CN113945735A - Testing fixture device and method for chip tantalum electrolytic capacitor processing laboratory - Google Patents
Testing fixture device and method for chip tantalum electrolytic capacitor processing laboratory Download PDFInfo
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- CN113945735A CN113945735A CN202111219005.XA CN202111219005A CN113945735A CN 113945735 A CN113945735 A CN 113945735A CN 202111219005 A CN202111219005 A CN 202111219005A CN 113945735 A CN113945735 A CN 113945735A
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- electrolytic capacitor
- connecting sleeve
- test fixture
- tantalum electrolytic
- fixture device
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- 238000012360 testing method Methods 0.000 title claims abstract description 32
- 239000003990 capacitor Substances 0.000 title claims abstract description 20
- 229910052715 tantalum Inorganic materials 0.000 title claims abstract description 20
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 title claims abstract description 20
- 238000012545 processing Methods 0.000 title claims abstract description 18
- 238000000034 method Methods 0.000 title claims abstract description 14
- 238000006243 chemical reaction Methods 0.000 claims abstract description 20
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 15
- 238000003466 welding Methods 0.000 claims abstract description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 46
- 230000005611 electricity Effects 0.000 claims description 11
- 238000005259 measurement Methods 0.000 claims description 6
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 229920001971 elastomer Polymers 0.000 claims description 3
- 230000001050 lubricating effect Effects 0.000 claims description 3
- 229920002635 polyurethane Polymers 0.000 claims description 3
- 239000004814 polyurethane Substances 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims 5
- 239000010949 copper Substances 0.000 claims 5
- 230000000694 effects Effects 0.000 claims 1
- 238000009434 installation Methods 0.000 abstract description 5
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000005489 elastic deformation Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
The invention discloses a test fixture device and a test fixture method for a chip tantalum electrolytic capacitor processing laboratory, wherein the test fixture device comprises an installation plate and is characterized in that: the test device comprises a mounting plate, wherein slots are uniformly formed in the mounting plate, articles to be detected are uniformly mounted on one sides of the slots, chuck devices are respectively arranged at two ends of the articles to be detected, one end of each chuck device is connected with a test instrument through a wire, each chuck device comprises a shell, through holes are correspondingly formed in two sides of the shell, the cross section of each through hole is square, a conversion head is sleeved in one end of the shell, one side of each conversion head is correspondingly and movably hinged with a clamping head, a conductive end is fixed on one side of each clamping head through welding, a graphite core is fixed on one side of each conversion head through a bolt, accommodating grooves are correspondingly formed in two sides of the graphite core, springs are correspondingly fixed on the inner walls of the accommodating grooves through welding, and a conical block is mounted at one end of each spring.
Description
Technical Field
The invention relates to the technical field of tantalum electrolytic capacitors, in particular to a test fixture device and a test method for a chip tantalum electrolytic capacitor processing laboratory.
Background
When testing the tantalum electrolytic capacitor, the positive clamping jaw and the negative clamping jaw of the instrument need to be replaced one by one to a connecting line led out by a product to be measured, and then the measuring is read. Therefore, it is necessary to design a testing fixture device and a testing method for a chip tantalum electrolytic capacitor processing laboratory, which have high practicability.
Disclosure of Invention
The invention aims to provide a test fixture device and a test fixture method for a chip tantalum electrolytic capacitor processing laboratory, which aim to solve the problems in the background technology.
In order to solve the technical problems, the invention provides the following technical scheme: a test fixture device and method for a chip tantalum electrolytic capacitor processing laboratory comprise an installation plate, and are characterized in that: the mounting plate is evenly provided with a slot, one side of the slot is evenly provided with an article to be detected, two ends of the article to be detected are respectively provided with a chuck device, and one end of the chuck device is connected with a test instrument through a wire.
According to the technical scheme, the chuck device comprises a shell, through holes are correspondingly formed in two sides of the shell, the cross section of each through hole is square, a conversion head is sleeved inside one end of the shell, one side of the conversion head is movably hinged to a clamping head correspondingly, and a conductive end is fixed on one side of the clamping head through welding.
According to the technical scheme, one side of the conversion head is fixed with a graphite core through a bolt, the two sides of the graphite core are correspondingly provided with accommodating grooves, the inner wall of each accommodating groove is correspondingly fixed with a spring through welding, a conical block is installed at one end of each spring and penetrates through the through holes, the number of the springs is two, and the springs are correspondingly distributed at the long ends and the short ends of the conical blocks.
According to the technical scheme, one side of the clamping head is hinged with the supporting rod, the supporting rod is electrically connected with the clamping head, one end of the clamping head is hinged with the front copper wire, one end of the front copper wire is provided with the rear copper wire, and the front copper wire is connected with the rear copper wire.
According to the technical scheme, one end of the front copper wire is connected with the first connecting sleeve, one end of the rear copper wire is connected with the second connecting sleeve, and the first connecting sleeve and the second connecting sleeve are of a matched structure.
According to the technical scheme, an access hole is formed in one side of the first connecting sleeve, an outer arc edge is formed in the inner wall of the access hole in an inward extending mode, an annular body is formed in one side of the second connecting sleeve, an arc-shaped body is correspondingly fixed to one side of the annular body in a welded mode and protrudes out of the outer wall of the annular body, the turning radius of the arc-shaped body is the same as that of the outer arc edge, and the radius of the access hole is the same as the outer diameter of the annular body.
According to the technical proposal, the device comprises a base,
s1, clamping the end of the to-be-detected article by the clamping head, and connecting the conductive end with electricity;
s2, mounting the conversion head on the shell when assembling, and aligning the first connecting sleeve with the second connecting sleeve;
s3, during measurement, the rotating arc-shaped body is attached to the access hole, and at the moment, the electric conduction can be carried out;
s4, aligning the arc-shaped body with the outer arc edge at a half position when the measurement is finished, wherein the arc-shaped body cannot conduct electricity at the half position, but the arc-shaped body and the outer arc edge are still connected;
s5, when the cable is disassembled, the conical block is inwards extruded, the rear copper wire is rotated by ninety degrees to separate the first connecting sleeve from the second connecting sleeve, and the rear copper wire is pulled rightwards, so that the disassembly of the cable can be completed;
s6, when the clamping head is replaced, the conical block is pressed inwards, and the shell can be drawn out.
According to the technical scheme, the number of the to-be-detected articles is four, the two ends of the to-be-detected articles are respectively provided with the positive electrode and the negative electrode, the rear copper wire positioned at the left end is electrically connected with the positive electrode, and the rear copper wire positioned at the right end is electrically connected with the negative electrode.
According to the technical scheme, the polyurethane lubricating coating is uniformly coated on the surface of the graphite core.
According to the technical scheme, the shell is made of elastic rubber.
Compared with the prior art, the invention has the following beneficial effects: according to the invention, the mounting plate normally used in a laboratory is provided with the matched slot, then the terminal connecting wire is led out, and the chuck device and the test instrument necklace are used, so that the clamp is high in speed, time is saved, accuracy can be improved, and the operation is convenient.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
FIG. 1 is a schematic overall view of the present invention;
FIG. 2 is a schematic view of the chuck assembly of the present invention;
FIG. 3 is a schematic view of the installation of the first connecting sleeve and the second connecting sleeve of the present invention;
FIG. 4 is a partial schematic view of a first connection sleeve and a second connection sleeve of the present invention;
in the figure: 1. testing the instrument; 2. a chuck device; 3. detecting a product to be detected; 4. mounting a plate; 21. a clamping head; 211. a conductive terminal; 22. a strut; 23. a conversion head; 24. a front copper wire; 241. a first connecting sleeve; 25. a back copper wire; 251. a second connecting sleeve; 26. a graphite core; 27. a conical block; 28. a containing groove; 281. a spring; 29. a housing; 2411. an access hole; 2412. an outer arc edge; 2511. an annular body; 2512. an arc-shaped body.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-4, the present invention provides the following technical solutions: a test fixture device and method for a chip tantalum electrolytic capacitor processing laboratory comprise a mounting plate 4, and are characterized in that: the mounting plate 4 is uniformly provided with slots, one side of each slot is uniformly provided with an article to be detected 3, two ends of each article to be detected 3 are respectively provided with a chuck device 2, one end of each chuck device 2 is connected with a test instrument 1 through a wire, the article to be detected 3 can be detected through the chuck devices 2, the mounting plate which is normally used in a laboratory is matched with the slots, then terminal connecting wires are led out, and the clamp is high in speed, time-saving, high in accuracy and convenient to operate through the chuck devices and test instrument necklaces;
the chuck device 2 comprises a shell 29, through holes are correspondingly formed in two sides of the shell 29, the cross section of each through hole is square, a conversion head 23 is sleeved in one end of the shell 29, a clamping head 21 is movably hinged to one side of the conversion head 23 correspondingly, a conductive end 211 is fixed to one side of the clamping head 21 through welding, the angle of the clamping head 21 can be changed through drawing the rear part, clamping and loosening are achieved, operation is simple and convenient, an article 3 to be detected does not need to be approached, and safety of operators is guaranteed;
a graphite core 26 is fixed on one side of the conversion head 23 through a bolt, accommodating grooves 28 are correspondingly formed in two sides of the graphite core 26, springs 281 are correspondingly fixed on the inner walls of the accommodating grooves 28 through welding, a conical block 27 is installed at one end of each spring 281, the conical blocks 27 penetrate through the through holes, the number of the springs 281 is two, the springs 281 are correspondingly distributed at the long end and the short end of each conical block 27, the graphite core 26 can be connected with high lubricity due to softness, sparks cannot occur due to friction static electricity during installation, the conical blocks 27 can be made to extend into the through holes through inward extrusion, the shell 29 at the rear side can be replaced conveniently, integral disassembly is not needed, and repeated assembly is not needed due to convenient disassembly;
a supporting rod 22 is hinged to one side of the clamping head 21, the supporting rod 22 is electrically connected with the clamping head 21, a front copper wire 24 is hinged to one end of the clamping head 21, a rear copper wire 25 is arranged at one end of the front copper wire 24, the front copper wire 24 is connected with the rear copper wire 25, and electric conduction is achieved through the front copper wire 24 and the rear copper wire 25;
one end of the front copper wire 24 is connected with a first connecting sleeve 241, one end of the rear copper wire 25 is connected with a second connecting sleeve 251, the first connecting sleeve 241 and the second connecting sleeve 251 are in a matching structure, the rear copper wire 25 and the front copper wire 24 are connected with the second connecting sleeve 251 through the first connecting sleeve 241, and the mounting and the dismounting are more convenient;
an access hole 2411 is formed in one side of the first connecting sleeve 241, an outer arc edge 2412 is formed in the inward extending mode of the inner wall of the access hole 2411, an annular body 2511 is formed in one side of the second connecting sleeve 251, an arc body 2512 is correspondingly fixed to one side of the annular body 2511 in a welding mode, the arc body 2512 protrudes out of the outer wall of the annular body 2511, the turning radius of the arc body 2512 is the same as that of the outer arc edge 2412, the radius of the access hole 2411 is the same as the outer diameter of the annular body 2511, when the turning radius of the arc body 2512 and the outer arc edge 2412 turn to the coinciding position, the connection between the arc body and the outer arc edge 2412 can be kept unbroken, the arc body and the outer arc edge can conduct electricity, when the arc body and the outer arc edge 2412 rotate to the half position, electricity cannot be conducted due to the fact that a contact point is too small, the connection between the arc body and the outer arc edge 2412 cannot be conducted, resistance can be flexibly adjusted, and continuous physical connection cannot be guaranteed when the arc body and the outer arc body are completely rotated;
the method comprises the following specific steps:
s1, clamping the end of the to-be-detected product 3 by the clamping head 21, and connecting the conductive end 211 with electricity;
s2, mounting the conversion head 23 on the shell 29 when assembling, and aligning the first connecting sleeve 241 with the second connecting sleeve 251;
s3, during measurement, the rotating arc 2512 is attached to the access hole 2411, and at the moment, electric conduction can be performed;
s4, aligning the arc-shaped body 2512 with the outer arc edge 2412 at a half position when the measurement is finished, wherein the arc-shaped body and the outer arc edge 2412 cannot conduct electricity at the moment, but are still connected;
s5, when the electric wire is disassembled, the conical block 27 is pressed inwards, the rear copper wire 25 rotates ninety degrees, the first connecting sleeve 241 is separated from the second connecting sleeve 251, and the rear copper wire 25 is pulled rightwards, so that the electric wire can be disassembled;
s6, when the clamping head 241 is replaced, the conical block 27 is extruded inwards, and the shell 29 can be drawn out, the method can realize three states of detection, installation connection and disconnection, the copper wire 25 can be rotated only, and the state switching is convenient;
the number of the products to be detected 3 is four, the two ends of each product to be detected 3 are respectively provided with a positive electrode and a negative electrode, the rear copper wire 25 positioned at the left end is electrically connected with the positive electrode, the rear copper wire 25 positioned at the right end is electrically connected with the negative electrode, and the conductivity tests of multiple point positions can be realized by arranging a plurality of groups;
the surface of the graphite core is uniformly coated with a polyurethane lubricating coating, so that the sliding smoothness of the graphite core is improved, and the service life of the graphite core is prolonged;
the shell 29 is made of elastic rubber, so that the shell 29 has high elastic deformation capacity and is flexible to use.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. The utility model provides a test fixture device of piece formula tantalum electrolytic capacitor processing laboratory, includes mounting panel (4), its characterized in that: evenly be provided with the slot on mounting panel (4), one side of slot is evenly installed and is detected article (3), the both ends that detect article (3) are provided with chuck device (2) respectively, the one end of chuck device (2) is connected with test instrument (1) through the wire.
2. The test fixture device of the chip tantalum electrolytic capacitor processing laboratory according to claim 1, wherein: chuck device (2) include shell (29), the through-hole has been seted up to the both sides correspondence of shell (29), the cross section of through-hole is square, conversion head (23) have been cup jointed to the one end inside of shell (29), one side of conversion head (23) corresponds the activity and articulates there is clamping head (21), one side of clamping head (21) is through welded fastening has electrically conductive end (211).
3. The test fixture device of the chip tantalum electrolytic capacitor processing laboratory according to claim 2, wherein: the utility model discloses a conversion head, including conversion head (23), conversion head, spring (281), conical block (27) are installed to the one end of spring (281), conversion head (23) and spring (281), conversion head's (26) one side is passed through the bolt fastening and is had graphite core (26), storage tank (28) have been seted up to the both sides correspondence of graphite core (26), the inner wall correspondence of storage tank (28) has spring (281) through welded fastening, conical block (27) are installed to the one end of spring (281), conical block (27) pass the through-hole, the quantity of spring (281) is two, and spring (281) correspond the long-end and the short-end that distribute at conical block (27).
4. The test fixture device of the chip tantalum electrolytic capacitor processing laboratory according to claim 3, wherein: one side of holding head (21) articulates there is branch (22), branch (22) are connected with holding head (21) electricity, the one end of holding head (21) articulates there is preceding copper line (24), the one end of preceding copper line (24) is provided with back copper line (25), preceding copper line (24) are connected with back copper line (25).
5. The test fixture device of the chip tantalum electrolytic capacitor processing laboratory according to claim 4, wherein: one end of the front copper wire (24) is connected with a first connecting sleeve (241), one end of the rear copper wire (25) is connected with a second connecting sleeve (251), and the first connecting sleeve (241) and the second connecting sleeve (251) are of a matching structure.
6. The test fixture device of the chip tantalum electrolytic capacitor processing laboratory according to claim 5, wherein: an access hole (2411) is formed in one side of the first connecting sleeve (241), an outer arc edge (2412) is formed in the inward extending mode of the inner wall of the access hole (2411), an annular body (2511) is formed in one side of the second connecting sleeve (251), an arc-shaped body (2512) is correspondingly fixed to one side of the annular body (2511) through welding, the arc-shaped body (2512) protrudes out of the outer wall of the annular body (2511), the turning radius of the arc-shaped body (2512) is identical to that of the outer arc edge (2412), and the radius of the access hole (2411) is identical to the outer diameter of the annular body (2511).
7. The use method of the test fixture device of the chip tantalum electrolytic capacitor processing laboratory according to claim 6, characterized in that: the method comprises the following specific steps:
s1, clamping the end of the to-be-detected product (3) by the clamping head (21), and connecting the conductive end (211) with electricity;
s2, mounting the conversion head (23) on the shell (29) when assembling, and aligning the first connecting sleeve (241) with the second connecting sleeve (251);
s3, attaching the rotating arc body (2512) to the access hole (2411) during measurement, and conducting electricity at the time;
s4, aligning the arc rotating body (2512) and the outer arc edge (2412) to a half position when the measurement is finished, wherein the arc rotating body and the outer arc edge cannot conduct electricity at the moment, but are still connected;
s5, when the electric wire is disassembled, the conical block (27) is inwards extruded, the rear copper wire (25) is rotated by ninety degrees to separate the first connecting sleeve (241) from the second connecting sleeve (251), and the rear copper wire (25) is pulled rightwards, so that the electric wire can be disassembled;
s6, when the clamping head (241) is replaced, the conical block (27) is pressed inwards, and the shell (29) can be drawn out.
8. The test fixture device of the chip tantalum electrolytic capacitor processing laboratory according to claim 6, wherein: the number of the to-be-detected articles (3) is four, the two ends of the to-be-detected articles (3) are respectively provided with a positive pole and a negative pole, the rear copper wire (25) located at the left end is electrically connected with the positive pole, and the rear copper wire (25) located at the right end is electrically connected with the negative pole.
9. The test fixture device of the chip tantalum electrolytic capacitor processing laboratory according to claim 6, wherein: the surface of the graphite core (26) is uniformly coated with a polyurethane lubricating coating.
10. The test fixture device of the chip tantalum electrolytic capacitor processing laboratory according to claim 6, wherein: the shell (29) is made of elastic rubber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111219005.XA CN113945735B (en) | 2021-10-20 | Test fixture device and method for chip tantalum electrolytic capacitor machining laboratory |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111219005.XA CN113945735B (en) | 2021-10-20 | Test fixture device and method for chip tantalum electrolytic capacitor machining laboratory |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113945735A true CN113945735A (en) | 2022-01-18 |
| CN113945735B CN113945735B (en) | 2024-07-26 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115542134A (en) * | 2022-11-30 | 2022-12-30 | 镇江矽佳测试技术有限公司 | High-precision testing device for integrated circuit |
Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE20107526U1 (en) * | 2000-05-03 | 2001-08-30 | Cascade Microtech, Inc., Beaverton, Oreg. | Rotatable indexing chuck for a test station |
| US6416352B1 (en) * | 1997-04-09 | 2002-07-09 | Channell Limited | Telecommunication apparatus test module with deflectable circuit switching contact |
| JP2008102035A (en) * | 2006-10-19 | 2008-05-01 | Hioki Ee Corp | Clamp tester |
| JP2009079905A (en) * | 2007-09-25 | 2009-04-16 | Espec Corp | Evaluation testing tool and evaluation testing electrode for electronic component |
| CN201749983U (en) * | 2010-07-28 | 2011-02-16 | 北京固融科技有限公司 | Rotary type electric connecting device, and plug, socket and plug board thereof |
| KR200456459Y1 (en) * | 2010-08-16 | 2011-11-01 | 이-창 우 | Rotary Electrical Connector |
| CN103399178A (en) * | 2013-08-06 | 2013-11-20 | 天津大学 | High temperature testing fixture of chip capacitor |
| CN208043876U (en) * | 2018-02-16 | 2018-11-02 | 深圳供电局有限公司 | Relay protection connecting wire device |
| CN112363006A (en) * | 2020-10-10 | 2021-02-12 | 安徽晶谷周界微电子股份有限公司 | Batch test fixture for high-temperature aging system of capacitor |
| CN213464989U (en) * | 2020-06-29 | 2021-06-18 | 上海市肺科医院 | Limb anesthesia intensity detection device |
| CN213633528U (en) * | 2020-11-30 | 2021-07-06 | 山东工业职业学院 | Experimental supplementary termination of electrical equipment |
| CN113075513A (en) * | 2021-04-01 | 2021-07-06 | 厦门启舞贸易有限公司 | Device for detecting insulativity of wire insulating layer |
| CN213903746U (en) * | 2020-11-30 | 2021-08-06 | 国网江西省电力有限公司南昌供电分公司 | Sampling head for detecting off-line or open circuit of storage battery pack |
| CN214067327U (en) * | 2020-12-29 | 2021-08-27 | 西安硕拓电子科技有限公司 | Chip testing device convenient to maintain |
Patent Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6416352B1 (en) * | 1997-04-09 | 2002-07-09 | Channell Limited | Telecommunication apparatus test module with deflectable circuit switching contact |
| DE20107526U1 (en) * | 2000-05-03 | 2001-08-30 | Cascade Microtech, Inc., Beaverton, Oreg. | Rotatable indexing chuck for a test station |
| JP2008102035A (en) * | 2006-10-19 | 2008-05-01 | Hioki Ee Corp | Clamp tester |
| JP2009079905A (en) * | 2007-09-25 | 2009-04-16 | Espec Corp | Evaluation testing tool and evaluation testing electrode for electronic component |
| CN201749983U (en) * | 2010-07-28 | 2011-02-16 | 北京固融科技有限公司 | Rotary type electric connecting device, and plug, socket and plug board thereof |
| KR200456459Y1 (en) * | 2010-08-16 | 2011-11-01 | 이-창 우 | Rotary Electrical Connector |
| CN103399178A (en) * | 2013-08-06 | 2013-11-20 | 天津大学 | High temperature testing fixture of chip capacitor |
| CN208043876U (en) * | 2018-02-16 | 2018-11-02 | 深圳供电局有限公司 | Relay protection connecting wire device |
| CN213464989U (en) * | 2020-06-29 | 2021-06-18 | 上海市肺科医院 | Limb anesthesia intensity detection device |
| CN112363006A (en) * | 2020-10-10 | 2021-02-12 | 安徽晶谷周界微电子股份有限公司 | Batch test fixture for high-temperature aging system of capacitor |
| CN213633528U (en) * | 2020-11-30 | 2021-07-06 | 山东工业职业学院 | Experimental supplementary termination of electrical equipment |
| CN213903746U (en) * | 2020-11-30 | 2021-08-06 | 国网江西省电力有限公司南昌供电分公司 | Sampling head for detecting off-line or open circuit of storage battery pack |
| CN214067327U (en) * | 2020-12-29 | 2021-08-27 | 西安硕拓电子科技有限公司 | Chip testing device convenient to maintain |
| CN113075513A (en) * | 2021-04-01 | 2021-07-06 | 厦门启舞贸易有限公司 | Device for detecting insulativity of wire insulating layer |
Non-Patent Citations (1)
| Title |
|---|
| 李正等: "电容储能螺柱焊在数字阵列模块加工中的应用", 《电子工艺技术》, vol. 40, no. 03, 31 May 2019 (2019-05-31), pages 168 - 170 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115542134A (en) * | 2022-11-30 | 2022-12-30 | 镇江矽佳测试技术有限公司 | High-precision testing device for integrated circuit |
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