CN114137470A - Bandwidth testing device and measuring method thereof - Google Patents
Bandwidth testing device and measuring method thereof Download PDFInfo
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- CN114137470A CN114137470A CN202111492033.9A CN202111492033A CN114137470A CN 114137470 A CN114137470 A CN 114137470A CN 202111492033 A CN202111492033 A CN 202111492033A CN 114137470 A CN114137470 A CN 114137470A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
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Abstract
The invention belongs to the technical field of bandwidth measurement, and particularly relates to a bandwidth testing device and a bandwidth measuring method. Which is used to reduce the difficulty and cost of measuring and evaluating the bandwidth characteristics of the current sensor. The device comprises a simple harmonic waveform generator, data acquisition equipment, data processing equipment and a to-be-detected sample sensor; wherein, the data acquisition equipment is respectively connected with the data processing equipment, the simple waveform generator and the sample sensor to be measured.
Description
Technical Field
The invention belongs to the technical field of bandwidth measurement, and particularly relates to a bandwidth testing device and a bandwidth measuring method.
Background
Current sensors are widely used in various power applications. The current in various electricity utilization occasions is from several amperes to several tens of thousands of amperes, and the current has direct current, also has alternating current and high frequency current measurement requirements. Therefore, currents with different magnitudes are converted into uniform voltages in proportion, measurement and control are facilitated, and protection is facilitated. In particular, the isolated current sensor not only reduces the risk brought by directly measuring the high-voltage line, but also reduces the danger of actual operation and improves the utilization rate of the isolated current sensor.
With the continuous progress of national production and life, the accurate measurement of the electric quantity is on the way. How to accurately measure the current to obtain more real current information becomes a problem which needs to be solved urgently in industries such as electricity utilization and the like. The output signal of the current sensor is a traditional method for evaluating the bandwidth characteristic of the current sensor by considering sinusoidal current signals with different frequencies as the current to be measured. Conventional current sensor bandwidth measurement evaluation typically requires a primary nominal input current source, a secondary output measurement device, where the nominal input current source needs to be able to provide nominally accurate current at different frequency points to be measured. And determining the bandwidth of the current sensor according to the ratio of the output of the current sensor to the measured current at each frequency point. Therefore, the conventional method puts high requirements on the variable-frequency sinusoidal current source, and especially, when the current sensor has a large range, the requirement on the large-amplitude high-frequency current source severely limits the evaluation work of the bandwidth of the current sensor.
In summary, the main disadvantages of the conventional method for estimating the bandwidth of the current sensor are as follows: 1. there is a need for a current source with high accuracy and continuous frequency that can be adjusted over a wide range, otherwise the evaluation of the full scale bandwidth of the current sensor cannot be met.
2. In fact, the precise high-frequency large-current power supply has great difficulty and high cost in manufacturing and implementation.
3. And each frequency point is tested point by point, so that the time and the labor are consumed, and the test evaluation cost is increased.
4. The rapidly developing digital signal and digital information processing techniques are ignored.
In view of the above shortcomings of conventional methods for measuring the frequency response bandwidth of a current sensor, there is a need for an improved technique for measuring the bandwidth of a current sensor.
Disclosure of Invention
Aiming at the defects in the prior art, the invention provides a bandwidth testing device and a measuring method thereof. The method is used for reducing the difficulty and cost of measuring and evaluating the bandwidth characteristics of the current sensor.
In order to achieve the purpose, the invention adopts the following technical scheme that the bandwidth testing device comprises a simple harmonic waveform generator, data acquisition equipment, data processing equipment and a to-be-tested sample sensor; wherein, the data acquisition equipment is respectively connected with the data processing equipment, the simple waveform generator and the sample sensor to be measured.
Furthermore, the simple harmonic waveform generator outputs a waveform which can be adjusted in frequency, duty ratio and amplitude within a certain range through a single chip microcomputer.
Further, the data processing apparatus is configured at the test platform to: according to the change value and the change time of the output of the simple waveform generator detected by the data acquisition equipment, calculating to obtain the frequency amplitude and the phase information of the simple waveform current signal, according to the signal acquired by the data processing equipment from the sample sensor to be detected, calculating to obtain the frequency amplitude and the phase information of the output signal of the sample sensor to be detected, and finally comparing the frequency amplitude and the phase information of the simple waveform current signal with the frequency amplitude and the phase information of the output signal of the sample sensor to be detected to determine the frequency response and the bandwidth characteristics of the current sensor.
Further, the data processing apparatus: according to the change value and the change time of the output of the simple harmonic waveform generator detected by the data acquisition equipment, the frequency amplitude and the phase information of the simple harmonic waveform current signal are obtained through FFT calculation, and according to the signal acquired by the data processing equipment from the sample sensor to be detected, the frequency amplitude and the phase information of the output signal of the sample sensor to be detected are obtained through FFT calculation.
A bandwidth measurement method, comprising the steps of:
step S0, based on the bandwidth testing device.
And step S1, checking circuit connectivity.
And step S2, after the examination is finished, supplying power to the simple harmonic waveform generator, and enabling the simple harmonic waveform generator to generate square waves, pulse waves or multi-harmonic currents as detected current signals input into the sample sensor to be detected.
And step S3, the data processing equipment calculates and obtains the frequency amplitude and the phase information of the simple harmonic waveform current signal according to the voltage change value and the voltage change time of the sampling resistor detected by the data acquisition equipment.
And step S4, the data processing equipment calculates and obtains the frequency amplitude and the phase information of the output signal of the sample sensor to be detected according to the signal acquired by the data acquisition equipment from the sample sensor to be detected.
Step S5, the data processing equipment compares the frequency amplitude and the phase information of the simple harmonic waveform current signal with the frequency amplitude and the phase information of the output signal of the sample sensor to be detected so as to determine the frequency response and the bandwidth characteristics of the current sensor.
Further, in step S2, the simple waveform generator should generate a plurality of cycles of square wave, pulse wave or multi-harmonic current as the measured current signal input to the current sensor.
Step S3 includes: and according to the voltage change value and the voltage change time of the sampling resistor detected by the data sampling equipment, the frequency amplitude and the phase information of the simple waveform current signal are obtained through FFT calculation.
Step S4 includes: and according to the signals acquired by the data acquisition equipment from the sample sensor to be detected, the frequency amplitude and the phase information of the output signals of the sample sensor to be detected are obtained through FFT calculation.
Compared with the prior art, the invention has the beneficial effects.
The invention utilizes a simple harmonic waveform generator to generate required simple harmonic waveform signal current as an input signal of a sensor, utilizes high-speed data sampling and FFT principles to obtain an output signal of a measured current signal after being converted by a sample sensor to be measured, and finally obtains the bandwidth characteristic of the sample sensor to be measured by comparing the amplitude and the phase of a plurality of frequency components of the input current signal and the output signal of the current sensor. The method obviously reduces the difficulty of measuring and evaluating the bandwidth characteristics of the current sensor, is practical and convenient, has reliable results, and is worthy of popularization.
Drawings
The invention is further described with reference to the following figures and detailed description. The scope of the invention is not limited to the following expressions.
FIG. 1 is a block diagram of a bandwidth testing apparatus according to an embodiment.
FIG. 2 is a schematic diagram of a simple harmonic waveform generator generating a decomposed resynthesized image of a simple harmonic waveform.
Detailed Description
The present invention includes, as shown in fig. 1, a bandwidth measuring apparatus of the present invention, including: the device comprises a self-made simple harmonic waveform generator 1 with adjustable duty ratio and output frequency, a data acquisition device 3, a data processing device 4 and a to-be-detected sample sensor 2.
Under the normal working state, supplying power to the simple harmonic waveform generator 1, and enabling the simple harmonic waveform generator 1 to generate square waves, pulse waves or multi-harmonic currents as detected current signals input into a sample sensor to be detected; the data processing device 4 calculates and obtains the frequency amplitude and the phase information of the simple waveform current signal through Fast Fourier Transform (FFT) according to the voltage change value and the voltage change time of the sampling resistor detected by the data acquisition device 3; the data processing equipment 4 calculates and obtains the frequency amplitude and the phase information of the output signal of the sample sensor 2 to be detected according to the signal acquired by the data acquisition equipment 3 from the sample sensor 2 to be detected; the data processing device 4 compares the frequency amplitude and phase information of the simple waveform current signal with the frequency amplitude and phase information of the output signal of the sample sensor to be measured to determine the frequency response and bandwidth characteristics of the current sensor.
Meanwhile, in the process, the calculation precision of the FFT is related to the number of sampling points of the data, so that the simple harmonic waveform is decomposed by the FFT and converted into multiple harmonics, and the comparison result is compared to finally obtain the accurate evaluation value of the bandwidth of the current sensor.
Based on the current sensor bandwidth measuring device, the second invention, namely a current sensor bandwidth measuring method, includes the following steps.
Step S1, circuit connectivity is checked.
And step S2, after the examination is finished, supplying power to the simple harmonic waveform generator 1, and enabling the simple harmonic waveform generator 1 to generate square wave, pulse wave or multi-harmonic current as a detected current signal input into the sample sensor 2 to be detected.
In step S3, the data processing device 4 calculates and obtains the frequency amplitude and the phase information of the simple harmonic waveform current signal 1 according to the voltage change value and the voltage change time of the sampling resistor detected by the data acquisition device 3.
In step S4, the data processing device 4 calculates and obtains the frequency amplitude and phase information of the output signal of the sample sensor 2 to be measured according to the signal collected by the data collecting device 3 from the sample sensor 2 to be measured.
In step S5, the data processing device 4 compares the frequency amplitude and phase information of the simple waveform current signal with the frequency amplitude and phase information of the output signal of the sample sensor to be measured, so as to determine the frequency response and bandwidth characteristics of the current sensor 2.
In summary, the invention aims to reduce the measurement and evaluation difficulty of the frequency response and the bandwidth of the current sensor, skillfully utilizes the characteristic that a simple harmonic current signal has rich frequency components, skillfully solves the problem of a current signal source to be tested by utilizing FFT analysis, a digital signal technology and a digital information processing technology, can test in a wide frequency domain range and a wide range, and has relatively low loss power of the current source to be tested. Specifically, the present invention has the following advantages.
1. The method is simple to operate, strong in concept and convenient to calculate; the current signal frequency spectrum of the current signal source in the working state is obtained according to the electrical knowledge, and the signal frequency characteristic of the current to be measured of the current sensor is obtained by utilizing the mature FFT technology.
2. The invention reduces the working intensity of the bandwidth test of the current sensor and avoids the repeated operation that the sine wave current source needs each frequency point to carry out measurement.
3. The invention fully utilizes the existing mature digital information processing technology, obtains the bandwidth characteristic of the current sensor by comparing the difference of the digital information, is convenient for realizing a computer program and lays a foundation for automatic testing.
It should be understood that the detailed description of the present invention is only for illustrating the present invention and is not limited by the technical solutions described in the embodiments of the present invention, and those skilled in the art should understand that the present invention can be modified or substituted equally to achieve the same technical effects; as long as the use requirements are met, the method is within the protection scope of the invention.
Claims (6)
1. The utility model provides a bandwidth testing arrangement which characterized in that: the device comprises a simple harmonic waveform generator, data acquisition equipment, data processing equipment and a to-be-detected sample sensor; wherein, the data acquisition equipment is respectively connected with the data processing equipment, the simple waveform generator and the sample sensor to be measured.
2. A bandwidth testing device according to claim 1, characterized in that: the simple harmonic waveform generator outputs a waveform with adjustable frequency, duty ratio and amplitude within a certain range through a single chip microcomputer.
3. A bandwidth testing device according to claim 1, characterized in that: the data processing device is used in a test platform for: according to the change value and the change time of the output of the simple waveform generator detected by the data acquisition equipment, calculating to obtain the frequency amplitude and the phase information of the simple waveform current signal, according to the signal acquired by the data processing equipment from the sample sensor to be detected, calculating to obtain the frequency amplitude and the phase information of the output signal of the sample sensor to be detected, and finally comparing the frequency amplitude and the phase information of the simple waveform current signal with the frequency amplitude and the phase information of the output signal of the sample sensor to be detected to determine the frequency response and the bandwidth characteristics of the current sensor.
4. A bandwidth testing device according to claim 1, characterized in that: the data processing apparatus: according to the change value and the change time of the output of the simple harmonic waveform generator detected by the data acquisition equipment, the frequency amplitude and the phase information of the simple harmonic waveform current signal are obtained through FFT calculation, and according to the signal acquired by the data processing equipment from the sample sensor to be detected, the frequency amplitude and the phase information of the output signal of the sample sensor to be detected are obtained through FFT calculation.
5. A method of bandwidth measurement, comprising: the method comprises the following steps:
step S0, testing the device based on the bandwidth;
step S1, checking circuit connectivity;
step S2, after the examination is finished, supplying power to a simple harmonic waveform generator, and enabling the simple harmonic waveform generator to generate square waves, pulse waves or multi-harmonic currents as detected current signals input into the sample sensor to be detected;
step S3, the data processing equipment calculates and obtains the frequency amplitude and the phase information of the simple harmonic waveform current signal according to the voltage change value and the voltage change time of the sampling resistor detected by the data acquisition equipment;
step S4, the data processing equipment calculates and obtains the frequency amplitude and the phase information of the output signal of the sample sensor to be detected according to the signal acquired by the data acquisition equipment from the sample sensor to be detected;
step S5, the data processing equipment compares the frequency amplitude and the phase information of the simple harmonic waveform current signal with the frequency amplitude and the phase information of the output signal of the sample sensor to be detected so as to determine the frequency response and the bandwidth characteristics of the current sensor.
6. The bandwidth measurement method according to claim 5, wherein: in step S2, the simple waveform generator should generate multiple periods of square wave, pulse wave or multi-harmonic current as the measured current signal input to the current sensor;
step S3 includes: according to the voltage change value and the voltage change time of the sampling resistor detected by the data sampling equipment, frequency amplitude and phase information of the simple harmonic waveform current signal are obtained through FFT calculation;
step S4 includes: and according to the signals acquired by the data acquisition equipment from the sample sensor to be detected, the frequency amplitude and the phase information of the output signals of the sample sensor to be detected are obtained through FFT calculation.
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CN115290180A (en) * | 2022-08-25 | 2022-11-04 | 天津大学 | Optical fiber type blade tip timing sensor bandwidth testing device and method |
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DE102004051949A1 (en) * | 2004-10-25 | 2006-04-27 | Prüftechnik Dieter Busch AG | Method for detecting faults in a test piece moved relative to a probe in a non-destructive and non-contact manner using a filter whose frequency is set depending on the fault frequency |
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