CN114383809B

CN114383809B - Optical module high-low temperature environment test device and system

Info

Publication number: CN114383809B
Application number: CN202011131574.4A
Authority: CN
Inventors: 许亮; 王祥忠; 张超
Original assignee: Innolight Technology Suzhou Ltd
Current assignee: Innolight Technology Suzhou Ltd
Priority date: 2020-10-21
Filing date: 2020-10-21
Publication date: 2024-02-23
Anticipated expiration: 2040-10-21
Also published as: CN114383809A

Abstract

The application discloses a high-low temperature environment test device, which comprises a heat-insulating closed box body and a test board for testing an optical module to be tested, wherein the closed box body is internally provided with a closed space, and is provided with a cover plate capable of opening the closed space and an air inlet and an air outlet communicated with the closed space; the test board is provided with at least two test interfaces, and the test interfaces are used for electrically connecting the optical module to be tested; an air duct is arranged in the closed space, the optical modules to be tested are arranged in the air duct in the closed space, and the air duct distributes air flow flowing in from the air inlet to each optical module to be tested. The structure of the inner structure of the closed box body for testing and the structure of the high and low temperature generating device are improved, the temperature rising and falling speed and the temperature uniformity of the testing device are improved, and the testing efficiency and the testing accuracy are effectively improved.

Description

Optical module high-low temperature environment test device and system

Technical Field

The application relates to the technical field of optical module testing, in particular to an optical module high-low temperature environment test device and an optical module high-low temperature environment test system.

Background

In the production of the optical module, the performance of the optical module needs to be tested under a plurality of temperature conditions such as low temperature, normal temperature, high temperature and the like, so that the reliability of the outgoing optical module is ensured. The current means for creating a temperature environment are mainly a thermal flow meter, a semiconductor refrigerator (TEC) environment test box and an incubator. The heat flow meter has high temperature control speed, but high energy consumption; the semiconductor refrigerator environment test box has low temperature control efficiency and low speed. In light module testing, the time required to change from one temperature to another, and the number of light modules tested simultaneously, determine the overall test efficiency. Devices such as thermal flow meters and semiconductor refrigerator environmental test boxes provide a test environment of desired temperature to one or two optical modules at a time, at a fast rate but with low overall efficiency. The temperature control can be given a plurality of optical modules to the incubator once, and more optical modules of test simultaneously, but the temperature rise speed is slow, and the temperature accuracy is poor, and the difference in temperature between different optical modules is great moreover.

Disclosure of Invention

The utility model aims at providing an optical module high low temperature environment test device and system can test a plurality of optical modules simultaneously, and the temperature rise speed is fast, and efficiency of software testing is high, and the temperature homogeneity is good, and the test accuracy is high.

In order to achieve one of the above objects, the present application provides an optical module high-low temperature environment test device, which is characterized in that: the device comprises a heat-insulating closed box body and a test board for testing an optical module to be tested, wherein the closed box body is internally provided with a closed space, and the closed box body is provided with a cover plate capable of opening the closed space, and an air inlet and an air outlet which are communicated with the closed space; at least two test interfaces are arranged on the test board, and each test interface is electrically connected with one optical module to be tested; an air duct is arranged in the closed space, the optical modules to be tested are arranged in the air duct in the closed space, and the air duct distributes air flow flowing in from the air inlet to each optical module to be tested.

As a further improvement of the implementation mode, a heat insulation wall is arranged in the closed space, the heat insulation wall divides the closed space into a plurality of air channels, and the air channels are used for adjusting the temperature of each optical module to be tested to be uniform.

As a further improvement of the embodiment, the heat insulation wall comprises a plurality of heat insulation boards arranged side by side, and the air channel is formed between the adjacent heat insulation boards.

As a further improvement of the embodiment, the air duct opposite to the air inlet has a relatively narrow width, and the air duct deviated from the air inlet has a relatively wide width.

As a further improvement of the embodiment, the width of the plurality of air channels is gradually widened from the air channels facing the air inlet to both sides.

As a further improvement of the implementation mode, a gas diversion device is arranged in the closed space, one end of the gas diversion device is connected with the gas inlet in a sealing way, and the other end of the gas diversion device is respectively connected with each heat insulation plate in a sealing way; the gas flow dividing device is used for dividing the gas introduced by the gas inlet into air channels between the heat insulation plates.

As a further improvement of the embodiment, the heat insulation wall comprises a heat insulation ring, the heat insulation ring divides the closed space into a containing part and an exhaust part, the containing part is arranged in the heat insulation ring, and a gap between the heat insulation ring and the closed box body is the exhaust part;

an air inlet hole is formed in the center of the top of the accommodating part, a plurality of air exhaust holes are formed in the heat insulation ring, and the air exhaust holes are distributed around the heat insulation ring;

the air duct is formed between the exhaust holes and the air inlet holes on the heat insulation ring.

As a further improvement of the implementation mode, the air inlet is arranged at the upper end of the closed box body, and the upper end of the heat insulation ring surrounds the air inlet and is in sealing connection with the inner wall of the closed box body; the air inlet is used as the air inlet hole of the accommodating part, and air flow introduced by the air inlet directly enters the accommodating part in the heat insulation ring.

As a further improvement of the implementation mode, the upper port of the heat insulation ring is provided with a heat insulation plate, the heat insulation plate is provided with an air inlet, and the air inlet is opposite to the central shaft of the heat insulation ring; the air flow from the air inlet enters the accommodating part in the heat insulation ring through the air inlet.

As a further improvement of the embodiment, the closed space is rotationally symmetrical about its central axis;

the heat insulation wall comprises an upper heat insulation plate and a lower heat insulation plate, and the upper heat insulation plate and the lower heat insulation plate divide the closed space into an upper part, a middle part and a lower part; the air inlet is communicated with the lower part of the closed space, and the air outlet is communicated with the upper part of the closed space;

an air inlet is formed in the center of the lower heat insulation plate, and a plurality of optical modules to be tested are uniformly distributed around the air inlet in the middle of the closed space; the edge of the upper heat insulation plate is provided with a plurality of exhaust holes which correspond to the plurality of optical modules to be tested and are uniformly distributed around the center of the upper heat insulation plate;

and air flow introduced by the air inlet enters the middle part through the air inlet holes, uniformly flows to the plurality of air exhaust holes, and enters the upper part through the plurality of air exhaust holes to form the air flue.

As a further improvement of the implementation mode, the heat insulation wall further comprises a plurality of air channel heat insulation plates, and the air channel heat insulation plates are arranged among the optical modules to be tested.

As a further improvement of the implementation mode, an air duct air speed regulator is arranged in the air duct where each optical module to be tested is located.

As a further improvement of the embodiment, the duct wind speed regulator comprises an adjustable speed fan.

As a further improvement of the embodiment, the air inlet is provided with an inlet air speed regulator, and/or the air outlet is provided with an outlet air speed regulator.

As a further improvement of the implementation mode, the test board is provided with a power supply, a main controller, a driver, a temperature sensor, a performance test module of the optical module to be tested, a data processor and a communication module.

As a further improvement of the embodiment, the test board is arranged in the closed space; the airtight box body is provided with an electric interface, and the test board is electrically connected with the outside through the electric interface.

The application also provides a high-low temperature environment test system of the optical module, which comprises a high-low temperature generation device, a control device and the high-low temperature environment test device in any embodiment;

the high-low temperature generating device comprises at least two temperature areas, wherein the at least two temperature areas are used for simultaneously generating gases with different temperatures; each temperature zone is provided with a corresponding air outlet, and the air outlets of the temperature zones are respectively communicated with the air inlets of different test devices.

As a further improvement of the embodiment, each temperature zone of the high-low temperature generating device is also provided with a return air port, and the exhaust port of the test device is in switchable communication with the return air port of the corresponding temperature zone.

The beneficial effects of this application: the structure of the inner structure of the closed box body for testing and the structure of the high and low temperature generating device are improved, the temperature rising and falling speed and the temperature uniformity of the testing device are improved, and the testing efficiency and the testing accuracy are effectively improved.

Drawings

FIG. 1 is a schematic diagram of a test apparatus according to example 1 of the present application;

FIG. 2 is a schematic view showing the internal structure of the test device according to example 1 of the present application;

FIG. 3 is a schematic top view of the test device within the enclosure;

FIG. 4 is a schematic front view of a test plate in a closed enclosure of the test apparatus;

FIG. 5 is a schematic top view of the test apparatus of example 2 of the present application in a closed enclosure;

FIG. 6 is a schematic top view of the test device of example 3 of the present application in a closed enclosure;

FIG. 7 is a schematic cross-sectional view of the test apparatus of example 4 of the present application;

FIG. 8 is a schematic longitudinal cross-sectional view of the experimental set-up shown in FIG. 7;

FIG. 9 is a schematic longitudinal cross-sectional view of a variation of the test device of FIG. 7;

FIG. 10 is a schematic longitudinal section of the test device of example 5 of the present application;

FIG. 11 is a schematic view in cross-section A-A of FIG. 10;

FIG. 12 is a schematic view in cross-section B-B of FIG. 10;

FIG. 13 is another variation of the experimental setup shown in FIG. 10;

FIG. 14 is a schematic diagram of the test system of example 6 of the present application.

Detailed Description

The present application will be described in detail with reference to the following detailed description of the embodiments shown in the drawings. However, these embodiments are not intended to limit the present application, and structural, methodological, or functional modifications made by one of ordinary skill in the art based on these embodiments are included within the scope of the present application.

In the various illustrations of the present application, certain dimensions of structures or portions may be exaggerated relative to other structures or portions for convenience of illustration, and thus serve only to illustrate the basic structure of the subject matter of the present application.

In addition, terms such as "upper", "above", "lower", "below", and the like, used herein to denote spatially relative positions are used for convenience of description to describe one element or feature relative to another element or feature as illustrated in the figures. The term spatially relative position may be intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "below" or "beneath" other elements or features would then be oriented "above" the other elements or features. Thus, the exemplary term "below" can encompass both an orientation of above and below. The device may be otherwise oriented (rotated 90 degrees or other orientations) and the spatially relative descriptors used herein interpreted accordingly. When an element or layer is referred to as being "on" or "connected to" another element or layer, it can be directly on, connected to, or intervening elements or layers may be present.

Example 1

As shown in fig. 1-4, this embodiment provides a high and low temperature environment test apparatus 100 for high and low temperature testing of optical modules. The high-low temperature environment test device 100 comprises a heat-insulating closed box 110, wherein the closed box 110 is made of heat-insulating materials, such as polypropylene plastic foaming materials (Expanded polypropylene, EPP) and the like, so as to reduce energy leakage and improve energy utilization efficiency. The sealed box 110 has a sealed space, the sealed box 110 has a cover plate 113 capable of opening the sealed space, so that the sealed box 110 is conveniently opened to replace the optical module to be tested, and the cover plate 113 is closed after the replacement is completed, thereby realizing the sealing of the whole sealed box 110. The closed casing 110 is further provided with an air inlet 111 and an air outlet 112 communicating with the closed space. Here, the intake port 111 and the exhaust port 112 may be either one or two or more. In the illustration, the closed casing 110 is a flat cuboid, the air inlet 111 and the air outlet 112 are respectively located on the front surface and the rear surface of the closed casing 110, and the cover plate 113 is located on the top surface of the closed casing 110. In other embodiments, the cover plate may be located on the side, and the air inlet and the air outlet may be located on the same side of the enclosure. The size of the cuboid closed box 110 is smaller on the premise that two or more optical modules to be tested can be installed, the better the heat preservation effect is, the more stable the temperature is, and the higher the temperature lifting efficiency is. In the optical module test, the length of the sealed box 110 is generally less than or equal to 80cm, the width is less than or equal to 80cm, and the height is less than or equal to 40cm, in this embodiment, taking the case that 4 optical modules are simultaneously placed in the box 110 as an example, the length of the box 110 is less than or equal to 30cm, the width is less than or equal to 30cm, and the height is less than or equal to 20cm.

As shown in fig. 2 to 4, in order to clearly show the structure in the closed space, the case is shown in a transparent mode in fig. 2, and the heat insulation plate is omitted; FIG. 3 shows the structure of the air inlet and the test plate in the case with the case removed; fig. 4 shows only a schematic front view of the test plate. In this embodiment, a test board 120 for testing the optical module 200 to be tested is disposed in the enclosed space, and at least two test interfaces are disposed on the test board 120 and are used for electrically connecting the optical module 200 to be tested, and each test interface is connected to one optical module 200 to be tested. An air duct 121 is arranged in the closed space, the optical modules 200 to be tested are arranged in the air duct 121, and the air duct 121 distributes the air flow flowing in from the air inlet 111 to each optical module 200 to be tested. Specifically, a heat insulation wall 140 is arranged in the closed space, the heat insulation wall 140 divides the closed space into a plurality of air channels 121, and the air channels are used for adjusting the temperature of each optical module to be tested to be uniform. In this embodiment, the heat insulation wall 140 includes a plurality of heat insulation boards 141 arranged side by side, air channels 121 are formed between adjacent heat insulation boards 141, and an optical module 200 to be tested is placed in one air channel 121. Thermal interference between adjacent air channels 121 is reduced by the heat shield 141. In this embodiment, the test board 120 is provided with a power supply, a main controller, a driver, a temperature sensor, a performance test module of an optical module to be tested, a data processor, a communication module and the like (not shown in the figure), so as to realize basic functions such as temperature monitoring, data processing, communication with external equipment and the like, and realize the test of the performance related to the optical module. The temperature sensor comprises at least two light module shell temperature sensors and an environment temperature sensor in the closed space. The enclosure 110 also has an electrical interface 114 thereon, through which electrical interface 114 the test board 120 is electrically connected to the outside, including electrical and communication connections, for providing power to the test board 120 within the enclosure 110, and/or for communicating the test board 120 to the outside. In other embodiments, the test board may also be disposed outside the sealed enclosure, and a test interface is disposed in the sealed space and used for electrically connecting the optical module, where the test interface is electrically connected to the test board outside the sealed enclosure through the electrical interface.

As shown in fig. 3 and 4, the wind channel 121 facing the air inlet 111 is designed to be smaller in this embodiment because the wind speed is high at a location facing the air inlet 111 and the wind speed is low at a location far from the air inlet 111 at both sides. I.e., the air channel 121 opposite the air inlet 111 has a relatively narrow width d1 and the air channel 121 offset from the air inlet 111 has a relatively wide width d2. Therefore, the flow of the air entering all the air channels 121 is relatively uniform, so that the air channels 121 keep relatively uniform temperature, the air flow is ensured to uniformly flow through each optical module 200 to be tested, the temperature difference among the optical modules is reduced, and the accuracy of optical module testing in each air channel is improved. Specifically, in this embodiment, the air inlet 111 is located in the middle of the front side wall of the closed casing 110, and the width of one or two air channels 121 facing the middle of the closed casing 110 is narrower, so that the width of the air channels 121 in the closed casing 110 gradually widens from the air channel 121 facing the air inlet 111 to both sides. A total air duct structure 150 for guiding air is further provided between the air inlet 111 and the heat insulation plates 141 outside the air ducts 121 on both sides, and the total air duct structure 150 has a hollow structure, and a cross section of the total air duct structure in a direction parallel to the bottom surface of the closed casing 110 is substantially trapezoidal. The smaller opening of the total air duct structure 150 is communicated with the air inlet 111, and the larger opening is communicated with all the air ducts 121 so as to guide air into each air duct 121, thereby further improving the lifting speed of the temperature of the test environment.

In operation, external high-temperature and low-temperature gas flows into the closed box body 110 through the gas inlet 111, enters each air duct 121 and flows through the optical module 200 to be tested. The outside air is continuously introduced into the hermetic container 110 through the air inlet 111 and discharged through the air outlet 121, so that the temperature of the hermetic space in the hermetic container 110 reaches a desired temperature and maintains a relatively stable temperature. In this embodiment, an air duct air speed regulator 130 is also provided in each air duct 121, and a miniature adjustable speed fan is used herein, and in other embodiments, other air speed regulators may be used. The wind speed regulator 130 of each wind channel 121 can finely regulate the wind speed of the air flowing through the corresponding wind channel 121 according to the temperature condition of each wind channel 121, so that the temperature of each wind channel 121 is more balanced and stable. Of course, the air duct and air speed regulator can be omitted under the condition that the volume of the box body is small or the requirement on temperature stability is low. In the illustration, the wind speed regulator 130 is disposed at one end of the wind channel 121 near the exhaust port 112, and in other embodiments, the wind speed regulator may be disposed at the other end of the wind channel or disposed in the wind channel.

Example 2

This embodiment also provides an optical module high and low temperature environment test apparatus 100', as shown in fig. 1 and 5, with the housing removed in fig. 5, showing only the air inlet and the test plate structure within the closed housing. Unlike embodiment 1, in this embodiment, the plurality of heat insulation plates 141 of the heat insulation wall 140 divide the enclosed space into 8 air channels 121, and the size of the enclosed box is also larger than 4 air channels. Typically 8 air ducts may have a length of less than or equal to 50cm, a width of less than or equal to 50cm, and a height of less than or equal to 20cm, such as 40cm x 20cm, and a suitable volume of the enclosure may improve thermal insulation and temperature uniformity. The test board 120 can test a plurality of optical modules 200 to be tested at the same time, i.e. a plurality of air channels 121 are arranged, and the number of the air channels 121 can be designed according to the required test efficiency, the flow rate of external air flow and the capacities of cooling and heating.

As in embodiment 1, the air duct 121 facing the air inlet 111 has a relatively narrow width d1, and the air duct 121 offset from the air inlet 111 has a relatively wide width d4, as shown by d1 < d2 < d3 < d4 in fig. 5. Thereby, the air flow entering all the air channels 121 is relatively uniform, so that each air channel 121 maintains relatively uniform temperature, and the accuracy of optical module testing in each air channel 121 is improved. Specifically, in this embodiment, the air inlet 111 is located at the middle position of the front side wall of the enclosure, and the width d1 of the two air channels 121 facing the middle of the enclosure is narrower, so that the width of the 8 air channels 121 in the enclosure gradually widens from the air channel 121 facing the air inlet 111 to two sides. A total air duct structure 150 for guiding air is further provided between the air inlet 111 and the heat insulation plates 141 outside the air ducts 121 on both sides, and the total air duct structure 150 is a hollow structure, and the cross section of the total air duct structure 150 in the direction parallel to the bottom surface of the closed box body is approximately trapezoidal. The smaller opening of the total air duct structure 150 is communicated with the air inlet 111, and the larger opening is communicated with all the air ducts 121 so as to guide air into each air duct 121, thereby further improving the lifting speed of the temperature of the test environment.

In this embodiment, the volume of the enclosure is relatively large, so an inlet air speed regulator 160, such as an adjustable speed fan, is further disposed at the position of the air inlet 111, for adjusting the total air volume and temperature in the entire enclosed space in the enclosure, so as to further improve the temperature uniformity and temperature rise and fall speed in the enclosure. In this embodiment, an outlet air speed regulator (not shown) is also provided at the exhaust port, as is an inlet air speed regulator, for regulating the total air volume and temperature in the entire enclosed space within the enclosed housing. In other embodiments, the inlet air speed regulator may be provided only at the air inlet, or the outlet air speed regulator may be provided only at the air outlet. In the embodiment, each air channel is also provided with an air channel air speed regulator for respectively fine-adjusting the air quantity and the temperature of the corresponding air channel, so that the temperature of each air channel is more balanced and stable. In other cases where the requirements on the temperature stability of each air duct are not high, the air duct air speed regulator can be omitted, and the air duct air speed regulator can be used for regulating the air duct air speed only through the inlet air speed regulator and/or the outlet air speed regulator.

Example 3

This embodiment also provides an optical module high and low temperature environment test apparatus 100", as shown in fig. 1 and 6, with the housing removed in fig. 6, showing only the air inlet and test plate structure within the closed housing. Unlike embodiment 1, in this embodiment, a gas dividing device 151 is further provided in the closed space, and one end (first port 151 a) of the gas dividing device 151 is hermetically connected to the gas inlet 111, and the other end (second port 151 b) is hermetically connected to each heat shield 141. The gas dividing device 151 is used for uniformly dividing the gas introduced from the gas inlet 111 into the air channels 121 between the heat insulation plates 141.

In this embodiment, the gas dividing device 151 has a structure of one inlet and one outlet, and the first port 151a thereof includes an air inlet port, and the air inlet port is connected with the air inlet 111 of the sealed box in a sealing manner; the second port 151b includes a plurality of air outlet ports, and in this embodiment, the second port 151b includes four air outlet ports, and each air outlet port is respectively and hermetically connected to the air duct between the heat insulation boards 141. The gas introduced from the gas inlet 111 is uniformly split into each air channel 121 by the gas splitting device 151, so that the flow rate of the gas flowing in each air channel 121 tends to be consistent, and the temperature of the optical module 200 to be tested in each air channel 121 is ensured to be relatively uniform. The air duct air speed regulator 130, such as a miniature adjustable speed fan, can be also arranged in each air duct 121, so that the air speed of the air flow flowing through the corresponding air duct 121 can be finely adjusted according to the temperature condition of each air duct 121, and the temperature of each air duct 121 is more balanced and stable.

In this embodiment, the distance between the heat shields 141 of the heat shield wall 140 is the same, i.e., the width of each air duct 121 is the same. In other embodiments, the width of each duct may also be different.

Example 4

As shown in fig. 7 and 8, this embodiment also provides an optical module high and low temperature environment test apparatus, unlike embodiments 1 and 2, in this embodiment, the heat insulation wall 140 includes a heat insulation ring 142, the heat insulation ring 142 divides the enclosed space in the enclosed housing 110 into the accommodating portion 115 and the air exhaust portion 116, the space in the heat insulation ring 142 is the accommodating portion 115, and the gap between the heat insulation ring 142 and the enclosed housing 110 is the air exhaust portion 116. Wherein, an air inlet is provided near the top center of the accommodating portion 115, a plurality of air outlets 142a are provided on the heat insulation ring 142, the plurality of air outlets 142a are uniformly distributed around the heat insulation ring 142, and a plurality of air channels are formed between the plurality of air outlets 142a and the air inlet on the heat insulation ring 142. Near the top center position of the receiving portion 115 refers to a position substantially at the top center or less off-center. The air flow introduced from the air inlet hole enters the heat insulation ring 142 from the middle of the upper port of the heat insulation ring 142, and uniformly flows to the plurality of air outlet holes 142a in the heat insulation ring 142 to form a plurality of air channels 121. The exhaust port 112 is provided in a side wall of the airtight housing 110, communicates with the exhaust portion 116, and flows from the exhaust holes 142a to the exhaust portion through the air flow in the heat insulating ring 142, and is exhausted from the exhaust port 112 to the outside of the airtight housing 110. In this embodiment, the airtight housing 110 adopts a hollow cylindrical structure, and the heat insulating ring 142 is disposed coaxially with the airtight housing 110 in the airtight housing 110. In other embodiments, the closed box body may also have other structures such as a hollow polygon prism, a cuboid, a cube, etc., and the heat-insulating ring may have a rotationally symmetrical structure such as a hollow cylinder, a hollow polygon prism, etc. .

In this embodiment, the air inlet 111 is disposed at the upper end of the airtight box 110, the upper end of the heat insulation ring 142 surrounds the air inlet 11 and is connected with the inner wall of the airtight box 110 in a sealing manner, the air inlet 111 is used as the air inlet hole of the accommodating portion 115, and the air flow introduced by the air inlet 111 directly enters the accommodating portion 115 of the heat insulation ring 142. The air inlet 111 is positioned in the middle of the upper port of the heat insulation ring 142, the test board 120 is arranged at the bottom of the accommodating part 115 in the heat insulation ring 142, the optical modules 200 to be tested are arranged on the test board 120, the air inlet and the test board are uniformly distributed around the central axis of the heat insulation ring 142, and each air exhaust hole 142a corresponds to each optical module 200 to be tested one by one. The air flow introduced from the air inlet 111 enters the heat insulating ring 142 from the middle of the upper port of the heat insulating ring 142, uniformly flows around, passes through each of the light modules 200 to be tested, is discharged from each of the air discharge holes 142a to the air discharge portion 116, and finally is discharged from the air discharge port 112 to the outside of the sealed case 110. The path length from the air inlet 111 to each optical module 200 to be tested is consistent, and the air flow can be uniformly distributed to each optical module 200 to be tested, so that each air duct 121 maintains relatively uniform temperature, the air flow is ensured to uniformly flow through each optical module 200 to be tested, the temperature difference between each optical module 200 to be tested is reduced, and the accuracy of testing the optical modules to be tested in each air duct 121 is improved.

In this embodiment, the heat insulation wall 140 further includes a plurality of air channel heat insulation plates 143, the plurality of air channel heat insulation plates 143 are respectively disposed between the optical modules 200 to be tested, and an air channel 121 is disposed between adjacent air channel heat insulation plates 143. The addition of the duct insulation plates 143 between adjacent ducts 121 reduces thermal interference between adjacent ducts 121. An air duct air speed regulator (not shown) such as a miniature adjustable speed fan may also be provided in each air duct 121. The air duct air speed regulator of each air duct 121 can finely regulate the air speed of the air flow flowing through the corresponding air duct 121 according to the temperature condition of each air duct 121, so that the temperature of each air duct 121 is more balanced and stable. Of course, the air duct and air speed regulator can be omitted under the condition that the volume of the box body is small or the requirement on temperature stability is low.

An inlet air speed regulator (not shown) such as an adjustable speed fan may be disposed at the position of the air inlet 111, for adjusting the total air volume and temperature in the whole enclosed space in the enclosed box, so as to further improve the temperature uniformity and temperature rise and fall speed in the enclosed box. An outlet air speed regulator (not shown) may also be provided at the exhaust port 112, as may an inlet air speed regulator, for regulating the overall air volume and temperature throughout the enclosed space within the enclosure. In other embodiments, the inlet air speed regulator may be provided only at the air inlet, or the outlet air speed regulator may be provided only at the air outlet.

Referring to fig. 9, a schematic longitudinal section of a modified structure of the test apparatus in embodiment 4 is shown, in which a thermal insulation plate 144 is disposed at the upper end of the thermal insulation ring 142, and an air inlet 144a is disposed on the thermal insulation plate 144, and the air inlet 144a faces the central axis of the thermal insulation ring. The air flow introduced from the air inlet 111 enters the accommodating part 115 in the heat insulation ring 142 through the air inlet 144a, uniformly flows to the periphery, passes through each air outlet 142a to the air outlet 116 after passing through each optical module 200 to be tested, and finally is discharged from the air outlet 112 to the outside of the sealed box 110. The path length from the air inlet 144a to each optical module 200 to be tested is consistent, and the air flow can be uniformly distributed to each optical module 200 to be tested, so that each air duct 121 maintains relatively uniform temperature, the air flow is ensured to uniformly flow through each optical module 200 to be tested, the temperature difference between the optical modules 200 to be tested is reduced, and the accuracy of testing the optical modules to be tested in each air duct 121 is improved. In this embodiment, the air inlet 111 is disposed at the top of the airtight box 110 and on the side wall above the heat insulation plate 144, a buffer area 122 is formed between the heat insulation plate 144 and the upper cover plate of the airtight box 110, and after the air flow enters the buffer area 122 from the air inlet 111, the air flow flows into the accommodating portion 115 in the heat insulation ring 142 from the air inlet 144a of the heat insulation plate 144, so that the air flow flows uniformly to the periphery and is uniformly discharged from each air outlet 142a, and the air flow is ensured to be relatively uniformly distributed to each air flue 121. In other embodiments, the air inlet may also be disposed at any position on the upper cover plate of the closed casing and communicate with the buffer area.

Example 5

As shown in fig. 10-12, this embodiment also provides an optical module high-low temperature environment test apparatus, unlike embodiment 1 or 2, in this embodiment, the enclosed space in the enclosed housing 110 has a central axis (as indicated by the dashed line in fig. 10) and is rotationally symmetrical about the central axis. The insulating wall 140 includes an upper insulating plate 145 and a lower insulating plate 146, and the upper insulating plate 145 and the lower insulating plate 146 divide the closed space into an upper portion 117, a middle portion 118 and a lower portion 119. The air inlet 111 communicates with the lower portion 119 of the enclosed space, and the air outlet 112 communicates with the upper portion 117 of the enclosed space. The center of the lower heat insulation plate 146 is provided with an air inlet 146a, the test plate 120 is arranged in the middle part 118 and is arranged on the lower heat insulation plate 146, and a plurality of optical modules 200 to be tested are arranged on the test plate 120 and evenly distributed in the middle part 118 of the closed space around the air inlet 146. In this embodiment, the test plate 120 is coaxially disposed with the lower heat insulation plate 146, and a central hole for avoiding the air inlet 146 is also provided in the middle, and the diameter of the central hole is equal to or greater than the diameter of the air inlet 146. In other embodiments, the test board 120 may also be a plurality of sub-boards uniformly distributed around the air inlet 146.

The edge of the upper heat shield 145 is provided with a plurality of air vents 145a, and the plurality of air vents 145a are uniformly distributed around the center of the upper heat shield 145 corresponding to the plurality of optical modules 200 to be tested. The upper heat shield 145 and the lower heat shield 146 are coaxially disposed with the closed space. The air flow with specific temperature enters the lower part 119 of the closed space through the air inlet 111, then enters the middle part 118 of the closed space through the air inlet 146a of the lower heat insulation plate 146, the air flow entering the middle part 118 uniformly flows to the periphery, flows through each optical module 200 to be tested, then flows to each air outlet 145a of the upper heat insulation plate 145, enters the upper part 117 through each air outlet 145a, finally is discharged from the air outlet 112, and a plurality of air channels 121 are formed in the middle part 118 of the closed space.

In this structure, the path length from the air inlet 146a of the lower heat insulation plate 146 to each optical module 200 to be tested is consistent, and the air flow can be uniformly distributed to each optical module 200 to be tested, so that each air duct 121 maintains a relatively uniform temperature, the air flow is ensured to uniformly flow through each optical module 200 to be tested, the temperature difference between each optical module 200 to be tested is reduced, and the accuracy of testing the optical modules to be tested in each air duct 121 is improved.

An air duct speed regulator (not shown) such as a miniature adjustable speed fan may also be provided in each air duct 121 of this embodiment. The air duct air speed regulator of each air duct 121 can finely regulate the air speed of the air flow flowing through the corresponding air duct 121 according to the temperature condition of each air duct 121, so that the temperature of each air duct 121 is more balanced and stable. Of course, the air duct and air speed regulator can be omitted under the condition that the volume of the box body is small or the requirement on temperature stability is low. An inlet air speed regulator (not shown) such as an adjustable speed fan may be disposed at the position of the air inlet 111 for regulating the total air volume and temperature in the whole enclosed space in the enclosed box, so as to further improve the temperature uniformity and temperature rise and fall speed in the enclosed box. An outlet air speed regulator (not shown) may also be provided at the exhaust port 112, as may an inlet air speed regulator, for regulating the overall air volume and temperature throughout the enclosed space within the enclosure. In other embodiments, the inlet air speed regulator may be provided only at the air inlet, or the outlet air speed regulator may be provided only at the air outlet.

As shown in fig. 13, in a modified structure of the test apparatus of embodiment 5, on the basis of the test apparatus of embodiment 5, air duct insulation boards 147 are added between the air ducts 121, that is, the insulation wall further includes a plurality of air duct insulation boards 147, the plurality of air duct insulation boards 147 are respectively disposed between the air ducts 121, and the optical module 200 to be tested is disposed in the air duct 121. The addition of the air duct insulation plates 147 between adjacent air ducts 121 reduces thermal interference between adjacent air ducts 121.

Example 6

As shown in fig. 14, this embodiment provides a high-low temperature environment test system including at least two of the above-described high-low temperature environment test apparatuses 100, and a high-low temperature generation apparatus 300 and a control apparatus 400. The high-low temperature generating device 300 includes at least two temperature areas 310 and 320, and the at least two temperature areas 310 and 320 are used for generating gases with different temperatures at the same time. Each temperature zone 310, 320 has a corresponding air outlet 311, 321, the air outlets 311, 321 of each temperature zone 310, 320 are respectively in switchable communication with the air inlets 111 of different test devices 100, respectively delivering different temperature gases to the same test device 100 during different test periods, and delivering different temperature gases to different test devices 100 during the same test period. Each temperature zone 310, 320 of the high and low temperature generating device 300 also has a return port 312, 322, and the exhaust port 112 of the test device 100 is in switchable communication with the return ports 312, 322 of the respective temperature zone 310, 320. The control device 400 is used for controlling the high-low temperature generating device 300 to work, and switching communication between each of the temperature areas 310 and 320 of the high-low temperature generating device 300 and each of the high-low temperature environment test devices 100, and also can provide power to each of the high-low temperature environment test devices 100, or display test data of the optical module in the high-low temperature environment test device 100.

The different temperature zones 310, 320 of the high and low temperature generating device 300 are used to provide different temperature gases required for the test, such as high temperature gas, normal temperature gas, low temperature gas, etc. The two temperature areas 310 and 320 shown in fig. 14 are a high temperature area 310 and a low temperature area 320, respectively, in the same test period, the air outlet 311 of the high temperature area 310 and the air outlet 321 of the low temperature area 320 are respectively communicated with the air inlets 111 of the box bodies of the two high and low temperature environment test devices 100, and the optical modules to be tested in the two high and low temperature environment test devices 111 are respectively tested in high and low temperature environments. For example, providing a first box with high-temperature air flow, and testing the optical module to be tested in the first box under a high-temperature environment; and providing low-temperature air flow for the second box body, and testing the optical module to be tested in the second box body in a low-temperature environment. Meanwhile, the exhaust ports 112 of the two cases of the high-low temperature environment test device 100 are respectively communicated with the air return ports 312 of the corresponding high-temperature region 310 and the air return ports 322 of the low-temperature region 320, so that the air flow after being utilized is recovered, and the air flows enter the temperature control cycle again, are not directly discharged into the air, and can achieve the effects of energy conservation and environmental protection. After the test is completed, the air outlet 311 of the high-temperature area 310 is switched and communicated to the second box body, and high-temperature air flow is provided for the second box body so as to test the optical module to be tested in the second box body in a high-temperature environment; meanwhile, the air outlet 311 of the low-temperature area 320 is switched and communicated to the first box body, and low-temperature air flow is provided for the first box body so as to test the optical module to be tested in the first box body in a low-temperature environment. And switches the exhaust ports 112 of the two cases to the return ports 312, 322 of the respective temperature zones 310, 320, respectively. In the above description, the high temperature and low temperature test is taken as an example, and in other embodiments, there may be a plurality of tests of the low temperature isothermal environment at different temperatures, and the number of the test devices 100 in the test system is equal to the number of the required environmental temperature levels.

The test system can test a plurality of optical modules simultaneously, and different temperature areas of the high and low temperature generating device work simultaneously, and simultaneously provides different temperature gases for different high and low temperature environment test devices 100, so that the test efficiency of the high and low temperature test of the optical modules is effectively improved, the high and low temperature gases are fully utilized, the energy consumption is saved, and the test system has the advantages of energy conservation, environmental protection and the like.

The above list of detailed descriptions is only specific to practical embodiments of the present application, and they are not intended to limit the scope of the present application, and all equivalent embodiments or modifications that do not depart from the spirit of the technical spirit of the present application are included in the scope of the present application.

Claims

1. The utility model provides an optical module high low temperature environment test device which characterized in that: the device comprises a heat-insulating closed box body and a test board for testing an optical module to be tested, wherein the closed box body is internally provided with a closed space, and the closed box body is provided with a cover plate capable of opening the closed space, and an air inlet and an air outlet which are communicated with the closed space; at least two test interfaces are arranged on the test board, and each test interface is electrically connected with one optical module to be tested; an air duct is arranged in the closed space, the optical modules to be tested are arranged in the air duct in the closed space, and the air duct distributes the air flow flowing in from the air inlet to each optical module to be tested;

the heat-insulating wall is arranged in the closed space and divides the closed space into a plurality of air channels, and the air channels are used for adjusting the temperature of each optical module to be measured to be uniform.

2. The optical module high-low temperature environment test device according to claim 1, wherein: the heat insulation wall comprises a plurality of heat insulation plates which are arranged side by side, and the air duct is formed between the adjacent heat insulation plates.

3. The optical module high-low temperature environment test device according to claim 2, wherein: the air duct opposite the air inlet has a relatively narrow width, and the air duct offset from the air inlet has a relatively wide width.

4. The optical module high-low temperature environment test device according to claim 3, wherein: the width of the air channels is gradually widened to two sides from the air channels opposite to the air inlet.

5. The optical module high-low temperature environment test device according to claim 2, wherein: a gas flow dividing device is arranged in the closed space, one end of the gas flow dividing device is connected with the gas inlet in a sealing way, and the other end of the gas flow dividing device is respectively connected with each heat insulation plate in a sealing way; the gas flow dividing device is used for dividing the gas introduced by the gas inlet into air channels between the heat insulation plates.

6. The optical module high-low temperature environment test device according to claim 1, wherein: the heat insulation wall comprises a heat insulation ring, the heat insulation ring divides the closed space into a containing part and an exhaust part, the containing part is arranged in the heat insulation ring, and a gap between the heat insulation ring and the closed box body is the exhaust part; an air inlet hole is formed in the center of the top of the accommodating part, a plurality of air exhaust holes are formed in the heat insulation ring, and the air exhaust holes are distributed around the heat insulation ring;

7. The optical module high-low temperature environment test device according to claim 6, wherein: the air inlet is arranged at the upper end of the closed box body, and the upper end of the heat insulation ring surrounds the air inlet and is connected with the inner wall of the closed box body in a sealing way; the air inlet is used as the air inlet hole of the accommodating part, and air flow introduced by the air inlet directly enters the accommodating part in the heat insulation ring.

8. The optical module high-low temperature environment test device according to claim 6, wherein: the upper end opening of the heat insulation ring is provided with a heat insulation plate, the heat insulation plate is provided with an air inlet, and the air inlet is opposite to the central shaft of the heat insulation ring; the air flow from the air inlet enters the accommodating part in the heat insulation ring through the air inlet.

9. The optical module high-low temperature environment test device according to claim 1, wherein:

the closed space is rotationally symmetrical about its center axis;

10. The optical module high-low temperature environment test device according to any one of claims 5-9, wherein: the heat insulation wall further comprises a plurality of air channel heat insulation plates, and the air channel heat insulation plates are arranged among the optical modules to be tested.

11. The optical module high-low temperature environment test device according to any one of claims 1 to 9, wherein: and an air duct air speed regulator is arranged in the air duct where each optical module to be tested is located.

12. The optical module high-low temperature environment test device according to claim 11, wherein: the wind channel wind speed regulator comprises an adjustable speed fan.

13. The optical module high-low temperature environment test device according to any one of claims 1 to 9, wherein: an inlet air speed regulator is arranged at the air inlet, and/or an outlet air speed regulator is arranged at the air outlet.

14. The optical module high-low temperature environment test device according to any one of claims 1 to 9, wherein: the test board is provided with a power supply, a main controller, a driver, a temperature sensor, a performance test module of the optical module to be tested, a data processor and a communication module.

15. The optical module high-low temperature environment test device according to claim 14, wherein: the test board is arranged in the closed space; the airtight box body is provided with an electric interface, and the test board is electrically connected with the outside through the electric interface.

16. The utility model provides an optical module high low temperature environment test system which characterized in that: comprising a high-low temperature generating device, a control device and the high-low temperature environment test device of any one of claims 1-15;

17. The optical module high-low temperature environment test system of claim 16, wherein: and each temperature zone of the high-low temperature generating device is also provided with a return air port, and the exhaust port of the test device is in switchable communication with the return air port of the corresponding temperature zone.