CN114124249B

CN114124249B - Test system

Info

Publication number: CN114124249B
Application number: CN202010879651.8A
Authority: CN
Inventors: 常凯; 陈良文; 陈顺利
Original assignee: Anhui Tatfook Technology Co Ltd
Current assignee: Anhui Tatfook Technology Co Ltd
Priority date: 2020-08-27
Filing date: 2020-08-27
Publication date: 2024-04-09
Anticipated expiration: 2040-08-27
Also published as: CN114124249A

Abstract

The application discloses test system, this test system is used for testing the filter index, and the filter includes a plurality of emission ports, and this test system includes at least: the device comprises a processor, a first test device, a second test device and an automatic line changing machine, wherein the first test device, the second test device and the automatic line changing machine are respectively connected with the processor; the automatic line changing machine is used for connecting first testing equipment to one of the plurality of emission ports, wherein the first testing equipment is used for sequentially testing first indexes of the emission ports; the automatic line changing machine is used for simultaneously connecting second testing equipment to another emission port in the plurality of emission ports, and the second testing equipment is used for sequentially testing second indexes of the emission ports. Therefore, the test system provided by the application can test different indexes of different emission ports of the filter at the same time, and the test efficiency is improved.

Description

Test system

Technical Field

The application relates to the technical field of detection, in particular to a test system.

Background

The filter is used as a communication device for selecting frequencies and suppressing signals, and plays an important role in the field of communication radio frequency. Before the filter leaves the factory, various indexes of the filter need to be tested, and main tested indexes include a power index, an intermodulation index, an out-of-band index, a voltage index, a TDR index and the like.

At present, the power index, intermodulation index, out-of-band index, voltage index and TDR index of a filter are generally tested separately to obtain each index respectively. Such a test process is cumbersome, takes much time, and is not beneficial to improving the efficiency of the test.

Disclosure of Invention

In order to solve the above problems in the prior art for testing the filter index, the present application provides a testing system.

To solve the above problems, an embodiment of the present application provides a test system for testing a filter index, where a filter includes a plurality of transmitting ports, and the test system includes at least: the device comprises a processor, a first test device, a second test device and an automatic line changing machine, wherein the first test device, the second test device and the automatic line changing machine are respectively connected with the processor; the automatic line changing machine is used for connecting first testing equipment to one of the plurality of emission ports, wherein the first testing equipment is used for sequentially testing first indexes of the emission ports; the automatic line changing machine is used for simultaneously connecting second testing equipment to another emission port in the plurality of emission ports, and the second testing equipment is used for sequentially testing second indexes of the emission ports.

Further, the filter also comprises a plurality of antenna ports, the antenna ports are correspondingly arranged with the transmitting ports, and the automatic line changing machine at least comprises a first switch unit and a second switch unit; the first testing device comprises a first power amplifier, a first signal source and a load, wherein the first power amplifier is connected with the first signal source, the first signal source is connected with the processor, the first switching unit is used for connecting the first power amplifier to one of a plurality of transmitting ports, and the second switching unit is used for simultaneously connecting the load to a corresponding antenna port so as to sequentially test the power of the transmitting ports.

Further, the filter further comprises a plurality of receiving ports, the receiving ports are correspondingly arranged with the transmitting ports, the automatic line changing machine further comprises a third switch unit, the second test equipment comprises a radio frequency matrix switch and a network analyzer, the radio frequency matrix switch is connected with the network analyzer, and the radio frequency matrix switch and the network analyzer are respectively connected with the processor; the first switch unit simultaneously connects the radio frequency matrix switch to another transmitting port of the plurality of transmitting ports, and the third switch unit simultaneously connects the radio frequency matrix switch to a corresponding receiving port to sequentially test the TDR performance between the plurality of transmitting ports and the corresponding receiving port.

Further, the test system further includes an intermodulation test device, the first switch unit connects the intermodulation test device to one of the plurality of transmit ports, the second switch unit simultaneously connects the load to the corresponding antenna port, and the third switch unit simultaneously connects the intermodulation test device to the corresponding receive port to test intermodulation performance between the transmit port and the corresponding receive port in sequence.

Further, the test system further comprises a second signal source, a third signal source and a frequency spectrograph, wherein the second signal source and the third signal source are respectively connected with the first power amplifier, and the second signal source, the third signal source and the frequency spectrograph are connected with the processor; after the power test of the plurality of transmitting ports is finished, the first switch unit connects the first power amplifier to one transmitting port of the plurality of transmitting ports, the second switch unit is simultaneously connected with the load and the corresponding antenna port, and the third switch unit is simultaneously connected with the frequency spectrograph to the corresponding receiving port so as to sequentially test intermodulation performance between the transmitting port and the corresponding receiving port.

The test system further comprises a second power amplifier, a second signal source, a third signal source and a frequency spectrograph, wherein the second signal source and the third signal source are respectively connected with the second power amplifier, and the second signal source, the third signal source and the frequency spectrograph are respectively connected with the processor; when the first switch unit connects the first power amplifier to one of the plurality of transmit ports, the first switch unit simultaneously connects the second power amplifier to another one of the plurality of transmit ports, the second switch unit simultaneously connects the load to the corresponding antenna port, and the third switch unit simultaneously connects the spectrometer to the corresponding receive port to sequentially test intermodulation performance between the transmit port and the corresponding receive port.

Further, after intermodulation performance testing between the plurality of transmitting ports and the corresponding receiving ports is completed, the first switch unit connects the radio frequency matrix switch to one of the plurality of transmitting ports, and the third switch unit simultaneously connects the radio frequency matrix switch to the corresponding receiving port, so as to sequentially test out-of-band rejection performance between the transmitting ports and the corresponding receiving ports.

Further, the second test equipment comprises a radio frequency matrix switch and a network analyzer, the radio frequency matrix switch is connected with the network analyzer, and the radio frequency matrix switch and the network analyzer are respectively connected with the processor; when the first switch unit connects the first power amplifier to one of the plurality of transmitting ports to sequentially test the power of the transmitting ports, the first switch unit simultaneously connects the radio frequency matrix switch to the other transmitting port of the plurality of transmitting ports, and the second switch unit simultaneously connects the radio frequency matrix switch to the corresponding antenna port to sequentially test the TDR performance between the transmitting port and the corresponding antenna port.

Further, the filter further comprises a lightning protection feed port, the lightning protection feed port is correspondingly arranged with the antenna ports, the test system further comprises a multi-path voltage test device, the second switch unit is used for connecting the radio frequency matrix switch to one of the antenna ports so as to sequentially test the TDR performance between the transmitting port and the corresponding antenna port, the second switch unit is used for simultaneously connecting the multi-path voltage device to the other antenna port of the antenna ports, and the multi-path voltage device is simultaneously communicated with the corresponding lightning protection feed port so as to sequentially test the voltage between the antenna port and the corresponding lightning protection port.

Further, the filter further comprises a plurality of reverse coupling ports, a plurality of forward coupling ports and a plurality of PCBA ports, the second test equipment comprises a radio frequency matrix switch and a network analyzer, the radio frequency matrix switch is connected with the network analyzer, and the radio frequency matrix switch and the network analyzer are respectively connected with the processor; when the first switch unit connects the first power amplifier to one of the plurality of emission ports to sequentially test the power of the emission ports, the first switch unit simultaneously connects the radio frequency matrix switch to another emission port of the plurality of emission ports, and the radio frequency matrix switch is simultaneously connected with a different reverse coupling port or a different forward coupling port or a different PCBA port or a different lightning protection feed port to sequentially test the TDR performance between the emission port and the reverse coupling port or the forward coupling port or the plurality of PCBA ports or the lightning protection feed port.

Compared with the prior art, the test system of the application at least comprises: the device comprises a processor, a first test system, a second test system and an automatic line changing machine, wherein the first test system, the second test system and the automatic line changing machine are respectively connected with the processor; the automatic line changing machine is used for connecting a first test system to one of the emission ports, wherein the first test system is used for sequentially testing first indexes of the emission ports; the automatic line changing machine is used for simultaneously connecting a second testing system to another transmitting port in the plurality of transmitting ports, and the second testing system is used for sequentially testing second indexes of the transmitting ports. Therefore, the test system provided by the application can test different indexes of two emission ports in a plurality of emission ports of the filter at the same time, and the test efficiency is improved.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings that are needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic diagram of a first embodiment of the test system of the present application;

FIG. 2 is a schematic diagram of a second embodiment of the test system of the present application;

FIG. 3 is a schematic diagram of a third embodiment of the test system of the present application;

FIG. 4 is a schematic diagram of a fourth embodiment of the test system of the present application;

fig. 5 is a schematic structural view of a fifth embodiment of the test system of the present application.

Detailed Description

The present application is described in further detail below with reference to the drawings and examples. It is specifically noted that the following examples are only for illustration of the present application, but do not limit the scope of the present application. Likewise, the following embodiments are only some, but not all, of the embodiments of the present application, and all other embodiments obtained by one of ordinary skill in the art without inventive effort are within the scope of the present application.

The terms "first," "second," "third," "fourth" and the like in the description and in the claims of this application and in the above-described figures, if any, are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that embodiments of the present application described herein may be implemented, for example, in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

Referring to fig. 1, fig. 1 is a schematic structural diagram of a first embodiment of a test system 10 of the present application.

As shown in fig. 1, the test system 10 of the present embodiment at least includes a processor 11, a first test device 12, a second test device 13 and an automatic wire changer 14, which are respectively connected to the processor 11. Wherein the first test device 12 and the second test device 13 are respectively connected with an automatic wire changing machine 14.

Wherein the automatic line changing machine 14 includes a plurality of interfaces and the filter 20 includes a plurality of ports. When the index test is performed on the filter 20, each port of the filter 20 is connected to one interface of the automatic line changing machine 14, and the interfaces connected to each port are different, the processor 11 can control the automatic line changing machine 14 to connect any one of the ports of the filter 20 with the first test device 12 or the second test device 13.

In this embodiment, the filter 20 includes at least four transmitting ports, i.e., a first transmitting port 201, a second transmitting port 202, a third transmitting port 203, and a fourth transmitting port 204, where the first transmitting port 201, the second transmitting port 202, the third transmitting port 203, and the fourth transmitting port 204 are respectively connected to one interface of the automatic line changer.

When the test system 10 of the present embodiment performs the index test on the filter 20, the processor 11 controls the automatic line changing machine 14 to connect the first test device 12 to one of the plurality of transmitting ports, the first test device 12 obtains the test data of the first index of the radio frequency signal of the transmitting port of the filter 20, the processor 11 obtains the test data of the first index from the first test device 12 and processes to obtain the first index of the transmitting port, and the process is repeated to sequentially measure the first index of each transmitting port. And, the processor 11 controls the automatic line changer 14 to simultaneously connect the second test device 13 to another one of the plurality of emission ports, the second test device 13 obtains test data of a second index of the emission port of the filter 20 to be tested, and the processor 11 obtains the test data of the second index from the second test device 13 and processes to obtain the second index of the emission port to sequentially obtain the second index of each emission port.

For example, the processor 11 controls the automatic line changing machine 14 to connect the first testing device 12 and the first transmitting port 201 of the filter 20 to test the first index of the radio frequency signal of the first transmitting port 201 of the filter 20 under test, and at the same time, the processor 11 controls the other transmitting port, such as the second transmitting port 202, to connect the second testing device and the other transmitting port of the filter 20 to test the second index of the second transmitting port 202 of the filter 20 at the same time. When the first index of the first emission port 201 is tested, the first test device 12 is connected to the second emission port 202 immediately to test the first index of the second emission port 202, and the second test device 13 is simultaneously connected to another emission port, for example, to the first emission port 201 to test the second index of the first emission port at the same time until the first index and the second index of all emission ports are tested.

It should be noted that, if the first index is tested in the same time as the second index, when the first index of one transmitting port is tested, the second index of another transmitting port is tested at the same time, and when the first index of all transmitting ports is tested, the second indexes of all transmitting ports are tested, and the total time spent is the time spent in testing the first index or the second index of all transmitting ports. If the time taken to test the first index of one port is different from the time taken to test the second index of one port, the test is not affected when the time taken to test the first index of one port is greater than the time taken to test the second index of one port.

When the time taken to test the first index of one port is less than the time taken to test the second index of one port, the second index of another port may be being tested after the first index of one port is tested, and the embodiment adopts the test sequence that after the first index of one port of the plurality of transmitting ports is tested, if the second index of another port is tested, the first index of the next port is tested immediately after the second index of another transmitting port is tested, and simultaneously starts to test the second index of the next port. When the second index test of all ports is completed, the first index and the second index of all ports are tested, and the total time spent for testing the second index of all ports is the time spent for testing the first index and the second index of all ports.

Of course, when the time spent testing the first indicator of one port is less than the time spent testing the second indicator of one port, in some other embodiments, a testing sequence may be adopted, where after the first indicator of one port of the plurality of transmitting ports is tested, if the second indicator of another port is being tested, it is not waited for after the second indicator of another transmitting port is tested to be finished and then the first indicator of the next port is tested, but the first indicator of the next port is directly started to be tested, and after the second indicator of one port is tested to be finished, the second indicator of the next port is tested immediately. When the second index test of the last port is completed, the test of the first index and the second index of all ports is completed, and the total time spent for testing the second index of all ports is the time spent for testing the first index and the second index of all ports.

Therefore, even when the time taken to test one port first index and the other port second index is different, only the time required for the test that takes longer time is required for the test, not the sum of the time taken to perform the two tests separately.

Therefore, in any event, the total test time taken by the test system of the present application is shorter than the time taken to test each index individually, and thus the test efficiency of the test can be improved.

In this embodiment, the test system 10 may further include a display (not shown) connected to the processor 11 to display the measured first index or the measured second index.

The beneficial technical effects that this embodiment possesses at least are: the test system 10 of the embodiment performs the switching of the connection lines between the first test device 12, the second test device 13 and different emission ports of the filter 20 through the automatic line changer 14 so as to test the first index and the second index at the same time, thereby improving the test efficiency of the index test of the filter 20.

Referring to fig. 2, fig. 2 is a schematic structural diagram of a second embodiment of the test system 10 of the present application.

In this embodiment, the filter 20 further includes four antenna ports, namely, a first antenna port 209, a second antenna port 210, a third antenna port 211, and a fourth antenna port 212, where the first antenna port 209, the second antenna port 210, the third antenna port 211, and the fourth antenna port 212 respectively correspond to the first transmission port 201, the second transmission port 202, the third transmission port 203, and the fourth transmission port 204. The automatic wire changer 14 at least comprises a first switch unit 141 and a second switch unit 142, the first test device 12 comprises a first power amplifier 121, a first signal source 122 and a load 123, the first power amplifier 121 is connected with the first signal source 122, and the first signal source 122 is connected with the processor 11.

The first switching unit 141 is connected to the first power amplifier 121, and the second switching unit 142 is connected to the load 123. The first switch unit 141 includes a plurality of interfaces corresponding to the transmitting ports, when the to-be-tested filter 20 performs the index test, each transmitting port of the to-be-tested filter 20 is connected to one interface of the first switch unit 141, and the interfaces connected to each transmitting port are different, and the processor 11 can control the first switch unit 141 to connect any one of the transmitting ports of the filter 20 with the first power amplifier 121.

Wherein the processor 11 controls the first switching unit 141 to connect the first power amplifier 121 to one of the plurality of transmission ports, and the processor 11 controls the second switching unit 142 to simultaneously connect the load 123 to an antenna port corresponding to one of the plurality of transmission ports to sequentially test the power of the transmission ports.

For example, when the processor 11 controls the first switching unit 141 to connect the first power amplifier 121 to the first one of the plurality of transmission ports 201, the processor 11 controls the second switching unit 142 to simultaneously connect the load 123 to the antenna port 209 corresponding to the first one of the plurality of transmission ports 201 to test the power of the first one of the plurality of transmission ports 201. Then, when the processor 11 controls the first switching unit 141 to connect the first power amplifier 121 to the second transmitting port 202 of the plurality of transmitting ports, the processor 11 controls the second switching unit 142 to simultaneously connect the load 123 to the second antenna port 210 corresponding to the second transmitting port 202 of the plurality of transmitting ports, so as to test the power of the second transmitting port 202 of the plurality of transmitting ports. Similarly, each transmitting port is sequentially connected with the corresponding antenna port to sequentially test the power of each transmitting port.

It should be noted that, the processor 11 may control the first switch unit 141 and the second switch unit 142, or the processor 11 may control the automatic wire changer 14 to further control the first switch unit 141 and the second switch unit 142, or the processor 11 may directly control the first switch unit 141 and the second switch unit 142, which is not limited herein.

The filter 20 to be tested further includes a plurality of receiving ports, which are a first receiving port 205, a second receiving port 206, a third receiving port 207, and a fourth receiving port 208, and the first receiving port 205, the second receiving port 206, the third receiving port 207, and the fourth receiving port 208 are respectively corresponding to the first transmitting port 201, the first transmitting port 202, the first transmitting port 203, and the first transmitting port 204. The automatic line changing machine 14 further includes a third switch unit 143, the second test device 13 includes a radio frequency matrix switch 131 and a network analyzer 132, the radio frequency matrix switch 131 is connected with the network analyzer 132, and the radio frequency matrix switch 131 and the network analyzer 132 are respectively connected with the processor 11.

The rf matrix switch 131 is connected to the third switch unit 143, where the third switch unit 143 includes a plurality of interfaces corresponding to receiving ports, when the filter 20 to be tested performs the index test, each receiving port of the filter 20 to be tested is connected to one interface of the third switch unit 143, and the interfaces connected to each receiving port are different, and the processor 11 can control the third switch unit 143 to connect any one of the plurality of receiving ports of the filter 20 with the rf matrix switch 131.

When the processor 11 controls the first switching unit 141 to connect the first power amplifier 121 with one of the plurality of transmitting ports to test the power of the one of the plurality of transmitting ports, the processor 11 controls the first switching unit 141 to simultaneously connect the radio frequency matrix switch 131 to the other of the plurality of transmitting ports, and the processor 11 controls the third switching unit 143 to simultaneously connect the radio frequency matrix switch 131 to the corresponding receiving port of the other of the plurality of transmitting ports to sequentially test the TDR performance between the transmitting port and the corresponding receiving port. The TDR performance includes return loss, insertion loss, isolation, time delay, standing wave, coupling degree, directivity, gain, ripple, and the like.

For example, when the processor 11 controls the first switching unit 141 to connect the first power amplifier 121 to one of the plurality of transmission ports, such as selecting the first transmission port 201, and simultaneously connects the load 123 to the antenna port 209 corresponding to the first transmission port to test the power of the first transmission port 201 of the plurality of transmission ports, the processor 11 controls the first switching unit 141 to simultaneously connect the radio frequency matrix switch 131 to another transmission port of the plurality of transmission ports, such as the second transmission port 202, and the processor 11 controls the third switching unit 143 to simultaneously connect the radio frequency matrix switch 131 to the second reception port 206 corresponding to the second transmission port 202 to simultaneously test the TDR performance of the second transmission port.

Of course, when testing the power of the first transmitting port 201, the TDR performance of the third transmitting port 203 or the fourth transmitting port 204 may also be tested, which is not limited in this application.

Then, the power of the other ports, such as the power of the second transmitting port 202, is tested simultaneously with the TDR of the other transmitting port of the plurality of transmitting ports, the power of the third transmitting port 203 is tested simultaneously with the TDR of the other transmitting port of the plurality of transmitting ports, and the power of the fourth transmitting port 204 is tested simultaneously with the TDR of the other transmitting port of the plurality of transmitting ports, so as to test the power of the plurality of transmitting ports and the TDR performance between the plurality of transmitting ports and the corresponding receiving ports in sequence. For a more specific test procedure, please refer to the specific test method of the above embodiment.

Thus, after the power test of the plurality of transmit ports is completed, the TDR of the plurality of transmit ports is also tested, or the TDR between the last transmit port and the corresponding receive port is being tested. Compared with the prior art, the method has the advantages that the testing time is obviously shortened, and the testing efficiency is improved.

Referring to fig. 3, fig. 3 is a schematic structural diagram of a third embodiment of a test system 10 provided in the present application.

As shown in fig. 3, the rf matrix switch 131 is also connected to a second switching unit 142. When the first switching unit 141 connects the first power amplifier 121 to one of the plurality of transmitting ports to test the power of the one of the plurality of transmitting ports, the first switching unit 141 simultaneously connects the radio frequency matrix switch 131 to the other of the plurality of transmitting ports, and the second switching unit 142 simultaneously connects the radio frequency matrix switch 131 to the antenna port corresponding to the other of the plurality of transmitting ports to sequentially test the TDR performance between the transmitting port and the corresponding antenna port.

For example, when the processor 11 controls the first switching unit 141 to connect the first power amplifier 121 to one of the plurality of transmission ports, such as the first transmission port 201, to test the power of the first transmission port 201, the processor 11 controls the first switching unit 141 to simultaneously connect the radio frequency matrix switch 131 to another one of the plurality of transmission ports, such as the second transmission port 202, and the second switching unit 142 simultaneously connects the radio frequency matrix switch 131 to the corresponding second antenna port 210 of the plurality of second transmission ports 202, to test the TDR performance between the second transmission port 202 and the corresponding second antenna port 210, and so on, to sequentially test the TDR performance between the plurality of transmission ports and the corresponding antenna ports.

The filter 20 of this embodiment further includes lightning protection feed ports, specifically, a first lightning protection feed port 213, a second lightning protection feed port 214, a third lightning protection feed port 215, and a fourth lightning protection feed port 216, where the first lightning protection feed port 213, the second lightning protection feed port 214, the third lightning protection feed port 215, and the fourth lightning protection feed port 216 are respectively corresponding to the first antenna port 209, the second antenna port 210, the third antenna port 211, and the fourth antenna port 212. The test system 10 further includes a multi-path voltage test device 15, and a fourth switch unit 144, where the fourth switch unit 144 includes a plurality of interfaces connected to the lightning protection ports, and the multi-path voltage test device is respectively connected to the processor 11 and the second switch unit 142.

When the second switch unit 142 connects the rf matrix switch 131 to one of the plurality of antenna ports to sequentially test the TDR performance between the one of the transmitting ports and the corresponding antenna port, the second switch unit 142 simultaneously connects the multi-path voltage test device 15 to the other of the plurality of antenna ports, and the multi-path voltage device is simultaneously connected to the lightning protection feed port corresponding to the one of the plurality of antenna ports to sequentially test the voltage between the antenna port and the corresponding lightning protection port.

For example, when the second switching unit 142 connects the radio frequency matrix switch 131 to one of the plurality of antenna ports, for example, the first antenna port 209, to sequentially test the TDR performance between the first transmitting port 201 and the corresponding antenna port first antenna port 209, the second switching unit 142 simultaneously connects the multi-path voltage testing device 15 to another one of the plurality of antenna ports, for example, the second antenna port 210, and the multi-path voltage testing device 15 simultaneously connects the second lightning protection feed port 214 corresponding to the second antenna port 210 to test the voltage between the second antenna port 210 and the corresponding second lightning protection port 214. And so on to test the voltage between one of the plurality of antenna ports and the corresponding lightning protection port in turn.

Further, the filter under test 20 further includes other ports and a fifth switching unit 145, where the other ports include a plurality of back-coupled ports, a plurality of forward-coupled ports, and a plurality of PCBA ports. The fifth switching unit 145 includes a plurality of interfaces connected to a plurality of back-coupled ports, a plurality of forward-coupled ports, and a plurality of PCBA ports.

When the first switch unit 141 connects the first power amplifier 121 to one of the plurality of emission ports to test the power of the one of the plurality of emission ports, the first switch unit 141 simultaneously connects the rf matrix switch 131 to another of the plurality of emission ports, and the rf matrix switch 131 is simultaneously connected to a different back-coupled port or a different forward-coupled port or a different PCBA port or a different lightning protection feed port to sequentially test the TDR performance between the emission port and the other ports.

For example, when the processor 11 controls the first switching unit 141 to connect the first power amplifier 121 to the first transmission port 201 of the plurality of transmission ports to test the power of the first transmission port 201, the processor 11 controls the first switching unit 141 to simultaneously connect the radio frequency matrix switch 131 to the second transmission port 202, and the radio frequency matrix switch 131 is simultaneously turned on with a different back-coupled port or a different forward-coupled port or a different PCBA port or a different lightning protection feed port to test the TDR performance between the first transmission port and the other ports. And so on to test TDR performance between the transmit port and the other ports in turn.

The test system 10 further comprises intermodulation test equipment for testing intermodulation performance of signals between the transmit port and the corresponding receive port of the filter 20. When testing intermodulation performance of the filter under test 20, the first switch unit 141 connects intermodulation test equipment to one of the plurality of transmitting ports, the second switch unit 142 connects the load 123 to an antenna port corresponding to one of the plurality of transmitting ports at the same time, and the third switch unit 143 connects intermodulation test equipment to a receiving port corresponding to one of the plurality of transmitting ports at the same time, so as to test intermodulation performance between the transmitting port and the corresponding receiving port in sequence.

Further, after intermodulation performance testing between the plurality of transmitting ports and the corresponding receiving port is completed, the first switch unit 141 connects the radio frequency matrix switch 131 to one of the plurality of transmitting ports, and the third switch unit 143 switches simultaneously connect the radio frequency matrix switch 131 to the corresponding receiving port of the one of the plurality of transmitting ports, so as to sequentially test out-of-band rejection performance between the plurality of transmitting ports and the corresponding receiving port.

Specifically, referring to fig. 4, fig. 4 is a schematic structural diagram of a fourth embodiment of the test apparatus of the present application.

Specifically, based on the second embodiment, the test system 10 further includes a second signal source 124, a third signal source 125, and a spectrometer 16, and the intermodulation test apparatus includes a first power amplifier 121, the second signal source 124, the third signal source 125, and the spectrometer 16. The second signal source 124 and the third signal source 125 are connected to the first power amplifier 121, and the second signal source 124, the third signal source 125, and the spectrometer 16 are connected to the processor 11.

After the power test of the plurality of transmitting ports is completed, the first switching unit 141 connects the first power amplifier 121 to one transmitting port of the plurality of transmitting ports, the second switching unit 142 connects the load 123 to an antenna port corresponding to one transmitting port of the plurality of transmitting ports at the same time, and the third switching unit 143 connects the spectrometer 16 to a receiving port corresponding to one transmitting port of the plurality of transmitting ports at the same time, so as to test intermodulation performance between the plurality of transmitting ports and the corresponding receiving port.

For example, immediately after finishing the power test of the last transmit port, the processor 11 controls the first switch unit 141 to connect the first power amplifier 121 to one of the plurality of transmit ports, such as the first transmit port 201, the processor 11 controls the second switch unit 142 to simultaneously connect the load 123 to the first antenna port 209 corresponding to the first transmit port 201, and the processor 11 controls the third switch unit 143 to simultaneously connect the spectrometer 16 to the first receive port 205 corresponding to the first transmit port 201 to test intermodulation performance of signals between the first transmit port 201 and the first receive port 205. And the like, the intermodulation performance of signals between each transmitting port and the corresponding receiving port is tested in sequence.

In some other embodiments, intermodulation indexes can be tested together with power indexes, and referring to fig. 5, fig. 5 is a schematic structural diagram of a fifth embodiment of the test system 10 of the present application.

As shown in fig. 5, the test system 10 further includes a second power amplifier 171, a second signal source 172, a third signal source 173, and a spectrometer 16, where the second signal source 172 and the third signal source 173 are connected to the second power amplifier 171, and the second signal source 172, the third signal source 173, and the spectrometer 16 are connected to the processor 11.

Wherein, when the first switching unit 141 connects the first power amplifier 121 to one of the plurality of transmitting ports, the first switching unit 141 simultaneously connects the second power amplifier 171 to a further one of the plurality of transmitting ports, the second switching unit 142 simultaneously connects the load 123 to an antenna port corresponding to the further one of the transmitting ports, and the third switching unit 143 simultaneously connects the spectrometer 16 to a receiving port corresponding to the further one of the transmitting ports to sequentially test intermodulation performance between the transmitting port and the corresponding receiving port.

For example, when the processor 11 controls the first switching unit 141 to connect the first power amplifier 121 to the first transmitting port 201 to test the power of the first transmitting port 201, when the processor 11 controls the first switching unit 141 to simultaneously connect the first power amplifier 121 to the second transmitting port 202 to test the TDR index of the signal between the second transmitting port 202 and other ports, the processor 11 controls the first switching unit 141 to simultaneously connect the second power amplifier 171 to yet another transmitting port of the plurality of transmitting ports, such as the third transmitting port 203, the processor 11 controls the second switching unit 142 to simultaneously connect the load 123 to the antenna port 211 corresponding to the third transmitting port 203, and the processor 11 controls the third switching unit 143 to simultaneously connect the spectrometer 16 to the third receiving port 207 corresponding to the third transmitting port 203 to test the intermodulation performance of the signal between the third transmitting port 203 and the third receiving port 207. And the like, testing intermodulation performance between each transmitting port and the corresponding receiving port in turn.

The principles and embodiments of the present application are described herein with specific examples, the above examples being provided only to assist in understanding the methods of the present application and their core ideas; meanwhile, as those skilled in the art will have modifications in the specific embodiments and application scope in accordance with the ideas of the present application, the present description should not be construed as limiting the present application in view of the above.

Claims

1. A test system for testing a filter indicator, the filter including a plurality of transmit ports, the test system comprising at least:

the device comprises a processor, a first test device, a second test device and an automatic line changing machine, wherein the first test device, the second test device and the automatic line changing machine are respectively connected with the processor;

the automatic wire changer connects the first testing device to one of the plurality of emission ports, and the first testing device is used for sequentially testing a first index of the emission ports;

the automatic line changing machine is used for simultaneously connecting the second testing equipment to another emission port in the emission ports, and the second testing equipment is used for sequentially testing second indexes of the emission ports;

the filter also comprises a plurality of antenna ports, the antenna ports are arranged corresponding to the transmitting ports, and the automatic line changing machine at least comprises a first switch unit and a second switch unit;

the first testing device comprises a first power amplifier, a first signal source and a load, wherein the first power amplifier is connected with the first signal source, the first signal source is connected with the processor, the first switching unit is used for connecting the first power amplifier to one of the plurality of transmitting ports, and the second switching unit is used for simultaneously connecting the load to the corresponding antenna port so as to sequentially test the power of the transmitting ports;

the filter further comprises a plurality of receiving ports, the receiving ports are arranged corresponding to the transmitting ports, the automatic line changing machine further comprises a third switch unit, the second test equipment comprises a radio frequency matrix switch and a network analyzer, the radio frequency matrix switch is connected with the network analyzer, and the radio frequency matrix switch and the network analyzer are respectively connected with the processor;

the first switch unit connects the radio frequency matrix switch to another transmitting port of the plurality of transmitting ports, and the third switch unit simultaneously connects the radio frequency matrix switch to a corresponding receiving port to sequentially test TDR performance between the transmitting port and the corresponding receiving port.

2. The test system of claim 1, wherein the test system comprises a plurality of test cells,

the test system further comprises intermodulation test equipment, the first switch unit connects the intermodulation test equipment to one of the plurality of transmitting ports, the second switch unit simultaneously connects the load to a corresponding antenna port, and the third switch unit simultaneously connects the intermodulation test equipment to a corresponding receiving port to test intermodulation performance between the transmitting port and the corresponding receiving port in sequence.

3. The test system of claim 2, wherein the test system comprises a plurality of test cells,

the test system further comprises a second signal source, a third signal source and a frequency spectrograph, wherein the second signal source and the third signal source are respectively connected with the first power amplifier, and the second signal source, the third signal source and the frequency spectrograph are connected with the processor;

after the power test of the plurality of transmitting ports is finished, the first switch unit connects the first power amplifier to one transmitting port of the plurality of transmitting ports, the second switch unit simultaneously connects the load and the corresponding antenna port, and the third switch unit simultaneously connects the spectrometer to the corresponding receiving port so as to test intermodulation performance between the transmitting port and the corresponding receiving port in sequence.

4. The test system of claim 2, wherein the test system comprises a plurality of test cells,

the test system further comprises a second power amplifier, a second signal source, a third signal source and a frequency spectrograph, wherein the second signal source and the third signal source are respectively connected with the second power amplifier, and the second signal source, the third signal source and the frequency spectrograph are respectively connected with the processor;

when the first switch unit connects the first power amplifier to one of the plurality of transmitting ports, the first switch unit simultaneously connects the second power amplifier to a further transmitting port of the plurality of transmitting ports, the second switch unit simultaneously connects the load to an antenna port corresponding to the further transmitting port, and the third switch unit simultaneously connects the spectrometer to a receiving port corresponding to the further transmitting port to sequentially test intermodulation performance between the transmitting port and the corresponding receiving port.

5. The test system of claim 2, wherein the test system comprises a plurality of test cells,

after intermodulation performance testing between the plurality of transmitting ports and the corresponding receiving ports is completed, the first switch unit connects the radio frequency matrix switch to one transmitting port among the plurality of transmitting ports, and the third switch unit simultaneously connects the radio frequency matrix switch to the corresponding receiving port, so as to sequentially test out-of-band rejection performance between the transmitting port and the corresponding receiving port.

6. The test system of claim 1, wherein the test system comprises a plurality of test cells,

the second test equipment comprises a radio frequency matrix switch and a network analyzer, wherein the radio frequency matrix switch is connected with the network analyzer, and the radio frequency matrix switch and the network analyzer are respectively connected with the processor;

the first switch unit connects the first power amplifier to one of the plurality of transmit ports to sequentially test the power of the transmit port, the first switch unit simultaneously connects the radio frequency matrix switch to another of the plurality of transmit ports, and the second switch unit simultaneously connects the radio frequency matrix switch to a corresponding antenna port to sequentially test the TDR performance between the transmit port and the corresponding antenna port.

7. The test system of claim 6, wherein the test system comprises a plurality of test cells,

the filter further comprises a lightning protection feed port, the lightning protection feed port is correspondingly arranged with the antenna ports, the test system further comprises a multi-path voltage test device, the second switch unit is used for connecting the radio frequency matrix switch to one of the antenna ports so as to sequentially test the TDR performance between the transmitting port and the corresponding antenna port, the second switch unit is used for simultaneously connecting the multi-path voltage device to the other antenna port of the antenna ports, and the multi-path voltage device is simultaneously communicated with the corresponding lightning protection feed port so as to sequentially test the voltage between the antenna port and the corresponding lightning protection feed port.

8. The test system of claim 1, wherein the test system comprises a plurality of test cells,

the filter further comprises a plurality of reverse coupling ports, a plurality of forward coupling ports and a plurality of PCBA ports, the second test equipment comprises a radio frequency matrix switch and a network analyzer, the radio frequency matrix switch is connected with the network analyzer, and the radio frequency matrix switch and the network analyzer are respectively connected with the processor;

when the first switch unit connects the first power amplifier to one of the plurality of transmitting ports to sequentially test the power of the transmitting ports, the first switch unit simultaneously connects the radio frequency matrix switch to the other transmitting port of the plurality of transmitting ports, and the radio frequency matrix switch is simultaneously connected with a different reverse coupling port or a different forward coupling port or a different PCBA port or a different lightning protection feed port to sequentially test the TDR performance between the transmitting port and the reverse coupling port or the forward coupling port or the plurality of PCBA ports or the lightning protection feed port.