CN114544441A - Self-checking method, system, device and medium of particle counter - Google Patents
Self-checking method, system, device and medium of particle counter Download PDFInfo
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Abstract
The application discloses a self-checking method, a self-checking system, a self-checking device and a self-checking medium of a particle counter, and mainly relates to the field of particle counting. The self-checking system of the particle counter comprises a light source, a photoelectric detector, a processing circuit module, an ADC (analog to digital converter), a DAC (digital to analog converter), a processor and a counting module; the ADC is used for converting the analog quantity of the first voltage pulse signal into digital quantity; the processor is used for judging whether the particle counter is qualified according to the noise comparison result of the digital quantity and the preset noise threshold and the counting comparison result obtained by judging the counting result sent by the counting module. The self-checking system detects the noise of the particle counter through the first voltage pulse signal, and realizes self-checking of the particle counter through a circuit of the voltage detection particle counter for processing the second voltage pulse signal and a counting module.
Description
Technical Field
The present disclosure relates to particle counting, and more particularly, to a self-checking method, system, device and medium for a particle counter.
Background
The particle counter is a special instrument for measuring the particle size and distribution of air particles. During measurement, the particle counter can measure the particle size and the quantity of particles in particle fluid passing through the measurement cavity belt, particle size resolution and particle counting are based on particle scattered light signals, the scattered light signals are amplified, converted, subjected to noise reduction and the like from the output end of the photoelectric detector to form voltage pulse signals corresponding to the scattered light signals, then the voltage pulse signals are input into a comparator for comparison and enter a counting channel with the corresponding particle size for particle counting, and the particle counting depends on accurate acquisition of the particle scattered light signals and effective operation of the circuit. In the prior art, a light source such as a laser emitter is generally used for providing a light beam, although the light beam emitting direction of laser is not directly incident on the receiving surface of the photoelectric detector, the divergence angle of the light beam causes that some stray light inevitably exists before the light beam enters the optical trap even after the light beam is shaped, and the stray light incident on the surface of the photoelectric detector forms a noise signal which influences the accurate identification and counting of particles. With the use of the device, the noise signal of the device, the conversion effect of the circuit and the calibration state of the particle counter inevitably change, so before the particle counter runs each time, it is important to control the noise signal except the particle scattered light signal, and to perform self-checking of the noise reduction, amplification and counting processes after the particle scattered light signal is obtained.
The particle counter is calibrated in a regular calibration mode at present, the particle counter is not detected before being used every time, and the particle counter cannot be guaranteed to be in a normal state when being used every time.
Therefore, how to implement self-test of the particle counter is an urgent problem to be solved by those skilled in the art.
Disclosure of Invention
The application aims to provide a self-checking method, a self-checking system, a self-checking device and a self-checking medium of a particle counter, which are used for realizing self-checking of the particle counter.
In order to solve the above technical problem, the present application provides a self-checking system for a particle counter, including: the device comprises a light source, a photoelectric detector, a processing circuit module, an ADC (analog to digital converter), a DAC (digital to analog converter), a processor and a counting module;
the photoelectric detector is used for converting the received optical signal into a current signal when the light source is turned on;
the processing circuit module is connected with the photoelectric detector and used for processing the current signal to obtain a first voltage pulse signal;
the ADC is connected with the processing circuit module and is used for converting the analog quantity of the first voltage pulse signal into digital quantity;
the DAC is connected with the processor and the processing circuit module and is used for converting a circuit detection value signal sent by the processor into a second voltage pulse signal and sending the second voltage pulse signal to the processing circuit module when the light source is turned off;
the counting module is connected with the processing circuit module and used for comparing the second voltage pulse signal processed by the processing circuit module with a threshold voltage preset in the processor to obtain a voltage comparison result and counting according to the voltage comparison result;
the processor is connected with the ADC and the counting module and used for comparing the digital quantity with a preset noise threshold value to obtain a noise comparison result, receiving the counting result of the counting module, judging the counting result to obtain a counting comparison result, and judging whether the particle counter is qualified according to the noise comparison result and the counting comparison result.
Preferably, the processing circuit module comprises a transimpedance amplification circuit and a noise reduction amplification filter circuit;
the transimpedance amplification circuit is connected with the photoelectric detector and the ADC and used for amplifying and converting the current signal into a first voltage pulse signal;
and the noise reduction amplification filter circuit is connected with the DAC and the counting module and is used for reducing noise, amplifying and filtering the second voltage pulse signal converted by the DAC.
Preferably, the counting module comprises a plurality of comparators and counters correspondingly connected with the comparators;
the comparator is connected with the processing circuit module and used for receiving the second voltage pulse signal processed by the processing circuit module and comparing the second voltage pulse signal with the threshold voltage to obtain a voltage comparison result;
the counter is connected with the processor and used for counting according to the voltage comparison result and sending the counting result to the processor.
Preferably, the processor determines whether the particle counter is qualified by:
and when the digital quantity is not greater than the noise threshold value and the second voltage pulse signal processed by the processing circuit module is greater than the threshold voltage, the counting module counts the second voltage pulse signal, and the particle counter is determined to be qualified.
Preferably, the processor is further configured to store a noise threshold, set a threshold voltage, and a circuit detection value signal.
Preferably, the particle counter further comprises a display module connected with the processor for displaying the result whether the particle counter is qualified.
In order to solve the above technical problem, the present application further provides a self-checking method for a particle counter, which is applied to the self-checking system for the particle counter, and includes:
comparing the digital quantity of the first voltage pulse signal with a preset noise threshold value to obtain a noise comparison result; the digital quantity is obtained by converting the analog quantity of a first voltage pulse signal obtained by the processing circuit module according to the current signal converted by the photoelectric detector by the ADC;
receiving a counting result of the counting module, and judging the counting result to obtain a counting comparison result;
and judging whether the particle counter is qualified or not according to the noise comparison result and the counting comparison result.
In order to solve the above technical problem, the present application further provides a self-checking device for a particle counter, which is applied to a self-checking system of the particle counter, and the device includes:
the comparison module is used for comparing the digital quantity of the first voltage pulse signal with a preset noise threshold value to obtain a noise comparison result; the digital quantity is obtained by converting the analog quantity of a first voltage pulse signal obtained by the processing circuit module according to the current signal converted by the photoelectric detector by the ADC;
the receiving module is used for receiving the counting result of the counting module and judging the counting result to obtain a counting comparison result;
and the judging module is used for judging whether the particle counter is qualified or not according to the noise comparison result and the counting comparison result.
In order to solve the above technical problem, the present application further provides a self-checking device for a particle counter, including:
a memory for storing a computer program;
and the processor is used for realizing the self-checking method of the particle counter when executing the computer program.
In order to solve the above technical problem, the present application further provides a computer-readable storage medium, where a computer program is stored, and when the computer program is executed by a processor, the steps of the self-checking method for the particle counter are implemented.
The application provides a self-checking method of a particle counter, which is applied to a self-checking system of the particle counter, and the self-checking system of the particle counter comprises a light source, a photoelectric detector, a processing circuit module, an ADC (analog to digital converter), a DAC (digital to analog converter), a processor and a counting module; the ADC is used for converting the analog quantity of the first voltage pulse signal converted according to the optical signal when the light source is turned on into a digital quantity; the counting module is used for comparing the second voltage pulse signal processed by the processing circuit module with a preset threshold voltage to obtain a voltage comparison result and counting according to the voltage comparison result; the processor is used for comparing the digital quantity with a preset noise threshold value to obtain a noise comparison result, receiving the counting result of the counting module, judging the counting result to obtain a counting comparison result, and judging whether the particle counter is qualified according to the noise comparison result and the counting comparison result. The self-checking system of the particle counter detects the noise of the particle counter through the first voltage pulse signal, and realizes self-checking of the particle counter through a circuit and a counting module of the voltage detection particle counter, which process the second voltage pulse signal.
In addition, the self-checking device and the medium of the particle counter provided by the application correspond to the self-checking method of the particle counter, and the effect is the same as that of the self-checking device and the medium.
Drawings
In order to more clearly illustrate the embodiments of the present application, the drawings needed for the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained by those skilled in the art without inventive effort.
Fig. 1 is a block diagram of a self-test system for a particle counter according to the present application;
fig. 2 is a structural diagram of a self-checking apparatus of a particle counter provided in the present application;
fig. 3 is a block diagram of another self-testing apparatus of a particle counter according to the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only some embodiments of the present application, and not all embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without any creative effort belong to the protection scope of the present application.
The core of the application is to provide a self-checking method, a system, a device and a medium of a particle counter, which are used for realizing the self-checking of the particle counter.
In order that those skilled in the art will better understand the disclosure, the following detailed description will be given with reference to the accompanying drawings.
The particle counter generally comprises a light source, a light trap, an air inlet structure, an exhaust structure, a light reflector and a photoelectric detector, wherein the light source emits a light beam and is received by the light trap, part of stray light objectively existing in the light beam is incident on the surface of the photoelectric detector, a fluid to be detected containing particles, such as gas to be detected, enters from an air inlet nozzle of the air inlet structure, penetrates through the light beam and is exhausted from an exhaust nozzle of the exhaust structure, a region where the gas to be detected and the light beam overlap forms a photosensitive region, the particles scatter light in the photosensitive region, a part of the scattered light is directly incident on the receiving surface of the photoelectric detector, a part of the scattered light is incident on the receiving surface of the photoelectric detector after being collected by the light reflector, the photoelectric detector receives the light and then converts the light into a current signal of photocurrent, the output end of the photoelectric detector is connected with a processing circuit module, and the processing circuit module comprises a transimpedance amplifying circuit and a noise reduction amplifying filter circuit, the transimpedance amplification circuit is used for amplifying and converting a current signal output by the photoelectric detector to obtain a voltage pulse signal, the voltage pulse signal is subjected to noise reduction and amplification by the noise reduction and amplification filter circuit and is further amplified, and the voltage pulse signal subjected to noise reduction and amplification enters the counting module to realize particle counting. It should be noted that some of the components in the self-test system of the particle counter in the present application are components of the particle counter, such as a light source, a photodetector, a processing circuit module, and a counting module.
Fig. 1 is a structural diagram of a self-test system of a particle counter according to the present application, and the self-test system of the particle counter shown in fig. 1 is described below.
A self-test system for a particle counter, comprising: the system comprises a light source 1, a photoelectric detector 2, a processing circuit module 3, an Analog-to-Digital Converter (ADC) 4, a Digital-to-Analog Converter (DAC) 5, a counting module 6 and a processor 7; the photoelectric detector 2 is used for converting the received optical signal into a current signal when the light source 1 is turned on; the processing circuit module 3 is connected with the photoelectric detector 2 and is used for processing the current signal to obtain a first voltage pulse signal; the ADC4 is connected to the processing circuit module 3, and is configured to convert an analog quantity of the first voltage pulse signal into a digital quantity; the DAC5 is connected to the processor 7 and the processing circuit module 3, and is configured to convert a circuit detection value signal sent by the processor 7 into a second voltage pulse signal when the light source 1 is turned off, and send the second voltage pulse signal to the processing circuit module 3; the counting module 6 is connected with the processing circuit module 3 and is used for comparing the second voltage pulse signal processed by the processing circuit module 3 with a threshold voltage preset in the processor 7 to obtain a voltage comparison result and counting according to the voltage comparison result; the processor 7 is connected to the ADC4 and the counting module 6, and configured to compare the digital quantity with a preset noise threshold to obtain a noise comparison result, receive the counting result of the counting module 6, determine the counting result to obtain a counting comparison result, and determine whether the particle counter is qualified according to the noise comparison result and the counting comparison result.
In specific implementation, the light source 1 is usually a laser diode, which is not specifically limited in this embodiment, the photodetector 2 is a photon detection conversion device, and is configured to convert received light into current to form a current signal, and the photodiode, the photomultiplier tube, or the photoconductive device may be used, which is not limited in this embodiment to the type of the photodetector 2. The processor 7 has functions of storing, receiving, outputting, and analyzing data, and can, but is not limited to, store a preset noise threshold, compare a received digital quantity with the preset noise threshold, and then obtain a noise comparison result according to a preset judgment logic in the processor 7, obtain an expected count for a detected value signal of the sending circuit by combining a preset threshold voltage, and compare the count of the received counter with the expected count, and then obtain a count comparison result according to the preset judgment logic, where the processor 7 may be a central processing unit, a microprocessor, or a single chip, and the present embodiment does not limit the type of the processor 7.
In addition, the processing circuit module 3 is configured to process the current signal converted by the photodetector 2 and the second voltage pulse signal converted by the DAC5 according to the circuit detection value signal, specifically, before the particle counter performs a particle measurement operation, the light source 1 is turned on, a part of stray light of the light source 1 is received by the photodetector 2 and converted into a current signal, the processing circuit module 3 converts the current signal converted by the photodetector 2 into a first voltage pulse signal, and sends the first voltage pulse signal to the ADC4, so that the ADC4 converts an analog quantity of the first voltage pulse signal into a digital quantity and sends the digital quantity to the processor 7, and the processor 7 compares the digital quantity with a noise threshold pre-stored in the processor 7 and obtains a noise comparison result according to a preset determination logic. Since the first voltage pulse signal is obtained by the particle counter before the particle measurement operation and under the condition of turning on the light source 1, the noise value of the particle counter when no particle to be measured exists in the photosensitive region is characterized, namely the noise value caused by the stray light of the light beam of the light source 1 when the particle monitoring and counting are not performed. The judgment logic here is to indicate that the noise value represented by the first voltage pulse signal is qualified when the digital quantity of the first voltage pulse signal does not exceed the noise threshold.
The counting module 6 comprises one or more comparators and counters which are connected with the comparators in a one-to-one correspondence manner, namely the number of the counters is the same as that of the comparators, one counter is connected with one comparator, the comparator is used for receiving the second voltage pulse signal processed by the processing circuit module 3 and comparing the second voltage pulse signal with a preset threshold voltage in the comparator to obtain a comparison result, and each counter counts according to the comparison result of the connected comparator; the processor 7 is connected with each counter respectively, receives the counting result of each counter and compares the counting result with the expected counting of the counter to obtain a counting comparison result so as to judge whether the particle counter is qualified. In a specific implementation, the number of the comparators in the counting module 6 may be one, but in a general case, the counting module 6 includes at least two comparators and counters connected to the comparators, each comparator is provided with an independent threshold voltage, the threshold voltages of the comparators may be the same or different, after the counting module 6 receives a second voltage pulse signal processed by the processing circuit module 3, the second voltage pulse signal is compared with the threshold voltages of the comparators, when the second voltage pulse signal is greater than the threshold voltage of the comparator, the count value of the counter correspondingly connected to the comparator is increased by 1, and when the second voltage pulse signal is less than or equal to the threshold voltage of the comparator, the count value of the counter correspondingly connected to the comparator is not changed. For example, if the amplitude theoretical output of the second voltage pulse signal processed by the processing circuit module 3 is 0.86V, when the threshold voltage of each comparator is 0.8V or 0.85V, the count value of the counter corresponding to each comparator is actually increased by 1, when the threshold voltage of each comparator is 0.9V, the count value of the counter corresponding to each comparator is not increased, when the threshold voltages of some comparators are 0.8V and 0.9V, the count value of the counter corresponding to the comparator actually achieving the threshold voltage of 0.8V is increased by 1, and the count value of the counter corresponding to the comparator having the threshold voltage of 0.9V is not increased, which indicates that the noise reduction filtering circuit and the noise reduction counter for processing the second voltage pulse signal in the processing circuit module 3 are not increased And after the second voltage pulse signal processed by the noise reduction amplifying circuit is compared with the threshold voltage of each comparator, counting of each counter can be used for observing whether the comparator corresponding to each counter is qualified or not. When the self-checking system performs self-checking, the processor 7 may send a plurality of circuit detection value signals with different values to obtain a plurality of second voltage pulse signals processed by the processing circuit modules 3, and the counting module 6 repeats the counting process for each second voltage pulse signal processed by the processing circuit module 3.
It should be noted that, for the particle counter to be self-tested, the noise threshold is generally set according to the requirements of the precision and performance of the device, the circuit detection value signal and the threshold voltage can be set according to theoretical experiments and experience, because the output end of the transimpedance amplification circuit outputs a processing signal of the scattered light of the particles when the particle counter performs the particle detection operation, the circuit detection value signal can be set to a value corresponding to the first voltage pulse signal output at the output end of the transimpedance amplification circuit when the scattering occurs to a particle of a certain particle size according to the experience, and at this time, the threshold of the comparator is set to the threshold voltage at which the particle size can realize the particle counting in the comparator.
In addition, for the particle counter to be self-tested, the processing circuit module 3 is predetermined, for the predetermined processing circuit module 3, after the second voltage pulse signal converted from the circuit detection value signal is input into the noise reduction amplification filter circuit, the output second voltage pulse signal processed by the noise reduction amplification filter circuit has a theoretical output, that is, the circuit detection signal value has the second voltage pulse signal processed by the noise reduction amplification filter circuit with the theoretical output, according to the theoretical output of the circuit detection signal value and the preset threshold voltage of each comparator, the processor 7 can perform analysis calculation to obtain the expected count of each counter, and the processing circuit module 3 receives the second voltage pulse signal and inputs into each comparator in the counting module 6, the count of the counter corresponding to each comparator is the actual count result of the second voltage pulse signal processed by the noise reduction amplification filter circuit, the counting result received by the counting module 6 in the processor 7 is consistent with the expected counting, which indicates that the particle counter is qualified, otherwise, the particle counter is not qualified. The counting logic of the counting module 6 counts the second voltage pulse signal received by the counting module 6 and processed by the noise reduction amplification filter circuit when the second voltage pulse signal is greater than a preset threshold voltage, and does not count when the second voltage pulse signal is less than or equal to the preset threshold voltage. When the second voltage pulse signal theoretically output after the circuit detection value signal is processed by the noise reduction amplification filter circuit is greater than the preset voltage threshold, the processor 7 counts the second voltage pulse signal theoretically output to form an expected count, namely the expected count comprises the count of the signal, at this time, when the second voltage pulse signal processed by the processing circuit module 3 is greater than the preset threshold voltage, the counting module 6 counts the second voltage pulse signal, namely the count of the counting module 6 is consistent with the expected count, the particle counter is qualified, otherwise, the particle counter is unqualified, and when the processor 7 does not count the second voltage pulse signal theoretically output to form the expected count, namely the expected count does not count the signal.
The embodiment provides a self-checking system of a particle counter, which comprises a light source, a photoelectric detector, a processing circuit module, an ADC (analog to digital converter), a DAC (digital to analog converter), a processor and a counting module; the ADC is used for converting the analog quantity of the first voltage pulse signal converted according to the optical signal when the light source is turned on into a digital quantity; the counting module is used for comparing the second voltage pulse signal processed by the processing circuit module with a preset threshold voltage to obtain a voltage comparison result and counting according to the voltage comparison result; the processor is used for comparing the digital quantity with a preset noise threshold value to obtain a noise comparison result, receiving the counting result of the counting module, judging the counting result to obtain a counting comparison result, and judging whether the particle counter is qualified according to the noise comparison result and the counting comparison result. The self-checking system of the particle counter detects the noise of the particle counter through the first voltage pulse signal, and realizes the self-checking of the particle counter through a circuit and a counting module of the voltage detection particle counter, which process the second voltage pulse signal.
On the basis of the above embodiments, the present embodiment further describes the processing circuit module 3. The processing circuit module 3 comprises a transimpedance amplification circuit and a noise reduction amplification filter circuit; the transimpedance amplification circuit is connected with the photoelectric detector 2 and the ADC4 and is used for amplifying and converting the current signal into a first voltage pulse signal; the noise reduction amplification filter circuit is connected with the DAC5 and the counting module 6 and is used for carrying out noise reduction, amplification and filtering on the second voltage pulse signal converted by the DAC 5.
It is understood that the processing circuit module 3 includes, but is not limited to, a transimpedance amplifying circuit and a noise reduction amplifying and filtering circuit, and in a specific implementation, may further include other circuits for processing the first voltage pulse signal and the second voltage pulse signal, which is not described in this embodiment. The noise reduction amplification filter circuit in this embodiment is obtained by integrating a plurality of circuits, for example, noise reduction is realized by a blocking circuit or a subtraction circuit, the noise reduced second voltage pulse signal is amplified by a signal amplification circuit, and different weights are given to different signal components by a filter circuit.
In this embodiment, a structure of a processing circuit module is described in a supplementary manner, where in this embodiment, the processing circuit module includes a transimpedance amplification circuit and a noise reduction amplification filter circuit; when the particle counter does not work, the light source is turned on, the transresistance amplifying circuit converts a current signal of light source light beam stray light converted by the photoelectric detector into a first voltage pulse signal so as to be compared with a preset noise threshold value, the second voltage pulse signal is processed through the noise reduction amplifying filter circuit so as to obtain a second voltage pulse signal without noise interference to simulate the output of the particle signal, and the comparison result of the obtained second voltage pulse signal and the threshold voltage is more accurate.
In addition to the above embodiments, the present embodiment provides a supplementary description of the manner in which the processor 7 determines whether the particle counter is qualified. The processor 7 determines whether the particle counter is qualified after determining the counting result of the counter according to the determination logic, specifically, the processor 7 determines whether the particle counter is qualified by:
when the digital quantity is not greater than the noise threshold and the second voltage pulse signal processed by the processing circuit module 3 is greater than the threshold voltage, the counting module 6 counts the second voltage pulse signal, and the particle counter is determined to be qualified.
It should be noted that, since the first voltage pulse signal represents the noise value when the particle count is not performed, if the digital quantity of the first voltage pulse signal is not greater than the noise threshold, the noise value when the particle count is not performed is qualified, and at this time, the circuit for measuring the noise value, that is, the circuit for measuring the first voltage pulse signal is qualified; because the logic of the comparator in the counting module 6 is that when the second voltage pulse signal output by the noise reduction amplification filter circuit is greater than the preset threshold voltage, the counter corresponding to the comparator counts the voltage signal, that is, the count value of the counter is increased by 1, if the second voltage pulse signal processed by the processing circuit module 3 is greater than the preset threshold voltage, the counter corresponding to the comparator counts the second voltage pulse signal for one time, and the noise reduction amplification filter circuit and the counting module 6 for processing the second voltage pulse signal are considered to be qualified. Otherwise, when the digital quantity is greater than the noise threshold and the second voltage pulse signal processed by the processing circuit module 3 is less than or equal to the preset threshold voltage, and the counting module 6 does not count the second voltage pulse signal, it is determined that the particle counter is not qualified.
It will be appreciated that for a particle counter, a failure of either of the noise comparison result and the count comparison result may determine that the particle counter is not qualified.
This embodiment will supplement the description of the manner in which the processor determines whether the particle counter is qualified, so as to determine whether the particle counter is qualified.
On the basis of the above embodiment, the processor 7 in the present embodiment is also used for storing the noise threshold, setting the threshold voltage, and the circuit detection value signal.
Specifically, the user may determine the noise threshold empirically and store the resulting noise threshold in the processor 7, so that the processor 7 compares the digital quantity of the first voltage pulse signal sent by the ADC4 with the noise threshold after receiving the digital quantity. In addition, the threshold voltage and the circuit detection value signal of each comparator may be fixedly set or may be non-fixedly set, and in the non-fixedly set, the threshold voltage and the circuit detection value signal may be set by the user through the processor 7. Specifically, after receiving the threshold voltage set by the user, the processor 7 sends each threshold voltage to each comparator, so that each comparator compares the second voltage pulse signal processed by the processing circuit module 3 with the threshold voltage corresponding to each comparator after receiving the second voltage pulse signal processed by the processing circuit module 3; in addition, after receiving the circuit detection value signal set by the user, the processor 7 sends the circuit detection value signal to the DAC5, so that the processing circuit module 3 obtains a second voltage pulse signal. It should be noted that the noise threshold, the threshold voltage and the circuit detection value signal may be fixed in a preset program of the processor 7, or may be configured and acquired on the display interface through an input configuration module.
In this embodiment, the processor is further configured to store a noise threshold, set a threshold voltage, and a circuit detection value signal, and the noise threshold, the threshold voltage, and the circuit detection value signal may be changed by the processor under different detection criteria, so that the flexibility of detection is improved.
On the basis of the foregoing embodiment, the self-test system for a particle counter in this embodiment further includes a display module connected to the processor 7, and configured to display a result of whether the particle counter is qualified.
Specifically, after obtaining the noise comparison result between the digital quantity of the first voltage pulse signal and the noise threshold, the processor 7 may determine whether the first voltage pulse signal is qualified according to the noise comparison result, and send the qualified result to the display module for display. In addition, after the processor 7 obtains the counting result obtained by counting according to the voltage comparison result of the second voltage pulse signal processed by the processing circuit module 3 and the threshold voltage, the counting result is judged to obtain the counting comparison result, so as to judge whether the corresponding circuit is qualified according to the counting comparison result, and the qualified result is sent to the display module for displaying, so that the user can accurately obtain the reason of the unqualified particle counter when the particle counter is unqualified. In addition, the display module is also used for parameter setting, and a user can configure the noise threshold, the threshold voltage and the circuit detection value signal to the processor 7 through the input configuration module on the display interface of the display module.
In this embodiment, the self-test system of the particle counter may further include an alarm device connected to the processor 7 for alarming when the particle counter is not qualified. In specific implementation, the alarm device may set a corresponding alarm mode according to different failure reasons, for example, the alarm mode when the circuit for measuring the first voltage pulse signal is failed should be different from the alarm mode when the circuit for processing the second voltage pulse signal is failed, so that a user can obtain the reason why the particle counter is failed according to the alarm mode of the alarm device.
In addition, the self-test system of the particle counter may further include a switch for controlling whether the ADC4 and/or the processor 7 receives the first voltage pulse signal, or a display interface for controlling whether the ADC4 and/or the processor 7 receives the first voltage pulse signal; further, the self-test system of the particle counter may further include a switch for controlling whether the processor 7 sends the circuit detection value signal to the DAC5 or whether the DAC5 sends the second voltage pulse signal to the noise reduction large filter circuit, or may be controlled by the display interface whether the processor 7 sends the circuit detection value signal to the DAC5 or whether the DAC5 sends the second voltage pulse signal to the noise reduction large filter circuit. It should be noted that the switch may be a key switch or a relay, and the present embodiment does not limit the type of the switch.
In this embodiment, the self-checking system of the particle counter further includes a display module connected to the processor, and configured to display a result of whether the particle counter is qualified, so that a user can obtain the result of whether the particle counter is qualified.
The embodiment provides a self-checking method of a particle counter, which is applied to a self-checking system of the particle counter. The method comprises the following steps:
comparing the digital quantity of the first voltage pulse signal with a preset noise threshold value to obtain a noise comparison result;
receiving a counting result of the counting module, and judging the counting result to obtain a counting comparison result;
and judging whether the particle counter is qualified or not according to the noise comparison result and the counting comparison result.
Specifically, when the light source is turned on, no detected particle exists in the particle counter, the digital quantity of the first voltage pulse signal is obtained by converting the analog quantity of the first voltage pulse signal, which is obtained by the processing circuit module according to the current signal converted by the photoelectric detector, by the ADC, and represents a noise value when particle counting is not performed, and whether the first voltage pulse signal is qualified or not is judged by comparing the digital quantity of the first voltage pulse signal with a preset noise threshold, so as to judge whether a circuit for measuring the noise value in the particle counter is qualified or not; when the light source is turned off, counting is carried out according to the voltage comparison result of the second voltage pulse signal and the threshold voltage, the counting result is judged to obtain the counting comparison result, and whether a circuit for processing the second voltage pulse signal in the particle counter and the counting module are qualified or not is further judged according to the counting comparison result.
As can be seen, in the self-checking method of the particle counter provided by this embodiment, since the digital quantity of the first voltage pulse signal is obtained when the light source is turned on, and there is no particle to be detected in the particle counter at this time, the characteristic is a noise value when particle counting is not performed, in this way, the noise of the particle counter is detected by the first voltage pulse signal, and the self-checking of the particle counter is realized by the circuit and the counting module, which process the second voltage pulse signal by the voltage detection particle counter.
In the foregoing embodiment, a self-test system of a particle counter and a self-test method of the particle counter are described in detail, and the present application also provides an embodiment corresponding to the self-test apparatus of the particle counter. It should be noted that the present application describes the embodiments of the apparatus portion from two perspectives, one from the perspective of the function module and the other from the perspective of the hardware.
Fig. 2 is a structural diagram of a self-checking apparatus of a particle counter according to the present application. As shown in fig. 2, the apparatus includes:
the comparison module 10 is configured to compare a digital quantity of the first voltage pulse signal with a preset noise threshold to obtain a noise comparison result; the digital quantity is obtained by converting the analog quantity of a first voltage pulse signal obtained by the processing circuit module according to the current signal converted by the photoelectric detector by the ADC;
the receiving module 11 is configured to receive a counting result of the counting module, and judge the counting result to obtain a counting comparison result;
and the judging module 12 is configured to judge whether the particle counter is qualified according to the noise comparison result and the count comparison result.
Since the embodiments of the apparatus portion and the method portion correspond to each other, please refer to the description of the embodiments of the method portion for the embodiments of the apparatus portion, which is not repeated here.
In the self-checking device of the particle counter provided by this embodiment, the digital quantity of the first voltage pulse signal is compared with a preset noise threshold value by the comparison module to obtain a noise comparison result; receiving the counting result of the counting module through the receiving module, and judging the counting result to obtain a counting comparison result; and judging whether the particle counter is qualified or not through a judging module according to the noise comparison result and the counting comparison result. The self-checking device of the particle counter provided by the embodiment detects the noise of the particle counter through the first voltage pulse signal, and realizes the self-checking of the particle counter through a circuit for processing the second voltage pulse signal and a counting module of the voltage detection particle counter.
Fig. 3 is a block diagram of another self-test apparatus for a particle counter according to the present application, and as shown in fig. 3, the self-test apparatus for a particle counter includes:
a memory 20 for storing a computer program;
a processor 21 for implementing the steps of the self-test method of the particle counter as mentioned in the above embodiments when executing the computer program.
The self-checking device of the particle counter provided by this embodiment may include, but is not limited to, a single chip microcomputer embedded in the particle counter, an external smart phone, a tablet computer, a notebook computer or a desktop computer, etc.
The processor 21 may include one or more processing cores, such as a 4-core processor, an 8-core processor, and the like. The Processor 21 may be implemented in hardware using at least one of a Digital Signal Processor (DSP), a Field-Programmable Gate Array (FPGA), and a Programmable Logic Array (PLA). The processor 21 may also include a main processor and a coprocessor, where the main processor is a processor for Processing data in an awake state, and is also called a Central Processing Unit (CPU); a coprocessor is a low power processor for processing data in a standby state. In some embodiments, the processor 21 may be integrated with a Graphics Processing Unit (GPU) which is responsible for rendering and drawing the content required to be displayed on the display screen. In some embodiments, the processor 21 may further include an Artificial Intelligence (AI) processor for processing computational operations related to machine learning.
The memory 20 may include one or more computer-readable storage media, which may be non-transitory. Memory 20 may also include high speed random access memory, as well as non-volatile memory, such as one or more magnetic disk storage devices, flash memory storage devices. In this embodiment, the memory 20 is at least used for storing the following computer program 201, wherein after being loaded and executed by the processor 21, the computer program can implement the relevant steps of the self-test method for a particle counter disclosed in any of the foregoing embodiments. In addition, the resources stored in the memory 20 may also include an operating system 202, data 203, and the like, and the storage manner may be a transient storage manner or a permanent storage manner. Operating system 202 may include, among others, Windows, Unix, Linux, and the like. The data 203 may include, but is not limited to, a first voltage pulse signal and a second voltage pulse signal, etc.
In some embodiments, the self-test apparatus for particle counters may further include a display 22, an input/output interface 23, a communication interface 24, a power supply 25, and a communication bus 26.
It will be appreciated by those skilled in the art that the arrangement shown in figure 3 does not constitute a limitation of the self-test apparatus of the particle counter and may include more or fewer components than those shown.
The self-test device for the particle counter provided by the embodiment comprises the memory and the processor, and the processor can realize the self-test method for the particle counter when executing the program stored in the memory, and the effect is the same as that of the self-test method.
Finally, the application also provides a corresponding embodiment of the computer readable storage medium. The computer-readable storage medium has stored thereon a computer program which, when being executed by a processor, carries out the steps of the method of self-checking a particle counter as described in the above-mentioned method embodiments.
It is to be understood that if the method in the above embodiments is implemented in the form of software functional units and sold or used as a stand-alone product, it can be stored in a computer readable storage medium. Based on such understanding, the technical solutions of the present application may be embodied in the form of a software product, which is stored in a storage medium and executes all or part of the steps of the methods described in the embodiments of the present application, or all or part of the technical solutions. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
The computer-readable storage medium provided by this embodiment includes the above-mentioned self-test method for the particle counter, and the effects are the same as above.
The self-checking method, system, apparatus and medium for the particle counter provided by the present application are described in detail above. The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed in the embodiment corresponds to the method disclosed in the embodiment, so that the description is simple, and the relevant points can be referred to the description of the method part. It should be noted that, for those skilled in the art, it is possible to make several improvements and modifications to the present application without departing from the principle of the present application, and such improvements and modifications also fall within the scope of the claims of the present application.
It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Claims (10)
1. A self-test system for a particle counter, comprising: the device comprises a light source, a photoelectric detector, a processing circuit module, an ADC (analog to digital converter), a DAC (digital to analog converter), a processor and a counting module;
the photoelectric detector is used for converting the received optical signal into a current signal when the light source is turned on;
the processing circuit module is connected with the photoelectric detector and used for processing the current signal to obtain a first voltage pulse signal;
the ADC is connected with the processing circuit module and is used for converting the analog quantity of the first voltage pulse signal into a digital quantity;
the DAC is connected with the processor and the processing circuit module and is used for converting a circuit detection value signal sent by the processor into a second voltage pulse signal and sending the second voltage pulse signal to the processing circuit module when the light source is turned off;
the counting module is connected with the processing circuit module and is used for comparing the second voltage pulse signal processed by the processing circuit module with a threshold voltage preset in the processor to obtain a voltage comparison result and counting according to the voltage comparison result;
the processor is connected with the ADC and the counting module and used for comparing the digital quantity with a preset noise threshold value to obtain a noise comparison result, receiving the counting result of the counting module, judging the counting result to obtain a counting comparison result, and judging whether the particle counter is qualified or not according to the noise comparison result and the counting comparison result.
2. The self-test system for the particle counter according to claim 1, wherein the processing circuit module comprises a transimpedance amplification circuit and a noise reduction amplification filter circuit;
the transimpedance amplification circuit is connected with the photoelectric detector and the ADC and is used for amplifying and converting the current signal into the first voltage pulse signal;
the noise reduction amplification filter circuit is connected with the DAC and the counting module and is used for reducing noise, amplifying and filtering the second voltage pulse signal converted by the DAC.
3. The self-test system for the particle counter according to claim 1, wherein the counting module comprises a plurality of comparators and counters correspondingly connected with the comparators;
the comparator is connected with the processing circuit module and is used for receiving the second voltage pulse signal processed by the processing circuit module and comparing the second voltage pulse signal with the threshold voltage to obtain a voltage comparison result;
and the counter is connected with the processor and used for counting according to the voltage comparison result and sending the counting result to the processor.
4. The self-test system for particle counters according to claim 1, wherein the processor determines whether the particle counter is qualified by:
and when the digital quantity is not greater than the noise threshold value and the second voltage pulse signal processed by the processing circuit module is greater than the threshold voltage, the counting module counts the second voltage pulse signal, and the particle counter is determined to be qualified.
5. The self-test system for a particle counter according to claim 1, wherein the processor is further configured to store the noise threshold, set the threshold voltage, and the circuit test value signal.
6. The self-test system for particle counters according to claim 1, further comprising a display module connected to the processor for displaying the result of whether the particle counter is acceptable.
7. A self-testing method of a particle counter, which is applied to the self-testing system of the particle counter according to claim 1, the method comprising:
comparing the digital quantity of the first voltage pulse signal with a preset noise threshold value to obtain a noise comparison result; the digital quantity is obtained by converting the analog quantity of the first voltage pulse signal, which is obtained by the processing circuit module according to the current signal converted by the photoelectric detector, by the ADC;
receiving a counting result of the counting module, and judging the counting result to obtain a counting comparison result;
and judging whether the particle counter is qualified or not according to the noise comparison result and the counting comparison result.
8. A self-testing apparatus for a particle counter, applied to the self-testing system for a particle counter according to claim 1, the apparatus comprising:
the comparison module is used for comparing the digital quantity of the first voltage pulse signal with a preset noise threshold value to obtain a noise comparison result; the digital quantity is obtained by converting the analog quantity of the first voltage pulse signal, which is obtained by the processing circuit module according to the current signal converted by the photoelectric detector, by the ADC;
the receiving module is used for receiving the counting result of the counting module and judging the counting result to obtain a counting comparison result;
and the judging module is used for judging whether the particle counter is qualified or not according to the noise comparison result and the counting comparison result.
9. A self-test apparatus for a particle counter, comprising:
a memory for storing a computer program;
a processor for implementing the steps of the self-test method of a particle counter as claimed in claim 7 when executing the computer program.
10. A computer-readable storage medium, having stored thereon a computer program which, when being executed by a processor, carries out the steps of the method for self-testing of a particle counter according to claim 7.
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