CN114235004A - Atomic gyroscope axial azimuth angle measuring device and method based on double theodolites - Google Patents
Atomic gyroscope axial azimuth angle measuring device and method based on double theodolites Download PDFInfo
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- CN114235004A CN114235004A CN202111352770.9A CN202111352770A CN114235004A CN 114235004 A CN114235004 A CN 114235004A CN 202111352770 A CN202111352770 A CN 202111352770A CN 114235004 A CN114235004 A CN 114235004A
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Abstract
The invention relates to an atomic gyroscope axial azimuth angle measuring device and method based on double theodolites, comprising a reflector and an inclinometer on an atomic gyroscope, a first theodolite on the normal of the reflector and a second theodolite on the normal of a plane crystal; detecting a horizontal angle value alpha of the reflector, the first theodolite and the second theodolite and a horizontal angle value beta of the crystal, the second theodolite and the first theodolite, and calculating a horizontal included angle phi between the axial direction of the atomic gyroscope and the normal direction of the plane crystal according to the alpha and the beta; rotating the atom gyroscope, correcting the inclination angle of the atom gyroscope, and adjusting the first warp-weft instrument; detecting a horizontal angle value alpha ' of the rotating reflector, the first theodolite and the second theodolite and a horizontal angle value beta ' of the plano-the second theodolite and the first theodolite, and calculating a horizontal included angle phi ' between the axial direction of the rotating atomic gyroscope and the normal direction of the plano according to the alpha ' and the beta '; and calculating the horizontal direction change value theta of the axial azimuth angle of the atomic gyroscope according to phi and phi'. The invention avoids the rotation error of the inclination angle of the rotary table and has high measurement precision.
Description
Technical Field
The invention relates to the field of quantum precision measurement, in particular to an atomic gyroscope axial azimuth angle measuring device and method based on double theodolites.
Background
In the field of rotating precision measurement, the rapid development of the atomic interference technology provides a foundation for the research of the atomic interference gyroscope. The four-pulse atomic gyro scheme is another difference scheme established on the basis of three-pulse interference, and adopts pi/2-pi/2 four Raman pulse sequences to perform interference action on atoms, wherein the four pulse widths are tau, 2 tau and tau in sequence, and the time intervals among the pulses are T, 2T and T. Compared with a three-pulse mode, the mode increases the interference area and can improve the measurement sensitivity. When the four-pulse atomic gyroscope is used for measuring the earth rotation rate or calibrating and measuring the scale factor of the atomic gyroscope, the axial azimuth angle of the four-pulse atomic gyroscope needs to be accurately known. Because of the atom top is bulky, heavy, need utilize the position revolving stage to drive during the rotation, but the position revolving stage has inclination gyration error, influences atom top axial azimuth angle measurement, leads to the ground speed to measure inaccurately or atom top scale factor measures inaccurately.
Disclosure of Invention
Aiming at the technical problems in the prior art, the invention provides the atomic gyroscope axial azimuth angle measuring device and method based on the double theodolites, which avoid the rotation error of the inclination angle of the rotary table, have strong feasibility, large measurable range and high measuring precision, and can accurately position the axial azimuth of the four-pulse atomic gyroscope.
The technical scheme for solving the technical problems is as follows:
as a first aspect of the present invention, the present invention provides an atomic gyroscope axial azimuth angle measurement apparatus based on dual theodolites, including an azimuth turntable, an atomic gyroscope, an inclinometer, a mirror, a first theodolite, a second theodolite, and a plano-crystal, the azimuth turntable is fixedly connected to the bottom of the atomic gyroscope, the mirror and the inclinometer are respectively and fixedly disposed on the atomic gyroscope, the first theodolite is disposed on a normal line of a reflecting surface of the mirror, the second theodolite is disposed on a normal line of the plano-crystal, detection portions of the first theodolite and the second theodolite are rotatably scanned, and the first theodolite and the second theodolite are mutually disposed within an aiming range of each other;
the azimuth turntable is used for adjusting the horizontal azimuth angle and the inclination angle of the atomic gyroscope, so that the inclination angle of the atomic gyroscope after rotation is consistent with the inclination angle of the atomic gyroscope before rotation;
the inclinometer is used for detecting inclination angle data before and after the rotation of the atomic gyroscope;
the reflecting mirror is used for feeding back the axial direction of the atomic gyroscope;
the flat crystal is used for providing a detection reference for the second theodolite;
the first theodolite and the second theodolite are used for detecting a horizontal included angle between the normal direction of the flat crystal and the normal direction of the reflecting surface of the reflector before and after the rotation of the atomic gyroscope, and the difference value of the horizontal included angle before and after the rotation of the atomic gyroscope is the change value of the axial azimuth angle horizontal direction of the atomic gyroscope.
Preferably, the detecting a horizontal included angle between a normal direction of the flat crystal and a normal direction of a reflecting surface of the reflecting mirror includes:
the first theodolite detects the horizontal angle value alpha of the reflector, the first theodolite and the second theodolite, the second theodolite detects the horizontal angle value beta of the plano-the second theodolite and the first theodolite, and the horizontal included angle phi between the axial direction of the atomic gyroscope and the normal direction of the plano-crystal is calculated according to the horizontal angle value alpha and the horizontal angle value beta.
Preferably, the azimuth turntable comprises a bearing end, a bearing and an adjusting foot pad, wherein the bearing end, the bearing and the adjusting foot pad are arranged from top to bottom, the top surface of the bearing end is used as a bearing surface and is connected with the bottom of the atom gyroscope, the lower part of the bearing end is rotatably connected with the adjusting foot pad through the bearing, and the adjusting foot pad is used for adjusting the inclination angle of the atom gyroscope.
Preferably, both sides of the reflector are plated with metal reflecting films, the surface shape precision of the reflecting surface after film plating is less than lambda/8 @632.8nm, and the parallelism of the two sides is less than 1 second.
Preferably, the inclinometer is an absolute inclinometer.
As a second aspect of the present invention, the present invention provides a method for measuring an axial azimuth angle of an atomic gyroscope based on a dual theodolite, comprising the following steps:
s1, arranging a reflector on the atomic gyroscope, arranging a first theodolite on a normal line of a reflecting surface of the reflector, arranging a plano-crystal and a second theodolite, enabling the second theodolite to be on the normal line of the plano-crystal, and enabling detection parts of the first theodolite and the second theodolite to rotate;
s2, detecting a horizontal angle value alpha of the reflector, the first theodolite and the second theodolite, detecting a horizontal angle value beta of the plano-the second theodolite and the first theodolite, and calculating to obtain a horizontal included angle phi between the axial direction of the atomic gyroscope and the normal direction of the plano according to the horizontal angle value alpha and the horizontal angle value beta;
s3, horizontally rotating the atomic gyroscope, correcting the inclination angle of the atomic gyroscope, and adjusting the position of the first theodolite to keep the first theodolite on the normal line of the reflecting surface of the reflector; detecting a horizontal angle value alpha ' of the rotating reflector, the first theodolite and the second theodolite, detecting a horizontal angle value beta ' of the plano-the second theodolite and the first theodolite, and calculating according to the horizontal angle value alpha ' and the horizontal angle value beta ' to obtain a horizontal included angle phi ' between the axial direction of the rotating atomic gyroscope and the normal direction of the plano;
and S4, calculating to obtain an axial azimuth angle horizontal direction change value theta of the atomic gyroscope according to the horizontal included angle phi before rotation and the horizontal included angle phi' after rotation.
Further, step S2 includes:
s201, aligning a first warp-weft instrument to a reflecting surface of a reflector, and acquiring an initial horizontal value a of the reflector relative to the first warp-weft instrument; aiming the first theodolite at a second theodolite, and acquiring an initial horizontal numerical value a' of the second theodolite relative to the first theodolite; calculating the horizontal angle value alpha of the reflector, the first theodolite and the second theodolite by the following formula: α -a';
s202, aiming the second theodolite at the first theodolite, and acquiring an initial horizontal numerical value b of the first theodolite relative to the second theodolite; aligning the second theodolite to the plano to obtain an initial horizontal numerical value b' of the plano relative to the second theodolite; calculating the horizontal angle value beta of the first theodolite, the second theodolite and the plano through the following formula: β ═ b-b';
s203, calculating a horizontal angle value between the normal direction of the flat crystal and the normal direction of the reflecting surface of the reflector according to the following formula: Φ is 180 ° - (180 ° - α) - (180 ° - β).
Further, step S3 includes:
s301, horizontally rotating the atomic gyroscope, and adjusting the coordinate position of the first theodolite to enable the first theodolite to be positioned on the normal line of the reflecting surface of the reflector;
s302, aligning the first theodolite to a reflecting surface of a reflector, and acquiring a current horizontal numerical value a1 of the reflector relative to the first theodolite; aiming the first theodolite at a second theodolite, and acquiring a current horizontal numerical value a 1' of the second theodolite relative to the first theodolite; the horizontal angle value alpha' of the reflector, the first theodolite and the second theodolite is calculated by the following formula: α '═ a1-a 1';
s303, aiming the second theodolite at the first theodolite, and acquiring a current horizontal numerical value b1 of the first theodolite relative to the second theodolite; aligning the second theodolite to the plano to obtain a current horizontal numerical value b 1' of the plano relative to the second theodolite; calculating the horizontal angle value beta' of the first theodolite, the second theodolite and the plano through the following formula: β '═ b1-b 1';
s304, calculating a horizontal angle value between the normal direction of the flat crystal and the normal direction of the reflecting surface of the reflector according to the following formula: Φ ' — (180 ° - α ') - (180 ° - β ').
Further, in step S4, the horizontal direction variation value θ of the axial azimuth angle before and after the rotation of the atomic gyroscope is calculated by the following formula: θ ═ Φ' - Φ.
Further, the tilt correction of the atomic gyroscope includes:
in step S2, detecting and recording an initial tilt angle (x, y) of the atomic gyro;
in step S3, after the atomic gyro is rotated, the real-time tilt angle (x ', y') of the atomic gyro is detected, and the tilt angle of the atomic gyro is adjusted until the value of (x ', y') coincides with the value of (x, y).
Further, if the rotation angle of the atom gyroscope exceeds 180 °, the positions of the plano and the second theodolite are adjusted to keep the second theodolite on the normal of the plano, the second theodolite and the first theodolite are mutually located in the aiming range of the other party, the second theodolite and the first theodolite can be mutually aligned, and then the steps S1-S4 are repeated.
The invention has the beneficial effects that: the invention discloses an atomic gyroscope axial azimuth angle measuring device and method based on double theodolites. The device takes a four-pulse atomic gyroscope as a measured main body, utilizes an azimuth turntable to change the horizontal azimuth angle of the four-pulse atomic gyroscope, selects an inclinometer to measure the absolute inclination angle before and after the rotation of the four-pulse atomic gyroscope, and corrects the inclination angle of the atomic gyroscope through the detection data of the inclinometer after the rotation so as to keep the inclination angle in an initial state and avoid the rotation error of the inclination angle of the turntable; the angle between the normal line of the reflecting surface of the reflecting mirror and the plane crystal before and after rotation is measured by adopting the double theodolites, and the direction of the normal line of the reflecting surface of the reflecting mirror is consistent with the axial direction of the atomic gyroscope, so that the device is used for measuring the axial direction of the atomic gyroscope to obtain the change value of the axial azimuth angle and the horizontal direction of the atomic gyroscope, the rotation error of the inclination angle of the rotary table is avoided in the test, the feasibility is strong, the measurable range is large, the measurement precision is high, and the axial direction of the four-pulse atomic gyroscope can be accurately positioned.
Drawings
FIG. 1 is a schematic diagram of the structure of the measuring device of the present invention;
FIG. 2 is a schematic view of an azimuth turntable according to the present invention;
FIG. 3 is a schematic diagram of a measurement method of the present invention;
FIG. 4 is a flow chart of a measurement method of the present invention.
In the drawings, the components represented by the respective reference numerals are listed below:
01. an inclinometer 02, an azimuth turntable 2a, a bearing end 2b, a load bearing 2c, an adjusting pad foot 03, a first theodolite 04, a second theodolite 05, a plane crystal 06, an atom gyroscope 6a and a reflector.
Detailed Description
The principles and features of this invention are described below in conjunction with the following drawings, which are set forth by way of illustration only and are not intended to limit the scope of the invention.
In order to solve the problems in the background art, in a first aspect, the present embodiment provides an atomic gyroscope axial azimuth angle measurement apparatus based on a dual theodolite, which is used for measuring the horizontal direction change condition of the axial azimuth angle before and after the rotation of the four-pulse atomic gyroscope 06. As shown in fig. 1, the measuring device includes an orientation rotary table 02, an inclinometer 01, a reflector 6a, a first theodolite 03, a second theodolite 04 and a plano-crystal 05, the orientation rotary table 02 is fixedly connected to the bottom of an atomic gyroscope, the reflector 6a and the inclinometer 01 are respectively and fixedly arranged on the atomic gyroscope 06 to be measured, the first theodolite 03 is arranged on the normal of the reflecting surface of the reflector 6a, the second theodolite 04 is arranged on the normal of the plano-crystal 05, the detecting parts of the first theodolite 03 and the second theodolite 04 can rotatably scan, and the first theodolite 03 and the second theodolite 04 are mutually arranged in the aiming range of the other party;
the orientation rotary table 02 is used for adjusting the horizontal orientation angle and the inclination angle of the atomic gyroscope 06 to be measured, so that the inclination angle of the atomic gyroscope 06 to be measured after rotation is consistent with the inclination angle before rotation;
the inclinometer 01 is used for detecting inclination angle data before and after the rotation of the atomic gyroscope 06 to be detected;
the reflector 6a is used for feeding back the axial direction of the atomic gyroscope 06 to be detected;
the flat crystal 05 is used for providing a detection reference for the second theodolite 04;
the first theodolite 03 and the second theodolite 04 are used for detecting a horizontal included angle between the normal direction of the flat crystal 05 and the normal direction of the reflecting surface of the reflector 6a before and after the rotation of the atomic gyroscope 06 to be detected, and the difference value of the horizontal included angle before and after the rotation of the atomic gyroscope 06 to be detected is the axial azimuth angle horizontal direction change value of the atomic gyroscope 06 to be detected.
For a four-pulse atomic gyroscope, the rotational phase shift can be written as:
in formula (1):
phase shifting for rotation; k is a radical ofeffIs a two-photon effective wave vector direction; g is the acceleration of gravity; omega is the system rotation angular speed; and T is the interval time of the two front Raman light pulses.
The sensitive axis direction of the four-pulse atomic gyroscope is k as shown in formula (1)effX g, the gravity acceleration g is a constant vector, namely the sensitive axis direction is determined by the effective k wave vector direction. And the effective k-wave vector direction is determined by the raman light incidence and reflection angles, i.e. by the mirror 6a normal. Therefore, the angular orientation of the raman reflection surface of the reflector 6a determines the axial orientation of the four-pulse atomic gyro, and under the condition of ensuring the surface type and the parallelism of the reflector 6a, the angular orientation of the reflector 6a on the atomic gyro is measured, namely the axial orientation angle of the four-pulse atomic gyro is measured.
In the measuring device, the azimuth turntable 02 is a main bearing and rotating platform of the four-pulse atomic gyroscope 06, and the inclinometer 01 preferably adopts an absolute inclinometer 01 which can measure the absolute inclination angle of the atomic gyroscope and is used for providing an adjusting basis when the inclination angle of the atomic gyroscope 06 is corrected after the rotating platform rotates. The method comprises the steps of measuring and recording an initial inclination angle of the atomic gyroscope 06 before rotation, measuring a real-time inclination angle of the atomic gyroscope 06 again after rotation, correcting the real-time inclination angle of the atomic gyroscope 06 by adjusting the local height of the azimuth turntable 02 until the real-time inclination angle is consistent with the initial inclination angle before rotation, thereby realizing the inclination angle correction after the atomic gyroscope 06 rotates, avoiding the problems that the inclination angle rotation error of the azimuth turntable 02 in the rotation process affects the axial azimuth angle measurement of the atomic gyroscope, and causing inaccurate ground speed measurement or inaccurate scale factor measurement of the atomic gyroscope. In the process of measuring the horizontal direction change value of the axial azimuth angle of the atomic gyroscope 06, the flat crystal 05 is used as a standard measuring tool and is used as a test reference after being fixed. The first theodolite 03 and the second theodolite 04 are preferably electronic theodolites. The first theodolite 03 is mounted on a tripod and can move along with the rotation of the atomic gyroscope, and the head (i.e., the detection part) of the first theodolite 03 can rotate during testing, so that the head is aligned with the reflecting mirror 6a on the atomic gyroscope 06 and the second theodolite 04. The base of the second theodolite 04 is fixed and its head is rotatably aligned with the plate 05 and the first theodolite 03.
In this embodiment, the detecting a horizontal included angle between the normal direction of the flat crystal 05 and the normal direction of the reflecting surface of the reflecting mirror 6a includes:
before the azimuth turntable 02 carries the atomic gyroscope 06 to rotate, the first theodolite 03 detects the horizontal angle value alpha of the reflector 6 a-the first theodolite 03-the second theodolite 04, the second theodolite 04 detects the horizontal angle value beta of the plano-05-the second theodolite 04-the first theodolite 03, and the horizontal included angle phi between the axial direction of the atomic gyroscope 06 to be detected and the normal direction of the plano-05 is calculated according to the horizontal angle value alpha and the horizontal angle value beta;
after an atomic gyroscope 06 is carried on an azimuth turntable 02 to rotate and perform inclination correction, a first theodolite 03 detects a horizontal angle value alpha ' of a reflector 6 a-the first theodolite 03-a second theodolite 04, a second theodolite 04 detects a horizontal angle value beta ' of a plano 05-the second theodolite 04-the first theodolite 03, and a horizontal included angle phi ' between the axial direction of the atomic gyroscope 06 to be detected and the normal direction of the plano 05 is calculated according to the horizontal angle value alpha ' and the horizontal angle value beta ';
and obtaining a horizontal direction change value theta of the axial azimuth angle before and after the rotation of the atomic gyroscope 06 to be detected according to the difference value between the calculated horizontal included angle phi and the calculated horizontal included angle phi'.
As shown in fig. 2, the orientation rotary table 02 includes a bearing end 2a, a bearing 2b and an adjusting foot pad 2c, which are arranged from top to bottom, the top surface of the bearing end 2a is used as a bearing surface to be connected with the bottom of the atomic gyroscope 06 to be measured, the lower part of the bearing end 2a is rotatably connected with the adjusting foot pad 2c through the bearing 2b, the local height of the adjusting foot pad 2c is adjustable, and the adjusting foot pad 2c is used for adjusting the inclination angle of the atomic gyroscope 06 to be measured.
In order to obtain a better reflection effect on the detection light of the first theodolite 03 and enable the detection to be more sensitive and accurate, two surfaces of the reflector 6a are plated with metal reflection films, the surface shape precision of the reflection surfaces after film coating is smaller than lambda/8 @632.8nm, and the parallelism of the two surfaces is smaller than 1 second.
On the basis of the above measuring device, as a second aspect of the present invention, as shown in fig. 3 to 4, the present embodiment further provides a method for measuring an axial azimuth angle of an atomic gyroscope based on a dual theodolite, including the following steps:
s1, setting a mirror 6a and an inclinometer 01 on the atomic gyroscope 06 to be measured, setting a first theodolite 03 on the normal of the reflection surface of the mirror 6a, setting a plano 05 and a second theodolite 04, making the second theodolite 04 on the normal of the plano 05, and making the detection parts of the first theodolite 03 and the second theodolite 04 rotatable and aimed at each other;
s2, detecting a horizontal angle value alpha of the reflector 6 a-the first theodolite 03-the second theodolite 04, detecting a horizontal angle value beta of the plano 05-the second theodolite 04-the first theodolite 03, and calculating to obtain a horizontal included angle phi between the axial direction of the atom gyroscope 06 to be detected and the normal direction of the plano 05 according to the horizontal angle value alpha and the horizontal angle value beta;
s3, horizontally rotating the atomic gyroscope 06 to be measured, correcting the tilt of the atomic gyroscope 06 to be measured, and adjusting the position of the first theodolite 03 so that it is held on the normal line of the reflection surface of the mirror 6 a; detecting a horizontal angle value alpha ' of the rotating reflector 6a, the first theodolite 03 and the second theodolite 04, detecting a horizontal angle value beta ' of the plano 05, the second theodolite 04 and the first theodolite 03, and calculating to obtain a horizontal included angle phi ' between the axial direction of the atom gyroscope 06 to be detected and the normal direction of the plano 05 after the rotation according to the horizontal angle value alpha ' and the horizontal angle value beta ';
and S4, calculating to obtain a horizontal direction change value theta of the axial azimuth angle of the atomic gyroscope 06 to be detected according to the horizontal included angle phi before rotation and the horizontal included angle phi' after rotation.
In more detail, step S2 includes:
s201, aligning the first theodolite 03 to a reflecting surface of a reflector 6a, and acquiring an initial horizontal numerical value a of the reflector 6a relative to the first theodolite 03; aiming the first theodolite 03 at the second theodolite 04 to obtain an initial horizontal numerical value a' of the second theodolite 04 relative to the first theodolite 03; the horizontal angle value alpha of the reflector 6a, the first theodolite 03 and the second theodolite 04 is calculated by the following formula: α -a';
s202, aiming the second theodolite 04 at the first theodolite 03, and acquiring an initial horizontal numerical value b of the first theodolite 03 relative to the second theodolite 04; aligning the second theodolite 04 to the plano-crystal 05 to obtain an initial horizontal numerical value b' of the plano-crystal 05 relative to the second theodolite 04; the horizontal angle value beta of the first theodolite 03, the second theodolite 04 and the plano 05 is calculated by the following formula: β ═ b-b';
s203, calculating a horizontal angle value between the normal direction of the flat crystal 05 and the normal direction of the reflection surface of the mirror 6a according to the following formula: Φ is 180 ° - (180 ° - α) - (180 ° - β).
In more detail, step S3 includes:
s301, horizontally rotating the atomic gyroscope 06 to be measured, and adjusting the coordinate position of the first theodolite 03 to keep it on the normal line of the reflecting surface of the reflecting mirror 6 a;
s302, aligning the first theodolite 03 to a reflecting surface of the reflector 6a, and acquiring a current horizontal numerical value a1 of the reflector 6a relative to the first theodolite 03; aiming the first theodolite 03 at the second theodolite 04, and acquiring a current horizontal numerical value a 1' of the second theodolite 04 relative to the first theodolite 03; the horizontal angle value α' of the mirror 6 a-the first theodolite 03-the second theodolite 04 is calculated by the following formula: α '═ a1-a 1';
s303, aiming the second theodolite 04 at the first theodolite 03, and obtaining a current horizontal value b1 of the first theodolite 03 relative to the second theodolite 04; aligning the second theodolite 04 to the flat crystal 05, and acquiring a current horizontal numerical value b 1' of the flat crystal 05 relative to the second theodolite 04; the horizontal angle value beta' of the first theodolite 03-the second theodolite 04-the plano 05 is calculated by the following formula: β '═ b1-b 1', b1 '═ b';
s304, calculating a horizontal angle value between the normal direction of the flat crystal 05 and the normal direction of the reflecting surface of the reflector 6a according to the following formula: Φ ' — (180 ° - α ') - (180 ° - β ').
In more detail, in step S4, the horizontal direction variation value θ of the axial azimuth angle before and after rotation of the atomic gyroscope 06 to be measured is calculated by the following formula: θ ═ Φ' - Φ.
In this embodiment, the performing the tilt correction on the atomic gyroscope 06 to be measured includes:
in step S2, the initial tilt angle (x, y) of the atomic gyroscope 06 under test is detected and recorded;
in step S3, after the atomic gyroscope 06 to be measured is rotated, the real-time tilt angle (x ', y') of the atomic gyroscope 06 to be measured is detected, and the tilt angle of the atomic gyroscope 06 to be measured is adjusted until the value of (x ', y') matches the value of (x, y).
To facilitate a further understanding of the present solution, a more detailed description of the present solution is provided in conjunction with fig. 3.
Fig. 3 shows a comparison of the state of the measuring apparatus before and after the rotation of the orientation rotary table 02. As shown in fig. 3, the initial state of the measuring apparatus before the rotation of the azimuth turntable 02 is shown by a solid line, and the state of the measuring apparatus after the rotation of the azimuth turntable 02 is shown by a dotted line. Because the plane crystal 05O is used as a measurement reference point of the measurement device, assuming that the position of the plane crystal 05 is O point, the rotation axis of the atom gyroscope 06 is C point, the measurement position of the first theodolite 03 before the rotation of the azimuth turntable 02 is B point, the measurement position of the second theodolite 04 is a point, the normal intersection point of the normal line of the plane crystal 05 and the reflection surface of the reflector 6a is D point, the measurement position of the first theodolite 03 after the rotation of the azimuth turntable 02 is B 'point, and the normal intersection point of the normal line of the plane crystal 05 and the reflection surface of the reflector 6a is D' point. As shown in fig. 3, point a is always on the normal line of the flat crystal 05, and points C, B, and B' are always on the normal line of the reflection surface of the mirror 6 a.
In the process of detection, referring to the steps shown in fig. 4, in an initial state shown by a solid line in fig. 3, the bubbles on the base of the first warp-weft instrument 03 are leveled, and are self-aligned with the reflection surface of the reflection mirror 6a on the atomic gyro, so as to obtain the pitch angle and the initial horizontal value a of the reflection mirror 6a at this time. Because the reflecting mirror 6a requires a metal-plated reflecting film on both sides, the surface shape precision of the reflecting surface after film plating is less than lambda/8 @632.8nm, the parallelism of both sides is less than 1 second, and the measurement of the normal value of the back surface of the reflecting mirror 6a by using a theodolite can be theoretically considered as the actual measurement of the Raman light k wave vector value.
And simultaneously leveling the air bubbles of the base of the second theodolite 04, and aligning the air bubbles with the flat crystal 05 of the reference to obtain an initial level value b. Then, the bases of the first theodolite 03 and the second theodolite 04 are respectively fixed in position, the heads of the first theodolite 03 and the second theodolite 04 are rotated, and the first theodolite 03 and the second theodolite 04 are aimed at each other (i.e., aimed at each other), so that a second initial level value a 'of the first theodolite 03 and a second initial level value b' of the second theodolite 04 are obtained.
The above detection data are calculated to obtain ═ ABC ═ α ═ a-a ', < OAB ═ β ═ b-b', and at the same time, ═ ODC ═ Φ ═ 180 ° - (180 ° - (OAB) - (180 ° - (ABC) ═ 180 ° - (180 ° - (180 ° -) - α ═ α + β -180 °. Note down the tilt angle value (x, y) of the atom gyro 06 at this time. At this time, the detection of the horizontal angle Φ between the axial direction of the atomic gyroscope 06 and the normal direction of the flat crystal 05 is completed in the initial state.
After the azimuth turntable 02 is rotated, the atom gyro 06 is turned to the position of the dotted line in fig. 3. Because the azimuth turntable 02 has an inclination angle rotation error, the current absolute inclination angle of the atomic gyroscope measured by the inclinometer 01 is (x ', y'), and at the moment, the adjustment foot pad of the azimuth turntable 02 needs to be adjusted, so that the absolute inclination angle of the atomic gyroscope 06 returns to the initial state (x, y), and the inclination angle state of the atomic gyroscope in the state is ensured to be consistent with the initial state. Moving the first theodolite 03 to the dotted line in fig. 3, adjusting the bubble on the base of the first theodolite, aligning the bubble with the reflecting surface of the reflecting mirror 6a to obtain the pitch angle of the reflecting mirror 6a in the state and the current horizontal value a1 of the current reflecting mirror 6a relative to the first theodolite 03, wherein the pitch angle in the state should be consistent with the previous state, and if the pitch angle is not consistent with the previous state, readjusting the position of the first theodolite 03. The first theodolite 03 and the second theodolite 04 are aimed at, and a second level value a 1' on the first theodolite 03, i.e. the current level value of the second theodolite 04 with respect to the first theodolite 03, and a first level value b1 on the second theodolite 04, i.e. the current level value of the first theodolite 03 with respect to the second theodolite 04, are obtained. The second theodolite 04 is then aimed at the piano 05, and the current level value b 1' of the piano 05 relative to the second theodolite 04 is obtained. Since the position of the flat crystal 05 is not changed as a detection reference and the position of the second theodolite 04 is also not changed, b 1' is satisfied.
The above detection data are calculated to obtain ═ ABC ═ α ' ═ a1-a1 ', ═ OAB ═ β ' ═ b1-b1 ═ b1-b ', and at the same time obtain ═ OD ' C ═ 180 ° - (180 ° - (OAB ') - (180 ° - (AB ' C) ═ 180 ° - (180 ° - (β ') - (180 ° - + β ' -180 °. After the rotation is completed, the horizontal included angle phi' between the axial direction of the atomic gyroscope 06 and the normal direction of the flat crystal 05 is detected. And the change value theta of the axial azimuth angle of the atomic gyroscope is phi-phi ', ODC-OD' C is alpha + beta-180-alpha '-beta' + 180-alpha + beta-alpha '-beta', so the absolute change amount of the axial azimuth angle of the atomic gyroscope can be measured by the double theodolites in the steps.
Because the atom gyroscope 06 can circumferentially rotate 360 °, under the condition that the positions of the plano 05 and the second theodolite 04 are not changed, the measurement range of the first theodolite 03 with respect to the mirror 6a theoretically cannot exceed 180 °, therefore, if the rotation angle of the atom gyroscope 06 to be measured exceeds 180 °, the positions of the plano 05 and the second theodolite 04 are adjusted, so that the second theodolite 04 is always kept on the normal of the plano 05, and the second theodolite 04 and the first theodolite 03 are mutually positioned within the aiming range of the other party, so that the second theodolite 04 and the first theodolite 03 can be mutually aligned, and then the above steps S1 to S4 are repeated, so that the absolute change amount of the axial azimuth of the atom gyroscope 06 is measured again by adopting the above measurement method.
In the device and the method for measuring the axial azimuth angle of the atomic gyroscope based on the double theodolites, a four-pulse atomic gyroscope 06 is taken as a measured main body, a horizontal azimuth angle of the four-pulse atomic gyroscope is changed by using an azimuth turntable 02, an inclinometer 01 is selected to measure absolute inclination angles before and after rotation of the four-pulse atomic gyroscope, and the inclination angle of the atomic gyroscope 06 is corrected through detection data of the inclinometer 01 after rotation, so that the inclination angle is kept in an initial state, and the rotation error of the inclination angle of the turntable is avoided; the angle between the normal line of the reflecting surface of the reflecting mirror 6a and the plane crystal 05 before and after rotation is measured by adopting a double theodolite, and the direction of the normal line of the reflecting surface of the reflecting mirror 6a is consistent with the axial direction of the atomic gyroscope, so that the device is used for measuring the axial direction of the atomic gyroscope to obtain the horizontal direction change value of the axial azimuth angle of the atomic gyroscope, the rotation error of the inclination angle of the rotary table is avoided in the test, the feasibility is strong, the measurable range is large, the measurement precision is high, and the axial direction of the four-pulse atomic gyroscope can be accurately positioned.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (10)
1. The utility model provides an atomic gyroscope axial azimuth angle measuring device based on two theodolites, its characterized in that, includes position revolving stage (02), clinometer (01), speculum (6a), first theodolite (03), second theodolite (04) and plain crystal (05), position revolving stage (02) fixed connection atomic gyroscope's bottom, speculum (6a) and clinometer (01) are fixed respectively and set up on the atomic gyroscope, first theodolite (03) set up on the normal line of the plane of reflection of speculum (6a), second theodolite (04) set up on the normal of plain crystal (05), first theodolite (03) and the rotatable scanning of detection part of second theodolite (04), and first theodolite (03) and second theodolite (04) set up each other in the scope of aiming at of counterpart;
the azimuth turntable (02) is used for adjusting the horizontal azimuth angle and the inclination angle of the atom gyro, so that the inclination angle of the atom gyro after rotation is consistent with the inclination angle of the atom gyro before rotation;
the inclinometer (01) is used for detecting inclination angle data before and after the rotation of the atomic gyroscope;
the reflector (6a) is used for feeding back the axial direction of the atomic gyroscope;
the flat crystal (05) is used for providing a detection reference for the second theodolite (04);
first theodolite (03) and second theodolite (04) are used for detecting the horizontal included angle between the normal direction of flat crystal (05) and the plane of reflection normal direction of speculum (6a) around atom top rotation, and atom top rotation front and back the difference of horizontal included angle is atom top axial azimuth angle horizontal direction change value promptly.
2. The dual theodolite-based atomic gyro axial azimuth angle measuring device according to claim 1, wherein the detecting of the horizontal angle between the normal direction of the flat crystal (05) and the normal direction of the reflecting surface of the mirror (6a) comprises:
the first theodolite (03) detects a horizontal angle value alpha of the reflector (6a) -the first theodolite (03) -the second theodolite (04), the second theodolite (04) detects a horizontal angle value beta of the plano-crystal (05) -the second theodolite (04) -the first theodolite (03), and a horizontal included angle phi between the axial direction of the atomic gyro and the normal direction of the plano-crystal (05) is calculated according to the horizontal angle value alpha and the horizontal angle value beta.
3. The double-theodolite-based axial azimuth angle measuring device for the atomic gyroscope according to claim 1, wherein the azimuth turntable (02) comprises a bearing end (2a), a load bearing (2b) and an adjusting pad foot (2c), which are arranged from top to bottom, the top surface of the bearing end (2a) is connected with the bottom of the atomic gyroscope as a bearing surface, the lower part of the bearing end (2a) is rotationally connected with the adjusting pad foot (2c) through the load bearing (2b), and the adjusting pad foot (2c) is used for adjusting the inclination angle of the atomic gyroscope.
4. The device for measuring the axial azimuth angle of the atomic gyroscope based on the dual-theodolite as claimed in claim 1, wherein both surfaces of the reflector (6a) are plated with metal reflecting films, the surface shape precision of the reflecting surfaces after the metal reflecting films are plated is less than lambda/8 @632.8nm, and the parallelism of the two surfaces is less than 1 second.
5. An atomic gyroscope axial azimuth angle measurement method based on double theodolites is characterized by comprising the following steps:
s1, a reflector (6a) is arranged on the atomic gyroscope, a first theodolite (03) is arranged on a normal line of a reflecting surface of the reflector (6a), a plano-crystal (05) and a second theodolite (04) are arranged, the second theodolite (04) is arranged on a normal line of the plano-crystal (05), and detection parts of the first theodolite (03) and the second theodolite (04) can rotate;
s2, detecting a horizontal angle value alpha of the reflector (6a) -the first theodolite (03) -the second theodolite (04), detecting a horizontal angle value beta of the plano-crystal (05) -the second theodolite (04) -the first theodolite (03), and calculating a horizontal included angle phi between the axial direction of the atomic gyro and the normal direction of the plano-crystal (05) according to the horizontal angle value alpha and the horizontal angle value beta;
s3, horizontally rotating the atomic gyroscope, correcting the inclination angle of the atomic gyroscope, and adjusting the position of the first theodolite (03) to keep the first theodolite on the normal line of the reflecting surface of the reflector (6 a); detecting the horizontal angle value alpha ' of the rotating reflector (6a) -the first theodolite (03) -the second theodolite (04), detecting the horizontal angle value beta ' of the plano-crystal (05) -the second theodolite (04) -the first theodolite (03), and calculating the horizontal included angle phi ' between the axial direction of the rotating atomic gyroscope and the normal direction of the plano-crystal (05) according to the horizontal angle value alpha ' and the horizontal angle value beta ';
and S4, calculating to obtain an axial azimuth angle horizontal direction change value theta of the atomic gyroscope according to the horizontal included angle phi before rotation and the horizontal included angle phi' after rotation.
6. The dual-theodolite-based atomic gyro axial azimuth angle measurement method according to claim 5, wherein the step S2 includes:
s201, aligning the first warp-weft instrument (03) to a reflecting surface of a reflector (6a), and acquiring an initial horizontal value a of the reflector (6a) relative to the first warp-weft instrument (03); aiming the first theodolite (03) at the second theodolite (04) to obtain an initial horizontal numerical value a' of the second theodolite (04) relative to the first theodolite (03); the horizontal angle value alpha of the reflector (6a), the first theodolite (03) and the second theodolite (04) is calculated by the following formula: α -a';
s202, aiming the second theodolite (04) at the first theodolite (03), and acquiring an initial horizontal numerical value b of the first theodolite (03) relative to the second theodolite (04); aligning the second theodolite (04) to the flat crystal (05) and acquiring an initial horizontal numerical value b' of the flat crystal (05) relative to the second theodolite (04); calculating the horizontal angle value beta of the first theodolite (03) -the second theodolite (04) -the plane crystal (05) by the following formula: β ═ b-b';
s203, calculating a horizontal angle value between the normal direction of the flat crystal (05) and the normal direction of the reflecting surface of the reflecting mirror (6a) according to the following formula: Φ is 180 ° - (180 ° - α) - (180 ° - β).
7. The dual-theodolite-based atomic gyro axial azimuth angle measurement method according to claim 5, wherein the step S3 includes:
s301, horizontally rotating the atomic gyroscope, and adjusting the coordinate position of the first theodolite (03) to enable the coordinate position to be kept on the normal line of the reflecting surface of the reflector (6 a);
s302, aligning the first warp-weft instrument (03) to a reflecting surface of a reflecting mirror (6a), and acquiring a current horizontal value a1 of the reflecting mirror (6a) relative to the first warp-weft instrument (03); aiming the first theodolite (03) at a second theodolite (04) to obtain a current horizontal numerical value a 1' of the second theodolite (04) relative to the first theodolite (03); the horizontal angle value alpha' of the reflector (6a), the first theodolite (03) and the second theodolite (04) is calculated by the following formula: α '═ a1-a 1';
s303, aiming the second theodolite (04) at the first theodolite (03), and acquiring a current horizontal numerical value b1 of the first theodolite (03) relative to the second theodolite (04); aligning the second theodolite (04) to the flat crystal (05) and acquiring a current horizontal numerical value b 1' of the flat crystal (05) relative to the second theodolite (04); calculating the horizontal angle value beta' of the first theodolite (03) -the second theodolite (04) -the plane crystal (05) by the following formula: β '═ b1-b 1';
s304, calculating a horizontal angle value between the normal direction of the flat crystal (05) and the normal direction of the reflecting surface of the reflecting mirror (6a) according to the following formula: Φ ' — (180 ° - α ') - (180 ° - β ').
8. The method for measuring the axial azimuth angle of the atomic gyroscope based on the dual theodolites as claimed in claim 5, wherein in step S4, the horizontal direction variation value θ of the axial azimuth angle before and after the rotation of the atomic gyroscope is calculated by the following formula: θ ═ Φ' - Φ.
9. The dual-theodolite-based atomic gyroscope axial azimuth angle measurement method according to claim 5, wherein the tilt correction of the atomic gyroscope comprises:
in step S2, detecting and recording an initial tilt angle (x, y) of the atomic gyro;
in step S3, after the atomic gyro is rotated, the real-time tilt angle (x ', y') of the atomic gyro is detected, and the tilt angle of the atomic gyro is adjusted until the value of (x ', y') coincides with the value of (x, y).
10. The method for measuring the axial azimuth angle of the atomic gyroscope based on the double theodolites as claimed in claim 5, wherein if the rotation angle of the atomic gyroscope exceeds 180 °, the positions of the plano-crystal (05) and the second theodolite (04) are adjusted, so that the second theodolite (04) is kept on the normal of the plano-crystal (05), the second theodolite (04) and the first theodolite (03) are mutually located in the aiming range of each other, the second theodolite (04) and the first theodolite (03) can be mutually aligned, and then the steps S1-S4 are repeated.
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