CN114296120A - Special test circuit and method for cadmium zinc telluride detector - Google Patents
Special test circuit and method for cadmium zinc telluride detector Download PDFInfo
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- CN114296120A CN114296120A CN202111600957.6A CN202111600957A CN114296120A CN 114296120 A CN114296120 A CN 114296120A CN 202111600957 A CN202111600957 A CN 202111600957A CN 114296120 A CN114296120 A CN 114296120A
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Abstract
The application provides a special test circuit and a special test method for a cadmium zinc telluride detector. The special test circuit for the cadmium zinc telluride detector comprises: the interface module of the tellurium-zinc-cadmium detector is used for connecting the tellurium-zinc-cadmium detector to be detected; the power supply module is used for supplying power to the cadmium zinc telluride detector connected to the cadmium zinc telluride detector interface module; and the signal output module is used for outputting the test signal of the cadmium zinc telluride detector. The power supply module comprises a boosting module for boosting an input voltage as a low voltage to a high voltage. The invention realizes a special test circuit and a special test method for a cadmium zinc telluride detector, a high-voltage module used by the special test circuit is small in size and low in noise, and can realize software-based accurate voltage regulation by matching with a micro-control unit and simultaneously support a plurality of cadmium zinc telluride detectors to work.
Description
Technical Field
The application relates to the field of radiation detector test circuits, in particular to a special test circuit and a special test method for a cadmium zinc telluride detector.
Background
Cadmium Zinc Telluride (CZT) is a semiconductor material which can be used for ray detection, a high-voltage module with low ripple and about 1000V is generally required for testing the CZT detector, and the high-voltage value is required to be continuously adjusted in the testing process to obtain the optimal working voltage of the CZT detector. In the test process of the CZT detector, high voltage required by the operation of the CZT detector is provided, when rays enter the CZT crystal, energy deposition outputs an electric signal, and the electric signal generates a pulse signal which can be processed by an oscilloscope or a multi-channel MCA through a front-end circuit and a shaping amplification circuit. Conventional high voltage modules are typically based on NIM chassis. NIM machine case is bulky, and the regulation of voltage is all based on manual knob, and uncontrollable is comparatively accurate, and CZT's signal processing also often needs to handle through a plurality of NIM amplifier modules and just can obtain the high quality signal that analog-to-digital converter (ADC) can handle, when having a plurality of CZT detectors to measure simultaneously, whole measurement system can become more complicated.
Disclosure of Invention
The application aims to provide a special test circuit and a special test method for a cadmium zinc telluride detector, a high-voltage module used by the special test circuit is small in size and low in noise, and can realize accurate voltage regulation based on software by matching with a Micro Control Unit (MCU), and can simultaneously support a plurality of cadmium zinc telluride detectors to work.
The purpose of the application is realized by adopting the following technical scheme:
in a first aspect, the present application provides a special test circuit for a cadmium zinc telluride detector, the circuit including: the interface module of the tellurium-zinc-cadmium detector is used for connecting the tellurium-zinc-cadmium detector to be detected; the power supply module is used for supplying power to the cadmium zinc telluride detector connected to the cadmium zinc telluride detector interface module; and the signal output module is used for outputting the test signal of the cadmium zinc telluride detector. The power supply module includes a boosting module for boosting an input voltage as a low voltage to a high voltage.
In some optional embodiments, the boost module is a 12V to 2000V boost module for boosting an input voltage of 12V to a high voltage below 2000V.
The technical scheme has the advantages that according to the special test circuit for the cadmium zinc telluride detector, the voltage is provided through the low-noise boosting module of 12V to 2000V, compared with the traditional special test circuit for the cadmium zinc telluride detector, the used high-voltage module is small in size and low in noise, and the miniaturization of the special test circuit for the cadmium zinc telluride detector is realized.
In some optional embodiments, the special test circuit for the cadmium zinc telluride detector further includes a micro control unit module configured to configure a digital-to-analog converter, apply a signal output by the digital-to-analog converter to the voltage regulating circuit, and further adjust a high voltage output to the cadmium zinc telluride detector. And the special test circuit for the cadmium zinc telluride detector can further comprise a communication module which is used for communicating with the micro control unit module through a USB communication interface by utilizing high-voltage configuration software to configure the output voltage of the digital-to-analog converter.
The technical scheme has the beneficial effects that according to the special test circuit for the cadmium zinc telluride detector, the digital-to-analog converter can be configured through the micro-control unit module, signals output by the digital-to-analog converter act on the voltage regulating circuit, so that the high voltage output to the cadmium zinc telluride detector is regulated, and the targeted regulation of the voltage supplied to the cadmium zinc telluride detector is realized. In addition, a user may use high voltage configuration software to communicate with the micro-control unit module via the USB communication interface to configure the digital-to-analog converter (DAC) to precisely adjust the high voltage ultimately output to the CZT detector.
In some optional embodiments, the circuit further includes a temperature compensation module, configured to monitor a temperature of the cadmium zinc telluride detector by using an on-board thermistor, and adjust the output voltage of the digital-to-analog converter in real time by the micro control unit module when the temperature of the cadmium zinc telluride detector changes, so as to compensate the temperature of the high voltage supplied to the cadmium zinc telluride detector connected to the interface module of the cadmium zinc telluride detector. The temperature of the cadmium zinc telluride detector monitored by the on-board thermistor is converted into a digital signal through an analog-to-digital converter in the micro-control unit module.
Because the temperature of the electronic components can be different under different working conditions and working environments, the characteristics of the components can be different under different temperatures, and the temperature characteristics of individual components can seriously influence the precision of the CZT detector. The technical scheme has the advantages that the onboard thermistor is utilized to monitor the temperature of the cadmium zinc telluride detector according to the special test circuit for the cadmium zinc telluride detector, and the output voltage of the digital-to-analog converter can be adjusted in real time through the micro control unit module when the temperature of the cadmium zinc telluride detector changes, so that the high voltage supplied to the cadmium zinc telluride detector connected to the interface module of the cadmium zinc telluride detector is subjected to temperature compensation, and the high voltage finally output to the CZT detector is adjusted more accurately.
In some optional embodiments, the interface module of the cadmium zinc telluride detector includes interfaces of a plurality of cadmium zinc telluride detectors, and the interfaces of the plurality of cadmium zinc telluride detectors can be respectively connected to a plurality of cadmium zinc telluride detectors to be detected. The signal output module comprises a plurality of operational amplifier circuits which respectively correspond to the interfaces of the cadmium zinc telluride detectors so as to simultaneously output a plurality of paths of test signals of the cadmium zinc telluride detectors.
The technical scheme has the advantages that the interfaces of the plurality of cadmium zinc telluride detectors are configured, the plurality of cadmium zinc telluride detectors to be detected can be simultaneously connected, and the simultaneous output of the test signals of the plurality of cadmium zinc telluride detectors is realized by utilizing the plurality of operational amplifier circuits respectively corresponding to the interfaces of the plurality of cadmium zinc telluride detectors, so that the test work of the plurality of cadmium zinc telluride detectors is simultaneously supported.
In a second aspect, the present application provides a method for testing a cadmium zinc telluride detector, including: connecting a cadmium zinc telluride detector to be detected to a cadmium zinc telluride detector interface; supplying power to a cadmium zinc telluride detector connected to the cadmium zinc telluride detector interface; and outputting a test signal of the cadmium zinc telluride detector. The system comprises a voltage boosting module, a cadmium zinc telluride detector, a power supply module and a power supply module, wherein the voltage boosting module is used for boosting input voltage serving as low voltage into high voltage so as to supply the high voltage to the cadmium zinc telluride detector connected with an interface of the cadmium zinc telluride detector. In some optional embodiments, the boost module is a 12V to 2000V boost module for boosting an input voltage of 12V to a high voltage below 2000V.
The technical scheme has the beneficial effects that according to the special test method for the cadmium zinc telluride detector, the voltage is provided through the low-noise boosting module of 12V to 2000V, and compared with the traditional special test method for the cadmium zinc telluride detector, the high-voltage module used is small in size and low in noise.
In some optional embodiments, the special test method for the cadmium zinc telluride detector further includes configuring a digital-to-analog converter by using the micro-control unit module, and applying a signal output by the digital-to-analog converter to the voltage regulating circuit so as to adjust the high voltage output to the cadmium zinc telluride detector. In addition, the special test method for the cadmium zinc telluride detector can further configure the output voltage of the digital-to-analog converter by using a communication module to communicate with the micro control unit through a USB communication interface by using high-voltage configuration software.
The technical scheme has the beneficial effects that according to the special test method for the cadmium zinc telluride detector, the digital-to-analog converter can be configured through the micro-control unit module, the signal output by the digital-to-analog converter acts on the voltage regulating circuit, so that the high voltage output to the cadmium zinc telluride detector is regulated, and the targeted regulation of the voltage supplied to the cadmium zinc telluride detector is realized. In addition, a user may use high voltage configuration software to communicate with the MCU through the USB communication interface to configure the digital-to-analog converter (DAC) to precisely adjust the high voltage ultimately output to the CZT detector.
In some optional embodiments, the method further includes monitoring the temperature of the cadmium zinc telluride detector by using an on-board thermistor, and adjusting the output voltage of the digital-to-analog converter in real time by the micro-control unit module when the temperature of the cadmium zinc telluride detector changes so as to compensate the temperature of the high voltage supplied to the cadmium zinc telluride detector connected to the cadmium zinc telluride detector interface module.
Because the temperature of the electronic components can be different under different working conditions and working environments, the characteristics of the components can be different under different temperatures, and the temperature characteristics of individual components can seriously influence the precision of the CZT detector. The technical scheme has the advantages that according to the special test method for the cadmium zinc telluride detector, the onboard thermistor is utilized to monitor the temperature of the cadmium zinc telluride detector, the output voltage of the digital-to-analog converter can be adjusted in real time through the micro control unit module when the temperature of the cadmium zinc telluride detector changes, so that the high voltage supplied to the cadmium zinc telluride detector connected to the interface module of the cadmium zinc telluride detector is subjected to temperature compensation, and the high voltage finally output to the CZT detector is adjusted more accurately.
Drawings
The present application is further described below with reference to the drawings and examples.
FIG. 1 is a schematic diagram of a special test circuit for a cadmium zinc telluride detector according to an embodiment of the present application;
FIG. 2 is a schematic structural diagram of a special test circuit for a cadmium zinc telluride detector according to another embodiment of the present application;
FIG. 3 is a schematic structural diagram of a special test circuit for a cadmium zinc telluride detector according to another embodiment of the present application;
FIG. 4 is a functional block diagram of a test circuit dedicated to a cadmium zinc telluride detector according to another embodiment of the present application;
FIG. 5 is a schematic flow chart of a special testing method for a cadmium zinc telluride detector according to an embodiment of the present application;
FIG. 6 is a schematic flow chart of a special testing method for a cadmium zinc telluride detector according to another embodiment of the present application;
fig. 7 is a schematic flow chart of a special testing method for a cadmium zinc telluride detector according to another embodiment of the present application.
Detailed Description
The present application is further described with reference to the accompanying drawings and the detailed description, and it should be noted that, in the present application, the embodiments or technical features described below may be arbitrarily combined to form a new embodiment without conflict.
Various embodiments of the cadmium zinc telluride detector specific test circuit of the present application will be described in detail below.
[ example 1]
Referring to fig. 1, the test circuit 100 dedicated to the cadmium zinc telluride detector includes: the interface module 101 of the cadmium zinc telluride detector is used for connecting the cadmium zinc telluride detector to be detected; the power supply module 102 is used for supplying power to the cadmium zinc telluride detector connected to the cadmium zinc telluride detector interface module 101; and the signal output module 103 is used for outputting the test signal of the cadmium zinc telluride detector. The power supply module 102 includes a boosting module for boosting an input voltage, which is a low voltage, to a high voltage. The method comprises the following specific steps:
the module 101: and a cadmium zinc telluride detector interface module.
The interface module 101 of the cadmium zinc telluride detector is used for connecting the cadmium zinc telluride detector to be detected.
In some optional embodiments, the interface module 101 of the cdte detector may include a plurality of interfaces of the cdte detector, and the plurality of interfaces of the cdte detector can be respectively connected to a plurality of cdte detectors to be detected.
As an example shown in fig. 4 of the present invention, the cadmium zinc telluride detector includes a power supply positive terminal, a ground terminal, and a signal terminal, respectively. When the cadmium zinc telluride detector is tested, the positive end, the grounding end and the signal end of the power supply of the cadmium zinc telluride detector are correspondingly connected with the positive end, the grounding end and the signal end of the power supply of the cadmium zinc telluride detector interface, so that the cadmium zinc telluride detector is connected. The work principle of the cadmium zinc telluride detector is as follows: the cadmium zinc telluride detector has two electrodes and is applied with certain bias voltage. When the incident particles enter the sensitive area of the cadmium zinc telluride detector, electron-hole pairs are generated. Upon application of a voltage to the electrodes, the charge carriers drift towards the electrodes and charges are induced on the collecting electrodes, forming signal pulses in an external circuit. However, in the cadmium zinc telluride detector, the average energy consumed by the incident particles to generate an electron-hole pair is about one tenth of the energy consumed by the gas ionization chamber to generate an ion pair, so that the cadmium zinc telluride detector has much better energy resolution than the scintillation counter and the gas ionization detector.
As an example shown in fig. 4 of the present invention, the testing circuit dedicated to the cadmium zinc telluride detector may include 4 interfaces of the cadmium zinc telluride detector to simultaneously connect 4 CZT detectors, so as to simultaneously test the 4 CZT detectors. It should be noted that in the example of fig. 4, the cdte detector specific test circuit contains 4 cdte detector interfaces. However, in practical applications, a person skilled in the art can choose to set up different numbers of cadmium zinc telluride detector interfaces, such as 1, 2, 3, 6, 8, etc., as required.
The module 102: power supply module
The power supply module 102 is used for supplying power to the cadmium zinc telluride detector connected to the cadmium zinc telluride detector interface module 101. The power supply module 102 includes a boosting module for boosting an input voltage, which is a low voltage, to a high voltage.
In some optional embodiments, the boost module is a 12V to 2000V boost module for boosting an input voltage of 12V to a high voltage below 2000V.
It should be noted that 12V to 2000V low noise boost modules are selected to provide the voltage in this embodiment. However, in practical applications, those skilled in the art can select boosting modules with different specifications to provide voltages according to needs. For example, 5V to 1000V, 5V to 2000V, 12V to 2000V boost modules and the like can be used in the special test circuit for the cadmium zinc telluride detector of the present invention. Commercially available boost modules may be used, such as the Hamamatsu CC228-01Y boost module, Hamamatsu CC228-02Y boost module, the XPPower P12P boost module, and the like.
The traditional high-voltage module is generally based on an NIM case and has larger volume. NIM is an abbreviation for Nuclear Instrument plug-in standard (Nuclear Instrument Module). The NIM chassis is a mounting body or box for mounting NIM cards, behind which are mounted bus connectors for mating with the connectors of the cards. The bus connector provides power to each card. The sizes of the chassis and the plug-in of the NIM system, the power supply, the plug, the input logic level and the output logic level have uniform specifications, so that the NIM system has interchangeability, and various functional unit plug-ins can be conveniently arranged in a standard box body to form an instrument circuit according to actual requirements. NIM systems typically accomplish the input and output of data through coaxial cables connected to plugs on the front panel of the card. When the input and output data are more, the connecting cable can shield the mark and data display on the plug-in panel, so that the operation is inconvenient. The signal processing of CZT also often requires processing by multiple NIM amplifier modules to obtain a high quality signal that can be processed by an analog-to-digital converter (ADC), and especially when multiple CZT detectors need to be measured at the same time, the whole measurement system becomes more complex.
The present embodiment provides a low noise boost module, for example, 12V to 2000V, to provide the voltage. The size of the miniaturized boost module may be, for example, 35.1 × 17.3 × 6.4 mm. The conventional high voltage power module is required to be used with an NIM chassis having a large size, such as a 4001A NIM chassis manufactured by ORTEC corporation of usa, which has a size of 22.2 × 48.3 × 27.3 cm. Therefore, compared with the traditional high-voltage module, the special test circuit for the cadmium zinc telluride detector provides voltage through the boost module, has small volume and low noise, and can realize the miniaturization of the special test circuit for the cadmium zinc telluride detector.
The module 103: and a signal output module.
The signal output module 103 is used for outputting a test signal of the cadmium zinc telluride detector.
In some optional embodiments, the signal output module 103 includes a plurality of operational amplifier circuits respectively corresponding to the interfaces of the plurality of cadmium zinc telluride detectors, so as to output the test signals of the plurality of cadmium zinc telluride detectors simultaneously. The operational amplifier circuit is a circuit composed of operational amplifiers, and is called an operational amplifier because it can amplify a weak signal in application, and can also be used as an inverting and voltage follower to perform addition and subtraction operations on an electrical signal. Sometimes, a voltage stabilizing circuit is used for manufacturing a high-precision voltage stabilizing filter circuit.
Therefore, according to the test circuit 100 dedicated to the cadmium zinc telluride detector of the embodiment, the low-noise boost module of 12V to 2000V provides voltage, compared with the conventional test circuit dedicated to the cadmium zinc telluride detector, the high-voltage module used is small in size and low in noise, and the test circuit dedicated to the cadmium zinc telluride detector is miniaturized. In addition, the interfaces of the plurality of cadmium zinc telluride detectors are configured, the plurality of cadmium zinc telluride detectors to be detected can be simultaneously connected, and the test signals of the plurality of cadmium zinc telluride detectors are simultaneously output by utilizing the plurality of operational amplifier circuits respectively corresponding to the interfaces of the plurality of cadmium zinc telluride detectors, so that the test work of the plurality of cadmium zinc telluride detectors is simultaneously supported.
[ example 2]
Referring to fig. 2, another embodiment of the present application provides a test circuit 100' dedicated for a cadmium zinc telluride detector, which includes modules 101 to 103, and further includes:
the module 104: a micro control unit module; and
the module 105: and a communication module.
The micro-control unit module 104 is configured to configure a digital-to-analog converter, and apply a signal output by the digital-to-analog converter to the voltage regulating circuit, so as to adjust the high voltage output to the cadmium zinc telluride detector. The communication module 105 is used for communicating with the micro control unit module 104 through a USB communication interface by using high voltage configuration software to configure the digital-to-analog converter output voltage.
Specifically, one example of the voltage regulating circuit may be a voltage dividing resistor connected to the boost module, the digital-to-analog converter, and the interface module 101 (shown in fig. 4) of the cdte detector. The digital signal output by the micro-control unit module 104 is converted into an analog signal by a digital-to-analog converter and acts on a divider resistor, and the voltage output from the boost module to the cadmium zinc telluride detector is adjusted by the divider resistor.
In the special test circuit for the traditional NIM case-based cadmium zinc telluride detector, the voltage is regulated based on a manual knob, and the regulation cannot be controlled accurately.
In contrast, in the present invention, in addition to the technical effects that can be achieved by the test circuit 100 dedicated to a cadmium zinc telluride detector in embodiment 1, the test circuit 100' dedicated to a cadmium zinc telluride detector in embodiment 2 can also configure a digital-to-analog converter through the micro control unit module 104, apply a signal output by the digital-to-analog converter to the voltage regulating circuit, and further adjust the high voltage output to the cadmium zinc telluride detector, thereby implementing the targeted adjustment of the voltage supplied to the cadmium zinc telluride detector. In addition, a user may use high voltage configuration software to communicate with the micro-control unit module 104 via the USB communication interface to configure the digital-to-analog converter (DAC) output voltage to precisely adjust the high voltage ultimately output to the CZT detector.
[ example 3]
Referring to fig. 3 and 4, another embodiment of the present application provides a test circuit 100 "dedicated to a cadmium zinc telluride detector, wherein the circuit 100" includes modules 101 to 104, and further includes a module 106: and a temperature compensation module.
The temperature compensation module 106 is configured to monitor a temperature of the cadmium zinc telluride detector by using the on-board thermistor, and adjust an output voltage of the digital-to-analog converter in real time through the micro control unit module 104 when the temperature of the cadmium zinc telluride detector changes, so as to perform temperature compensation on a high voltage supplied to the cadmium zinc telluride detector connected to the cadmium zinc telluride detector interface module 101. The temperature of the cadmium zinc telluride detector monitored by the on-board thermistor is converted to a digital signal by an analog-to-digital converter inside the micro-control unit module 104.
Because the temperature of the electronic components can be different under different working conditions and working environments, the characteristics of the components can be different under different temperatures, and the temperature characteristics of individual components can seriously influence the precision of the CZT detector. In addition to the technical effects that can be achieved by the test circuit 100 dedicated to a cadmium zinc telluride detector in embodiment 1, the test circuit 100 ″ dedicated to a cadmium zinc telluride detector according to embodiment 3 can monitor the temperature of the cadmium zinc telluride detector by using the on-board thermistor, and can adjust the output voltage of the digital-to-analog converter in real time by the micro-control unit module 104 when the temperature of the cadmium zinc telluride detector changes, so as to perform temperature compensation on the high voltage supplied to the cadmium zinc telluride detector connected to the interface module of the cadmium zinc telluride detector, thereby more accurately adjusting the high voltage finally output to the CZT detector.
The embodiment of the application further provides a special test method for the cadmium zinc telluride detector, and the specific implementation manner of the special test method is consistent with the implementation manner and the achieved technical effect recorded in the embodiment of the circuit, and part of the detailed contents are not repeated.
[ example 4]
Referring to fig. 5, the embodiment of the present application provides a special test method for a cadmium zinc telluride detector, which includes steps S101 to S103.
Step S101: and connecting the tellurium-zinc-cadmium detector.
Specifically, a cadmium zinc telluride detector to be detected is connected to a cadmium zinc telluride detector interface. The plurality of cadmium zinc telluride detectors can be simultaneously and respectively connected with the plurality of cadmium zinc telluride detector interfaces.
Step S102: step of supplying Power
And supplying power to the cadmium zinc telluride detector connected with the cadmium zinc telluride detector interface. And the boosting module is used for boosting the input voltage which is low voltage into high voltage to be supplied to the cadmium zinc telluride detector connected with the cadmium zinc telluride detector interface.
In some optional embodiments, the boost module is a 12V to 2000V boost module for boosting an input voltage of 12V to a high voltage below 2000V.
Step S103: and outputting the signal.
And outputting a test signal of the cadmium zinc telluride detector.
In some alternative embodiments, the signal output step S103 simultaneously outputs the test signals of the multiple cdte detectors by using a plurality of operational amplifier circuits respectively corresponding to the interfaces of the multiple cdte detectors.
Therefore, according to the test method special for the cadmium zinc telluride detector of the embodiment, the voltage is provided through the low-noise boost module of 12V to 2000V, for example, compared with the traditional test method special for the cadmium zinc telluride detector, the used high-voltage module has small volume and low noise. In addition, the interfaces of the plurality of cadmium zinc telluride detectors are configured, the plurality of cadmium zinc telluride detectors to be detected can be simultaneously connected, and the test signals of the plurality of cadmium zinc telluride detectors are simultaneously output by utilizing the plurality of operational amplifier circuits respectively corresponding to the interfaces of the plurality of cadmium zinc telluride detectors, so that the test work of the plurality of cadmium zinc telluride detectors is simultaneously supported.
[ example 5]
Referring to fig. 6, another embodiment of the present application provides a method for testing a cadmium zinc telluride detector, which includes steps S101 to S103, and further includes:
step S104: voltage configuration; and
step S105: and a communication control step.
In the voltage configuration step S104, the micro control unit module is used to configure the digital-to-analog converter, and the signal output by the digital-to-analog converter is applied to the voltage regulating circuit, so as to adjust the high voltage output to the cadmium zinc telluride detector. And, in the communication control step S105, the digital-to-analog converter output voltage is configured by the communication module by communicating with the micro control unit through the USB communication interface using the high voltage configuration software.
In addition to the technical effects that can be achieved by the testing method specifically for the cadmium zinc telluride detector in embodiment 4, according to the testing method specifically for the cadmium zinc telluride detector in embodiment 5, the digital-to-analog converter can be configured by the micro control unit, and the signal output by the digital-to-analog converter is applied to the voltage regulating circuit, so as to adjust the high voltage output to the cadmium zinc telluride detector, thereby achieving the targeted adjustment of the voltage supplied to the cadmium zinc telluride detector. In addition, a user can use high voltage configuration software to communicate with the micro-control unit through the USB communication interface to configure a digital-to-analog converter (DAC) output voltage, so that the high voltage finally output to the CZT detector is accurately adjusted.
[ example 6]
Referring to fig. 7, another embodiment of the present application provides a method for testing a cadmium zinc telluride detector, which includes steps S101 to S103, and further includes: step S106: and (5) temperature compensation.
And a temperature compensation step S106, in which the temperature of the cadmium zinc telluride detector is monitored by using an onboard thermistor, and when the temperature of the cadmium zinc telluride detector changes, the output voltage of the digital-to-analog converter is adjusted in real time by the micro control unit module so as to compensate the temperature of the high voltage supplied to the cadmium zinc telluride detector connected to the interface module of the cadmium zinc telluride detector.
Because the temperature of the electronic components can be different under different working conditions and working environments, the characteristics of the components can be different under different temperatures, and the temperature characteristics of individual components can seriously influence the precision of the CZT detector. In addition to the technical effects that can be achieved by the special test method for the cadmium zinc telluride detector in the embodiment 4, according to the special test method for the cadmium zinc telluride detector in the embodiment 6, the temperature of the cadmium zinc telluride detector is monitored by using the on-board thermistor, and when the temperature of the cadmium zinc telluride detector changes, the output voltage of the digital-to-analog converter can be adjusted in real time by the micro-control unit module, so that the temperature compensation is performed on the high voltage supplied to the cadmium zinc telluride detector connected to the interface module of the cadmium zinc telluride detector, and the high voltage finally output to the CZT detector is adjusted more accurately.
The foregoing description and drawings are only for purposes of illustrating the preferred embodiments of the present application and are not intended to limit the present application, which is, therefore, to the contrary, limited by the scope of the appended claims.
Claims (11)
1. A special test circuit for a cadmium zinc telluride detector is characterized by comprising:
the interface module of the tellurium-zinc-cadmium detector is used for connecting the tellurium-zinc-cadmium detector to be detected;
the power supply module is used for supplying power to the cadmium zinc telluride detector connected to the cadmium zinc telluride detector interface module;
a signal output module for outputting the test signal of the cadmium zinc telluride detector,
wherein the power supply module includes a boosting module for boosting an input voltage as a low voltage to a high voltage.
2. The circuit of claim 1,
the boosting module is a 12V-2000V boosting module and is used for boosting the 12V input voltage to a high voltage below 2000V.
3. The circuit of claim 1, further comprising:
and the micro-control unit module is used for configuring a digital-to-analog converter, and applying a signal output by the digital-to-analog converter to the voltage regulating circuit so as to regulate and output a high voltage to the cadmium zinc telluride detector.
4. The circuit of claim 3, further comprising:
and the communication module is used for communicating with the micro-control unit module through a USB communication interface by utilizing high-voltage configuration software to configure the output voltage of the digital-to-analog converter.
5. The circuit of claim 4, further comprising:
and the temperature compensation module is used for monitoring the temperature of the cadmium zinc telluride detector by utilizing an onboard thermistor, and adjusting the output voltage of the digital-to-analog converter in real time through the micro-control unit module when the temperature of the cadmium zinc telluride detector changes so as to compensate the temperature of the high voltage supplied to the cadmium zinc telluride detector connected to the cadmium zinc telluride detector interface module.
6. The circuit of claim 5,
the temperature of the cadmium zinc telluride detector monitored by the on-board thermistor is converted into a digital signal through an analog-to-digital converter in the micro-control unit module.
7. The circuit of claim 1, wherein the interface module of the cadmium zinc telluride detector comprises interfaces of a plurality of cadmium zinc telluride detectors, and the interfaces of the plurality of cadmium zinc telluride detectors can be respectively connected with a plurality of cadmium zinc telluride detectors to be detected.
8. The circuit of claim 7,
the signal output module comprises a plurality of operational amplifier circuits which respectively correspond to the interfaces of the cadmium zinc telluride detectors so as to simultaneously output a plurality of paths of test signals of the cadmium zinc telluride detectors.
9. A special test method for a cadmium zinc telluride detector is characterized by comprising the following steps:
connecting a cadmium zinc telluride detector to be detected to a cadmium zinc telluride detector interface;
supplying power to a cadmium zinc telluride detector connected to the cadmium zinc telluride detector interface;
outputting the test signal of the cadmium zinc telluride detector,
the system comprises a voltage boosting module, a cadmium zinc telluride detector, a power supply module and a power supply module, wherein the voltage boosting module is used for boosting input voltage serving as low voltage into high voltage so as to supply the high voltage to the cadmium zinc telluride detector connected with an interface of the cadmium zinc telluride detector.
10. The method of claim 9,
and configuring a digital-to-analog converter by using the micro-control unit, and applying a signal output by the digital-to-analog converter to a voltage regulating circuit so as to regulate and output a high voltage to the cadmium zinc telluride detector.
11. The method of claim 10,
and monitoring the temperature of the cadmium zinc telluride detector by using an onboard thermistor, and adjusting the output voltage of the digital-to-analog converter in real time through the micro-control unit module when the temperature of the cadmium zinc telluride detector changes so as to compensate the temperature of the high voltage supplied to the cadmium zinc telluride detector connected to the cadmium zinc telluride detector interface module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
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| CN116068608A (en) * | 2023-03-08 | 2023-05-05 | 陕西迪泰克新材料有限公司 | CZT bias voltage testing system, testing method thereof, control device and storage medium |
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| CN116068608A (en) * | 2023-03-08 | 2023-05-05 | 陕西迪泰克新材料有限公司 | CZT bias voltage testing system, testing method thereof, control device and storage medium |
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