CN114760001A - Control method for automatic calibration of single TEC with two lasers in multipath DWDM - Google Patents
Control method for automatic calibration of single TEC with two lasers in multipath DWDM Download PDFInfo
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- CN114760001A CN114760001A CN202210338814.0A CN202210338814A CN114760001A CN 114760001 A CN114760001 A CN 114760001A CN 202210338814 A CN202210338814 A CN 202210338814A CN 114760001 A CN114760001 A CN 114760001A
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Abstract
The invention relates to a control method for automatic calibration of a single TEC with two lasers in a multipath DWDM. According to the invention, one TEC is used for controlling two paths of lasers to work according to the condition that the adjacent wavelength interval of DWDM is 0.4nm, so that the use quantity of TECs of a plurality of paths of DWDM optical modules is reduced, the material cost is reduced, the space of the optical module is saved, other reliability design spaces can be increased, and the performance of the optical module is improved. The automatic wavelength calibration method is adopted to improve the production efficiency and reduce the production cost.
Description
Technical Field
The invention relates to the field of optical communication, in particular to a control method for automatic calibration of a single TEC with two lasers in a multipath DWDM.
Background
With the development of the technology in the field of optical communication, the emerging industries such as super-large-scale data centers, laser radars, automatic driving, robots, Artificial Intelligence (AI) computing and the like are protruding, the requirements for information transmission and data interaction are increased explosively, and the multi-path DWDM photoelectric integrated photoelectric module gradually replaces the traditional photoelectric module and becomes the competitive core of each company.
In a traditional multi-path DWDM optical module, one TEC is used for controlling one path of laser to emit one wavelength in laser wavelength control, a plurality of TECs and control of the TECs are needed for a module output by the multi-path laser, the module is large in size and difficult to design, no enough reliable design space exists inside the module, the number of TECs is needed, the material cost is high, the manual wavelength calibration consumes time seriously, the production efficiency is low, and the production cost is high.
Disclosure of Invention
The invention aims to provide a control method for automatic calibration of a single TEC with two lasers in a multipath DWDM.
The invention realizes the purpose through the following technical scheme: a control method for automatic calibration of a single TEC with two lasers in a multipath DWDM comprises the following steps:
s1, starting up and electrifying, sampling the resistance value of a thermistor attached to the surface of the TEC, obtaining a temperature value through calculation, accumulating the result of DAC _ T required to be adjusted with the DAC _ T given at the previous time through formula calculation, converting the result into a 0-2.5V voltage signal for controlling GNA4008, adjusting the driving current of the TEC, setting a proper PID (proportion integration differentiation) parameter in cooperation with a power supply ripple smaller than 50mV, additionally adjusting the sampling frequency of the thermistor, realizing that the working environment temperature of the TEC surface laser is stabilized within +/-0.01 ℃, and starting the light emitting size calibration of the laser by the PC after the working environment temperature of the laser is stabilized;
S2, the system starts the laser to enable the laser to enter a working state, then the MCU controls TLC2662 to slowly increase the output of DAC current to enable the current flowing through the laser to slowly increase, meanwhile, the MCU in the module detects the light emitting size of the laser through the PD and compares the light emitting size with a target value set by the light emitting size until the light emitting size is larger than the target value plus 0.3dBm, then the DAC value and the current value at the moment are recorded, and the light emitting sizes of other paths of lasers are calibrated by the same method;
s3, when the current value needed by the light emitting size of the laser is calibrated, the light emitting wavelength of each laser is calibrated, firstly, the optical module compares the real-time wavelength sent by the PC with the target wavelength, the setting temperature of the TEC is changed, the control temperature of the TEC is changed, thereby changing the working temperature of the laser, the light-emitting wavelength of the laser can change along with the change of the working temperature of the laser, the PC sends the real-time wavelength read from the spectrometer to the MCU in the optical module, the MCU compares the obtained real-time wavelength with the target wavelength, if the difference of the two wavelengths is larger, the temperature of the TEC is adjusted to change the change direction, if the difference of the two wavelengths is smaller, the adjustment is continued until the difference value of the two wavelengths is stabilized within a certain numerical value to be calibrated, the current TEC temperature parameter and the current of the laser are recorded, and a channel calibration completion mark is set;
S4, after reading the channel calibration completion mark by a PC machine, switching a control optical switch, switching the outgoing light of the second laser to the light input port of a spectrometer, sending a command to an optical module to start the wavelength calibration of the second laser, wherein the calibration process of the second laser is the same as that of the first laser, and finally recording the temperature of the TEC and the current of the second laser;
s5, averaging the two recorded TEC temperature values to obtain the working temperature value of the TEC, adjusting the current of the second laser after the TEC is stabilized, if the wavelength of the laser is larger than the target value, adjusting to reduce the target value, reducing the current of the laser to reduce the light-emitting wavelength of the laser, if the wavelength of the laser is smaller than the target wavelength, increasing the current of the laser to adjust the wavelength of the laser, stabilizing the light-emitting wavelength of the laser within a certain value, and setting an adjustment completion mark to inform a PC of the completion of the adjustment after the stabilization;
s6, after receiving the adjustment, the PC controls the optical switch to switch the optical path, the first path of laser is connected to the optical inlet of the spectrometer, the spectrometer tests the first path of light, the first path of light wavelength adjustment is started, the process is the same as the current adjustment wavelength of the second path, and the completion flag is set after the completion;
S7, after the two paths of current are adjusted, verifying, controlling the light output of the light switching laser to be input to a light input port of the spectrometer through the PC, and verifying whether the current light output wavelength meets the requirement, if not, adjusting the current appropriately;
and S8, calibrating the two lasers on the other TECs in the same way as the previous step.
Further, in the step S1, the resistance value of the thermistor with 3% o precision, which is surface-mounted on the TEC, is sampled by using the ADC with 16 bits.
Further, the accuracy of the temperature value in step S1 is 0.001 ℃.
Further, the step S3 is performed until the difference between the two wavelengths is stabilized within a certain value ± 0.003 nm.
Further, the 10mA current in step S5 can adjust the wavelength to about 0.3 nm.
Further, step S5 is to stabilize the wavelength of the output light of the laser within ± 0.003 nm.
Compared with the prior art, the control method for automatically calibrating the single TEC with the two lasers in the multipath DWDM has the advantages that: according to the technical scheme, the interval between adjacent wavelengths of DWDM is 0.4nm, one TEC is used for controlling the work of two paths of lasers, the number of TECs used for the multiple paths of DWDM optical modules is reduced, the material cost is reduced, the space of the optical module is saved, other reliability design spaces can be increased, and the performance of the optical module is improved. The automatic wavelength calibration method is adopted to improve the production efficiency and reduce the production cost.
Drawings
FIG. 1 is a control system diagram of the present invention.
Detailed Description
Referring to fig. 1, fig. 1 is a control system diagram during system calibration; after calibration, the optical module can be without a PC (personal computer) and an OSA (optical fiber operation interface) (spectrometer) when in normal operation, and the wavelength is not adjusted when in normal operation; the system can be divided into a system calibration process and a system normal working process.
The control method for automatic calibration of the single TEC with two lasers in the multipath DWDM comprises the following steps:
s1, starting up and powering up, firstly, sampling the resistance value of a thermistor with 3 per mill precision attached to the surface of the TEC by using a 16-bit ADC, obtaining a temperature value through calculation, wherein the precision of the temperature value is 0.001 ℃, calculating through a PID formula, accumulating the result of DAC _ T needing to be adjusted with the DAC _ T given at the previous time, converting the result into a 0-2.5V voltage signal for controlling GNA4008, adjusting the driving current of the TEC, setting a proper PID parameter in cooperation with a power supply ripple smaller than 50mV, and adjusting the sampling frequency of the thermistor, so that the working environment temperature of the TEC surface laser can be controlled to be stabilized within +/-0.01 ℃, and after the working environment temperature of the laser is stabilized, starting the light emitting size calibration of the laser by using the PC.
S2, the system starts the laser to make the laser enter the working state, then the MCU (micro controller) controls the TLC2662 to slowly increase the output of the DAC (digital signal to analog signal converter) current to make the current flowing through the laser slowly increase, meanwhile the MCU inside the module detects the light emitting size of the laser through the PD and compares the light emitting size with the target value set by the light emitting until the light emitting size is larger than the target value plus 0.3dBm, then the DAC value and the current value at the moment are recorded, and the light emitting sizes of other paths of lasers are calibrated by the same method.
S3, when the current value needed by the light-emitting size of the laser is calibrated, the light-emitting wavelength of each laser is calibrated, firstly, the optical module compares the real-time wavelength sent by the PC with the target wavelength, the set temperature of the TEC is changed, the control temperature of the TEC is changed, thereby the working temperature of the laser is changed, the light-emitting wavelength of the laser changes along with the working temperature of the laser, the PC sends the real-time wavelength read from the spectrometer to the MCU inside the optical module, the MCU compares the obtained real-time wavelength with the target wavelength, if the difference of the two wavelengths is increased, the temperature adjustment of the TEC is changed, if the difference of the two wavelengths is decreased, the measurement is continuously adjusted until the difference of the two wavelengths is stabilized within +/-0.003 nm (which can be properly adjusted according to the specific situation) for calibration completion, the current TEC temperature parameter and the current of the laser are recorded, and setting a channel calibration completion mark.
S4, after reading the mark of channel calibration completion by the PC, the PC switches the control optical switch, switches the second laser to the light input port of the spectrometer, sends out a command to the optical module to start the calibration of the second laser wavelength, the calibration process of the second laser is the same as that of the first laser, and finally records the temperature of the TEC and the current of the second laser.
S5, averaging the two recorded TEC temperature values to obtain the working temperature value of the TEC, adjusting the current of the second laser after the TEC is stabilized, wherein if the wavelength of the laser is larger than the target value, the target value needs to be reduced for adjustment, the light emitting wavelength of the laser can be reduced by reducing the current of the laser, and the wavelength can be adjusted to 0.3nm by 10mA current; if the wavelength of the laser is smaller than the target wavelength, the current of the laser needs to be increased to adjust the wavelength of the laser, finally the light-emitting wavelength of the laser can be stabilized within +/-0.003 nm, and an adjustment completion mark is set after stabilization to inform a PC of completion of adjustment.
S6, after receiving the adjustment, the PC controls the optical switch to switch the optical path, the first path of laser is connected to the optical inlet of the spectrometer, the spectrometer tests the first path of light, the first path of light wavelength adjustment is started, the process is the same as the current adjustment wavelength of the second path, and the completion flag is set after the completion.
And S7, after the two paths of current are adjusted, verifying that the current wavelength of the current light is satisfied with the requirement, if not, adjusting the current properly.
And S8, calibrating the two lasers on the other TECs in the same way as the previous step.
According to the invention, one TEC is used for controlling two paths of lasers to work according to the condition that the adjacent wavelength interval of DWDM is 0.4nm, so that the use quantity of TECs of a plurality of paths of DWDM optical modules is reduced, the material cost is reduced, the space of the optical module is saved, other reliability design spaces can be increased, and the performance of the optical module is improved. The automatic wavelength calibration method is adopted to improve the production efficiency and reduce the production cost.
What has been described above are merely some of the embodiments of the present invention. It will be apparent to those skilled in the art that various changes and modifications can be made therein without departing from the spirit and scope of the invention.
Claims (6)
1. The control method for automatic calibration of the single TEC with the two lasers in the multipath DWDM is characterized by comprising the following steps of:
s1, starting up and electrifying, sampling the resistance value of a thermistor attached to the surface of the TEC, obtaining a temperature value through calculation, calculating through a formula, accumulating the result of DAC _ T needing to be adjusted and the DAC _ T given at the previous time, converting the result into a 0-2.5V voltage signal for controlling GNA4008, adjusting the driving current of the TEC, adjusting the sampling frequency of the thermistor in cooperation with a power supply ripple smaller than 50mV, setting a proper PID (proportion integration differentiation) parameter and adjusting the sampling frequency of the thermistor to realize that the working environment temperature of the TEC surface laser is stabilized at +/-0.01 ℃, and starting the light emitting size calibration of the laser by a PC (personal computer) after the working environment temperature of the laser is stabilized;
S2, the system starts the laser to make the laser enter into working state, then the MCU controls TLC2662 to slowly increase the output of DAC current to make the current flowing through the laser slowly increase, meanwhile the MCU in the module detects the light-emitting size of the laser through PD and compares with the target value set by the light-emitting until the light-emitting size is larger than the target value plus 0.3dBm, then records the DAC value and the current value at the moment, and calibrates the light-emitting sizes of other paths of lasers by the same method;
s3, when the current value needed by the light emitting size of the laser is calibrated, the light emitting wavelength of each laser is calibrated, firstly, the optical module compares the real-time wavelength sent by the PC with the target wavelength, the setting temperature of the TEC is changed, the control temperature of the TEC is changed, thereby changing the working temperature of the laser, the light-emitting wavelength of the laser can change along with the change of the working temperature of the laser, the PC sends the real-time wavelength read from the spectrometer to the MCU in the optical module, the MCU compares the obtained real-time wavelength with the target wavelength, if the difference of the two wavelengths is larger, the temperature of the TEC is adjusted to change the change direction, if the difference of the two wavelengths is smaller, the adjustment is continued until the difference value of the two wavelengths is stabilized within a certain numerical value to be calibrated, the current TEC temperature parameter and the current of the laser are recorded, and a channel calibration completion mark is set;
S4, after reading the channel calibration completion mark by a PC machine, switching a control optical switch, switching the outgoing light of the second laser to the light input port of a spectrometer, sending a command to an optical module to start the wavelength calibration of the second laser, wherein the calibration process of the second laser is the same as that of the first laser, and finally recording the temperature of the TEC and the current of the second laser;
s5, averaging the two recorded TEC temperature values to obtain the working temperature value of the TEC, adjusting the current of the second laser after the TEC is stabilized, if the wavelength of the laser is larger than the target value, adjusting to reduce the target value, reducing the current of the laser to reduce the light-emitting wavelength of the laser, if the wavelength of the laser is smaller than the target wavelength, increasing the current of the laser to adjust the wavelength of the laser, stabilizing the light-emitting wavelength of the laser within a certain value, and setting an adjustment completion mark to inform a PC of the completion of the adjustment after the stabilization;
s6, after receiving the adjustment, the PC controls the optical switch to switch the optical path, the first path of laser is connected to the optical inlet of the spectrometer, the spectrometer tests the first path of light, the first path of light wavelength adjustment is started, the process is the same as the current adjustment wavelength of the second path, and the completion flag is set after the completion;
S7, after the two paths of current are adjusted, verifying, controlling the light-emitting and light-switching laser to output the light to the light input port of the spectrometer by the PC, and verifying whether the current light-emitting wavelength meets the requirements or not, if not, adjusting the current to correct the current;
s8, calibrating the two lasers on the other TECs is the same as the steps.
2. The method of claim 1, wherein the single TEC with two lasers auto-calibration in a multiplexed DWDM is characterized by: in the step S1, the resistance value of the thermistor with 3% o precision, which is surface-mounted on the TEC, is sampled by using 16-bit ADC.
3. The method of claim 1, wherein the single TEC with two lasers auto-calibration in a multiplexed DWDM is characterized by: the accuracy of the temperature value in the step S1 is 0.001 ℃.
4. The method of claim 1, wherein the single TEC with two lasers auto-calibration in a multiplexed DWDM is characterized by: in step S3, calibration is completed until the difference between the two wavelengths is stabilized within a certain value ± 0.003 nm.
5. The method of claim 1, wherein the single TEC with two lasers auto-calibration in a multiplexed DWDM is characterized by: the 10mA current in step S5 can adjust the wavelength to about 0.3 nm.
6. The method of claim 1, wherein the single TEC with two lasers auto-calibration in a multiplexed DWDM is characterized by: and step S5, stabilizing the wavelength of the output light of the laser within ± 0.003 nm.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115426051A (en) * | 2022-11-03 | 2022-12-02 | 国开启科量子技术(北京)有限公司 | Multi-laser performance parameter automatic calibration method and system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115426051A (en) * | 2022-11-03 | 2022-12-02 | 国开启科量子技术(北京)有限公司 | Multi-laser performance parameter automatic calibration method and system |
| CN115426051B (en) * | 2022-11-03 | 2023-03-03 | 国开启科量子技术(北京)有限公司 | Multi-laser performance parameter automatic calibration method and system |
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