CN114487896A - Power supply equipment aging testing cabinet - Google Patents
Power supply equipment aging testing cabinet Download PDFInfo
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- CN114487896A CN114487896A CN202111683061.9A CN202111683061A CN114487896A CN 114487896 A CN114487896 A CN 114487896A CN 202111683061 A CN202111683061 A CN 202111683061A CN 114487896 A CN114487896 A CN 114487896A
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- 238000012360 testing method Methods 0.000 title claims abstract description 315
- 230000032683 aging Effects 0.000 title claims abstract description 66
- 238000005070 sampling Methods 0.000 claims description 61
- 238000001514 detection method Methods 0.000 claims description 21
- 230000000712 assembly Effects 0.000 claims description 9
- 238000000429 assembly Methods 0.000 claims description 9
- 238000007599 discharging Methods 0.000 claims description 9
- 230000001960 triggered effect Effects 0.000 claims description 7
- 238000012545 processing Methods 0.000 claims description 4
- 238000000034 method Methods 0.000 description 9
- 230000008569 process Effects 0.000 description 9
- 229910000967 As alloy Inorganic materials 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
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- 239000000463 material Substances 0.000 description 2
- 239000011120 plywood Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 1
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- 238000005286 illumination Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
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Abstract
The invention discloses a power supply equipment aging test cabinet, which comprises: the testing device comprises a cabinet body, a testing device and a control device, wherein the cabinet body is provided with a plurality of testing areas, and the plurality of testing areas are used for placing a plurality of power supply devices to be tested; the testing component is arranged on the cabinet body and provided with a power consumption load for consuming the electric energy of the power supply equipment to be tested, and the testing component is used for accessing the power supply equipment to be tested so as to obtain the electrical parameters of the power supply equipment to be tested and output corresponding testing information. The invention can solve the problem of poor practicability of the existing aging test equipment.
Description
Technical Field
The invention relates to the technical field of power supply testing, in particular to an aging testing cabinet for power supply equipment.
Background
Burn-in testing is an important means for quality control of electronic products. Before the electronic product leaves a factory, the electronic product is generally aged for a certain time to ensure the quality of the electronic product leaving the factory and eliminate early-stage failure products. The power supply is used as an electronic product or a component of the electronic product, the stability of the power supply directly influences the working stability of the electronic product, so that a strict aging test needs to be carried out before the power supply leaves a factory, and if the whole power supply aging process can be monitored in real time, the test result in the test process is collected in the whole process, the condition of abnormal voltage, current and temperature in the power supply aging process is alarmed in real time, and the circuit is protected, so that the real-time performance and the accuracy of the aging test can be further improved; therefore, the aging state and effect of the power supply can be more effectively reflected, and the working efficiency is improved. However, the existing power supply aging system does not acquire and process the power supply output parameters in the aging process in real time, cannot deeply and intuitively observe the power supply aging process, and is poor in real-time performance and operability.
Disclosure of Invention
The invention mainly aims to provide an aging test cabinet for power supply equipment, and aims to solve the problem that the existing aging test equipment is poor in practicability.
In order to achieve the above object, the aging test cabinet for power supply equipment provided by the present invention comprises:
the testing device comprises a cabinet body, a testing device and a control device, wherein the cabinet body is provided with a plurality of testing areas, and the plurality of testing areas are used for placing a plurality of power supply devices to be tested;
the testing component is arranged on the cabinet body and provided with a power consumption load for consuming the electric energy of the power supply equipment to be tested, and the testing component is used for accessing the power supply equipment to be tested so as to obtain the electrical parameters of the power supply equipment to be tested and output corresponding testing information.
Optionally, the number of the power consuming loads is plural;
the test assembly also comprises a test main body, a switch assembly and an electric control assembly;
the test device comprises a test main body and is characterized in that an accommodating cavity is formed in the test main body, and a test interface for connecting to power supply equipment to be tested is arranged at the bottom of the test main body;
the switch assembly set up in the holding intracavity, switch assembly's input with test interface connection, a plurality of outputs and a plurality of power consumptive load one-to-one of switch assembly are connected, switch assembly's controlled end with automatically controlled subassembly is connected, switch assembly is used for under the control of automatically controlled subassembly, communicate corresponding power consumptive load with test interface to consume the electric energy of the power supply unit output that awaits measuring.
Optionally, the test assembly further comprises:
the sampling assembly, set up in the holding intracavity, the sampling assembly with test interface connects, the output of sampling assembly with automatically controlled subassembly is connected, the sampling assembly is used for acquireing the electrical parameter when the electrical power unit that awaits measuring exports to the test sampling signal that the output corresponds.
The electric control assembly is also used for carrying out signal processing on the test sampling signal and outputting corresponding test information.
Optionally, a charging interface is further arranged at the bottom of the test main body;
the test assembly further comprises a power supply assembly, the power supply assembly is respectively connected with the electric control assembly and the charging interface, and the power supply assembly is used for supplying power to the electric control assembly and charging power supply equipment to be tested through the charging interface;
the sampling assembly is further connected with the charging interface and used for acquiring electrical parameters of the power supply equipment to be tested during charging and outputting corresponding charging sampling signals.
Optionally, the electronic control assembly is further configured to control the switch assembly to communicate with the corresponding power consumption load and the test interface according to the charging sampling signal, and control the power supply assembly to charge the power supply device to be tested through the charging interface according to the test sampling signal, so that the power supply device to be tested completes the charging and discharging tests of the preset times.
Optionally, the power consuming load is an incandescent lamp;
the sampling assembly is also connected with a plurality of output ends of the switch assembly and is also used for acquiring current values of the plurality of output ends of the switch assembly and outputting corresponding current sampling signals;
the electric control assembly is further used for outputting prompt information when the power consumption load is determined to be in a circuit break state according to the current sampling signal.
Optionally, the test assembly further comprises:
the key triggering assembly comprises a plurality of keys and is arranged on the side surface of the testing main body, the key triggering assembly is connected with the electric control assembly, and the key triggering assembly is used for outputting a corresponding triggering signal when being triggered by a user;
the electric control assembly is also used for controlling the switch assembly to connect/disconnect the corresponding power consumption load and the test interface according to the trigger signal.
Optionally, the key triggering component includes:
the automatic test key is used for outputting an automatic test signal when being triggered by a user;
the electric control assembly is also used for controlling the switch assembly to sequentially communicate different preset quantities of power consumption loads and the test interface according to the automatic test signal.
Optionally, the test assembly further comprises:
the temperature detection device is arranged at the top of the test main body and connected with the electric control assembly, and the temperature detection device is used for detecting the temperature of the power consumption load and outputting a corresponding temperature detection signal;
the electric control assembly is also used for controlling the switch assembly to connect/disconnect the corresponding power consumption load and the test interface according to the temperature detection signal.
Optionally, the number of the test assemblies is a plurality of, and a plurality of the test assemblies are sequentially arranged on the cabinet body side by side.
According to the technical scheme, the cabinet body and the test assembly are arranged, and the test assembly is provided with the power consumption load for consuming the electric energy of the power supply equipment to be tested, so that the test assembly can acquire the electric parameters of the connected power supply equipment to be tested and output corresponding test information, and a user can know the running state, the aging degree and the like of the power supply equipment to be tested through the electric parameters acquired by the test assembly. By arranging the cabinet body and the test assembly, the problem of poor practicability of the conventional aging test equipment is solved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
FIG. 1 is a schematic structural diagram of an embodiment of a power supply device aging test cabinet according to the present invention;
FIG. 2 is a functional block diagram of an embodiment of a test component in the power device burn-in test cabinet according to the present invention;
the reference numbers illustrate:
| reference numerals | Name (R) | Reference numerals | Name (R) |
| 10 | |
24 | |
| 20 | |
25 | Charging interface |
| 21 | |
26 | |
| 22 | |
27 | |
| 23 | Test interface | 28 | Temperature detection device |
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that, if directional indications (such as up, down, left, right, front, and back … …) are involved in the embodiment of the present invention, the directional indications are only used to explain the relative positional relationship between the components, the movement situation, and the like in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indications are changed accordingly.
In addition, if there is a description of "first", "second", etc. in an embodiment of the present invention, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
The invention provides an aging test cabinet for power supply equipment.
At present, if the whole power supply aging process can be monitored in real time, test results in the test process are collected in the whole process, the conditions of abnormal voltage, current and temperature in the power supply aging process are alarmed in real time, and a circuit is protected, the real-time performance and the accuracy of an aging test can be further improved; therefore, the aging state and effect of the power supply can be more effectively reflected, and the working efficiency is improved. However, the power supply aging system in the prior art does not acquire and process the power supply output parameters in the aging process in real time, cannot deeply and intuitively observe the power supply aging process, and has poor real-time performance and operability.
To solve the above problem, referring to fig. 1 and 2, in an embodiment, the power device burn-in test cabinet includes:
the testing device comprises a cabinet body 10, wherein the cabinet body 10 is provided with a plurality of testing areas, and the plurality of testing areas are used for placing a plurality of power supply devices to be tested;
the testing component 20, the testing component 20 set up in on the cabinet body 10, the testing component 20 has the power consumptive load that is used for consuming the power supply unit electrical energy that awaits measuring, the testing component 20 is used for inserting the power supply unit that awaits measuring to obtain the electrical parameter of the power supply unit that awaits measuring, and output corresponding test information.
In this embodiment, the cabinet 10 is provided with a plurality of test areas, that is, a plurality of areas for placing power devices to be tested, which may be one of the layers on the cabinet 10 divided into a plurality of test areas, or a layer on the cabinet 10 having a plurality of test areas. The testing component 20 may be disposed on the top or top layer of the cabinet 10, and the testing component 20 may be welded to the cabinet 10, or may be detachably mounted on the cabinet 10 by a fastener, a nut, or the like. The cabinet body 10 can adopt materials such as alloy to make, plywood and supporting legs can be the cavity design, make things convenient for inside to set up the electric circuit that communicates test assembly 20 and electrical power unit that awaits measuring, so, can set up the test interface 23 of electrical power unit that awaits measuring on the position that cabinet body 10 test area corresponds, walk the line through the inside of the cabinet body 10 and be connected with test interface 23 of test assembly 20 for the user is more convenient when inserting the electrical power unit that awaits measuring and testing.
The test component 20 is provided with a power consumption load, and the power consumption load can be connected with the power supply device to be tested through the test interface 23 and is used for consuming the electric energy output by the power supply device to be tested, so that the test component 20 can obtain the electrical parameters of the power supply device to be tested through the test interface 23 in real time. Specifically, the power supply device to be tested supplies power to the power consuming load through the test interface 23, and the test component 20 obtains electrical parameters of the power supply device to be tested, such as output voltage, output peak current, output power, and output total power consumption, through the test interface 23, so that a user can know the running state, the aging degree, and the like of the power supply device to be tested through the electrical parameters obtained by the test component 20. The test component 20 can directly display the corresponding electrical parameters to a user for viewing through setting a display component, and the display component can be realized by selecting an LED screen. The corresponding electrical parameters can be uploaded to the upper computer by arranging the wireless communication module or connecting the wireless communication module with the upper computer through a network cable. Further, the test component 20 can also automatically analyze the running state and the aging degree of the power supply equipment to be tested according to the acquired electrical parameters, and display the final result obtained by analysis to the user in a display component or a mode of sending the final result to the upper computer, so that the user can directly know the running state and the aging degree of the power supply equipment to be tested in real time. It can be understood that, a plurality of test assemblies 20 can also be arranged on the cabinet 10 at the same time, so that a user can access a plurality of power devices to be tested at the same time for testing, and the testing efficiency is improved.
According to the invention, by arranging the cabinet body 10 and the test component 20 and arranging the power consumption load for consuming the electric energy of the power supply equipment to be tested on the test component 20, the test component 20 can acquire the electric parameters of the accessed power supply equipment to be tested and output corresponding test information, so that a user can know the running state, the aging degree and the like of the power supply equipment to be tested through the electric parameters acquired by the test component 20. According to the aging test cabinet, the test component 20 is arranged, so that the test component 20 can acquire and process the output parameters of the accessed power supply equipment to be tested in real time, a user can deeply and intuitively observe the aging process of the power supply, the running state and the aging degree of the power supply equipment to be tested can be mastered in time, and the instantaneity and the operability of the aging test cabinet of the power supply equipment are improved. According to the invention, the cabinet body 10 and the test component 20 are integrated into an integrated test device, so that a user can conveniently and quickly carry out aging test on the power supply device to be tested, the test efficiency of the power supply device to be tested is improved, the labor cost of the test is reduced, and the convenience and the practicability of the power supply device aging test cabinet are improved.
Referring to fig. 1 and 2, in an embodiment, the number of the power consuming loads is multiple;
the testing component 20 further comprises a testing main body, a switch component 22 and an electric control component 21;
the test main body is internally provided with an accommodating cavity, and the bottom of the test main body is provided with a test interface 23 for accessing power supply equipment to be tested;
switch module 22 set up in the holding intracavity, switch module 22's input with test interface 23 connects, a plurality of outputs and a plurality of power consumptive load one-to-one of switch module 22 are connected, switch module 22's controlled end with automatically controlled subassembly 21 is connected, switch module 22 is used for under the control of automatically controlled subassembly 21, communicate corresponding power consumptive load with test interface 23 to consume the electric energy of the power supply unit output that awaits measuring.
In this embodiment, the testing component 20 includes a testing main body, a switch component 22 and an electric control component 21, a containing cavity is provided in the testing main body for containing the electric circuits of the switch component 22 and the electric control component 21, and a testing interface 23 for accessing the device under test is further provided at the bottom of the testing main body. The electronic control component 21 may be an application specific integrated circuit, a programmable logic device, a controller, a microcontroller, a microprocessor, or other electronic components for implementing control. The switch component 22 may be a switch circuit composed of a plurality of switch tubes controlled by the electronic control component 21, the switch component 22 is disposed between the test interface 23 and the power consuming load, and is used for communicating the power consuming load with the test interface 23 under the control of the electronic control component 21, so that the power supply device to be tested can supply power for the power consuming load through the test interface 23, and the sampling component 24 disposed on the test component 20 can obtain the output electrical parameters of the power supply device to be tested. Further, the number of the power consuming loads is plural, the switch assembly 22 is provided with a corresponding number of switch branches, and the electric control assembly 21 can communicate the corresponding power consuming loads and the test interface 23 by controlling the switch assembly 22, that is, the switch assembly 22 can communicate different numbers of power consuming loads under the control of the electric control assembly 21. For example, the switch component 22 may be simultaneously connected to three power consuming loads under the control of the electric control component 21, so as to obtain output electrical parameters of the power supply device to be tested under the condition of the three loads, and after the power supply device to be tested is tested under the condition of the three loads for a period of time, the electric control component 21 may control the switch component 22 to be connected to two power consuming loads again, so as to obtain output electrical parameters of the power supply device to be tested under the condition of the five loads. Therefore, the electric control component 21 can control the switch component 22 to communicate with different quantities of power consumption loads, so that output electrical parameters of the power supply equipment to be tested under different quantities of loads are obtained, a user can obtain the running state and the aging degree of the power supply equipment to be tested under different quantities of loads, the user can more comprehensively, deeply and intuitively know the running state and the aging degree of the power supply equipment to be tested, the accuracy of judging the aging degree of the power supply equipment to be tested by the user is improved, and the accuracy and the practicability of the power supply equipment aging test cabinet are improved.
Referring to fig. 1 and 2, in an embodiment, the testing assembly 20 further includes:
sampling subassembly 24 set up in the holding intracavity, sampling subassembly 24 with test interface 23 connects, sampling subassembly 24's output with automatically controlled subassembly 21 is connected, sampling subassembly 24 is used for acquireing the electrical parameter when the electrical power unit that awaits measuring exports to the test sampling signal that the output corresponds.
The electronic control component 21 is further configured to perform signal processing on the test sampling signal and output corresponding test information.
In this embodiment, the testing component 20 is further provided with a sampling component 24, a sampling end of the sampling component 24 is connected to the testing interface 23, the sampling component 24 can obtain an electrical parameter of the power supply device to be tested when outputting through the testing interface 23, and the sampling component 24 may be composed of a current detection circuit and a voltage detection circuit, and is respectively used for obtaining an output voltage and an output current of the power supply device to be tested. Specifically, the sampling component 24 can obtain the output voltage and the output current of the power supply device to be tested, and output a corresponding test sampling signal to the electronic control component 21, and the electronic control component 21 can calculate the output power and the output total power consumption of the power supply device to be tested according to the output voltage and the output current obtained by the sampling component 24. Further, the electronic control component 21 can control the switch component 22 to connect different numbers of power consuming loads, so as to obtain output voltage and output current of the power supply device to be tested under different numbers of loads, and further measure output peak voltage and output peak current of the power supply device to be tested. The electric control component 21 can determine the output voltage and the output current of the power supply equipment to be tested according to the test sampling signal output by the sampling component 24, and calculate, analyze and process the output voltage and the output current, so as to obtain data such as output peak voltage, output peak current, output power, output total power consumption and the like, and display the data to a user in a display panel, an upper computer and the like, so that the user can intuitively master the electrical parameters of the power supply equipment to be tested, and more comprehensively, deeply and intuitively know the running state and the aging degree of the power supply equipment to be tested.
Referring to fig. 1 and 2, in an embodiment, a charging interface 25 is further disposed at the bottom of the testing body;
the test component 20 further comprises a power supply component 26, the power supply component 26 is respectively connected with the electronic control component 21 and the charging interface 25, and the power supply component 26 is used for supplying power to the electronic control component 21 and charging the power supply device to be tested through the charging interface 25;
the sampling assembly 24 is further connected with the charging interface 25, and the sampling assembly 24 is further used for acquiring electrical parameters of the power supply equipment to be tested during charging and outputting corresponding charging sampling signals.
In this embodiment, the test component 20 is further provided with a power supply component 26 and a charging interface 25, the power supply component 26 is used for supplying power to the power supply device to be tested through the charging interface 25, and can also be used for supplying power to other components in the test component 20, and the power supply component 26 outputs to the power supply branch of each component and can be provided with a switch tube controlled by the electronic control component 21, so that the electronic control component 21 can control the power supply object of the power supply component 26 through the on/off of the switch tube. In addition, the sampling component 24 can also obtain the electrical parameters of the power supply device to be tested during charging, namely, the charging current, the charging voltage and the like, through the charging interface 25, and output the electrical parameters to the electronic control component 21 in the form of charging sampling signals, so that the electronic control component 21 determines the electrical parameters of the power supply device to be tested during charging, and presents the obtained data to the user through a display panel, an upper computer and the like. Further, the electronic control component 21 can also determine the battery state of the power supply device to be tested according to the electrical parameters acquired by the sampling component 24. When charging, when the battery is fully charged, if the charging input is still connected at the moment, the battery is in a trickle charging state. Trickle charging, namely charging with a tiny pulse current to ensure the true saturation of the battery, so that when the trickle is collected by the assembly, the electric control assembly 21 can judge that the power supply equipment to be tested is fully charged at the moment. It can be understood that the electronic control component 21 can directly present the trickle occurrence time, the charging current and the charging voltage of the power supply device to be tested to the user through a display panel, an upper computer and the like, and the user can judge the battery state of the power supply device to be tested. The electric control component 21 can also determine the charging time of the power supply equipment to be tested according to the trickle occurrence time, and combine the charging current and the charging voltage of the power supply equipment to be tested, so as to further determine the battery state of the power supply equipment to be tested, and present the judgment result to the user through modes such as the display panel, the upper computer and the like, so that the user can visually know the battery condition and the aging degree of the power supply equipment to be tested, and the accuracy and the practicability of the power supply equipment aging test cabinet are improved.
Referring to fig. 1 and fig. 2, in an embodiment, the electronic control assembly 21 is further configured to control the switch assembly 22 to communicate the corresponding power consuming load with the test interface 23 according to the charging sampling signal, and control the power supply assembly 26 to charge the power supply device to be tested through the charging interface 25 according to the test sampling signal, so that the power supply device to be tested completes the charging and discharging tests of the preset times.
When the test component 20 is in the normal operating mode, the user accesses the power supply device to be tested to the test interface 23, so that the discharge test can be performed, and after the discharge test of the power supply device to be tested is completed, the user exits the test interface 23 and accesses the charging interface 25 to perform the charge test while charging. Under the normal operating mode, if the power supply equipment to be tested needs to carry out a plurality of charging and discharging tests, the plugging and replacing tests need to be carried out manually.
In this embodiment, the testing component 20 further has a continuous testing mode, that is, the electric control component 21 automatically controls the power device to be tested to complete the charging and discharging tests for a preset number of times. The number of tests may be preset to a fixed number of tests in the electronic control component 21, or may be set by the user to the test component 20 through a key, a touch screen, or the like. This continuous test mode may be set as a default running mode, i.e. a continuous test mode every time a test is performed on the power supply device under test. A mode switching key may also be additionally provided on the testing component 20, the testing component 20 is in a normal mode before the user does not trigger the mode switching key, that is, only a single charging test or discharging test is performed, and after the user triggers the mode switching key, the testing component enters a continuous testing mode. Specifically, in the continuous test mode, the user can simultaneously connect the power device to be tested to the charging interface 25 and the test interface 23, and at this time, the electronic control component 21 controls the switch component 22 to disconnect all power consuming loads, and controls the power supply component 26 to charge the power device to be tested. After the electric control assembly 21 judges that the power supply equipment to be tested is charged completely according to the charging sampling signal, the electric control assembly 21 controls the power supply assembly 26 to stop charging the power supply equipment to be tested, controls the switch assembly 22 to communicate with the corresponding power consumption load, and starts a first round of test. When the electric control assembly 21 judges that the power supply equipment to be tested finishes discharging according to the test sampling signal, the switch assembly 22 is controlled to disconnect all power consuming loads, the power supply assembly 26 is controlled to recharge the power supply equipment to be tested, when the power supply equipment to be tested finishes recharging, the first round of test is considered to be finished, and at the moment, the electric control assembly 21 continues the second round of test. After the test of the preset times is repeated, the electric control assembly 21 can directly present the electric parameters acquired during the test to the user in a display panel, an upper computer and other modes, and the user judges the running state and the aging degree of the power supply equipment to be tested. Or the electric control component 21 performs processing analysis according to the electric parameters obtained by multiple tests to obtain the running state and the aging degree of the power supply equipment to be tested, and displays the obtained final result to the user through a display panel or in a mode of sending the final result to an upper computer, so that the user can visually know the running state and the aging degree of the power supply equipment to be tested. According to the invention, the power supply equipment to be tested is automatically controlled by the electric control assembly 21 to complete the charging and discharging tests for the preset times, so that the power supply equipment aging test cabinet can automatically complete the charging and discharging times for multiple times, the test efficiency of the power supply equipment to be tested is greatly improved, the labor cost is reduced, and the convenience and the practicability of the power supply equipment aging test cabinet are improved.
Referring to fig. 1 and 2, in an embodiment, the power consuming load is an incandescent lamp;
the sampling assembly 24 is further connected to a plurality of output ends of the switch assembly 22, and the sampling assembly 24 is further configured to obtain current values of the plurality of output ends of the switch assembly 22 and output corresponding current sampling signals;
the electric control component 21 is further configured to output a prompt message when the power consumption load is determined to be in an open circuit according to the current sampling signal.
In the present embodiment, the sampling assembly 24 is further connected to a plurality of output terminals of the switch assembly 22, so as to obtain current values of the plurality of output terminals of the switch assembly 22, that is, current values flowing through the corresponding power consuming loads. It can be understood that the test assembly 20 has a plurality of power consuming loads therein, and the plurality of power consuming loads are usually in an operating state, so the power consuming loads are relatively easy to be damaged or the like. When one power consuming load in the testing component 20 fails, the switching component 22 is connected to the failed power consuming load when the power supply device to be tested is tested, and at this time, due to the failure of the power consuming load, the current of the branch where the power consuming load is located is greatly different from the current under the normal condition. For example, when the branch where the power consumption load is in failure is open circuit, the sampling component 24 may not acquire current or the acquired current is very small, the electronic control component 21 may not acquire a current sampling signal of the corresponding branch, or determine that the current of the corresponding branch is very small according to the current sampling signal, determine that the power consumption load of the corresponding branch is in failure, and output prompt information to prompt a user. The electric control component 21 can remind a user that a power consuming load has a fault in the form of sound, illumination and the like through a buzzer, an LED and other devices, and can also directly display the fault type through the display component.
Further, the power consuming load in the test assembly 20 is an incandescent lamp, or other lighting fixtures, such as tungsten light bulbs, which are commonly used in life. The instantaneous power of the incandescent lamp at the starting time is much larger than that of the conventional resistive load, namely, the instantaneous power output by the power supply device to be tested is large enough to enable the incandescent lamp to be normally lightened. Therefore, the pressure test can be performed on the power supply equipment to be tested by utilizing the characteristic that the instantaneous power required by starting the bulb is large, so that whether the instantaneous power output by the power supply equipment to be tested reaches the standard or not is judged. It will be appreciated that at the instant when the switch assembly 22 is closed, a large instantaneous current will be generated due to the large instantaneous power requirement of the incandescent lamp at startup, which will change to a steady current if the incandescent lamp can be successfully lit by the power supply device under test. If the incandescent lamp is not successfully lighted by the power supply equipment to be tested, the incandescent lamp is equivalent to an open circuit after the instantaneous large current, and the current is zero or the collected current is very small. Therefore, the electric control assembly 21 can judge whether the incandescent lamp can be successfully lightened by the power supply equipment to be tested according to the instantaneous large current and the subsequent current collected by the sampling assembly 24, namely judge the pressure test result of the power supply equipment to be tested, and the electric control assembly 21 can remind a user of the pressure test result in the forms of sound, light and the like through devices such as a buzzer, an LED and the like and also can directly display the pressure test result through the display assembly. In addition, different numbers of incandescent lamps can be connected by controlling the switch assembly 22, so as to further perform different degrees of stress test on the power supply equipment to be tested. According to the invention, the sampling assembly 24 is arranged to obtain the current values of the plurality of output ends of the switch assembly 22, so that the electric control assembly 21 can timely judge whether a power consumption load has a fault or not, and a user can be timely reminded. The invention also takes the incandescent lamp as a power consumption load, and utilizes the characteristic that the incandescent lamp needs large instantaneous power for starting to realize the pressure test of the power supply equipment to be tested, thereby comprehensively judging the running state and the aging degree of the power supply equipment to be tested and improving the safety and the practicability of the power supply equipment aging test cabinet.
Referring to fig. 1 and 2, in an embodiment, the testing assembly 20 further includes:
the key triggering assembly 27 comprises a plurality of keys and is arranged on the side surface of the test main body, the key triggering assembly 27 is connected with the electronic control assembly 21, and the key triggering assembly 27 is used for outputting a corresponding triggering signal when being triggered by a user;
the electronic control component 21 is further configured to control the switch component 22 to connect/disconnect the corresponding power consuming load and the test interface 23 according to the trigger signal.
In the present embodiment, a key triggering component 27 is provided for controlling the switch component 22 to connect the corresponding power consuming load with the test interface 23. Specifically, a plurality of keys of the key triggering assembly 27 may output different triggering signals, so that the electronic control assembly 21 controls the switch assembly 22 to connect to different numbers of power consuming loads, for example, 5 keys may respectively correspond to 1, 3, 5, 7, and 9 power consuming loads connected to the control switch assembly 22. Therefore, a user can control the power supply equipment to be tested to test under the load conditions of different quantities by triggering the keys, so that the electrical parameters of the power supply equipment to be tested under the load conditions of different quantities are obtained, and the running state and the aging degree of the power supply equipment to be tested are judged more comprehensively. In addition, the key triggering component 27 can also be provided with a reset key, a mode switching key, and other keys, for example, the reset key can reset parameter display on the display panel, so that the electronic control component 21 redisplays the reset test information on the display panel, and the mode switching key can switch the test mode of the test component 20, for example, a continuous test mode. According to the invention, by arranging the key trigger assembly 27, a user can control the power supply equipment to be tested to test under the condition of different quantities of loads by triggering the keys, so that the user can more comprehensively judge the running state and the aging degree of the power supply equipment to be tested, and the test accuracy of the power supply equipment aging test cabinet is improved. The invention can also realize functions of resetting, mode switching and the like through the key triggering assembly 27, and improves the diversity and convenience of the power supply equipment aging test cabinet.
Referring to fig. 1 and 2, in an embodiment, the key triggering component 27 further includes:
the automatic test key is used for outputting an automatic test signal when being triggered by a user;
the electric control assembly 21 is further configured to control the switch assembly 22 to sequentially communicate different preset amounts of power consuming loads and the test interface 23 according to the automatic test signal.
In this embodiment, the key triggering component 27 is further provided with an automatic test key, and when the automatic test key is triggered by a user, the test component 20 enters an automatic test mode, that is, the electronic control component 21 controls the switch component 22 to sequentially connect different power consuming loads with different preset quantities. For example, after the test component 20 enters the automatic test mode, the electronic control component 21 controls the switch component 22 to communicate with 1 power consumption load to test the power supply device to be tested, after the power supply device to be tested is tested for 5 minutes, the electronic control component 21 controls the switch component 22 to communicate with 3 power consumption loads to test the power supply device to be tested, and after the power supply device to be tested is tested for 5 minutes again, the electronic control component 21 controls the switch component 22 to communicate with 5 power consumption loads to continue testing the power supply device to be tested. Therefore, after a certain test time interval, the electric control assembly 21 controls the switch assembly 22 to communicate with the next preset number of power consuming loads, so that the automatic replacement of the number of the power consuming loads connected to the power supply equipment to be tested is realized. According to the invention, the automatic test key is arranged in the key trigger component 27, so that the automatic replacement of the power consumption load access quantity of the power supply equipment to be tested is realized, the running state and the aging degree of the power supply equipment to be tested can be more comprehensively judged according to the acquired electrical parameters, the test efficiency is improved, the labor cost is reduced, and the practicability of the power supply equipment aging test cabinet is improved.
Referring to fig. 1 and 2, in an embodiment, the testing assembly 20 further includes:
the temperature detection device 28 is arranged at the top of the test main body, the temperature detection device 28 is connected with the electric control assembly 21, and the temperature detection device 28 is used for detecting the temperature of the power consumption load and outputting a corresponding temperature detection signal;
the electronic control assembly 21 is further configured to control the switch assembly 22 to connect/disconnect a corresponding power consumption load and the test interface 23 according to the temperature detection signal.
In this embodiment, the testing component 20 is further provided with a temperature detecting device 28, the temperature detecting device 28 may be a temperature sensor, etc., and the temperature detecting device 28 can obtain the power consumption load and the ambient temperature around the power consumption load, so that the electronic control component 21 can determine the temperature conditions of the power consumption load and the environment of the testing component 20 according to the temperature detection signal output by the temperature detecting device 28. It can be understood that the test assembly 20 has a plurality of power consuming loads therein, and the plurality of power consuming loads are usually in an operating state, so that the power consuming loads and the ambient temperature around the power consuming loads are likely to be in a high temperature state, and the high temperature state is likely to cause damage to the power consuming loads or the test assembly 20. Therefore, in the present embodiment, the temperature detection device 28 is provided, so that the electronic control component 21 can control the switch component 22 to disconnect the power consuming load, i.e. control the test component 20 to stop working, when the power consuming load and the ambient temperature around the power consuming load are determined to be higher than the preset temperature threshold according to the temperature detection signal output by the temperature detection device 28. Meanwhile, the user can be reminded of higher temperature at the moment through the arrangement of a buzzer, an LED lamp and other forms, so that the user is reminded of not needing to test again too fast. According to the invention, the temperature detection device 28 is arranged, so that the test assembly 20 can realize over-temperature protection, the safety of the test process is improved, the service life of the test assembly 20 is prolonged, and the safety and the stability of the power supply equipment aging test cabinet are improved.
Referring to fig. 1 and 2, in an embodiment, the number of the testing assemblies 20 is multiple, and the testing assemblies 20 are sequentially arranged on the cabinet 10 side by side.
In the present embodiment, the number of the test assemblies 20 is multiple, and a plurality of test assemblies 20 may be disposed side by side on the top or top layer of the cabinet 10, and may also be disposed side by side on each layer of the cabinet 10. The test assembly 20 may be welded to the cabinet 10, or may be detachably mounted to the cabinet 10 by a snap, a nut, or the like. The cabinet body 10 can adopt materials such as alloy to make, plywood and supporting legs can be the cavity design, make things convenient for inside to set up the electric circuit that communicates test assembly 20 and electrical power unit that awaits measuring, so, can set up the test interface 23 of electrical power unit that awaits measuring on the position that cabinet body 10 test area corresponds, walk the line through the inside of the cabinet body 10 and be connected with test interface 23 of test assembly 20 for the user is more convenient when inserting the electrical power unit that awaits measuring and testing. According to the aging test cabinet for the power equipment, the plurality of test components 20 are arranged, so that a user can test a plurality of power equipment to be tested at the same time, the test efficiency is improved, the cost for manually replacing the power equipment to be tested is reduced, and the convenience and the practicability of the aging test cabinet for the power equipment are improved.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and all modifications and equivalents of the present invention, which are made by the contents of the present specification and the accompanying drawings, or directly/indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (10)
1. The utility model provides a power supply unit aging testing cabinet which characterized in that includes:
the testing device comprises a cabinet body, a testing device and a control device, wherein the cabinet body is provided with a plurality of testing areas, and the plurality of testing areas are used for placing a plurality of power supply devices to be tested;
the testing component is arranged on the cabinet body and provided with a power consumption load for consuming the electric energy of the power supply equipment to be tested, and the testing component is used for accessing the power supply equipment to be tested so as to obtain the electrical parameters of the power supply equipment to be tested and output corresponding testing information.
2. The power supply device aging test cabinet according to claim 1, wherein the number of the power consuming loads is plural;
the test assembly also comprises a test main body, a switch assembly and an electric control assembly;
the test device comprises a test main body and is characterized in that an accommodating cavity is formed in the test main body, and a test interface for connecting to power supply equipment to be tested is arranged at the bottom of the test main body;
the switch assembly set up in the holding intracavity, switch assembly's input with test interface connection, a plurality of outputs and a plurality of power consumptive load one-to-one of switch assembly are connected, switch assembly's controlled end with automatically controlled subassembly is connected, switch assembly is used for under the control of automatically controlled subassembly, communicate corresponding power consumptive load with test interface to consume the electric energy of the power supply unit output that awaits measuring.
3. The power supply device burn-in test cabinet of claim 2, wherein the test assembly further comprises:
the sampling assembly is arranged in the accommodating cavity, is connected with the test interface, and has an output end connected with the electric control assembly, and is used for acquiring electric parameters of the power supply equipment to be tested during output and outputting a corresponding test sampling signal;
the electric control assembly is also used for carrying out signal processing on the test sampling signal and outputting corresponding test information.
4. The power supply equipment aging test cabinet of claim 3, wherein the bottom of the test main body is further provided with a charging interface;
the test assembly further comprises a power supply assembly, the power supply assembly is respectively connected with the electric control assembly and the charging interface, and the power supply assembly is used for supplying power to the electric control assembly and charging power supply equipment to be tested through the charging interface;
the sampling assembly is further connected with the charging interface and used for acquiring electrical parameters of the power supply equipment to be tested during charging and outputting corresponding charging sampling signals.
5. The power supply device aging test cabinet of claim 4, wherein the electric control component is further configured to control the switch component to communicate the corresponding power consuming load with the test interface according to the charging sampling signal, and to control the power supply component to charge the power supply device to be tested through the charging interface according to the test sampling signal, so that the power supply device to be tested completes the charging and discharging tests of the preset number of times.
6. The power supply device aging test cabinet of claim 3, wherein the power consuming load is an incandescent lamp;
the sampling assembly is also connected with a plurality of output ends of the switch assembly and is also used for acquiring current values of the plurality of output ends of the switch assembly and outputting corresponding current sampling signals;
the electric control assembly is further used for outputting prompt information when the power consumption load is determined to be in a circuit break state according to the current sampling signal.
7. The power supply device burn-in test cabinet of claim 2, wherein the test assembly further comprises:
the key triggering assembly comprises a plurality of keys and is arranged on the side surface of the testing main body, the key triggering assembly is connected with the electric control assembly, and the key triggering assembly is used for outputting a corresponding triggering signal when being triggered by a user;
the electric control assembly is also used for controlling the switch assembly to connect/disconnect the corresponding power consumption load and the test interface according to the trigger signal.
8. The power supply device burn-in test cabinet of claim 7, wherein the key trigger assembly comprises:
the automatic test key is used for outputting an automatic test signal when being triggered by a user;
the electric control assembly is also used for controlling the switch assembly to sequentially communicate different preset quantities of power consumption loads and the test interface according to the automatic test signal.
9. The power supply device burn-in test cabinet of claim 2, wherein the test assembly further comprises:
the temperature detection device is arranged at the top of the test main body and connected with the electric control assembly, and the temperature detection device is used for detecting the temperature of the power consumption load and outputting a corresponding temperature detection signal;
the electric control assembly is also used for controlling the switch assembly to connect/disconnect the corresponding power consumption load and the test interface according to the temperature detection signal.
10. The power supply equipment aging test cabinet of any one of claims 1 to 9, wherein the number of the test assemblies is multiple, and the multiple test assemblies are sequentially arranged on the cabinet body side by side.
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| CN202111683061.9A CN114487896A (en) | 2021-12-31 | 2021-12-31 | Power supply equipment aging testing cabinet |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115700392A (en) * | 2022-10-28 | 2023-02-07 | 深圳市恒运昌真空技术有限公司 | Power supply aging test circuit and method |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101650411A (en) * | 2009-07-31 | 2010-02-17 | 迈普通信技术股份有限公司 | Universal power-aging testing system |
| CN102214938A (en) * | 2010-04-02 | 2011-10-12 | 联想(北京)有限公司 | Charge control method of rechargeable battery and portable computer |
| CN104569841A (en) * | 2014-12-26 | 2015-04-29 | 国家电网公司 | Aging detection method and device for battery pack |
| CN104569840A (en) * | 2014-12-26 | 2015-04-29 | 国家电网公司 | Aging detection method and device for individual battery |
| CN107192965A (en) * | 2017-07-21 | 2017-09-22 | 王晓妮 | A kind of dc source aging testing system and its method |
| CN107408822A (en) * | 2015-02-24 | 2017-11-28 | 北京山沃新能源科技有限公司 | Intelligent battery, electric energy distribution bus, battery charging and discharging method and electric energy distribution method |
| CN108776313A (en) * | 2018-06-15 | 2018-11-09 | 广东美的制冷设备有限公司 | Dynamic characteristic test circuit and IPM test devices |
| CN110286335A (en) * | 2019-06-26 | 2019-09-27 | 深圳创维－Rgb电子有限公司 | A kind of test aging circuit of power supply, method and device |
| CN209961891U (en) * | 2018-09-18 | 2020-01-17 | 四川创宏电气有限公司 | Intelligent test system of power supply unit |
| CN113406421A (en) * | 2021-06-18 | 2021-09-17 | 上海华兴数字科技有限公司 | Durable aging loading test system and method |
| CN113484638A (en) * | 2021-06-30 | 2021-10-08 | 深圳市豪恩声学股份有限公司 | Aging test method based on wireless earphone charging box, upper computer and aging cabinet |
| CN214953981U (en) * | 2021-03-13 | 2021-11-30 | 深圳市雷铭科技发展有限公司 | Aging testing cabinet |
-
2021
- 2021-12-31 CN CN202111683061.9A patent/CN114487896A/en active Pending
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101650411A (en) * | 2009-07-31 | 2010-02-17 | 迈普通信技术股份有限公司 | Universal power-aging testing system |
| CN102214938A (en) * | 2010-04-02 | 2011-10-12 | 联想(北京)有限公司 | Charge control method of rechargeable battery and portable computer |
| CN104569841A (en) * | 2014-12-26 | 2015-04-29 | 国家电网公司 | Aging detection method and device for battery pack |
| CN104569840A (en) * | 2014-12-26 | 2015-04-29 | 国家电网公司 | Aging detection method and device for individual battery |
| CN107408822A (en) * | 2015-02-24 | 2017-11-28 | 北京山沃新能源科技有限公司 | Intelligent battery, electric energy distribution bus, battery charging and discharging method and electric energy distribution method |
| CN107192965A (en) * | 2017-07-21 | 2017-09-22 | 王晓妮 | A kind of dc source aging testing system and its method |
| CN108776313A (en) * | 2018-06-15 | 2018-11-09 | 广东美的制冷设备有限公司 | Dynamic characteristic test circuit and IPM test devices |
| CN209961891U (en) * | 2018-09-18 | 2020-01-17 | 四川创宏电气有限公司 | Intelligent test system of power supply unit |
| CN110286335A (en) * | 2019-06-26 | 2019-09-27 | 深圳创维－Rgb电子有限公司 | A kind of test aging circuit of power supply, method and device |
| CN214953981U (en) * | 2021-03-13 | 2021-11-30 | 深圳市雷铭科技发展有限公司 | Aging testing cabinet |
| CN113406421A (en) * | 2021-06-18 | 2021-09-17 | 上海华兴数字科技有限公司 | Durable aging loading test system and method |
| CN113484638A (en) * | 2021-06-30 | 2021-10-08 | 深圳市豪恩声学股份有限公司 | Aging test method based on wireless earphone charging box, upper computer and aging cabinet |
Non-Patent Citations (2)
| Title |
|---|
| 北京：中国电力出版社: "《EPS应急电源百事通》", 30 April 2007 * |
| 张雷，王震坡, 北京：北京理工大学出版社 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115700392A (en) * | 2022-10-28 | 2023-02-07 | 深圳市恒运昌真空技术有限公司 | Power supply aging test circuit and method |
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