CN114323444A - High-temperature-resistant sealed cavity testing device and configuration method - Google Patents
High-temperature-resistant sealed cavity testing device and configuration method Download PDFInfo
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- CN114323444A CN114323444A CN202111483053.XA CN202111483053A CN114323444A CN 114323444 A CN114323444 A CN 114323444A CN 202111483053 A CN202111483053 A CN 202111483053A CN 114323444 A CN114323444 A CN 114323444A
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Abstract
The application discloses seal chamber testing arrangement, including inner conductor, insulation support, first outer conductor, second outer conductor, third outer conductor. The first outer conductor bulges to form a cylindrical cavity with one open end, and the bottom of the cavity is provided with a hole. The inner conductor and the insulating support, and the insulating support and the bottom hole wall of the first outer conductor are combined through high-temperature sintering, and the combined parts of the inner conductor, the insulating support and the bottom hole wall of the first outer conductor form a first coaxial transmission line. The hole wall of the first outer conductor faces one end of the cavity and is matched with the outer wall of the second outer conductor, and the inner wall of the second outer conductor and the inner conductor form a second coaxial transmission line. The hole wall of the first outer conductor is far away from one end of the cavity and is matched with the outer wall of the third outer conductor, and the inside of the third outer conductor and the inner conductor form a third coaxial transmission line. The application also includes a method of configuring the device. The application solves the problem that the structural change of the sealing material at high temperature influences the product testing precision.
Description
Technical Field
The application relates to the technical field of microwaves, in particular to a high-temperature-resistant sealing cavity testing device.
Background
The normal temperature sealing test device is mainly applied to a test environment at a temperature of less than 400 ℃, and in an application environment at a temperature of more than 400 ℃, relative positions of various parts in a product can change, so that the product performance is influenced, and a test system is damaged most seriously.
Disclosure of Invention
The high-temperature-resistant sealing cavity testing device provided by the invention is mainly applied to solving the problem that the structural change of a sealing environment at high temperature influences the testing precision of a product.
The embodiment of the application provides a sealed cavity testing device, which comprises an inner conductor, an insulating support, a first outer conductor, a second outer conductor and a third outer conductor;
the first outer conductor bulges to form a cylindrical cavity with one open end, and the bottom of the cavity is provided with a hole;
the inner conductor and the insulating support, and the insulating support and the bottom hole wall of the first outer conductor are combined through high-temperature sintering, and the combined parts of the inner conductor, the insulating support and the bottom hole wall of the first outer conductor form a first coaxial transmission line;
the wall of the first outer conductor hole faces one end of the cavity and is matched with the outer wall of the second outer conductor, and the inner wall of the second outer conductor and the inner conductor form a second coaxial transmission line;
the hole wall of the first outer conductor is far away from one end of the cavity and is matched with the outer wall of the third outer conductor, and the inside of the third outer conductor and the inner conductor form a third coaxial transmission line.
The application also provides a method for configuring the sealing cavity testing device, which comprises the following steps:
the inner conductor, the first outer conductor and the insulating support are sintered at high temperature to test the electrical property and the sealing property;
the second outer conductor and the third outer conductor are screwed into the device completed in the last step through threads, and an SMA type standard transmission interface is arranged;
and filling elastic sealing strips in the sealing grooves, and screwing the device into the furnace wall of the high-temperature sealing device through threads.
At least one technical scheme adopted by the embodiment of the application can achieve the following beneficial effects:
the invention provides a high-temperature-resistant sealed cavity testing device which is developed for meeting the special testing requirement of a 800 ℃ sealed cavity, can isolate a testing environment and an external testing environment at the temperature of 800 ℃, can stably transmit signals at the high-temperature environment, can seal a testing cavity and protect testing equipment in the cavity to reliably run. The application has the advantages of stable structure, convenience in maintenance and excellent performance, and can well meet the test requirements in the test environment with special requirements.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
FIG. 1 is a schematic view of an embodiment of the apparatus of the present application;
FIG. 2 is a schematic view of the apparatus of the present application in combination with a furnace wall.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be described in detail and completely with reference to the following specific embodiments of the present application and the accompanying drawings. It should be apparent that the described embodiments are only some of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The technical solutions provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of an embodiment of the apparatus of the present application.
A sealed cavity testing device comprises an inner conductor 1, an insulating support 5, a first outer conductor 2, a second outer conductor 3 and a third outer conductor 4;
the first outer conductor bulges to form a cylindrical cavity with one open end, and the bottom of the cavity is provided with a hole;
the inner conductor and the insulating support, and the insulating support and the bottom hole wall of the first outer conductor are combined through high-temperature sintering, and the combined parts of the inner conductor, the insulating support and the bottom hole wall of the first outer conductor form a first coaxial transmission line;
the wall of the first outer conductor hole faces one end of the cavity and is matched with the outer wall of the second outer conductor, and the inner wall of the second outer conductor and the inner conductor form a second coaxial transmission line;
the hole wall of the first outer conductor is far away from one end of the cavity and is matched with the outer wall of the third outer conductor, and the inside of the third outer conductor and the inner conductor form a third coaxial transmission line.
Preferably, the first coaxial transmission line, the second coaxial transmission line and the third coaxial transmission line have the same characteristic impedance.
Furthermore, the second outer conductor, the third outer conductor and the first outer conductor are connected through threads, and installation is convenient. Preferably, the first outer conductor bottom hole wall and the second outer conductor outer surface are matched through threads; the bottom hole wall of the first outer conductor is matched with the outer surface of the third outer conductor through threads.
Furthermore, the two ends of the inner conductor are grooved and are respectively connected with the inner data transmission line and the outer data transmission line. Preferably, the second outer conductor and the inner conductor constitute a standard SMA connector; the second outer conductor extends into the cavity, and the outer surface of the second outer conductor is provided with screwing threads; the inner conductor extends into the cavity, and the top end of the inner conductor is in a petal shape. The third outer conductor and the inner conductor form a standard SMA connector; the part of the third outer conductor far away from the first outer conductor is provided with screw threads on the outer surface; the top end of the inner conductor is in a petal shape, and the part of the inner conductor is far away from the first outer conductor.
For example, in the preferred embodiment of the present application, the inner conductor, the dielectric support, the first outer conductor, the second outer conductor and the third outer conductor are integrally formed into a 50 ohm coaxial transmission line, and the operating frequency can reach 3 GHz. Wherein the material of the inner conductor and the first outer conductor is kovar alloy, and the material of the second outer conductor and the third outer conductor is brass. Preferably, the inner conductor and the first outer conductor are integrally connected via the insulating support, and the three parts are connected by soldering.
FIG. 2 is a schematic view of the apparatus of the present application in combination with a furnace wall. As shown in FIG. 2, the high temperature resistant sealed chamber testing device of the present application is combined with a furnace wall 6 of a high temperature device.
The coaxial cavity of the first outer conductor is provided with a coaxial outer surface, and the outer surface is provided with threads and is connected with the furnace wall through threads. The outer surface of the part of the first outer conductor, which is far away from the cavity, is expanded to be a flange plate in a direction perpendicular to the axial direction. And one surface of the flange plate facing the cavity is provided with a sealing groove 7.
The first area is a test cavity, the interior of the test cavity is high in temperature and filled with inert gas, and a device to be tested is located in the test cavity. The test data of the device in the high temperature environment is conducted to the external test instrument via the standard SMA connector interface (second, third outer conductor). The whole test equipment in the whole process can ensure the stable environment state in the cavity and can effectively solve the problem of the conduction of the internal temperature to the outside.
This application still provides high temperature resistant seal chamber testing arrangement's processing and debugging method, and the device of this application includes inner conductor, insulating support, first outer conductor, second outer conductor and third outer conductor, and its assembling process is:
firstly, an inner conductor 1, a first outer conductor 2 and an insulating support 5 are sintered at high temperature, and the electrical property and the sealing property of the device are tested;
in the second step, the second and third outer conductors 3, 4 are screwed into the device completed in the first step. The main purpose is to provide the device with a standard transmission interface (SMA type).
And thirdly, filling an elastic sealing strip, such as a sealing ring made of rubber, in the sealing groove during testing. The device of the present application is screwed into the high temperature seal device furnace wall 6.
The inner conductor and the outer conductor of the test equipment provided by the invention are combined to form a coaxial transmission system for transmitting radio frequency signals with the highest frequency of 3 GHz.
Compared with the prior art, the invention provides a high-temperature-resistant sealing cavity testing device. As an inventive whole, the sealing structure can ensure the whole sealing in a high-temperature environment of 800 ℃. Compared with the existing sealing test device, the equipment provided by the invention has higher working temperature and better reliability;
it should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The above description is only an example of the present application and is not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.
Claims (10)
1. A sealed cavity testing device is characterized by comprising an inner conductor, an insulating support, a first outer conductor, a second outer conductor and a third outer conductor;
the first outer conductor bulges to form a cylindrical cavity with one open end, and the bottom of the cavity is provided with a hole;
the inner conductor and the insulating support, and the insulating support and the bottom hole wall of the first outer conductor are combined through high-temperature sintering, and the combined parts of the inner conductor, the insulating support and the bottom hole wall of the first outer conductor form a first coaxial transmission line;
the wall of the first outer conductor hole faces one end of the cavity and is matched with the outer wall of the second outer conductor, and the inner wall of the second outer conductor and the inner conductor form a second coaxial transmission line;
the hole wall of the first outer conductor is far away from one end of the cavity and is matched with the outer wall of the third outer conductor, and the inside of the third outer conductor and the inner conductor form a third coaxial transmission line.
2. The seal testing apparatus of claim 1, wherein the first coaxial transmission line, the second coaxial transmission line, and the third coaxial transmission line have the same characteristic impedance.
3. The seal testing apparatus of claim 1, wherein the first outer conductor and the second outer conductor are threadably engaged; and/or the first outer conductor and the third outer conductor are matched through threads.
4. The seal testing apparatus of claim 1, wherein the second outer conductor and the inner conductor comprise a standard SMA connector; the second outer conductor extends into the cavity, and the outer surface of the second outer conductor is provided with screwing threads; the inner conductor extends into the cavity, and the top end of the inner conductor is in a petal shape.
5. The seal testing apparatus of claim 1, wherein the third outer conductor and the inner conductor comprise a standard SMA connector; the part of the third outer conductor far away from the first outer conductor is provided with screw threads on the outer surface; the top end of the inner conductor is in a petal shape, and the part of the inner conductor is far away from the first outer conductor.
6. The seal testing apparatus of claim 1, wherein the coaxial cavity of the first outer conductor has a coaxial outer surface configured with threads.
7. The seal testing apparatus of claim 1, wherein a portion of the outer surface of the first outer conductor remote from the cavity is bulged perpendicularly to the axial direction as a flange.
8. The seal testing apparatus of claim 7, wherein a face of the flange facing the cavity is provided with a seal groove.
9. A method for configuring a sealed chamber testing device, which is used for the device of any one of claims 1-8, and comprises the following steps:
the inner conductor, the first outer conductor and the insulating support are sintered at high temperature to test the electrical property and the sealing property;
the second outer conductor and the third outer conductor are screwed into the device completed in the last step through threads, and an SMA type standard transmission interface is arranged.
10. The method of claim 9, further comprising the step of:
and filling elastic sealing strips in the sealing grooves, and screwing the device into the furnace wall of the high-temperature sealing device through threads.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202111483053.XA CN114323444A (en) | 2021-12-07 | 2021-12-07 | High-temperature-resistant sealed cavity testing device and configuration method |
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| CN202111483053.XA CN114323444A (en) | 2021-12-07 | 2021-12-07 | High-temperature-resistant sealed cavity testing device and configuration method |
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