CN114088978A - PXI structure-based calibration method and device for TACAN signal speed parameters - Google Patents
PXI structure-based calibration method and device for TACAN signal speed parameters Download PDFInfo
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- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
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Abstract
The invention provides a calibration method and a device for TACAN signal speed parameters based on a PXI structure. The invention saves the system volume, integrates the test function, improves the calibration accuracy and enables the TACAN signal speed parameter to finally trace to the national standard. The positioning of the amplitude point is more accurate, and the accuracy of the measurement result is higher.
Description
Technical Field
The invention relates to the technical field of instrument measurement, in particular to an automatic calibration method and device, which can be used for calibration test of a Tacan signal speed parameter.
Background
The speed parameter of the tacan signal must be calibrated during the debugging, inspection and field maintenance of the navigation device to verify the performance index of the navigation device.
At present, when the speed parameter of the TACAN signal is measured, a corresponding calibration method for meeting the accuracy requirement does not exist, only a pulse power source is generally used in combination with a digital oscilloscope, the pulse power source is utilized to provide an excitation signal for a TACAN signal simulator, and the digital oscilloscope measures the time delay between excitation and response. And for the speed parameter which is changed in time, the method of reading the stopwatch timing can only be realized, the measurement accuracy is extremely low, and effective calibration cannot be carried out.
Disclosure of Invention
In order to overcome the defects of the prior art, the invention provides a calibration method and a calibration device for a tacan signal speed parameter based on a PXI structure. The invention aims to provide a calibration method and a calibration device for a tacan signal speed parameter based on a PXI structure aiming at the defects of the prior art. In order to achieve the above purpose, the invention adopts a PXI structure test system, uses the trigger signal to perform the storage measurement of the broadband high-speed signal,
the technical scheme adopted by the invention for solving the technical problem comprises the following steps:
the method comprises the following steps: connecting a PXI structure test system according to figure 1; connecting the TACAN signal simulator to one coupling-direction through port of a single directional coupler (5), connecting a PXI vector signal generator board card (3) to the other coupling-direction port of the directional coupler (5), connecting a PXI signal analysis module (4) to the coupling port of the directional coupler (5), and connecting a trigger output port of the PXI vector signal generator board card (3) to a trigger input port of the PXI signal analysis module (4);
step two: setting the local oscillation frequency of the PXI signal analysis module (4) as a wave channel of the GJB 914, setting the PXI signal analysis module (4) as a corresponding wave channel of a response signal in the GJB 914 according to the GJB 914, and setting the PXI vector signal generator board card (3) to transmit a TACAN excitation signal with double-pulse modulation, wherein the transmission period is t;
step three: setting a PXI signal analysis module (4) into a trigger acquisition mode;
step four: starting to collect response signals, and storing the waveforms collected after each trigger in a PXI zero slot controller (2);
step five: calling each waveform file acquired in the PXI zero slot controller (2), and measuring the time difference between the leading edge (50% amplitude point) of the response signal acquired for i times and the trigger signal to be Ti；
Step six: from the measured time difference TiAnd calculating a speed measurement result by the following formula:
and C is the light speed, and after the speed measurement result is obtained, the speed measurement result is provided for a simulator use unit to correct the speed value of the simulator and calibrate the tested equipment.
The invention also provides a calibration device of the TACAN signal speed parameter based on the PXI structure, which comprises a PXI case (1), a PXI zero slot controller (2), a PXI vector signal generator board card (3), a PXI signal analysis module (4) and a single directional coupler (5), wherein the PXI zero slot controller (2), the PXI vector signal generator board card (3) and the PXI signal analysis module (4) are all connected to a PXI bus, the PXI zero slot controller (2), the PXI vector signal generator board card (3) and the PXI signal analysis module (4) are integrally installed in the PXI case (1), the PXI zero slot controller (2) controls the PXI vector signal generator board card (3) and the PXI signal analysis module (4) through the PXI bus, the PXI vector signal generator board card (3) is connected to one through port of the single directional coupler (5), and the TACAN signal simulator to be tested is connected to the other through port of the single directional coupler (5), the PXI signal analysis module (4) is connected to the coupling port of the unidirectional coupler (5).
The PXI vector signal generator board card (3) of the calibration device for the speed parameter of the TACAN signal based on the PXI structure transmits an excitation signal required by the TACAN signal simulator, the pulse waveform of the excitation signal of the PXI vector signal generator board card (3) is edited to be a smooth waveform with the leading edge rising time of (2.0 +/-0.25) mu s and the amplitude of 10% -90%, the trailing edge falling time of (2.5 +/-0.5) mu s and the amplitude of 90% -10%, the pulse width of a half-amplitude point of (3.5 +/-0.5) mu s, and the transmission cycle of a double-pulse signal is t; in practical application, when excitation signal power required by the TACAN signal simulator is larger than the maximum output power of the PXI vector signal generator board card (3), a power amplifier is added at an output port of the PXI vector signal generator board card (3) to improve the output power of the PXI vector signal generator board card (3); meanwhile, the PXI vector signal generator board card (3) transmits a trigger signal to the PXI vector signal generator board card (3) to be used as a reference for the excitation signal and the response signal.
The PXI signal analysis module (4) comprises a local vibration source board card, a down-conversion board card and an intermediate frequency digitization board card; after the excitation signal is subjected to frequency mixing and down-conversion by the local vibration source board card and the down-conversion board card, the intermediate frequency digital board card is used for carrying out intermediate frequency acquisition; the trigger signal of the PXI vector signal generator board card (3) is connected to the trigger input port of the intermediate frequency digital board card; when the response signal is collected, according to the characteristics of the response signal, the signal is collected at the position which deviates 63MHz from the central frequency of the excitation signal according to the requirement of a GJB 914 wave channel.
The PXI zero slot controller (2) controls a PXI vector signal generator board card (3) and a PXI signal analysis module (4), sets the transmitting frequency and the transmitting level of the PXI vector signal generator board card (3), loads an edited excitation signal waveform into an IQ modulator of the PXI vector signal generator board card (3), sets the acquisition center frequency, the reference level, the sampling rate and the sampling point parameters of the PXI signal analysis module (4), performs waveform processing on the acquired excitation signal and response signal to obtain a measurement result, judges whether the technical index of the TACAN signal simulator meets the requirement or not, and finally generates a test report.
The directional coupler (5) is used for directly transmitting an excitation signal transmitted by the PXI vector signal generator board card (3) to the TACAN signal simulator, and coupling a response signal of the TACAN signal simulator into the PXI signal analysis module (4).
The PXI vector signal generator board card (3) adopts a signal generator PXIE-5673E of NI company, a broadband modulator of the device has good phase balance, the background noise can reach-150 dBm/Hz, and the frequency domain integrity of a baseband signal generated by IQ modulation after modulation is finished is guaranteed.
The method has the advantages that the signal waveforms are acquired by triggering for multiple times, the speed measurement result is obtained by measuring the time interval between each excitation and response and calculating, so that the speed parameters can be traced to the test equipment, and the accuracy and reliability of quantity value transmission are ensured; the method of replacing radio frequency acquisition by intermediate frequency is adopted to complete the measurement of signals, and the acquisition bandwidth used by the method is far narrower than the bandwidth acquired by an oscilloscope, so the background noise of the measurement process is lower, the positioning of amplitude points is more accurate, and the accuracy of the measurement result is higher.
Because the speed calculation result is calculated by using the relative amount of time delay, the time difference between an excitation signal and a response signal does not need to be directly measured, the method adopts a method taking a trigger signal as a reference to measure, only the time delay difference between the response signal and the trigger signal needs to be measured, because a frequency difference of 63MHz exists between the frequencies of the excitation signal and the response signal, the acquisition bandwidth for directly and simultaneously acquiring two paths of signals is at least 63MHz, only acquiring the response signal does not need to simultaneously cover two paths of signals, only the bandwidth of the response signal needs to be covered, the bottom noise can be lower, and the measurement accuracy is further improved.
Drawings
Fig. 1 is a test connection diagram of a calibration apparatus for tacan signal speed parameter based on a PXI structure according to the present invention.
Detailed Description
The invention is further illustrated with reference to the following figures and examples.
The invention aims to provide a calibration method of a tacan signal speed parameter, aiming at the defects of the prior art, the system is based on a PXI bus system architecture, the system volume is saved, the test function is integrated, the calibration accuracy is improved, and the tacan signal speed parameter can be finally traced to the national standard.
In order to achieve the above object, the present invention comprises: the system comprises a PXI case (1), a PXI zero slot controller (2), a PXI vector signal generator board card (3), a PXI signal analysis module (4) and a unidirectional coupler (5).
The invention adopts a PXI structure test system, utilizes a trigger signal to carry out storage measurement of a broadband high-speed signal, and adopts the technical scheme for solving the problems that the PXI structure test system comprises the following steps:
the method comprises the following steps: the devices are connected according to fig. 1. The method comprises the steps that a TACAN signal simulator is connected to a coupling-direction through port of a single directional coupler (5), a PXI vector signal generator board card (3) is connected to the other through port of the directional coupler, a PXI signal analysis module (4) is connected to the coupling port of the directional coupler, and a trigger output port of the PXI vector signal generator board card (3) is connected to a trigger input port of the PXI signal analysis module (4). (ii) a
Step two: setting the local oscillation frequency of the PXI signal analysis module (4) as a wave channel of the GJB 914, setting the PXI signal analysis module (4) as a corresponding wave channel of a response signal in the GJB 914 according to the GJB 914, and setting the PXI vector signal generator board card (3) to transmit a TACAN excitation signal with double-pulse modulation, wherein the transmission period is t;
step three: the PXI signal analysis module (4) is set to a trigger acquisition mode.
Step four: and starting to collect response signals, and storing the waveforms collected after each trigger in the PXI zero slot controller (2).
Step five: calling each waveform file acquired in the PXI zero slot controller (2), and measuring the time difference Ti between the leading edge (50% amplitude point) of the response signal acquired for i times and the trigger signal.
Step six: and calculating a speed measurement result according to the measured time difference Ti, wherein the calculation formula is shown as the following, wherein C is the light speed. After the calibration result is obtained, the calibration result can be provided for a simulator using unit to correct the simulator speed value and calibrate the tested device.
In the testing process, a PXI zero slot controller (2), a PXI vector signal generator board card (3) and a PXI signal analysis module (4) are integrally installed in a PXI case (1), the PXI zero slot controller (2) controls the PXI vector signal generator board card (3) and the PXI signal analysis module (4) through a PXI bus, the PXI vector signal generator board card (3) is connected to one through port of a single-directional coupler (5), a tested TACAN signal simulator is connected to the other through port of the single-directional coupler (5), and the PXI signal analysis module (4) is connected to a coupling port of the single-directional coupler (5).
The PXI vector signal generator board card (3) is responsible for transmitting an excitation signal required by a TACAN signal simulator, the pulse waveform of the excitation signal of the PXI vector signal generator board card (3) is edited into a smooth waveform with the leading edge rising time of (2.0 +/-0.25) mu s (10% -90% amplitude), the trailing edge falling time of (2.5 +/-0.5) mu s (90% -10% amplitude), the half-amplitude point pulse width of (3.5 +/-0.5) mu s, and a double-pulse signal of a transmission period. In practical application, when the excitation signal power required by the TACAN signal simulator is larger than the maximum output power of the PXI vector signal generator board card (3), a power amplifier is added at the output port of the PXI vector signal generator board card (3), and the output power of the PXI vector signal generator board card (3) is improved. Meanwhile, the PXI vector signal generator board card (3) transmits a trigger signal to the PXI vector signal generator board card (3) to be used as a reference for the excitation signal and the response signal.
The PXI signal analysis module (4) comprises a local vibration source board card, a down-conversion board card and an intermediate frequency digital board card. The excitation signal is subjected to frequency mixing and down-conversion by the local vibration source board card and the down-conversion board card, and then is subjected to intermediate frequency acquisition by the intermediate frequency digital board card. The trigger signal of the PXI vector signal generator board card (3) is connected to the trigger input port of the intermediate frequency digital board card. When the response signal is collected, according to the characteristics of the response signal, the signal is collected at a position which deviates 63MHz from the center frequency of the excitation signal according to the requirement of a GJB 914 wave channel.
The PXI zero slot controller (2) is responsible for controlling the PXI vector signal generator board card (3) and the PXI signal analysis module (4), setting the transmitting frequency and the transmitting level of the PXI vector signal generator board card (3), and loading the edited excitation signal waveform into an IQ modulator of the PXI vector signal generator board card (3). The acquisition center frequency, the reference level, the sampling rate and the sampling point parameters of the PXI signal analysis module (4) are set, waveform processing is carried out on the acquired excitation signal and the acquired response signal to obtain a measurement result, whether the technical index of the TACAN signal simulator meets the requirement or not is judged, and finally a test report is generated.
The directional coupler 5 is responsible for directly transmitting an excitation signal transmitted by the PXI vector signal generator board card (3) to the TACAN signal simulator, and coupling a response signal of the TACAN signal simulator into the PXI signal analysis module (4).
The PXI vector signal generator board card (3) is a signal generator PXIE-5673E of NI company, a broadband modulator of the device has good phase balance, the background noise can reach-150 dBm/Hz, and the frequency domain integrity of a baseband signal generated by IQ modulation after modulation is finished is guaranteed.
While the foregoing is directed to embodiments of the present invention, other and further embodiments of the invention may be devised without departing from the basic scope thereof, and the scope thereof is determined by the claims that follow.
Claims (7)
1. A calibration method of a TACAN signal speed parameter based on a PXI structure is characterized by comprising the following steps:
the method comprises the following steps: connecting a PXI structure test system; connecting the TACAN signal simulator to one coupling-direction through port of a single directional coupler (5), connecting a PXI vector signal generator board card (3) to the other coupling-direction port of the directional coupler (5), connecting a PXI signal analysis module (4) to the coupling port of the directional coupler (5), and connecting a trigger output port of the PXI vector signal generator board card (3) to a trigger input port of the PXI signal analysis module (4);
step two: setting the local oscillation frequency of the PXI signal analysis module (4) as a wave channel of the GJB 914, setting the PXI signal analysis module (4) as a corresponding wave channel of a response signal in the GJB 914 according to the GJB 914, and setting the PXI vector signal generator board card (3) to transmit a TACAN excitation signal with double-pulse modulation, wherein the transmission period is t;
step three: setting a PXI signal analysis module (4) into a trigger acquisition mode;
step four: starting to collect response signals, and storing the waveforms collected after each trigger in a PXI zero slot controller (2);
step five: calling each waveform file acquired in the PXI zero slot controller (2), and measuring the time difference between the leading edge (50% amplitude point) of the response signal acquired for i times and the trigger signal to be Ti；
Step six: from the measured time difference TiAnd calculating a speed measurement result by the following formula:
and C is the light speed, and after the speed measurement result is obtained, the speed measurement result is provided for a simulator use unit to correct the speed value of the simulator and calibrate the tested equipment.
2. A calibration apparatus for tacan signal speed parameter based on PXI architecture according to claim 1, wherein:
the calibration device for the TACAN signal speed parameters based on the PXI structure comprises a PXI case (1), a PXI zero slot controller (2), a PXI vector signal generator board card (3), a PXI signal analysis module (4) and a single directional coupler (5), wherein the PXI zero slot controller (2), the PXI vector signal generator board card (3) and the PXI signal analysis module (4) are all connected to a PXI bus, the PXI zero slot controller (2), the PXI vector signal generator board card (3) and the PXI signal analysis module (4) are integrally installed in the PXI case (1), the PXI zero slot controller (2) controls the PXI vector signal generator board card (3) and the PXI signal analysis module (4) through the PXI bus, the PXI vector signal generator board card (3) is connected to one through port of the single directional coupler (5), and a tested TACAN signal simulator is connected to the other through port of the single directional coupler (5), the PXI signal analysis module (4) is connected to the coupling port of the unidirectional coupler (5).
3. The apparatus for calibrating tacan signal speed parameter based on PXI structure of claim 2, wherein:
the PXI vector signal generator board card (3) of the calibration device for the speed parameter of the TACAN signal based on the PXI structure transmits an excitation signal required by the TACAN signal simulator, the pulse waveform of the excitation signal of the PXI vector signal generator board card (3) is edited to be a smooth waveform with the leading edge rising time of (2.0 +/-0.25) mu s and the amplitude of 10% -90%, the trailing edge falling time of (2.5 +/-0.5) mu s and the amplitude of 90% -10%, the half-amplitude point pulse width of (3.5 +/-0.5) mu s, and the transmission cycle is t; in practical application, when excitation signal power required by the TACAN signal simulator is larger than the maximum output power of the PXI vector signal generator board card (3), a power amplifier is added at an output port of the PXI vector signal generator board card (3) to improve the output power of the PXI vector signal generator board card (3); meanwhile, the PXI vector signal generator board card (3) transmits a trigger signal to the PXI vector signal generator board card (3) to be used as a reference for the excitation signal and the response signal.
4. The apparatus for calibrating tacan signal speed parameter based on PXI structure of claim 2, wherein:
the PXI signal analysis module (4) comprises a local vibration source board card, a down-conversion board card and an intermediate frequency digitization board card; after the excitation signal is subjected to frequency mixing and down-conversion by the local vibration source board card and the down-conversion board card, the intermediate frequency digital board card is used for carrying out intermediate frequency acquisition; the trigger signal of the PXI vector signal generator board card (3) is connected to the trigger input port of the intermediate frequency digital board card; when the response signal is collected, according to the characteristics of the response signal, the signal is collected at the position which deviates 63MHz from the central frequency of the excitation signal according to the requirement of a GJB 914 wave channel.
5. The apparatus for calibrating tacan signal speed parameter based on PXI structure of claim 2, wherein:
the PXI zero slot controller (2) controls a PXI vector signal generator board card (3) and a PXI signal analysis module (4), sets the transmitting frequency and the transmitting level of the PXI vector signal generator board card (3), loads an edited excitation signal waveform into an IQ modulator of the PXI vector signal generator board card (3), sets the acquisition center frequency, the reference level, the sampling rate and the sampling point parameters of the PXI signal analysis module (4), performs waveform processing on the acquired excitation signal and response signal to obtain a measurement result, judges whether the technical index of the TACAN signal simulator meets the requirement or not, and finally generates a test report.
6. The apparatus for calibrating tacan signal speed parameter based on PXI structure of claim 2, wherein:
the directional coupler (5) is used for directly transmitting an excitation signal transmitted by the PXI vector signal generator board card (3) to the TACAN signal simulator, and coupling a response signal of the TACAN signal simulator into the PXI signal analysis module (4).
7. The apparatus for calibrating tacan signal speed parameter based on PXI structure of claim 2, wherein:
the PXI vector signal generator board card (3) adopts a signal generator PXIE-5673E of NI company, the background noise can reach-150 dBm/Hz, and the frequency domain integrity of the baseband signal generated by IQ modulation after modulation is finished is ensured.
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