CN114167840A - Wireless charging chip test system combined with peripheral MCU - Google Patents
Wireless charging chip test system combined with peripheral MCU Download PDFInfo
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- CN114167840A CN114167840A CN202111472570.7A CN202111472570A CN114167840A CN 114167840 A CN114167840 A CN 114167840A CN 202111472570 A CN202111472570 A CN 202111472570A CN 114167840 A CN114167840 A CN 114167840A
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- 238000012360 testing method Methods 0.000 title claims abstract description 63
- 230000002093 peripheral effect Effects 0.000 title claims abstract description 23
- 238000004891 communication Methods 0.000 claims abstract description 25
- 239000004973 liquid crystal related substance Substances 0.000 description 9
- 239000000463 material Substances 0.000 description 9
- 238000005516 engineering process Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0256—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24065—Real time diagnostics
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Charge And Discharge Circuits For Batteries Or The Like (AREA)
Abstract
The invention discloses a wireless charging chip test system combined with a peripheral MCU (microprogrammed control unit), which changes a communication host during burning, and changes the burning of a wireless charging chip from being executed by a test machine to being executed by a peripheral MCU chip of the wireless charging chip, wherein the MCU chip and the wireless charging chip are in communication between internal levels of the same board card. The invention can improve the testing speed and stability of the wireless charging chip and can adapt to various tests of the wireless charging chip.
Description
Technical Field
The invention belongs to the field of chip sealing and testing, and particularly relates to a wireless charging chip testing system combined with a peripheral MCU.
Background
The wireless charging chip applies a novel energy transmission technology, namely a wireless charging technology. The technology enables the charger to get rid of the limitation of a circuit, and the complete separation of an electric appliance and a power supply is realized. The charger has the advantages of practicability, flexibility and the like better than the traditional charger. The wireless charging technology shows wide development prospect, the market of the wireless charging chips is developed vigorously, more and more wireless charging chips are on the surface at present, and a large amount of wireless charging chip test scheme development requirements are met.
In a wireless charging chip testing link, a corresponding program is generally required to be burned into a register inside a wireless charging chip, so as to drive the chip and detect a corresponding function, such as configuring a chip output frequency, a chip internal self-checking program, and the like. At present, a test machine operates Pattern to write program data into an internal register of an IC, and because the test machine is connected with the IC by a universal cable, certain impedance interference exists, so that the speed and the stability during burning are influenced.
There is a need in the art for a solution that can improve the test rate and stability of a wireless charging chip.
Disclosure of Invention
In view of this, the present invention provides a wireless charging chip test system combined with a peripheral MCU, which is characterized in that:
the test system changes a communication host during burning, the burning of the wireless charging chip is converted from the execution of the test machine to the execution of a peripheral MCU chip of the wireless charging chip, wherein the MCU chip and the wireless charging chip are in communication between the internal levels of the same board card.
Preferably, the first and second liquid crystal materials are,
the MCU chip is connected with a peripheral circuit of the wireless charging chip.
Preferably, the first and second liquid crystal materials are,
the MCU chip is connected with the tester.
Preferably, the first and second liquid crystal materials are,
the MCU chip is electrically connected with the communication pin of the wireless charging chip to be tested.
Preferably, the first and second liquid crystal materials are,
the MCU chip is an MCU chip with various communication protocols.
Preferably, the first and second liquid crystal materials are,
and (4) adopting a program burner to burn the burning program into the MCU through a reserved burning interface of the board card.
Preferably, the first and second liquid crystal materials are,
and defining the burning command and the burning state pin of the MCU in the program of the tester.
Preferably, the first and second liquid crystal materials are,
and compiling a statement for sending a burning command and detecting a burning state of the MCU pin by the tester in the tester program.
Preferably, the first and second liquid crystal materials are,
the test machine is connected with the board card through the Cable.
Preferably, the first and second liquid crystal materials are,
the board card is connected with the manipulator or the sorting machine through a jig.
The invention has the following technical effects:
through the scheme, the test system of the invention combines the test scheme of the wireless charging chip burned by the peripheral MCU to change the communication host during burning, the MCU chip burned to the peripheral circuit is executed, the communication between the test machine and the chip to be tested is converted into the communication between board card levels through cable connection, the influence is eliminated, and a series of problems caused by burning of the test machine can be effectively improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a schematic diagram of a test system in one embodiment of the invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it should be noted that if the terms "upper", "lower", "inside", "outside", etc. indicate an orientation or a positional relationship based on that shown in the drawings or that the product of the present invention is used as it is, this is only for convenience of description and simplification of the description, and it does not indicate or imply that the device or the element referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present invention.
Furthermore, the appearances of the terms "first," "second," and the like, if any, are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
It should be noted that the features of the embodiments of the present invention may be combined with each other without conflict.
In one embodiment, the present invention discloses a wireless charging chip test system combined with a peripheral MCU, which is characterized in that: the test system changes the communication host during burning, and the burning of the wireless charging chip is converted from the execution of the test machine to the execution of the peripheral MCU chip of the wireless charging chip.
It can be understood that the present embodiment has the following features: compared with the traditional test scheme, the invention converts the connection of the tester and the chip to be tested into the communication between the board card levels through the cable connection.
That is to say, the MCU chip and the wireless charging chip are communicated between the internal levels of the same board card.
It can be understood that through the same board card, the board card serves as a test board card, the problems that burning is unstable, the speed is low, mistakes are easy to make and the like in the chip test process are solved, and the test quality is effectively improved.
In one embodiment of the present invention,
the MCU chip is connected with a peripheral circuit of the wireless charging chip.
In one embodiment of the present invention,
the MCU chip is connected with the tester.
In one embodiment of the present invention,
the MCU chip is electrically connected with the communication pin of the wireless charging chip to be tested.
In one embodiment of the present invention,
the MCU chip is an MCU chip with various communication protocols.
In one embodiment of the present invention,
and (4) adopting a program burner to burn the burning program into the MCU through a reserved burning interface of the board card.
In one embodiment of the present invention,
and defining the burning command and the burning state pin of the MCU in the program of the tester.
In one embodiment of the present invention,
and compiling a statement for sending a burning command and detecting a burning state of the MCU pin by the tester in the tester program.
In one embodiment of the present invention,
the test machine is connected with the board card through the Cable.
In one embodiment of the present invention,
the board card is connected with the manipulator or the sorting machine through a jig.
Referring to fig. 1, in one embodiment,
a test scheme of a wireless charging chip combining with peripheral MCU burning is characterized in that when a PCB test board card is planned and tested, a peripheral circuit of a tested chip is connected with an MCU chip, communication pins of both sides of the MCU chip and the tested chip are electrically connected, burning pins required by the tested chip and an MCU communication protocol are reserved as burning ports, and a program burner is adopted to burn a required test program into a memory of the MCU through the reserved burning ports of the board card before the chip is tested. When the tested chip needs to be burned, the testing machine sends a burning instruction to a specific pin of the MCU, the MCU can automatically establish a communication protocol with the tested chip and execute burning actions to burn program data in the internal memory of the MCU into the chip, and then the testing machine detects the pin state predefined by the MCU to detect whether burning is finished.
The testing machine and the MCU can be used for respectively playing respective advantages of the testing machine and the MCU through the combination of the testing machine and the peripheral MCU for burning, and the problem caused by burning through a pattern is avoided.
Obviously, the wireless charging chip test system combining with peripheral MCU burning disclosed by the invention comprises:
1. the host machine during the programming process is changed, and the problems of low speed and instability caused by cable connection impedance are solved;
2. the tester as an analog I2C communication host has a communication rate that cannot reach the maximum rate supported by the wireless charging chip.
To sum up, combine external MCU chip with data transmission to the MCU chip execution, MCU has built-in communication protocol, and is connected by cable and more changes direct electrical connection into, has got rid of input/output impedance, when acting as the burning record host computer and burn record, can reach faster speed and more stable effect with being surveyed the chip communication.
In addition, the test machine is combined with the peripheral MCU to carry out burning operation together, so that the test program can be simplified, the test program is more convenient to maintain and update, if burning data needs to be modified, the MCU only needs to be burned again, the complex pattern of the test machine does not need to be modified, and error errors which may be brought about are avoided;
the test time can be shortened by combining the test scheme of the wireless charging chip burnt by the peripheral MCU, the stability is high, the output of the chip test is more efficient, the test program is simplified, the development period can be shortened, the efficiency is improved, and the economical efficiency and the practicability are good;
obviously, the wireless charging chip testing system combining with the peripheral MCU burning is simple to realize and high in feasibility, the speed, the stability and the yield of the burning process are obviously improved, the testing time in a unit is faster, the testing cost is saved, the production efficiency is greatly improved, and the wireless charging chip testing system has good economy and practicability. Meanwhile, the comprehensive advantages of the program, the MCU and the communication between the same board card and particularly between the internal levels of the same board card are fully utilized, so that the test becomes more concise and efficient and is easy to update and maintain, the development period is greatly shortened, and the method is favorable for flexibly adapting to various later-stage tests of a large number of wireless charging tests on the market.
The above description is only for the specific embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the appended claims.
Claims (10)
1. The utility model provides a wireless chip test system that charges who combines peripheral MCU which characterized in that:
the test system changes a communication host during burning, the burning of the wireless charging chip is converted from the execution of the test machine to the execution of a peripheral MCU chip of the wireless charging chip, wherein the MCU chip and the wireless charging chip are in communication between the internal levels of the same board card.
2. The test system of claim 1, wherein, preferably,
the MCU chip is connected with a peripheral circuit of the wireless charging chip.
3. The test system of claim 1,
the MCU chip is connected with the tester.
4. The test system of claim 1,
the MCU chip is electrically connected with the communication pin of the wireless charging chip to be tested.
5. The test system of claim 1,
the MCU chip is an MCU chip with various communication protocols.
6. The test system of claim 1,
and (4) adopting a program burner to burn the burning program into the MCU through a reserved burning interface of the board card.
7. The test system of claim 1,
and defining the burning command and the burning state pin of the MCU in the program of the tester.
8. The test system of claim 1,
and compiling a statement for sending a burning command and detecting a burning state of the MCU pin by the tester in the tester program.
9. The test system of claim 1,
the test machine is connected with the board card through the Cable.
10. The test system of claim 1,
the board card is connected with the manipulator or the sorting machine through a jig.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202111472570.7A CN114167840A (en) | 2021-12-06 | 2021-12-06 | Wireless charging chip test system combined with peripheral MCU |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202111472570.7A CN114167840A (en) | 2021-12-06 | 2021-12-06 | Wireless charging chip test system combined with peripheral MCU |
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| CN114167840A true CN114167840A (en) | 2022-03-11 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114814540A (en) * | 2022-04-20 | 2022-07-29 | 苏州吾爱易达物联网有限公司 | SLT (Serial bus test) method and system of SIP (Session initiation protocol) chip |
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