CN114527412A - Electrical contact test system - Google Patents
Electrical contact test system Download PDFInfo
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- CN114527412A CN114527412A CN202111621042.3A CN202111621042A CN114527412A CN 114527412 A CN114527412 A CN 114527412A CN 202111621042 A CN202111621042 A CN 202111621042A CN 114527412 A CN114527412 A CN 114527412A
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- contact
- power supply
- circuit
- electrical contact
- voltages
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
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- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention relates to an electrical contact test system comprising: the contact power supply circuit is electrically connected with an electric contact of the contact type electric element to be detected and is used for triggering the work of the electric element; the embedded control device is used for collecting real-time voltages of the multiple ADC channels in real time, processing the voltages and packaging the processed voltages to be sent out; the touch display device is used for displaying the test waveform and performing man-machine interaction; the digital signal input and output circuit is respectively connected with the data input end and the data output end of the embedded control device; the contact power supply circuit is provided with four groups of working circuits, each group of working circuits comprises four contacts, contact power supplies are respectively configured on the four contacts, and each contact power supply is electrically connected with the contact through a resistance voltage division circuit. The test device can be suitable for testing the contact internal resistance of the electrical elements of different types, is high in test precision and good in working reliability, and test results can be visually displayed, so that testers can conveniently judge and trace problems.
Description
Technical Field
The invention relates to the technical field of test equipment, in particular to test equipment in the field of electrical elements, and particularly relates to an electrical contact test system.
Background
In order to measure the performance of an electrical element, further realize product quality control and provide a test basis for product research and development, in the existing scheme for testing the electrical element with an electrical contact, such as a circuit breaker, on the market, sampling is basically performed through a DSP chip, but the parallel processing performance of the DSP chip is very low, so that serial time-sharing sampling can be performed, the single-channel sampling frequency is only about 1KHz, namely the sampling period is about 1ms, for a contactor test system, the critical performance of the contactor cannot be tested at all through the sampling period of 1ms, the measurement precision and the sampling frequency are insufficient, and the error of measurement data is large. Besides the above problems, the existing test scheme has the following defects: the waveform can not be displayed in real time, so that the experimenter can not judge the cause of the problem, and the existence of an isolation safety circuit is avoided, so that the reliability is poor and the problem is easy to break. And the contact state identification in the molded case circuit breaker and the universal circuit breaker can not be realized, the frequent manual confirmation and selection are needed, the detection efficiency is low, and the detection accuracy is poor. The compatibility is poor, the detection of the electrical contact of the electrical element of a machine covering the whole series of customers cannot be realized, so that a plurality of test machines are put into by the customers, the test cost is high, and the test efficiency is also influenced.
Therefore, how to provide a safe and reliable electrical contact testing system capable of realizing multiple functions of one machine is a technical problem to be solved at present.
Disclosure of Invention
The invention aims to provide an electrical contact testing system which can be suitable for testing electrical contact performances of electrical contacts of different types, including parameters such as synchronization, bounce, stable closing voltage drop and the like of the electrical contacts in the switching moment. The test precision is high, and the operational reliability is good, and the test result can audio-visual display, is convenient for the tester to carry out the judgement and the traceing back of problem.
In order to achieve the purpose, the invention adopts the technical scheme that:
the invention provides an electrical contact test system, comprising:
the contact power supply circuit is electrically connected with the electrical contact to be detected and used for triggering the operation of the electrical contact;
the embedded control device is used for acquiring real-time voltages of the multiple ADC channels in real time, processing the voltages and packaging the processed voltages to send out;
the touch display device is connected with the data serial port of the embedded control device and is used for displaying the test waveform and carrying out man-machine interaction;
the digital signal input and output circuit is respectively connected with the data input end and the data output end of the embedded control device; the contact power supply circuit is provided with four groups of working circuits, each group of working circuits comprises four contacts, contact power supplies are respectively configured on the four contacts, and each contact power supply is electrically connected with the contact through a resistance voltage division circuit.
For the above technical solution, the applicant has further optimization measures.
Optionally, the power supply of the contact is a positive and negative 36 v power supply, sixteen controllable voltage outputs are formed by a voltage output circuit formed by sixteen groups of OPA541 power amplifiers and a resistance voltage dividing circuit, and the sixteen controllable voltage outputs are respectively connected to a contact for test selection.
Optionally, the step of acquiring and processing the real-time voltages of the multiple ADC channels in real time by the embedded control device is:
and acquiring real-time voltage values of 16 ADC channels in a test system loop, processing the real-time voltage values, uploading the real-time voltage values to an upper computer or an industrial personal computer through a TCP/IP protocol or an RS485 protocol, and simultaneously completing the generation and control of two DAC modulation signals and the control of 8 digital input channels and 8 digital output channels.
Optionally, the digital signal input/output circuit includes a power supply, an on-off indicator, a digital isolation chip and a darning ton chip, and the digital isolation chip is disposed at the connection port.
Optionally, the power supply device further comprises a high-speed analog-digital-analog conversion circuit, and the output of each contact power supply circuit performs corresponding power supply work through the high-speed analog-digital conversion circuit.
Due to the application of the technical scheme, compared with the prior art, the invention has the following advantages:
the invention relates to an electrical contact test system, which flexibly sets the contact voltage and the AC/DC type in a contact power supply circuit, can ensure that the current of each contact is in the national standard range by combining a resistance bleeder circuit, can basically cover all types of contact electrical elements on the market, adopts a high-efficiency and flexible high-speed data acquisition module for an embedded control device, can meet the test requirements of any contact electrical element product, can realize the simultaneous test of four groups of products, and can finish the intelligent switching of the test modes of four groups of products and 16 contacts by arranging four contacts corresponding to a single product in each group of working circuits, thereby being convenient for customers and simplifying the maintenance cost.
In addition, the embedded control device can realize real-time test data waveform uploading and displaying, pull-in release voltage testing and simulated power grid fault testing by combining with the touch display device, which cannot be realized by a conventional test system.
Furthermore, the comprehensive test system of the application has the advantages that all circuits are electrically isolated from power supplies and signals, the working reliability of the whole system circuit is high through actual measurement, the system can still run efficiently even under the strong electromagnetic interference environment, and the working reliability and stability of the system are effectively guaranteed.
Drawings
Some specific embodiments of the invention will be described in detail hereinafter, by way of illustration and not limitation, with reference to the accompanying drawings. The same reference numbers in the drawings identify the same or similar elements or components. Those skilled in the art will appreciate that the drawings are not necessarily drawn to scale. In the drawings:
FIG. 1 is a functional block diagram of an electrical contact testing system according to one embodiment of the present invention;
FIG. 2 is a circuit diagram of a contact power circuit in an electrical contact testing system according to one embodiment of the present invention;
figure 3 is a circuit diagram of a high speed analog to digital to analog conversion circuit in an electrical contact testing system according to one embodiment of the present invention.
The reference numbers are as follows:
1. electrical contacts of the contact electrical component; 2. an embedded control device;
3. a touch display device;
4. a digital signal input/output circuit;
5. the device comprises a contact power supply circuit 51, contacts 52, a contact power supply 53, a resistance voltage division circuit 54 and a voltage output circuit;
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In addition, the technical features involved in the different embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
The present embodiment describes an electrical contact testing system, as shown in fig. 1, comprising:
the embedded control device 2 is used for acquiring real-time voltages of the multiple ADC channels in real time, processing the voltages and packaging the processed voltages to send out;
the touch display device 3 is connected with the data serial port of the embedded control device 2 and is used for displaying a test waveform and carrying out man-machine interaction;
the digital signal input and output circuit 4 is respectively connected with the data input end and the data output end of the embedded control device 2;
the contact power supply circuit 5 is electrically connected with the electrical contact 1 of the contact type electrical element to be detected and is used for triggering the operation of the electrical contact 1;
the contact power supply circuit is provided with four groups of working circuits, each group of working circuits comprises four contacts, contact power supplies are respectively configured on the four contacts, and each contact power supply is electrically connected with the contact through a resistance voltage division circuit.
Specifically, in the contact power supply circuit shown in fig. 2, the contact power supply 52 is a plus-minus 36 v power supply, and eight sets of voltage output circuits 54(OPA541 power amplifier) and resistance voltage dividing circuits 53 form sixteen controllable voltage outputs, which are then respectively connected to a contact for test selection. Therefore, the present embodiment can flexibly set the voltage and ac/dc type of the contact 51 in the contact power supply circuit 5, and the combination with the resistor divider circuit 53 can ensure that the current of each contact 51 is within the national standard range. And the embedded control device 2 can realize real-time test data waveform uploading and displaying, pull-in release voltage testing and simulated power grid fault testing by combining with the touch display device 3, which can not be realized by the prior test system.
Optionally, the step of acquiring the real-time voltages of the multiple ADC channels in real time and processing by the embedded control device 2 is: and real-time voltage values of 16 ADC channels in the loop of the test system are collected and subjected to data processing, and then are uploaded to an upper computer or an industrial personal computer through a TCP/IP protocol or an RS485 protocol, and meanwhile, the generation and control of two paths of DAC modulation signals and the control of 8 paths of digital input channels and 8 paths of digital output channels are completed. The embedded control device 2 may generally include both ARM and FPGA programming. Specifically, the method comprises two parts of sampling and communication, wherein:
the sampling part supports the realization of 8-channel synchronous AD conversion acquisition, the sampling frequency is 200Khz, and the AD digit is 16 bits; supporting 4-channel differential AD conversion acquisition, wherein the sampling frequency is 200Khz, and the AD bit number is 16 bits; the sampling input is +/-10V; 8-path simultaneous high-frequency continuous sampling can be supported for 1000 ms; and dynamic switching of multiple acquisition modes is supported.
The communication part adopts Lwip to transmit acquired data, and realizes Modbus-RS485 command transmission, DAC amplitude controllable (frequency/amplitude) transmission under algorithm control and various dynamic parameter settings. The data cache module mainly comprises an ARM extension 32M cache, and the FPGA extension two pieces of SRAM with 512K are used as high-speed data acquisition caches.
In addition, the input and output part of the embedded control device 2 has 8-way input and 8-way output which are large in DC 24V. Wherein, the output supports 24V and 0.5A power, the power supply is provided externally, and the speed of 100Khz is supported. 2 paths of DA adjustable outputs with 16 bits, and the output range is as follows: 10V, the output generates a sine wave of not less than 1Khz using a 200Khz resolution DAC.
The digital signal input and output circuit 4 comprises a power supply, an on-off indicator lamp, a digital isolation chip and a Darunton chip, wherein the digital isolation chip is arranged at the connecting port.
In a further embodiment, the electrical contact testing system further includes a high-speed analog-to-digital conversion circuit, as shown in fig. 3, and the output of the contact power supply circuit 5 performs corresponding power supply operation through the high-speed analog-to-digital conversion circuit. In particular to a high-speed analog-digital conversion circuit which mainly comprises an ADC circuit and a DAC circuit. The ADC circuit uses two AD7606 chips to form 16 channels for 3.2MHz parallel acquisition, and the DAC circuit uses 4 DAC8562 chips to form 8 channels of DAC which are responsible for the output of the contact signal of the contact power supply circuit 5.
In addition, the comprehensive test system of the embodiment performs power supply and signal electrical isolation on all circuits, the working reliability of the whole system circuit is high through actual measurement, the comprehensive test system can still run efficiently even in a strong electromagnetic interference environment, and the working reliability and stability of the system are effectively guaranteed. Specifically, the communication between the master control and peripheral chips such as DAC and Darunton tubes of the system is isolated and protected by an isolation chip (ISO7240), which is the most important isolation measure. The main control part, the DAC part and the relay part adopt three isolated power supplies, so that the interference of strong interference sources such as product coils, relay coils, field frequency converters and the like on the whole system and irreversible hardware damage are avoided. The connection wires and the communication wires led out to the outside by the system are all shielded wires, such as SMA wires and RS485 shielded wires, although the cost is slightly improved, the problems of communication interruption and board card damage caused by unknown reasons in the past are thoroughly solved.
The above embodiments are merely illustrative of the technical concept and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the content of the present invention and implement the invention, and not to limit the scope of the invention, and all equivalent changes or modifications made according to the spirit of the present invention should be covered by the scope of the present invention.
Claims (5)
1. An electrical contact testing system, comprising:
the contact power supply circuit is electrically connected with the electrical contact to be detected and used for triggering the operation of the electrical contact;
the embedded control device is used for collecting real-time voltages of the multiple ADC channels in real time, processing the voltages and packaging the processed voltages to send out;
the touch display device is connected with the data serial port of the embedded control device and is used for displaying the test waveform and carrying out man-machine interaction;
the digital signal input and output circuit is respectively connected with the data input end and the data output end of the embedded control device; the contact power supply circuit is provided with four groups of working circuits, each group of working circuits comprises four contacts, contact power supplies are respectively configured on the four contacts, and each contact power supply is electrically connected with the contact through a resistance voltage division circuit.
2. The electrical contact testing system of claim 1, wherein said contact power supply is a positive or negative 36 volt power supply, and sixteen controllable voltage outputs are formed via a voltage output circuit comprising sixteen sets of OPA541 power amplifiers and a resistive voltage divider circuit, and said sixteen controllable voltage outputs are respectively connected to a contact for testing.
3. The electrical contact testing system of claim 1, wherein the embedded control device collects real-time voltages of multiple ADC channels in real time and processes the voltages by:
and acquiring real-time voltage values of 16 ADC channels in a test system loop, processing the real-time voltage values, uploading the real-time voltage values to an upper computer or an industrial personal computer through a TCP/IP protocol or an RS485 protocol, and simultaneously completing the generation and control of two DAC modulation signals and the control of 8 digital input channels and 8 digital output channels.
4. The electrical contact testing system of claim 1, wherein the digital signal input output circuit comprises a power supply, an on-off indicator light, a digital isolation chip and a darning-ton chip, the digital isolation chip being disposed at the connection port.
5. An electrical contact testing system according to any one of claims 1 to 4, further comprising high speed analogue to digital to analogue conversion circuitry, the output of each contact power supply circuit being subjected to a corresponding power supply operation by the high speed analogue to digital to analogue conversion circuitry.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111621042.3A CN114527412A (en) | 2021-12-27 | 2021-12-27 | Electrical contact test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111621042.3A CN114527412A (en) | 2021-12-27 | 2021-12-27 | Electrical contact test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114527412A true CN114527412A (en) | 2022-05-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111621042.3A Pending CN114527412A (en) | 2021-12-27 | 2021-12-27 | Electrical contact test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114527412A (en) |
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2021
- 2021-12-27 CN CN202111621042.3A patent/CN114527412A/en active Pending
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