CN115114145A

CN115114145A - Method, system and medium for parameterization design of test program set of automatic test system

Info

Publication number: CN115114145A
Application number: CN202210614717.XA
Authority: CN
Inventors: 肖勇; 周阳明; 陈维波; 李乐; 刘潇龙
Original assignee: CETC 10 Research Institute
Current assignee: CETC 10 Research Institute
Priority date: 2022-06-01
Filing date: 2022-06-01
Publication date: 2022-09-27

Abstract

The invention discloses a test program set parameterization design method, a system and a medium of an automatic test system, wherein the method comprises the following steps: packaging related contents of the test program set into classes; a method for packaging interface functions required by the design of the test program set into classes; and according to the methods of all the classes, realizing parameterization of data required by designing the test program set. The invention abstracts and encapsulates the content related to the test program set on the bottom layer to form various methods, the methods of the types are provided for the designer to call, the variables and default parameters of the methods are provided for the designer to refer and modify, and the bottom layer driving codes do not need to be concerned or repeatedly designed, thereby the design of the test program set is simpler and more efficient.

Description

Method, system and medium for parameterization design of test program set of automatic test system

Technical Field

The invention relates to the technical field of data processing, in particular to a parameterization design method, a parameterization design system and a parameterization design medium for a test program set of an automatic test system.

Background

An Automatic Test System (ATS) is a generic term for a system that is controlled by a computer and can automatically complete excitation, measurement, data processing, display, and output test results for a product to be tested. The ATS generally includes three major components, namely, an Automatic Test Equipment (ATE), a Test Program Set (TPS), and a TPS software development tool (also called a test development environment). Aiming at modules with large production capacity, multiple repeated work and long testing time of a single set, the automatic testing system is arranged, so that the product testing efficiency can be improved, and meanwhile, the human resources are saved, and the method is a method with half the effort.

The popularization and application of the automatic test system improve the debugging production efficiency of products to a certain extent, while the development mode efficiency of the conventional automatic test system is low, thus hindering the popularization and application of the automatic test system. The automatic test system is a product combining a measuring instrument with a computer technology, a software technology, an interface technology, a communication technology and a network technology, and carries out product test upgrading according to product test requirements. The software of the ATS is the core and key of the whole automatic test system, and is a bridge for connecting test resources with a tested unit, the quality of the TPS directly influences the overall performance of the ATS, and the design of the TPS is particularly important in the development process of the whole automatic test system.

The main work of developing a new product automatic test system is the integration of ATE and the design of TPS, and the TPS is designed on an automatic test system software platform. The content of the test program set of the automatic test system is mainly description of a test method and a test flow of a tested unit, and mainly comprises control of the state of the tested unit, parameter setting of a test instrument, control of the state of external equipment (matrix routing, a bus board card, a low-frequency switch, a digital IO port and the like), and processing of test data, and the curing is performed through codes. The process of operating the TPS by the automatic test system software platform is substantially to operate TPS codes by combining the bottom layer drive of the automatic test system software platform, so that when designing the TPS, the bottom layer drive resources and related function interfaces of the software platform need to be known well.

The design of the conventional TPS is to design on an automatic test system software platform, a bottom layer driver of the automatic test system software platform is separated from the TPS, the subsequent automatic test system development of products can be realized by people with two different roles, a system maintenance role is responsible for the maintenance of the bottom layer driver and the software platform, a TPS designer is responsible for the automatic test system development of new products, and the TPS designer mainly works as the TPS design. TPS designers need to know a software platform, particularly a bottom layer drive and function interface, so that the design speed of TPS can be improved, TPS design modes can be standardized, and the difficulty in upgrading and maintaining a later-stage automatic test system is reduced.

Before writing TPS, a designer knows a test method, a test flow, a test environment, attention and the like of a tested product according to design files such as a product test description or product specification and the like; establishing a connection relation to determine an adapter, a testing instrument and a connection relation used in the test; the testing step is a main part of test program compiling and is formed by combining according to certain logics (series connection, circulation, jump, branching and the like), and the TPS describes the testing step of the tested product in detail. And (4) the TPS designer writes the test steps step by step on the automatic test system software platform according to the test file corresponding to the tested equipment. After the TPS design is preliminarily completed, a bottom layer drive needs to be called on an automatic test system software platform, TPS is tested by combining hardware equipment such as instruments and peripherals, and whether the logic, variables, calculation formulas, jump settings and the like are correct is verified.

The specific content of the TPS mainly describes a test flow and a test method of a tested unit, and the test flow and the test method comprise the contents of the link of test equipment, the state setting of the tested unit, the state setting of a test instrument, the parameter setting of the test instrument, the acquisition, the processing and the storage of test data and the like. The conventional TPS design is separated from an automatic test system software platform, so that the TPS content is only related to the test flow and the test method of the tested unit, and a specific bottom layer drive code is not embodied, thereby improving the universality and readability of the TPS design and reducing the difficulty of later maintenance.

The TPS is mainly used for driving hardware equipment such as instruments, tools and units to be tested to automatically execute tests on the basis of an automatic test system software platform, collecting test results and judging whether the test results are qualified or not. The TPS content only comprises a test method of a tested unit, and in the process of automatically executing a test on the driving hardware equipment, the TPS needs to call a related bottom layer drive, and sends related control commands and setting data through a bus, and the commands and the data content are interface functions transmitted to the bottom layer drive by the TPS, so that when the TPS is designed, the interface functions of the bottom layer drive and default parameters corresponding to the functions need to be known. Designing the TPS and maintaining the underlying drive are two people with different roles, which brings certain difficulty to skillfully design the TPS.

The conventional TPS design mode requires a designer to be familiar with all drivers on the bottom layer of the software platform of the automatic test system and corresponding interface functions, and the design is switched between TPS design and bottom layer driver observation during TPS design, so that the design efficiency of TPS is reduced, and for a person who is not familiar with the bottom layer driver, the TPS is difficult to design smoothly, and even a driver program can be designed repeatedly. According to related contents related to TPS, related function names, function interface variables and default parameters driven by the bottom layer of the software platform of the automatic test system are extracted and presented to a TPS designer in a list form, so that parametric design is realized, the TPS design difficulty is reduced, and the TPS design efficiency and the universality of the software platform of the automatic test system are improved.

Disclosure of Invention

The invention provides a method, a system and a medium for parametric design of a test program set of an automatic test system, aiming at changing the existing TPS design mode, reducing the TPS design difficulty, and improving the design efficiency of a test program of the automatic test system and the universality of a software platform of the automatic test system.

The invention discloses a test program set parameterization design method of an automatic test system, which comprises the following steps:

packaging related contents of the test program set into classes;

a method for packaging interface functions required by the design of the test program set into classes;

and according to the methods of all the classes, realizing parameterization of data required by designing the test program set.

Further, the packaging the related content of the test program set into classes:

the related content comprises control of the state of the tested unit, parameter setting of a testing instrument, control of the tool state and processing of testing data.

Further, the control of the tool state comprises a matrix route, a bus board card, a low-frequency switch and a digital IO port.

Further, the parameterization of data required for designing the test program set is realized according to the methods of the classes, and comprises the following steps:

extracting various methods and forming a method list;

on the basis of the method list, extracting variables and default parameter values of corresponding methods, and forming a list;

materializing various types, and creating objects required by the design of the test program set;

and according to the designed test program set, parameterizing data required by the design of the test program set.

Further, the parameterizing data required by the design of the test program set according to the designed test program set comprises the following steps:

designing a test program set, determining a currently called object, selecting an applicable method from a method list of the object, and then determining a parameter value of the method.

Further, the parameterizing data required by the design of the test program set according to the designed test program set further comprises:

designing a test program set, changing default parameter values into values required by the design test program set according to the data types of the default parameter values of the method and calling the method required by the design of the test program set, and accordingly determining the actual content of the method.

The invention also discloses a test program set parameterization design system of the automatic test system, which comprises the following steps:

the content packaging module is used for packaging the related content of the test program set into classes;

the function packaging module is used for packaging the interface functions required by the design of the test program set into class methods;

and the parameterization module is used for realizing parameterization of data required by designing the test program set according to the methods of the classes.

The invention also discloses a computer readable storage medium for storing a computer program, wherein the computer program realizes the parameterized design method of the test program set of the automatic test system when being executed by a processor.

Due to the adoption of the technical scheme, the invention has the following advantages:

the TPS is simpler to design and has higher efficiency. The invention abstractly encapsulates the TPS related content on the bottom layer to form various methods, the methods of the types are provided for a designer to call, the variables and default parameters of the methods are referred and modified by the designer, the attention on the bottom layer driving code is not needed, or the bottom layer driving code is repeatedly designed, the attention is focused on the TPS design, and the TPS design is simpler and more efficient.

TPS content is more uniform and standard, and readability is stronger. The invention provides parameterized underlying driving resources for designing TPS, interface functions, variable names and parameter forms of the TPS are all provided by an automatic test system software platform, and the TPS is solidified and can not be changed, so that a designer can directly call the TPS. The TPS designed by different designers has the same style, the content description is more uniform and standard, and the readability of the code is stronger.

The software platform reuse rate of the automatic test system is higher. The invention adopts a mode of separating bottom layer drive and top layer application of an automatic test system software platform, TPS content only relates to a test method and a test step of a tested unit, and specific execution codes or drive codes are finished by the bottom layer of the automatic test system software platform. The automatic test system software platform has abundant driving resource libraries, can support all applications of the top TPS, supports TPS design of new products, does not need to develop bottom codes or platform software of the automatic test system software platform, and enables the reuse rate of the automatic test system software platform to be higher.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments described in the embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings.

FIG. 1 is a flowchart illustrating a method for parameterizing a test suite of an automatic test system according to an embodiment of the present invention;

fig. 2 is a schematic diagram of a framework for parameterizing a test suite of an automatic test system according to an embodiment of the present invention.

Detailed Description

The invention will be further described with reference to the drawings and examples, it being understood that the examples described are only some of the examples and are not intended to be exhaustive. All other embodiments available to those of ordinary skill in the art are intended to be within the scope of the embodiments of the present invention.

Referring to fig. 1 and fig. 2, in the embodiment of the present invention, first, a bottom layer driver related to the relevant content of a test program set is implemented, including control of a tested unit state, setting of parameters of a test instrument, control of a tool state (matrix routing, a bus board card, a low frequency switch, a digital IO port, etc.), processing of test data, and other contents, to form a class by abstract encapsulation, and an interface function provided for TPS design is encapsulated as a class method; extracting various methods and forming a list; extracting variables and default parameter values of corresponding methods, and forming a list; materializing various types, and creating objects required by the design of a test program set; and designing a test program set, and presenting corresponding methods, variables and default values to a designer for calling in a parameterized form. Therefore, a uniform, standard and convenient parameterized design method is provided for the design of the test program set.

Taking the control of relevant instruments of a certain tested product test program set as an example, the following implementation steps are adopted:

s1: abstract packaging is carried out on the bottom layer driver related to the related content of the test program set to form a class, and an interface function provided for TPS design is packaged into the class. The following example is a certain instrument driver class of the package.

class N5181():

def __ init __ (self, instrument interface "asll 1:: INSTR"):

visa __ init __ (self, instrument interface)

def ligation (self):

……

def sets the frequency (self, frequency 1000):

……

def sets the amplitude mv (self, amplitude 2):

……

def sets the amplitude dBm (self, amplitude 0):

……

def sets the modulation depth (self, depth 10):

……

def sets the continuous scan (self):

……

def read amplitude (self):

……

def read frequency (self):

……

s2: and extracting the method of the instrument class formed by abstraction to form a method list. As shown in table 1.

Table 1 list of methods of class

S3: and extracting the variables and default parameter values of the corresponding method on the basis of the extracted method list. As shown in table 2.

TABLE 2 list of variables and default parameter values for each method

Serial number	Class name	Name of method	Name of variable	Default parameter value
					1	N5181	Connect ()
2	N5181	Setting frequency ()	Frequency of	1000
					3	N5181	Setting amplitude mv ()	Amplitude of	2
4	N5181	Setting amplitude dBm ()	Amplitude of	0
					5	N5181	Setting modulation depth()	Depth of field	10
6	N5181	Setting continuous scanning ()
					7	N5181	Read amplitude ()
8	N5181	Read frequency ()

S4: the materialization class creates the objects required by the design of the test program set.

S5: designing a test program set, calling a relevant method and a corresponding variable name, and determining a final parameter value by referring to a default parameter value.

The invention also provides an embodiment of a test program set parameterization design system of the automatic test system, which comprises the following steps:

the function packaging module is used for packaging the interface functions required by the design test program set into class methods;

and the parameterization module is used for realizing parameterization of data required by the test program set design in the embodiment according to various methods.

The present invention also provides an embodiment of a computer-readable storage medium for storing a computer program, wherein the computer program, when executed by a processor, implements the method for parameterizing the test suite of the automatic test system in the above-mentioned embodiment.

Finally, it should be noted that: the above embodiments are only for illustrating the technical solutions of the present invention and not for limiting the same, and although the present invention is described in detail with reference to the above embodiments, those of ordinary skill in the art should understand that: modifications and equivalents may be made to the embodiments of the invention without departing from the spirit and scope of the invention, which is to be covered by the claims.

Claims

1. A parameterization design method for a test program set of an automatic test system is characterized by comprising the following steps:

packaging related contents of the test program set into classes;

2. The method of claim 1, wherein the packaging the content associated with the set of test programs into classes:

3. The method of claim 2, wherein the control of the tool state comprises matrix routing, bus boards, low frequency switches, digital IO ports.

4. The method of claim 1, wherein the parameterizing of the data required to design the set of test programs according to the methods of each of the classes comprises:

extracting various methods and forming a method list;

5. The method of claim 4, wherein parameterizing data required for design of the set of test programs according to the designed set of test programs comprises:

6. The method of claim 5, wherein the parameterizing the set of test procedures design required data according to a designed set of test procedures further comprises:

designing a test program set, changing default parameter values into values required by the design of the test program set according to the data types of the default parameter values of the method and calling the method required by the design of the test program set, and determining the actual content of the method.

7. A parameterized design system for a test suite of an automatic test system, comprising:

8. A computer-readable storage medium for storing a computer program, wherein the computer program, when executed by a processor, implements the test suite parameterization design method for an automatic test system according to any one of claims 1 to 6.