric main board (2), the test functions of the test modules (6) are different, the test modules (6) are provided with input interfaces (3), and the input interfaces (3) are fixedly arranged on the box body (1);

and part of the test module (6) comprises a switch piece arranged on the box body (1), and when the test component is connected into the input interface (3), the test component is tested by closing or opening the switch piece.

2. The drop off test apparatus of claim 1, wherein:

the testing module (6) further comprises an indicator light (4), the indicator light (4) is fixedly arranged on the box body (1), and the indicator light (4) is connected with the switch piece.

3. The end-of-line testing apparatus of claim 1, wherein:

the plurality of test modules (6) comprise a power supply module (61), the power supply module (61) comprises a power supply switch part (611), a key wake-up switch part (612), a direct current charging wake-up switch part (613) and an alternating current wake-up test switch part (614) which are independent of each other, and the power supply switch part (611), the key wake-up switch part (612), the direct current charging wake-up switch part (613) and the alternating current wake-up test switch part (614) are respectively connected with different input interfaces (3) correspondingly.

4. A drop test apparatus according to claim 1 or 3, wherein:

the plurality of test modules (6) comprise a charging module (62), the charging module (62) comprises a direct current charging confirmation switch piece (621) and an alternating current charging confirmation switch piece (622) which are independent of each other, and the direct current charging confirmation switch piece (621) and the alternating current charging confirmation switch piece (622) are respectively and correspondingly connected with different input interfaces (3);

when the direct current charging confirmation switch piece (621) is disconnected, the charging module (62) simulates an open-circuit fault of a direct current charging confirmation signal; when the direct current charging confirmation switch piece (621) is closed, the charging module (62) simulates normal handshaking of a direct current charging confirmation signal.

5. The drop test apparatus of claim 4, wherein:

the charging module (62) further comprises a first temperature-sensing switch element (623) and a second temperature-sensing switch element (624), when the first temperature-sensing switch element (623) is disconnected, the charging module (62) simulates a temperature-sensing open-circuit fault, and when the first temperature-sensing switch element (623) is closed, the charging module (62) normally tests temperature;

when the second temperature-sensitive switch (624) is closed, the charging module (62) simulates a temperature-sensitive short-circuit fault;

the charging module (62) further comprises an electronic lock forward rotation switch piece (627) and an electronic lock reverse rotation switch piece (628) which are independent of each other, and the electronic lock forward rotation switch piece (627) and the electronic lock reverse rotation switch piece (628) are both connected with an indicator lamp (4);

when the electronic lock forward rotation switch piece (627) is closed, the charging module (62) simulates the forward rotation of the electronic lock, and the corresponding indicator lamp (4) emits light;

when the electronic lock forward rotation switching piece (627) is disconnected, the charging module (62) simulates an electronic lock open-circuit fault, and the corresponding indicator lamp (4) does not emit light.

6. A drop test apparatus according to claim 1 or 3, wherein:

a plurality of test module (6) are including debugging diagnostic module (63), debugging diagnostic module (63) include a plurality of CAN box interface (631), and are a plurality of CAN box interface (631) and corresponding connect through whole car CAN switch spare (632), inside CAN switch spare (633) and the CAN switch spare (634) that charges that are independent of each other respectively between input interface (3).

7. The drop test device according to claim 1, wherein the plurality of test modules (6) comprises:

the BCU debugging module (64) comprises a BCU power supply switch piece (641) and a BCU key awakening switch piece (642) which are independent of each other, and the BCU power supply switch piece (641) and the BCU key awakening switch piece (642) are respectively connected with different input interfaces (3) correspondingly;

and the BMU debugging module (65), the BMU debugging module (65) comprises a BMU power supply switch (651) and a BMU key wake-up switch (652) which are independent of each other, and the BMU power supply switch (651) and the BMU key wake-up switch (652) are respectively and correspondingly connected with different input interfaces (3).

8. The drop test device according to claim 1, wherein the plurality of test modules (6) comprises:

the relay diagnosis module (66) comprises a high-voltage source interface, and the high-voltage source interface is connected with the corresponding input interface (3) through a relay test switch part;

and the insulation test module (67) comprises a plurality of resistors which are connected in series, the resistances of the plurality of resistors are different, and two ends of each resistor are connected to different input interfaces (3).

9. The end-of-line testing apparatus of claim 1, wherein the plurality of test modules (6) comprises:

the DCDC external output module (68) comprises a DCDC external output switch piece (681), the DCDC external output switch piece (681) is connected with an indicator lamp (4), when the DCDC external output switch piece (681) is closed and the corresponding indicator lamp (4) emits light, the DCDC external output is normal, otherwise, the DCDC external output is abnormal;

and the analog & digital signal module (69) comprises a DO signal test switch piece and an indicator lamp (4) connected with the DO signal test switch piece, when the DO signal test switch piece is closed and the corresponding indicator lamp (4) emits light, the DO signal is normally output, otherwise, the DO signal is abnormally output.

10. A testing method using the offline testing apparatus of any one of claims 1-9, comprising the steps of:

and inserting the test component into the input interface (3) corresponding to the test module (6) to perform corresponding test or fault simulation on the test component.