CN113960456B - Automatic detection method for micro-damage of circuit interface - Google Patents
Automatic detection method for micro-damage of circuit interface Download PDFInfo
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- CN113960456B CN113960456B CN202111561703.8A CN202111561703A CN113960456B CN 113960456 B CN113960456 B CN 113960456B CN 202111561703 A CN202111561703 A CN 202111561703A CN 113960456 B CN113960456 B CN 113960456B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
Abstract
The invention relates to the technical field of circuit detection, and particularly discloses a circuit interface micro-damage automatic detection device which is suitable for a multi-interface circuit, has good reliability of detection results, low measurement difficulty and high measurement efficiency, and comprises a control host computer, an IO address card, a program-controlled power supply and a digital electric meter which are connected with the control host computer, and a routing switch connected with the IO address card and the program-controlled power supply; the control host computer controls the program control power supply to output voltage or current so as to provide preset excitation, and allocates an IO address to the routing switch through an IO address card so that the routing switch is connected with an interface of a tested circuit, and the control host computer draws a volt-ampere characteristic curve through feedback voltage or current measured by the digital electric meter; and the control host computer sets a golden machine threshold according to the volt-ampere characteristic curve of the golden machine, and analyzes the volt-ampere characteristic curve of the prototype machine through the golden machine threshold so as to judge the damage condition of the circuit interface. Also discloses a method for automatically detecting the micro-damage of the circuit interface by adopting the device.
Description
Technical Field
The invention relates to the technical field of circuit detection, in particular to a circuit interface micro-damage automatic detection device and method suitable for a multi-interface circuit.
Background
In the electrical field, it is generally considered that the performance of a hardware system does not change significantly after the design and manufacture are completed, and the subsequent test for a circuit interface is mainly to check whether the circuit interface is functioning normally. However, in the actual use process, the damage of the function is often caused by the continuous degradation accumulation of the components, and is expressed in a mode of function abnormality only after the components are finally completely damaged, so that the degradation trend of the circuit can be found in advance through the micro-damage detection of the circuit interface, and the reliability of the current circuit can be evaluated.
At present, in the micro-damage detection of a circuit interface, functional parameters of the circuit interface, such as common parameters of whether a resistor, a capacitor and a diode are conducted or not, are mainly measured, and the parameters are not easy to show the degradation degree of the port. Different currents or voltage excitations are superposed on the circuit interface, the voltage or the current fed back by the circuit is measured at the same time to obtain the volt-ampere curve characteristic of the circuit interface, the degradation degree of the circuit can be evaluated by measuring the deviation of the actual volt-ampere characteristic and the ideal volt-ampere characteristic of the circuit interface, and the damage condition of the circuit interface can be reflected more visually. However, in the process of evaluating the circuit interface by using the volt-ampere characteristic, the excitation source needs to be changed for many times to measure the volt-ampere curve, and the volt-ampere curve is compared with an ideal volt-ampere characteristic curve, so that the manual operation is very troublesome, the efficiency is very low, particularly, the test difficulty of the volt-ampere characteristic curve is high under the condition that the circuit interfaces are large in number, and the method for detecting the circuit damage by evaluating the volt-ampere curve is high in operation difficulty, and is particularly difficult to be used for circuit detection of a plurality of interfaces.
Disclosure of Invention
Therefore, it is necessary to provide an automatic detection apparatus and method for micro-damage of circuit interface suitable for multi-interface circuit, aiming at the technical problems of insufficient reliability of detection result, high measurement difficulty and low measurement efficiency.
An automatic detection device for micro-damage of a circuit interface comprises a control host computer, an IO address card, a programmable power supply, a digital ammeter and a route selection switch, wherein the IO address card, the programmable power supply and the digital ammeter are respectively connected with the control host computer, the route selection switch is respectively connected with the IO address card and the programmable power supply, a measuring end of the digital ammeter is arranged on a connecting line of the route selection switch and the programmable power supply, and the route selection switch is used for being connected with an interface of a detected circuit;
the control host computer controls the programmable power supply to output constant voltage or current and controls the IO address card to allocate an IO address to the routing switch when providing preset excitation to the routing switch so that the routing switch is connected with one interface of the tested circuit, the digital ammeter is used for measuring the voltage or current between the routing switch and the programmable power supply, the control host computer adjusts the output of the programmable power supply for multiple times to adjust the excitation, and a volt-ampere characteristic curve is drawn through the measured value of the digital ammeter;
and the control host computer sets a golden machine threshold according to the measured golden machine volt-ampere characteristic curve, and analyzes the volt-ampere characteristic curve of the prototype machine through the golden machine threshold so as to judge the damage condition of the circuit interface.
In one embodiment, the routing switch is a routing relay, and the routing relay comprises a multi-path input pin for connecting with a tested circuit and a single-path output pin for connecting with a programmable power supply; when the routing relay receives the address signal sent by the IO address card, one path of signal is selected from the multiple paths of signals accessed by the multiple paths of input pins to serve as an input signal to be communicated.
In one embodiment, the automatic detection device for the micro-damage of the circuit interface comprises two routing switches connected in parallel.
In one embodiment, the automatic detection device for micro-damage of the circuit interface further comprises a source measurement unit SMU, wherein the programmable power supply and the digital electric meter are integrated in the source measurement unit SMU, and the source measurement unit SMU is respectively connected with the control host computer and the routing switch.
In one embodiment, the automatic detection device for the micro-damage of the circuit interface further comprises a conversion joint arranged between the circuit to be detected and the routing switch.
The invention also discloses a circuit interface micro-damage automatic detection method adopting the circuit interface micro-damage automatic detection device, which comprises the following steps:
step S1: selecting a golden machine, and loading an interface pin configuration list and an excitation signal configuration list in a control host computer;
step S2: the digital ammeter measures the voltage or current of a circuit under the combination of different interfaces and excitation signals;
step S3: setting a threshold, selecting a plurality of golden machines, repeating the steps S1 and S2, calculating the average measurement value of the plurality of golden machines, setting a plurality of different fluctuation amplification ratios, and setting a plurality of threshold ranges with different standards according to the fluctuation amplification ratios and the average measurement value;
step S4: selecting a prototype, loading an interface pin configuration list and an excitation signal configuration list in a control host computer, and repeating the step S2;
step S5: and comparing the prototype measurement result with the threshold range of the prototype measurement to judge the damage condition of the circuit interface of the prototype.
In one embodiment, the interface pin configuration list includes a number of pin pair numbers that require pair-wise measurements, each pin pair including a signal pin and a power or ground pin.
In one embodiment, the excitation signal configuration list includes the excitation size of the current or voltage source, and the protection threshold size of the circuit, which need to be loaded in sequence for each pin pair to be measured.
In one embodiment, step S2 further includes: after the digital electric meter performs feedback measurement on one group of pin pairs under different excitations, the control host computer controls the routing switch to be switched to the next group of pin pairs for connection through the IO address card, controls the programmable power supply to apply different excitations corresponding to the group of pin pairs one by one, and performs feedback measurement through the digital electric meter.
The invention is implemented by the automatic detection device and the method for the micro-damage of the circuit interface, controls the host computer to send address signals to the route selection switch through the IO address card so that the route selection switch is respectively switched to be connected with different interfaces of the circuit to be detected according to instructions, meanwhile, the control host computer controls the output of the program-controlled power supply to adjust the excitation in the circuit, draws a volt-ampere characteristic curve according to the voltage or current feedback measurement value of each interface of the circuit to be tested under different excitations, compares the prototype measurement value with the golden machine threshold to obtain the damage condition of the interface of the circuit to be tested, in the process, the damage condition of the circuit interface is judged by adopting the volt-ampere characteristic curve, and compared with the common parameter modes of only measuring the resistance, the capacitance, the diode conduction direction and the like of the interface, the damage condition of the circuit interface can be reflected more visually, and the reliability of the detection result is improved; according to the device and the method, all the interface switching and excitation adjustment are adjusted by the control host computer, manual debugging and measurement are not needed, the circuit interface measurement difficulty is reduced, and the measurement efficiency is improved.
Drawings
FIG. 1 is a schematic structural diagram of an automatic detection apparatus for micro-damage of a circuit interface according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a routing switch according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of an automatic detection apparatus for micro-damage of a circuit interface according to another embodiment of the present invention;
FIG. 4 is a flow chart of a method for automatically detecting micro-damage of a circuit interface according to an embodiment of the present invention;
FIG. 5 is a flow chart of golden machine measurements in one embodiment of the present invention;
FIG. 6 is a logic decision diagram of golden machine measurements in accordance with an embodiment of the present invention;
FIG. 7 is a flow chart of prototype measurements in one embodiment of the present invention.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in detail below. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein.
Referring to fig. 1, the present invention discloses an automatic detection device for micro-damage of a circuit interface suitable for a multi-interface circuit, which includes a control host computer 100, an IO address card 200, a programmable power supply 300 and a digital electric meter 400 respectively connected to the control host computer 100, and a routing switch 500 respectively connected to the IO address card 200 and the programmable power supply 300, wherein a measurement end of the digital electric meter 400 is disposed on a connection line between the routing switch 500 and the programmable power supply 300, and the routing switch 500 is used for connecting with an interface of a circuit to be detected. When the control host computer 100 controls the programmable power supply to output a constant voltage or current and provides a preset excitation to the routing switch 500, the control host computer 100 controls the IO address card 200 to allocate an IO address to the routing switch 500, so that the routing switch 500 is connected with one interface of a circuit to be tested, the digital electric meter 400 is used for measuring the voltage or current between the routing switch 500 and the programmable power supply 300, the control host computer 100 adjusts the output of the programmable power supply for multiple times to adjust the excitation, and a volt-ampere characteristic curve is drawn through a measurement value of the digital electric meter 400.
In this embodiment, the golden machine and the prototype are introduced into the automatic detection device for detecting the micro-damage of the circuit interface as the detected circuit in sequence to measure current or voltage, and then the volt-ampere characteristic curves are respectively drawn, and then the control host computer 100 sets the threshold of the golden machine according to the measured volt-ampere characteristic curve of the golden machine, and analyzes the volt-ampere characteristic curve of the prototype through the threshold of the golden machine to judge the damage condition of the circuit interface. It should be noted that the golden machine refers to a device to be tested which is considered to have no damage and has a completely normal function, in this embodiment, the golden machine refers to a circuit device to be tested which has a standard performance when leaving a factory and is never put into use, data obtained by measuring the golden machine is considered as an ideal parameter, and a measured value of the golden machine is used as a standard value to evaluate the damage condition of a circuit interface of a prototype.
It should be noted that the automatic detection apparatus for micro-damage of circuit interface of this embodiment includes two operation modes, i.e., a golden machine measurement mode and a prototype measurement mode, before the two modes are performed, a mode command needs to be sent to the control host computer 100 to enable the control host computer 100 to enter a predetermined mode, then the routing switch 500 is connected to a predetermined golden machine or prototype, after voltage or current (i.e., feedback measurement value) of one circuit interface under different excitations is measured, a volt-ampere characteristic curve of one interface of the golden machine or prototype is drawn according to the voltage or current under different excitations, and then a new address signal is sent to the routing switch 500 through the IO address card 200 to enable the routing switch 500 to be connected to a next interface of the circuit to be measured, and the feedback measurement value under different excitations under the condition of the interface connection is measured one by one. In the process of judging damage of the circuit interface of the prototype, the volt-ampere characteristic curve measured at one interface of the prototype is compared with the volt-ampere characteristic curve of the interface corresponding to the interface on the golden machine, and then judgment is carried out. In this embodiment, in order to improve the reliability of the measurement result of the golden machine, a plurality of golden machines can be selected for measurement, so as to weaken or even eliminate the influence of the machining process on the performance of the golden machine.
Before the circuit interface of the same type of prototype is measured, the volt-ampere characteristic curve of the golden machine corresponding to the prototype needs to be measured, the volt-ampere characteristic curve of the golden machine is taken as a standard value and stored in the control host computer 100, meanwhile, the judgment threshold of micro-damage is set according to the measurement data value and the fluctuation condition of the golden machine and stored in the control host computer 100, and after the feedback measurement values of different interfaces of one prototype under different excitations are measured and the volt-ampere characteristic curves are respectively drawn, the volt-ampere characteristic curves are respectively compared with the standard value and the threshold of the golden machine so as to judge the damage conditions (or degradation conditions) of the different interfaces of the prototype.
In this embodiment, the IO address card 200 is an IO control signal output device that sends an address signal to the routing switch 500 according to an instruction of the control host computer 100, and the routing switch 500 switches to connect with a preset interface or a pin of a circuit to be tested according to the address signal, so as to measure voltage or current feedback of a specific interface on the golden machine or the prototype machine.
In an embodiment, the routing switch 500 is a routing relay, if a routing chip is adopted, the cost is lower, the speed is higher, but a large error is introduced into a measurement system, the relay has small introduction interference to the measurement system, and the reliability of a measurement result can be improved. Referring to fig. 2, the routing relay includes a multi-input pin for connecting to the circuit to be tested, a single-output pin for connecting to the programmable power supply 300, and an address pin for connecting to the IO address card 200; when receiving the address signal sent by the IO address card 200, the routing relay selects one of the multiple signals accessed from the multiple input pins as an input signal to be communicated. Furthermore, in this embodiment, the automatic detection device for micro-damage of the circuit interface includes two parallel-connected routing switches 500, single-path output pins of the two routing switches 500 are respectively connected with the positive electrode and the negative electrode of the programmable power supply 300, and the digital electric meter 400 is mounted across the connecting lines of the two single-path output pins and the programmable power supply 300, so that, through the two routing switches 500, the circuit selects two paths of tested signal nodes for testing at each time, and through combining different tested signal nodes (i.e., combining two interfaces in pairs), the measurement data volume is increased, which is beneficial to further improving the reliability of the measurement and analysis result.
Referring to fig. 3, in another embodiment, the apparatus for automatically detecting micro-damage of a circuit interface further includes a source measurement unit SMU600, wherein the programmable power supply 300 and the digital electric meter 400 are integrated in the source measurement unit SMU600, and the source measurement unit SMU600 is connected to the control host computer 100 and the routing switch 500, respectively. It can also be understood that, in this embodiment, the source measurement unit SMU600 is an alternative to the programmable power supply 300 and the digital electric meter 400, the source measurement unit SMU600 supports setting of a required current-voltage protection threshold value to prevent the circuit from being damaged due to excessive voltage or current excitation, and the source measurement unit SMU600 can simplify the wiring optimization test procedure, and simultaneously control and measure the voltage and the current through a single channel, thereby reducing the wiring and control difficulty of the device. Further, the automatic detection device for the micro-damage of the circuit interface further comprises a conversion joint 700 arranged between the circuit to be detected and the routing switch 500, so that the device can be ensured to be adaptively connected with various types of circuit interfaces to be detected.
Referring to fig. 4, the present invention also discloses a method for automatically detecting micro-damage of a circuit interface by using the device for automatically detecting micro-damage of a circuit interface, which comprises the following steps:
step S1: selects a golden machine and loads an interface pin configuration list and an excitation signal configuration list in the control host computer 100.
Step S2: the control host computer 100 traverses the interface pin configuration list and controls the routing switch 500 to connect each interface of the circuit to be tested one by one according to the address signal sent by the IO address card 200, and the control host computer 100 traverses the excitation signal configuration list and controls and adjusts the output of the programmable power supply 300 to switch different excitation signals one by one, and the digital electric meter 400 measures the voltage or current of the circuit under the combination of different interfaces and excitation signals.
Step S3: and (4) threshold setting, selecting a plurality of golden machines, repeating the steps S1 and S2, calculating the average measurement value of the plurality of golden machines, setting a plurality of different fluctuation amplification ratios, and setting a plurality of threshold ranges with different standards according to the fluctuation amplification ratios and the average measurement value.
Step S4: the prototype is selected, the interface pin configuration list and the excitation signal configuration list are loaded in the control host computer 100, and step S2 is repeated.
Step S5: and comparing the prototype measurement result with the threshold range of the prototype measurement to judge the damage condition of the circuit interface of the prototype.
Fig. 5 shows a flowchart of golden machine measurement, and it can be seen from the diagram that, before golden machine measurement, an interface pin configuration list and an excitation signal configuration list need to be loaded in the control host computer 100 in advance, where the interface pin configuration list includes a number of pin pairs that need to be measured in pairs, each pin pair includes a signal pin and a power or ground pin, the pin pair in this embodiment corresponds to "a combination of an interface and an excitation signal" in step S2, and during golden machine measurement, it needs to be switched to the pin pair that needs to be measured sequentially through the routing switch 500 to perform testing. The pin configuration list format is exemplified as follows:
the excitation signal configuration list comprises the excitation size of the current or voltage source and the protection threshold size of the circuit, which need to be loaded in sequence for each pair of pins to be measured. During measurement, after the current pin pair routing switch 500 is switched, excitation signals are sequentially loaded according to the corresponding excitation signal configuration list information of the pin pair, and feedback parameter measurement (namely, measurement voltage or current is fed back through the digital ammeter 400) is performed. Before the excitation is superimposed, the protection threshold parameter of the excitation needs to be set so as to prevent the circuit to be detected from being damaged when the circuit is abnormal.
The format of the excitation signal configuration list is exemplified as follows:
in one embodiment, step S2 further includes: after the digital electric meter 400 performs feedback measurement on one group of pin pairs under different excitations, the control host computer 100 controls the routing switch 500 to switch to the next group of pin pairs through the IO address card 200, controls the programmable power supply 300 to apply different excitations corresponding to the group of pin pairs one by one, and performs feedback measurement by the digital electric meter 400. Specifically, the control host computer 100 sequentially traverses the interface pin configuration list and the excitation signal configuration list in order to perform testing and record a measurement result, please refer to fig. 6, after the beginning of the golden machine measurement process, the control host computer 100 first sends an address signal to the routing switch 500 through the IO address card 200 to switch a pin pair, then different voltage or current excitations are applied to the pin pair one by one, after each voltage or current excitation is applied, the digital electric meter 400 feeds back the current or voltage of the measurement circuit, and the measured result value is stored in the control host computer 100. After each voltage or current excitation is switched, the control host computer 100 performs a judgment on data, that is, whether a last group of excitation values is needed or not is judged, if not, a next group of excitation values are continuously switched and current or voltage feedback measurement is performed, and if the last group of excitation values is performed, feedback measurement under all excitation values of the group of pin pairs is judged to be completed, so that a new address of the routing switch 500 is allocated through the IO address card 200 to be switched to a next pin pair, current or voltage under all excitation values of the next pin pair is measured until voltage or current measurement under the last group of excitation values of the last group of pin pairs corresponding to the last group of pin pairs is completed, and then testing of each interface of a tested circuit is finished.
It should be noted that, in the threshold setting step performed after the golden machine measurement, the threshold sorting step is to generate a comparison standard during the testing of the prototype through experience pre-judgment and the measurement result of the golden machine, and usually, the average value of the measurement result data of the golden machine can be used as an expected reference value, the parameter qualified range threshold of the tested prototype is set by amplifying the fluctuation range of the result data of the golden machine measured for multiple times according to a certain proportion, and different thresholds such as strict, common and loose can be set by adjusting different fluctuation amplification proportions.
Fig. 7 shows a flowchart of the prototype measurement, and it can be seen that the steps of the prototype measurement are the same as those of the prototype measurement, except that the object to be measured is a prototype. After the prototype measurement, the data needs to be compared, and the interface damage condition is judged. Specifically, the result data of the prototype measurement can be compared with an expected reference value and a threshold range set during the measurement of the golden machine, so that the degradation degree of the circuit of the prototype can be judged, the condition that the parameter deviates from the expected parameter to a certain extent can be judged to have micro damage, the condition that the parameter deviates more seriously can be judged to be serious damage, and specifically, the damage condition can be accurately judged by setting the deviation parameter, for example, the deviation between the parameter of the prototype and the expected parameter measured by the golden machine is within 3%, the result is judged to be micro damage, the deviation is more than 8%, the result is judged to be serious damage, and other damage judgment standards can be set, so that after the comparison of the measurement results of all pins is completed, the circuit of which pins has damage can be known.
The device and the method for automatically detecting the micro-damage of the circuit interface of the invention are implemented to control the host computer 100 to send an address signal to the routing switch 500 through the IO address card 200, so that the routing switches 500 switch to different interface connections with the circuit under test respectively according to the instructions, at the same time, the control host computer 100 controls the output of the programmable power supply 300 to adjust the excitation in the circuit, and drawing a volt-ampere characteristic curve according to the voltage or current feedback measurement value of each interface of the circuit to be tested under different excitation, comparing the prototype measurement value with the golden machine threshold to obtain the damage condition of the interface of the circuit to be tested, in the process, the damage condition of the circuit interface is judged by adopting the volt-ampere characteristic curve, and compared with the common parameter modes of only measuring the resistance, the capacitance, the diode conduction direction and the like of the interface, the damage condition of the circuit interface can be reflected more visually, and the reliability of the detection result is improved; according to the device and the method, all interface switching and excitation adjustment are adjusted by the control host computer 100, manual debugging and measurement are not needed, the circuit interface measurement difficulty is reduced, and the measurement efficiency is improved.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (8)
1. The automatic detection method for the micro-damage of the circuit interface is characterized by being used for an automatic detection device for the micro-damage of the circuit interface, wherein the automatic detection device for the micro-damage of the circuit interface comprises a control host computer, an IO address card, a programmable power supply and a digital electric meter which are respectively connected with the control host computer, and a route selection switch which is respectively connected with the IO address card and the programmable power supply, wherein a measuring end of the digital electric meter is arranged on a connecting line of the route selection switch and the programmable power supply, and the route selection switch is used for being connected with an interface of a detected circuit;
the control host computer controls the programmable power supply to output constant voltage or current and controls the IO address card to allocate an IO address to the routing switch when providing preset excitation to the routing switch so that the routing switch is connected with one interface of the tested circuit, the digital ammeter is used for measuring the voltage or current between the routing switch and the programmable power supply, the control host computer adjusts the output of the programmable power supply for multiple times to adjust the excitation, and a volt-ampere characteristic curve is drawn through the measured value of the digital ammeter;
the control host computer sets a golden machine threshold according to the measured golden machine volt-ampere characteristic curve, and analyzes the volt-ampere characteristic curve of the prototype machine through the golden machine threshold so as to judge the damage condition of the circuit interface; the method comprises the following steps:
step S1: selecting a golden machine, and loading an interface pin configuration list and an excitation signal configuration list in a control host computer;
step S2: the digital ammeter measures the voltage or current of a circuit under the combination of different interfaces and excitation signals;
step S3: setting a threshold, selecting a plurality of golden machines, repeating the steps S1 and S2, calculating the average measurement value of the plurality of golden machines, setting a plurality of different fluctuation amplification ratios, and setting a plurality of threshold ranges with different standards according to the fluctuation amplification ratios and the average measurement value;
step S4: selecting a prototype, loading an interface pin configuration list and an excitation signal configuration list in a control host computer, and repeating the step S2;
step S5: and comparing the prototype measurement result with the threshold range of the prototype measurement to judge the damage condition of the circuit interface of the prototype.
2. The method according to claim 1, wherein the interface pin configuration list includes a number of pin pair numbers to be measured in pairs, each pin pair including a signal pin and a power or ground pin.
3. The method according to claim 2, wherein the excitation signal configuration list includes an excitation magnitude of a current or voltage source and a protection threshold magnitude of a circuit, which are required to be sequentially loaded to each pair of pins to be measured.
4. The method for automatically detecting micro-damage of a circuit interface according to claim 3, wherein the step S2 further comprises: after the digital electric meter performs feedback measurement on one group of pin pairs under different excitations, the control host computer controls the routing switch to be switched to the next group of pin pairs for connection through the IO address card, controls the programmable power supply to apply different excitations corresponding to the group of pin pairs one by one, and performs feedback measurement through the digital electric meter.
5. The method according to claim 4, wherein the routing switch is a routing relay, and the routing relay includes a multi-input pin for connecting with a circuit to be tested and a single-output pin for connecting with a programmable power supply; when the routing relay receives the address signal sent by the IO address card, one path of signal is selected from the multiple paths of signals accessed by the multiple paths of input pins to serve as an input signal to be communicated.
6. The method according to claim 5, wherein the automatic detection device for micro-damage of circuit interface comprises two parallel routing switches.
7. The method as claimed in claim 6, wherein the apparatus further comprises a source measurement unit SMU, the programmable power supply and the digital electric meter are integrated with the source measurement unit SMU, and the source measurement unit SMU is respectively connected to the control host computer and the routing switch.
8. The method according to claim 7, wherein the device further comprises a switch disposed between the circuit to be tested and the routing switch.
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Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4646299A (en) * | 1983-08-01 | 1987-02-24 | Fairchild Semiconductor Corporation | Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits |
| US5578927A (en) * | 1993-12-09 | 1996-11-26 | Saft | Measurement circuit for a modular system of cells electrically connected in series, in particular for electrical accumlator batteries |
| WO1999010769A1 (en) * | 1997-08-28 | 1999-03-04 | E-Ink Corporation | Applications for encapsulated electrophoretic displays |
| EP1701174A1 (en) * | 2005-03-11 | 2006-09-13 | Agilent Technologies, Inc. | Pin electronic for usage in an automatic test equipment for testing integrated circuits |
| CN101937037A (en) * | 2009-07-01 | 2011-01-05 | 哈尔滨建成集团有限公司 | Device for automatically testing performance of cable bunch |
| CN103645432A (en) * | 2013-09-25 | 2014-03-19 | 临安科泰通信科技有限公司 | Signal reproduction type integrated circuit board failure detection device |
| CN104614613A (en) * | 2015-02-02 | 2015-05-13 | 深圳市中科源电子有限公司 | Alternating current parameter monitoring aging test system and finished product lamp aging test system |
| CN104730444A (en) * | 2015-04-16 | 2015-06-24 | 顺德职业技术学院 | Multifunctional LED lamp test machine |
| CN106597247A (en) * | 2016-12-29 | 2017-04-26 | 西北核技术研究所 | Measuring system for volt-ampere characteristic curve of radiation effect semiconductor device based on four-probe method |
| CN108318780A (en) * | 2017-12-26 | 2018-07-24 | 北京航天测控技术有限公司 | A kind of testing lines system that distribution channel is expansible |
| CN207731150U (en) * | 2017-12-28 | 2018-08-14 | 深圳市永达电子信息股份有限公司 | Industrial system signal of communication detecting system |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6940271B2 (en) * | 2001-08-17 | 2005-09-06 | Nptest, Inc. | Pin electronics interface circuit |
| CN108303640B (en) * | 2016-01-25 | 2020-06-05 | 深圳睿晟自动化技术有限公司 | Line detection method and device |
| CN106526303B (en) * | 2016-10-27 | 2019-11-01 | 中国西电电气股份有限公司 | A kind of the C-V characteristic test device and method of solid decoupling device |
| CN108267682B (en) * | 2016-12-30 | 2020-07-28 | 杭州广立微电子有限公司 | High-density test chip, test system and test method thereof |
| US20210181252A1 (en) * | 2019-12-16 | 2021-06-17 | Celerint, Llc | Method for semiconductor device interface circuitry functionality and compliance testing |
| CN113625148A (en) * | 2020-05-06 | 2021-11-09 | 天芯互联科技有限公司 | Chip aging detection method, system, equipment and computer storage medium |
-
2021
- 2021-12-20 CN CN202111561703.8A patent/CN113960456B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4646299A (en) * | 1983-08-01 | 1987-02-24 | Fairchild Semiconductor Corporation | Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits |
| US5578927A (en) * | 1993-12-09 | 1996-11-26 | Saft | Measurement circuit for a modular system of cells electrically connected in series, in particular for electrical accumlator batteries |
| WO1999010769A1 (en) * | 1997-08-28 | 1999-03-04 | E-Ink Corporation | Applications for encapsulated electrophoretic displays |
| EP1701174A1 (en) * | 2005-03-11 | 2006-09-13 | Agilent Technologies, Inc. | Pin electronic for usage in an automatic test equipment for testing integrated circuits |
| CN101937037A (en) * | 2009-07-01 | 2011-01-05 | 哈尔滨建成集团有限公司 | Device for automatically testing performance of cable bunch |
| CN103645432A (en) * | 2013-09-25 | 2014-03-19 | 临安科泰通信科技有限公司 | Signal reproduction type integrated circuit board failure detection device |
| CN104614613A (en) * | 2015-02-02 | 2015-05-13 | 深圳市中科源电子有限公司 | Alternating current parameter monitoring aging test system and finished product lamp aging test system |
| CN104730444A (en) * | 2015-04-16 | 2015-06-24 | 顺德职业技术学院 | Multifunctional LED lamp test machine |
| CN106597247A (en) * | 2016-12-29 | 2017-04-26 | 西北核技术研究所 | Measuring system for volt-ampere characteristic curve of radiation effect semiconductor device based on four-probe method |
| CN108318780A (en) * | 2017-12-26 | 2018-07-24 | 北京航天测控技术有限公司 | A kind of testing lines system that distribution channel is expansible |
| CN207731150U (en) * | 2017-12-28 | 2018-08-14 | 深圳市永达电子信息股份有限公司 | Industrial system signal of communication detecting system |
Non-Patent Citations (2)
| Title |
|---|
| Peta-pico-Voltron: An open-source high voltage power supply;SamuelSchlatter 等;《HardwareX》;20181031;第4卷;e00039 * |
| 基于DSP和CPLD的有源滤波器数据采集***设计;李鹏 等;《测控技术》;20120518;第31卷(第5期);73-76 * |
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