CN115128853B - Response time testing method and system for liquid crystal phase shifter and driving method - Google Patents
Response time testing method and system for liquid crystal phase shifter and driving method Download PDFInfo
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- CN115128853B CN115128853B CN202210722188.5A CN202210722188A CN115128853B CN 115128853 B CN115128853 B CN 115128853B CN 202210722188 A CN202210722188 A CN 202210722188A CN 115128853 B CN115128853 B CN 115128853B
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
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- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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Abstract
The application provides a response time testing method and system for a liquid crystal phase shifter and a driving method. The test method comprises the following steps: determining a stepping phase value; dividing a preset phase interval at equal intervals according to the stepping phase value to obtain a plurality of test phases; determining a plurality of first test voltages according to the plurality of test phases based on a pre-established mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter; driving the liquid crystal phase shifter by using the plurality of first test voltages, and acquiring a plurality of response times of the liquid crystal phase shifter corresponding to the plurality of first test voltages; based on the plurality of first test voltages and the plurality of response times, a response schedule is created for driving the liquid crystal phase shifter. According to the scheme provided by the application, the response speeds of the liquid crystal phase shifter in different phase states are evaluated through the microwave index, so that the method has persuasion in the microwave field, and the acceleration strategy of the liquid crystal phase shifter can be flexibly selected according to the test result.
Description
Technical Field
The application relates to the technical field of microwaves, in particular to a response time testing method, a response time testing system and a response time driving method of a liquid crystal phase shifter.
Background
The phase shifter is an important device in the microwave radio frequency field and is a core component of the phased array antenna. The currently widely used phase shifter is a liquid crystal phase shifter. However, the response speed of the liquid crystal phase shifter is slow, on the order of milliseconds.
In order to flexibly adopt the acceleration strategy of the liquid crystal phase shifter to meet the application requirement, the response time of the phase shifter of different liquid crystal materials needs to be accurately tested. For the response time test in the related art, an optical means is mainly adopted, and the phase change in the microwave index cannot be reflected.
Disclosure of Invention
Accordingly, the present application is directed to a response time testing method, a response time testing system, and a response time testing driving method for a liquid crystal phase shifter, which solve or partially solve the above-mentioned problems.
In a first aspect of the present application, a response time testing method for a liquid crystal phase shifter is provided, including:
determining a stepping phase value;
dividing a preset phase interval at equal intervals according to the stepping phase value to obtain a plurality of test phases;
determining a plurality of first test voltages according to the plurality of test phases based on a pre-established mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter;
driving the liquid crystal phase shifter by using the plurality of first test voltages, and acquiring a plurality of response times of the liquid crystal phase shifter corresponding to the plurality of first test voltages;
based on the plurality of first test voltages and the plurality of response times, a response schedule is created for driving the liquid crystal phase shifter.
In a second aspect of the present application, there is provided a driving method of a liquid crystal phase shifter, comprising:
determining a target phase of the liquid crystal phase shifter;
searching for a target response time from a response time table based on the target phase, wherein the response time table is obtained according to the method of the first aspect;
the liquid crystal phase shifter is driven based on the target response time.
In a third aspect of the present application, there is provided a response time testing system for a liquid crystal phase shifter, comprising:
the host computer is configured to: determining a stepping phase value; dividing a preset phase interval at equal intervals according to the stepping phase value to obtain a plurality of test phases; determining a plurality of first test voltages according to the plurality of test phases based on a pre-established mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter;
a voltage drive module configured to: driving the liquid crystal phase shifter with the plurality of first test voltages;
a vector network analyzer configured to: collecting a plurality of output data corresponding to the plurality of first test voltages;
the upper computer is further configured to: calculating a plurality of response times according to the plurality of output data; based on the plurality of first test voltages and the plurality of response times, a response schedule is created for driving the liquid crystal phase shifter.
From the above, the response time testing method, the response time testing system and the response time driving method for the liquid crystal phase shifter provided by the application can be used for realizing the automatic test of the response time of the liquid crystal phase shifter and outputting the response time table by determining the test phase of the liquid crystal phase shifter and the corresponding driving voltage of the liquid crystal phase shifter, thereby being convenient for driving the liquid crystal phase shifter and obtaining more accurate driving effect.
Drawings
In order to more clearly illustrate the technical solutions of the present application or related art, the drawings that are required to be used in the description of the embodiments or related art will be briefly described below, and it is apparent that the drawings in the following description are only embodiments of the present application, and other drawings may be obtained according to the drawings without inventive effort to those of ordinary skill in the art.
FIG. 1 is a schematic diagram of a response time testing method of a liquid crystal phase shifter according to an embodiment of the present application;
FIG. 2 is a flow chart of a response time testing method of a liquid crystal phase shifter according to an embodiment of the application;
FIG. 3 is a response schedule created based on a plurality of first test voltages and a plurality of response times according to an embodiment of the present application;
FIG. 4 is a flow chart for establishing a mapping relationship between a driving voltage and a phase of a liquid crystal phase shifter according to an embodiment of the present application;
FIG. 5 is a schematic flow chart of a driving method of a liquid crystal phase shifter according to an embodiment of the application;
FIG. 6 is a schematic diagram of a response time testing system of a liquid crystal phase shifter according to an embodiment of the present application;
FIG. 7 is a schematic diagram showing timing synchronization among devices of a response time testing system of a liquid crystal phase shifter according to an embodiment of the present application;
fig. 8 is a schematic diagram of a hardware structure of an upper computer according to an embodiment of the present application.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present application more apparent, embodiments of the present application will be described in detail below with reference to the accompanying drawings.
It should be noted that unless otherwise defined, technical or scientific terms used in the embodiments of the present application should be given the ordinary meaning as understood by one of ordinary skill in the art to which the present application belongs. The terms "first," "second," and the like, as used in embodiments of the present application, do not denote any order, quantity, or importance, but rather are used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that elements or items preceding the word are included in the element or item listed after the word and equivalents thereof, but does not exclude other elements or items. The terms "connected" or "connected," and the like, are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", etc. are used merely to indicate relative positional relationships, which may also be changed when the absolute position of the object to be described is changed.
The phase shifter is a device for adjusting the phase of electromagnetic waves, and has wide application in the fields of accelerators, communication, instruments and meters and the like. Currently common phase shifters may be varactors Guan Yixiang, ferrite phase shifters, MEMS (Micro-Electro-Mechanical System, microelectromechanical system) phase shifters, PIN diode phase shifters, liquid crystal phase shifters, etc. The varactor Guan Yixiang is affected by the packaging performance of the diode, and can only work below 10GHz, so that the requirements of high-frequency applications such as KU/KA satellite communication and 5G communication are difficult to meet; ferrite phase shifters cannot meet the requirements of modern antenna systems due to the large size of the control equipment; MEMS phase shifters and PIN diode phase shifters can only provide a given output phase, which is difficult to meet the needs of modern microwave applications.
The liquid crystal phase shifter is designed based on the basic principle of the existing liquid crystal grating, has the advantages of low cost, miniaturization, batch capacity and the like, and is a phase shifter widely applied at present. However, the response speed of liquid crystal phase shifters is much slower, typically on the order of milliseconds, compared to conventional phase shifters. And the liquid crystal phase shifter has a threshold voltage and a saturation voltage, and has stronger liquid crystal molecular inertia and longer response time near the threshold voltage and shorter response time near the saturation voltage. In order to flexibly adopt the acceleration strategy of the liquid crystal phase shifter to meet the application requirement, the response time of the phase shifter of different liquid crystal materials needs to be accurately tested.
For the response time test in the related art, an optical means is mainly adopted, and the response time of the deflection of liquid crystal molecules is tested more, so that the phase change in the microwave index cannot be accurately corresponding. In addition, in the method for testing the response time of the liquid crystal phase shifter, only the response time in the two states of non-pressurization and saturation voltage are usually tested, and the response time data corresponding to the limited set voltage value cannot show continuous phase change and response speed.
In view of this, the embodiment of the application provides a response time testing method, a response time testing system and a response time driving method for a liquid crystal phase shifter, which utilize the technical means in the microwave field to determine the testing phase of the liquid crystal phase shifter and the corresponding driving voltage thereof according to the application requirements, realize the automatic test of the response time of the liquid crystal phase shifter and output a response time table. According to the scheme provided by the application, the response speeds of the liquid crystal phase shifters in different phase states are directly evaluated through the microwave index, so that the method has persuasion in the microwave field, and the acceleration strategy of the liquid crystal phase shifters can be flexibly selected according to the test result. Furthermore, the scheme of the application can be applied to phase shifters of various different types of liquid crystal materials. The response speed of different liquid crystal materials is different due to the different electromagnetic characteristics, but the response speed is not an influence factor to be considered for the scheme.
Referring to fig. 1, a schematic diagram of a response time testing method of a liquid crystal phase shifter according to an embodiment of the application is shown. For a liquid crystal phase shifter, the dielectric constant of the liquid crystal layer may be controlled by a bias electric field or a magnetic field. Therefore, under the drive of periodic voltage, along with the change of bias voltage, the dielectric constant is continuously changed, the directors of liquid crystal molecules of the liquid crystal phase shifter are deflected, continuous phase adjustment can be further realized, and the response time of the liquid crystal phase shifter is obtained according to the phase change.
Fig. 2 is a flow chart of a response time testing method 200 of a liquid crystal phase shifter according to an embodiment of the application. As shown in fig. 2, the method 200 may include the following steps.
Step S201, determining a stepping phase value.
In this embodiment, a requirement parameter of the liquid crystal phase shifter is determined according to a practical application requirement, and then a step phase value is determined according to the requirement parameter. The required parameter may be the number of bits of the liquid crystal phase shifter set to meet a certain test accuracy requirement. In general, the number of bits of the liquid crystal phase shifter may be 4 bits, 5 bits, 6 bits, or the like, and is not limited in this embodiment. If the liquid crystal phase shifter is pre-arrangedThe bit number is B, the step phase value(degree). The 360-degree phase is an example of a preset phase interval, and it can be understood that the value of the 360-degree phase may be different according to different preset phase intervals.
Step S202, dividing a preset phase interval (for example, 360 DEG phase) at equal intervals according to the step phase value to obtain a plurality of test phases.
In this embodiment, the phase shift range of the liquid crystal phase shifter is set to 360 degrees, and the phase value is adjusted according to the step phase valueEqually dividing 360 degree phase to output N phases +.>(wherein->) As a test phase value.
Step S203, determining a plurality of first test voltages according to the plurality of test phases based on a pre-established mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter.
In some embodiments, in order to facilitate fast and accurate acquisition of different voltage states for testing response time of the liquid crystal phase shifter after obtaining a plurality of test phases of the liquid crystal phase shifter, a mapping relationship between a driving voltage and a phase of the liquid crystal phase shifter may be pre-established, that is, a correspondence relationship between the driving voltage and the phase of the liquid crystal phase shifter is determined, and the driving voltage and the phase of the liquid crystal phase shifter are in one-to-one correspondence. The specific steps for establishing the mapping relationship will be described later.
In this embodiment, after obtaining a plurality of test phases, a plurality of first test voltages may be rapidly determined based on the pre-established mapping relationship, so as to apply voltages to the driving electrodes of the liquid crystal phase shifter in a targeted manner, thereby further representing continuous phase changes.
Step S204, driving the liquid crystal phase shifter by using the plurality of first test voltages, and acquiring a plurality of response times of the liquid crystal phase shifter corresponding to the plurality of first test voltages.
In this embodiment, the plurality of first test voltages are sequentially used as the driving electrode voltages of the liquid crystal phase shifter, and an input signal is provided to the liquid crystal phase shifter. The input signal may comprise a radio frequency signal input to the liquid crystal phase shifter by the vector network analyzer.
In this embodiment, a vector network analyzer may be used to collect a plurality of output data corresponding to the plurality of first test voltages. Specifically, in response to updating the current first test voltage to the next first test voltage, the vector network analyzer receives the radio frequency signal output through the liquid crystal phase shifter, compares the radio frequency signal according to the input signal and the output signal to obtain S (scattering) parameter change data of the phase of the signal, and stores the S parameter change data into a database.
In specific implementation, the vector network analyzer may include the following steps: configuring various parameters output by the vector network analyzer according to test requirements, wherein the parameters can comprise a start frequency, a stop frequency, input power, sweep frequency time, sampling points, S parameters, data formats and the like; the vector network analyzer is connected to the liquid crystal phase shifter, and then the test is started; recording test data, sorting, analyzing and storing test results.
In this embodiment, the plurality of response times may be calculated from the plurality of output data. In particular, the way to calculate the corresponding response time for a single output data may be: assuming that the sweep time of the vector network analyzer is t, the sampling point number is point1, and the initial phase of the liquid crystal phase shifter isAfter the applied first test voltage is changed, the phase of the liquid crystal phase shifter is +>And the error is set to be +_ according to the actual application requirement>And take the phase of change as +.>To->Processing by the upper computer to obtain the sub ∈>To->The required point number is point2, and the response time is +.>Repeating this, the plurality of response times may be calculated from the plurality of output data.
Step S205, creating a response time table for driving the liquid crystal phase shifter based on the plurality of first test voltages and the plurality of response times.
In this embodiment, a response time table is created based on the plurality of response times calculated as described above, and the response time table is stored in a database. As shown in fig. 3, the X-axis of the response time table may include a phase corresponding to the current first test voltage, the Y-axis includes a phase corresponding to the next first test voltage, and the coordinate point within the response time table includes a response time of the phase change. It should be understood that the coordinate points located on the diagonal of the response time table are null values, and the phases of the X-axis and the Y-axis corresponding to the coordinate points are the same, that is, the first test voltage is unchanged. Also, building such a response schedule, it is also possible to skip testing, e.g. with current phase asThe next phase is +.>Can be measured from +.>To->And fills in the corresponding location of the response time table.
In this embodiment, the response time table is used to drive the liquid crystal phase shifter, and the acceleration strategy of the liquid crystal phase shifter can be adopted accordingly. The specific driving steps will be described later.
A method 400 for establishing a mapping relationship between a driving voltage and a phase of a liquid crystal phase shifter according to an embodiment of the present application may be as shown in fig. 4. The method 400 may include the following steps.
Step S401, dividing a preset voltage (e.g. 20V) at equal intervals according to the step voltage value to obtain a plurality of second test voltages.
In this embodiment, a step voltage value may be determined according to actual application requirements, and then the preset voltage is divided at equal intervals according to the step voltage value, so as to obtain a plurality of second test voltages. In order to ensure that the measured data is sufficient to drive the liquid crystal phase shifter at the threshold voltage and the saturation voltage, the corresponding response time can be measured to drive the liquid crystal phase shifter, and the magnitude of the preset voltage needs to be larger than the threshold voltage and the saturation voltage. Although the threshold voltage and saturation voltage of different liquid crystal materials may be different, they are usually around several volts, so for example, setting the preset voltage to 20V is sufficient to measure the response time of the liquid crystal phase shifter at the threshold voltage and saturation voltage.
In order to ensure that the interval obtained by dividing the preset voltage by the step voltage value can satisfy the accuracy of the data obtained by the subsequent look-up table, the step voltage value in this embodiment may be set smaller, for example, 0.01V. Assuming that 0.01V is used as the step voltage value, the preset voltage of 20V may be divided into 2000 parts, so that the measured mapping table may have enough corresponding relation values of voltage value and phase. In this way, when determining the plurality of first test voltages according to the plurality of test phases in step 203, the more accurate first test voltages may be found from the mapping table.
Step S402, driving the liquid crystal phase shifter by using the plurality of second test voltages, and acquiring a plurality of phases corresponding to the plurality of second test voltages.
In this embodiment, the plurality of second test voltages are sequentially used as the driving electrode voltages of the liquid crystal phase shifter, and the input signals are provided to the liquid crystal phase shifter. The input signal may comprise a radio frequency signal input to the liquid crystal phase shifter by the vector network analyzer.
In this embodiment, in response to updating from the current second test voltage to the next second test voltage, the vector network analyzer receives the radio frequency signal output through the liquid crystal phase shifter, obtains the phase of the signal, and stores the phase in the database.
Step S403, based on the plurality of second test voltages and the plurality of phases, establishing a mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter.
In practical applications, the mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter may be established before the step of determining the required parameter of the liquid crystal phase shifter, or the mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter may be established after the step of obtaining a plurality of test phases, which is not particularly limited.
The application also provides a driving method of the liquid crystal phase shifter. As shown in fig. 5, the method 500 may include the steps of:
step S501, determining a target phase of the liquid crystal phase shifter.
Step S502 is to find a target response time from a response time table based on the target phase, the response time table being obtained according to the method (e.g. the method 200, 400) in the foregoing embodiment.
Step S503, driving the liquid crystal phase shifter based on the target response time.
Thus, the target response time corresponding to the target phase can be obtained by searching the response time table, and the driving of the liquid crystal phase shifter can be better realized.
In this embodiment, in response to determining that the target response time is higher than a response time threshold, the target driving voltage corresponding to the target phase is raised by a preset voltage value and then used to drive the liquid crystal phase shifter; after a preset time has elapsed, the liquid crystal phase shifter is driven with the target driving voltage. Thus, when the response time of the liquid crystal phase shifter does not meet the use requirement, the response can be accelerated by applying a high voltage for a short time, and the driving efficiency can be improved.
It should be noted that the foregoing describes some embodiments of the present application. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments described above and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
Based on the same technical concept, the application also provides a response time testing system 600 of the liquid crystal phase shifter, corresponding to the method of any embodiment.
Referring to fig. 6, the response time test system 600 of the liquid crystal phase shifter includes:
the host computer 601 is configured to: determining a stepping phase value; dividing a preset phase interval (for example, 360-degree phase) at equal intervals according to the stepping phase value to obtain a plurality of test phases; determining a plurality of first test voltages according to the plurality of test phases based on a pre-established mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter;
a voltage drive module 602 configured to: driving the liquid crystal phase shifter with the plurality of first test voltages;
a vector network analyzer 603 configured to: collecting a plurality of output data corresponding to the plurality of first test voltages;
the upper computer 601 is further configured to: calculating a plurality of response times according to the plurality of output data; based on the plurality of first test voltages and the plurality of response times, a response schedule is created for driving the liquid crystal phase shifter.
The testing system consists of an upper computer 601, a voltage driving module 602 and a vector network analyzer 603, and the devices are communicated with each other in information. According to the response time testing system 600 of the liquid crystal phase shifter, the upper computer 601 is used for respectively controlling the voltage driving module 602 and the vector network analyzer 603, so that the driving voltage applied to the liquid crystal phase shifter by the voltage driving module 602 is changed based on the instruction of the upper computer 601, the vector network analyzer 603 is used for collecting the output data of the liquid crystal phase shifter, and finally, the response time of the liquid crystal phase shifter is obtained and a response time table is output based on the algorithm processing of the upper computer 601 on the related data, so that the automatic test of the response time of the liquid crystal phase shifter is realized.
In some embodiments, the voltage driving module 602 may include a synchronization unit specifically configured to send voltage change information to the vector network analyzer 603 in response to updating from a current first test voltage to a next first test voltage; and/or in response to updating from the current second test voltage to the next second test voltage, the synchronization unit sends voltage change information to the vector network analyzer 603. Fig. 7 shows a schematic diagram of timing synchronization among devices of a response time testing system 600 for a liquid crystal phase shifter. As shown in fig. 7, when the voltage driving module 602 drives the first test voltage or the second test voltage of the liquid crystal phase shifter to change, the vector network analyzer 603 synchronously receives the voltage change information and collects the output data of the liquid crystal phase shifter, so as to ensure that the time for obtaining the complete phase change is ensured, thereby improving the accuracy of the test result.
In some alternative embodiments, the host computer 601 establishes a communication connection with the voltage driving module 602 through a USB cable, and establishes a communication connection with the vector network analyzer 603 through a LAN interface, a USB interface, or other interfaces that can implement a communication function; the voltage driving module 602 is connected with a driving electrode of the liquid crystal phase shifter through an FPC wire or other cables with current conduction; the vector network analyzer 603 is connected to the input and output terminals of the liquid crystal phase shifter by a radio frequency cable.
Fig. 8 is a schematic diagram showing a hardware structure of the host computer 601 according to the embodiment. In some alternative embodiments, the host computer 601 may include: a processor 1010, a memory 1020, an input/output interface 1030, a communication interface 1040, and a bus 1050. Wherein processor 1010, memory 1020, input/output interface 1030, and communication interface 1040 implement communication connections therebetween within the device via a bus 1050.
The processor 1010 may be implemented by a general-purpose CPU (Central Processing Unit ), microprocessor, application specific integrated circuit (Application Specific Integrated Circuit, ASIC), or one or more integrated circuits, etc. for executing relevant programs to implement the technical solutions provided in the embodiments of the present disclosure.
The Memory 1020 may be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory ), static storage device, dynamic storage device, or the like. Memory 1020 may store an operating system and other application programs, and when the embodiments of the present specification are implemented in software or firmware, the associated program code is stored in memory 1020 and executed by processor 1010.
The input/output interface 1030 is used to connect with an input/output module for inputting and outputting information. The input/output module may be configured as a component in a device (not shown) or may be external to the device to provide corresponding functionality. Wherein the input devices may include a keyboard, mouse, touch screen, microphone, various types of sensors, etc., and the output devices may include a display, speaker, vibrator, indicator lights, etc.
Communication interface 1040 is used to connect communication modules (not shown) to enable communication interactions of the present device with other devices. The communication module may implement communication through a wired manner (such as USB, network cable, etc.), or may implement communication through a wireless manner (such as mobile network, WIFI, bluetooth, etc.).
Bus 1050 includes a path for transferring information between components of the device (e.g., processor 1010, memory 1020, input/output interface 1030, and communication interface 1040).
It should be noted that although the above-described device only shows processor 1010, memory 1020, input/output interface 1030, communication interface 1040, and bus 1050, in an implementation, the device may include other components necessary to achieve proper operation. Furthermore, it will be understood by those skilled in the art that the above-described apparatus may include only the components necessary to implement the embodiments of the present description, and not all the components shown in the drawings.
As an alternative embodiment, the storage of information may be accomplished by any method or technique, including both permanent and non-permanent, removable and non-removable media. The information may be readable instructions, data structures, modules of a program, or other data. Examples of storage media for the host computer 601 include, but are not limited to, phase change memory (PRAM), static Random Access Memory (SRAM), dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), read Only Memory (ROM), electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium, which can be used to store information that can be accessed by the host computer 601.
The device of the foregoing embodiment is used to implement the response time testing method of the corresponding liquid crystal phase shifter in any of the foregoing embodiments, and has the beneficial effects of the corresponding method embodiment, which is not described herein again.
Those of ordinary skill in the art will appreciate that: the discussion of any of the embodiments above is merely exemplary and is not intended to suggest that the scope of the application (including the claims) is limited to these examples; the technical features of the above embodiments or in the different embodiments may also be combined within the idea of the application, the steps may be implemented in any order, and there are many other variations of the different aspects of the embodiments of the application as described above, which are not provided in detail for the sake of brevity.
Additionally, well-known power/ground connections to Integrated Circuit (IC) chips and other components may or may not be shown within the provided figures, in order to simplify the illustration and discussion, and so as not to obscure the embodiments of the present application. Furthermore, the devices may be shown in block diagram form in order to avoid obscuring the embodiments of the present application, and also in view of the fact that specifics with respect to implementation of such block diagram devices are highly dependent upon the platform within which the embodiments of the present application are to be implemented (i.e., such specifics should be well within purview of one skilled in the art). Where specific details (e.g., circuits) are set forth in order to describe example embodiments of the application, it should be apparent to one skilled in the art that embodiments of the application can be practiced without, or with variation of, these specific details. Accordingly, the description is to be regarded as illustrative in nature and not as restrictive.
While the application has been described in conjunction with specific embodiments thereof, many alternatives, modifications, and variations of those embodiments will be apparent to those skilled in the art in light of the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may use the embodiments discussed.
The present embodiments are intended to embrace all such alternatives, modifications and variances which fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, and the like, which are within the spirit and principles of the embodiments of the application, are intended to be included within the scope of the application.
Claims (9)
1. A response time testing method for a liquid crystal phase shifter, comprising:
determining a stepping phase value;
dividing a preset phase interval at equal intervals according to the stepping phase value to obtain a plurality of test phases;
determining a plurality of first test voltages according to the plurality of test phases based on a pre-established mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter; the establishing a mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter specifically includes: dividing the preset voltage at equal intervals according to the stepping voltage value to obtain a plurality of second test voltages; driving the liquid crystal phase shifter by using the plurality of second test voltages, and acquiring a plurality of phases corresponding to the plurality of second test voltages; establishing a mapping relation between the driving voltage and the phase of the liquid crystal phase shifter based on the second test voltages and the phases;
driving the liquid crystal phase shifter by using the plurality of first test voltages, and acquiring a plurality of response times of the liquid crystal phase shifter corresponding to the plurality of first test voltages;
based on the plurality of first test voltages and the plurality of response times, a response schedule is created for driving the liquid crystal phase shifter.
2. The method of claim 1, wherein acquiring a plurality of response times of the liquid crystal phase shifter corresponding to the plurality of first test voltages comprises:
collecting a plurality of output data corresponding to the plurality of first test voltages by using a vector network analyzer;
the plurality of response times is calculated from the plurality of output data.
3. The method of claim 1, wherein determining a step phase value comprises:
determining a demand parameter of the liquid crystal phase shifter;
and determining the stepping phase value according to the demand parameter.
4. A driving method of a liquid crystal phase shifter, comprising:
determining a target phase of the liquid crystal phase shifter;
looking up a target response time from a response schedule based on the target phase, the response schedule being obtained according to the method of any one of claims 1-3;
the liquid crystal phase shifter is driven based on the target response time.
5. The method of claim 4, wherein driving the liquid crystal phase shifter based on the target response time comprises:
and in response to determining that the target response time is higher than a response time threshold, increasing a target driving voltage corresponding to the target phase by a preset voltage value and then driving the liquid crystal phase shifter.
6. The method of claim 5, wherein driving the liquid crystal phase shifter based on the target response time further comprises:
after a preset time has elapsed, the liquid crystal phase shifter is driven with the target driving voltage.
7. A response time testing system for a liquid crystal phase shifter, comprising:
the host computer is configured to: determining a stepping phase value; dividing a preset phase interval at equal intervals according to the stepping phase value to obtain a plurality of test phases; determining a plurality of first test voltages according to the plurality of test phases based on a pre-established mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter; the establishing a mapping relationship between the driving voltage and the phase of the liquid crystal phase shifter specifically includes: dividing the preset voltage at equal intervals according to the stepping voltage value to obtain a plurality of second test voltages; driving the liquid crystal phase shifter by using the plurality of second test voltages, and acquiring a plurality of phases corresponding to the plurality of second test voltages; establishing a mapping relation between the driving voltage and the phase of the liquid crystal phase shifter based on the second test voltages and the phases;
a voltage drive module configured to: driving the liquid crystal phase shifter with the plurality of first test voltages;
a vector network analyzer configured to: collecting a plurality of output data corresponding to the plurality of first test voltages;
the upper computer is further configured to: calculating a plurality of response times according to the plurality of output data; based on the plurality of first test voltages and the plurality of response times, a response schedule is created for driving the liquid crystal phase shifter.
8. The system of claim 7, wherein the voltage drive module comprises a synchronization unit configured to: and transmitting voltage change information to the vector network analyzer in response to the first test voltage change.
9. The system of claim 7, wherein the host computer, the voltage driving module, the vector network analyzer and the liquid crystal phase shifter are respectively connected in a communication manner to realize mutual communication.
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