CN114543668B - Measuring system and method suitable for ultra-large array plane pointing change - Google Patents
Measuring system and method suitable for ultra-large array plane pointing change Download PDFInfo
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- CN114543668B CN114543668B CN202210080159.3A CN202210080159A CN114543668B CN 114543668 B CN114543668 B CN 114543668B CN 202210080159 A CN202210080159 A CN 202210080159A CN 114543668 B CN114543668 B CN 114543668B
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
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- Length Measuring Devices By Optical Means (AREA)
Abstract
The application provides a measuring system suitable for ultra-large array surface pointing change, which comprises: the system comprises a multi-beam point laser transmitter, a two-dimensional PSD sensor assembly, a measurement control unit and an ultra-large array surface; the two-dimensional PSD sensor assembly is connected with the measurement control unit; the light beams output by the multi-beam point laser transmitters are irradiated to the two-dimensional PSD sensor assembly; a two-dimensional PSD sensor assembly is arranged on the oversized array surface; ultra-large array surface 2K x 2K. The application also provides a measuring method suitable for the ultra-large array plane pointing change. The application is based on a multi-beam point laser transmitter, and can acquire the on-orbit absolute flatness and normal direction of the ultra-large array surface to realize the direction change measurement of the ultra-large array surface.
Description
Technical Field
The application relates to the technical field of spacecraft measurement, in particular to a measurement system and method suitable for ultra-large array surface pointing change.
Background
The space thermal environment is repeatedly and alternately changed seriously, so that the on-orbit deformation of a satellite structure is extremely easy to be caused, particularly the on-orbit deformation of the ultra-large array surface of the satellite is extremely serious, and the on-orbit deformation of the ultra-large array surface of the satellite needs to be measured for analyzing and acquiring the influence of the on-orbit deformation on the pointing and imaging precision of the ultra-large array surface antenna of the satellite, and data support is provided for the on-orbit deformation inhibition and on-orbit correction.
Through retrieval, patent document CN105444669B discloses a measurement system and a measurement method for large plane pointing change, comprising a linear laser emitter, a one-dimensional PSD measuring point, a measurement controller and an information processor; the information processor is in data connection with the measurement controller, the measurement controller is in control connection with the linear laser transmitters, the one-dimensional PSD measuring points are multiple, one-dimensional PSD sensors are arranged at the one-dimensional PSD measuring points, the light output by the linear laser transmitters is transmitted to the one-dimensional PSD sensors, and the one-dimensional PSD sensors are in data connection with the measurement controller; a plurality of the one-dimensional PSD measuring points are arranged on a large plane. Meanwhile, a measuring method of the measuring system is provided. The measuring method of the application is that the linear laser is matched with the sensing technology of the one-dimensional PSD to obtain the position variation of each measuring point, and the pointing variation of the large plane is obtained by solving, so as to further adjust or compensate the large plane. The disadvantage of this prior art is that measurement of an oversized array surface cannot be achieved.
Accordingly, there is a need to develop systems and methods that are capable of measuring very large arrays.
Disclosure of Invention
Aiming at the defects in the prior art, the application aims to provide a measuring system and a measuring method suitable for the pointing change of an oversized array surface, and the measuring system and the measuring method can acquire the on-orbit absolute flatness and normal pointing of the oversized array surface based on a plurality of beam point laser transmitters so as to realize the pointing change measurement of the oversized array surface.
According to the application, a measuring system suitable for ultra-large array surface pointing change comprises: the system comprises a multi-beam point laser transmitter, a two-dimensional PSD sensor assembly, a measurement control unit and an ultra-large array surface; the two-dimensional PSD sensor assembly is connected with the measurement control unit; the light beams output by the multi-beam point laser transmitters are irradiated to the two-dimensional PSD sensor assembly; a two-dimensional PSD sensor assembly is arranged on the oversized array surface; ultra-large array surface 2K x 2K array
Preferably, the multiple spot laser emitters output multiple spot beams in the same horizontal plane, each spot beam of the multiple spot beams having the same parameters.
Preferably, the divergence angle of each beam of light beam output by the multi-beam point laser transmitter is tiny, the long-distance transmission keeps the light spot size unchanged and the energy density unchanged, and each point of light beam irradiates the central area of the corresponding two-dimensional PSD sensor component photosurface respectively.
Preferably, the two-dimensional PSD sensor assemblies are arranged in a plurality and distributed on the ultra-large array surface.
According to the measuring method suitable for the ultra-large array surface pointing change, which is provided by the application, the measuring system suitable for the ultra-large array surface pointing change is adopted for measuring the pointing change, and the measuring method comprises the following steps:
step S1: installing a measuring system suitable for the ultra-large array surface pointing change and calibrating absolute coordinates of each measuring point;
step S2: when the flatness of the ultra-large array surface changes, acquiring and calculating by using the measurement control unit, and recording the light spot position value of each two-dimensional PSD sensor component in the direction perpendicular to the ultra-large array surface;
step S3: calculating current absolute coordinates of all measuring points of the oversized array surface through the measurement control unit, wherein the deformation of the array surface causes the displacement of all the measuring points along the direction vertical to the array surface to obtain deformed space coordinates of all the measuring points;
step S4: and fitting the current space coordinates of each measuring point of the oversized array surface by using a least square method, and calculating to obtain the absolute planeness and normal direction of the oversized array surface.
PreferablyStep S1 includes step S1.1: sticking photogrammetry targets on the mounting surfaces of the two-dimensional PSD sensor assemblies of the ultra-large array surface, and obtaining absolute space position coordinates (X 1-0 ，Y 1-0 ，Z 1-0 )、(X 2-0 ，Y 2-0 ，Z 2-0 )、(X 3-0 ，Y 3-0 ，Z 3-0 )、···(X N-0 ，Y N-0 ，Z N-0 )。
Preferably, step S1 further comprises step S1.2: removing the photogrammetry targets on the oversized array surface, keeping the flatness and the space position state of the oversized array surface in the step S1.1 unchanged, installing and adjusting a plurality of beam laser transmitters and two-dimensional PSD sensor assemblies, and ensuring that the central area of the photosensitive surface of each two-dimensional PSD sensor assembly receives one beam of light beams.
Preferably, step S1 further comprises step S1.3: maintaining the flatness and the space position state of the ultra-large array surface in the step S1.2 unchanged, acquiring output signals of the two-dimensional PSD sensor assemblies by using a measurement control unit, and calculating the spot position value S of each two-dimensional PSD sensor assembly in the direction perpendicular to the ultra-large array surface 1-0 、S 2-0 、S 3-0 、···S N-0 The installation of the measuring system and the calibration of the absolute coordinates of each measuring point are completed.
Preferably, after the flatness of the oversized array surface is changed, the measurement control unit is used for collecting and calculating, and recording the spot position value S of each two-dimensional PSD sensor component in the direction perpendicular to the oversized array surface 1-1 、S 2-1 、S 3-1 、···S N- 1。
Preferably, the current absolute coordinates of each measuring point of the oversized array surface are calculated by the measurement control unit, the deformation of the array surface causes the displacement of each measuring point along the direction vertical to the array surface, the displacement parallel to the direction of the array surface is basically ignored, namely the space coordinates of each measuring point after the deformation are as follows: (X) 1-0 ，Y 1-0 ，Z 1-0 +S 1-0 -S 1-1 )、(X 2-0 ，Y 2-0 ，Z 2-0 +S 2-0 -S 2-1 )、(X 3-0 ，Y 3-0 ，Z 3-0 +S 3-0 -S 3-1 )、···(X N-0 ，Y N-0 ，Z N-0 +S N-0 -S N-1 )。
Compared with the prior art, the application has the following beneficial effects:
1. the application selects the multi-beam point laser transmitters with small beam divergence angles, outputs each beam as point laser, can keep the light spot size unchanged during long-distance transmission, keeps good energy concentration, avoids the exponential decay of the light power of line laser along with the transmission distance, and has the capability of measuring the on-orbit deformation of an oversized array surface.
2. The application makes the light power, wavelength and spot size of the multi-beam point laser the same, and the laser parameters received by the two-dimensional PSD sensor assemblies at different mounting positions are the same, so that the circuit parameters such as current-voltage conversion parameters, voltage amplification factors and the like in the circuit of each two-dimensional PSD sensor assembly can be consistent, and the two-dimensional PSD sensor assemblies at different measuring points have interchangeability; the line laser is avoided, the PSD component close to the laser receives strong light energy, small voltage amplification factor is required to be designed, the PSD component far away from the laser receives weak light energy, and large voltage amplification factor is required to be designed.
3. The application uses the two-dimensional PSD sensor component, is convenient for realizing the engineering adjustment of irradiating each beam of light beam to the photosensitive surface of the corresponding two-dimensional PSD sensor component, has the allowance in the horizontal direction, and avoids the deviation of the beam of light beam out of the photosensitive surface of the two-dimensional PSD sensor component caused by the deformation of the ultra-large array surface.
4. The application selects the point laser and the two-dimensional PSD sensor component, realizes that the light output by the laser generator is totally irradiated on the PSD photosensitive surface, and avoids that only a very small part of light of the selected line laser is irradiated on the PSD photosensitive surface and the absolute part of light is not utilized.
5. The application can not only realize the on-orbit deformation measurement capability of the ultra-large array surface, but also reduce the requirement of a measurement system on the laser light power, reduce the power consumption and the heat consumption of a laser and save satellite energy.
6. The application is based on a multi-beam point laser transmitter, can acquire the on-orbit absolute flatness and normal direction of the ultra-large array surface and realize the measurement of the direction change of the ultra-large array surface
Drawings
Other features, objects and advantages of the present application will become more apparent upon reading of the detailed description of non-limiting embodiments, given with reference to the accompanying drawings in which:
FIG. 1 is a schematic diagram of a measurement system adapted for ultra-large array face pointing changes in accordance with the present application;
FIG. 2 is a schematic layout of a measurement system for ultra-large array area pointing changes in accordance with the present application;
FIG. 3 is a schematic block diagram of a two-dimensional PSD sensor assembly of the present application.
Detailed Description
The present application will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the present application, but are not intended to limit the application in any way. It should be noted that variations and modifications could be made by those skilled in the art without departing from the inventive concept. These are all within the scope of the present application.
As shown in fig. 1, 2 and 3, the present application provides a measuring system suitable for ultra-large array plane directional changes, comprising: the system comprises a multi-beam point laser transmitter, a two-dimensional PSD sensor assembly, a measurement control unit and an ultra-large array surface; the two-dimensional PSD sensor assembly is connected with the measurement control unit; the light beams output by the multi-beam point laser transmitters are irradiated to the two-dimensional PSD sensor assembly; a two-dimensional PSD sensor assembly is arranged on the oversized array surface; ultra-large array surface 2K x 2K.
The multi-beam point laser transmitters output a plurality of point beams in the same horizontal plane, and parameters of each point beam of the plurality of point beams are the same. The light beam of each beam point output by the multi-beam point laser transmitter has tiny dispersion angle, long-distance transmission keeps the light spot size unchanged and the energy density unchanged, and each light beam of each point irradiates to the central area of the corresponding two-dimensional PSD sensor component photosurface. The two-dimensional PSD sensor assemblies are arranged in a plurality and distributed on the ultra-large array surface.
According to the measuring method suitable for the pointing change of the ultra-large array surface, the measuring system suitable for the pointing change of the ultra-large array surface is adopted to measure the pointing change, the vertical displacement measured value of each measuring point of the two-dimensional PSD sensor assembly is used, the space coordinates of each two-dimensional PSD sensor assembly are obtained by combining the initial layout size, and then the equivalent plane is fitted through the space coordinates of the measuring points of the two-dimensional PSD sensor assembly to obtain the plane degree and the plane normal, wherein the plane normal represents the plane degree and the plane normal of the ultra-large array surface and/or the plane degree and the plane normal of each subarray surface of the ultra-large array surface.
The method comprises the following steps:
step S1: and installing a measuring system suitable for the ultra-large array surface pointing change and calibrating absolute coordinates of each measuring point. Specifically comprising:
step S1.1: sticking photogrammetry targets on the mounting surfaces of the two-dimensional PSD sensor assemblies of the ultra-large array surface, and obtaining absolute space position coordinates (X 1-0 ，Y 1-0 ，Z 1-0 )、(X 2-0 ，Y 2-0 ，Z 2-0 )、(X 3-0 ，Y 3-0 ，Z 3-0 )、···(X N-0 ，Y N-0 ，Z N-0 )。
Step S1.2: removing the photogrammetry targets on the oversized array surface, keeping the flatness and the space position state of the oversized array surface in the step S1.1 unchanged, installing and adjusting a plurality of beam laser transmitters and two-dimensional PSD sensor assemblies, and ensuring that the central area of the photosensitive surface of each two-dimensional PSD sensor assembly receives one beam of light beams.
Step S1.3: maintaining the flatness and the space position state of the ultra-large array surface in the step S1.2 unchanged, acquiring output signals of the two-dimensional PSD sensor assemblies by using a measurement control unit, and calculating the spot position value S of each two-dimensional PSD sensor assembly in the direction perpendicular to the ultra-large array surface 1-0 、S 2-0 、S 3-0 、···S N-0 The installation of the measuring system and the calibration of the absolute coordinates of each measuring point are completed.
Step S2: when the planeness of the ultra-large array surface changesAfter the conversion, a measurement control unit is used for collecting and calculating, and the spot position value S of each two-dimensional PSD sensor component in the direction perpendicular to the ultra-large array surface is recorded 1-1 、S 2-1 、S 3-1 、···S N-1 。
Step S3: the current absolute coordinates of all measuring points of the ultra-large array surface are calculated through the measurement control unit, the deformation of the array surface causes the displacement of all the measuring points along the direction vertical to the array surface, the displacement parallel to the direction of the array surface is basically ignored, namely the space coordinates of all the measuring points after the deformation are as follows: (X) 1-0 ，Y 1-0 ，Z 1-0 +S 1-0 -S 1-1 )、(X 2-0 ，Y 2-0 ，Z 2-0 +S 2-0 -S 2-1 )、(X 3-0 ，Y 3-0 ，Z 3-0 +S 3-0 -S 3-1 )、···(X N-0 ，Y N-0 ，Z N-0 +S N-0 -S N-1 )。
Step S4: and fitting the current space coordinates of each measuring point of the oversized array surface by using a least square method, and calculating to obtain the absolute planeness and normal direction of the oversized array surface.
In the description of the present application, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are merely for convenience in describing the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present application.
The foregoing describes specific embodiments of the present application. It is to be understood that the application is not limited to the particular embodiments described above, and that various changes or modifications may be made by those skilled in the art within the scope of the appended claims without affecting the spirit of the application. The embodiments of the application and the features of the embodiments may be combined with each other arbitrarily without conflict.
Claims (7)
1. A measurement system for use in ultra-large array area pointing changes, comprising: the system comprises a multi-beam point laser transmitter, a two-dimensional PSD sensor assembly, a measurement control unit and an ultra-large array surface;
the multi-beam point laser transmitter is connected with the measurement control unit, and the two-dimensional PSD sensor assembly is connected with the measurement control unit;
the light beams output by the multi-beam point laser transmitters irradiate the two-dimensional PSD sensor assembly;
the two-dimensional PSD sensor assembly is arranged on the oversized array surface;
the ultra-large array surface is an array with the size of more than 2K x 2K;
the multi-beam point laser transmitters output a plurality of point beams in the same horizontal plane, and parameters of each point beam of the plurality of point beams are the same;
each beam of light beam of each beam point output by the multi-beam point laser transmitter has tiny dispersion angle, long-distance transmission keeps the light spot size unchanged and the energy density unchanged, and each beam of light of each point irradiates to the central area of the corresponding two-dimensional PSD sensor component photosurface;
the method also comprises a measuring method suitable for the ultra-large array surface pointing change, and the measuring system suitable for the ultra-large array surface pointing change is adopted for measuring the pointing change, and comprises the following steps:
step S1: installing a measuring system suitable for the ultra-large array surface pointing change and calibrating absolute coordinates of each measuring point; step by step
Step S2: when the flatness of the ultra-large array surface changes, acquiring and calculating by using the measurement control unit, and recording the light spot position value of each two-dimensional PSD sensor component in the direction perpendicular to the ultra-large array surface;
step S3: calculating current absolute coordinates of all measuring points of the oversized array surface through the measurement control unit, wherein the deformation of the array surface causes the displacement of all the measuring points along the direction vertical to the array surface to obtain deformed space coordinates of all the measuring points;
step S4: and fitting the current space coordinates of each measuring point of the oversized array surface by using a least square method, and calculating to obtain the absolute planeness and normal direction of the oversized array surface.
2. The measurement system for ultra-large array area pointing variation of claim 1, wherein the two-dimensional PSD sensor assemblies are provided in plurality and are arranged in a dispersed manner on the ultra-large array area.
3. The measurement system for a change in pointing direction of an oversized array according to claim 1, wherein step S1 comprises step S1.1: sticking photogrammetry targets on the mounting surfaces of the two-dimensional PSD sensor assemblies of the oversized array surface, and obtaining absolute space position coordinates (X 1-0 ，Y 1-0 ，Z 1-0 )、(X 2-0 ，Y 2-0 ，Z 2-0 )、(X 3-0 ，Y 3-0 ，Z 3-0 )、···(X N-0 ，Y N-0 ，Z N-0 )。
4. A measurement system for adapting to ultra-large array face pointing changes according to claim 3, wherein said step S1 further comprises step S1.2: and (3) dismantling the photogrammetry targets on the oversized array surface, keeping the flatness and the space position state of the oversized array surface in the step S1.1 unchanged, installing and adjusting the multi-beam point laser transmitters and the two-dimensional PSD sensor assemblies, and ensuring that the central area of the photosensitive surface of each two-dimensional PSD sensor assembly receives one beam of point light beams.
5. The measurement system for a change in pointing direction of an oversized array according to claim 4 wherein step S1 further comprises step S1.3: maintaining the planeness and the space position state of the ultra-large array surface in the step S1.2 unchanged, acquiring output signals of the two-dimensional PSD sensor assemblies by using the measurement control unit, and calculating the spot position value S of each two-dimensional PSD sensor assembly in the direction perpendicular to the ultra-large array surface 1-0 、S 2-0 、S 3-0 、···S N-0 The installation of the measuring system and the calibration of the absolute coordinates of each measuring point are completed.
6. The measuring system for the pointing direction change of the ultra-large array surface according to claim 5, wherein after the flatness of the ultra-large array surface is changed, the measuring control unit is used for collecting and calculating, and recording the spot position value S of each two-dimensional PSD sensor assembly in the direction perpendicular to the ultra-large array surface 1-1 、S 2-1 、S 3-1 、···S N-1 。
7. The measurement system for the pointing change of the oversized array surface according to claim 6, wherein the current absolute coordinates of each measuring point of the oversized array surface are calculated by the measurement control unit, the deformation of the array surface mainly causes the displacement of each measuring point along the direction perpendicular to the array surface, the displacement parallel to the direction of the array surface is basically ignored, namely the spatial coordinates of each measuring point after the deformation are:
(X 1-0 ，Y 1-0 ，Z 1-0 +S 1-0 -S 1-1 )、(X 2-0 ，Y 2-0 ，Z 2-0 +S 2-0 -S 2-1 )、(X 3-0 ，Y 3-0 ，Z 3-0 +S 3-0 -S 3-1 )、···(X N-0 ，Y N-0 ，Z N-0 +S N-0 -S N-1 )。
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| CN105444669A (en) * | 2015-11-30 | 2016-03-30 | 上海卫星工程研究所 | Measuring system and measuring method for large-scale plane directional variation |
| CN108801169A (en) * | 2018-06-25 | 2018-11-13 | 上海卫星工程研究所 | One-dimensional PSD sensor module suitable for the in-orbit deformation measurement of satellite structure |
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Patent Citations (5)
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| CN105043284A (en) * | 2015-08-06 | 2015-11-11 | 中国电子科技集团公司第三十八研究所 | System and method for large-scale radar antenna deformation real time measurement |
| CN105444669A (en) * | 2015-11-30 | 2016-03-30 | 上海卫星工程研究所 | Measuring system and measuring method for large-scale plane directional variation |
| CN108801169A (en) * | 2018-06-25 | 2018-11-13 | 上海卫星工程研究所 | One-dimensional PSD sensor module suitable for the in-orbit deformation measurement of satellite structure |
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