CN114624240A - Machine vision detection system - Google Patents
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- CN114624240A CN114624240A CN202210238194.3A CN202210238194A CN114624240A CN 114624240 A CN114624240 A CN 114624240A CN 202210238194 A CN202210238194 A CN 202210238194A CN 114624240 A CN114624240 A CN 114624240A
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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Abstract
The application provides a machine vision detection system, including machine vision detection device, computer and output terminal, machine vision detection device includes conveyer belt and imaging system, imaging system includes vertical imaging device and horizontal imaging device, wherein, vertical imaging device is used for acquireing the vertical scanning image that is detected the piece, horizontal imaging device is used for acquireing the horizontal scanning image that is detected the piece, the computer is used for discerning the defect that is detected a surface according to two kinds of image data that machine vision detection system acquireed and obtains the testing result, output terminal is used for exporting the testing result. The method and the device improve the recognition rate of the surface defects of the detected piece.
Description
Technical Field
The invention relates to the technical field of detection, in particular to a machine vision detection technology.
Background
Surface defects of the high-light mirror panel member can be classified into two major categories, one is concave-convex defects reflecting mirror surface smoothness, such as ripples, convexities, concavities, and the like; the other is a plurality of tiny defects caused by mirror surface damage, such as scratches, cracks, missed polishing, pockmarks and the like. These two main types of defects lack color characteristics and can only be identified from the change of the intensity of reflected light at different angles. The manual detection has the problems of low precision, strong subjective arbitrariness, high omission factor, high labor intensity and the like. With the research and development and popularization of new products such as luxury mirror panel members of large-scale ceramic rock plates and the like, the size of the mirror panel members is larger and larger, the quality requirement is higher and higher, and the visual detection cannot adapt to the development of related industries. The existing machine vision adopts a one-way imaging technology, and the amount of information carried by an image is insufficient, so that the surface defect detection of the high-light mirror panel component generates misjudgment and missing detection.
The machine vision detection system and device using structured light and multi-view imaging can improve the recognition rate of detection.
Disclosure of Invention
The invention aims to provide a machine vision detection system which can effectively improve the recognition rate of product surface defect detection.
The invention provides a technical scheme that:
in a first aspect, the machine vision inspection system includes a machine vision inspection device, a computer and an output terminal, the machine vision inspection device includes a conveyor belt and an imaging system, the imaging system includes a longitudinal imaging device and a transverse imaging device, wherein a scanning line of the longitudinal imaging device is perpendicular to a moving direction of the conveyor belt, a scanning line of the transverse imaging device is parallel to the moving direction of the conveyor belt, the longitudinal imaging device is used for acquiring a longitudinal scanning image of an inspected object, the transverse imaging device is used for acquiring a transverse scanning image of the inspected object, the computer is used for identifying a defect on the surface of the inspected object according to two kinds of image data acquired by the machine vision inspection device to obtain an inspection result, and the output terminal is used for outputting the inspection result.
Optionally, the longitudinal imaging device includes a longitudinal line scanning camera, a longitudinal imaging light source, and a longitudinal imaging frame, the longitudinal line scanning camera, the longitudinal imaging light source, and the longitudinal imaging frame are disposed above the conveyor belt, the longitudinal line scanning camera and the longitudinal imaging light source are mounted at a predetermined position of the longitudinal imaging frame, a scanning line of the longitudinal line scanning camera is perpendicular to a movement direction of the detected object, and a longitudinal scanning image of the detected object is acquired at a preset inclination angle.
Optionally, the transverse imaging device includes a transverse line scanning camera, a transverse imaging light source and a transverse imaging frame, the transverse line scanning camera, the transverse imaging light source and the transverse imaging frame are disposed above the conveyor belt, and the transverse line scanning camera and the transverse imaging light source are mounted at predetermined positions of the transverse imaging frame; the scanning line of the transverse line scanning camera is parallel to the movement direction of the detected piece, and a transverse scanning image of the detected piece is acquired at a preset inclination angle.
Optionally, the transverse imaging device further includes a motor and a guide rail, the motor is connected to the transverse imaging frame, the transverse imaging frame is disposed on the guide rail, and the transverse imaging frame is driven by the motor to reciprocate along the guide rail perpendicular to the moving direction of the detected object.
Optionally, the longitudinal line scanning camera in the longitudinal imaging device and the transverse line scanning camera in the transverse imaging device are one or multiple cameras working in parallel.
Optionally, the imaging light source of the longitudinal imaging device and the imaging light source of the transverse imaging device may be any one of an LED line light source, a laser structured light source, or an LED structured light source.
In a second aspect, the machine vision inspection system comprises a machine vision inspection device, a computer and an output terminal, wherein the machine vision inspection device comprises a conveyor belt and an imaging system, the conveyor belt comprises a longitudinal conveyor belt and a transverse conveyor belt, the longitudinal conveyor belt is perpendicular to the conveying direction of the transverse conveyor belt, the imaging system comprises two longitudinal imaging devices which scan and image in mutually perpendicular directions, a scanning line of each longitudinal imaging device is perpendicular to the moving direction of the conveyor belt, the two longitudinal imaging devices respectively acquire a transverse scanning image and a longitudinal scanning image of an inspected piece, the computer is used for identifying defects on the surface of the inspected piece according to two types of image data acquired by the machine vision inspection device to obtain an inspection result, and the output terminal is used for outputting the inspection result.
In a third aspect, a machine vision inspection system comprises a machine vision inspection device, a computer and an output terminal, wherein the machine vision inspection device comprises a conveyor belt and an imaging system, and the imaging system comprises a longitudinal imaging device, a transverse imaging device and a color pattern imaging device, or comprises a longitudinal imaging device and a color pattern imaging device, or comprises a transverse imaging device and a color pattern imaging device.
The machine vision detection system provided by the invention has the beneficial effects that:
the machine vision detection system comprises a conveyor belt and an imaging system, wherein the imaging system comprises a longitudinal imaging device and a transverse imaging device, the longitudinal imaging device is used for acquiring a longitudinal scanning image of a detected piece, and the transverse imaging device is used for acquiring a transverse scanning image of the detected piece. In the application, different structured light images are respectively obtained through the longitudinal imaging device and the transverse imaging device, and the complementarity of two kinds of image information can improve the recognition rate of the surface defects of the high-gloss mirror panel.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
Fig. 1 is a schematic structural diagram of a machine vision inspection apparatus according to an embodiment of the present invention;
fig. 2 is a second schematic structural diagram of a machine vision inspection apparatus according to an embodiment of the present invention;
fig. 3 is a third schematic structural diagram of a machine vision inspection system according to an embodiment of the present invention;
fig. 4 is a fourth schematic structural diagram of a machine vision inspection system according to an embodiment of the present invention.
An icon: 100-machine vision inspection device; 200-a computer; 300-an output terminal; 10-a conveyor belt; 20-longitudinal imaging means; 30-a lateral imaging device; 210-a longitudinal scanning camera; 220-longitudinal imaging light source; 310-a lateral scanning camera; 320-a lateral imaging light source; 330-a motor; 340-guide rail.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it is to be understood that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like, indicate orientations or positional relationships that are based on the orientations or positional relationships shown in the drawings, or the orientations or positional relationships that the products of the present invention conventionally put into use, or the orientations or positional relationships that the persons skilled in the art conventionally understand, are only used for convenience of describing the present invention and simplifying the description, and do not indicate or imply that the equipment or elements referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
As described in the background, the development of the surface unevenness defect detection technology for mirror-surface plate materials is becoming faster and faster. Surface irregularities of the mirror plate member material can be classified into two broad categories, one being irregularities reflecting a smooth finish of the mirror surface, such as waviness, convexity, concavity, and the like; the other is a plurality of tiny defects caused by mirror surface damage, such as scratches, cracks, missed polishing, pockmarks and the like. The common characteristic of the two main types of defects is lack of color characteristics and can only be identified from the variation of the light reflection intensity at different angles. The manual detection has the problems of low precision, strong subjective arbitrariness, high omission factor, high labor intensity and the like. With the research and development and popularization of new products such as luxury mirror panel pieces such as large ceramic rock plates and the like, the mirror panel pieces are larger and larger in size and higher in quality requirement, and the visual detection becomes a bottleneck problem influencing the development of related industries. The machine vision technology of the existing mirror surface defect detection system can not image the mirror surface and the defects thereof from different angles at the same time, and the information content of the concave-convex defects and the local micro defects of the mirror surface contained in the unidirectional image obtained based on the traditional method is less, so that the defect identification rate is lower.
In view of the above, referring to fig. 1, fig. 2, fig. 3 and fig. 4, an embodiment of the present application provides a machine vision inspection system, which includes a machine vision inspection apparatus 100, a computer 200 and an output terminal 300,
the machine vision inspection device 100 comprises a conveyor belt 10, a longitudinal imaging device 20 and a transverse imaging device 30, wherein a scanning line of the longitudinal imaging device 20 is perpendicular to the moving direction of the conveyor belt 10, a scanning line of the transverse imaging device 30 is parallel to the moving direction of the conveyor belt 10, the conveyor belt 10 is used for transporting an inspected piece, the longitudinal imaging device 20 is used for acquiring a longitudinal scanning image of the inspected piece, and the transverse imaging device 30 is used for acquiring a transverse scanning image of the inspected piece.
The computer 200 is used for identifying the defects on the surface of the detected piece according to the two image data acquired by the machine vision detection device to obtain a detection result, and the output terminal 300 is used for outputting the detection result.
In the embodiment of the present application, the longitudinal imaging device 20 and the transverse imaging device 30 respectively obtain the structured light scanning images of the detected object from different angles, and the computer 200 can more accurately identify the surface defects of the mirror plate through the multi-angle structured light scanning images, thereby providing the identification rate of the surface defects of the mirror plate.
It should be noted that, in this embodiment, the scanning line of the longitudinal imaging device 20 is perpendicular to the moving direction of the conveyor belt 10 (i.e., the moving direction of the detected object), so as to acquire a longitudinal scanning image, and the scanning line of the transverse imaging device 30 is parallel to the moving direction of the conveyor belt 10, so as to acquire a transverse scanning image, where the longitudinal scanning image and the transverse scanning image respectively represent surface information of the detected object in different directions and viewing angles. Compared with the scanning image with only one angle in the prior art, the structured light scanning images with different directions and viewing angles have the advantages that the computer 200 comprehensively analyzes the multivariate information, and the detection recognition rate is improved.
It should be noted that, it can also be other mirror surface materials to be detected the piece by the ceramic plate in this application, when being detected the piece and being the ceramic plate, machine vision detects and just indicates the defect detection of ceramic plate highlight glaze, the common defect of pottery highlight glaze includes the ripple, drip the glaze, the turn-up, the stick nail, lack the glaze, the mar, the crackle, pock et al, these defects do not have the colour characteristic, if only through the scanning image of an angle, often can't accurately discern the defect that highlight glaze exists, so need observe the discernment through the scanning image of different angles, just can guarantee the accuracy of highlight glaze discernment.
It should be noted that, in a specific application scenario, the machine vision inspection apparatus 100 may include only one of the longitudinal imaging apparatus 20 and the lateral imaging apparatus 30, or may include a plurality of the longitudinal imaging apparatuses 20 and the lateral imaging apparatuses 30, which may be set according to actual needs.
In another possible embodiment, with continued reference to fig. 1 and 2, the longitudinal imaging device 20 includes a longitudinal imaging light source 220 and a longitudinal scanning camera 210, wherein the scanning line of the longitudinal scanning camera 210 is perpendicular to the moving direction of the conveyor belt. The lateral imaging device 30 includes a lateral imaging light source 320 and a lateral scanning camera 310, and the scanning line of the lateral scanning camera 310 is parallel to the moving direction of the conveyor belt.
In the embodiment, the longitudinal imaging device 20 comprises a longitudinal imaging light source 220 and a longitudinal scanning camera 210, and the transverse imaging device 30 comprises a transverse imaging light source 320 and a transverse scanning camera 310, and mirror scanning images at different angles are respectively taken under the condition of the imaging light sources, so that the identification rate of surface defects of the mirror panel is effectively improved.
It should be noted that, in this embodiment, the longitudinal scanning camera 210 and the transverse scanning camera 310 respectively acquire scanning images at different angles under different illuminations, wherein the scanning line of the longitudinal scanning camera 210 is perpendicular to the moving direction of the conveyor belt, and the scanning line of the transverse scanning camera 310 is parallel to the moving direction of the conveyor belt. In a specific application, the scanning lines and the illumination light sources of the longitudinal scanning camera 210 and the transverse scanning camera 310 may be adjusted according to actual conditions to obtain a structured light scanning image at a specific angle, and in this embodiment, only the direction of the scanning lines is limited, and the specific scanning angles, the illumination light sources, and the positions of the longitudinal scanning camera 210 and the transverse scanning camera 310 may also be adjusted according to actual needs.
The scanning line in this embodiment refers to an imaging line for acquiring mirror surface information of the object to be detected by the scanning camera.
In another possible embodiment, the longitudinal imaging light source 220 and the transverse imaging light source 320 are LED structure light sources or laser structure light sources.
It should be noted that, in the present embodiment, the imaging light source may also be other types of structural light sources.
It should be noted that, in order to avoid the mutual interference of the light sources in the longitudinal imaging device 20 and the transverse imaging device 30, the longitudinal imaging device 20 and the transverse imaging device 30 may be disposed at a certain distance in a specific application.
In an embodiment, the longitudinal imaging device 20 further comprises a first bracket for fixing the longitudinal imaging light source 220 and the longitudinal scanning camera 210.
In an embodiment, the lateral imaging device 30 further includes a second bracket, the second bracket includes a guide rail 340 and a motor 330, the lateral imaging light source 320 and the lateral scanning camera 310 are both connected to the motor 330 and are both disposed on the guide rail 340, the guide rail 340 is perpendicular to the moving direction of the conveyor belt 10, and the motor 330 is configured to drive the lateral imaging light source 320 and the lateral scanning camera 310 to reciprocate along the guide rail 340 to obtain a lateral scanning image of the detected object.
It should be noted that, in the present embodiment, the speed, the stroke and the frequency of the movement of the lateral imaging light source 320 and the lateral scanning camera 310 can be adjusted by the controller.
Meanwhile, in this embodiment, the angle of the imaging light source and the scanning angle of the scanning camera may also be adjusted according to the actual application.
In this embodiment, the longitudinal line scanning camera in the longitudinal imaging device and the transverse line scanning camera in the transverse imaging device are one or a plurality of cameras operating in parallel.
In another possible embodiment, the machine vision inspection device 100 further comprises a color imaging device for acquiring a color scanning image of the inspected object, and the controller performs comprehensive processing and identifies surface defects of the plate member by using the mirror scanning image and the color scanning image in different directions and angles.
It should be noted that, in this embodiment, the machine vision inspection apparatus 100 may include any one or more of the longitudinal imaging apparatus 20, the transverse imaging apparatus 30 and the color imaging apparatus, and specifically, may include the longitudinal imaging apparatus 20 and the color imaging apparatus, may also include the transverse imaging apparatus 30 and the color imaging apparatus, and may also include the longitudinal imaging apparatus 20, the transverse imaging apparatus 30 and the color imaging apparatus.
In another alternative embodiment, the conveyor belt 10 includes a longitudinal conveyor belt and a transverse conveyor belt, the conveying directions of the longitudinal conveyor belt and the transverse conveyor belt are perpendicular, the imaging system includes two longitudinal imaging devices 20 for scanning and imaging in mutually perpendicular directions, and the two longitudinal imaging devices 20 respectively acquire a transverse scanning image and a longitudinal scanning image of the detected object.
Referring to fig. 3 and 4, an embodiment of the present application provides a machine vision inspection system, which includes a machine vision inspection apparatus 100.
In another possible implementation manner, the machine vision inspection system includes a computer 200 and an output terminal 300, and the computer 200 is connected to the machine vision inspection apparatus 100 and the output terminal 300.
It should be noted that, in this embodiment, the computer 200 may be a computer or a cloud server, or may be an integrated circuit chip having a capability of processing picture information. The computer 200 may be a general-purpose computer 200, and includes a Central Processing Unit (CPU) 200, a Network computer 200 (NP), and the like; the device may also be a Digital Signal computer 200 (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other Programmable logic device, a discrete Gate or transistor logic device, or a discrete hardware component.
The output terminal 300 includes, but is not limited to, an electronic device with a display function, such as a computer, a display, a tablet, or a mobile phone.
In this embodiment, scanning images of different angles of the detected object are obtained by the machine vision inspection device, and the scanning images are transmitted to the computer 200 for defect identification, so as to obtain corresponding defect identification results, and the defect identification results are displayed and issued through the output terminal 300.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (8)
1. The machine vision detection system is characterized by comprising a machine vision detection device, a computer and an output terminal, wherein the machine vision detection device comprises a conveyor belt and an imaging system, the imaging system comprises a longitudinal imaging device and a transverse imaging device, a scanning line of the longitudinal imaging device is perpendicular to the moving direction of the conveyor belt, a scanning line of the transverse imaging device is parallel to the moving direction of the conveyor belt, the longitudinal imaging device is used for acquiring a longitudinal scanning image of a detected piece, the transverse imaging device is used for acquiring a transverse scanning image of the detected piece, the computer is used for identifying the defects on the surface of the detected piece according to two kinds of image data acquired by the machine vision detection device to obtain a detection result, and the output terminal is used for outputting the detection result.
2. The machine vision inspection system of claim 1, wherein the longitudinal imaging device comprises a longitudinal line scanning camera, a longitudinal imaging light source and a longitudinal imaging frame, the longitudinal line scanning camera, the longitudinal imaging light source and the longitudinal imaging frame are arranged above the conveyor belt, the longitudinal line scanning camera and the longitudinal imaging light source are installed at a predetermined position of the longitudinal imaging frame, a scanning line of the longitudinal line scanning camera is perpendicular to a moving direction of the inspected object, and a longitudinal scanning image of the inspected object is acquired at a preset inclination angle.
3. The machine vision inspection system of claim 1, wherein the lateral imaging device includes a lateral line scan camera, a lateral imaging light source, and a lateral imaging gantry, the lateral line scan camera, the lateral imaging light source, and the lateral imaging gantry being disposed above the conveyor belt, the lateral line scan camera and the lateral imaging light source being mounted at a predetermined location on the lateral imaging gantry; the scanning line of the transverse line scanning camera is parallel to the movement direction of the detected piece, and a transverse scanning image of the detected piece is acquired at a preset inclination angle.
4. The machine vision inspection system of claim 3, wherein the lateral imaging device further comprises a motor and a guide rail, the motor is connected to the lateral imaging frame, the lateral imaging frame is disposed on the guide rail, and the lateral imaging frame is driven by the motor to reciprocate along the guide rail perpendicular to the moving direction of the inspected object.
5. The machine vision inspection system of claim 4, wherein the longitudinal line scan camera in the longitudinal imaging device and the transverse line scan camera in the transverse imaging device are one or multiple cameras operating in parallel.
6. The machine vision inspection system of claim 1, wherein the imaging light source of the longitudinal imaging device and the lateral imaging device can be any one of an LED line light source, a laser structured light source, or an LED structured light source.
7. A machine vision detection system is characterized by comprising a machine vision detection device, a computer and an output terminal, the machine vision detection device comprises a conveyor belt and an imaging system, the conveyor belt comprises a longitudinal conveyor belt and a transverse conveyor belt, the longitudinal conveyor belt and the transverse conveyor belt are vertical in conveying direction, the imaging system comprises two longitudinal imaging devices for scanning and imaging in mutually vertical directions, the scanning line of the longitudinal imaging device is vertical to the moving direction of the conveyor belt, the two longitudinal imaging devices respectively acquire a transverse scanning image and a longitudinal scanning image of the detected piece, the computer is used for identifying the defects on the surface of the detected piece according to the two image data acquired by the machine vision detection device to obtain a detection result, and the output terminal is used for outputting the detection result.
8. A machine vision detection system is characterized by comprising a machine vision detection device, a computer and an output terminal, wherein the machine vision detection device comprises a conveyor belt and an imaging system, and the imaging system comprises a longitudinal imaging device, a transverse imaging device and a color pattern imaging device, or comprises the longitudinal imaging device and the color pattern imaging device, or comprises the transverse imaging device and the color pattern imaging device.
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| CN202210238194.3A CN114624240A (en) | 2022-03-11 | 2022-03-11 | Machine vision detection system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115308218A (en) * | 2022-10-11 | 2022-11-08 | 中材节能股份有限公司 | Calcium silicate board surface defect on-line measuring system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115308218A (en) * | 2022-10-11 | 2022-11-08 | 中材节能股份有限公司 | Calcium silicate board surface defect on-line measuring system |
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