CN114359176B

CN114359176B - Panel detection method and device, electronic equipment and storage medium

Info

Publication number: CN114359176B
Application number: CN202111547308.4A
Authority: CN
Inventors: 朱小明; 匡梦良; 殷亚男; 许超; 张鑫
Original assignee: Suzhou Mega Technology Co Ltd
Current assignee: Suzhou Mega Technology Co Ltd
Priority date: 2021-12-16
Filing date: 2021-12-16
Publication date: 2024-07-09
Anticipated expiration: 2041-12-16
Also published as: CN114359176A

Abstract

The embodiment of the invention provides a panel detection method, a device, electronic equipment and a storage medium. The method comprises the following steps: acquiring an image of a panel to be detected; determining a region of interest in an image of a panel to be detected; identifying a suspected defect region in the region of interest based on a gray level difference between pixels in the region of interest; and determining a foreign object region based on the suspected defect region. The foreign matter area in the panel can be quickly and accurately determined through the scheme. Thus, the reliability of the panel detection is ensured.

Description

Panel detection method and device, electronic equipment and storage medium

Technical Field

The present invention relates to the field of panel detection, and more particularly, to a panel detection method, a panel detection apparatus, an electronic device, and a storage medium.

Background

Chip On Glass (COG) is a technology in which a driving circuit Chip is directly bonded to a Glass substrate, and is widely applied to various display products such as liquid crystal display and electroluminescence. The COG process aligns the conductive pins of the driving circuit to the electrodes (bumps) on the glass substrate, uses an anisotropic conductive film (Anisotropic Conductive Film, abbreviated as ACF) as a bonding dielectric material, and realizes the connection and conduction between the conductive pins of the driving circuit and the electrodes on the glass substrate through a high temperature and high pressure for a certain time. Similarly, the flexible circuit board On Glass (FOG) is a technology in which a flexible circuit board (FPC) is directly bonded to a Glass substrate, and the process is similar to COG. Similarly, chip On Film (COF) technology is a technology of packaging a semiconductor chip on a flexible substrate, and then bonding the flexible substrate on the packaged product to a glass substrate, and the process is similar to COG.

The panel detection technique can be used to detect the appearance of the panel, the condition of conductive particle indentations in the panel, and the like. In addition to the problems of appearance and conductive particles, some panels may have foreign materials therein, resulting in unsatisfactory panel quality. Therefore, a panel inspection method is needed to detect the foreign matters on the panel.

Disclosure of Invention

The present invention has been made in view of the above-described problems. The invention provides a panel detection method, which comprises the following steps: acquiring an image of a panel to be detected; determining a region of interest in an image of a panel to be detected; identifying a suspected defect region in the region of interest based on a gray level difference between pixels in the region of interest; and determining a foreign object region based on the suspected defect region.

Illustratively, determining the foreign object region based on the suspected defect region includes: determining the area of the suspected defect area; judging whether the suspected defect area meets preset conditions or not, wherein the preset conditions comprise that the area of the suspected defect area meets the area requirement; and determining the suspected defect area meeting the preset condition as a foreign object area.

Illustratively, prior to determining the area of the suspected defect region, the method further comprises: morphological processing is performed on the identified suspected defect region to process a noise region associated with the suspected defect region.

Illustratively, morphological processing of the identified suspected defect region includes: merging the suspected defect areas with the distance smaller than the merging distance threshold value; the method further comprises the steps of: a user interface is provided, wherein the user interface includes a third operable control for setting a merge distance threshold in response to a user operation.

Illustratively, determining the area of the suspected defect region includes: determining the area of each suspected defect area; adding the areas of all the suspected defect areas to obtain the total area of all the suspected defect areas; the judging whether the suspected defect area meets the preset condition comprises the following steps: and judging whether the total area of the suspected defect area meets the total area requirement.

Illustratively, the region of interest includes an electrode region, and summing the areas of all suspected defect regions to obtain a total area of all suspected defect regions includes: determining an area of a suspected defect region in each electrode region; the areas of the suspected defect areas in all the electrode areas in the region of interest are added to obtain the total area of the suspected defect areas in all the electrode areas.

Illustratively, the region of interest includes an electrode region, and determining the area of the suspected defect region includes: determining an area of a suspected defect region in each electrode region; the judging whether the suspected defect area meets the preset condition comprises the following steps: and judging whether the area of the suspected defect area in each electrode area meets the single area requirement.

Illustratively, a user interface is provided, wherein the user interface includes a second operable control for setting an area requirement threshold for a suspected defect region in the region of interest in response to a user operation.

Illustratively, determining a region of interest in an image of a panel to be detected includes: image segmentation is carried out on the image of the panel to be detected according to the gray threshold value so as to extract electrode areas in the image of the panel to be detected, wherein the region of interest comprises the electrode areas.

Illustratively, a user interface is provided, wherein the user interface includes a fourth operable control for setting the grayscale threshold in response to a user operation.

Illustratively, receiving coordinates of a target area entered by a user; cutting out a target area from an image of the panel to be detected according to the coordinates of the target area; image segmentation of the image of the panel to be detected according to the gray threshold value to extract the electrode region in the image of the panel to be detected comprises: image segmentation is performed for the target region to determine the electrode region.

Illustratively, determining a region of interest in an image of a panel to be detected includes: responding to the operation of a user aiming at the image of the panel to be detected, and acquiring boundary coordinates of an electrode area in the image; an electrode region is determined from the boundary coordinates, wherein the region of interest comprises the electrode region.

Illustratively, determining the electrode region from the boundary coordinates includes: and scaling the boundary of the electrode region in response to an adjustment operation of the user for the boundary coordinates.

Illustratively, the method further comprises: a user interface is provided, wherein the user interface includes a fifth operable control for setting a size that scales a boundary of the electrode area in response to a user operation.

Illustratively, determining a region of interest in an image of a panel to be detected includes: determining an electrode area in an image of a panel to be detected; from the electrode areas, an electrode gap area is determined, wherein the region of interest comprises the electrode gap area.

Illustratively, the method further comprises: a user interface is provided, wherein the user interface includes a first operable control for setting a grayscale difference threshold between a suspected defective region and a normal region in a region of interest in response to a user operation.

According to another aspect of the present invention, there is also provided a panel detection apparatus including: the image acquisition module is used for acquiring an image of the panel to be detected; the ROI determining module is used for determining a region of interest in an image of the panel to be detected; the primary identification module is used for identifying suspected defect areas in the region of interest based on gray level differences among pixels in the region of interest; and the foreign matter determining module is used for determining a foreign matter area based on the suspected defect area.

According to yet another aspect of the present invention, there is also provided an electronic device comprising a processor and a memory, wherein the memory has stored therein computer program instructions which, when executed by the processor, are adapted to carry out the panel detection method as described above.

According to still another aspect of the present invention, there is also provided a storage medium having stored thereon program instructions for executing the panel detection method as described above when running.

According to the technical scheme, the suspected defect area can be determined according to the pixel gray level difference in the image of the panel to be detected, and then the foreign object area is determined according to the suspected defect area. The foreign matter area in the panel can be quickly and accurately determined through the scheme. Thus, the reliability of the panel detection is ensured.

The foregoing description is only an overview of the present invention, and is intended to be implemented in accordance with the teachings of the present invention in order that the same may be more clearly understood and to make the same and other objects, features and advantages of the present invention more readily apparent.

Drawings

The above and other objects, features and advantages of the present invention will become more apparent from the following more particular description of embodiments of the present invention, as illustrated in the accompanying drawings. The accompanying drawings are included to provide a further understanding of embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate the invention and together with the embodiments of the invention, and not constitute a limitation to the invention. In the drawings, like reference numerals generally refer to like parts or steps.

FIG. 1 shows a schematic flow chart of a panel detection method according to one embodiment of the invention;

FIG. 2 shows a partial schematic view of an image of a panel to be inspected according to one embodiment of the invention;

FIG. 3 shows a schematic diagram of a user interface according to one embodiment of the invention;

FIG. 4 shows a schematic flow chart of determining a region of interest in an image of a panel to be detected, according to one embodiment of the invention;

Fig. 5 shows a schematic flow chart of determining a region of interest in an image of a panel to be detected according to another embodiment of the invention;

FIG. 6 shows a schematic flow chart of determining a foreign object region based on a suspected defect region according to one embodiment of the invention;

FIG. 7 shows a schematic flow chart of determining the area of a suspected defect region according to one embodiment of the invention;

FIG. 8 shows a schematic block diagram of a panel detection device according to one embodiment of the invention; and

Fig. 9 shows a schematic block diagram of an electronic device according to an embodiment of the invention.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, exemplary embodiments according to the present invention will be described in detail with reference to the accompanying drawings. It should be apparent that the described embodiments are only some embodiments of the present invention and not all embodiments of the present invention, and it should be understood that the present invention is not limited by the example embodiments described herein. Based on the embodiments of the invention described in the present application, all other embodiments that a person skilled in the art would have without inventive effort shall fall within the scope of the invention.

According to one embodiment of the present invention, a panel detection method is provided. Fig. 1 shows a schematic flow chart of a panel detection method 100 according to an embodiment of the invention. The method 100 includes the following steps.

Step S110, an image of the panel to be detected is acquired.

The image of the panel to be detected can be an original image acquired by an image acquisition device such as a camera in the panel detection system, or an image obtained after preprocessing the original image. The preprocessing operation may include all operations for performing panel detection for greater clarity. For example, the preprocessing operation may include a denoising operation such as filtering. The image may contain all or part of the electrodes in the panel to be detected.

Step S120, determining a region of interest in the image of the panel to be detected.

It will be appreciated that the image of the panel to be detected is obtained for detecting the panel to be detected, and the region of interest may be a region on the panel to be detected, which any user wishes to detect, for example, an electrode region on the panel to be detected, an electrode gap region between electrodes on the panel to be detected, and so on. In order to reduce the interference in the subsequent steps, the region of interest in the image of the panel to be detected may be extracted after it has been determined. The extraction process may be implemented in response to user input, may be implemented based on an image segmentation method, etc., and is not limited in this regard.

Step S130, identifying a suspected defect region in the region of interest based on the gray level differences between pixels in the region of interest.

Fig. 2 shows a partial schematic view of an image of a panel to be inspected according to one embodiment of the invention. Referring to fig. 2, wherein the gray rectangular area is an electrode area, a plurality of electrodes are included therein. The black area between every two adjacent electrodes is the electrode gap area. When the region of interest is an electrode region, the gradation difference between every two adjacent pixels can be calculated for all pixels within the electrode region, respectively. It can be appreciated that the greater the gray level difference between pixels, the more pronounced the corresponding degree of light-dark difference is exhibited in fig. 2. A suspected defective region in the electrode region can be identified based on the gray level difference between the pixels. By way of example, any image segmentation method may be utilized to identify suspected defect regions in the electrode region, such as region-based image segmentation, edge-based image segmentation, and the like. The suspected defect regions identified in this step may include true defect regions and false defect regions (e.g., conductive particles) that are misrecognized. Similarly, when the region of interest is an electrode gap region, the gray-scale difference between each two adjacent pixels thereof can be calculated, respectively. The suspected defect region 210 in the electrode gap region may be identified based on the resulting gray scale difference.

Step S140, determining a foreign object region based on the suspected defect region.

The suspected defect area in the region of interest can be identified and extracted according to the aforementioned step S130, and as previously described, the suspected defect area includes both true and false defect areas. The detection is performed for the suspected defect region, and the true defect region can be determined as the foreign object region. For example, if a foreign object exists on the panel to be detected, the display of the panel may be poor. The image of the panel to be detected can be embodied as a bright spot, a dark spot, a bright line, a dark line or a light spot. The foreign object region may be determined by a detection method of detecting whether the area of the suspected defective region or the pixel value of the pixel in the suspected defective region, or the like exceeds a preset threshold value. If it is determined that the foreign matter region is included in the panel to be detected, it may be determined that the quality of the panel to be detected is not acceptable. Optionally, this may be alerted to alert the user to timely exclude bad quality panels.

Illustratively, determining the region of interest in the image of the panel to be detected in step S120 may include image segmentation of the image of the panel to be detected according to a gray threshold to extract electrode regions in the image of the panel to be detected. Wherein the region of interest comprises an electrode region.

It is understood that image segmentation refers to the operation of extracting a region of interest in an image based on some rule. In this embodiment, the image of the panel to be detected may be image-segmented based on the gray threshold. For example, the gray values of all pixels on the image of the panel to be detected may be compared with the gray threshold value, respectively, and when the gray value of a pixel on the image is greater than or equal to the gray threshold value, the pixel may be determined to belong to the electrode region in the image. Based on this, it is possible to achieve division of the electrode area and the electrode gap area in the image of the panel to be detected, and extract the electrode area accordingly. Alternatively, the extracted electrode region may be directly taken as the region of interest. Alternatively, the electrode gap region may be obtained after the electrode region is extracted as the region of interest. The gradation threshold value may be set in response to an operation by a user, and may also be set before shipment of the panel detection apparatus according to experience of image division by most panels to be detected.

Thus, the region of interest can be determined using the method of image segmentation. The method has the advantages of good positioning effect, high segmentation precision and the like, and can reduce the interference in the region of interest obtained by segmentation to a great extent.

For example, the method 100 may include providing a user interface. FIG. 3 shows a schematic diagram of a user interface according to one embodiment of the invention. The user interface includes a fourth operable control 310, shown in fig. 3 as a "Bump minimum grayscale value", for setting a grayscale threshold in response to a user operation. The fourth operable control 310 may be a text entry box, a dialer, or a filter box, among others. For example, when the fourth operable control 310 is a tuner, the user may adjust the grayscale threshold by clicking the up and down arrow after "Bump minimum grayscale value". Specifically, clicking on the up arrow may increase the gray threshold and clicking on the down arrow may decrease the gray threshold. It will be appreciated that setting the gray threshold to 80 in this embodiment is merely exemplary and not limiting of the gray threshold. The user can set the gray threshold value randomly and reasonably according to actual requirements.

Therefore, the user can set the corresponding gray threshold value through the fourth operable control 310 according to the need to realize the accurate segmentation of the image of the panel to be detected, thereby meeting the requirements of different users and improving the use experience.

Illustratively, the method 100 may further include receiving coordinates of a target area input by a user, and cropping the target area in the image of the panel to be detected according to the coordinates of the target area.

It will be appreciated that, since there may be thousands of electrodes on the panel to be detected, the size of the image corresponding to the acquired panel to be detected may be too large, and the accuracy of the panel detection result may be affected by too much interference data. Thus, the user can select a target area on the image of the panel to be detected as a targeted area for panel detection. For example, the user may input the coordinates of the selected target area through an input device such as a keyboard. Taking the case that the target area is a rectangle as an example, the coordinates input by the user may be coordinate values of two points, and the coordinate values of the two points are respectively taken as position coordinates of an upper left vertex and a lower right vertex or an upper left vertex and an upper right vertex which form the target area, so as to determine the target area. Alternatively, the user may draw the target area directly at a specific position on the screen using an input device such as a mouse or a touch screen. Coordinates of a start point and an end point of a cursor corresponding to the mouse can be used as coordinates of different vertexes of the target area respectively. After the target area is determined, the target area is cut out directly from the image of the panel to be detected. Typically, the width value may be around 30 pixels for each electrode. To ensure the rationality of the target area size, and to ensure the panel detection accuracy, the user may set the target area to 1024 pixels by 1024 pixels. Thus, 20-30 electrodes may be included in the target area.

Based on this, in the above-described image segmentation step, image segmentation may be performed for the target region according to the gradation threshold value to extract the electrode region in the target region. One of ordinary skill in the art can understand the specific embodiment of image segmentation of the target area according to the gray threshold by reading the above description related to image segmentation of the image of the panel to be detected according to the gray threshold, and the description is omitted herein for brevity.

Therefore, the interference except the target area in the image of the panel to be detected can be effectively removed, and the influence on the accuracy of the panel detection result caused by excessive noise in the image is avoided. In addition, the calculated amount is obviously reduced, and the working performance of the system is improved.

Fig. 4 shows a schematic flow chart of step S120 of determining a region of interest in an image of a panel to be detected according to an embodiment of the invention. As shown in fig. 4, step S120 may include the following steps. In this embodiment, the region of interest comprises an electrode region.

Step S121, in response to a user operation for an image of a panel to be detected, boundary coordinates of an electrode region in the image are acquired.

For example, the user may click on four vertices or a set of diagonal vertices of an electrode in the image of the panel to be detected, respectively, using any suitable input device such as a mouse or a touch screen to obtain the boundary coordinates of the electrode region. The above operations are repeatedly performed, and the boundary coordinates of the electrode areas of the plurality of electrodes can be obtained. Step S122, determining an electrode region according to the boundary coordinates, wherein the region of interest includes the electrode region.

With step S121, boundary coordinates may be obtained, and for an electrode region, the obtained boundary coordinates are respectively used as four vertex coordinates or a set of coordinates of diagonal vertices of a rectangular frame, and the electrode region may be selected with the rectangular frame. It will be appreciated that the rectangular box is the bounding box of the electrode area.

The user can thus easily determine the electrode area and take this as the region of interest. The scheme has simple algorithm, is easy to realize and is convenient for the user to operate.

Illustratively, determining the electrode region according to the boundary coordinates in step S122 may include scaling the boundary of the electrode region in response to an adjustment operation of the boundary coordinates by a user. For example, the user can move and adjust the vertex of the original selected electrode to realize the adjustment of the boundary coordinates. After the boundary coordinates are changed, the boundaries of the corresponding electrode regions are also changed. Taking one vertex in the electrode, for example the upper left vertex, the user moves it to the left a certain distance, correspondingly moves the lower left vertex to the left the same distance. The boundary of the electrode region can thereby be expanded to the left. Conversely, if the upper left vertex and the lower left vertex are moved rightward, the boundary of the electrode region may be contracted rightward. Similarly, the user moves the upper left vertex upward a distance, and correspondingly, moves the upper right vertex upward the same distance. The boundary of the electrode region can thereby be widened upwards. Conversely, if the upper left vertex and the upper right vertex are moved downward, the boundary of the electrode region may be contracted downward.

According to the technical scheme, scaling adjustment of the boundary of the electrode area can be achieved. It will be appreciated that the electrode boundary is the location of the electrode adjacent to its gap. In the image of the panel to be inspected, the position will generally have a large pixel value change, which will significantly affect the subsequent foreign object inspection process, and thus the panel inspection result. Therefore, the boundary of the electrode area is adjusted according to the requirement, so that the interference data in the interested area in the image of the panel to be detected is effectively reduced, the calculated amount is reduced for the subsequent determination of the foreign object area, and the panel detection accuracy is improved.

Illustratively, the method 100 may further include providing a user interface. Referring again to fig. 3, the user interface may include a fifth operable control 320 for setting a size that scales the boundary of the electrode area in response to a user operation. Similarly, the fifth operable control 320 may be a text entry box, a dialer, or a screening box, among others. The fifth operable control 320 is shown in fig. 3 as four controls, the "TOPX direction", "TOPY direction", "BottomX direction", and the "BottomY direction". Where "TOP" and "Bottom" are for an electrode region, "TOP" may represent an upper boundary of the electrode region and "Bottom" may represent a lower boundary of the electrode region. The "TOPX direction" may denote an adjustment of the upper boundary of the electrode region in the horizontal direction, i.e. the upper boundary is lengthened or shortened in the horizontal direction to the left and/or to the right. The "TOPY direction" may represent an adjustment in the vertical direction for the upper boundary of the electrode region, i.e., the upper boundary moves up or down in the vertical direction. The effect of the two controls, the "BottomX direction" and the "BottomY direction", can be known in the same manner. It will be appreciated that when the electrode areas are adjusted, in order to ensure that the boundaries of the electrode areas are regularly closed rectangles, after one of the controls is operated, the same operation can be performed on the control associated therewith. In the following description, taking the "TOPX direction" control as an example, when the fifth operable control 320 is a dial, the user can zoom in and out the size of the boundary of the electrode area by clicking the up-down arrow after "TOPX direction". It will be appreciated that when the value after "TOPX direction" is positive, it may be indicated that the extension process is performed on the current electrode region on the basis of the length of the upper boundary thereof. For example, the length of the upper boundary of the electrode region may be extended to the right or left by 2 pixel sizes by setting the value after "TOPX direction" to 2. Alternatively, the length of the upper boundary of the electrode region may be extended by 1 pixel size to the left and right, respectively. When the value after the TOPX direction is negative, the method is completely opposite to the scheme, and the pixel size of the corresponding value is correspondingly shortened. After the upper boundary of the electrode area is lengthened or shortened, the lower boundary of the electrode area is lengthened or shortened by utilizing a control in the 'BottomX direction', and after the upper and lower boundaries of the electrode area are adjusted, the left and right boundaries of the electrode area are adjusted adaptively so as to ensure that the boundaries of the electrode area are regularly closed rectangles.

Those of ordinary skill in the art will understand the specific embodiments for operating the remaining three controls from reading the above description of the "TOPX direction" control, and will not be further described herein for brevity.

According to the technical scheme, the user can automatically adjust the boundary of the electrode area only by executing simple operation on the fifth operable control 320, so that different requirements of the user can be met, personalized customization is realized, complicated operation is not required to be executed by the user, and the use experience is improved.

Fig. 5 shows a schematic flow chart of step S120 of determining a region of interest in an image of a panel to be detected according to another embodiment of the invention. As shown in fig. 5, step S120 may include the following steps. In this embodiment, the region of interest includes an electrode gap region.

Step S123, determining an electrode area in the image of the panel to be detected.

For example, the electrode region in the image of the panel to be detected may be determined in response to an operation by the user. Wherein the electrode region comprises at least one electrode. In one embodiment, a user may perform a drag operation on an image of a panel to be detected along a boundary of at least one electrode in the image using an external input device such as a mouse or a touch screen. The vertex of the electrode, such as the upper left vertex, is first clicked with the mouse, and a drag operation is performed from the vertex until the vertex diagonal to the vertex, such as the lower right vertex. The boundary of at least one electrode can thereby be determined, on the basis of which the electrode area in the image of the panel to be detected can be determined. Alternatively, the electrode regions may also be extracted by a threshold-based image segmentation or the like to determine the electrode regions in the image of the panel to be detected.

Step S124, determining an electrode gap region according to the electrode region, wherein the region of interest includes the electrode gap region.

The electrode region in the image of the panel to be detected may be determined based on step S123. As previously mentioned, the electrode area comprises at least one electrode, with an electrode gap between each adjacent electrode, all of the electrode gaps constituting the electrode gap area. The determined electrode gap region is then used as a region of interest for subsequent foreign body region detection.

According to the technical scheme, the electrode area in the image of the panel to be detected is firstly determined, and the electrode gap area can be determined based on the electrode area. It will be appreciated that the above described approach is easier to implement and less error in determining the electrode gap region indirectly by determining the electrode region than the approach in which the electrode gap region is determined directly.

Illustratively, the user interface provided by the method 100 may include a first operable control. The first operable control shown in fig. 3 includes an operable control "gray value difference". The first operable control is used for setting a gray level difference threshold between the suspected defect region and the normal region in the region of interest for the aforementioned step S130 in response to an operation of the user. When the gray level difference between pixels in the region of interest exceeds the gray level difference threshold, the relevant pixels may be identified as part of the pixels in the suspected defective region, whereas all pixels may belong to part of the pixels in the normal region. As previously mentioned, the region of interest may be an electrode region in the image of the panel to be detected, or may be an electrode gap region in the image of the panel to be detected.

When the slider after the operable control "enable detection" in fig. 3 slides to the right, it may indicate that the region of interest is an electrode region in the image of the panel to be detected at this time, and then the gray value difference value between the suspected defect region and the normal region in the electrode region is set to 60 by using the "gray value difference value" control 331. The user can adjust the magnitude of the gray level difference threshold by clicking the up and down arrow after "gray level difference" control 331. Specifically, clicking on the up arrow may increase the gray level difference threshold, clicking on the down arrow may decrease the gray level difference threshold.

When the slider after the operable control "gap defect detection enabled" in fig. 3 slides to the right end, it may indicate that the region of interest is an electrode gap region in the image of the panel to be detected at this time, and then foreign matter region detection is performed on the electrode gap region. Similarly, a gray level difference threshold between the suspected defect region and the normal region in the electrode gap region, for example, set to 120, may be set using a "gray level difference" control 332. The numerical adjustment operation for the gray-scale difference threshold is not described here in detail. It is understood that foreign matter region detection for the electrode region and the electrode gap region is performed separately in most cases. In other words, "enable detection" and "enable gap defect detection" in fig. 3 may not be turned on at the same time.

Therefore, the user can reasonably set the gray level difference threshold between the suspected defect area and the normal area in the interested area by utilizing the first operable control according to actual conditions, so that the possibility of misdetecting the normal area as the suspected defect area is reduced, and further, the introduction of excessive calculation data for subsequent calculation is avoided. In addition, the implementation method is convenient for user operation and improves user experience.

Fig. 6 shows a schematic flow chart of step S140 of determining a foreign object region based on a suspected defect region according to an embodiment of the invention. As shown in fig. 6, step S140 may include the following steps.

Step S141, determining the area of the suspected defect area.

For example, after the suspected defect area is identified according to the step S130, the number of all the pixels in the suspected defect area may be counted. It is understood that the number of pixels may reflect the area of the suspected defective area. For example, the number of the pixel points may be directly taken as the area of the suspected defect region. Alternatively, the size of one pixel point may be calculated according to the resolution of the image of the panel to be detected. And multiplying the number of all the pixel points by the size of one pixel point to calculate the area of the suspected defect area.

Step S142, judging whether the suspected defect area meets a preset condition, wherein the preset condition comprises that the area of the suspected defect area meets the area requirement.

After the area of the suspected defect area is determined through the calculation, whether the area of the suspected defect area meets the area requirement or not can be judged. The area requirement may include an area requirement threshold. When the area of the suspected defective region is greater than or equal to the first area requirement threshold and less than or equal to the second area requirement threshold, the suspected defective region may be considered to satisfy a preset condition. Otherwise, it is not satisfied.

In step S143, the suspected defect area satisfying the preset condition is determined as the foreign object area.

For example, the above-described area requirement threshold may be used to represent a minimum or maximum area of the foreign object region. Therefore, when the area of the suspected defective area satisfies the preset condition, the suspected defective area is determined as a foreign object area.

According to the technical scheme, whether the suspected defect area is a foreign object area can be determined by judging whether the area of the suspected defect area meets a preset condition. It can be understood that the area parameter can more directly and accurately represent the difference between the foreign object area and the normal area, and the reliability is higher. In the image, particularly in the electrode area, the conductive particles also have a gray scale difference from the surrounding area, while the area occupied by the conductive particles is typically not too large. The suspected defect area is screened by utilizing the area requirement, so that the interference of conductive particles and the like is eliminated, and the accuracy of foreign matter detection of the panel is effectively improved.

Fig. 7 shows a schematic flow chart of determining the area of the suspected defect area according to step S141 of one embodiment of the invention. As shown in fig. 7, step S141 may include the following steps.

In step S141a, the area of each suspected defect area is determined. Optionally, for each suspected defect area in the region of interest, the number of pixels therein is counted separately.

Step S141b, adding the areas of all the suspected defect areas to obtain the total area of all the suspected defect areas.

The total area of all the suspected defect areas in the region of interest can be obtained by adding the areas of each suspected defect area calculated in step S141 a. It is understood that the above addition is performed in units of suspected defective areas.

For example, the step S142 of determining whether the suspected defective area satisfies the preset condition may include determining whether the total area of the suspected defective area satisfies the total area requirement.

The total area requirement may include an upper total area requirement threshold and a lower total area requirement threshold. The upper threshold of the total area requirement may represent a maximum value of the total area of all suspected defect areas in the region of interest, and the lower threshold of the total area requirement may represent a minimum value of the total area of all suspected defect areas in the region of interest. It is understood that the total area of all suspected defect regions within the region of interest meets the total area requirement when the total area is between the upper total area requirement threshold and the lower total area requirement threshold. Otherwise, the requirements are not satisfied.

It will be appreciated that during actual panel detection, certain noise data may be introduced based on image imaging noise and the like. In the scheme, the condition that the suspected defect area is determined as the foreign object area is further limited, the accuracy of a foreign object area determination result is guaranteed, and the robustness of noise processing is improved.

Illustratively, the region of interest includes an electrode region. Step S141b of adding the areas of all the suspected defective areas to obtain the total area of all the suspected defective areas may include: first, the area of the suspected defect region in each electrode region is determined. As described above, the area of each suspected defective region can be calculated through step S141 a. And may include one or more suspected defect regions in each electrode region. For each electrode region, the areas of all the suspected defect regions are added to determine the area of the suspected defect region in each electrode region. And secondly, adding the areas of the suspected defect areas in all the electrode areas in the region of interest to obtain the total area of the suspected defect areas in all the electrode areas. It is understood that the process of adding the areas of the suspected defect regions in all the electrode regions is performed in units of electrode regions. The total area of the suspected defective regions in all the electrode regions can thus be obtained.

Thus, the areas of the suspected defective regions can be calculated for the respective electrode regions, and if the suspected defective regions are not present in the electrode regions, the areas are not added. Therefore, before the addition operation is performed, the electrode region in which the suspected defect region does not exist can be eliminated, thereby reducing the amount of data to be processed later.

Illustratively, the region of interest includes an electrode region. Step S141 of determining the area of the suspected defect region includes determining the area of the suspected defect region in each electrode region. The determination method is as described above and will not be described in detail herein. Step S142 of determining whether the suspected defect area satisfies the preset condition includes determining whether the area of the suspected defect area in each electrode area satisfies the single area requirement.

Illustratively, the single electrode area requirement may include a single electrode area upper limit and a single electrode area lower limit. Wherein the upper limit of the area of the single electrode represents the maximum value of the total area of all suspected defect areas in one electrode, and the lower limit of the area of the single electrode represents the minimum value of the total area of all suspected defect areas in one electrode. It will be appreciated that when the total area of all suspected defective regions within each electrode region is between the upper single electrode area limit and the lower single electrode area limit, the total area meets the single area requirement. Otherwise, the requirements are not satisfied.

It will be appreciated that each electrode has its own electrical conductivity. And foreign matter in the electrode will affect its electrical conduction effect. In the above scheme, the condition that the suspected defect area is determined to be the foreign object area is further defined to include the area of the suspected defect area in the single electrode area, so that the electrical conduction quality of each electrode in the qualified panel to be detected is ensured, and the quality of the panel to be detected is further ensured.

Illustratively, a second operable control 350, shown in FIG. 3 as "single area lower limit", "single area upper limit", "multiple area lower limit", "defect area lower limit", and "defect area upper limit", may also be included in the user interface provided by the method 100 for setting an area requirement threshold for a suspected defect area in the area of interest in response to a user operation. It is appreciated that the "single area lower limit", "single area upper limit", "multiple area lower limits", and "multiple area lower limits" in the second operable control 350 are valid when the region of interest is an electrode region. The "lower defect area limit" and "upper defect area limit" in the second operable control 350 are valid when the region of interest is an electrode gap region. The function of the second operable control 350 will be understood by those skilled in the art from reading the above description of determining the area of the suspected defect region, and will not be repeated here for brevity. The user can adjust the numerical value of the area requirement threshold by clicking the upper and lower arrows after the single area lower limit, the single area upper limit, the multiple area lower limits, the defect area lower limit and the defect area upper limit. Specifically, clicking on the up arrow may increase the area requirement threshold and clicking on the down arrow may decrease the area requirement threshold.

Therefore, the user can conveniently and rapidly perform self-defined setting on the area requirement threshold according to actual requirements, the requirements of different users are met, and the use experience is improved.

Through the technical scheme, the position of the foreign matter area can be determined on the image of the panel to be detected. In order to facilitate the subsequent operations such as processing the foreign object region, the image in which the foreign object region is detected may be extracted. For example, the user can turn on or off the function of saving the foreign-matter region image by sliding the slider behind the operable control "save small image" shown in fig. 3.

Preferably, the determining of the area of the suspected defect region in step S141 may further include morphological processing of the identified suspected defect region to process a noise region associated with the suspected defect region.

Morphological processing of the identified suspected defect region may include performing operations such as expansion and corrosion, respectively, on the suspected defect region. The expansion operation described above may be understood as enlarging the suspected defect region 210 of fig. 2, for example. Specifically, each pixel in suspected defect region 210 may be scanned with one structural element, and each pixel in the structural element is ored with its covered pixel, which is 0 if both are 0, and is 1 otherwise. Conversely, the etching operation may scan each pixel in suspected defective area 210 with one structural element, and each pixel in the structural element with its covered pixels, with the pixel being 1 if both are 1, and 0 otherwise. Typically, these two operations are performed sequentially, whereby noise regions associated with suspected defective regions can be processed.

Therefore, not only can the noise area connected with the suspected defect area be effectively removed, but also part of pixel points in the interested area contacted with the suspected defect area can be merged into the suspected defect area to fill small holes in the suspected defect area, so that the suspected defect area with smoother boundary and higher accuracy is obtained. Furthermore, an accurate data basis is provided for foreign matter detection of the subsequent panel.

For example, morphological processing of the identified suspected defect regions may include merging suspected defect regions that are less than a merge distance threshold. As previously described, the method 100 may also include providing a user interface. Referring again to fig. 3, the user interface may include a third operable control 340, shown in fig. 3 as a "merge threshold," for setting a merge distance threshold in response to a user operation. The merging distance threshold is used for limiting the distance between adjacent boundaries of different suspected defect areas. And merging the two suspected defect areas when the distance between the adjacent boundaries of the two suspected defect areas is smaller than the merging distance threshold value. Otherwise, no treatment is carried out. For example, the expansion and corrosion operations described above may be combined. The user may adjust the value of the combined distance threshold by clicking the arrow after "combining threshold". Specifically, clicking on the up arrow may increase the merge distance threshold and clicking on the down arrow may decrease the merge distance threshold.

Therefore, under the condition that interference data affecting the detection result of the foreign object region is not increased, the combined suspected defect region contains more effective information about the detection of the foreign object region, and the accuracy of the detection result of the panel is improved.

According to another aspect of the present invention, there is also provided a panel detection apparatus. Fig. 8 shows a schematic block diagram of a panel detection device 800 according to an embodiment of the invention. As shown in fig. 8, the apparatus 800 includes an image acquisition module 810, an ROI determination module 820, a primary identification module 830, and a foreign object determination module 840.

The image acquisition module 810 is configured to acquire an image of a panel to be detected.

The ROI determination module 820 is used to determine a region of interest in an image of a panel to be detected.

The primary identifying module 830 is configured to identify a suspected defect region in the region of interest based on a gray scale difference between pixels in the region of interest.

The foreign object determination module 840 is configured to determine a foreign object region based on the suspected defect region.

According to still another aspect of the present invention, there is also provided an electronic apparatus. Fig. 9 shows a schematic block diagram of an electronic device 900 according to an embodiment of the invention. As shown in fig. 9, the electronic device 900 includes a processor 910 and a memory 920. Wherein the memory 920 stores computer program instructions that, when executed by the processor 910, are configured to perform the panel detection method 100 described above.

According to still another aspect of the present invention, there is also provided a storage medium. Program instructions are stored on the storage medium that, when executed, are used to perform the panel detection method 100 described above. The storage medium may include, for example, a storage component of a tablet computer, a hard disk of a personal computer, read-only memory (ROM), erasable programmable read-only memory (EPROM), portable compact disc read-only memory (CD-ROM), USB memory, or any combination of the foregoing storage media. The computer-readable storage medium may be any combination of one or more computer-readable storage media.

Those skilled in the art will understand the specific implementation schemes of the panel detection apparatus, the electronic device and the storage medium by reading the above description about the panel detection method, and for brevity, the description is omitted here.

Although the illustrative embodiments have been described herein with reference to the accompanying drawings, it is to be understood that the above illustrative embodiments are merely illustrative and are not intended to limit the scope of the present invention thereto. Various changes and modifications may be made therein by one of ordinary skill in the art without departing from the scope and spirit of the invention. All such changes and modifications are intended to be included within the scope of the present invention as set forth in the appended claims.

Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.

In the several embodiments provided by the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the above-described device embodiments are merely illustrative, e.g., the division of the elements is merely a logical functional division, and there may be additional divisions when actually implemented, e.g., multiple elements or components may be combined or integrated into another device, or some features may be omitted or not performed.

In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.

Similarly, it should be appreciated that in order to streamline the invention and aid in understanding one or more of the various inventive aspects, various features of the invention are sometimes grouped together in a single embodiment, figure, or description thereof in the description of exemplary embodiments of the invention. However, the method of the present invention should not be construed as reflecting the following intent: i.e., the claimed invention requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this invention.

It will be understood by those skilled in the art that all of the features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the processes or units of any method or apparatus so disclosed, may be combined in any combination, except combinations where the features are mutually exclusive. Each feature disclosed in this specification (including any accompanying claims, abstract and drawings), may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise.

Furthermore, those skilled in the art will appreciate that while some embodiments described herein include some features but not others included in other embodiments, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, in the claims, any of the claimed embodiments may be used in any combination.

Various component embodiments of the invention may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. Those skilled in the art will appreciate that some or all of the functions of some of the modules in a panel detection arrangement according to embodiments of the invention may be implemented in practice using a microprocessor or Digital Signal Processor (DSP). The present invention can also be implemented as an apparatus program (e.g., a computer program and a computer program product) for performing a portion or all of the methods described herein. Such a program embodying the present invention may be stored on a computer readable medium, or may have the form of one or more signals. Such signals may be downloaded from an internet website, provided on a carrier signal, or provided in any other form.

It should be noted that the above-mentioned embodiments illustrate rather than limit the invention, and that those skilled in the art will be able to design alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The invention may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The use of the words first, second, third, etc. do not denote any order. These words may be interpreted as names.

The foregoing description is merely illustrative of specific embodiments of the present invention and the scope of the present invention is not limited thereto, and any person skilled in the art can easily think about variations or substitutions within the scope of the present invention. The protection scope of the invention is subject to the protection scope of the claims.

Claims

1. A panel inspection method, comprising:

acquiring an image of a panel to be detected;

Determining a region of interest in an image of the panel to be detected;

Identifying a suspected defect region in the region of interest based on a gray level difference between pixels in the region of interest;

morphological processing is carried out on the identified suspected defect area so as to process a noise area related to the suspected defect area; wherein the morphological processing of the identified suspected defect region comprises: merging the suspected defect areas with the distance smaller than the merging distance threshold value; and

Determining a foreign object region based on the suspected defect region;

wherein the method further comprises:

A user interface is provided, wherein the user interface includes a third operable control for setting the merge distance threshold in response to a user operation.

2. The method of claim 1, wherein the determining a foreign object region based on the suspected defect region comprises:

Determining the area of the suspected defect area;

judging whether the suspected defect area meets a preset condition, wherein the preset condition comprises that the area of the suspected defect area meets an area requirement; and

And determining the suspected defect area meeting the preset condition as a foreign object area.

3. The method of claim 2, wherein,

The determining the area of the suspected defect area comprises:

Determining the area of each suspected defect area;

adding the areas of all the suspected defect areas to obtain the total area of all the suspected defect areas;

The judging whether the suspected defect area meets the preset condition comprises the following steps:

and judging whether the total area of the suspected defect area meets the total area requirement.

4. The method of claim 3, wherein the region of interest comprises an electrode region,

The adding the areas of all the suspected defective areas to obtain the total area of all the suspected defective areas includes:

determining an area of a suspected defect region in each electrode region;

And adding the areas of the suspected defect areas in all the electrode areas in the region of interest to obtain the total area of the suspected defect areas in all the electrode areas.

5. The method of claim 2, wherein the region of interest comprises an electrode region,

The determining the area of the suspected defect area comprises:

determining an area of a suspected defect region in each electrode region;

and judging whether the area of the suspected defect area in each electrode area meets the single area requirement or not.

6. The method of claim 1, wherein the determining a region of interest in the image of the panel to be detected comprises:

And image segmentation is carried out on the image of the panel to be detected according to a gray threshold value so as to extract electrode areas in the image of the panel to be detected, wherein the region of interest comprises the electrode areas.

7. The method of claim 6, wherein the method further comprises:

receiving coordinates of a target area input by a user;

cutting out a target area from the image of the panel to be detected according to the coordinates of the target area;

the image segmentation of the image of the panel to be detected according to the gray threshold value to extract the electrode area in the image of the panel to be detected comprises:

image segmentation is performed for the target region to determine the electrode region.

8. The method of claim 1, wherein the determining a region of interest in the image of the panel to be detected comprises:

Responding to the operation of a user on the image of the panel to be detected, and acquiring boundary coordinates of an electrode area in the image;

and determining the electrode region according to the boundary coordinates, wherein the region of interest comprises the electrode region.

9. The method of claim 8, wherein the determining the electrode region from boundary coordinates comprises:

And scaling the boundary of the electrode region in response to an adjustment operation of the boundary coordinates by a user.

10. The method of claim 1, wherein the determining a region of interest in the image of the panel to be detected comprises:

determining an electrode area in an image of the panel to be detected;

An electrode gap region is determined from the electrode regions, wherein the region of interest includes the electrode gap region.

11. A panel detection device, comprising:

the image acquisition module is used for acquiring an image of the panel to be detected;

The ROI determining module is used for determining a region of interest in the image of the panel to be detected;

The primary identification module is used for identifying suspected defect areas in the region of interest based on gray level differences among pixels in the region of interest; morphological processing is carried out on the identified suspected defect area so as to process a noise area related to the suspected defect area; wherein the primary identifying module morphologically processing the identified suspected defect region comprises performing the following operations: merging the suspected defect areas with the distance smaller than the merging distance threshold value;

a foreign object determination module for determining a foreign object region based on the suspected defect region;

a setting module for providing a user interface, wherein the user interface includes a third operable control for setting the merge distance threshold in response to a user operation.

12. An electronic device comprising a processor and a memory, wherein the memory has stored therein computer program instructions which, when executed by the processor, are adapted to carry out the panel detection method of any one of claims 1 to 10.

13. A storage medium having stored thereon program instructions for performing the panel detection method of any one of claims 1 to 10 when run.