CN115098536B

CN115098536B - Semiconductor data query method, device, electronic equipment and storage medium

Info

Publication number: CN115098536B
Application number: CN202211019040.1A
Authority: CN
Inventors: 黄宗; 刘永利; 刘嘉玲
Original assignee: Changsha Guangli Microelectronics Co ltd
Current assignee: Changsha Guangli Microelectronics Co ltd
Priority date: 2022-08-24
Filing date: 2022-08-24
Publication date: 2022-11-22
Anticipated expiration: 2042-08-24
Also published as: CN115098536A

Abstract

The application relates to a semiconductor data query method, a device, an electronic device and a storage medium, wherein the method comprises the following steps: acquiring a data query request of a user and at least one role information matched with the user information of the user; performing authority verification on the data query request, and determining a data query condition which accords with the data authority of the user in the data query request, wherein the data authority of the user is determined according to the data authority of the at least one role information on at least one semiconductor data dimension; and determining the semiconductor data matched with the data query condition according to the data query condition. The semiconductor data query method provided by the embodiment of the application can quickly respond to the data query requirement of a user, improves the security level of data, and ensures that the user can only check the data within the authority range.

Description

Semiconductor data query method, device, electronic equipment and storage medium

Technical Field

The present application relates to the field of semiconductor data management technologies, and in particular, to a semiconductor data query method, an apparatus, an electronic device, and a storage medium.

Background

In the industrial production field of semiconductor manufacturing, production data and quality data are often required throughout the entire semiconductor product cycle. During production and testing, a large amount of data is generated, such as data generated by testing different types of products for different products. Generally, the data has certain data authority difference for different organizations, different posts and different users, and if the data is not filtered, the users are required to find the wanted data from a large amount of data or see sensitive data. The data authority for viewing data is different in different departments, for example, the data authority of a PE process engineer is different from the data authority of a PIE process engineer.

In the user right management system in the prior art, usually, only whether a configuration role menu can control the user right or not is visible, and whether the user has the right to enter a certain menu or not is limited to query data. However, due to the limitation of data authority management in the related art, the viewing requirements of large-data semiconductor data and multi-dimensional semiconductor data cannot be met, and therefore a more free and reliable semiconductor data query method is needed in the related art.

Disclosure of Invention

The embodiment of the application provides a semiconductor data query method, a semiconductor data query device, electronic equipment and a storage medium, and at least solves the technical problem that the semiconductor data query of big data cannot be met in the related technology.

In a first aspect, an embodiment of the present application provides a semiconductor data query method, where the method includes:

acquiring a data query request of a user and at least one role information matched with the user information of the user;

performing authority verification on the data query request, and determining a data query condition which accords with the data authority of the user in the data query request, wherein the data authority of the user is determined according to the data authority of the at least one role information on at least one semiconductor data dimension, and the method comprises the following steps: acquiring a plurality of target data types contained in the data query request, and sequentially determining the data authority range of the user on a single target data type dimension; summarizing the data authority ranges of the users on a single target data type dimension, and determining the total data authority ranges of the users on a plurality of target data type dimensions; determining a data query condition which accords with the total data authority range in the data query request according to the total data authority range;

and determining the semiconductor data matched with the data query condition according to the data query condition.

According to the semiconductor data query method provided by the embodiment of the application, the data authority of the user can be determined according to the role information corresponding to the user for querying the data and the data authority of the role information on at least one semiconductor data dimension. Then, a data query condition in the data query request, which meets the data authority of the user, can be determined. Finally, the corresponding semiconductor data can be obtained according to the data query condition. The semiconductor data query method can quickly respond to the data query requirement of a user, simultaneously improves the safety level of the system, and ensures that the user can only view data within the authority range.

Optionally, in an embodiment of the present application, the data authority of the user is determined according to the following manner:

respectively acquiring a plurality of subdata authorities of the at least one role information on at least one semiconductor data dimension;

and solving a union set of the plurality of subdata authorities and determining the data authority of the user.

Optionally, in an embodiment of the present application, in a case that the semiconductor data dimension includes a data type dimension, the data authority of the user is determined as follows:

respectively acquiring a plurality of subdata authorities of the at least one role information on at least one dimension of other semiconductor data except the dimension of the data type;

and after the union set of the plurality of subdata authorities is obtained, the intersection set of the subdata authorities and the data authority of the at least one role information in the data type dimension is obtained, and the data authority of the user is determined.

Optionally, in an embodiment of the present application, the determining a data authority range of the user in a single target data type dimension includes:

selecting target role information matched with the data authority on the target data type dimension from the at least one role information;

and determining the data authority range of the user in the dimension of the target data type based on the sub-data authority of the target role information in the at least one semiconductor data dimension.

Optionally, in an embodiment of the present application, the performing permission verification on the data query request, and determining a data query condition in the data query request, where the data query condition meets the data permission of the user, includes:

acquiring the priority of the data authority of the user on at least one semiconductor data dimension;

and sequentially screening the data query conditions which accord with the data authority of the user according to the priority of the data authority.

Optionally, in an embodiment of the present application, the semiconductor data dimension includes at least one of:

product dimension, process dimension, data type dimension, wafer fabrication plant dimension, equipment dimension, test time dimension, process flow dimension.

Optionally, in an embodiment of the present application, the method further includes:

acquiring user information of a user to be configured with an authority;

determining at least one role information matched with the user information;

configuring data permissions of the at least one role information in at least one semiconductor data dimension.

Optionally, in an embodiment of the present application, after configuring the data authority of the at least one role information in at least one semiconductor data dimension, the method further includes:

loading a menu matched with the data authority and/or the at least one role information based on the at least one role information matched with the user information and/or the data authority of the at least one role information on at least one semiconductor data dimension.

Optionally, in an embodiment of the present application, the configuring data authority of the at least one role information on at least one semiconductor data dimension includes:

configuring data authority of the at least one role information in at least one semiconductor data dimension and priority order of the data authority based on the at least one role information and/or data attribute of the semiconductor data.

Optionally, in an embodiment of the present application, the configuring data authority of at least one semiconductor data dimension based on the user information and/or the data attribute of the semiconductor data, and the priority order of the data authority include:

and setting the priority of the data authority of the process dimension as the highest priority based on a data security coefficient in the data attribute of the semiconductor data.

Optionally, in an embodiment of the application, the configuring, based on the user information and/or data attributes of the semiconductor data, data authority of at least one semiconductor data dimension, and a priority order of the data authority includes:

and setting the priority of the data authority of the data type dimension as the highest priority based on a test link in the data attribute of the semiconductor data.

In a second aspect, an embodiment of the present application further provides a semiconductor data query apparatus, where the apparatus includes:

the system comprises an acquisition module, a processing module and a display module, wherein the acquisition module is used for acquiring a data query request of a user and at least one role information matched with the user information of the user;

the authority verification module is used for performing authority verification on the data query request, determining a data query condition which accords with the data authority of the user in the data query request, and determining the data authority of the user according to the data authority of the at least one role information in at least one semiconductor data dimension, and comprises: acquiring a plurality of target data types contained in the data query request, and sequentially determining the data authority range of the user on a single target data type dimension; summarizing the data authority ranges of the users on a single target data type dimension, and determining the total data authority ranges of the users on a plurality of target data type dimensions; determining a data query condition which accords with the total data authority range in the data query request according to the total data authority range;

and the determining semiconductor data module is used for determining the semiconductor data matched with the data query condition according to the data query condition.

In a third aspect, an embodiment of the present application further provides an electronic device, including a processor and a memory for storing processor-executable instructions, where the processor is configured to implement the method according to the embodiments of the present application when the processor is configured to execute the instructions.

In a fourth aspect, the embodiments of the present application further provide a non-transitory computer-readable storage medium, on which computer program instructions are stored, and the computer program instructions, when executed by a processor, implement the method according to the embodiments of the present application.

In a fifth aspect, the present application further provides a computer program product, which includes computer readable code or a non-volatile computer readable storage medium carrying computer readable code, when the computer readable code runs in a processor of an electronic device, the processor in the electronic device executes the method according to the various embodiments of the present application.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.

The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:

FIG. 1 is a flowchart of a method of a semiconductor data query method according to an embodiment of the present application;

FIG. 2 is a flowchart of a method for configuring rights of semiconductor data according to an embodiment of the present disclosure;

fig. 3 is a schematic block diagram of a semiconductor data query device according to an embodiment of the present application;

fig. 4 is a schematic block structure diagram of an electronic device provided in an embodiment of the present application;

FIG. 5 is a conceptual partial view of a computer program product provided by embodiments of the present application.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be described and illustrated below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments provided in the present application without any inventive step are within the scope of protection of the present application. Moreover, it should be appreciated that in the development of any such actual implementation, as in any engineering or design project, numerous implementation-specific decisions must be made to achieve the developers' specific goals, such as compliance with system-related and business-related constraints, which may vary from one implementation to another.

Reference in the specification to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the specification. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of ordinary skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments without conflict.

Unless defined otherwise, technical or scientific terms referred to herein shall have the ordinary meaning as understood by those of ordinary skill in the art to which this application belongs. Reference to "a," "an," "the," and similar words throughout this application are not to be construed as limiting in number, and may refer to the singular or the plural. The present application is directed to the use of the terms "including," "comprising," "having," and any variations thereof, which are intended to cover non-exclusive inclusions; for example, a process, method, system, article, or apparatus that comprises a list of steps or modules (elements) is not limited to the listed steps or elements, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus. Reference to "connected," "coupled," and the like in this application is not intended to be limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. Reference herein to "a plurality" means greater than or equal to two. Reference herein to the terms "first," "second," "third," and the like, are merely to distinguish similar objects and do not denote a particular ordering for the objects.

A semiconductor data query method according to the present application will be described in detail below with reference to the accompanying drawings. Fig. 1 is a schematic flowchart of an embodiment of a semiconductor data query method provided in the present application. Although the present application provides method steps as shown in the following examples or figures, more or fewer steps may be included in the method based on conventional or non-inventive efforts. In steps where there is no logically necessary causal relationship, the order of execution of these steps is not limited to the order of execution provided by the embodiments of the present application. The method may be executed sequentially or in parallel in the semiconductor data query process or the method execution in practice according to the method shown in the embodiment or the figures (for example, in the context of parallel processors or multi-thread processing).

Specifically, an embodiment of a semiconductor data query method provided in the present application is shown in fig. 1, where the method may include:

s101: the method comprises the steps of obtaining a data query request of a user and at least one role information matched with user information of the user.

In the embodiment of the application, a user can enter the semiconductor data query system through login authentication, for example, the login authentication can be performed in the form of a user name and a password. The semiconductor data query system can acquire user information of a user and at least one role information corresponding to the user information. Wherein the user information may comprise a user identification of the user. The user identification may be a unique identification that enables to determine and distinguish different users, e.g. an identity ID of the user, a user name, a user account, a user name, etc. Generally, a user may be responsible for different work contents and may be affiliated with different departments, and thus, the user information may be associated with one or more role information. Specifically, the user information may include position information, organization information, and the like of the user; the role information is mainly data authority information, and certainly, the role information can also comprise the post information and the organization information, so that a proper role can be conveniently and correspondingly allocated to the user. The position information may include, for example, a Process Engineer (PE), a Process Integration Engineer (PIE), and the like. The organization information may include, for example, development groups, testing groups, sales groups, and the like. Specifically, different role information can be given to the user according to the working property and/or the application scenario of the user. Of course, the role information is exemplary, and other types of role information categories are possible, which is not limited in this application. In an embodiment of the present application, after a user logs in the semiconductor data query system, the data to be queried may be selected according to actual application requirements to generate different query instructions. Data query requests may then be generated based on the different query instructions. In one embodiment of the application, the data query request may include a data query instruction and a query condition, the data query instruction being used for indicating queried data. The query condition is used to indicate which data needs to be queried, for example, the query condition may be wafer test data with a process dimension of 14 nm.

S103: and performing authority verification on the data query request, and determining a data query condition which accords with the data authority of the user in the data query request, wherein the data authority of the user is determined according to the data authority of the at least one role information on at least one semiconductor data dimension.

In practical application, when a user queries data, various query conditions may be added as parameters and submitted to a semiconductor data query system, the semiconductor data query system needs to perform authority verification on the query conditions firstly, and whether the query conditions are within a data authority range is judged, so that the situation that the user maliciously logs in the system to query some confidential data is avoided, or the situation that the user queries some data which are not within the data authority range is avoided, and the data security of the semiconductor data query system is improved. Based on this, in the embodiment of the present application, the data query request may be subjected to authority verification, and a data query condition that meets the data authority of the user in the data query request is determined. In an embodiment of the present application, the data authority of the user may be determined according to the data authority of the at least one role information corresponding to the user in the at least one semiconductor data dimension. The data permission refers to control over data resource visibility of a user, that is, a user meeting a certain condition can only obtain a corresponding data resource under the condition. In the semiconductor industry, chips are generally formed by a series of operations including designing, manufacturing, and packaging integrated circuits. Specifically, a wafer (wafer) is prepared from a very high-purity semiconductor through the processes of crystal pulling, slicing and the like, a very tiny circuit structure is formed on the wafer through a series of semiconductor manufacturing processes, and the wafer is cut, packaged and tested to form a chip which is widely applied to various electronic devices. In this process, different roles in different steps have data rights for different semiconductor data dimensions. Therefore, the semiconductor data dimension can be divided into a plurality of types, and can be a data dimension in a wafer production process, such as a process dimension and a process flow dimension, or a data dimension in a wafer test process, such as a test equipment dimension and a test time dimension. Specifically, in an embodiment of the present application, the semiconductor data dimension may include at least one of:

product dimension, process dimension, data type dimension, wafer fabrication plant dimension, test equipment dimension, test time dimension, process flow dimension.

In the embodiment of the application, different users such as mobile phone manufacturers can entrust different entrusting items to wafer manufacturers, and the entrusting items can be, for example, integrated circuit layouts of mobile phones of certain models. For the fab, the integrated circuit layout may correspond to a semiconductor product. The process dimension may include semiconductor process information, such as 18nm, 14nm, 7nm, and so on. The data type dimension includes Test data, design data, manufacturing data, and the like, and may also be continuously subdivided, for example, the Test data may be subdivided into Wafer Test (CP) Test data, wafer Acceptance Test (WAT) Test data, final Test (FT) Test data, and the like; in an embodiment of the present application, the hierarchy of the data type dimension is higher than that of other dimensions, thereby affecting the subsequent data query process. In one embodiment of the present application, in the case that the test item is the wafer test, the test parameter information may include test data of each die on a test wafer, and the test data may include, for example, a yield failure bin code, yield loss die distribution information, and yield loss die number. In the case that the test item is the wafer acceptability test, the test parameter information may include electrical test data of a test wafer. The fab dimension may include identification information for the fab, such as the fab ID, number, name, and the like. The test device dimensions may include device information used by the test process. The device information may include a test device identification, a test device type, and the like. Different tests may correspond to different types of test equipment. For example, the Test device corresponding to the CP Test may be an Automatic Test Equipment (ATE) for integrated circuits, and the device corresponding to the FT Test may be an FT Test device. The test time dimension may include time information for the test. The time information may include a test start time and a test end time. The process flow dimension may include a wafer-to-chip process flow. The process flow may include wet cleaning, photolithography, ion implantation, etching, thermal processing, plating processing, wafer testing, wafer polishing, and the like. Since each dimension described in the above embodiments belongs to a specific data dimension in the semiconductor field, a data dimension that is personalized and conforms to the background of the semiconductor industry can be provided for data query of semiconductor data.

In order to significantly improve the query efficiency and accuracy of data, so that the data query condition guarantees a comprehensive range of data permissions on the premise that the data query condition conforms to the data permissions, in an embodiment of the present application, the performing permission verification on the data query request to determine the data query condition conforming to the data permissions of the user in the data query request, where the data permissions of the user are determined according to the data permissions of the at least one role information in at least one semiconductor data dimension, may include:

s201: acquiring a plurality of target data types contained in the data query request, and sequentially determining the data authority range of the user on a single target data type dimension;

s203: summarizing the data authority ranges of the users on a single target data type dimension, and determining the total data authority ranges of the users on a plurality of target data type dimensions;

s205: and determining a data query condition which accords with the total data authority range in the data query request according to the total data authority range.

In the embodiment of the present application, a plurality of target data types included in the data query request may be acquired. For example, the plurality of target data types may include a CP test data type, a WAT test data type, and a FT test data type. After the plurality of target data types are determined, the data authority range of the user on each target data type can be sequentially determined. For example, the data authority range of the user on the CP test data type, the data authority range of the user on the WAT test data type, and the data authority range of the user on the FT test data type may be determined in sequence. In an embodiment of the application, a data permission range of the user in the dimension of the target data type may be determined according to target role information which is contained in the user and matches with the target data type, and sub-data permission of the target role information in the at least one semiconductor data dimension. Specifically, in an embodiment of the present application, the determining a data authority range of the user in a single target data type dimension includes:

s301: selecting target role information matched with the data authority on the target data type dimension from the at least one role information;

s303: and determining the data authority range of the user in the dimension of the target data type based on the sub-data authority of the target role information in the at least one semiconductor data dimension.

In this embodiment of the application, target role information matched with the data authority in the target data type dimension may be selected from the at least one role information. For example, in one example, the role information included in the user S is role a, role B, role C, and role D. The subdata authority of the role A is CP test data of the product A, the subdata authority of the role B is CP test data of 12nm, the subdata authority of the role C is WAT test data of the product B, and the subdata authority of the role D is WAT test data of 12 nm. And in the case that the target data type is determined to be the CP test data type, the target role information may be role a and role B. Since the sub-data permission of the role C and the role D does not include CP test data, the target role information does not include the role C and the role D. In an embodiment of the present application, after the target role information is determined, a data authority range may be determined according to the data authority of the target role information in the at least one semiconductor data dimension. Specifically, a union set of the sub-data permissions corresponding to each piece of role information may be obtained, so as to determine the data permission range. Namely, the data authority range comprises the sub-data authority corresponding to each role information. For example, in one example, the data permission range of the user S in the CP test data dimension is a data permission set m formed by merging the sub data permission of the role a and the sub data permission of the role B, namely { product a CP test data, 12nm CP test data }. In the same way, it can be determined that the target role information containing the data authority of the WAT test data type in the user S is the role C and the role D. Based on the method, the data authority range of the target role information can be determined to be a data authority set n formed by combining the subdata authority of the role C and the subdata authority of the role D, namely { WAT test data of a product B, WAT test data of 12nm }. That is, the data permission range of the user S in the dimension of the WAT test data type is a data permission set n formed by merging the sub-data permission of the role C and the sub-data permission of the role D.

In this embodiment of the application, after determining the data permission ranges of the user in each target data type dimension, the data permission ranges of the user in each target data type dimension may be summarized, and the total data permission ranges in the plurality of target data type dimensions are determined. Specifically, the data authority ranges of the user in each target data type dimension may be subjected to union to determine a total data authority range. For example, in one example, the total data permission range may be a set of the set of data permissions m and the set of data permissions n. In one embodiment of the present application, after determining the total data authority range, a data query condition in the data query request that meets the total data authority range may be determined. For example, each data query condition included in the data query request may be sequentially compared with the total data authority range to determine the data query condition that meets the data authority range.

According to the embodiment, before the data query request is subjected to authority verification, the data authority of the user can be screened according to the data type contained in the data query request, so that the data authority range of the user can be ensured to be comprehensive and accurate, the authority verification process of subsequent data query requests can be ensured to be accurate and rapid, and the query efficiency and accuracy of data are obviously improved.

In the embodiment of the application, after the data authority of the at least one role information on at least one semiconductor data dimension is determined, the data authority corresponding to the user can be determined. For example, the data authority may be determined according to a set of data authorities corresponding to at least part of the role information. Of course, the total data permission of each role information in the at least one semiconductor data dimension may also be determined according to the total data permission of each role information. Specifically, in an embodiment of the present application, the data authority of the user may be determined as follows:

s401: respectively acquiring a plurality of subdata authorities of the at least one role information on at least one semiconductor data dimension;

s403: and solving a union set of the plurality of subdata authorities and determining the data authority of the user.

In the embodiment of the application, the sub-data permission corresponding to the role information may be determined according to a mapping relationship between the role information and the sub-data permission, where the mapping relationship may include a mapping relationship table, a mapping relationship model, a mapping relationship function, and the like. The mapping relationship may be such that certain role information has certain specific role rights. For example, in a case that the role information is a process engineer, it may be determined according to the mapping relationship that the data permissions corresponding to the role information in the product dimension are product a and product B and the data permission corresponding to the role information in the data type dimension is a CP test data type. That is, according to the mapping relationship between the role information and the data authority, the sub-data authority of the role information on at least one semiconductor data dimension can be determined quickly and accurately. In an embodiment of the application, after determining a plurality of sub-data permissions corresponding to a plurality of pieces of role information, a union set may be obtained for the plurality of sub-data permissions, for example, each sub-data permission is merged together, and the formed set is the data permission of the user. More generally, if a plurality of roles are allocated to the same user, the user has the authority of a union of the roles, and thus, a user-role-authority relationship can be formed. For example, in an example, the role information corresponding to the user S is a role a and a role B, where the data authority of the role a is CP test data of 14nm, and the data authority of the role B is WAT test data of the product a, then the data authority of the user S is { CP test data of 14nm, WAT test data of the product a }.

In another embodiment of the present application, in the case that the semiconductor data dimension of the semiconductor data query system includes a data type dimension, that is, the data managed in the semiconductor data query system may include not only the test data but also other design data, manufacturing data, and the like. On the basis that the hierarchy of the data type dimension is higher than other semiconductor data dimensions, the data authority of the user can be determined in the following way:

s501: respectively acquiring a plurality of subdata authorities of the at least one role information on at least one dimension of other semiconductor data except the dimension of the data type;

s503: and after the union set of the plurality of subdata authorities is obtained, the intersection set of the subdata authorities and the data authority of the at least one role information in the data type dimension is obtained, and the data authority of the user is determined.

In this embodiment, a plurality of sub-data permissions of the at least one role information on other semiconductor data dimensions may be determined first. Wherein the other semiconductor data dimensions do not include data type dimensions, and may include product dimensions, process dimensions, and the like. For example, in one example, the subdata permission M of role M in the other semiconductor data dimension is { product M, 8nm }, and the subdata permission N of role N in the other semiconductor data dimension is { product N, 10nm }. After the multiple subdata permissions are determined, a union set of the multiple subdata permissions can be obtained, and a union set corresponding to the multiple subdata permissions is determined. For example, the union of the sub-data permission of the role M and the sub-data permission of the role N may be determined by using the sub-data permission M @ sub-data permission N. It can be understood that the way of obtaining and combining the subdata authorities corresponding to the plurality of role information can ensure that the data authority of the user can be comprehensive, and any data conforming to the data authority of the user cannot be omitted. After determining the union corresponding to the plurality of sub-data permissions, an intersection may be obtained between the union and the data permission of the at least one role information in the data type dimension. For example, the intersection can be determined by way of the data authority of the union &' for the at least one role information in the data type dimension. It can be understood that the intersection is obtained in a manner to ensure that the determined data permission of the user is accurate, and the data permission which does not belong to the user permission range does not occur.

In the embodiment of the application, after the data authority of the user is determined, authority verification can be performed on the data query request to determine the data query condition which accords with the data authority of the user in the data query request. For example, in an example, in a case that the data query condition included in the data query request is { product a, 14nm, CP test data }, it may be determined whether 14nm meets data authority of the user in a process dimension, whether product a meets data authority of the user in a product dimension, and whether CP test data meets data authority of the user in a data type dimension. And under the condition that the data authority on the data type dimension contains CP test data and the data authority on the product dimension contains a product A, the data query condition meeting the data authority of the user is { product A, CP test data }.

Further, in order to improve accuracy and efficiency of performing permission verification on the data query request, in an embodiment of the present application, the performing permission verification on the data query request and determining a data query condition in the data query request, where the data query condition meets data permission of the user, may include:

s601: acquiring the priority of the data authority of the user on at least one semiconductor data dimension;

s603: and sequentially screening the data query conditions which accord with the data authority of the user according to the priority of the data authority.

In the embodiment of the application, the priority of the data authority of the user on at least one semiconductor data dimension can be set by an administrator, so that the semiconductor data is isolated, and the security of the semiconductor data is improved. After receiving the priority order of the data permissions of different users set by the administrator, the data permissions can be stored in a local database or a cloud. After logging in the semiconductor data query system, a user can acquire the priority of the data authority of the user from the local database or the cloud. In an embodiment of the present application, different users may correspond to different priorities of data permissions, for example, the priority of the data permission of the research and development group personnel is different from the priority order of the data permission of the test group personnel. The process engineer's data rights are also prioritized differently than the process integration engineer's data rights. In an embodiment of the present application, after the priority of the data permission of the user is obtained, the data query conditions meeting the data permission of the user may be sequentially screened according to the priority of the data permission. For example, when the priority of the data authority is that the priority of the data authority of the process dimension is greater than the priority of the data authority of the product dimension, the process information included in the data query condition may be verified first, and when the process information conforms to the data authority of the process dimension, the product information included in the data query condition may be verified. And under the condition that the product information conforms to the data authority of the product dimension, determining that the data query condition conforms to the data authority of the user. In this process, if the product information does not conform to the data permission of the product dimension, subsequent permission verification is not required. Therefore, the efficiency of authority verification of the data query request can be improved, unnecessary verification steps are avoided, and time is saved.

In an embodiment of the present application, as shown in fig. 2, the method may further include:

s701: and acquiring user information of the user to be configured with the authority.

In the embodiment of the application, the user information can be acquired through information input by a user to be configured with the authority based on a visual interface displayed by a client, and the user information sent by the client can also be acquired through a data interface. The client may include, but is not limited to, a mobile smart phone, a computer (including a laptop computer, a desktop computer), a tablet electronic device, a Personal Digital Assistant (PDA), and the like. The user information may be a user name such as a user name input when the user registers, or may be a user identifier such as user identity credential information. The user identification may be a unique identification that enables the determination and differentiation of different users. In an embodiment of the application, the user information may be stored in a preset database, so that the obtaining efficiency of the user information is improved. The preset database can be a local database such as a memory, and can also be a cloud database.

S703: and determining at least one role information matched with the user information.

In the embodiment of the application, after the user information is obtained, the role information corresponding to the user information can be determined. Wherein the user information may be associated with one or more role information. Specifically, the role information corresponding to the user information may be obtained through the user information input by the user, and the corresponding role information may be determined according to the working property and/or the application scenario of the user. The role information includes data authority information, and certainly, the role information may also include position information, organization information, and the like of a user to be configured with the authority. The position information may include, for example, a Process Engineer (PE), a Process Integration Engineer (PIE), and the like. The organization information may include, for example, development groups, testing groups, sales groups, and the like. Of course, the role information is exemplary and other types are possible, which should not be construed as limiting the present application. After determining the role information, data rights of the rights user to be configured in at least one semiconductor data dimension may be determined based on the role information.

S705: configuring data permissions of the at least one role information in at least one semiconductor data dimension.

In the embodiment of the application, different role information can correspond to different data authorities, for example, the data authority of the research and development group personnel is different from the data authority of the test group personnel. The process engineer's data authority is also different from the process integration engineer's data authority. Therefore, a user such as an administrator can configure the data authority of the at least one role information in at least one semiconductor data dimension according to the actual application requirements and the industry background of the semiconductor field. The semiconductor data dimension here is the same as the semiconductor data dimension described in the above embodiments, and the details of this application are not repeated here. In an embodiment of the application, after configuration is completed, the corresponding relationship between the user to be configured with the authority and the data authority of the at least one semiconductor data dimension may be stored in a local database or a cloud, so as to facilitate subsequent calling.

According to the semiconductor data authority configuration method provided by the embodiment of the application, the data authority of at least one role information on at least one semiconductor data dimension can be configured based on at least one role information corresponding to the user information, so that the semiconductor data can be subjected to data isolation, and different users can access the semiconductor data according to self service requirements. In addition, the data permission is determined based on the data dimension of the semiconductor data, so that the method is more in line with the industry background and the actual requirements in the semiconductor field, and the personalized permission configuration method in the semiconductor field is realized.

Further, in an embodiment of the present application, the configuring the data authority of the at least one role information in at least one semiconductor data dimension may include:

s801: configuring data authority of the at least one role information in at least one semiconductor data dimension and priority order of the data authority based on the at least one role information and/or data attribute of the semiconductor data.

In the embodiment of the present application, the data attribute may include a data amount, secret information, a security coefficient, and the like of the semiconductor data. For example, in one embodiment of the present application, in the case that the data size of a certain semiconductor data dimension is the largest, the priority of the data authority of the semiconductor data dimension may be set as the highest priority, and correspondingly, the priority of the data authority of the semiconductor data dimension containing the smallest data size may be set as the lowest priority. In other embodiments of the present application, the priority of the data authority of the at least one semiconductor data dimension may also be configured according to the secret information of the semiconductor data. The secret information may be a specific secret value, or may be a secret level such as secret, secret-isolated, etc. Specifically, the priority of the data authority of the semiconductor data dimension for which the secret information satisfies the preset requirement may be set to the highest priority. For example, in a case where the data security level in the process flow dimension is the highest, the priority of the data authority of the process flow dimension may be set to the highest priority. In an embodiment of the application, after configuration is completed, the corresponding relationship between the user to be configured with the authority and the priority order of the data authority of the at least one semiconductor data dimension may be stored in a local database or a cloud, so as to facilitate subsequent calling.

It should be noted that the priority order of the data authority of the at least one semiconductor data dimension may be configured according to the user information, and the priority order of the data authority of the at least one semiconductor data dimension may also be configured according to the data attribute of the semiconductor data. Of course, the priority order of the data authority of the at least one semiconductor data dimension may also be configured according to the user information and the data attribute of the semiconductor data, and specifically, in an embodiment of the present application, the configuring the priority order of the data authority of the at least one semiconductor data dimension based on the user information and the data attribute of the semiconductor data may include:

s901: determining a first weight value of a data right of the at least one semiconductor data dimension based on the user information;

s903: determining a second weight value of the data permission of the at least one semiconductor data dimension based on the data attribute of the semiconductor data;

s905: configuring a priority order of data permissions of the at least one semiconductor data dimension according to the first weight value and the second weight value.

In an embodiment of the application, a first weight value of a data right of the at least one semiconductor data dimension may be determined based on the user information. Specifically, the first weight value may be determined based on role information associated with the user information. The role information may be station information, organization information, and the like. The first weight value may be used to characterize a degree of importance of the data rights of the at least one semiconductor data dimension. The weight value may be a specific value such as 0.9, or may be a weight level such as primary, high, or the like. For example, in one example, it may be determined that the first weight value of the data authority of the product dimension is 0.3, the first weight value of the data authority of the process dimension is 0.6, and the first weight value of the data authority of the data type dimension is 0.1 based on the process engineer information corresponding to the user a. Of course, after determining the first weight value of the data permission of the product dimension, the process dimension, and the test data type dimension, it may be determined that the priority of the data permission of the process dimension is higher than the priority of the data permission of the product dimension, and the priority of the data permission of the product dimension is higher than the priority of the data permission of the test data type dimension.

Likewise, in an embodiment of the present application, the second weight value of the data authority of the at least one semiconductor data dimension may be determined based on a data attribute of the semiconductor data. The data attributes may include data volume, security information, security coefficients, and the like. For example, in one example, it may be determined that the second weight value of the data permission of the product dimension is 0.2, the second weight value of the data permission of the process dimension is 0.2, and the second weight value of the data permission of the test data type dimension is 0.6 based on the data attribute of the semiconductor data. Thereafter, a priority order of data permissions for the at least one semiconductor data dimension may be configured according to the first weight value and the second weight value. Specifically, the priority order may be determined according to a weight sum value or a weight value of a first weight value and a second weight value of the data authority of the at least one semiconductor data dimension. For example, in one example, the weight sum value of the data permissions of the product dimension may be determined to be 0.5, the weight sum value of the data permissions of the process dimension may be 0.8, and the weight sum value of the data permissions of the test data type dimension may be 0.7, based on which the data permissions of the process dimension may be determined to have a higher priority than the data permissions of the test data type dimension.

In one embodiment of the present application, the priority order of the data authority may also be configured according to a security coefficient of the semiconductor data. Specifically, the configuring the data authority of the at least one semiconductor data dimension based on the user information and/or the data attribute of the semiconductor data, and the priority order of the data authority may include:

s1001: and setting the priority of the data authority of the process dimension as the highest priority based on the data security coefficient in the data attribute.

At present, the process development of the semiconductor industry is often measured by the processing technology node numbers of 16nm, 14nm, 10nm and the like in the semiconductor field, which shows the importance of the processing technology. Generally, different manufacturers of mobile phones or other manufacturers such as samsung manufacturers and hua-ji manufacturers have different research and development focuses and different strategic points of layout, so that the manufacturing processes of the two manufacturers are greatly different and have a competitive relationship therebetween. Typically, manufacturer a needs to send the chips to be manufactured to the ic manufacturing end (Foundry) for manufacturing. The manufacturer A does not want others to see the manufacturing process of the manufacturer A, so that the research and development emphasis of the manufacturer A is known. Therefore, in view of the above considerations, in one embodiment of the present application, priorities of data authorities of different dimensions may be set based on the order of the data security coefficients. For example, the priority of the data authority of the process dimension may be set to the highest priority, so that data isolation may be performed on the semiconductor data, so that data viewed by different users and functions implemented are different.

By the embodiment, based on the industry background and the actual requirements in the semiconductor field, the priority of the data authority of the process dimension with the highest data security coefficient and the highest importance degree can be set as the highest priority, so that data isolation and accurate data authority control are realized, a user can only check the data in the authority range, and the security level of the semiconductor data is improved.

In another embodiment of the present application, the priority of the data authority of the data type dimension corresponding to the test link may also be set to be the highest priority according to different semiconductor test links. Specifically, in an embodiment of the present application, the configuring the data authority of the at least one semiconductor data dimension based on the user information and/or the data attribute of the semiconductor data, and the priority order of the data authority may include:

s1101: and setting the priority of the data authority of the data type dimension as the highest priority based on the test link in the data attribute.

In the present embodiment, testing is an important step throughout the entire process of wafer production and application in the semiconductor field. From the time a chip is processed and produced to the time of delivery to a final client, the chip needs to be screened layer by layer through a plurality of testing links. For example, after the wafer has completed all the manufacturing processes, it is necessary to perform WAT test on the wafer to perform electrical test on each test structure on the wafer, and perform CP test on the wafer to ensure that each core on the wafer can substantially meet the characteristics of the device. Generally, data analysis and data processing methods adopted for test data obtained in different test links are completely different, and test machines provided by different manufacturers can generate different test results. Thus, the departments or vendors responsible for the different data types will be completely different. Therefore, in view of the above, in an embodiment of the present application, the priority of the data authority of the data type dimension may be set to be the highest priority based on the test method of the semiconductor data, so that the semiconductor data may be subjected to hierarchical data isolation. In an embodiment of the present application, after the priority of the data right of the data type dimension is set as the highest priority, the data right of the data type dimension is verified first in the data right verification process.

Through the embodiment, based on different industry backgrounds and different testing links in the semiconductor field, the priority of the data authority of the data type dimension can be set as the highest priority, accurate data authority control is achieved, and actual requirements in the semiconductor testing field are met better.

Further, in an embodiment of the present application, after configuring the data authority of the at least one role information in at least one semiconductor data dimension, the method may further include:

s1201: loading a menu matched with the data authority and/or the at least one role information based on the at least one role information matched with the user information and/or the data authority of the at least one role information on at least one semiconductor data dimension.

In the embodiment of the application, after the configuration of the data authority of the at least one role information on the at least one semiconductor data dimension is completed. The data rights of the user in the at least one semiconductor data dimension may be determined based on role information contained in the user information. Then, after the user enters the semiconductor data query system through login authentication, the semiconductor data query system can call the corresponding relation between the user and the data authority from the local database or the cloud. The semiconductor data query system can determine the data authority corresponding to the user according to the corresponding relation and load the menu after the filtering adaptation. Each entry displayed in the menu may conform to the user's data rights. The user can optionally view the semiconductor data within the data authority range.

In another aspect of the present application, there is provided a semiconductor data query apparatus 300, as shown in fig. 3, the semiconductor data query apparatus 300 may include:

an obtaining module 301, configured to obtain a data query request of a user and at least one role information matched with user information of the user;

an authority verification module 303, configured to perform authority verification on the data query request, and determine a data query condition that meets the data authority of the user in the data query request, where the data authority of the user is determined according to the data authority of the at least one role information in at least one semiconductor data dimension, and the authority verification module 303 includes: acquiring a plurality of target data types contained in the data query request, and sequentially determining the data authority range of the user on a single target data type dimension; summarizing the data authority ranges of the users on a single target data type dimension, and determining the total data authority ranges of the users on a plurality of target data type dimensions; determining a data query condition which accords with the total data authority range in the data query request according to the total data authority range;

and a determining semiconductor data module 305 for determining semiconductor data matching the data query condition according to the data query condition.

Optionally, in an embodiment of the present application, the data authority of the user is determined as follows:

acquiring user information of a user to be configured with an authority;

determining at least one role information matched with the user information;

configuring data permissions of the at least one role information on at least one semiconductor data dimension.

Optionally, in an embodiment of the present application, after configuring the data right of the at least one role information on at least one semiconductor data dimension, the method further includes:

Optionally, in an embodiment of the present application, the configuring data permission of the at least one role information in at least one semiconductor data dimension includes:

The semiconductor data query device 300 according to the embodiment of the present application may correspondingly perform the method described in the embodiment of the present application, and the above and other operations and/or functions of each module in the semiconductor data query device 300 are respectively for realizing the corresponding processes of the methods provided in the above embodiments, and are not described herein again for brevity.

It should be noted that the above-described embodiments are merely illustrative, wherein the modules described as separate parts may or may not be physically separate, and the parts displayed as modules may or may not be physical modules, may be located in one place, or may be distributed on a plurality of network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. In addition, in the drawings of the embodiments of the apparatus provided in the present application, the connection relationship between the modules indicates that there is a communication connection therebetween, and may be implemented as one or more communication buses or signal lines.

As shown in fig. 4, an embodiment of the present application further provides an electronic device 400, where the electronic device 400 includes: a processor and a memory for storing processor-executable instructions; wherein the processor is configured to implement the method of the above embodiments when executing the instructions. Electronic device 400 includes memory 401, processor 403, bus 405, communication interface 407. The memory 401, processor 403 and communication interface 407 communicate over a bus 405. The bus 405 may be a Peripheral Component Interconnect (PCI) bus, an Extended Industry Standard Architecture (EISA) bus, or the like. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, only one thick line is shown in FIG. 4, but this does not indicate only one bus or one type of bus. The communication interface 407 is used for communication with the outside. The processor 403 may be a Central Processing Unit (CPU). The memory 401 may include volatile memory (volatile memory), such as Random Access Memory (RAM). The memory 401 may also include a non-volatile memory (non-volatile memory), such as a read-only memory (ROM), a flash memory, an HDD, or an SSD. The memory 401 has stored therein executable code that the processor 403 executes to perform the methods described in the various embodiments above.

Embodiments of the present application provide a computer-readable storage medium having stored thereon computer program instructions which, when executed by a processor, implement the method described above.

Embodiments of the present application provide a computer program product comprising computer readable code, or a non-transitory computer readable storage medium carrying computer readable code, which when run in a processor of an electronic device, the processor in the electronic device performs the method described above.

In some embodiments, the disclosed methods may be implemented as computer program instructions encoded on a computer-readable storage medium in a machine-readable format or encoded on other non-transitory media or articles of manufacture. Fig. 5 schematically illustrates a conceptual partial view of an example computer program product comprising a computer program for executing a computer process on a computing device, arranged in accordance with at least some embodiments presented herein. In one embodiment, the example computer program product 500 is provided using a signal bearing medium 501. The signal bearing medium 501 may include one or more program instructions 502 that, when executed by one or more processors, may provide the functions or portions of the functions described above with respect to fig. 1. Further, program instructions 502 in FIG. 5 also describe example instructions.

In some examples, the signal bearing medium 501 may comprise a computer readable medium 503 such as, but not limited to, a hard disk drive, a Compact Disc (CD), a Digital Video Disc (DVD), a digital tape, a Memory, a Read-Only Memory (ROM), a Random Access Memory (RAM), or the like. In some implementations, the signal bearing medium 501 may comprise a computer recordable medium 504 such as, but not limited to, a memory, a read/write (R/W) CD, a R/W DVD, and so forth. In some implementations, the signal bearing medium 501 may include a communication medium 505, such as, but not limited to, a digital and/or analog communication medium (e.g., a fiber optic cable, a waveguide, a wired communications link, a wireless communication link, etc.). Thus, for example, the signal bearing medium 501 may be communicated by a wireless form of communication medium 505 (e.g., a wireless communication medium conforming to the IEEE 802.11 standard or other transmission protocol). The one or more program instructions 502 may be, for example, computer-executable instructions or logic-implementing instructions. In some examples, a computing device, such as the electronic device described with respect to fig. 3, may be configured to provide various operations, functions, or actions in response to program instructions 502 conveyed to the computing device by one or more of a computer-readable medium 503, a computer-recordable medium 504, and/or a communications medium 505. It should be understood that the arrangements described herein are for illustrative purposes only. Thus, those skilled in the art will appreciate that other arrangements and other elements (e.g., machines, interfaces, functions, orders, and groupings of functions, etc.) can be used instead, and that some elements may be omitted altogether depending upon the desired results. In addition, many of the described elements are functional entities that may be implemented as discrete or distributed components or in conjunction with other components, in any suitable combination and location.

The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of apparatus, systems, and computer program products according to various embodiments of the present application. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of instructions, which comprises one or more executable instructions for implementing the specified logical function(s). In some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved.

It is also noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by hardware (e.g., a Circuit or an ASIC) for performing the corresponding function or action, or by combinations of hardware and software, such as firmware.

While the invention has been described in connection with various embodiments, other variations to the disclosed embodiments can be understood and effected by those skilled in the art in practicing the claimed invention, from a review of the drawings, the disclosure, and the appended claims. A single processor or other unit may fulfill the functions of several items recited in the claims. The mere fact that certain measures are recited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to advantage.

Having described embodiments of the present application, the foregoing description is intended to be exemplary, not exhaustive, and not limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is chosen in order to best explain the principles of the embodiments, the practical application, or improvements made to the technology in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein.

Claims

1. A method for querying semiconductor data, the method comprising:

performing authority verification on the data query request, and determining a data query condition which accords with the data authority of the user in the data query request, wherein the data authority of the user is determined according to the data authority of the at least one role information on at least one semiconductor data dimension, and the method comprises the following steps: acquiring a plurality of target data types contained in the data query request, and sequentially determining the data authority range of the user on a single target data type dimension; summarizing the data permission range of the user on a single target data type dimension, and determining the total data permission range of the user on a plurality of target data type dimensions; determining a data query condition which accords with the total data authority range in the data query request according to the total data authority range; the performing authority verification on the data query request to determine a data query condition meeting the data authority of the user in the data query request further includes: acquiring the priority of the data authority of the user on at least one semiconductor data dimension; sequentially screening data query conditions which accord with the data authority of the user according to the priority of the data authority; the priority is determined as follows: determining a first weight value of a data right of the at least one semiconductor data dimension based on the user information; determining a second weight value of the data permission of the at least one semiconductor data dimension based on the data attribute of the semiconductor data; determining a priority order of data permissions of the at least one semiconductor data dimension according to the first weight value and the second weight value; in the case where the semiconductor data dimension comprises a data type dimension, the data permissions of the user are determined as follows: respectively acquiring a plurality of subdata authorities of the at least one role information on at least one dimension of other semiconductor data except the dimension of the data type; after the multiple subdata authorities acquire a union set, acquiring an intersection set with the data authority of the at least one role information in the data type dimension, and determining the data authority of the user;

2. The method of claim 1, wherein determining the data permission range of the user in a single target data type dimension comprises:

3. The method of claim 1, wherein the semiconductor data dimension comprises at least one of:

4. The method of claim 1, further comprising:

acquiring user information of a user to be configured with an authority;

determining at least one role information matched with the user information;

5. The method of claim 4, wherein after configuring the data permissions of the at least one role information in at least one semiconductor data dimension, the method further comprises:

6. The method of claim 4, wherein the configuring the data permissions of the at least one role information in at least one semiconductor data dimension comprises:

configuring data authority of the at least one role information in at least one semiconductor data dimension and priority order of the data authority based on the at least one role information and data attributes of the semiconductor data.

7. The method of claim 6, wherein configuring data permissions for at least one semiconductor data dimension and a priority order of the data permissions based on the user information and data attributes of the semiconductor data comprises:

8. The method of claim 6, wherein configuring data permissions for at least one semiconductor data dimension and a priority order of the data permissions based on the user information and data attributes of the semiconductor data comprises:

9. A semiconductor data query device, the device comprising:

the authority verification module is used for performing authority verification on the data query request, determining a data query condition which accords with the data authority of the user in the data query request, and determining the data authority of the user according to the data authority of the at least one role information in at least one semiconductor data dimension, and comprises: acquiring a plurality of target data types contained in the data query request, and sequentially determining the data authority range of the user on a single target data type dimension; summarizing the data permission range of the user on a single target data type dimension, and determining the total data permission range of the user on a plurality of target data type dimensions; determining a data query condition which accords with the total data authority range in the data query request according to the total data authority range; the performing authority verification on the data query request to determine a data query condition meeting the data authority of the user in the data query request further includes: acquiring the priority of the data authority of the user on at least one semiconductor data dimension; sequentially screening data query conditions which accord with the data authority of the user according to the priority of the data authority; the priority is determined as follows: determining a first weight value of a data right of the at least one semiconductor data dimension based on the user information; determining a second weight value of the data permission of the at least one semiconductor data dimension based on the data attribute of the semiconductor data; determining a priority order of data permissions of the at least one semiconductor data dimension according to the first weight value and the second weight value; in the case where the semiconductor data dimension comprises a data type dimension, the data permissions of the users are determined as follows: respectively acquiring a plurality of subdata authorities of the at least one role information on at least one dimension of other semiconductor data except the dimension of the data type; after the union set of the plurality of subdata authorities is obtained, the intersection set of the subdata authorities and the data authority of the at least one role information in the data type dimension is obtained, and the data authority of the user is determined;

10. An electronic device comprising a processor and a memory for storing processor-executable instructions, wherein the processor is configured to perform the method of any one of claims 1-8 when the instructions are executed.

11. A non-transitory computer readable storage medium having computer program instructions stored thereon, wherein the computer program instructions, when executed by a processor, implement the method of any one of claims 1-8.