CN115097236A - Test type switching method of universal test platform - Google Patents
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Abstract
The invention discloses a test type switching method of a generalized test platform, belonging to the technical field of test, and the method comprises the steps of obtaining a target test type, classifying the obtained target test type to obtain parallel classification and single-row classification; setting test schemes of parallel classification and single-row classification, summarizing and establishing a test scheme library, and setting a test platform according to the test schemes in the test scheme library; identifying a target test type of a product to be tested, mounting the product to be tested in a corresponding test station on a test platform, matching a corresponding comprehensive test scheme, and testing according to the matched comprehensive test scheme to obtain test data of each product to be tested; and testing is carried out according to the matched comprehensive testing scheme, so that in the testing process of a worker, the automatic testing of all the tested products can be realized according to the corresponding comprehensive testing scheme as long as all the tested products to be tested are installed, and the testing precision and efficiency of finished products and semi-finished products are improved.
Description
Technical Field
The invention belongs to the technical field of testing, and particularly relates to a test type switching method of a universal test platform.
Background
With the rapid development of industrial production, the original methods for testing 8-way DI, 48-way DO, 8-way AI, 8-way AO, 16-way PWM, 16-way FI and 24-way PWMI are not suitable for the current testing requirements, and in order to complete the current production testing requirements, an automatic testing method needs to be set, so that the full-function testing of mainstream products of enterprises is met, the testing precision and efficiency of finished products and semi-finished products in a factory are improved, and the artificial testing errors are reduced to the greatest extent, therefore, the invention provides a testing type switching method of a universal testing platform.
Disclosure of Invention
In order to solve the problems existing in the above schemes, the invention provides a test type switching method of a generalized test platform.
The purpose of the invention can be realized by the following technical scheme:
a test type switching method of a generalized test platform comprises the following specific steps:
the method comprises the following steps: acquiring a target test type, and classifying the acquired target test type to obtain parallel classification and single-row classification;
step two: setting test schemes of parallel classification and single-row classification, summarizing and establishing a test scheme library, and setting a test platform according to the test schemes in the test scheme library;
step three: identifying the target test type of a product to be tested, installing the product to be tested in a corresponding test station on a test platform, matching a corresponding comprehensive test scheme, and testing according to the matched comprehensive test scheme to obtain test data of each product to be tested.
Further, the single-line classification comprises 8 paths of AI tests, and the method for the 8 paths of AI tests comprises the following steps:
controlling a high-precision source to output an analog quantity signal, controlling a 4012 module to output a grounding signal to a common source type relay board to connect the signal with AI _1, and accessing the signal to an AI _1 channel of a product through a test wiring harness, reading a sampling value of the channel through communication and comparing the sampling value with a preset sampling value when the AI _1 channel of the product acquires the analog quantity signal output by the high-precision source, and when the AI _1 channel is within an error allowable range, passing an AI _1 analog quantity sampling test; and at the moment, the 4012 module is controlled to output a grounding signal to the common source type relay board to connect the signal with AI _2, and the AI _2 channel is continuously tested until the 8-path AI test is finished.
Further, the method for setting the test platform according to the test scheme in the test scheme library comprises the following steps:
and planning a test station according to the test scheme, configuring corresponding test equipment, and combining to establish a test platform.
Further, the method for matching the corresponding comprehensive test scheme includes:
and acquiring the information of the test products to be tested, sequencing the priority of the test products, acquiring a second sequence, and setting a comprehensive test scheme corresponding to the second sequence and the test station number of the corresponding test product in a matching manner.
Further, the method of prioritizing the test products includes:
matching the corresponding first fixed value and the second fixed value through the test product information, and respectively marking the first fixed value and the second fixed value as GDYi and GDEi, wherein i is 1, 2, … … and n, and n is a positive integer; calculating a first priority value according to a first formula Qi (b1 × GDYi + b2 × GDEi) × α i, wherein b1 and b2 are proportional coefficients, the value range is 0< b1 ≤ 1, 0< b2 ≤ 1, and α i is an emergency coefficient of a corresponding test product, sorting according to the calculated first priority value to obtain a first sequence, obtaining the first test product in the first sequence, and performing iterative sorting according to a collision detection standard to obtain a second sequence.
Further, the method for iterative ordering according to the collision detection criteria comprises:
setting a conflict detection standard, identifying the test products which accord with the conflict detection standard with the first test products in the first sequence, arranging the corresponding test products into the second sequence according to the sequence in the first sequence, identifying the rest test products with the first sequence in the current first sequence, and so on until all the test products in the first sequence are arranged into the second sequence.
Compared with the prior art, the invention has the beneficial effects that:
by the method, the test is realized according to the matched comprehensive test scheme, so that in the test process of a worker, the automatic test of all the test products can be realized according to the corresponding comprehensive test scheme as long as all the test products to be tested are installed, the automatic test of all the test products is not required to be adjusted manually after one product is tested, the test precision and efficiency of finished products and semi-finished products are improved, the artificial test errors are reduced to the maximum extent, and the purpose of automatic test is achieved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a flow chart of the method of the present invention.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the following embodiments, and it should be understood that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, a method for switching test types of a generalized test platform includes:
the method comprises the following steps: acquiring a target test type, and classifying the acquired target test type to obtain parallel classification and single-row classification;
the target test type is a test type capable of switching, and generally includes test functions such as 48-path DI, 48-path DO, 8-path AI, 8-path AO, 16-path PWM, 16-path FI, and 24-path PWMI.
Classifying the acquired target test types according to whether a parallel scheme can be adopted for testing, for example, 48 paths of DI, 48 paths of DO and 8 paths of AO can be tested by adopting the parallel scheme, and 48 paths of level signals are output or collected at the same time so as to achieve the effect of testing at the same time, so that the testing time is saved, and then the 48 paths of DI, 48 paths of DO and 8 paths of AO are classified in parallel; if the 8-path AI, 16-path PWM, 16-path FI and 24-path PWMI tests need to test a certain channel independently, the next channel is tested continuously until the tests are finished, and therefore the 8-path AI, 16-path PWM, 16-path FI and 24-path PWMI are classified as single-line classification.
Step two: setting test schemes of parallel classification and single-row classification, summarizing and establishing a test scheme library, and setting a test platform according to the test schemes in the test scheme library;
the parallel classification can output or collect 48 paths of level signals at the same time so as to achieve the effect of testing simultaneously, and the specific non-disclosed part can be realized by the prior art.
The test of single-row classification needs to test a certain channel independently, and then continue to test the next channel until the test is completed. The specific test logic takes AI test as an example: controlling a high-precision source to output an analog quantity signal, controlling a 4012 module to output a grounding signal to a common source type relay board to connect the signal with AI _1, and accessing the signal to an AI _1 channel of a product through a test wire harness, reading a sampling value of the channel through communication (a serial port/network port/CAN bus) to compare with a preset sampling value when the AI _1 channel of the product acquires the analog quantity signal output by the high-precision source, and if the sampling value is within an error allowable range, passing an AI _1 analog quantity sampling test; at the moment, the 4012 module is controlled to output a grounding signal to the common source type relay board to connect the signal with AI _2, and the AI _2 channel is continuously tested until the AI test is finished; the preset sampling value and the error allowable range can be set according to corresponding standard requirements; the high-precision source, the 4012 module and the like are all existing modules in the field, and a corresponding test scheme can be set based on the above description and the common knowledge of the skilled person in the field, so the detailed description is not given.
The method for setting the test platform according to the test scheme in the test scheme library comprises the following steps:
and planning a test station according to the test scheme, configuring corresponding test equipment, and combining to establish a test platform.
The corresponding test equipment can be matched according to the planned test station and the corresponding test scheme, and then the establishment of the test platform according to the corresponding matched test equipment is common knowledge in the field, so detailed description is not given.
In one embodiment, a method of planning a test station according to a test scenario includes:
identifying each test scheme and the corresponding target test type, and acquiring test requirements, wherein the test requirements are set according to actual test requirements of enterprises, for example, each target test needs to be provided with a plurality of test stations; integrating the test requirements, the test scheme and the target test types into planning data, performing regional distribution setting of each target test type according to the planning data, and setting corresponding test stations in each distribution region.
Based on the current design principle of the test platform, the planning data can realize the setting of the distribution area and the planning of the corresponding test stations, so that the detailed description is not given.
In another embodiment, the method of planning test stations according to a test scenario may be set up directly using existing design principles.
Step three: and identifying the target test type of the product to be tested, installing the product to be tested in a corresponding test station on the test platform, matching the corresponding comprehensive test scheme, and testing according to the matched comprehensive test scheme to obtain the test data of each product to be tested.
The testing is carried out according to the matched comprehensive testing scheme, so that in the testing process of a worker, the automatic testing of all the tested products can be realized according to the corresponding comprehensive testing scheme as long as the whole installation of the tested products to be tested is completed, and after one product is not required to be tested, the manual adjustment is carried out again, so that the testing precision and the efficiency of finished products and semi-finished products are improved, the manual testing errors are reduced to the greatest extent, and the purpose of automatic testing is achieved.
The method for matching the corresponding comprehensive test scheme comprises the following steps:
obtaining the information of the test products to be tested, including the information of the types, the models and the like, sequencing the priority of the test products, obtaining a second sequence, and setting a comprehensive test scheme corresponding to the second sequence and the test station number of the corresponding test product in a matching manner.
The comprehensive test scheme is mainly set according to the test sequence of the corresponding test product and the switching method between the two corresponding adjacent test products, and is specifically common knowledge in the field.
The method for conducting prioritization of test products comprises:
matching the corresponding first fixed value and the second fixed value through the test product information, and respectively marking the first fixed value and the second fixed value as GDYi and GDEi, wherein i is 1, 2, … … and n, and n is a positive integer; i represents the corresponding test product; calculating a first priority value according to a first formula Qi (b1 × GDYi + b2 × GDEi) × α i, wherein b1 and b2 are proportional coefficients, the value range is 0< b1 ≤ 1, 0< b2 ≤ 1, and α i is an emergency coefficient of a corresponding test product, setting is performed by a corresponding worker, different levels of emergency coefficients are set by expert groups according to different emergency situations, the worker matches the corresponding emergency coefficient according to the corresponding emergency situation, and when the emergency situation does not exist, α i is 1; and sequencing according to the calculated first priority value to obtain a first sequence, obtaining a first test product in the first sequence, and performing iterative sequencing according to a conflict detection standard to obtain a second sequence, wherein the second sequence is the priority sequencing of the test product.
The corresponding first fixed value and the second fixed value are matched through the test product information, the matching table is established according to the type of the test product in the enterprise, and the matching table is obtained after matching, wherein the first fixed value and the second fixed value are respectively set according to the corresponding type and model and are used for expressing the priority of products of different types and models, and particularly are set according to the product test requirements of the enterprise.
The method for iterative sequencing according to the conflict detection standard comprises the following steps:
setting conflict detection standards, namely which products cannot be tested continuously or next kind of tests are carried out after the type of tests are finished, wherein the conflict detection standards can be specifically set according to test requirements and are common knowledge in the field; and identifying the test products in the first sequence which accord with the conflict detection standard with the first test products, listing the corresponding test products in the second sequence according to the sequence in the first sequence, identifying the rest test products in the first sequence which are ranked first, and so on until all the test products in the first sequence are listed in the second sequence.
The above formulas are all calculated by removing dimensions and taking numerical values thereof, the formula is a formula which is obtained by acquiring a large amount of data and performing software simulation to obtain the closest real situation, and the preset parameters and the preset threshold value in the formula are set by the technical personnel in the field according to the actual situation or obtained by simulating a large amount of data.
Although the present invention has been described in detail with reference to the preferred embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted for elements thereof without departing from the scope of the present invention.
Claims (6)
1. A test type switching method of a generalized test platform is characterized by comprising the following specific steps:
the method comprises the following steps: acquiring a target test type, and classifying the acquired target test type to obtain parallel classification and single-row classification;
step two: setting test schemes of parallel classification and single-row classification, summarizing and establishing a test scheme library, and setting a test platform according to the test schemes in the test scheme library;
step three: identifying the target test type of a product to be tested, installing the product to be tested in a corresponding test station on a test platform, matching a corresponding comprehensive test scheme, and testing according to the matched comprehensive test scheme to obtain test data of each product to be tested.
2. The method as claimed in claim 1, wherein the single-line classification includes 8-way AI test, and the method of 8-way AI test is:
controlling a high-precision source to output an analog quantity signal, controlling a 4012 module to output a grounding signal to a common source type relay board to connect the signal with AI _1, and accessing the signal to an AI _1 channel of a product through a test wiring harness, reading a sampling value of the channel through communication and comparing the sampling value with a preset sampling value when the AI _1 channel of the product acquires the analog quantity signal output by the high-precision source, and when the AI _1 channel is within an error allowable range, passing an AI _1 analog quantity sampling test; and at the moment, the 4012 module is controlled to output a grounding signal to the common source type relay board to connect the signal with AI _2, and the AI _2 channel is continuously tested until the 8-path AI test is finished.
3. The method for switching the test types of the generalized test platform according to claim 1, wherein the method for setting the test platform according to the test solutions in the test solution library comprises:
and planning a test station according to the test scheme, configuring corresponding test equipment, and combining to establish a test platform.
4. The method for switching the test types of the generalized test platform according to claim 1, wherein the method for matching the corresponding comprehensive test solution comprises:
and acquiring test product information to be tested, sequencing the priority of the test products to obtain a second sequence, and setting a comprehensive test scheme corresponding to the second sequence and the test station number of the corresponding test product in a matching manner.
5. The method for switching the test types of the generalized test platform according to claim 4, wherein the method for performing the prioritization of the test products comprises:
matching the corresponding first fixed value and the second fixed value through the test product information, and respectively marking the first fixed value and the second fixed value as GDYi and GDEi, wherein i is 1, 2, … … and n, and n is a positive integer; calculating a first priority value according to a first formula Qi (b1 × GDYi + b2 × GDEi) × α i, wherein b1 and b2 are proportional coefficients, the value range is 0< b1 ≤ 1, 0< b2 ≤ 1, and α i is an emergency coefficient of a corresponding test product, sorting according to the calculated first priority value to obtain a first sequence, obtaining the first test product in the first sequence, and performing iterative sorting according to a collision detection standard to obtain a second sequence.
6. The method for switching the test types of the generalized test platform according to claim 5, wherein the method for performing the iterative ordering according to the collision detection criteria comprises:
setting a conflict detection standard, identifying the test products which accord with the conflict detection standard with the first test products in the first sequence, arranging the corresponding test products into the second sequence according to the sequence in the first sequence, identifying the rest test products with the first sequence in the current first sequence, and so on until all the test products in the first sequence are arranged into the second sequence.
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