CN113922915B - Automatic deviation correcting method for wavelength of DML (digital light management) optical module, DML optical module and DWDM (DWDM) system - Google Patents

Abstract

The invention discloses a DML optical module wavelength automatic deviation correcting method, a DML optical module and a DWDM system, and relates to the technical field of optical communication. The method comprises the following steps: setting a wavelength deviation correcting parameter configuration table; periodically acquiring LOL/LOS states from a laser driving unit of the DML optical module, and judging whether TX LOL/TX LOS alarms are generated in the transmitting direction; inquiring in a wavelength deviation correcting parameter configuration table by taking the current emission wavelength as an index according to a judging result of whether the TX LOL/TX LOS alarm is generated or not, and obtaining a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the acquired TEC target temperature ADC value. The invention solves the problem of the shift of the emission wavelength of the DML TOSA caused by the change of the modulation current of the DML TOSA, realizes the rapid, accurate and convenient automatic deviation correction of the wavelength of the DML optical module, and ensures the smoothness of the data transmission of an optical link.

Description

Automatic deviation correcting method for wavelength of DML (digital light management) optical module, DML optical module and DWDM (DWDM) system

Technical Field

The invention relates to the technical field of optical communication, in particular to a DML optical module wavelength automatic deviation correcting method, a DML optical module and a DWDM system.

Background

As the 5G deployment process accelerates, operators begin to build 5G bearer networks on a scale. Compared with 4G,5G has higher requirements on the aspects of bandwidth, time delay, synchronization, reliability, flexibility and the like of a bearing network. As an important component of the carrier network, the 5G forwarding network not only needs to meet the above requirements, but also needs to face the difficult problem of laying optical fiber resources required by 5G base station deployment, which is multiplied in number.

Dense optical multiplexing (Dense Wavelength Division Multiplexing, DWDM) is a system that can combine a set of wavelengths of light for transmission over an optical fiber. This is a laser technology used to increase bandwidth over existing fiber backbones. Rather, the technique multiplexes tight spectral spacing of individual fiber carriers in a given fiber in order to take advantage of the transmission performance that can be achieved (e.g., to minimize dispersion or attenuation). In this way, the total number of optical fibers required can be reduced for a given information transmission capacity.

DWDM wavelength tunable optical modules can be used in DWDM systems, and the lasers of DWDM wavelength tunable optical modules are of two types: direct modulator lasers (Directly Modulated Laser, DML) and electro-absorption modulated lasers (electro-absorption Modulated Laser, EML). Compared with DML, EML has large extinction ratio, small chirp and small dispersion cost, but has high cost and large power consumption. Therefore, compared with the DWDM wavelength tunable optical module of the EML type, the DWDM wavelength tunable optical module of the DML type with low cost and low power consumption is more suitable for large-scale commercial use.

In the DML optical module, when there is a modulation signal (with data transmission) and no modulation signal (without data transmission) in the TX (transport) direction, the modulation current of the DML TOSA (Transmitter Optical Subassembly, optical transmit sub-module) changes, and the change of the modulation current causes the emission wavelength of the DML TOSA to shift.

As shown in fig. 1, in the DWDM wavelength multiplexing/demultiplexing application scenario, a DML optical module is inserted between an SNI (Service Node Interface ) side device (such as a distributed unit DU/baseband processing unit BBU) and a UNI (User Network Interface ) side device (such as an active antenna unit AAU/radio frequency processing unit RRU), and the SNI side device and the UNI side device are connected through a DWDM wavelength multiplexing/demultiplexing device and a long-distance optical fiber. The DWDM wavelength multiplexing demultiplexer includes a plurality of wavelength channels, each of which has a different center wavelength. When the wavelength value of the optical signal emitted by the DML optical module is in the wavelength bandwidth of the DWDM wavelength channel, the optical signal emitted by the DML optical module can pass through the DWDM wavelength channel; otherwise, it cannot pass. The wavelength bandwidth of the wavelength channel of the DWDM wavelength multiplexing and demultiplexing device and the wavelength interval between different wavelength channels are smaller than 1nm, and if the emission wavelength of the DML optical module is greatly deviated and exceeds the bandwidth range of the wavelength channel of the DWDM wavelength multiplexing and demultiplexing device, the optical signal can not pass through the corresponding DWDM wavelength channel.

More specifically, as shown in fig. 2, a typical DML optical module includes a high-speed transceiver interface, a laser drive unit, TOSAs, and ROSAs (Receiver Optical Subassembly, optical receiving sub-modules). In the DWDM wavelength multiplexing/demultiplexing application scenario, before the SNI side device and the UNI side device send data to the opposite terminal through the DML optical module, it is required to detect whether an optical signal sent by the opposite terminal device is received. If the optical signal is not received, data is not sent to the opposite terminal through the DML optical module; if the optical signal is received, data is sent to the opposite terminal through the DML optical module. In an application scenario, when the DML optical module changes from a data transmission stop state to a data transmission state, a modulation signal is generated in the TX direction, a modulation current of the DML TOSA is increased, so that an emission wavelength of the DML TOSA is shifted, and an emission wavelength value is increased, as shown in fig. 3, the emission wavelength of the DML TOSA is shifted from an original λ to λ', where λ is an emission wavelength when the DML optical module does not have the modulation signal in the TX direction, and the wavelength value is equal to a center wavelength value of a channel currently connected in the TX direction of the DML optical module. In another application scenario, when the DML optical module changes from the data transmission state to the data transmission stop state, no modulation signal is generated in the TX direction, and the modulation current of the DML TOSA decreases, so that the emission wavelength of the DML TOSA shifts, and the emission wavelength value becomes smaller, as shown in fig. 4, the emission wavelength of the DML TOSA shifts from λ to λ″. And lambda is the emission wavelength of the DML optical module TX direction with a modulation signal, and the wavelength value is equal to the central wavelength value of the channel currently connected with the DML optical module TX direction. When the transmission wavelength offset of the DML TOSA exceeds the bandwidth of the DWDM wavelength channel, an optical signal sent when the DML TOSA transmits data cannot pass through the wavelength channel of the DWDM wavelength multiplexing demultiplexer connected to the DML TOSA, and finally, the data transmitted to the opposite end by the SNI side device and the UNI side device cannot reach the opposite end device through the wavelength channel of the DWDM wavelength multiplexing demultiplexer, and the communication fails.

Therefore, how to implement automatic correction when the emission wavelength of the DML optical module is shifted is a technical problem to be solved by those skilled in the art.

Disclosure of Invention

The invention aims to overcome the defects of the background technology, and provides a DML optical module wavelength automatic deviation correcting method, a DML optical module and a DWDM system, which solve the problem of the emission wavelength deviation of a DML TOSA caused by the change of the modulation current of the DML TOSA and realize the rapid, accurate and convenient automatic deviation correction of the wavelength of the DML optical module.

In order to achieve the above objective, in a first aspect, an embodiment of the present invention provides a method for automatically correcting a wavelength of a DML optical module, where the method is based on an intensive optical wave multiplexing DWDM system, and the method includes:

setting a wavelength deviation correcting parameter configuration table, wherein the wavelength deviation correcting parameter configuration table is used for storing ADC values of each emission wavelength of the optical module corresponding to TEC target temperature when TX LOL/TX LOS alarms exist or not;

periodically acquiring LOL/LOS states from a laser driving unit of the DML optical module, and judging whether TX LOL/TX LOS alarms are generated in the transmitting direction;

inquiring in a wavelength deviation correcting parameter configuration table by taking the current emission wavelength as an index according to a judging result of whether the TX LOL/TX LOS alarm is generated or not, and obtaining a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

As a preferred embodiment, the wavelength correction parameter configuration table includes: a sub-table with alarm parameters and a sub-table without alarm parameters; the alarm parameter sub-table comprises: when TX LOL/TX LOS alarms exist, the tunable N emission wavelengths of the optical module respectively correspond to TEC target temperature ADC values; the alarm-free parameter sub-table comprises: when no TX LOL/TX LOS alarm is given, the tunable N emission wavelengths of the optical module respectively correspond to the TEC target temperature ADC values.

As a preferred embodiment, according to the determination result of whether to generate TX LOL/TX LOS alarm, the method queries in the wavelength deviation correcting parameter configuration table by using the current emission wavelength as an index to obtain the TEC target temperature ADC value corresponding to the current emission wavelength, and specifically includes:

when the generation of TX LOL/TX LOS alarm is judged, the current emission wavelength of the DML optical module is obtained, the alarm parameter sub-table is inquired by taking the wavelength as an index, and an ADC value corresponding to the TEC target temperature corresponding to the current emission wavelength is obtained;

when the TX LOL/TX LOS alarm is judged not to be generated, the current transmission wavelength of the DML optical module is obtained, the alarm-free parameter sub-table is queried by taking the wavelength as an index, and an ADC value corresponding to the TEC target temperature corresponding to the current transmission wavelength is obtained.

In the wavelength deviation correcting parameter configuration table, the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature is obtained by a test mode or a program automatic calculation mode.

As a preferred implementation manner, the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature is obtained through a test mode, and specifically comprises the following steps:

under the condition that the emission wavelength of the DML optical module is unchanged, ADC values of TEC target temperature corresponding to the current emission wavelength are tested when no modulation signal exists and when the modulation signal exists respectively by using a test instrument and a test tool;

if the DML optical module can tune N different emission wavelengths, respectively testing ADC values of TEC target temperatures corresponding to the emission wavelengths when no modulation signal exists and modulation signals exist for the N different emission wavelengths.

As a preferred implementation manner, the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature is obtained through a program automatic calculation mode, and the method specifically comprises the following steps:

according to the corresponding relation between the modulation current value and the DML TOSA emission wavelength value and the corresponding relation between the TEC target temperature value and the DML TOSA emission wavelength value, under the condition that the DML optical module emission wavelength is unchanged, calculating the ADC value of the TEC target temperature corresponding to the current emission wavelength when no modulation signal exists and when the modulation signal exists by utilizing an automatic calculation program;

if the DML optical module can tune N different emission wavelengths, respectively calculating ADC values of TEC target temperatures corresponding to the emission wavelengths when no modulation signal exists and the modulation signal exists for the N different emission wavelengths.

As a preferred embodiment, the method further comprises the steps of: after the TEC temperature control ADC value is successfully set, the emission wavelength of the TOSA in the DML optical module is automatically adjusted to a target value consistent with the wavelength of the currently connected channel.

As a preferred embodiment, the set wavelength deviation correcting parameter configuration table is stored as a factory configuration in the memory of the DML optical module.

In a second aspect, an embodiment of the present invention further provides a DML optical module applying the method in the embodiment of the first aspect, including:

a wavelength correction parameter configuration table for: when TX LOL/TX LOS alarm is stored or not, the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature is stored;

the state acquisition and alarm judging module is used for: periodically acquiring LOL/LOS states from a laser driving unit of the DML optical module, and judging whether TX LOL/TX LOS alarms are generated in the transmitting direction;

the deviation rectifying processing module is used for: inquiring in a wavelength deviation correcting parameter configuration table by taking the current emission wavelength as an index according to a judging result of whether the TX LOL/TX LOS alarm is generated or not, and obtaining a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

In a third aspect, embodiments of the present invention further provide a DWDM system, including DML optical modules as in the embodiments of the second aspect, in the SNI side and/or the UNI side of the system.

The invention has the beneficial effects that:

(1) According to the invention, a wavelength deviation correcting parameter configuration table is established to store ADC (Analog-to-Digital Converter) values of each emission wavelength of the optical module corresponding to TEC (Thermo Electric Cooler, semiconductor refrigerator) target temperature when TX LOL (TX CDR Loss of Lock, TX CDR lock-out)/TX LOS (TX Loss of Signal, TX signal LOSs) alarms and ADC values of each emission wavelength of the optical module corresponding to TEC target temperature when no TX LOL/TX LOS alarms. When the emission wavelength of the subsequent DML TOSA deviates, LOL (Loss of Lock)/LOS (Loss of Signal) states are obtained from a laser driving unit of the DML optical module in real time, whether TX LOL/TX LOS alarms are generated in the sending direction is judged, ADC values corresponding to required TEC target temperatures in different alarm states in a wavelength deviation correcting parameter configuration table are inquired, and the TEC temperature control ADC values are set to the inquired required TEC target temperature ADC values, so that the TOSA emission wavelength of the DML optical module can be automatically adjusted to a target value consistent with the currently connected channel wavelength, and further the rapid, accurate and convenient automatic deviation correction of the emission wavelength of the DML optical module is realized, and smoothness of optical link data transmission is ensured.

(2) In the invention, the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature can be obtained by a test mode or a program automatic calculation mode, the acquisition mode is more flexible and various, and a plurality of choices are provided for the implementation of the invention.

Drawings

FIG. 1 is a schematic diagram of a prior art DWDM system;

FIG. 2 is a schematic diagram of a prior art DML optical module applied to a DWDM system;

fig. 3 is a schematic diagram of an emission wavelength shift of a DML optical module when the DML optical module changes from a data transmission stop state to a data transmission state in an application scenario;

fig. 4 is a schematic diagram of an emission wavelength shift when a DML optical module changes from a data transmission state to a data transmission stop state in another application scenario;

FIG. 5 is a schematic diagram of an embodiment of the present invention for implementing automatic deviation correction in an application scenario;

FIG. 6 is a schematic diagram of an embodiment of the present invention for implementing automatic deviation correction in another application scenario;

fig. 7 is a flowchart of a method for automatically correcting the wavelength of a DML optical module according to an embodiment of the present invention.

Detailed Description

The method aims at solving the problem that in the existing DWDM system, the transmission wavelength of the DML TOSA is shifted due to the fact that the DML optical module changes when the modulation current of the DML TOSA is changed, as shown in fig. 3 or 4. The invention aims to provide a DML optical module wavelength automatic correction method, a DML optical module and a DWDM system, which can realize the automatic correction of the wavelength of the DML optical module rapidly, accurately and conveniently, so that the DML optical module can automatically correct the deviation rapidly, accurately and conveniently when the emission wavelength of the DML optical module deviates. For example, referring to fig. 5, when the emission wavelength of the DML TOSA is shifted as shown in fig. 3 (i.e., from the original λ to λ '), the method of the present invention can quickly and effectively correct the shifted λ' to the original λ, thereby implementing automatic correction; also, referring to FIG. 6, when the emission wavelength of the DML TOSA is shifted as shown in FIG. 4 (i.e., from the original lambda to lambda "), the method of the present invention can also be used to quickly and effectively correct the shifted lambda to the original lambda, thereby achieving automatic correction. In summary, referring to fig. 5 and fig. 6, it can be known that, no matter the DML optical module has a modulated signal or no modulated signal, the emission wavelength of the DML optical module is shifted, so that automatic deviation correction can be quickly performed, thereby ensuring smooth data transmission of the optical link, and meeting practical application requirements.

In order to achieve the above purpose, the main design concept of the invention is as follows: and (3) storing the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature when the TX LOL/TX LOS alarm is stored by establishing a wavelength deviation correction parameter configuration table, and storing the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature when the TX LOL/TX LOS alarm is not generated. And, the LOL/LOS state is creatively used for judging whether the TX direction generates TX LOL/TX LOS alarm. When the automatic correction of the emission wavelength is needed, the ADC value corresponding to the required TEC target temperature under different alarm conditions can be inquired by utilizing the wavelength correction parameter configuration table, and the TEC temperature control ADC value is set to the inquired required TEC target temperature ADC value, so that the TOSA emission wavelength of the DML optical module can be automatically adjusted to the target value consistent with the currently connected channel wavelength, the rapid, accurate and convenient automatic correction of the emission wavelength of the DML optical module is realized, and the smoothness of optical link data transmission is ensured.

In order to make the technical problems, technical solutions and advantages to be solved more apparent, the technical solutions of the present invention will be described in detail with reference to the accompanying drawings and specific embodiments.

However, it should be noted that: the examples to be presented below are only a few specific examples and are not intended to limit the embodiments of the present invention to the following specific steps, values, conditions, data, sequences, etc. Those skilled in the art can, upon reading the present specification, make and use the concepts of the invention to construct further embodiments not mentioned in the specification.

Example 1

Referring to fig. 5, the embodiment provides a method for automatically rectifying the wavelength of a DML optical module, which can be applied to an intensive optical wave multiplexing DWDM system, and the method includes the following steps:

s1, setting a wavelength deviation correcting parameter configuration table, wherein the wavelength deviation correcting parameter configuration table is used for storing ADC values of each emission wavelength of the optical module corresponding to TEC target temperature when TX LOL/TX LOS alarms exist or not. In practical application, the wavelength deviation correcting parameter configuration table can be stored in a FLASH memory of the DML optical module as factory configuration.

It is appreciated that the DML optical module supports emission wavelength tunability, and that the DML TOSA emission wavelength is affected by both TEC operating temperature and modulation current. Under the condition that the modulation current is the same, the DML TOSA can emit different emission wavelengths by changing the working temperature of the TEC, and the working temperature of the TEC corresponds to the emission wavelengths of the DML TOSA one by one; under the condition that the TEC working temperatures are the same, the DML TOSA can emit different emission wavelengths by changing the modulation current value, and the modulation current value corresponds to the DML TOSA emission wavelength one by one. Because the modulation current value is different when the DML optical module has a modulation signal and does not have a modulation signal, when the DML optical module automatically rectifies, the situation that the modulation signal has a modulation signal and does not have a modulation signal needs to be distinguished, namely whether a TX LOL/TX LOS alarm is generated or not needs to be distinguished (when the DML optical module does not have a modulation signal, TX LOL or TX LOS alarm is generated, and when the DML optical module has a modulation signal, TX LOL or TX LOS alarm is not generated).

In this embodiment, a wavelength deviation correcting parameter configuration table is established to store the ADC values of the TEC target temperatures corresponding to the respective emission wavelengths of the optical module when the TX LOL/TX LOS alarm is stored, and the ADC values of the TEC target temperatures corresponding to the respective emission wavelengths of the optical module when the TX LOL/TX LOS alarm is not present. When the emission wavelength of the subsequent DML TOSA is shifted, the ADC value corresponding to the required TEC target temperature under different conditions can be queried by utilizing the wavelength deviation correcting parameter configuration table, and the TOSA emission wavelength of the DML optical module can be automatically adjusted to the target value consistent with the currently connected channel wavelength by setting the TEC temperature control ADC value to the queried required TEC target temperature ADC value, so that the rapid, accurate and convenient automatic deviation correction of the emission wavelength of the DML optical module is realized.

S2, periodically acquiring LOL/LOS states from a laser driving unit of the DML optical module, and judging whether a TX LOL/TX LOS alarm is generated in the transmitting direction.

For example, after the DML optical module is successfully powered on and initialized, the MCU (Microcontroller Unit, micro control unit) of the DML optical module may periodically obtain the real-time LOL state or LOS state of the sending direction from the laser driving unit through a communication interface (such as the serial peripheral interface SPI, the integrated circuit bus interface IIC, the management data input/output interface MDIO, etc.). If the MCU of the DML optical module successfully acquires the LOL or LOS state of the transmitting direction in real time from the laser driving unit, whether the TX LOL alarm or the TX LOS alarm is generated or not is continuously judged. The acquiring period can be set and modified according to the requirement, and the example is not limited specifically.

S3, according to a judging result of whether TX LOL/TX LOS alarm is generated, inquiring in a wavelength deviation correcting parameter configuration table by taking the current emission wavelength as an index, and acquiring a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

Specifically, when it is determined that a TX LOL/TX LOS alarm is generated, the current emission wavelength is used as an index in a wavelength deviation correction parameter configuration table to perform inquiry, and when the TX LOL/TX LOS alarm is generated, a TEC target temperature ADC value corresponding to the current emission wavelength is obtained; when the TX LOL/TX LOS alarm is judged not to be generated, the current emission wavelength is used as an index in the wavelength deviation correction parameter configuration table to be inquired, and when the TX LOL/TX LOS alarm is not generated, the TEC target temperature ADC value corresponding to the current emission wavelength is obtained.

In addition, it can be understood that, in practical application, after step S3 is implemented, the following operations may be further included: when the TEC temperature control ADC value is successfully set, the emission wavelength of the TOSA in the DML optical module can be automatically adjusted to a target value consistent with the wavelength of the currently connected channel, namely, the error wavelength value after the wavelength is shifted is automatically corrected and adjusted to the correct working wavelength value corresponding to the wavelength channel. For example, after the DML optical module successfully sets the ADC value corresponding to the TEC temperature control target temperature, the TEC temperature control PID algorithm (Proportion Integral Differential algorithm, which is a control algorithm combining three links of proportional, integral and Differential) in the MCU of the DML optical module may be utilized to automatically adjust the TEC operating temperature to the target temperature, and keep the current operating temperature stable at the target temperature. When the current working temperature of the DML optical module TEC is changed, the emission wavelength of the DML TOSA is also changed, and the DML TOSA can be automatically adjusted to a target value consistent with the wavelength of the currently connected channel, so that the automatic deviation correction of the emission wavelength is realized.

Further, as an optional embodiment, in step S1, the wavelength deviation correcting parameter configuration table includes: with and without alarm parameter sub-tables.

Wherein, have alarm parameter sub-table to include: when TX LOL/TX LOS alarms exist, the tunable N emission wavelengths of the optical module respectively correspond to the TEC target temperature ADC values. It will be appreciated that when the DML optical module is not modulating signals, a TX LOL or TX LOS alarm may be generated.

The alarm-free parameter sub-table comprises: when no TX LOL/TX LOS alarm is given, the tunable N emission wavelengths of the optical module respectively correspond to the TEC target temperature ADC values. It will be appreciated that when the DML optical module has a modulated signal, no TX LOL or TX LOS alarm will be generated.

Furthermore, on the basis of the above embodiment, a wavelength information sub-table may be further set in the wavelength deviation correcting parameter configuration table, and the current emission wavelength of the DML optical module may be rapidly queried by using the wavelength information sub-table. In a specific design, the wavelength information sub-table may include: the DML optical module has the wavelength values of the current emission wavelength and the tunable emission wavelength entry number N, N different emission wavelengths; and each parameter stored in the wavelength information sub-table can be modified according to the requirement.

However, it should be noted that, in actual operation, the current emission wavelength of the DML optical module may be obtained by various other manners (such as directly reading from a register of the DML optical module) in addition to the current emission wavelength of the DML optical module by setting a wavelength information sub-table. That is, the above-described alternative embodiments are merely examples, and are not particularly limited.

It will be appreciated that in the alternative embodiments described above, a plurality of sub-table designs are employed in the wavelength correction parameter configuration table. Namely, the system comprises an alarm parameter sub-table and a no alarm parameter sub-table or also comprises a wavelength information sub-table. When no modulation signal is found out by using the alarm parameter sub-table, TX LOL or TX LOS alarms are generated, and each emission wavelength of the optical module corresponds to an ADC value of TEC set temperature; when a modulation signal is rapidly inquired by using the alarm-free parameter sub-table, TX LOL or TX LOS is not generated, and each emission wavelength of the optical module corresponds to an ADC value of the TEC set temperature; the current emission wavelength of the DML optical module can be rapidly inquired by utilizing the wavelength information sub-table. Through the design of the sub-table, targeted inquiry can be realized, useless data is prevented from being searched, the searching efficiency is effectively improved, and the purpose of automatically correcting errors is further realized rapidly and conveniently.

On the basis, as a preferred implementation manner, in step S3, according to the determination result of whether to generate the TX LOL/TX LOS alarm, query is performed in the wavelength deviation rectification parameter configuration table by using the current emission wavelength as an index, so as to obtain the TEC target temperature ADC value corresponding to the current emission wavelength, which specifically includes the following steps:

step S301, when it is determined that a TX LOL/TX LOS alarm is generated, acquiring the current emission wavelength of the DML optical module (for example, the current emission wavelength can be acquired from a set wavelength information sub-table or read from a register of the DML optical module, etc.), inquiring the alarm parameter sub-table by taking the wavelength as an index, and acquiring an ADC value corresponding to the TEC target temperature corresponding to the current emission wavelength;

step S302, when it is determined that the TX LOL/TX LOS alarm is not generated, the current emission wavelength of the DML optical module is obtained (for example, the current emission wavelength may be obtained from a set wavelength information sub-table or read from a register of the DML optical module, etc.), the alarm-free parameter sub-table is queried with the wavelength as an index, and an ADC value corresponding to the TEC target temperature corresponding to the current emission wavelength is obtained therefrom.

Further, as an optional implementation manner, in step S1, in the wavelength deviation rectification parameter configuration table, an ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature may be obtained through a test mode or a program automatic calculation mode.

Specifically, the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature is obtained through a test mode, and the method comprises the following steps: and respectively testing ADC values of TEC target temperature corresponding to the current emission wavelength when no modulation signal exists and the modulation signal exists under the condition that the emission wavelength of the DML optical module is unchanged by using a test instrument and a test tool. Then, if the DML optical module can tune N different emission wavelengths, the ADC values of the TEC target temperatures corresponding to the respective emission wavelengths need to be tested for the N different emission wavelengths, respectively, when there is no modulation signal and a modulation signal.

ADC values of the optical module, corresponding to TEC target temperatures, of each emission wavelength are obtained through a program automatic calculation mode, and the method comprises the following steps: according to the corresponding relation between the modulation current value and the DML TOSA emission wavelength value and the corresponding relation between the TEC target temperature value and the DML TOSA emission wavelength value, under the condition that the DML optical module emission wavelength is unchanged, an automatic calculation program is utilized to respectively calculate the ADC value of the TEC target temperature corresponding to the current emission wavelength when no modulation signal and the modulation signal exist. Then, if the DML optical module is tunable to N different emission wavelengths, the ADC values of the TEC target temperatures corresponding to the respective emission wavelengths need to be calculated for the N different emission wavelengths, respectively, when there is no modulation signal and a modulation signal.

Example two

Based on the same inventive concept, the embodiment of the invention also provides a DML optical module applying the DML optical module wavelength automatic deviation correcting method of the first embodiment. The DML optical module specifically comprises a wavelength deviation correcting parameter configuration table, a state acquisition and alarm judgment module and a deviation correcting processing module.

The wavelength deviation correcting parameter configuration table is used for: and storing ADC values of each emission wavelength of the optical module corresponding to the TEC target temperature when the TX LOL/TX LOS alarm is stored or not.

The state acquisition and alarm judgment module is used for: and periodically acquiring LOL/LOS states from a laser driving unit of the DML optical module, and judging whether a TX LOL/TX LOS alarm is generated in the transmitting direction.

The deviation rectifying processing module is used for: inquiring in a wavelength deviation correcting parameter configuration table by taking the current emission wavelength as an index according to a judging result of whether the TX LOL/TX LOS alarm is generated or not, and obtaining a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

In addition, it should be noted that, the various changing manners and specific examples in the foregoing embodiment of the automatic deviation correcting method for DML optical module wavelength are equally applicable to the DML optical module of this embodiment, and those skilled in the art will clearly know the implementation method of the DML optical module of this embodiment through the foregoing detailed description of the method, so that, for brevity of description, they will not be described in detail herein.

Example III

Based on the same inventive concept, the embodiment of the present invention further provides a DWDM system, where the SNI side and/or UNI side of the system includes the DML optical module of the second embodiment.

Note that: the particular embodiments described above are illustrative only and not restrictive, and those skilled in the art may combine and combine steps and means from the various embodiments described above separately to achieve the benefits of the present invention in accordance with the concepts of the present invention, such combined and combined embodiments also being encompassed by the present invention, such combination and combination not being described in detail herein.

The advantages, effects, etc. mentioned in the embodiments of the present invention are merely examples, and are not to be construed as necessarily limiting the various embodiments of the present invention. In addition, the foregoing specific details of the embodiments of the invention have been disclosed for purposes of illustration and understanding only, and are not intended to be limiting, since the embodiments of the invention must not be practiced with the specific details.

The block diagrams of the devices, apparatuses, devices, systems according to the embodiments of the present invention are merely illustrative examples, and are not intended to require or imply that connections, arrangements, configurations must be made in the manner shown in the block diagrams. As will be appreciated by one of skill in the art, the devices, apparatuses, devices, systems may be connected, arranged, configured in any manner. Words such as "including," "comprising," "having," and the like are words of openness and mean "including but not limited to," and are used interchangeably therewith. The terms "or" and "as used in embodiments of the present invention refer to and are used interchangeably with the term" and/or "unless the context clearly indicates otherwise. The term "such as" as used in embodiments of the present invention refers to, and is used interchangeably with, the phrase "such as, but not limited to.

The step flow diagrams in the embodiments of the invention and the method descriptions above are merely illustrative examples and are not intended to require or imply that the steps of the various embodiments must be performed in the order presented. The order of steps in the above embodiments may be performed in any order, as will be appreciated by those skilled in the art. Words such as "thereafter," "then," "next," and the like are not intended to limit the order of the steps; these words are simply used to guide the reader through the description of these methods. Furthermore, any reference to an element in the singular, for example, using the articles "a," "an," or "the," is not to be construed as limiting the element to the singular.

In addition, the steps and means in the various embodiments of the present invention are not limited to practice in a certain embodiment, and indeed, the relevant partial steps and partial means in the various embodiments herein may be combined according to the concept of the present invention to contemplate new embodiments, which are also included in the scope of the present invention.

The operations of embodiments of the present invention may be performed by any suitable means capable of performing the corresponding functions. The means may include various hardware and/or software components and/or modules including, but not limited to, circuitry or a processor of the hardware.

The method of an embodiment of the invention includes one or more acts for implementing the method described above. The methods and/or acts may be interchanged with one another without departing from the scope of the claims. In other words, unless a specific order of acts is specified, the order and/or use of specific acts may be modified without departing from the scope of the claims.

The functions of the embodiments of the present invention may be implemented in hardware, software, firmware, or any combination thereof. If implemented in software, the functions may be stored as one or more instructions on a tangible computer-readable medium. A storage media may be any available tangible media that can be accessed by a computer. By way of example, and not limitation, such computer-readable media can comprise RAM, ROM, EEPROM, CD-ROM or other optical disk storage, magnetic disk storage or other magnetic storage devices, or any other tangible medium that can be used to carry or store desired program code in the form of instructions or data structures and that can be accessed by a computer. As used herein, discs (disks) and disks include Compact Disks (CDs), laser disks, optical disks, DVDs (Digital Versatile Disc, digital versatile disks), floppy disks, and blu-ray disks where disks reproduce data magnetically, while disks reproduce data optically with lasers.

Thus, the computer program product may perform the operations presented herein. For example, such a computer program product may be a computer-readable tangible medium having instructions tangibly stored (and/or encoded) thereon, the instructions being executable by one or more processors to perform the operations described herein. The computer program product may comprise packaged material.

Other examples and implementations are within the scope and spirit of embodiments of the invention and the appended claims. For example, due to the nature of software, the functions described above may be implemented using software executed by a processor, hardware, firmware, hardwired or any combination of these. Features that implement the functions may also be physically located at various locations including being distributed such that portions of the functions are implemented at different physical locations.

Various changes, substitutions, and alterations to the techniques described herein may be made by those skilled in the art without departing from the teachings as defined by the appended claims. Furthermore, the scope of the claims of the present disclosure is not limited to the particular aspects of the process, machine, manufacture, composition of matter, means, methods and acts described above. The processes, machines, manufacture, compositions of matter, means, methods, or acts, presently existing or later to be developed that perform substantially the same function or achieve substantially the same result as the corresponding aspects described herein may be utilized. Accordingly, the appended claims are intended to include within their scope such processes, machines, manufacture, compositions of matter, means, methods, or acts.

The previous description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these aspects will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other aspects without departing from the scope of the invention. Thus, the present invention is not intended to be limited to the aspects shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

The foregoing description has been presented for purposes of illustration and description. Furthermore, this description is not intended to limit embodiments of the invention to the form disclosed herein. Although a number of example aspects and embodiments have been discussed above, a person of ordinary skill in the art will recognize certain variations, modifications, alterations, additions, and subcombinations thereof. And what is not described in detail in this specification is prior art known to those skilled in the art.

Claims (10)

1. The automatic deviation correcting method for the wavelength of the DML optical module is characterized by comprising the following steps of:

setting a wavelength deviation correcting parameter configuration table, wherein the wavelength deviation correcting parameter configuration table is used for storing ADC values of each emission wavelength of the optical module corresponding to TEC target temperature when TX LOL/TX LOS alarms exist or not;

periodically acquiring LOL/LOS states from a laser driving unit of the DML optical module, and judging whether TX LOL/TX LOS alarms are generated in the transmitting direction;

inquiring in a wavelength deviation correcting parameter configuration table by taking the current emission wavelength as an index according to a judging result of whether the TX LOL/TX LOS alarm is generated or not, and obtaining a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

2. The method for automatically correcting the wavelength of a DML optical module according to claim 1, wherein the wavelength correction parameter configuration table includes: a sub-table with alarm parameters and a sub-table without alarm parameters;

the alarm parameter sub-table comprises: when TX LOL/TX LOS alarms exist, the tunable N emission wavelengths of the optical module respectively correspond to TEC target temperature ADC values;

the alarm-free parameter sub-table comprises: when no TX LOL/TX LOS alarm is given, the tunable N emission wavelengths of the optical module respectively correspond to the TEC target temperature ADC values.

3. The method for automatically correcting the wavelength of the DML optical module according to claim 2, wherein the method for automatically correcting the wavelength of the DML optical module is characterized by searching in a wavelength correction parameter configuration table by taking the current emission wavelength as an index according to the determination result of whether to generate the TX LOL/TX LOS alarm, and obtaining the TEC target temperature ADC value corresponding to the current emission wavelength, specifically comprising:

when the generation of TX LOL/TX LOS alarm is judged, the current emission wavelength of the DML optical module is obtained, the alarm parameter sub-table is inquired by taking the wavelength as an index, and an ADC value corresponding to the TEC target temperature corresponding to the current emission wavelength is obtained;

when the TX LOL/TX LOS alarm is judged not to be generated, the current transmission wavelength of the DML optical module is obtained, the alarm-free parameter sub-table is queried by taking the wavelength as an index, and an ADC value corresponding to the TEC target temperature corresponding to the current transmission wavelength is obtained.

4. The automatic deviation correcting method for DML optical module wavelength according to claim 1, wherein in the wavelength deviation correcting parameter configuration table, the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature is obtained by a test mode or a program automatic calculation mode.

5. The method for automatically correcting the wavelength of a DML optical module according to claim 4, wherein the method for obtaining the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature by a test method specifically comprises:

under the condition that the emission wavelength of the DML optical module is unchanged, ADC values of TEC target temperature corresponding to the current emission wavelength are tested when no modulation signal exists and when the modulation signal exists respectively by using a test instrument and a test tool;

if the DML optical module can tune N different emission wavelengths, respectively testing ADC values of TEC target temperatures corresponding to the emission wavelengths when no modulation signal exists and modulation signals exist for the N different emission wavelengths.

6. The method for automatically correcting the wavelength of a DML optical module according to claim 4, wherein the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature is obtained by a program automatic calculation method, specifically comprising:

according to the corresponding relation between the modulation current value and the DML TOSA emission wavelength value and the corresponding relation between the TEC target temperature value and the DML TOSA emission wavelength value, under the condition that the DML optical module emission wavelength is unchanged, calculating the ADC value of the TEC target temperature corresponding to the current emission wavelength when no modulation signal exists and when the modulation signal exists by utilizing an automatic calculation program;

if the DML optical module can tune N different emission wavelengths, respectively calculating ADC values of TEC target temperatures corresponding to the emission wavelengths when no modulation signal exists and the modulation signal exists for the N different emission wavelengths.

7. The method for automatically correcting the wavelength of a DML optical module of claim 1, further comprising the steps of:

after the TEC temperature control ADC value is successfully set, the emission wavelength of the TOSA in the DML optical module is automatically adjusted to a target value consistent with the wavelength of the currently connected channel.

8. The automatic deviation correcting method for the wavelength of the DML optical module according to claim 1, wherein the method comprises the following steps: the set wavelength deviation correcting parameter configuration table is stored in a memory of the DML optical module as factory configuration.

9. A DML optical module applying the method of any one of claims 1 to 8, characterized in that the DML optical module comprises:

a wavelength correction parameter configuration table for: when TX LOL/TX LOS alarm is stored or not, the ADC value of each emission wavelength of the optical module corresponding to the TEC target temperature is stored;

the state acquisition and alarm judging module is used for: periodically acquiring LOL/LOS states from a laser driving unit of the DML optical module, and judging whether TX LOL/TX LOS alarms are generated in the transmitting direction;

the deviation rectifying processing module is used for: inquiring in a wavelength deviation correcting parameter configuration table by taking the current emission wavelength as an index according to a judging result of whether the TX LOL/TX LOS alarm is generated or not, and obtaining a TEC target temperature ADC value corresponding to the current emission wavelength; and after the acquisition is successful, setting the TEC temperature control ADC value as the currently acquired TEC target temperature ADC value.

10. A DWDM system, characterized by: the system comprises the DML optical module of claim 9 in the SNI side and/or UNI side.

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