CN115034096B - Modeling method and device based on stamping signal, storage medium and electronic equipment - Google Patents
Modeling method and device based on stamping signal, storage medium and electronic equipment Download PDFInfo
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Abstract
The invention discloses a modeling method and device based on a stamping signal, a storage medium and electronic equipment, wherein the method comprises the following steps: the method comprises the steps of obtaining a stamping signal curve of a stamping die in the stamping process, wherein the stamping signal curve comprises a plurality of stamping signals which are correspondingly collected at a plurality of time points; generating a searching reference point according to the height values and the searching multiplying power of the plurality of stamping signals; positioning a feature alignment point of the punching signal curve according to the search reference point; calculating a characteristic parameter of the stamping signal curve based on the characteristic alignment point, wherein the characteristic parameter is used for indicating the characteristic quality of a characteristic frequency band; and re-modeling the stamping signal curve by adopting the characteristic parameters to obtain a digital model of the stamping die. According to the invention, the technical problem of inaccurate model caused by signal misalignment in the related technology is solved, and the accuracy of time/rotor phase alignment can be improved, so that the precision of the stamping signal model is improved.
Description
Technical Field
The invention relates to the field of computers, in particular to a modeling method and device based on a stamping signal, a storage medium and electronic equipment.
Background
In the related art, the punching abnormity detection system needs to collect punching signals for a certain number of times to perform modeling, and the latest signals are compared by taking the punching signals as a standard to serve as a judgment mode. The current stamping detection system generally adopts a method of taking the highest peak in a certain time period or directly taking a value from the rotating wheel phase of a stamping machine to carry out time alignment of stamping signals. In an actual production scenario, the stamping signal may be slightly out of phase with the rotating wheel, and there may be multiple peaks of the stamping signal, which may result in that a group of stamping signals after being clipped cannot be aligned exactly in time, resulting in low efficiency of the model.
In the related art, in a punching abnormity detection system, a certain number of samples are collected for modeling, and then a standard model which is effective in a certain time is fitted by using the samples and is compared with a newly collected signal. The samples need to be cut, windowed and the like before modeling, each sample in a group of signals only keeps one peak after cutting, and the peaks are all in the same phase, so that a group of characteristic signals with similar peak positions are obtained. In the commonly adopted signal processing mode, the highest point of the whole wave crest is usually taken as the central point of the cutting area, but the characteristic section of some stamping signals may have a plurality of highest points, which can cause that the phases of the signals cannot be aligned.
In view of the above problems in the related art, no effective solution has been found at present.
Disclosure of Invention
The embodiment of the invention provides a modeling method and device based on a stamping signal, a storage medium and electronic equipment.
According to an aspect of an embodiment of the present application, there is provided a modeling method based on a punching signal, including: the method comprises the steps of obtaining a stamping signal curve of a stamping die in the stamping process, wherein the stamping signal curve comprises a plurality of stamping signals which are correspondingly collected at a plurality of time points; generating a searching reference point according to the height values and the searching multiplying power of the plurality of stamping signals; positioning a feature alignment point of the punching signal curve according to the search reference point; calculating a characteristic parameter of the stamping signal curve based on the characteristic alignment point, wherein the characteristic parameter is used for indicating the characteristic quality of a characteristic frequency band; and adopting the characteristic parameters to re-model the stamping signal curve to obtain a digital model of the stamping die.
Further, generating a search reference point from the height values of the plurality of punching signals includes: traversing each punching signal in the punching signal curve, and determining a target point position Tn and a target point height Hn with the maximum amplitude in the punching signal curve; multiplying the target point height Hn by a specified multiplying power K to obtain a reference height Cn; determining the reference height Cn as a search reference point.
Further, locating the feature alignment point of the stamped signal curve from the search reference point comprises: for each stamped signal in the stamped signal curve, comparing the amplitude height of the stamped signal with the search reference point, wherein the height of the search reference point is a reference height Cn; searching M target stamping signals with amplitude heights larger than the reference height Cn in the stamping signal curve, wherein M is an integer larger than 0; intercepting reference peaks Kn in the M target stamping signals; extracting a start coordinate An and An end coordinate Bn of the reference peak Kn; and calculating the average coordinate value of the start coordinate An and the end coordinate Bn, and determining the average coordinate value as a characteristic alignment point Dn of the punching signal curve.
Further, truncating reference peaks Kn in the M target press signals comprises: if M is equal to 1, determining the target stamping signal as a reference peak Kn; and if M is larger than 1, determining the position Tn of a target point with the maximum amplitude in the plurality of stamping signals, and selecting a wave peak band containing Tn from the M target stamping signals as a reference peak Kn.
Further, calculating the characteristic parameter of the punch signal curve based on the characteristic alignment point comprises: respectively extending the length W forwards and backwards by taking the characteristic alignment point as a reference point Dn of the stamping signal curve to obtain Dn-W and Dn + W; generating a signal sequence On based On [ Dn-W, dn + W ]; windowing the signal sequence On to obtain a characteristic signal matrix, wherein each row of the characteristic signal matrix corresponds to a characteristic frequency band of a stamping signal; calculating a standard deviation for each column of elements of the characteristic signal matrix to obtain a standard deviation sequence; calculating the average value of all standard deviations in the standard deviation sequence; and determining the average value as the aggregation looseness of the stamping signal curve at the searching multiplying power, wherein the characteristic parameters comprise the searching multiplying power and the aggregation looseness corresponding to the searching multiplying power.
Further, re-modeling the stamping signal curve by using the characteristic parameters to obtain a digital model of the stamping die, including: the following steps are executed in a circulating mode until the maximum searching magnification is reached: adjusting the current searching multiplying power according to a preset step length, and generating an adjusted searching reference point according to the height values of the plurality of stamping signals and the adjusted searching multiplying power; positioning the adjusted characteristic alignment point of the stamping signal curve according to the adjusted search reference point; calculating the current characteristic parameter of the stamping signal curve based on the adjusted characteristic alignment point; after the search multiplying power circulation is completed, the search multiplying power and the aggregation looseness of each circulation are correlated to generate a characteristic parameter set; and searching the optimal multiplying power in the characteristic parameter set, and adopting the optimal multiplying power to re-model the stamping signal curve to obtain a digital model of the stamping die.
Further, searching an optimal multiplying power in the characteristic parameter set, and performing modeling on the stamping signal curve by using the optimal multiplying power to obtain a digital model of the stamping die, wherein the method comprises the following steps: searching for a target aggregation looseness Kmin with the minimum value in the characteristic parameter set, and determining a search multiplying power corresponding to the Kmin as an optimal multiplying power; generating an optimal search reference point according to the height values of the plurality of stamping signals and the optimal multiplying power; positioning an optimal feature alignment point of the stamping signal curve according to the optimal search reference point; respectively extending the lengths W forwards and backwards by taking the optimal feature alignment point as an optimal reference point D of the stamping signal curve to obtain D-W and D + W; generating an optimal signal sequence based on [ D-W, D + W ]; windowing the optimal signal sequence to obtain an optimal characteristic signal matrix, wherein each row of the characteristic signal matrix corresponds to a characteristic frequency band of the stamping signal; and adopting the optimal characteristic signal matrix to re-model the stamping signal curve to obtain a digital model of the stamping die.
According to another aspect of the embodiments of the present application, there is also provided a modeling apparatus based on a punching signal, including: the device comprises an acquisition module, a processing module and a processing module, wherein the acquisition module is used for acquiring a stamping signal curve of a stamping die in the stamping process, and the stamping signal curve comprises a plurality of stamping signals which are acquired in a plurality of time points; the generating module is used for generating a searching reference point according to the height values and the searching multiplying power of the plurality of stamping signals; the positioning module is used for positioning the characteristic alignment point of the stamping signal curve according to the search reference point; the calculation module is used for calculating a characteristic parameter of the stamping signal curve based on the characteristic alignment point, wherein the characteristic parameter is used for indicating the characteristic quality of a characteristic frequency band; and the modeling module is used for re-modeling the stamping signal curve by adopting the characteristic parameters to obtain a digital model of the stamping die.
Further, the generating module includes: the first determination unit is used for traversing each stamping signal in the stamping signal curve and determining a target point position Tn and a target point height Hn with the maximum amplitude in the stamping signal curve; the operation unit is used for multiplying the target point height Hn by a specified multiplying power K to obtain a reference height Cn; a second determining unit for determining the reference height Cn as a search reference point.
Further, the positioning module includes: the comparison unit is used for comparing the amplitude height of the stamping signal with the search reference point for each stamping signal in the stamping signal curve, wherein the height of the search reference point is a reference height Cn; a searching unit, configured to search M target stamping signals with amplitude heights larger than the reference height Cn in the stamping signal curve, where M is an integer larger than 0; an intercepting unit for intercepting reference peaks Kn in the M target punching signals; an extracting unit configured to extract a start coordinate An and An end coordinate Bn of the reference peak Kn; and the determining unit is used for calculating the average coordinate value of the start coordinate An and the end coordinate Bn and determining the average coordinate value as the characteristic alignment point Dn of the stamping signal curve.
Further, the intercepting unit includes: a first clipping subunit, configured to determine the target stamping signal as a reference peak Kn if M is equal to 1; and the second interception subunit is used for determining a position Tn of a target point with the largest amplitude in the plurality of stamping signals if M is larger than 1, and selecting a wave peak band containing Tn from the M target stamping signals as a reference peak Kn.
Further, the calculation module includes: the extension unit is used for respectively extending the length W forwards and backwards by taking the feature alignment point as a reference point Dn of the stamping signal curve to obtain Dn-W and Dn + W; a generating unit for generating a signal sequence On based On [ Dn-W, dn + W ]; the windowing unit is used for carrying out windowing processing On the signal sequence On to obtain a characteristic signal matrix, wherein each row of the characteristic signal matrix corresponds to a characteristic frequency band of a stamping signal; the first calculation unit is used for calculating a standard deviation aiming at each row of elements of the characteristic signal matrix to obtain a standard deviation sequence; a second calculating unit, configured to calculate an average value of all standard deviations in the standard deviation sequence; and the determining unit is used for determining the average value as the aggregation looseness of the stamping signal curve at the searching multiplying power, wherein the characteristic parameters comprise the searching multiplying power and the aggregation looseness corresponding to the searching multiplying power.
Further, the modeling module includes: a circulation unit for circularly executing the following steps until the maximum search magnification: adjusting the current searching multiplying power according to a preset step length, and generating an adjusted searching reference point according to the height values of the plurality of stamping signals and the adjusted searching multiplying power; positioning the adjusted feature alignment point of the stamping signal curve according to the adjusted search reference point; calculating the current characteristic parameter of the stamping signal curve based on the adjusted characteristic alignment point; the generating unit is used for associating the searching multiplying power and the aggregation looseness of each circulation after the circulation of the searching multiplying power is finished, and then generating a characteristic parameter set; and the modeling unit is used for searching the optimal multiplying power in the characteristic parameter set, and adopting the optimal multiplying power to re-model the stamping signal curve to obtain the digital model of the stamping die.
Further, the modeling unit includes: a determining subunit, configured to search for a target aggregation looseness Kmin with a smallest value in the feature parameter set, and determine a search magnification corresponding to the Kmin as an optimal magnification; the generating subunit is used for generating an optimal searching reference point according to the height values of the plurality of stamping signals and the optimal multiplying power; the positioning subunit is used for positioning the optimal feature alignment point of the stamping signal curve according to the optimal search reference point; the extension subunit is used for respectively extending the length W forwards and backwards by taking the optimal feature alignment point as an optimal reference point D of the stamping signal curve to obtain D-W and D + W; a generating subunit, configured to generate an optimal signal sequence based on [ D-W, D + W ]; a windowing subunit, configured to perform windowing on the optimal signal sequence to obtain an optimal characteristic signal matrix, each line of the characteristic signal matrix corresponds to a characteristic frequency band of a stamping signal; and the rebuilding subunit is used for rebuilding a model of the stamping signal curve by adopting the optimal characteristic signal matrix to obtain a digital model of the stamping die.
According to another aspect of the embodiments of the present application, there is also provided a storage medium including a stored program which performs the above steps when the program is executed.
According to another aspect of the embodiments of the present application, there is also provided an electronic device, including a processor, a communication interface, a memory, and a communication bus, where the processor, the communication interface, and the memory complete communication with each other through the communication bus; wherein: a memory for storing a computer program; a processor for executing the steps of the method by running the program stored in the memory.
Embodiments of the present application further provide a computer program product containing instructions, which when executed on a computer, cause the computer to perform the steps of the above method.
According to the invention, a stamping signal curve of the stamping die in the stamping process is obtained, wherein the stamping signal curve comprises a plurality of stamping signals which are correspondingly collected at a plurality of time points; generating a searching reference point according to the height values and the searching multiplying powers of the plurality of stamping signals; positioning a characteristic alignment point of the stamping signal curve according to the search reference point; calculating a characteristic parameter of the stamping signal curve based on the characteristic alignment point, wherein the characteristic parameter is used for indicating the characteristic quality of the characteristic frequency band; the method has the advantages that the characteristic parameters are adopted to re-model the stamping signal curve to obtain the digital model of the stamping die, a set of algorithm process for adaptively determining the alignment central point is provided, the alignment detection is carried out on the whole stamping wave crest, and the specific alignment parameters can be adaptively adjusted, so that the high-efficiency signal alignment is realized, the attention to the top end of the wave crest is avoided, the attention to the whole wave crest as a characteristic section is paid, the problem that the alignment is difficult due to flat tops or multiple tops is solved, the technical problem that the model is inaccurate due to signal misalignment in the related art is solved, the accuracy of time/rotor phase alignment can be improved, and the precision of the stamping signal model is improved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the invention and do not constitute a limitation of the invention. In the drawings:
FIG. 1 is a block diagram of a hardware configuration of a computer according to an embodiment of the present invention;
FIG. 2 is a flow chart of a method of modeling based on a punching signal according to an embodiment of the invention;
FIG. 3 is a schematic illustration of a punch signal in an embodiment of the present invention;
FIG. 4 is a schematic diagram of a signal sequence extracted from a stamped signal curve according to an embodiment of the invention;
FIG. 5 is a flow chart of the processing of the impact signal profile according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of modeling with optimal magnification according to an embodiment of the present invention;
FIG. 7 is a comparative schematic of aligning the punch signals according to an embodiment of the present invention;
fig. 8 is a block diagram of a modeling apparatus based on a punching signal according to an embodiment of the present invention.
Detailed Description
In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application. It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict.
It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It should be understood that the data so used may be interchanged under appropriate circumstances such that embodiments of the application described herein may be implemented in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Example 1
The method provided in the first embodiment of the present application may be executed in a server, a computer, a punching machine, or a similar computing device. Taking an example of the present invention running on a computer, fig. 1 is a block diagram of a hardware structure of a computer according to an embodiment of the present invention. As shown in fig. 1, computer 10 may include one or more (only one shown in fig. 1) processors 102 (processor 102 may include, but is not limited to, a processing device such as a microprocessor MCU or a programmable logic device FPGA) and a memory 104 for storing data, and optionally may also include a transmission device 106 for communication functions and an input-output device 108. It will be appreciated by those of ordinary skill in the art that the configuration shown in FIG. 1 is illustrative only and is not intended to limit the configuration of the computer described above. For example, computer 10 may also include more or fewer components than shown in FIG. 1, or have a different configuration than shown in FIG. 1.
The memory 104 may be used to store a computer program, for example, a software program and a module of an application software, such as a computer program corresponding to a modeling method based on a stamping signal in an embodiment of the present invention, and the processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, so as to implement the method. The memory 104 may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory 104 may further include memory located remotely from the processor 102, which may be connected to the computer 10 via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The transmission device 106 is used for receiving or transmitting data via a network. Specific examples of such networks may include wireless networks provided by the communications provider of computer 10. In one example, the transmission device 106 includes a Network adapter (NIC), which can be connected to other Network devices through a base station so as to communicate with the internet. In one example, the transmission device 106 may be a Radio Frequency (RF) module, which is used to communicate with the internet in a wireless manner.
In the present embodiment, a modeling method based on a punching signal is provided, and fig. 2 is a flowchart of a modeling method based on a punching signal according to an embodiment of the present invention, as shown in fig. 2, the flowchart includes the following steps:
step S202, a stamping signal curve of the stamping die in the stamping process is obtained, wherein the stamping signal curve comprises a plurality of stamping signals which are correspondingly collected at a plurality of time points;
fig. 3 is a schematic diagram of a stamping signal according to an embodiment of the present invention, where the stamping signal refers to a surface amplitude signal collected by a vibration sensor or an ultrasonic sensor, and fig. 3 illustrates an ultrasonic signal detected by an ultrasonic sensor mounted on a stamping die during a stamping process, and the signal is emitted from a surface of an object.
Step S204, generating a search reference point according to the height values and the search multiplying powers of the plurality of stamping signals;
optionally, the search magnification ranges between 0 and 1.
Step S206, positioning a characteristic alignment point of the stamping signal curve according to the search reference point;
step S208, calculating characteristic parameters of the stamping signal curve based on the characteristic alignment points, wherein the characteristic parameters are used for indicating the characteristic quality of the characteristic frequency band; wherein, the characteristic quality can be a characteristic parameter such as polymerization looseness J and the like.
And step S210, re-modeling the stamping signal curve by adopting the characteristic parameters to obtain a digital model of the stamping die.
Through the steps, a stamping signal curve of the stamping die in the stamping process is obtained, wherein the stamping signal curve comprises a plurality of stamping signals which are correspondingly collected at a plurality of time points; generating a searching reference point according to the height values and the searching multiplying power of the plurality of stamping signals; positioning a characteristic alignment point of the stamping signal curve according to the search reference point; calculating a characteristic parameter of the stamping signal curve based on the characteristic alignment point, wherein the characteristic parameter is used for indicating the characteristic quality of the characteristic frequency band; the method has the advantages that the characteristic parameters are adopted to re-model the stamping signal curve to obtain the digital model of the stamping die, a set of algorithm process for adaptively determining the alignment central point is provided, the alignment detection is carried out on the whole stamping wave crest, and the specific alignment parameters can be adaptively adjusted, so that the high-efficiency signal alignment is realized, the attention to the top end of the wave crest is avoided, the attention to the whole wave crest as a characteristic section is paid, the problem that the alignment is difficult due to flat tops or multiple tops is solved, the technical problem that the model is inaccurate due to signal misalignment in the related art is solved, the accuracy of time/rotor phase alignment can be improved, and the precision of the stamping signal model is improved.
In one embodiment of this embodiment, generating the search reference point from the height values of the plurality of punching signals comprises: traversing each punching signal in the punching signal curve, and determining a target point position Tn with the maximum amplitude and a target point height Hn in the punching signal curve; multiplying the target point height Hn by a specified multiplying power K to obtain a reference height Cn; the reference height Cn is determined as a search reference point.
After modeling is started, each time a model signal, namely a stamping signal, is acquired, an original signal Sn is stored in a list L to obtain a stamping signal curve, and after the requirement of modeling times is met, the highest position Tn and the highest height Hn of the signal are found for each original signal (S1, S2 \8230; sn) in the L. And then, calculating the highest point height Hn multiplied by a specified multiplying power K to obtain a reference height Cn serving as a searching reference point.
In one embodiment of this embodiment, locating the feature alignment point of the punch signal curve according to the search reference point includes:
s11, aiming at each stamping signal in the stamping signal curve, comparing the amplitude height of the stamping signal with a search reference point, wherein the height of the search reference point is a reference height Cn;
s12, searching M target stamping signals with amplitude heights larger than a reference height Cn in a stamping signal curve, wherein M is an integer larger than 0;
s13, intercepting reference peaks Kn from the M target stamping signals;
in one example, truncating the reference peaks Kn in the M target press signals comprises: if M is equal to 1, determining the target stamping signal as a reference peak Kn; and if M is larger than 1, determining the position Tn of a target point with the maximum amplitude in the plurality of stamping signals, and selecting a wave peak band containing Tn from the M target stamping signals as a reference peak Kn.
S14, extracting a starting coordinate An and An ending coordinate Bn of the reference peak Kn;
and S15, calculating the average coordinate value of the start coordinate An and the end coordinate Bn, and determining the average coordinate value as a characteristic alignment point Dn of the punching signal curve.
For each signal and Cn, finding a part of the original signal Sn which is larger than Cn, wherein the part of the found signal which is higher than a certain value may find a plurality of discontinuous intervals because a plurality of peaks may exist, if a plurality of parts are found, selecting the part comprising Tn as a reference peak Kn, wherein Kn has a start coordinate An and An end coordinate Bn, and calculating the average value of An and Bn as An actual alignment point Dn.
In some examples, calculating the characteristic parameter of the punch signal curve based on the characteristic alignment point includes: respectively extending the length W forwards and backwards by taking the characteristic alignment point as a reference point Dn of the stamping signal curve to obtain Dn-W and Dn + W; generating a signal sequence On based On [ Dn-W, dn + W ]; windowing the signal sequence On to obtain a characteristic signal matrix, wherein each row of the characteristic signal matrix corresponds to a characteristic frequency band of a stamping signal; calculating a standard deviation aiming at each row of elements of the characteristic signal matrix to obtain a standard deviation sequence; calculating the average value of all standard deviations in the standard deviation sequence; and determining the average value as the polymerization looseness of the stamping signal curve at the searching magnification, wherein the characteristic parameters comprise the searching magnification and the polymerization looseness corresponding to the searching magnification.
In this example, after the feature alignment point is obtained, a part of the length W before and after the point is taken to obtain a sequence On with coordinates [ Dn-W, dn + W ], where the sequence On is a segment from (Dn-W) to (Dn + W) taken from the original signal Sn, and after the signal windowing processing is performed On the sequence On, the extracted feature is stored in a new list Q. Optionally, a Kaiser window or a hann window may be used for windowing. FIG. 4 is a schematic diagram of extracting a signal sequence from a stamped signal curve according to an embodiment of the present invention, where On is the signal sequence obtained by the last extraction and has coordinates [ Dn-W, dn + W ].
In an embodiment of this embodiment, the obtaining of the digital model of the stamping die by re-modeling the stamping signal curve with the characteristic parameters includes:
s21, circularly executing the following steps until the maximum search magnification: adjusting the current searching multiplying power according to a preset step length, and generating an adjusted searching reference point according to the height values of the plurality of stamping signals and the adjusted searching multiplying power; positioning the adjusted characteristic alignment point of the stamping signal curve according to the adjusted search reference point; calculating the current characteristic parameters of the stamping signal curve based on the adjusted characteristic alignment points;
s22, after the search multiplying power circulation is finished, correlating the search multiplying power and the aggregation looseness of each circulation to generate a characteristic parameter set;
and S23, searching the optimal multiplying power in the characteristic parameter set, and adopting the optimal multiplying power to re-model the stamping signal curve to obtain the digital model of the stamping die.
Optionally, the optimal multiplying power is searched in the characteristic parameter set, and the stamping signal curve is modeled again by using the optimal multiplying power, so as to obtain a digital model of the stamping die, including: searching for a target polymerization looseness Kmin with the minimum value in the characteristic parameter set, and determining a search magnification corresponding to Kmin as an optimal magnification; generating an optimal search reference point according to the height values and the optimal multiplying power of the plurality of stamping signals; positioning an optimal characteristic alignment point of the stamping signal curve according to the optimal search reference point; respectively extending the lengths W forwards and backwards by taking the optimal characteristic alignment point as an optimal reference point D of the stamping signal curve to obtain D-W and D + W; generating an optimal signal sequence based on [ D-W, D + W ]; windowing the optimal signal sequence to obtain an optimal characteristic signal matrix, wherein each row of the characteristic signal matrix corresponds to a characteristic frequency band of the stamping signal; and (5) re-modeling the stamping signal curve by adopting the optimal characteristic signal matrix to obtain a digital model of the stamping die.
Fig. 5 is a flowchart of processing a stamping signal curve according to an embodiment of the present invention, where after a signal set L of the stamping signal curve is input and each signal Sn in L is processed to obtain a feature set Q corresponding to L, each element On in Q may be represented as (On 1, on2, on3 \8230; on 2W), where Q may be represented as a matrix M:
o11 o12 o13 o14…… o12W
o21 o22 o23 o24…… o22W
……
on1 on2 on3 on4…… on2W
for matrix M, the standard deviation Stdn is determined for each vertical column to obtain the standard deviation sequence ST1, ST2 \8230STn, and then the standard deviation sequence is averaged to obtain the polymeric looseness J of the group of signals at the multiplying factor K. A search can be performed specifying a specific range of K (0 to 1), for example from 0.1 to 0.9, for every 0.05 to calculate J at that K (for K =0.1, J = xxx, K =0.15, J = xxx, 8230, until K =0.9, J = xxx), finding the K value Kmin that minimizes the polymerization bulk J as the optimum magnification.
Then, the original signal set L can be modeled again by Kmin using the above procedure to obtain a high-precision model, and K is used to extract the aligned characteristic portion Ox of the next acquired new signal Sx by using the previous procedure, and the model and Ox are used to perform scoring operation.
Fig. 6 is a schematic diagram of modeling with optimal multiplying power, where K with the smallest J is used as the optimal multiplying power (optimal K), then the optimal K is used to perform alignment processing to obtain a characteristic frequency band, and finally the characteristic frequency band is used to perform modeling operation and prediction. The embodiment can automatically find the height of the reference peak, thereby improving the compactness of peak alignment and reducing the loss of model precision caused by the fact that the peaks are not aligned.
By adopting the scheme of the embodiment, the peak of the characteristic frequency band is not used as the alignment center, but the whole peak is used as the alignment target, so that the defect that the peak of the peak is partially asymmetric is avoided, and a high-precision algorithm model is obtained. The peak height Hn is used to calculate a reference height Cn, followed by Cn to calculate the specific position Dn of the current peak as the actual alignment point. And (3) re-modeling different K by using a searching mode, thereby searching out the optimal K value Kmin required by the model with the most compact wave crest as the optimal parameter of time alignment for modeling and judging actual production. Fig. 7 is a schematic diagram comparing alignment of stamping signals according to an embodiment of the present invention, where the upper part is a waveform obtained by aligning the stamping signals according to the embodiment, and the lower part is a waveform obtained by aligning the stamping signals according to a related art scheme.
The embodiment avoids the concern about the peak top and focuses on the whole peak as a characteristic segment, thereby reducing the problem of difficult alignment caused by flat top or multiple tops. The embodiment can also automatically find the height of the reference peak, thereby improving the compactness of peak alignment and reducing the loss of model precision caused by the fact that the peaks are not aligned.
Through the above description of the embodiments, those skilled in the art can clearly understand that the method according to the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but the former is a better implementation mode in many cases. Based on such understanding, the technical solutions of the present invention or portions thereof contributing to the prior art may be embodied in the form of a software product, which is stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal device (which may be a mobile phone, a computer, a server, or a network device) to execute the method according to the embodiments of the present invention.
Example 2
In this embodiment, a modeling apparatus based on a stamping signal is further provided, which is used to implement the foregoing embodiments and preferred embodiments, and the description of the modeling apparatus is omitted. As used below, the term "module" may be a combination of software and/or hardware that implements a predetermined function. Although the means described in the embodiments below are preferably implemented in software, an implementation in hardware, or a combination of software and hardware is also possible and contemplated.
Fig. 8 is a block diagram of a modeling apparatus based on a punching signal according to an embodiment of the present invention, as shown in fig. 8, the apparatus including: an acquisition module 80, a generation module 82, a positioning module 84, a calculation module 86, a modeling module 88, wherein,
an obtaining module 80, configured to obtain a stamping signal curve of a stamping die in a stamping process, where the stamping signal curve includes a plurality of stamping signals acquired at a plurality of time points;
a generating module 82, configured to generate a search reference point according to the height values and the search magnifications of the multiple stamping signals;
a positioning module 84, configured to position feature alignment points of the punching signal curve according to the search reference point;
a calculating module 86, configured to calculate a characteristic parameter of the stamping signal curve based on the characteristic alignment point, where the characteristic parameter is used to indicate a characteristic quality of a characteristic frequency band;
and the modeling module 88 is used for re-modeling the stamping signal curve by adopting the characteristic parameters to obtain a digital model of the stamping die.
Optionally, the generating module includes: the first determination unit is used for traversing each stamping signal in the stamping signal curve and determining a target point position Tn and a target point height Hn with the maximum amplitude in the stamping signal curve; the operation unit is used for multiplying the target point height Hn by a specified multiplying power K to obtain a reference height Cn; a second determining unit for determining the reference height Cn as a search reference point.
Optionally, the positioning module includes: a comparison unit for comparing the amplitude height of the stamping signal with the search reference point for each stamping signal in the stamping signal curve, wherein the height of the search reference point is a reference height Cn; the searching unit is used for searching M target stamping signals with amplitude heights larger than the reference height Cn in the stamping signal curve, wherein M is an integer larger than 0; an intercepting unit for intercepting reference peaks Kn in the M target punching signals; an extraction unit configured to extract a start coordinate An and An end coordinate Bn of the reference peak Kn; and the determining unit is used for calculating the average coordinate value of the start coordinate An and the end coordinate Bn and determining the average coordinate value as the characteristic alignment point Dn of the punching signal curve.
Optionally, the intercepting unit includes: a first clipping subunit, configured to determine the target stamping signal as a reference peak Kn if M is equal to 1; and the second interception subunit is used for determining a position Tn of a target point with the largest amplitude in the plurality of stamping signals if M is larger than 1, and selecting a wave peak band containing Tn from the M target stamping signals as a reference peak Kn.
Optionally, the calculation module includes: the extension unit is used for respectively extending the length W forwards and backwards by taking the feature alignment point as a reference point Dn of the stamping signal curve to obtain Dn-W and Dn + W; a generating unit for generating a signal sequence On based On [ Dn-W, dn + W ]; the windowing unit is used for carrying out windowing processing On the signal sequence On to obtain a characteristic signal matrix, wherein each row of the characteristic signal matrix corresponds to a characteristic frequency band of a stamping signal; the first calculation unit is used for calculating a standard deviation aiming at each row of elements of the characteristic signal matrix to obtain a standard deviation sequence; the second calculating unit is used for calculating the average value of all standard deviations in the standard deviation sequence; and the determining unit is used for determining the average value as the aggregation looseness of the stamping signal curve at the searching multiplying power, wherein the characteristic parameters comprise the searching multiplying power and the aggregation looseness corresponding to the searching multiplying power.
Optionally, the modeling module includes: a circulation unit for circularly executing the following steps until the maximum search magnification: adjusting the current searching multiplying power according to a preset step length, and generating an adjusted searching reference point according to the height values of the plurality of stamping signals and the adjusted searching multiplying power; positioning the adjusted feature alignment point of the stamping signal curve according to the adjusted search reference point; calculating the current characteristic parameter of the stamping signal curve based on the adjusted characteristic alignment point; the generating unit is used for associating the searching multiplying power and the aggregation looseness of each circulation after the searching multiplying power circulation is finished, and then generating a characteristic parameter set; and the modeling unit is used for searching the optimal multiplying power in the characteristic parameter set, and adopting the optimal multiplying power to re-model the stamping signal curve to obtain the digital model of the stamping die.
Optionally, the modeling unit includes: a determining subunit, configured to search for a target aggregation looseness Kmin with a smallest value in the feature parameter set, and determine a search magnification corresponding to the Kmin as an optimal magnification; the generating subunit is used for generating an optimal searching reference point according to the height values of the plurality of stamping signals and the optimal multiplying power; the positioning subunit is used for positioning the optimal feature alignment point of the stamping signal curve according to the optimal search reference point; the extension subunit is used for respectively extending the length W forwards and backwards by taking the optimal feature alignment point as an optimal reference point D of the stamping signal curve to obtain D-W and D + W; a generating subunit, configured to generate an optimal signal sequence based on [ D-W, D + W ]; the windowing subunit is used for performing windowing processing on the optimal signal sequence to obtain an optimal characteristic signal matrix, wherein each row of the characteristic signal matrix corresponds to a characteristic frequency band of the stamping signal; and the rebuilding subunit is used for rebuilding the model of the stamping signal curve by adopting the optimal characteristic signal matrix to obtain the digital model of the stamping die.
It should be noted that, the above modules may be implemented by software or hardware, and for the latter, the following may be implemented, but not limited to: the modules are all positioned in the same processor; alternatively, the modules are respectively located in different processors in any combination.
Example 3
Embodiments of the present invention also provide a storage medium having a computer program stored therein, wherein the computer program is arranged to perform the steps of any of the above method embodiments when executed.
Alternatively, in the present embodiment, the storage medium may be configured to store a computer program for executing the steps of:
s1, obtaining a stamping signal curve of a stamping die in a stamping process, wherein the stamping signal curve comprises a plurality of stamping signals which are correspondingly collected at a plurality of time points;
s2, generating a search reference point according to the height values and the search multiplying powers of the plurality of stamping signals;
s3, positioning a feature alignment point of the stamping signal curve according to the search reference point;
s4, calculating a characteristic parameter of the stamping signal curve based on the characteristic alignment point, wherein the characteristic parameter is used for indicating the characteristic quality of a characteristic frequency band;
and S5, adopting the characteristic parameters to re-model the stamping signal curve to obtain a digital model of the stamping die.
Optionally, in this embodiment, the storage medium may include but is not limited to: various media capable of storing computer programs, such as a usb disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic disk, or an optical disk.
Embodiments of the present invention also provide an electronic device comprising a memory having a computer program stored therein and a processor arranged to run the computer program to perform the steps of any of the above method embodiments.
Optionally, the electronic device may further include a transmission device and an input/output device, where the transmission device is connected to the processor, and the input/output device is connected to the processor.
Optionally, in this embodiment, the processor may be configured to execute the following steps by a computer program:
s1, acquiring a stamping signal curve of a stamping die in a stamping process, wherein the stamping signal curve comprises a plurality of stamping signals which are correspondingly acquired at a plurality of time points;
s2, generating a searching reference point according to the height values and the searching multiplying powers of the plurality of stamping signals;
s3, positioning a feature alignment point of the stamping signal curve according to the search reference point;
s4, calculating a characteristic parameter of the stamping signal curve based on the characteristic alignment point, wherein the characteristic parameter is used for indicating the characteristic quality of a characteristic frequency band;
and S5, adopting the characteristic parameters to re-model the stamping signal curve to obtain a digital model of the stamping die.
Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments and optional implementation manners, and this embodiment is not described herein again.
The above-mentioned serial numbers of the embodiments of the present application are merely for description and do not represent the merits of the embodiments.
In the above embodiments of the present application, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed technology can be implemented in other ways. The above-described apparatus embodiments are merely illustrative, and for example, the division of the units is only one type of logical functional division, and other divisions may be implemented in practice, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit may be implemented in the form of hardware, or may also be implemented in the form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present application may be substantially implemented or contributed to by the prior art, or all or part of the technical solution may be embodied in a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic disk, or an optical disk, and various media capable of storing program codes.
The foregoing is only a preferred embodiment of the present application and it should be noted that those skilled in the art can make several improvements and modifications without departing from the principle of the present application, and these improvements and modifications should also be considered as the protection scope of the present application.
Claims (9)
1. A modeling method based on a punching signal, comprising:
acquiring a stamping signal curve of a stamping die in a stamping process, wherein the stamping signal curve comprises a plurality of stamping signals which are correspondingly acquired at a plurality of time points;
generating a searching reference point according to the height values and the searching multiplying power of the plurality of stamping signals;
positioning a feature alignment point of the punching signal curve according to the search reference point;
calculating a characteristic parameter of the stamping signal curve based on the characteristic alignment point, wherein the characteristic parameter is used for indicating the characteristic quality of a characteristic frequency band;
modeling the stamping signal curve again by adopting the characteristic parameters to obtain a digital model of the stamping die;
wherein locating the feature alignment point of the stamped signal curve from the search reference point comprises: for each stamped signal in the stamped signal curve, comparing the amplitude height of the stamped signal with the search reference point, wherein the height of the search reference point is a reference height Cn; searching M target stamping signals with amplitude heights larger than the reference height Cn in the stamping signal curve, wherein M is an integer larger than 0; intercepting reference peaks Kn from the M target stamping signals; extracting a start coordinate An and An end coordinate Bn of the reference peak Kn; and calculating the average coordinate value of the start coordinate An and the end coordinate Bn, and determining the average coordinate value as a characteristic alignment point Dn of the punching signal curve.
2. The method of claim 1, wherein generating a search reference point from the height values of the plurality of punching signals comprises:
traversing each punching signal in the punching signal curve, and determining a target point position Tn and a target point height Hn with the maximum amplitude in the punching signal curve;
multiplying the target point height Hn by a specified multiplying power K to obtain a reference height Cn;
determining the reference height Cn as a search reference point.
3. The method of claim 1, wherein truncating reference peaks Kn in the M target press signals comprises:
if M is equal to 1, determining the target stamping signal as a reference peak Kn;
and if M is larger than 1, determining a target point position Tn with the maximum amplitude in the plurality of stamping signals, and selecting a wave peak band containing Tn from the M target stamping signals as a reference peak Kn.
4. The method of claim 1, wherein calculating a characteristic parameter of the punch signal curve based on the characteristic alignment point comprises:
respectively extending the length W forwards and backwards by taking the characteristic alignment point as a reference point Dn of the stamping signal curve to obtain Dn-W and Dn + W;
generating a signal sequence On based On [ Dn-W, dn + W ];
windowing the signal sequence On to obtain a characteristic signal matrix, wherein each row of the characteristic signal matrix corresponds to a characteristic frequency band of a stamping signal;
calculating a standard deviation for each row of elements of the characteristic signal matrix to obtain a standard deviation sequence;
calculating the average value of all standard deviations in the standard deviation sequence;
and determining the average value as the polymerization looseness of the stamping signal curve at the searching multiplying power, wherein the characteristic parameters comprise the searching multiplying power and the polymerization looseness corresponding to the searching multiplying power.
5. The method of claim 1, wherein re-modeling the stamping signal curve using the characteristic parameters to obtain a digital model of the stamping die comprises:
the following steps are executed in a circulating manner until the maximum searching magnification is reached: adjusting the current searching multiplying power according to a preset step length, and generating an adjusted searching reference point according to the height values of the plurality of stamping signals and the adjusted searching multiplying power; positioning the adjusted characteristic alignment point of the stamping signal curve according to the adjusted search reference point; calculating the current characteristic parameter of the stamping signal curve based on the adjusted characteristic alignment point;
after the search multiplying power circulation is completed, the search multiplying power and the aggregation looseness of each circulation are correlated to generate a characteristic parameter set;
and searching the optimal multiplying power in the characteristic parameter set, and adopting the optimal multiplying power to re-model the stamping signal curve to obtain a digital model of the stamping die.
6. The method of claim 5, wherein the step of finding an optimal magnification in the set of characteristic parameters and using the optimal magnification to re-model the stamping signal curve to obtain the digital model of the stamping die comprises:
searching for a target polymerization looseness Kmin with the minimum value in the characteristic parameter set, and determining a search magnification corresponding to the Kmin as an optimal magnification;
generating an optimal search reference point according to the height values of the plurality of stamping signals and the optimal multiplying power;
positioning an optimal characteristic alignment point of the stamping signal curve according to the optimal search reference point;
respectively extending the lengths W forwards and backwards by taking the optimal feature alignment point as an optimal reference point D of the stamping signal curve to obtain D-W and D + W;
generating an optimal signal sequence based on [ D-W, D + W ];
windowing the optimal signal sequence to obtain an optimal characteristic signal matrix, wherein each row of the characteristic signal matrix corresponds to a characteristic frequency band of the stamping signal;
and adopting the optimal characteristic signal matrix to re-model the stamping signal curve to obtain a digital model of the stamping die.
7. A modeling apparatus based on a punching signal, comprising:
the stamping device comprises an acquisition module, a processing module and a processing module, wherein the acquisition module is used for acquiring a stamping signal curve of a stamping die in a stamping process, and the stamping signal curve comprises a plurality of stamping signals which are correspondingly acquired at a plurality of time points;
the generating module is used for generating a searching reference point according to the height values and the searching multiplying power of the plurality of stamping signals;
the positioning module is used for positioning the characteristic alignment point of the stamping signal curve according to the search reference point;
the calculation module is used for calculating a characteristic parameter of the stamping signal curve based on the characteristic alignment point, wherein the characteristic parameter is used for indicating the characteristic quality of a characteristic frequency band;
the modeling module is used for adopting the characteristic parameters to re-model the stamping signal curve to obtain a digital model of the stamping die;
wherein the positioning module comprises: the comparison unit is used for comparing the amplitude height of the stamping signal with the search reference point for each stamping signal in the stamping signal curve, wherein the height of the search reference point is a reference height Cn; the searching unit is used for searching M target stamping signals with amplitude heights larger than the reference height Cn in the stamping signal curve, wherein M is an integer larger than 0; an intercepting unit for intercepting reference peaks Kn in the M target punching signals; an extraction unit configured to extract a start coordinate An and An end coordinate Bn of the reference peak Kn; and the determining unit is used for calculating the average coordinate value of the start coordinate An and the end coordinate Bn and determining the average coordinate value as the characteristic alignment point Dn of the stamping signal curve.
8. A storage medium, characterized in that the storage medium comprises a stored computer program, wherein the computer program performs the method steps of any of the preceding claims 1 to 6 when running.
9. An electronic device comprises a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory are communicated with each other through the communication bus; wherein:
a memory for storing a computer program;
a processor for performing the method steps of any one of claims 1 to 6 by running a computer program stored on a memory.
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