CN114646356A - Metering threshold setting method, device, equipment and medium of nonmagnetic metering system - Google Patents
Metering threshold setting method, device, equipment and medium of nonmagnetic metering system Download PDFInfo
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- CN114646356A CN114646356A CN202011511388.3A CN202011511388A CN114646356A CN 114646356 A CN114646356 A CN 114646356A CN 202011511388 A CN202011511388 A CN 202011511388A CN 114646356 A CN114646356 A CN 114646356A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
- G01F1/56—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using electric or magnetic effects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F15/00—Details of, or accessories for, apparatus of groups G01F1/00 - G01F13/00 insofar as such details or appliances are not adapted to particular types of such apparatus
- G01F15/001—Means for regulating or setting the meter for a predetermined quantity
- G01F15/003—Means for regulating or setting the meter for a predetermined quantity using electromagnetic, electric or electronic means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F15/00—Details of, or accessories for, apparatus of groups G01F1/00 - G01F13/00 insofar as such details or appliances are not adapted to particular types of such apparatus
- G01F15/07—Integration to give total flow, e.g. using mechanically-operated integrating mechanism
- G01F15/075—Integration to give total flow, e.g. using mechanically-operated integrating mechanism using electrically-operated integrating means
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Abstract
The application provides a metering threshold setting method and device, equipment and medium of a nonmagnetic metering system. The nonmagnetic metering system comprises a disc, an oscillation unit and a processor, wherein the oscillation unit comprises at least two LC oscillation circuits, the processor comprises a comparator, and the method comprises the following steps: determining a reference voltage of the comparator based on a centerline voltage of an LC oscillating signal generated by the LC oscillating circuit; driving the disc to rotate for at least one circle, comparing the voltage amplitude of the LC oscillating signal which is close to the disc and is attenuated with the reference voltage of the comparator to output square waves, and determining the maximum value and the minimum value of the number of the square waves; and determining a metal area pulse number threshold value and a nonmetal area pulse number threshold value based on the square wave number maximum value and the square wave number minimum value.
Description
Technical Field
The application relates to the technical field of touch, in particular to a method, a device, equipment and a medium for setting a metering threshold of a nonmagnetic metering system.
Background
Along with the development of electronic technology, the power consumption and the cost of wireless communication technology are continuously reduced, and the metering mode of the meter is also continuously developed, from a mechanical metering mode to a plurality of electronic metering water meters: pulse accumulation type, image pickup type, and photoelectric type.
The pulse accumulating water meter is generally to sample by reed pipe or Hall element, then to convert the pulse number into water consumption in the calculator and store it in the CPU memory, and to read the data of the memory directly, and the disadvantage is that the reed pipe sampling element has short service life and is easy to damage, and the metering is easy to be inaccurate under the vibration of external magnetic field or pipeline.
The camera type water meter is characterized in that a camera is additionally arranged on a water meter display window, the defects are obvious, expensive electronic hardware is needed for analyzing images, the software processing power consumption is too large, and the overall cost is too high.
The photoelectric meter adopts the mode that the direct-reading photoelectric module is placed in a liquid seal character wheel box of the water meter, and the liquid seal character wheel box is filled with non-conductive liquid such as transformer oil, purified water or glycerin, and the like, so that the work is normal, but as time goes on, tap water can permeate to enable the photoelectric module to lose effect due to short circuit and the like.
The non-magnetic metering technology is gradually gaining favor of the smart meter market due to the characteristics of magnetic interference resistance, high metering precision, low cost and the like.
The non-magnetic meter is designed by adopting an LC oscillation principle, and when the flow in the meter flows, the disk is driven to rotate, so that the oscillation attenuation speed of an LC oscillation circuit is changed, and the small attenuation change is converted into the change of the number of square waves through a comparator. The number of square waves corresponding to different positions of a metal area and a non-metal area on the disc is different, the attenuation of the metal area is fast, and the number of the square waves is small; the non-metal area is slow in decay and more in square wave number. And comparing the square wave number with a reasonable threshold value to obtain the periodic state machine change. If the number of square waves is larger than or equal to the non-metal area threshold value, the square waves are judged to be in the non-metal area, if the number of square waves is smaller than the metal area threshold value, the square waves are judged to be in the metal area, otherwise, the square waves are judged to be in the intermediate state, and therefore the number of turns of the disc rotation is identified. Reasonable metal area and non-metal area threshold values are set, so that the rotating turns of the disc and the flow measurement accuracy can be guaranteed.
Disclosure of Invention
The embodiment of the application provides a method for setting a metering threshold of a nonmagnetic metering system, the nonmagnetic metering system comprises a disc, an oscillation unit and a processor, the oscillation unit comprises at least two LC oscillation circuits, the processor comprises a comparator, and the method comprises the following steps: determining a reference voltage of the comparator based on a centerline voltage of an LC oscillating signal generated by the LC oscillating circuit; driving the disc to rotate for at least one circle, comparing the voltage amplitude of the LC oscillating signal which is close to the disc and is attenuated with the reference voltage of the comparator to output square waves, and determining the maximum value and the minimum value of the number of the square waves; and determining a metal area pulse number threshold value and a nonmetal area pulse number threshold value based on the square wave number maximum value and the square wave number minimum value.
According to some embodiments, the metering threshold setting method further comprises: and determining the reasonability of the setting of the pulse number threshold of the metal area and the pulse number threshold of the non-metal area.
According to some embodiments, the determining the reasonableness of the setting of the metal area pulse number threshold and the nonmetal area pulse number threshold includes: determining a first quantity difference between the maximum value of the square wave number and the pulse number threshold value of the nonmetal area; determining a second quantity difference between the minimum value of the number of square waves and the threshold value of the number of pulses in the metal area; and the absolute values of the first quantity difference and the second quantity difference are within a preset range, and the metal area pulse number threshold and the nonmetal area pulse number threshold are determined to be reasonably set.
According to some embodiments, the metering threshold setting method further comprises: and when the disc rotates to reach the preset number of turns or preset time, setting the pulse number threshold value of the metal area and the pulse number threshold value of the non-metal area again.
According to some embodiments, the predetermined number of turns is 1000 turns and the predetermined time is 0.5 hours.
According to some embodiments, the determining a reference voltage of the comparator based on a centerline voltage of an LC oscillating signal generated by the LC oscillating circuit comprises: setting the reference voltage of the comparator to be 1.15 times of the central line voltage of the LC oscillating signal.
According to some embodiments, the determining the metal region pulse number threshold value and the non-metal region pulse number threshold value based on the maximum square wave number value and the minimum square wave number value comprises: determining the square wave number average value of the square wave number maximum value and the square wave number minimum value; subtracting a preset value from the square wave number average value to serve as a metal area pulse number threshold value; and adding a preset value to the square wave number average value to be used as the pulse number threshold value of the nonmetal area.
The embodiment of the application also provides a metering threshold setting device of the non-magnetic metering system, which comprises a reference voltage setting module, a disc driving module, a comparison module and a threshold setting module, wherein the reference voltage setting module determines the reference voltage of a comparator based on the central line voltage of an LC oscillating signal generated by an LC oscillating circuit; the disc driving module drives the disc to rotate for at least one circle; the comparison module compares the voltage amplitude of the LC oscillation signal which is close to the disc and is attenuated with the reference voltage of the comparator to output square waves, and determines the maximum value and the minimum value of the number of the square waves; and the threshold setting module determines a metal area pulse number threshold and a nonmetal area pulse number threshold based on the square wave number maximum value and the square wave number minimum value.
An embodiment of the present application further provides an electronic device, including a memory and one or more processors; the memory is used for storing one or more programs; when executed by the one or more processors, cause the one or more processors to perform the method as described above.
Embodiments of the present application also provide a computer-readable storage medium, on which a processor program is stored, the processor program being configured to execute the method described above.
According to the technical scheme, static correction is performed on factors such as environment and hardware difference, the threshold value is set after the static correction, the accuracy of threshold value setting can be improved, and the metering accuracy of the non-magnetic metering system can be further improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a functional block diagram of a nonmagnetic metering system according to an embodiment of the present application.
Fig. 2 is a schematic flow chart of a method for setting a metering threshold of a nonmagnetic metering system according to an embodiment of the present disclosure.
Fig. 3 is a schematic diagram of a reference voltage setting of a comparator according to an embodiment of the present application.
Fig. 4 is a second flowchart illustrating a method for setting a metering threshold of a nonmagnetic metering system according to an embodiment of the present application.
Fig. 5 is a schematic diagram of threshold rationality determination provided in an embodiment of the present application.
Fig. 6 is a third schematic flowchart of a metering threshold setting method for a nonmagnetic metering system according to an embodiment of the present application.
Fig. 7 is a functional block diagram of a metering threshold setting device of a nonmagnetic metering system according to an embodiment of the present application.
Fig. 8 is a functional block diagram of an electronic device according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
Fig. 1 is a functional block diagram of a nonmagnetic metering system according to an embodiment of the present application.
As shown in fig. 1, in the present embodiment, the nonmagnetic metering system 1000 includes a disk 300, an oscillating unit 200 (e.g., the peripheral functional module 200 of fig. 1), and a processor 100 (e.g., the MCU module 100 of fig. 1).
The peripheral functional module 200 includes a first oscillation module 210 and a second oscillation module 220. The first oscillation module 210 and the second oscillation module 220 are LC oscillation circuits. The first oscillation module 210 and the second oscillation module 220 are measurement oscillation modules.
When the fluid to be measured flows, the disc 300 is driven by the fluid to be measured to horizontally rotate, and the disc 300 comprises a metal area and a non-metal area.
Optionally, the area ratio of the metal region to the non-metal region is 1: 1, but not limited thereto. The LC oscillating circuit of the peripheral function module 200 measures the metal area and the non-metal area, and the voltage amplitude is different.
The peripheral function module 200 generates two LC oscillation signals, which are arranged at an included angle of 90 degrees with respect to the center of the disc. The first inductor L1 of the first oscillation module 210 and the second inductor L2 of the second oscillation module 220 are disposed above the disk. When the disc metal area is close to the inductor, the oscillation amplitude of the corresponding LC oscillation module is reduced rapidly, and the LC oscillation amplitude changes.
The MCU module 100 is connected with the peripheral function module 200, when a metal area and a non-metal area of the disc 300 are close to an LC oscillation circuit, the change of the amplitude of an LC oscillation signal occurs, different voltage amplitude values are generated, the positions of the metal area and the non-metal area are recorded to determine the revolution number of the disc 300, fluid flow information is calculated through the relationship between the pipe diameter and the number of turns driven by fluid based on the revolution number of the disc 300, and the flow information of the fluid to be detected is determined.
The MCU block 100 includes a comparator block 110, a pulse counting block 140, an encoder block 150, and a rotation counting block 160.
The first oscillation module 210 and the second oscillation module 220 are connected to the positive terminal of the comparator module 110, the DAC module 130 is connected to the negative terminal of the comparator module 110, the output terminal of the comparator module 110 is connected to the pulse counting module 140, and further connected to the encoder module 150, and the encoder module 150 is connected to the rotation counting module 160.
When the metal area of the disk 300 is close to the inductor, the oscillation amplitude of the corresponding LC oscillation module is attenuated more rapidly, and a change in the LC oscillation amplitude occurs. Therefore, when the metal area and the non-metal area of the disk 300 cover the LC oscillation circuit, the oscillation amplitude of the oscillation circuit changes. By detecting the oscillation amplitude of the LC oscillation signal circuit, the LC oscillation signal circuit is compared with a set voltage by the comparator module 110, and converted into a square wave pulse to be output. The pulse counting module 140 is connected to the output end of the comparator module 110, and counts according to the square wave pulse output by the comparator module 110. The encoder module 150 is connected to the pulse counting module 140, compares the number of each square wave pulse signal with the pulse number threshold, determines whether each LC oscillating circuit measures a metal area or a non-metal area of the disc, encodes the states of the first inductance of the first oscillating circuit and the second inductance of the second oscillating circuit according to the counting variation of the square wave pulses, and outputs the encoded states to the rotation counting module 160. The rotation counting module 160 records the sequence of the state combination codes of the first inductor and the second inductor and the cycle number, so as to judge the rotation angle and the direction information of the disc and measure the rotation number of the disc.
Optionally, the MCU module 100 further comprises a charging module 120, a DAC module 130, a clock module 170 and a stimulus voltage 180.
The charging module 120 is connected to the input terminals of the first oscillating module 210, the second oscillating module 220, and the third oscillating module. The charging module 120 charges the first oscillation module 210, the second oscillation module 220, and the third oscillation module 230 in an interval periodic manner. The excitation voltage 180 provides power to the charging module 120. The DAC module 130 (digital-to-analog conversion circuit) is connected to the comparator module 120, and sets a predetermined voltage. The clock module 170 provides clock signals to the encoder module 150, the pulse count module 140, and the comparator module 110.
Optionally, the peripheral function module 200 further comprises a third oscillation module 230, and the third oscillation module 230 is an alarm oscillation module for determining whether the disc position is normal.
The three LC oscillator circuits work together to further determine whether the third oscillator module 230 measures a metallic or non-metallic area of the puck 300, based on the above-described principles of operation. If the three LC oscillating circuits measure the metal area of the disc 300, indicating that a magnet is close, the MCU module 100 sends out an alarm. If the three LC oscillating circuits measure non-metal areas of the disc 300, the disc 300 falls off, and the MCU module 100 gives an alarm.
Optionally, the oscillation frequency of the LC oscillation circuit is between 100KHz and 50MHz, and the preferred frequency range is between 100KHz and 1000KHz, but not limited thereto, according to the characteristic of the LC oscillation circuit and the monitoring distance.
Optionally, the MCU module 100 further includes a communication module, and the communication module performs remote communication with the management terminal to upload the flow information of the fluid to be measured.
The non-magnetic metering system has the characteristic of low power consumption, and the overall power consumption is less than 20 uA. Further by reducing the sampling period, i.e. the time to generate a ringing, the overall power consumption can be less than 15 uA. By analogy, further may be less than 10uA, further may be less than 5uA, further may be less than 3 uA.
Fig. 2 is a schematic flow chart of a method for setting a metering threshold of a nonmagnetic metering system according to an embodiment of the present disclosure.
In S110, a reference voltage of the comparator is determined based on a center line voltage of an LC oscillation signal generated by an LC oscillation circuit of the sensor without the magnetic metering system.
During the damping oscillation process of the LC oscillation signal, the position of the reference voltage of the comparator is larger than or equal to the reference voltage of the comparator to output square waves. To eliminate the mixing of the damped oscillating tail with other channel induced voltages and other uncertain disturbances, according to some embodiments, the comparator reference voltage is floated by a certain proportion (e.g., 15%) on the centerline voltage, and as shown in fig. 3, the reference voltage of the comparator is set to be 1.15 times the centerline voltage of the LC oscillating signal.
And in S120, the disc is driven to rotate for at least one circle, the voltage amplitude of the LC oscillation signal which is close to the disc and is attenuated is compared with the reference voltage of the comparator to output square waves, and the maximum value and the minimum value of the number of the square waves are determined.
And starting a driving module, such as a warm gun air supply device, and driving the disc to rotate for one hundred circles. And comparing the voltage amplitude of the LC oscillation signal generated at fixed time and attenuated close to the disc with the reference voltage of the comparator to output square waves, and counting the square waves. There will be multiple square wave numbers per turn. And determining the maximum value and the minimum value of the square wave number of each circle. And determining the maximum value and the minimum value of the square wave number of one hundred circles.
In S130, the metal area pulse number threshold value and the nonmetal area pulse number threshold value are determined based on the maximum square wave number value and the minimum square wave number value.
According to some embodiments, the square wave number average of both the square wave number maximum value and the square wave number minimum value is determined as (max + min)/2. And subtracting a preset value from the average value of the number of the square waves, namely, taking the average-preset value as the threshold value of the number of the pulses in the metal area. And adding a preset value to the average value of the square wave number, namely averaging + the preset value, as the pulse number threshold value of the non-metal area.
According to some embodiments, the preset value may be 1, but is not limited thereto.
The technical scheme provided by the embodiment carries out static correction aiming at factors such as environment and hardware difference, and the threshold is set after the static correction, so that the accuracy of threshold setting can be improved, and the metering accuracy of a nonmagnetic metering system can be further improved.
Fig. 4 is a second flowchart illustrating a method for setting a metering threshold of a nonmagnetic metering system according to an embodiment of the present application.
In S210, a reference voltage of a comparator is determined based on a center line voltage of an LC oscillation signal generated by an LC oscillation circuit of a sensor without a magnetic metering system.
During the damping oscillation process of the LC oscillation signal, the position of the reference voltage of the comparator is larger than or equal to the reference voltage of the comparator to output square waves. To eliminate the mixing of the damped oscillation tail with other channel induced voltages and other uncertain disturbances, according to some embodiments, the comparator reference voltage floats by a certain proportion (e.g., 15%) on the centerline voltage, and the reference voltage of the comparator is set to be 1.15 times the centerline voltage of the LC oscillation signal as shown in fig. 3.
In S220, the disk is driven to rotate at least one turn, the voltage amplitude of the LC oscillating signal attenuated close to the disk is compared with the reference voltage of the comparator to output a square wave, and the maximum value and the minimum value of the number of square waves are determined.
And starting a driving module, such as a warm gun air supply device, and driving the disc to rotate for one hundred circles. And comparing the voltage amplitude of the two paths of LC oscillation signals generated at regular time, which are close to the disc and are attenuated, with the reference voltage of the comparator to output square waves, and counting the square waves. There will be multiple square wave numbers per turn. And determining the maximum value and the minimum value of the square wave number of each circle. And determining the maximum value and the minimum value of the square wave number of one hundred circles.
In S230, the metal area pulse number threshold value and the nonmetal area pulse number threshold value are determined based on the maximum square wave number value and the minimum square wave number value.
According to some embodiments, the square wave number average of both the square wave number maximum value and the square wave number minimum value is determined as (max + min)/2. And subtracting a preset value from the average value of the number of the square waves, namely, taking the average-preset value as the threshold value of the number of the pulses in the metal area. And adding a preset value to the average value of the square wave number, namely averaging + the preset value, as the pulse number threshold value of the non-metal area.
According to some embodiments, the preset value may be 1, but is not limited thereto.
In S240, the reasonableness of the setting of the metal area pulse number threshold value and the nonmetal area pulse number threshold value is determined.
And determining a first quantity difference a between the maximum value of the square wave number and the pulse number threshold value of the nonmetal area. A second quantity difference b between the minimum value of the number of square waves and the threshold value of the number of pulses of the metal area is determined, as shown in fig. 5. The absolute value of the first quantity difference a and the absolute value of the second quantity difference b are within a preset range, for example, the absolute value is less than or equal to 3, and the metal area pulse number threshold and the nonmetal area pulse number threshold are determined to be reasonably set.
The technical scheme that this embodiment provided has increased rationality inspection step, can improve the accuracy that the threshold value set up, can further improve the measurement accuracy of no magnetism measurement system.
Fig. 6 is a third schematic flowchart of a metering threshold setting method for a nonmagnetic metering system according to an embodiment of the present application.
In S310, a reference voltage of a comparator is determined based on a center line voltage of an LC oscillation signal generated by an LC oscillation circuit of a sensor without a magnetic metering system.
During the damping oscillation process of the LC oscillation signal, the position of the reference voltage of the comparator is larger than or equal to the reference voltage of the comparator to output square waves. To eliminate the mixing of the damped oscillation tail with other channel induced voltages and other uncertain disturbances, according to some embodiments, the comparator reference voltage floats by a certain proportion (e.g., 15%) on the centerline voltage, and the reference voltage of the comparator is set to be 1.15 times the centerline voltage of the LC oscillation signal as shown in fig. 3.
In S320, the disk is driven to rotate for at least one circle, the voltage amplitude of the LC oscillation signal which is close to the disk and is attenuated is compared with the reference voltage of the comparator to output square waves, and the maximum value and the minimum value of the number of the square waves are determined.
And starting a driving module, such as a warm gun air supply device, and driving the disc to rotate for one hundred circles. And comparing the voltage amplitude of the two paths of LC oscillation signals generated at regular time, which are close to the disc and are attenuated, with the reference voltage of the comparator to output square waves, and counting the square waves. There will be multiple square wave numbers per turn. And determining the maximum value and the minimum value of the square wave number of each circle. And determining the maximum value and the minimum value of the square wave number of one hundred circles.
In S330, the metal area pulse number threshold and the nonmetal area pulse number threshold are determined based on the maximum square wave number value and the minimum square wave number value.
According to some embodiments, the square wave number average of both the square wave number maximum value and the square wave number minimum value is determined as (max + min)/2. And subtracting a preset value from the average value of the number of the square waves, namely, taking the average-preset value as the threshold value of the number of the pulses in the metal area. And adding a preset value to the average value of the square wave number, namely averaging + the preset value, as the pulse number threshold value of the non-metal area.
According to some embodiments, the preset value may be 1, but is not limited thereto.
In S340, the reasonableness of the setting of the metal area pulse number threshold and the nonmetal area pulse number threshold is determined.
And determining a first quantity difference a between the maximum value of the square wave number and the pulse number threshold value of the nonmetal area. A second quantity difference b between the minimum value of the number of square waves and the threshold value of the number of pulses of the metal area is determined, as shown in fig. 5. The absolute value of the first quantity difference a and the absolute value of the second quantity difference b are within a preset range, for example, the absolute value is less than or equal to 3, and the metal area pulse number threshold and the nonmetal area pulse number threshold are determined to be reasonably set.
In S350, when the disc rotates for a preset number of turns or a preset time, the threshold of the number of pulses in the metal area and the threshold of the number of pulses in the non-metal area are set again.
According to some embodiments, the predetermined number of turns is 1000 turns and the predetermined time is 0.5 hours. The threshold is reset periodically to avoid interference induced drift.
The technical scheme that this embodiment provided, fixed number of turns and fixed cycle combine together to rectify in the further dynamic runtime, have increased the robustness of system, guarantee the measurement accuracy simultaneously, make it possess the volume production nature.
Fig. 7 is a functional block diagram of a metering threshold setting device of a nonmagnetic metering system according to an embodiment of the present application, where the device includes a reference voltage setting module 10, a disk driving module 20, a comparing module 30, and a threshold setting module 40.
The reference voltage setting module 10 determines a reference voltage of the comparator based on the center line voltage of the LC oscillation signal generated by the LC oscillation circuit. The disk drive module 20 drives the disk to rotate at least one revolution. The comparison module 30 compares the voltage amplitude of the LC oscillating signal attenuated near the disc with the reference voltage of the comparator to output a square wave, and determines the maximum value and the minimum value of the number of square waves. The threshold setting module 40 determines the metal area pulse number threshold and the nonmetal area pulse number threshold based on the square wave number maximum value and the square wave number minimum value.
Optionally, the apparatus further comprises a rationality determining module for determining the rationality of the setting of the metal area pulse number threshold and the non-metal area pulse number threshold.
Optionally, the device further comprises a timing setting module, and when the disc rotates for a preset number of turns or preset time, the metal area pulse number threshold and the non-metal area pulse number threshold are set again.
Fig. 8 is a functional block diagram of an electronic device according to an embodiment of the present disclosure.
The electronic device may include an output unit 301, an input unit 302, a processor 303, a storage 304, a communication interface 305, and a memory unit 306.
The memory 304 is provided as a non-transitory computer readable memory that can be used to store software programs, computer executable programs, and modules. When the one or more programs are executed by the one or more processors 303, the one or more processors 303 are caused to implement the methods as described above.
The memory 304 may include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function; the storage data area may store data created according to use of the electronic device, and the like. Further, the memory 304 may include high speed random access memory, and may also include non-transitory memory, such as at least one magnetic disk storage device, flash memory device, or other non-transitory solid state storage device. In some embodiments, the memory 304 may optionally include memory located remotely from the processor 303, which may be connected to the electronic device via a network.
The above embodiments are only for illustrating the technical idea of the present application, and the protection scope of the present application is not limited thereby, and any modifications made on the basis of the technical solution according to the technical idea presented in the present application fall within the protection scope of the present application.
Claims (10)
1. A metering threshold setting method of a nonmagnetic metering system, wherein the nonmagnetic metering system comprises a disc, an oscillating unit and a processor, the oscillating unit comprises at least two LC oscillating circuits, the processor comprises a comparator, and the method comprises the following steps:
determining a reference voltage of the comparator based on a centerline voltage of an LC oscillating signal generated by the LC oscillating circuit;
driving the disc to rotate for at least one circle, comparing the voltage amplitude of the LC oscillation signal which is close to the disc and is attenuated with the reference voltage of the comparator to output square waves, and determining the maximum value and the minimum value of the number of the square waves;
and determining a metal area pulse number threshold value and a non-metal area pulse number threshold value based on the square wave number maximum value and the square wave number minimum value.
2. The metering threshold setting method of claim 1, further comprising:
and determining the reasonability of the setting of the pulse number threshold of the metal area and the pulse number threshold of the non-metal area.
3. The metrology threshold setting method of claim 2, wherein said determining the rationality of the metallic and non-metallic zone pulse count threshold settings comprises:
determining a first quantity difference between the maximum value of the square wave number and the pulse number threshold value of the nonmetal area;
determining a second quantity difference between the minimum value of the number of square waves and the threshold value of the number of pulses in the metal area;
and the absolute value of the first quantity difference and the absolute value of the second quantity difference are within a preset range, and the metal area pulse number threshold and the nonmetal area pulse number threshold are determined to be reasonably set.
4. The metering threshold setting method of any one of claims 1 to 3, further comprising:
and when the disc rotates to reach the preset number of turns or the preset time, setting the pulse number threshold value of the metal area and the pulse number threshold value of the non-metal area again.
5. A metering threshold setting method as claimed in claim 1, wherein said preset number of turns is 1000 turns and said preset time is 0.5 hours.
6. The metrology threshold setting method of claim 1, wherein said determining a reference voltage of the comparator based on a centerline voltage of an LC oscillating signal generated by the LC oscillating circuit comprises:
setting the reference voltage of the comparator to be 1.15 times of the central line voltage of the LC oscillating signal.
7. The metrology threshold setting method of claim 1, wherein said determining a metallic region pulse count threshold and a non-metallic region pulse count threshold based on said square wave number maxima and square wave number minima comprises:
determining the square wave number average value of the square wave number maximum value and the square wave number minimum value;
subtracting a preset value from the square wave number average value to serve as a metal area pulse number threshold value;
and adding a preset value to the square wave number average value to be used as the pulse number threshold value of the nonmetal area.
8. A metering threshold setting device for a nonmagnetic metering system, comprising:
the reference voltage setting module is used for determining the reference voltage of the comparator based on the center line voltage of the LC oscillating signal generated by the LC oscillating circuit;
the disc driving module drives the disc to rotate for at least one circle;
the comparison module compares the voltage amplitude of the LC oscillation signal which is close to the disc and is attenuated with the reference voltage of the comparator to output square waves and determines the maximum value and the minimum value of the number of the square waves;
and the threshold setting module is used for determining the pulse number threshold of the metal area and the pulse number threshold of the nonmetal area based on the square wave number maximum value and the square wave number minimum value.
9. An electronic device, comprising:
one or more processors;
a memory for storing one or more programs;
when executed by the one or more processors, cause the one or more processors to perform the method of any one of claims 1-7.
10. A computer-readable storage medium having stored thereon a processor program for performing the method of any one of claims 1 to 7.
Priority Applications (1)
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