CN114076868A - Switch defect identification method, device, equipment and readable storage medium - Google Patents
Switch defect identification method, device, equipment and readable storage medium Download PDFInfo
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Abstract
The application discloses a switch defect identification method, a device, equipment and a readable storage medium, wherein the method comprises the following steps: acquiring instantaneous arc power and a current signal value of a switching coil when a switch is switched off for a plurality of times within a period of time; based on the instantaneous arc power and the current signal value of the switch coil during the switching-off of the switches for a plurality of times, obtaining an arc power moving average value time sequence and a coil current moving average value time sequence; calculating a causal correlation degree of the arc power moving average value time sequence and the coil current moving average value time sequence; and determining the switch defect condition according to the causal correlation degree. The method and the device judge whether the switch has defects or not by calculating the causal association degree of the arc power moving average value time sequence and the coil current moving average value time sequence, and simultaneously determine the defect degree of the switch further through the strength value of the coupling relation, namely the causal association degree.
Description
Technical Field
The present application relates to the field of power transmission, and more particularly, to a method, apparatus, device, and readable storage medium for identifying a switch defect.
Background
With the development of science and technology, electric energy has become one of indispensable energy sources in production, development and life. The power application is not independent of the corresponding power transmission, and the power distribution switchgear is one of the important devices in the power transmission process, including the medium voltage switchgear. Medium voltage switchgear is used in a wide range of power grids, and its usage increases with the increase of the distribution capacity of the power grid. Although the medium voltage switch manufacturing process is mature day by day and the product performance is stable, individual defects and faults of partial products still occur at times, and according to statistics, in recent years, the defect rate of medium voltage switch equipment is high, and a high fault defect rate brings certain hidden dangers to safe and stable operation of a power grid. Therefore, it is particularly important to develop defect recognition detection for switches.
Based on the above situation, a method for identifying a switch defect is needed to quickly identify the defect problem of the switch, so as to avoid hidden troubles to the safe and stable operation of the power grid.
Disclosure of Invention
In view of this, the present application provides a method, an apparatus, a device and a readable storage medium for identifying a switch defect, so as to realize fast identification of a defect problem of a switch, so as to avoid hidden troubles caused by safe and stable operation of a power grid.
In order to achieve the above object, the following solutions are proposed:
a switch defect identification method, comprising:
acquiring instantaneous arc power and a current signal value of a switching coil when a switch is switched off for a plurality of times within a period of time;
based on the instantaneous arc power and the current signal value of the switch coil during the switching-off of the switches for a plurality of times, obtaining an arc power moving average value time sequence and a coil current moving average value time sequence;
calculating a causal correlation degree of the arc power moving average value time sequence and the coil current moving average value time sequence;
and determining the switch defect condition according to the causal correlation degree.
Preferably, the obtaining of the arc power moving average time sequence and the coil current moving average time sequence based on the instantaneous arc power and the switch coil current signal value during the switching-off of the plurality of times of switches includes:
carrying out moving average processing on the instantaneous arc power during the switching-off of the switches for a plurality of times to obtain an arc power moving average value time sequence;
and carrying out moving average processing on the current signal values of the switching coil when the switch is switched off for a plurality of times to obtain a time sequence of moving average values of the coil current.
Preferably, the process for acquiring the instantaneous arc power when the primary switch is opened comprises the following steps:
measuring the instantaneous value of the voltage difference between the input end and the output end of the switch and the instantaneous value of the current flowing through the switch when the switch is opened;
and calculating to obtain the instantaneous arc power when the current switch is switched off according to the voltage difference instantaneous value and the current instantaneous value.
Preferably, the moving average processing of the instantaneous arc power when the switch is opened for several times to obtain the time series of the moving average of the arc power includes:
and inputting the instantaneous arc power generated during the switching-off of the switch for a plurality of times into a preset power moving average filter for moving average processing to obtain an arc power moving average value time sequence.
Preferably, the moving average processing is performed on the switch coil current signal values when the switches are switched off for a plurality of times to obtain a coil current moving average time sequence, and the moving average time sequence includes:
and inputting the current signal value of the switching coil when the switch is switched off for a plurality of times into a preset current moving average filter for moving average processing to obtain a coil current moving average value time sequence.
Preferably, the calculating the causal relationship between the arc power moving average time series and the coil current moving average time series includes:
and calculating the causal association degree of the arc power moving average value time sequence and the coil current moving average value time sequence through nonlinear Granger causal test.
Preferably, the determining a switch defect condition according to the causal correlation degree includes:
determining an interval of the causal correlation degree in a preset defect mapping table;
and determining the defect grade of the switch according to the located interval.
A switch defect identification apparatus comprising:
the acquisition unit is used for acquiring instantaneous arc power and a switch coil current signal value when the switch is switched off for a plurality of times within a period of time;
the sequence determination unit is used for obtaining an arc power moving average value time sequence and a coil current moving average value time sequence based on the instantaneous arc power and the switch coil current signal value during the switching-off of the switches for a plurality of times;
the calculating unit is used for calculating the causal correlation degree of the arc power moving average value time sequence and the coil current moving average value time sequence;
and the defect determining unit is used for determining the switch defect condition according to the causal correlation degree.
A switch defect identifying apparatus includes a memory and a processor;
the memory is used for storing programs;
the processor is used for executing the program to realize the steps of the switch defect identification method.
A readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the above-mentioned switch defect identification method.
According to the technical scheme, the switch defect identification method provided by the embodiment of the application obtains the arc power moving average time sequence and the coil current moving average time sequence by obtaining the instantaneous arc power and the switch coil current signal value obtained in a period of time when the switch is opened for a plurality of times, calculates the causal association degree of the arc power moving average time sequence and the coil current moving average time sequence, and determines the switch defect condition according to the causal association degree.
When the switch is in a defect state, the electric arc can reflect the defect state of the switch contact when the switch is opened. When the switch has defects, the coupling relation between the coil current value and the switch arc power is weak when the switch is opened, namely the causal relationship between the coil current change and the switch arc power change is weak. Therefore, whether the switch has defects can be judged by calculating the causal association degree of the arc power moving average value time sequence and the coil current moving average value time sequence, and the defect degree of the switch can be further determined by the strength value of the coupling relation, namely the causal association degree.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a flow chart of a switch defect identification method disclosed herein;
fig. 2 is a block diagram of a switch defect recognition apparatus disclosed in the present application;
fig. 3 is a block diagram of a hardware structure of a switch defect identifying apparatus disclosed in the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The following is a description of the present application, which proposes the following technical solutions, and is referred to in detail below.
Before introducing the technical solution of the present application, first, a detection principle applied by the present application is introduced.
During the opening operation, i.e. the opening operation, of the switching equipment, an arc is generated between the switching contacts, and the energy of the arc is one of the defect judgment indexes of the switching equipment.
The action principle of the switch device is as follows: when the switching equipment receives a switching-on command, rated voltage is applied to a switching-on coil, the iron core generates suction force on the contact, and when the suction force is larger than counter force, the contact moves to drive a mechanical structure to move, so that switching-on is realized; when the switch equipment needs to be opened, the electromagnetic coil is powered off, the contact drives the mechanical structure to move under the action of the counter-force spring, the guide rod and the moving contact are pulled to complete opening, and the switch can generate switch electric arc which is not easy to extinguish when opening is carried out on the switch.
When the switch is in a normal state, namely no defect exists, the current value of the switch electromagnetic coil and the switch electric arc have a strong coupling relation, namely the switch is switched off when the coil is powered off (the current of the coil changes), and the switch electric arc is generated. When the switch is in a defect state, the coupling relation between the energy of the switching arc and the current of the coil is influenced by the defect of the switch, so that the coupling relation between the current value of the coil and the power of the switching arc is weak, namely the causal relation between the current change of the coil and the power change of the switching arc is weak. Thus, a fault condition of the switch can be determined by determining a causal relationship between a change in coil current and a change in switch arc power.
The method is characterized in that whether the switch has defects is judged according to the causal association degree of the arc power moving average value time sequence and the coil current moving average value time sequence when the switch is switched off, and meanwhile, the defect degree of the switch can be further determined according to the strength value of the coupling relation, namely the causal association degree.
Based on the above detection principle, the present application provides a switch defect identification method, and fig. 1 is a flowchart of the switch defect identification method disclosed in the embodiment of the present application, and as shown in fig. 1, the method may include:
and step S1, acquiring instantaneous arc power and current signal values of the switch coil when the switch is opened for a plurality of times within a period of time.
Specifically, the switching arc power refers to power loss generated by a switching arc, namely, power difference between an input end and an output end of the switch, and instantaneous arc power during switching off of the switch, namely, power difference between the input end and the output end of the switch at the switching off time. In a period of time, namely a period of detection time, the switch to be detected can be switched on and off for a plurality of times, and the instantaneous arc power of each switching-off of the switch can be obtained by measuring the instantaneous value of the voltage difference between the input end and the output end of the switch during switching-off and the instantaneous value of the current flowing through the switch and calculating.
And step S2, obtaining an arc power moving average value time sequence and a coil current moving average value time sequence based on the instantaneous arc power and the switch coil current signal value when the switch is switched off for a plurality of times.
Specifically, in order to determine the coupling relationship between the instantaneous arc power and the current signal value of the switching coil, it is necessary to first obtain a moving average time series of the arc power and a moving average time series of the coil current. The moving average time sequence of the arc power and the moving average time sequence of the coil current can be obtained in various ways, for example, the moving average can be directly obtained by carrying out moving average processing on the instantaneous arc power and the current signal value of the switch coil when the switch is switched off, and the moving average can also be obtained by carrying out filtering processing through a moving average filter.
And step S3, calculating the causal correlation degree of the arc power moving average value time sequence and the coil current moving average value time sequence.
Specifically, after the arc power moving average time sequence and the coil current moving average time sequence are obtained, the causal association degree of the arc power moving average time sequence and the coil current moving average time sequence is detected by using a Granger causal detection method or a Granger causal model and the like, and the causal association degree of the arc power moving average time sequence and the coil current moving average time sequence is calculated and obtained and can be used for judging whether the switch has defects or not.
And step S4, determining the switch defect condition according to the causal correlation degree.
Specifically, the causal correlation value can also reflect the switch defect degree and other conditions besides judging whether the switch has defects, so that after the switch is determined to have defects, the severity of the switch defects can be further determined according to the causal correlation value.
According to the technical scheme, the switch defect identification method provided by the embodiment of the application obtains the arc power moving average time sequence and the coil current moving average time sequence by obtaining the instantaneous arc power and the switch coil current signal value obtained in a period of time when the switch is opened for a plurality of times, calculates the causal association degree of the arc power moving average time sequence and the coil current moving average time sequence, and determines the switch defect condition according to the causal association degree.
When the switch is in a defect state, the electric arc can reflect the defect state of the switch contact when the switch is opened. When the switch has defects, the coupling relation between the coil current value and the switch arc power is weak when the switch is opened, namely the causal relationship between the coil current change and the switch arc power change is weak. Therefore, whether the switch has defects can be judged by calculating the causal association degree of the arc power moving average value time sequence and the coil current moving average value time sequence, and the defect degree of the switch can be further determined by the strength value of the coupling relation, namely the causal association degree.
In some embodiments of the present application, the process of acquiring the instantaneous arc power when the switch is opened for several times within a period of time in step S1 is described, which may include:
step S11, during each opening of the switch, the instantaneous value of the voltage difference between the input terminal and the output terminal of the switch and the instantaneous value of the current flowing through the switch are measured.
And step S12, calculating to obtain the instantaneous arc power when the current switch is switched off according to the voltage difference instantaneous value and the current instantaneous value.
Specifically, for each switching opening in a period of time, the instantaneous value of the voltage difference between the input end and the output end of each switching opening and the instantaneous value of the current flowing through the switch are measured, and the instantaneous arc power of the switching opening can be calculated, wherein the calculation formula is as follows:
wherein, Δ p is the calculated instantaneous arc power, s is the sampling frequency of the instantaneous value of the voltage and the current, and TsIs a sampling period, vSFor instantaneous value of voltage difference between input and output of switch iSIs the current transient through the switch.
In some embodiments of the present application, the instantaneous arc power and the switch coil current signal value during switching off of the switch may be processed in a moving average processing manner, so as to obtain an arc power moving average time sequence and a coil current moving average time sequence.
The following describes a moving average processing method, specifically:
inputting a time sequence X with the length of N, removing first data after new sampling, sequentially moving the rest N-1 data forwards, inserting the (N + 1) th value of new sampling data, and forming a new sequence Y by the (2) nd value to the (N) th value of the original time sequence and the (N + 1) th value of the new sampling; the average of the N values of the time series Y is then calculated as the 1 st value of the output time series Z. And processing the 2 nd value of the sequence Z in the same way, namely averaging the 3 rd value to the N +1 th value and the N +2 th value of new sampling on the Nth value machine of the sequence X until the Nth value of the sequence Z is obtained by calculation, and outputting the time sequence Z with the length of N.
On the basis, the process of obtaining the arc power moving average time sequence and the coil current moving average time sequence based on the instantaneous arc power and the switch coil current signal value during the switching-off of the switch for several times in step S2 will be described, which may specifically include:
and step S21, carrying out moving average processing on the instantaneous arc power during the switching-off of the switches for a plurality of times to obtain an arc power moving average value time sequence.
In particular, the moving average process may effectively eliminate high frequency oscillations and generate a smooth arc power time series. An alternative embodiment is provided below for step S21, including:
and inputting the instantaneous arc power generated during the switching-off of the switch for a plurality of times into a preset power moving average filter for moving average processing to obtain an arc power moving average value time sequence.
After the instantaneous arc power when the switch is switched off for a plurality of times is obtained, the instantaneous arc power delta p is used as an input sequence, the instantaneous arc power is subjected to moving average processing by using a power moving average filter, and the time sequence of the moving average of the output arc power is as follows:
wherein, PtRepresenting the time sequence of the moving average value of the obtained arc power, t is the time, pMAIs the moving average value of the switching arc power, j is the sampling moment of the instantaneous value, and N is the period length of the moving average window.
And step S22, performing moving average processing on the switch coil current signal values during the switching-off of the switches for a plurality of times to obtain a coil current moving average value time sequence.
In particular, the moving average process may effectively reject high frequency oscillations and generate a smoothed time series of moving averages of the coil current. An alternative embodiment is provided below for step S22, including:
and inputting the current signal value of the switching coil when the switch is switched off for a plurality of times into a preset current moving average filter for moving average processing to obtain a coil current moving average value time sequence.
Measuring the current signal value of the switch coil when the switch is opened to obtain the coil current instantaneous value iCCInstantaneous value i of coil currentCCAs an input sequence, the instantaneous arc power is subjected to moving average processing by a current moving average filter, and the output coil current moving average time sequence is as follows:
wherein, ItRepresenting the resulting time series of coil currents, t being the time, iMAIs the moving average of the coil current.
In some embodiments of the present application, the process of calculating the causal association degree between the arc power moving average time sequence and the coil current moving average time sequence in step S3 may specifically include:
and calculating the causal association degree of the arc power moving average value time sequence and the coil current moving average value time sequence through nonlinear Granger causal test.
Specifically, nonlinear causal relationship between the arc power moving average time sequence and the coil current moving average time sequence is verified and analyzed by nonlinear Granger causal detection, and causal association degree between the switching arc power moving average time sequence and the coil current moving average time sequence is obtained. The process of nonlinear Granger causal test specifically comprises the following steps:
generating a lag vector matrix of the arc power moving average time sequence and the coil current moving average time sequence, wherein the lag vector matrices are respectively expressed as:
wherein lpAnd liDenotes the hysteresis order, where l isp＝li＝1。
Assuming that there is no Granger causal relationship between the two time series, i.e.
Does not comprise
Then the sequence obeys the following distribution:
setting random vectors with invariant distributions
Wherein Zt＝It+1The time index is omitted, and given (P, Y) ═ P, I, the conditional distribution of Z is the same as given I ═ I, and the above formula can be expressed as a joint distribution density function:
the causal correlation T of the time series of moving averages of the arc power and the time series of moving averages of the coil current is expressed as follows:
wherein the function
Denotes that the random variable W is at WiLocal density function estimate at value, εnRepresenting the bandwidth parameter associated with the sample and n representing the number of samples.
The smaller the causal relationship T, the weaker the causal relationship between the time series of moving averages of arc power and the time series of moving averages of coil current, i.e., the more severe the degree of defect of the switch.
In some embodiments of the present application, a defect mapping table is set in advance according to various defect conditions of the switch, and the setting process of the defect mapping table is as follows:
for known switching devices with different defects, switching arc power and coil current data of the switching devices during switching-off are collected, and according to the switching defect identification method provided by the application, causal association degrees of the arc power moving average time sequence and the coil current moving average time sequence of the switching devices are obtained. And if the causal association degree value is recorded as T, counting and analyzing to obtain that the total range interval of the causal association degrees of the known switch devices with different defects is [ Tmin,Tmax]The total range of the causal association degree can be divided into four levels, I level: [ T ]min,Tm1]And II stage: [ T ]m1,Tm2]And grade III: [ T ]m2,Tm3]And IV stage: [ T ]m3,Tmax]Respectively, representing different defect levels of the switchgear. Wherein, the larger the T value is, the stronger the coupling relation between the characteristic switch arc power and the coil current isThe closer to the normal state of the switch, i.e. the absence of a defective state; the smaller the T value is, the weaker the coupling relation of the characteristic switching arc power and the coil current is, and the more serious the switching defect degree is.
It can be understood that the more the number of the collected switching devices, the wider the defect degree range, and the more comprehensive and accurate the defect mapping table, so that when the defect mapping table is set, the information of each switching device with different defects should be collected as much as possible.
The above setting manner of the defect level is not the only setting manner, and in the specific implementation, the causal association degree may be divided in more detail according to the actual situation, and the division of the degree of the defect situation is not specifically limited in the present application, and any embodiment that further determines the severity of the defect degree based on the magnitude of the causal association degree should belong to the protection scope of the present application.
In addition, the process of explaining the process of determining the switch defect condition according to the causal relationship degree in step S4 may specifically include:
and step S41, determining the interval of the causal association degree in a preset defect mapping table.
And step S42, determining the defect level of the switch according to the located interval.
Specifically, after the causal association degree is obtained, an interval in which a value of the causal association degree falls is determined, and then the defect level of the switch is determined according to the interval. E.g. the value of causal association belongs to [ Tm1,Tm2]Then, the causal relationship degree is shown in the interval [ Tm1,Tm2]The level II defect is the switch defect with a medium degree. The staff can be according to the switch defect grade, assesses the defect risk, confirms whether to change the maintenance to switchgear.
The following describes a switch defect identification apparatus provided in an embodiment of the present application, and the switch defect identification apparatus described below and the switch defect identification method described above may be referred to correspondingly.
Referring to fig. 2, fig. 2 is a schematic structural diagram of a switch defect identifying apparatus disclosed in the embodiment of the present application.
As shown in fig. 2, the apparatus may include:
the obtaining unit 110 is configured to obtain an instantaneous arc power and a switching coil current signal value when the switch is opened for a plurality of times within a period of time;
the sequence determination unit 120 is configured to obtain an arc power moving average time sequence and a coil current moving average time sequence based on the instantaneous arc power and the switch coil current signal value during the switching-off of the plurality of times;
a calculating unit 130 for calculating a causal association degree between the arc power moving average time series and the coil current moving average time series;
and the defect determining unit 140 is used for determining the switch defect condition according to the causal correlation degree.
It can be seen from the foregoing technical solutions that, in the switching defect identification device provided in the embodiments of the present application, an arc power moving average time sequence and a coil current moving average time sequence are obtained by obtaining instantaneous arc power and a switching coil current signal value obtained in a certain period when a switch is opened for several times, a causal association degree between the arc power moving average time sequence and the coil current moving average time sequence is calculated, and a switching defect condition is determined according to the causal association degree.
When the switch is in a defect state, the electric arc can reflect the defect state of the switch contact when the switch is opened. When the switch has defects, the coupling relation between the coil current value and the switch arc power is weak when the switch is opened, namely the causal relationship between the coil current change and the switch arc power change is weak. Therefore, whether the switch has defects can be judged by calculating the causal association degree of the arc power moving average value time sequence and the coil current moving average value time sequence, and the defect degree of the switch can be further determined by the strength value of the coupling relation, namely the causal association degree.
Optionally, the sequence determining unit may include:
the power sequence determining unit is used for carrying out moving average processing on the instantaneous arc power during the switching-off of the switches for a plurality of times to obtain an arc power moving average value time sequence;
and the current sequence determining unit is used for carrying out moving average processing on the switch coil current signal values during switching-off for a plurality of times to obtain a coil current moving average value time sequence.
Optionally, the obtaining unit may include:
the measuring unit is used for measuring the instantaneous value of the voltage difference between the input end and the output end of the switch and the instantaneous value of the current flowing through the switch when the switch is switched off each time;
and the power calculation unit is used for calculating and obtaining the instantaneous arc power when the current switch is switched off according to the voltage difference instantaneous value and the current instantaneous value.
Optionally, the power sequence determining unit may be configured to input the instantaneous arc power obtained when the switch is switched off for several times into a preset power moving average filter to perform moving average processing, so as to obtain an arc power moving average time sequence.
Optionally, the current sequence determining unit may be configured to input the switching coil current signal value obtained when the switch is switched off for several times into a preset current moving average filter to perform moving average processing, so as to obtain a coil current moving average time sequence.
Optionally, the calculating unit may be configured to calculate a causal association degree between the arc power moving average time sequence and the coil current moving average time sequence through a nonlinear Granger causal test.
Preferably, the defect determining unit may include:
the first defect determining subunit is used for determining an interval where the causal association degree is located in a preset defect mapping table;
and the second defect determining subunit is used for determining the defect level of the switch according to the located section.
The switch defect identification device provided by the embodiment of the application can be applied to switch defect identification equipment. Alternatively, fig. 3 shows a block diagram of a hardware structure of the switch defect identifying apparatus, and referring to fig. 3, the hardware structure of the switch defect identifying apparatus may include: at least one processor 1, at least one communication interface 2, at least one memory 3 and at least one communication bus 4;
in the embodiment of the application, the number of the processor 1, the communication interface 2, the memory 3 and the communication bus 4 is at least one, and the processor 1, the communication interface 2 and the memory 3 complete mutual communication through the communication bus 4;
the processor 1 may be a central processing unit CPU, or an application Specific Integrated circuit asic, or one or more Integrated circuits configured to implement embodiments of the present invention, etc.;
the memory 3 may include a high-speed RAM memory, and may further include a non-volatile memory (non-volatile memory) or the like, such as at least one disk memory;
wherein the memory stores a program and the processor can call the program stored in the memory, the program for:
acquiring instantaneous arc power and a current signal value of a switching coil when a switch is switched off for a plurality of times within a period of time;
based on the instantaneous arc power and the current signal value of the switch coil during the switching-off of the switches for a plurality of times, obtaining an arc power moving average value time sequence and a coil current moving average value time sequence;
calculating a causal correlation degree of the arc power moving average value time sequence and the coil current moving average value time sequence;
and determining the switch defect condition according to the causal correlation degree.
Alternatively, the detailed function and the extended function of the program may refer to the above description.
Embodiments of the present application further provide a readable storage medium, where a program suitable for being executed by a processor may be stored, where the program is configured to:
acquiring instantaneous arc power and a current signal value of a switching coil when a switch is switched off for a plurality of times within a period of time;
based on the instantaneous arc power and the current signal value of the switch coil during the switching-off of the switches for a plurality of times, obtaining an arc power moving average value time sequence and a coil current moving average value time sequence;
calculating a causal correlation degree of the arc power moving average value time sequence and the coil current moving average value time sequence;
and determining the switch defect condition according to the causal correlation degree.
Alternatively, the detailed function and the extended function of the program may refer to the above description.
Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A method for identifying a switch defect, comprising:
acquiring instantaneous arc power and a current signal value of a switching coil when a switch is switched off for a plurality of times within a period of time;
based on the instantaneous arc power and the current signal value of the switch coil during the switching-off of the switches for a plurality of times, obtaining an arc power moving average value time sequence and a coil current moving average value time sequence;
calculating a causal correlation degree of the arc power moving average value time sequence and the coil current moving average value time sequence;
and determining the switch defect condition according to the causal correlation degree.
2. The method of claim 1, wherein the deriving an arc power moving average time series and a coil current moving average time series based on instantaneous arc power and switch coil current signal values at the times of switch opening comprises:
carrying out moving average processing on the instantaneous arc power during the switching-off of the switches for a plurality of times to obtain an arc power moving average value time sequence;
and carrying out moving average processing on the current signal values of the switching coil when the switch is switched off for a plurality of times to obtain a time sequence of moving average values of the coil current.
3. The method of claim 1, wherein the obtaining of the instantaneous arc power when the switch is opened for one time comprises:
measuring the instantaneous value of the voltage difference between the input end and the output end of the switch and the instantaneous value of the current flowing through the switch when the switch is opened;
and calculating to obtain the instantaneous arc power when the current switch is switched off according to the voltage difference instantaneous value and the current instantaneous value.
4. The method of claim 2, wherein the moving average processing of the instantaneous arc power at the time of opening the switch for several times to obtain an arc power moving average time sequence comprises:
and inputting the instantaneous arc power generated during the switching-off of the switch for a plurality of times into a preset power moving average filter for moving average processing to obtain an arc power moving average value time sequence.
5. The method according to claim 2, wherein the moving average processing is performed on the switch coil current signal values when the switches are opened for a plurality of times to obtain a coil current moving average time sequence, and the method comprises:
and inputting the current signal value of the switching coil when the switch is switched off for a plurality of times into a preset current moving average filter for moving average processing to obtain a coil current moving average value time sequence.
6. The method of claim 1, wherein said calculating a causal association of said time series of moving averages of arc power and said time series of moving averages of coil current comprises:
and calculating the causal association degree of the arc power moving average value time sequence and the coil current moving average value time sequence through nonlinear Granger causal test.
7. The method of claim 1, wherein determining a switch defect condition based on the causal relationship comprises:
determining an interval of the causal correlation degree in a preset defect mapping table;
and determining the defect grade of the switch according to the located interval.
8. A switch defect identifying apparatus, comprising:
the acquisition unit is used for acquiring instantaneous arc power and a switch coil current signal value when the switch is switched off for a plurality of times within a period of time;
the sequence determination unit is used for obtaining an arc power moving average value time sequence and a coil current moving average value time sequence based on the instantaneous arc power and the switch coil current signal value during the switching-off of the switches for a plurality of times;
the calculating unit is used for calculating the causal correlation degree of the arc power moving average value time sequence and the coil current moving average value time sequence;
and the defect determining unit is used for determining the switch defect condition according to the causal correlation degree.
9. A switch defect identification device comprising a memory and a processor;
the memory is used for storing programs;
the processor, configured to execute the program, implementing the steps of the switch defect identification method according to any one of claims 1 to 7.
10. A readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method for identifying a switch defect according to any one of claims 1 to 7.
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