CN114088980A - Quartz crystal microbalance coupling atomic force microscope device and detection method - Google Patents
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- CN114088980A CN114088980A CN202111527650.8A CN202111527650A CN114088980A CN 114088980 A CN114088980 A CN 114088980A CN 202111527650 A CN202111527650 A CN 202111527650A CN 114088980 A CN114088980 A CN 114088980A
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- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
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Abstract
The invention provides a quartz crystal microbalance coupling atomic force microscope device and a detection method, wherein the device comprises: the flow cell comprises an upper cover body and a lower cover body which are sequentially arranged, wherein the upper cover body is provided with a sample inlet, a sample outlet and a sample containing groove positioned between the sample inlet and the sample outlet, a quartz crystal sensor chip used for contacting with a sample and a piezoelectric ceramic tube used for receiving a piezoelectric signal are sequentially embedded in the lower cover body, and the quartz crystal sensor chip protrudes out of the outer surface of the lower cover body and extends into the sample containing groove; the scanning head comprises an atomic force limiting main body and a cantilever extending into the sample accommodating groove, wherein the cantilever is provided with a probe for detecting a sample, and the atomic force limiting main body is provided with a laser emitter for emitting detection laser to the probe and a laser monitor for receiving reflected laser; the controller is used for outputting the detection result. By the technical scheme, the visual research of data can be combined with quantitative analysis, and the operation convenience of detecting the sample can be improved.
Description
Technical Field
The invention belongs to the technical field of chemical sensor detection, and particularly relates to a quartz crystal microbalance coupling atomic force microscope device and a detection method.
Background
The Quartz Crystal Microbalance (QCM) is a surface-sensitive analysis technology based on the piezoelectric effect of quartz crystal, is a highly sensitive surface interface analysis tool, has nanogram-level sensitivity, can reflect the quality and dissipation change of the surface of a quartz crystal chip in situ and in real time, but cannot realize the nano-scale visual research of the surface morphology of a material, cannot complete a high-resolution imaging technology, and cannot realize the quantitative analysis of the adsorption quantity of a sample on the surface of the material, so that the microscopic characterization of the material has limitations.
Disclosure of Invention
Aiming at the defects or shortcomings in the prior art, the invention provides a quartz crystal microbalance coupling atomic force microscope device and a detection method, and aims to solve the technical problem that the quartz crystal microbalance in the prior art cannot realize visual research.
In order to achieve the above object, the present invention provides a quartz crystal microbalance coupled atomic force microscope device, wherein the device comprises: the flow cell comprises an upper cover body and a lower cover body which are sequentially arranged, wherein the upper cover body is provided with a sample inlet, a sample outlet and a sample containing groove positioned between the sample inlet and the sample outlet, a quartz crystal sensor chip used for contacting with a sample and a piezoelectric ceramic tube used for receiving a piezoelectric signal are sequentially embedded in the lower cover body, and the quartz crystal sensor chip protrudes out of the outer surface of the lower cover body and extends into the sample containing groove; the scanning head comprises an atomic force limiting main body and a cantilever extending into the sample containing groove, the cantilever is provided with a probe for detecting the sample, and the atomic force limiting main body is provided with a laser emitter for emitting detection laser to the probe and a laser monitor for receiving reflected laser; and the controller is used for receiving the detection signals transmitted by the piezoelectric ceramic tube and the laser monitor, processing the signals and outputting a detection result.
In the embodiment of the invention, the upper cover body and the lower cover body are connected in a sealing manner through the first sealing ring.
In the embodiment of the invention, the quartz crystal sensor chip is hermetically connected with the lower cover body through the second sealing ring.
In the embodiment of the invention, the upper cover body is provided with a sapphire transmission window through which laser emitted by the laser emitter and laser received by the laser monitor pass.
In the embodiment of the invention, the lower surface of the quartz crystal sensor chip is provided with an electrode electrically connected with the piezoelectric ceramic tube.
In an embodiment of the present invention, the scanning head further includes a sliding assembly and a driving member, the probe is mounted on the cantilever through the sliding assembly, and the driving member is configured to drive the probe to move in three directions, i.e., x, y, and z, relative to the cantilever.
In the embodiment of the invention, the laser emitter is fixed on the atomic force limiting main body through a first buckle, and the first buckle is connected with a first adjusting knob for adjusting the laser emitting position of the laser emitter.
In the embodiment of the invention, the laser monitor is fixed on the atomic force limiting main body through a second buckle, and a second adjusting knob for adjusting the laser receiving position of the laser monitor is connected to the second buckle.
In an embodiment of the present invention, the outer surface of the probe is provided with an antibody layer corresponding to the sample.
In the embodiment of the invention, the outer surface of the quartz crystal sensor chip facing the sample containing groove is plated with one of a platinum film, a gold film and a calcium carbonate film.
A quartz crystal microbalance coupling atomic force microscope detection method is characterized by comprising the following steps:
the controller controls the scanning head to scan the outer surface of the quartz crystal sensor chip and judges the hardness of the outer surface of the quartz crystal sensor chip;
controlling the probe to enter a contact detection mode, a non-contact detection mode or a tapping detection mode according to the hardness of the outer surface of the quartz crystal sensor chip;
in the contact detection mode, the probe is always in contact with the quartz crystal sensor chip to detect the sample;
in the non-contact detection mode, the probe always performs sample detection in a non-contact state with the quartz crystal sensor chip;
and in the tapping detection mode, the probe taps the quartz crystal sensor chip at a preset amplitude to detect the sample.
Through the technical scheme, the quartz crystal microbalance coupling atomic force microscope device provided by the embodiment of the invention has the following beneficial effects:
the sample can be conveyed to the quartz crystal sensor chip in the sample containing groove through the sample inlet, a piezoelectric signal is transmitted to the controller through a piezoelectric ceramic tube stacked below the quartz crystal sensor chip, the frequency shift of the quartz crystal sensor chip is monitored, the quartz crystal sensor chip is kept balanced until a stable frequency signal is reached after the applied voltage is closed, and the controller can output the dynamic adsorption change of the surface of the quartz crystal sensor chip to realize the quantitative recording of detection data; laser that the laser emitter of scanning head sent shines the light at the probe, and when the probe scanned the swing formation to the sample appearance on quartz crystal sensor chip surface, the light position that makes reflection to the laser monitor changes and causes the offset, and the laser monitor records the offset to give the controller with signal feedback, do benefit to the controller and do appropriate adjustment, show the surface characteristic of sample with the mode of image again at last, realize that data is visual. After the detection is finished, the sample can be output through the sample outlet, the sample containing groove does not need to be opened in the whole detection process, the dynamic adsorption change on the surface of the quartz crystal sensor chip can be analyzed in the controller only by controlling the type of the introduced sample, the adsorption quality, the thickness, the viscoelasticity and the adsorption morphology data on the surface of the quartz crystal sensor chip and the experimental data are accurate and reliable, the visual research and the quantitative analysis of the data can be realized, and the operation convenience of detecting the sample can be improved.
Additional features and advantages of the invention will be set forth in the detailed description which follows.
Drawings
The accompanying drawings, which are included to provide an understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention without limiting the invention. In the drawings:
FIG. 1 is a schematic diagram of a quartz crystal microbalance coupled atomic force microscope apparatus according to an embodiment of the present invention;
FIG. 2 is a diagram showing the output of a quartz crystal microbalance coupled to the controller of an atomic force microscope device according to an embodiment of the present invention;
fig. 3 is another test result of a quartz crystal microbalance coupled to the output of the controller of an atomic force microscope device according to an embodiment of the present invention.
Description of the reference numerals
Detailed Description
The following detailed description of specific embodiments of the invention refers to the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative and explanatory of the invention and are not restrictive thereof.
The quartz crystal microbalance coupled atomic force microscope device according to the present invention is described below with reference to the accompanying drawings.
As shown in fig. 1, in an embodiment of the present invention, there is provided a quartz crystal microbalance coupled atomic force microscope apparatus, wherein the quartz crystal microbalance coupled atomic force microscope apparatus 100 includes a flow cell 1, a scanning head 2 and a controller 3; the flow cell 1 comprises an upper cover body 11 and a lower cover body 15 which are sequentially arranged, wherein the upper cover body 11 is provided with a sample inlet 12, a sample outlet 13 and a sample containing groove 14 positioned between the sample inlet 12 and the sample outlet 13, a quartz crystal sensor chip 16 used for contacting with a sample and a piezoelectric ceramic tube 17 used for receiving a piezoelectric signal are sequentially embedded in the lower cover body 15, and the quartz crystal sensor chip 16 protrudes out of the outer surface of the lower cover body 15 and extends into the sample containing groove 14; the scanning head 2 comprises an atomic force limiting main body 21 and a cantilever 28 extending into the sample accommodating groove 14, the cantilever 28 is provided with a probe 29 for detecting a sample, the atomic force limiting main body 21 is provided with a laser emitter 22 for emitting detection laser to the probe 29 and a laser monitor 23 for receiving reflected laser; the controller 3 is used for receiving the detection signals transmitted by the piezoelectric ceramic tube 17 and the laser monitor 23, processing the signals and outputting detection results. The controller 3 in this embodiment may include a feedback system and a computer.
In the embodiment of the invention, a sample can be conveyed to the quartz crystal sensor chip 16 in the sample containing groove 14 through the sample inlet 12, and a piezoelectric signal is transmitted to the controller 3 through the piezoelectric ceramic tube 17 stacked below the quartz crystal sensor chip 16, so as to monitor the frequency shift of the quartz crystal sensor chip 16. After the applied voltage is turned off, the quartz crystal sensor chip 16 is kept in balance until a stable frequency signal is reached, the controller 3 can output dynamic adsorption change on the surface of the quartz crystal sensor chip 16, laser emitted by the laser emitter 22 of the scanning head 2 irradiates the probe 29 with light, when the probe 29 scans and swings the sample shape on the surface of the quartz crystal sensor chip 16, the position of reflected light is changed to cause offset, the laser monitor 23 records the offset, and feeds back the signal to the controller 3, so that the controller 3 can conveniently make proper adjustment, and finally the surface characteristic of the sample is presented in an image mode. After the detection is finished, the sample can be output through the sample outlet 13, the sample containing groove 14 does not need to be opened in the whole detection process, the dynamic adsorption change of the surface of the quartz crystal sensor chip 16 can be analyzed in the controller 3 only by controlling the type of the introduced sample, and the adsorption quality, the thickness, the viscoelasticity, the adsorption morphology data and the experimental data of the surface of the quartz crystal sensor chip 16 are obtained accurately and reliably. The visual research of data can be realized in this embodiment and quantitative analysis is combined, can improve the operation convenience of detecting the sample.
Specifically, in the embodiment, the surface structure and properties of the substance are researched by detecting the extremely weak interatomic interaction force on the surface of the sample to be tested, so that the force distribution information is obtained, and finally, the surface morphology structure and the surface roughness information of the quartz crystal sensor chip 16 are obtained with the nanometer resolution, so that the interface interaction among petroleum components, oil displacement additives and other related chemical substances can be researched in real time under the real geological condition, and the dynamic adsorption process of the surfactant on the surface of the reservoir cover in the reservoir environment can be accurately simulated.
In the embodiment of the present invention, the upper cover 11 and the lower cover 15 are hermetically connected by a first seal ring. The quartz crystal sensor chip 16 is hermetically connected with the lower cover body 15 through a second sealing ring. First sealing washer and second sealing washer in this embodiment can adopt rubber seal, realize the sealing connection of upper cover body 11 and lower cover body 15, avoid the condition that the sample was revealed, guarantee test environment's leakproofness, can guarantee the accuracy nature of detection, and quartz crystal sensor chip 16 passes through second sealing washer and lower cover body 15 sealing connection, can guarantee the stability of cover body 15 under quartz crystal sensor chip 16 imbeds, avoid the condition that quartz crystal sensor chip 16 drops, improve the stability in use of device.
In one embodiment, the upper cover 11 is provided with a sapphire transparent window through which the laser emitted from the laser emitter 22 and the laser received by the laser monitor 23 pass. Sapphire window can make things convenient for wearing to establish and the reflection process of laser among the testing process in this embodiment, reduces the consumption of laser in transmission process, can improve the precision that detects the sample in this embodiment.
In the embodiment of the present invention, the lower surface of the quartz crystal sensor chip 16 is provided with an electrode electrically connected to the piezoelectric ceramic tube 17. In the embodiment, the electrodes on the lower surface of the quartz crystal sensor chip 16 are connected with the piezoelectric ceramic tube 17, so that the accuracy of electric signal transmission can be ensured, and the quartz crystal sensor chip is simple in structure and convenient to assemble.
In the embodiment of the present invention, the scanning head 2 further comprises a sliding assembly, by which the probe 29 is mounted to the cantilever 28, and a driving member for driving the probe 29 to move in three directions, x, y, and z, relative to the cantilever 28. In this embodiment, the probe 29 can be driven by the driving member to move in the x, y and z directions, so that the probe 29 scans the quartz crystal sensor chip 16 in multiple directions, and the comprehensiveness of the detection imaging is ensured.
As shown in fig. 1, in the embodiment of the present invention, the laser emitter 22 is fixed to the atomic force limiting body 21 by a first buckle 24, and a first adjusting knob 25 for adjusting a laser emitting position of the laser emitter 22 is connected to the first buckle 24. In this embodiment, the position and the angle of the laser emitter 22 can be adjusted by operating the first adjusting knob 25, so as to adjust the laser emitting position.
In an embodiment, the laser emitter 22 with an adjustable corresponding position, the laser monitor 23 is fixed on the atomic force limiting body 21 through a second buckle 26, and a second adjusting knob 27 for adjusting the laser receiving position of the laser monitor 23 is connected to the second buckle 26. After the laser emitting position is adjusted, the laser receiving position of the laser monitor 23 can be adjusted by correspondingly adjusting the second adjusting knob 27, so that the accuracy of laser emitting and receiving is avoided, the condition that laser cannot be received or the probe 29 cannot be accurately irradiated in the test process is avoided, and the detection accuracy of the quartz crystal microbalance coupling atomic force microscope device 100 is further improved.
In one embodiment, the outer surface of the probe 29 is provided with an antibody layer corresponding to the sample. In the case where an antigen exists on the surface of the sample, the surface of the probe 29 may be treated so that an antibody layer corresponding to the sample is provided on the outer surface of the probe 29, thereby increasing the application range of the quartz crystal microbalance coupled atomic force microscope apparatus 100. In one embodiment, the outer surface of the quartz crystal sensor chip 16 facing the sample receiving groove 14 is plated with one of a platinum film, a gold film, and a calcium carbonate film. In another embodiment, the quartz crystal sensor chip 16 may be coated with silica, gold, calcium carbonate, aptamer molecules, etc. according to different requirements.
The invention also provides a detection method of the quartz crystal microbalance coupled atomic force microscope, which is characterized in that the method is applied to the quartz crystal microbalance coupled atomic force microscope device 100, and the method comprises the following steps:
washing the quartz crystal sensor chip 16 for 3 times by deionized water, ethanol and isopropanol, then placing in a pure and stable nitrogen flow for mild drying, and embedding into the lower cover body 15;
the controller 3 controls the scanning head 2 to scan the outer surface of the quartz crystal sensor chip 16 and judges the hardness of the outer surface of the quartz crystal sensor chip 16;
controlling the probe 29 to enter a contact detection mode, a non-contact detection mode or a tapping detection mode according to the hardness of the outer surface of the quartz crystal sensor chip 16;
after the detection is finished, the quartz crystal sensor chip 16 is taken out of the lower cover body 15, the quartz crystal sensor chip 16 is washed for 3 times by deionized water, ethanol and isopropanol, and then the quartz crystal sensor chip is put in a pure and stable nitrogen flow for moderate drying and then is embedded into the lower cover body 15 again to wait for the next sample detection.
In the contact detection mode, the sample detection is performed in a state that the probe 29 is always in contact with the quartz crystal sensor chip 16;
in the non-contact detection mode, the probe 29 is kept in a non-contact state with the quartz crystal sensor chip 16 all the time to perform sample detection;
in the tapping detection mode, the probe 29 taps the quartz crystal sensor chip 16 at a predetermined amplitude to perform sample detection. Specifically, the quartz crystal sensor chip 16 can be divided into a hard surface corresponding to the contact detection mode, a soft surface corresponding to the non-contact detection mode, and a neutral surface corresponding to the tapping detection mode by the hardness size. In this embodiment, the three operation modes are applied to the surface detection of different quartz crystal sensor chips 16, so that accurate surface topography image data can be realized.
In one embodiment, the deposition solution is first prepared and the CaCO3 deposition solution is prepared from two solutions, one CaCl2 solution to provide Ca2+ ions and the other NaHCO3 solution to provide ions, both solutions having the same concentration. These solutions also contained 500mM NaNO3, which served as the background electrolyte solution and provided OH-. The pH of the two solutions was adjusted to 7 with dilute NaOH and HCl solutions to minimize CaCO3 precipitation upon mixing.
Then, NaHCO3 solution was added dropwise to CaCl2 solution while the solution was magnetically stirred with a magnetic stirrer at 1500rpm to prepare CaCO3 deposition solution. The CaCO3 deposition solution was filtered into centrifuge tubes and centrifuged in a centrifuge to remove any precipitated CaCO 3.
Then, the CaCO3 deposition solution and the instrument channel with the sample inlet 12 and the sample outlet 13 are installed, the platinum-plated or gold-plated quartz crystal sensor chip 16 is taken out, the quartz crystal sensor chip 16 is washed for 3 times by deionized water, ethanol and isopropanol respectively, then the quartz crystal sensor chip 16 is placed in pure and stable nitrogen flow for medium temperature and drying, and after the drying is finished, the quartz crystal sensor chip 16 is embedded into the lower cover body 15 and starts to be measured.
The CaCO3 deposition solution is fed into the sample containing groove 14 from the sample inlet 12, and after the frequency curve is stabilized for 10 minutes, negative voltage is applied for 10 minutes under a constant potential mode. As the deposition proceeds, the frequency shift across the interface of the solution flowing through the quartz crystal sensor chip 16 is monitored, and after the applied voltage is turned off, the quartz crystal sensor chip 16 is allowed to equilibrate until a stable frequency signal is reached, and the controller 3 outputs a quantitative detection result, as shown in fig. 2.
Then the controller 3 controls the scanning head 2 to scan the outer surface of the quartz crystal sensor chip 16 and judges the hardness of the outer surface of the quartz crystal sensor chip 16; controlling the probe 29 to enter a contact detection mode according to the platinization or gold plating on the outer surface of the quartz crystal sensor chip 16, scanning the surface of the quartz crystal sensor chip 16 by the sharp tip of the probe 29, transmitting a laser beam to the upper surface of the probe 29 by the laser transmitter 22, reflecting the incident beam to the laser monitor 23 by the upper surface of the probe 29 for monitoring the slight change of the reflected beam caused by the bending of the probe 29, feeding back a signal to the controller 3 when the tip of the probe 29 passes through the surface protrusion, controlling the distance between the tip of the probe 29 and the surface of the quartz crystal sensor chip 16 through a feedback loop, stabilizing the position of the laser, and finally forming an accurate image of the surface topography of the sample, as shown in fig. 3.
In the description of the present invention, it is to be understood that the terms "first", "second" and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; may be mechanically coupled, may be electrically coupled or may be in communication with each other; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.
Claims (11)
1. A quartz crystal microbalance coupled atomic force microscope apparatus, the apparatus comprising:
the flow cell (1) comprises an upper cover body (11) and a lower cover body (15) which are sequentially arranged, wherein the upper cover body (11) is provided with a sample inlet (12), a sample outlet (13) and a sample containing groove (14) which is positioned between the sample inlet (12) and the sample outlet (13), a quartz crystal sensor chip (16) which is used for contacting with a sample and a piezoelectric ceramic tube (17) which is used for receiving a piezoelectric signal are sequentially embedded in the lower cover body (15), and the quartz crystal sensor chip (16) protrudes out of the outer surface of the lower cover body (15) and extends into the sample containing groove (14);
the scanning head (2) comprises an atomic force limiting main body (21) and a cantilever (28) extending into the sample containing groove (14), the cantilever (28) is provided with a probe (29) for detecting the sample, and the atomic force limiting main body (21) is provided with a laser emitter (22) for emitting detection laser to the probe (29) and a laser monitor (23) for receiving reflected laser;
and the controller (3) is used for receiving the detection signals transmitted by the piezoelectric ceramic tube (17) and the laser monitor (23), processing the signals and outputting a detection result.
2. The quartz crystal microbalance coupled atomic force microscope device according to claim 1, wherein the upper cover body (11) and the lower cover body (15) are hermetically connected by a first sealing ring.
3. The quartz crystal microbalance coupled atomic force microscope device (100) according to claim 2, wherein the quartz crystal sensor chip (16) is hermetically connected to the lower cover (15) by a second sealing ring.
4. The quartz crystal microbalance coupled atomic force microscope device according to claim 3, wherein the upper cover (11) is provided with a sapphire transmission window through which the laser emitted by the laser emitter (22) and the laser received by the laser monitor (23) pass.
5. The quartz crystal microbalance coupled atomic force microscope device according to claim 1, wherein the lower surface of the quartz crystal sensor chip (16) is provided with an electrode electrically connected with the piezoelectric ceramic tube (17).
6. The quartz crystal microbalance coupled atomic force microscope device according to any of claims 1 to 5, wherein the scanning head (2) further comprises a sliding assembly by which the probe (29) is mounted to the cantilever (28) and a driving member for driving the probe (29) to move in three directions x, y and z relative to the cantilever (28).
7. The quartz crystal microbalance coupling atomic force microscope device according to any one of claims 1 to 5, wherein the laser emitter (22) is fixed to the atomic force limiting body (21) through a first snap (24), and the first snap (24) is connected with a first adjusting knob (25) for adjusting the laser emission position of the laser emitter (22).
8. The quartz crystal microbalance coupling atomic force microscope device according to any one of claims 1 to 5, wherein the laser monitor (23) is fixed to the atomic force limiting body (21) through a second buckle (26), and the second buckle (26) is connected with a second adjusting knob (27) for adjusting the laser receiving position of the laser monitor (23).
9. The quartz crystal microbalance coupled atomic force microscope device according to any of claims 1 to 5, characterized in that the outer surface of the probe (29) is provided with an antibody layer corresponding to the sample.
10. The quartz crystal microbalance coupled atomic force microscope device according to any one of claims 1 to 5, wherein the outer surface of the quartz crystal sensor chip (16) facing the sample receiving groove (14) is plated with one of platinum film, gold film and calcium carbonate film.
11. A quartz crystal microbalance coupled atomic force microscope detection method, characterized in that the method is applied to a quartz crystal microbalance coupled atomic force microscope device (100) according to any one of claims 1 to 10, the method comprising:
the controller (3) controls the scanning head (2) to scan the outer surface of the quartz crystal sensor chip (16), and judges the hardness of the outer surface of the quartz crystal sensor chip (16);
controlling the probe (29) to enter a contact detection mode, a non-contact detection mode or a tapping detection mode according to the hardness of the outer surface of the quartz crystal sensor chip (16);
wherein in the contact detection mode, the probe (29) is kept in contact with the quartz crystal sensor chip (16) all the time to perform sample detection;
in the non-contact detection mode, the probe (29) is kept in a non-contact state with the quartz crystal sensor chip (16) all the time to carry out sample detection;
in the tapping detection mode, the probe (29) taps the quartz crystal sensor chip (16) with a preset amplitude to detect a sample.
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| WO2024016425A1 (en) * | 2022-07-19 | 2024-01-25 | 厦门大学 | Electrochemical nano infrared spectromicroscope and analysis method |
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