CN113945134B - Zero drift measuring device and method for sliding micrometer - Google Patents
Zero drift measuring device and method for sliding micrometer Download PDFInfo
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- CN113945134B CN113945134B CN202111226436.9A CN202111226436A CN113945134B CN 113945134 B CN113945134 B CN 113945134B CN 202111226436 A CN202111226436 A CN 202111226436A CN 113945134 B CN113945134 B CN 113945134B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses a zero drift measuring device of a sliding micrometer, belonging to the technical field of rock engineering detecting instruments, comprising a laserThe base of the optical distance measuring instrument is provided with a measuring tube, the end of the measuring tube is opposite to the transmitting end of the laser distance measuring instrument, the measuring tube is provided with two measuring rings with adjustable intervals, the middle position of each measuring ring is provided with an installation part for installing a reflecting device, the reflecting device can reflect laser to the receiving end of the laser distance measuring instrument, and the base is provided with a fine adjustment mechanism for adjusting the axial position of a probe of the sliding micrometer in the measuring tube; also discloses a zero drift measuring method of the sliding micrometer, S1, placing a measuring device and standing for 24 hours; s2, adjusting the standard distance of the two measuring rings to be 1m through a laser range finder; s3, adjusting the probe to a proper position in the measuring tube through a fine adjustment mechanism; and obtaining the actual distance L between the two measuring rings when the computer display of the micrometer is 1 2 ‑L 1 Finally obtaining a zero drift value L 2 ‑L 1 1, so as to correct the data measured by the actual project and obtain the real distance measurement.
Description
Technical Field
The invention relates to the technical field of rock engineering detecting instruments, in particular to a zero drift measuring device of a sliding micrometer and a measuring method thereof.
Background
The sliding micrometer is a common device for monitoring the deformation of the surrounding rock, the whole set of device consists of a probe, a cable, a guide rod and a matched reading computer (secondary instrument), the probe is extended to the bottom of a surrounding rock measuring hole under the control of the measuring rod, the probe can measure the distance between two copper rings on the measuring hole, the standard distance of the copper rings is 1m, certain errors exist, the deformation between the two copper rings can be measured section by gradually lifting the probe, and then the final deformation result can be obtained after the deformation of each section is accumulated. In engineering practice, during the long-term use of the monitoring equipment, the conditions of probe wear length change, electronic component performance change, instrument efficacy reduction and the like are inevitably generated, and the factors can cause the error of the whole sliding micrometer measuring system for the standard length (1 m), namely the zero drift phenomenon. If there is zero drift, the measurement result will cause error amplification when added segment by segment, and the measurement result will be seriously distorted. Therefore, the relevant regulatory regulations require regular certification of such monitoring instruments, secondary meters. However, the precision of the whole set of sliding side micrometer is very high, the difficulty of maintenance is very high, once the sliding side micrometer is detected to have the zero drift problem, the final processing mode is usually only to replace the whole set of system, so that the cost is very high, and if the specific zero drift value can be measured, after each section of measurement result is obtained by using the sliding side micrometer, the measurement result is subtracted or added with the measured zero drift to obtain real measurement data, so that the sliding side micrometer can be continuously used, and the cost is reduced.
However, at present, the detection of the slide micrometer in China still remains whether the slide micrometer can carry out measurement, and the measurement of the specific zero drift value of the slide micrometer still remains a blank. The invention patent with the patent number of '201910971697. X' and the name of 'a calibrating device and a calibrating method for a sliding micrometer' discloses a device and a method for determining whether the current state of a probe of the sliding micrometer can be measured and whether the length of the probe changes, wherein the device comprises a shell, a measuring tube, two measuring rings, a humidity-temperature meter, a guide structure, a clamp and a transmission assembly, the two measuring rings are arranged on the measuring tube, the distance value between the two measuring rings is equal to the standard length of the probe, and after the probe of the sliding micrometer extends into the measuring tube and is positioned at the central position between the two measuring rings, the temperature, the humidity and the humidity measured by the humidity-temperature meter on a display screen of a computer are read, and the actual measured value on the display screen is a first distance value, the probe can be determined whether the probe adapts to the environment and whether the length of the probe changes. However, the above patent still can only judge whether the probe length has changed, and cannot determine what the specific zero value of the slide micrometer is, and the zero drift of the slide micrometer is generated, and not only because whether the probe has changed, often the conditions such as the performance change of electronic elements, the efficiency reduction of instruments and the like cause the zero drift problem of the slide micrometer, so only the change of the probe length is absorbed, in the actual use process, the probe determination can be carried out, but the finally measured data has a larger error problem.
Disclosure of Invention
The invention aims to solve the technical problems and provides a zero drift measuring device and a zero drift measuring method of a sliding micrometer.
In order to achieve the purpose, the invention provides the following scheme: the invention provides a zero drift measuring device of a sliding micrometer, which comprises a base provided with a laser range finder, wherein a measuring tube with the end head facing to the transmitting end of the laser range finder is arranged on the base, two measuring rings with adjustable intervals are arranged on the measuring tube, an installation part for installing a reflecting device is arranged in the middle of each measuring ring, the reflecting device can reflect laser to the receiving end of the laser range finder, and a fine adjustment mechanism for adjusting the axial position of a probe of the sliding micrometer in the measuring tube is arranged on the base.
Preferably, the laser range finder includes that the top is equipped with the shell of display screen, be equipped with signal processor in the shell, signal processor both ends are connected with laser emitter and light source receiver respectively, be equipped with on the shell respectively with laser emitter the corresponding transmission mouth of light source receiver, receiving port.
Preferably, condenser lenses are arranged between the laser transmitter and the transmitting opening, and between the light source receiver and the receiving opening.
Preferably, the measuring ring is in threaded connection with the measuring pipe.
Preferably, the measuring tube is provided with scale marks, and the end heads on the same side of the two measuring rings are provided with mark lines matched with the scale marks.
Preferably, the precision of the thread on the measuring tube and the measuring ring and the precision of the scale mark are both 1mm.
Preferably, the mounting portion includes an annular groove located in the middle of the measuring ring, and the light reflecting device includes a metal buckle capable of being clamped on the annular groove and a light reflecting plate rotatably connected to the metal buckle.
Preferably, the fine adjustment mechanism comprises a guide assembly, a traction assembly and a transmission assembly, the guide assembly comprises a fixed seat and a guide rod, the guide rod is fixed on the base through the fixed seat, and the guide rod is parallel to the axial direction of the measuring tube; the traction assembly comprises a connecting rod detachably connected with the probe of the sliding micrometer, the connecting rod is coaxially connected with the probe of the sliding micrometer, and the connecting rod is connected to the guide rod in a sliding mode through an adjusting sliding block; the transmission assembly comprises a fine adjustment fixing part and a threaded connection, wherein the fine adjustment fixing part and the threaded connection are fixedly connected to the fixing seat, an adjusting threaded rod is arranged on the fine adjustment fixing part, one end of the adjusting threaded rod is in threaded connection with the adjusting slide block, and a hand wheel is installed at the other end of the adjusting threaded rod.
Preferably, the connecting rod is connected with the probe of the slide micrometer through a buckle.
The zero drift measuring device adopting the sliding micrometer comprises the following steps:
s1, placing a base of the measuring device on a table top of a laboratory, and standing for 24 hours in a laboratory environment;
s2, firstly, the reflecting device is installed on a measuring ring close to one side of the laser range finder, then the laser range finder is started, laser emitted by the emitting end is reflected to the receiving end through the reflecting device, and the distance L from the reflecting device to the emitting end is measured 1 Then the reflecting device is arranged on another measuring ring, and the distance L from the reflecting device to the transmitting end is measured 2 Then moving the measuring ring with the reflecting device until L is enabled 2 -L 1 ＝1m；
S3, extending a probe of the sliding micrometer into the measuring tube and connecting the probe with the fine adjustment mechanism; then opening a micrometer computer connected with the probe; then, the axial position of the probe in the measuring tube is adjusted through the fine adjustment mechanism, and when a row of position indicating lamps on the micrometer computer are completely turned off, the probe is represented to reach a proper position; at this time, if the number on the display of the micrometer computer is 1, the null shift is 0, and the measurement is finished; if the display number is not 1, synchronously moving the two measuring rings, changing the distance between the two measuring rings until the micrometer computer displays 1, stopping moving the measuring rings, and repeating the operation step of the step 2, wherein L is the moment 2 -L 1 The value of-1 is the zero drift value.
Compared with the prior art, the invention has the following technical effects:
1. the measuring device comprises a laser range finder, a measuring tube with measuring rings and a fine adjustment mechanism, wherein the measuring rings with a standard distance (1 m) can be adjusted by the laser range finder, then the fine adjustment mechanism can ensure that a probe is just positioned in the middle of the two measuring rings, and finally the actual distance between the two measuring rings can be obtained by adjusting the distance between the two measuring rings and matching the laser range finder when the sliding micrometer displays the standard distance of 1m; then, a zero drift specific value can be obtained by comparing the standard distance 1m displayed by the sliding micrometer with the real distance of the actual measuring ring, and the real distance measurement can be obtained only by subtracting or adding the corresponding zero drift value from the distance measurement of each section of the subsequent actual sliding micrometer, so that the problem of larger error after data accumulation is solved.
2. The laser distance meter is selected for measurement, and compared with any mechanical measurement mode, the measurement precision can be obviously improved.
3. According to the invention, the measuring tube is provided with the scale marks, the end heads on the same side of the two measuring rings are provided with the mark lines, and the positions of the measuring rings on the measuring tube can be effectively known through the matching of the mark lines and the scale marks, so that the distance between the measuring rings can be conveniently adjusted, and the moving distances of the measuring rings are the same when the measuring rings are synchronously moved.
4. The determination method of the present invention is carried out by using a sliding micrometer to display the true ring spacing (L) at a standard distance of 1m 2 -L 1 ) The method is simple and accurate, and can neglect the zero drift value of the integral sliding micrometer, and the error of the integral sliding micrometer is calibrated because the probe length of the sliding micrometer changes or the sensing element has problems.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive exercise.
FIG. 1 is a schematic view of a zero drift measurement device of a slide micrometer;
FIG. 2 is a front view of a zero drift measurement device of the slide micrometer;
FIG. 3 is a top view of a zero drift measurement device for a slide micrometer;
FIG. 4 is a schematic view of a reflector;
FIG. 5 is a schematic diagram of the zero drift measurement process of the slide micrometer.
Description of reference numerals: 1. a base; 2. a laser range finder; 3. measuring a tube; 4. measuring a ring; 5. a fine adjustment mechanism; 6. a housing; 7. a signal processor; 8. a laser transmitter; 9. a light source receiver; 10. an electric wire; 11. an emission port; 12. a receiving port; 13. a condenser lens; 14. an annular groove; 15. a metal buckle; 16. a reflector; 17. a measuring tube fixing frame; 18. a guide bar; 19. a fixed seat; 20. finely adjusting the fixing piece; 21. a connecting rod; 22. adjusting the sliding block; 23. a threaded adjusting rod; 24. a hand wheel; 25. a probe.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment provides a zero drift survey device of slip micrometer, as shown in fig. 1 to 5, including base 1, laser range finder 2, survey pipe 3 and fine tuning 5 arrange along a lateral opposite side of base 1 in proper order, and base 1's effect guarantees that laser range finder 2, survey pipe 3 and fine tuning 5 are the equal level setting, therefore base 1's top surface need be the horizontal plane, and preferred base 1 is a rectangle steel sheet. The measuring tube 3 is fixed on the base 1 through a measuring tube fixing frame 17, two ends of the measuring tube 3 respectively face the laser range finder 2 and the fine adjustment mechanism 5, one end of the measuring tube 3 faces the transmitting end of the laser range finder 2, and the material of the measuring tube 3 cannot influence the detection of the probe 25 of the sliding micrometer, so that the preferable measuring tube 3 is a PVC tube, the length is preferably more than 1.2m, and the probe 25 is usually about 1.2 m. Two measuring rings 4 are arranged on the measuring tube 3, and the distance between the two measuring rings 4 is adjustable. The measuring ring 4 is preferably made of metal, preferably copper, so that the probe 25 of the slide micrometer can detect the measuring ring 4. Every centre that surveys ring 4 all is equipped with the installation department that supplies the reflex reflector installation, can install the reflex reflector at the centre that surveys ring 4 through the installation department, the reflex reflector can be with the laser reflection that the transmitting terminal of laser range finder 2 launched out to the receiving end of laser range finder 2 on, thereby record the distance of the transmitting terminal of laser range finder 2 to the reflex reflector, the distance of the transmitting terminal of laser range finder 2 to surveying ring 4 centre promptly, through install the reflex reflector respectively on the survey ring 4 that is close to laser range finder 2 end and the survey ring 4 of keeping away from laser range finder 2 end, thereby obtain two distances between surveying ring 4, then adjust the distance of two survey rings 4, until adjusting to standard interval (1 m). The fine adjustment mechanism 5 is used for adjusting the axial position of the probe 25 of the sliding micrometer in the measuring tube 3, so that the probe 25 is just positioned between the two measuring rings 4, the distance from the end of the probe 25 to the outermost end of the two measuring rings 4 is equal, after the adjustment is finished, the zero drift measurement of the sliding micrometer can be formally carried out, when the computer display number of the micrometer of the sliding micrometer is 1 (namely, the distance is 1 m), no problem exists, zero drift does not exist, and the zero drift measurement can be directly used for engineering measurement. If the number displayed by the micrometer computer is not 1, zero drift exists, the two measuring rings 4 need to be moved towards or away from each other at the same time by the same distance, the distance between the two measuring rings 4 is adjusted until the number displayed by the micrometer computer is 1, the zero drift of the sliding micrometer is measured, then the distance between the two measuring rings 4 is measured by the laser range finder 2, and the zero drift value can be obtained by subtracting 1 m. In the actual engineering, the slide micrometer adds the zero drift value to correct the result to obtain the real measurement result.
Further, in this embodiment, referring to fig. 1 to 5, the laser distance measuring instrument 2 includes a housing 6 having a display screen on the top, a signal processor 7 is installed in the housing 6, two ends of the signal processor 7 are respectively connected to a laser emitter 8 and a light source receiver 9 through wires 10, and the display screen is electrically connected to the signal processor 7 and can display the measured distance. The shell 6 is provided with two openings, one opening faces the laser emitter 8 and is a transmitting opening 11, the other opening faces the light source receiver 9 and is a receiving opening 12, the laser emitter 8 and the transmitting opening 11 form a transmitting end of the laser range finder 2, and the light source receiver 9 and the receiving opening 12 form a receiving end of the laser range finder 2. Laser emitted by the laser emitter 8 can be irradiated on the reflecting device through the emitting opening 11, then the laser can be emitted to the receiving opening 12 through the reflection of the reflecting device, and is irradiated on the light source receiver 9 after passing through the receiving opening 12, and after the processing of the signal processor 7, the laser can be displayed on a display screen, and the distance from the reflecting device to the laser emitter 8 can be displayed. A battery can be arranged in the shell 6 of the laser range finder 2, and a power line can be arranged behind the shell 6 and is connected with power supply equipment to supply power for the signal processor 7, the laser transmitter 8 and the light source receiver 9.
Further, in order to ensure that the laser range finder 2 measures accurately, in this embodiment, a condenser 13 is disposed between the laser emitter 8 and the emitting port 11, and between the light source receiver 9 and the receiving port 12. The laser convergence degree and intensity of emission and reception are improved, the phenomenon that multi-point laser is applied to the light source receiver 9 to cause data confusion and weakening of laser intensity is avoided, and the light source receiver 9 cannot effectively recognize the laser.
In this embodiment, as shown in fig. 1 to 5, the measuring ring 4 is screwed on the measuring pipe 3, and the axial position of the measuring ring 4 on the measuring pipe 3 can be adjusted by rotating the measuring ring 4, so that the distance between the two measuring rings 4 can be adjusted.
Further, in order to adjust the measuring ring 4 conveniently and improve the adjustment precision of the measuring ring 4, referring to fig. 1 to 5, in this embodiment, the adjustment distance of the measuring ring 4 is visualized, i.e. the measuring tube 3 is provided with scale marks along the axis direction thereof, and the end heads of the two measuring rings 4 are respectively provided with mark lines, the mark lines are located at the end heads at the same side of the two measuring rings 4, i.e. the mark lines can be the left end and the right end of the measuring ring 4, and the positions of the measuring rings 4 can be accurately adjusted by identifying the scale marks corresponding to the mark lines, so that the problems that the rotation distance of one measuring ring 4 is large and the rotation distance of one measuring ring 4 is small when the measuring ring 4 needs to be synchronously rotated when the zero drift of the sliding micrometer is measured are avoided.
Further, in this embodiment, the precision of the scale mark on the measuring tube 3 is 1mm, and the thread precision of the measuring ring 4 and the measuring tube 3 is also 1mm, that is, the distance between the two threads is 1mm. To improve the accuracy of the adjustment of the measuring ring 4.
In this embodiment, referring to fig. 1 to 5, the mounting portion includes an annular groove 14 located in the middle of the measuring ring 4, the light reflecting device includes a metal clip 15 and a light reflecting plate 16, the light reflecting plate 16 is rotatably connected to the metal clip 15 through a rotating shaft so as to adjust the angle of the light reflecting plate 16, so as to reflect the laser emitted by the laser emitter 8 to the light source receiver 9, the metal clip 15 is an arc clip and can be just clipped on the annular groove 14, and after the metal clip 15 is clipped in the annular groove 14, the mounting of the light reflecting plate 16 in the middle of the measuring ring 4 is realized.
In this embodiment, as shown in fig. 1 to 5, the fine adjustment mechanism 5 includes a guide assembly, a traction assembly, and a transmission assembly; the guide assembly comprises two fixing seats 19 and two guide rods 18, the two fixing seats 19 are fixed on the base 1, the two guide rods 18 are fixed on the two fixing seats 19, and the two guide rods 18 are parallel to the axis direction of the measuring tube 3. The traction assembly comprises a connecting rod 21 and an adjusting slide block 22, the adjusting slide block 22 is connected to the two guide rods 18 in a sliding mode, the connecting rod 21 is fixed on the adjusting slide block 22, the end of the connecting rod 21 is coaxially fixed with a probe 25 of a sliding micrometer extending into the measuring tube 3, and the connecting rod 21 is driven to move along the axis direction of the measuring tube 3. The transmission assembly comprises a fine adjustment fixing piece 20 and a thread adjusting rod 23, and the fine adjustment fixing piece 20 is fixedly connected to a fixing seat 19 far away from the measuring tube 3; one end of the threaded adjusting rod 23 is connected to the adjusting slider 22 in a threaded manner, the other end of the threaded adjusting rod is connected to the fine adjustment fixing member 20 in a rotating manner and extends out of the fine adjustment fixing member 20, and a hand wheel 24 is fixed on the end of the fine adjustment fixing member 20. The probe 25 of the sliding micrometer extends into the measuring tube 3 from one end provided with the laser range finder 2, then the hand wheel 24 is rotated after the probe extends out from the other end, the adjusting slide block 22 moves towards the probe 25, the connecting rod 21 is fixed after approaching the probe 25, then the hand wheel 24 is continuously rotated, the probe 25 is driven to retract into the measuring tube 3 through the connecting rod 21, and adjustment is carried out as required.
Further, in this embodiment, the connecting rod 21 is connected with the probe 25 of the slide micrometer through the buckle, and the buckle mode is easy to detach and install, and can effectively improve the measuring efficiency.
The present embodiment provides a method for measuring zero drift of a sliding micrometer, as shown in fig. 1 to 5, in which the zero drift measuring apparatus using the sliding micrometer includes the following steps:
s1, placing a base 1 of a measuring device on a table top of a laboratory, and standing for 24 hours in a laboratory environment; so that the environment in the measuring tube 3 is the same as the environment in the laboratory, and the influence of environmental factors on the sensing element of the slide micrometer is avoided;
s2, firstly installing the reflecting device on the measuring ring 4 close to one side of the laser range finder 2, then starting the laser range finder 2, enabling the transmitting end of the laser range finder 2 to emit laser to strike the reflecting device, enabling the reflecting device to reflect the laser to the receiving end of the laser range finder 2, and enabling the laser range finder 2 to measure the distance L from the reflecting device to the transmitting end 1 I.e. the distance L from the midpoint of the measuring ring 4 to the transmitting end of the laser distance measuring instrument 2 1 Then the reflecting device is arranged on the other measuring ring 4, and the distance L from the reflecting device to the transmitting end is measured 2 I.e. the distance L from the midpoint of the other measuring ring 4 to the emitting end of the laser distance measuring device 2 2 Then the measuring ring 4 close to the laser distance measuring device 2 is kept still, and only the measuring ring 4 with the reflecting device is moved until L is enabled 2 -L 1 Stop at =1m;
s3, extending a probe 25 of the slide micrometer into the measuring tube 3 and connecting the probe with the fine adjustment mechanism 5; then, a micrometer computer connected with the probe 25 is turned on, the axial position of the probe 25 in the measuring tube 3 is adjusted through the fine adjustment mechanism 5, and when a row of position indicating lamps on the micrometer computer are completely turned off, the probe 25 is represented to reach a proper position; at this time, if the number on the display of the micrometer computer is 1, the null shift is 0, and the measurement is finished; if the display number is not 1, synchronously moving the two measuring rings 4, needing to ensure that the moving distances of the two measuring rings 4 are the same, changing the distance between the two measuring rings 4 until the micrometer computer displays 1, stopping moving the measuring rings 4, and repeating the step 2Operating procedure, at this point L 2 -L 1 The value of-1 is the zero drift value.
After the zero drift finger is obtained, in the measurement in the subsequent actual engineering, the real distance measurement of each segment can be obtained only by subtracting or adding the zero drift value to each segment of measurement data of the sliding side micrometer, and the error problem caused by the zero drift can be avoided due to the accumulated real distance measurement.
The principle and the implementation mode of the invention are explained by applying a specific example, and the description of the embodiment is only used for helping to understand the method and the core idea of the invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, the present disclosure should not be construed as limiting the invention.
Claims (9)
1. A zero drift measurement device of a sliding micrometer is characterized by comprising a base provided with a laser range finder, wherein the base is provided with a measurement tube, the end of the measurement tube is opposite to the transmitting end of the laser range finder, the measurement tube is provided with two measurement rings with adjustable intervals, the measurement rings are in threaded connection with the measurement tube, the middle position of each measurement ring is provided with an installation part for installing a reflecting device, the reflecting device can reflect laser to the receiving end of the laser range finder, and the base is provided with a fine adjustment mechanism for adjusting the axial position of a probe of the sliding micrometer in the measurement tube;
measuring the zero drift value of the sliding micrometer:
step 1: firstly, mounting the reflecting device on a measuring ring close to one side of the laser range finder, then measuring the distance L1 from the reflecting device to the transmitting end by the laser range finder, then mounting the reflecting device on another measuring ring, measuring the distance L2 from the reflecting device to the transmitting end, and then moving the measuring ring provided with the reflecting device until L2-L1=1m;
step 2: then extending the probe of the sliding micrometer into the measuring tube and connecting the probe with the fine adjustment mechanism; opening a micrometer computer connected with the probe; the axial position of the probe in the measuring tube is adjusted through the fine adjustment mechanism, and when a row of position indicating lamps on the micrometer computer are completely turned off, the probe is represented to be in a proper position; at this time, if the number on the display of the micrometer computer is 1, the null shift is 0, and the measurement is finished; and if the display number is not 1, synchronously moving the two measuring rings, changing the distance between the two measuring rings, stopping moving the measuring rings until the micrometer computer displays 1, and then repeating the operation step of the step 1, wherein the numerical value of L2-L1-1 is the zero drift value.
2. The device of claim 1, wherein the laser range finder comprises a housing having a display screen at the top, a signal processor is disposed in the housing, the signal processor is connected to a laser transmitter and a light source receiver at two ends thereof, and the housing is provided with a transmitting opening and a receiving opening corresponding to the laser transmitter and the light source receiver.
3. The apparatus of claim 2, wherein a condenser is disposed between the laser transmitter and the transmitter, and between the light source receiver and the receiver.
4. The apparatus of claim 3, wherein the measuring tube has a graduation line, and the ends of the two measuring rings on the same side have a mark line matching the graduation line.
5. A slide micrometer zero drift measurement setup according to claim 4, wherein the accuracy of the thread on the tube and the measuring ring and the accuracy of the graduation marks are 1mm.
6. The apparatus of claim 1, wherein the mounting portion comprises an annular groove at a middle position of the measuring ring, and the reflector comprises a metal latch capable of latching in the annular groove and a reflector rotatably connected to the metal latch.
7. The device for measuring zero drift of a sliding micrometer according to claim 1, wherein the fine adjustment mechanism comprises a guide assembly, a traction assembly and a transmission assembly, the guide assembly comprises a fixed seat and a guide rod, the guide rod is fixed on the base through the fixed seat, and the guide rod is parallel to the axial direction of the measuring tube; the traction assembly comprises a connecting rod detachably connected with the probe of the sliding micrometer, the connecting rod is coaxially connected with the probe of the sliding micrometer, and the connecting rod is connected to the guide rod in a sliding mode through an adjusting sliding block; the transmission assembly comprises a fine adjustment fixing part and a threaded connection, wherein the fine adjustment fixing part and the threaded connection are fixedly connected to the fixing seat, an adjusting threaded rod is arranged on the fine adjustment fixing part, one end of the adjusting threaded rod is in threaded connection with the adjusting slide block, and a hand wheel is installed at the other end of the adjusting threaded rod.
8. The apparatus of claim 7, wherein the connecting rod is connected to the probe of the slide micrometer by a snap fit.
9. A method for measuring zero drift of a slide micrometer using a device for measuring zero drift of a slide micrometer according to any one of claims 1 to 8, comprising the steps of:
s1, placing a base of the measuring device on a table top of a laboratory, and standing for 24 hours in a laboratory environment;
s2, firstly, mounting the reflecting device on a measuring ring close to one side of the laser range finder, then starting the laser range finder, reflecting laser emitted by the emitting end to the receiving end through the reflecting device, measuring the distance L1 from the reflecting device to the emitting end, then mounting the reflecting device on another measuring ring, measuring the distance L2 from the reflecting device to the emitting end, and then moving the measuring ring provided with the reflecting device until L2-L1=1m;
s3, extending a probe of the sliding micrometer into the measuring tube and connecting the probe with the fine adjustment mechanism; then opening a micrometer computer connected with the probe; then, the axial position of the probe in the measuring tube is adjusted through the fine adjustment mechanism, and when a row of position indicating lamps on the micrometer computer are completely turned off, the probe is represented to be in a proper position; at this time, if the number on the display of the micrometer computer is 1, the null shift is 0, and the measurement is finished; and if the display number is not 1, synchronously moving the two measuring rings, changing the distance between the two measuring rings, stopping moving the measuring rings until the micrometer computer displays 1, and repeating the operation step of the step 2, wherein the numerical value of L2-L1-1 is the zero drift value.
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