CN113870699B - Display panel and test terminal thereof - Google Patents
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- CN113870699B CN113870699B CN202111057114.6A CN202111057114A CN113870699B CN 113870699 B CN113870699 B CN 113870699B CN 202111057114 A CN202111057114 A CN 202111057114A CN 113870699 B CN113870699 B CN 113870699B
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- 238000012360 testing method Methods 0.000 title claims abstract description 229
- 239000002184 metal Substances 0.000 claims abstract description 347
- 239000010410 layer Substances 0.000 claims description 119
- 239000000758 substrate Substances 0.000 claims description 13
- 239000011241 protective layer Substances 0.000 claims description 10
- 238000012546 transfer Methods 0.000 claims description 3
- 230000007797 corrosion Effects 0.000 abstract description 23
- 238000005260 corrosion Methods 0.000 abstract description 23
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- 238000010586 diagram Methods 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 239000002355 dual-layer Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 230000007480 spreading Effects 0.000 description 2
- 238000003892 spreading Methods 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
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- 239000004973 liquid crystal related substance Substances 0.000 description 1
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- 230000000979 retarding effect Effects 0.000 description 1
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- 238000003860 storage Methods 0.000 description 1
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
- G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
- G09F9/30—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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Abstract
The application discloses a display panel and a test terminal thereof, wherein the display panel comprises a test wiring arranged in the display panel; test terminal connects and test is walked the line, and test terminal includes: a first metal pad; the first insulating layer is arranged on the first metal liner; the second metal gasket is arranged on the first insulating layer, the first metal gasket and the second metal gasket are connected to the same test connecting wire, the first metal gasket and the second metal gasket are arranged on different metal layers, the second insulating layer is arranged on the second metal gasket, a plurality of first through holes are formed in the position, corresponding to the first metal gasket, of the second insulating layer, a plurality of second through holes are formed in the position, corresponding to the second metal gasket, of the second insulating layer, and the conducting layer is arranged on the second insulating layer and is electrically connected with the first metal gasket through the first through holes and is electrically connected with the second metal gasket through the second through holes. The corrosion resistance of the test terminal of the display panel is improved through the scheme.
Description
Technical Field
The application relates to the technical field of display, in particular to a display panel and a test terminal thereof.
Background
The manufacturing process of the display panel is often complex, for example, taking a liquid crystal display panel as an example, which includes an array substrate manufacturing process, a color film substrate manufacturing process, a box alignment process, and a cutting process, so that a large display panel motherboard is cut into a plurality of display panel sub-boards. For reasons of process yield, a certain detection is required after each step of critical process to ensure the normal operation of the subsequent process, and here, the wiring process of the array substrate is taken as an example, and the driving wiring on the array substrate, such as the signal lines of the scanning line, the data line, and the like, need to detect whether the process defects, such as wire breakage, and the like, exist. In order to test the yield, the array substrate is generally formed with test traces, and the exposed test terminals of the test traces are connected with external signals to detect the test traces inside the array substrate.
However, the exposed test terminal is exposed to the environment and is easily corroded by water vapor in the environment, and once the metal layer in the test terminal is corroded, the corrosion is continuous, so that the whole test wire cannot be used, and furthermore, the corrosion of the test wire leads to the whole display panel being scrapped. How to solve the corrosion problem of the test terminals is a urgent problem for those skilled in the art.
Disclosure of Invention
The purpose of the application is to provide a display panel and a test terminal thereof, so as to improve the corrosion resistance of the test terminal of the display panel.
The application discloses a test terminal of a display panel, wherein the display panel comprises a test wiring and a test terminal which are arranged in the display panel; the test terminal is connected to the test trace, the test terminal includes: a first metal pad, a first insulating layer, a second metal pad, a second insulating layer, and a conductive layer; a first insulating layer disposed on the first metal pad; the second metal pad is arranged on the first insulating layer, the first metal pad and the second metal pad are connected to the same test wiring, the first metal pad and the second metal pad are arranged on different layers, and the first metal pad and the second metal pad are isolated through the first insulating layer; the second insulating layer is arranged on the second metal liner, the second insulating layer is provided with a plurality of first through holes, the positions of the first through holes and the first metal liner are corresponding, the positions of the first metal liner corresponding to the first through holes are exposed, the second insulating layer is provided with a plurality of second through holes, the positions of the second through holes corresponding to the second metal liner are exposed, and the positions of the second metal liner corresponding to the second through holes are exposed; and the conductive layer is arranged on the second insulating layer and is electrically connected with the first metal pad and the second metal pad through the first through holes and the second through holes respectively.
Optionally, the orthographic projection of the first metal pad and the second metal pad on the substrate of the display panel is not coincident.
Optionally, the test wiring includes a test connection line and a test main line, and the test main line is connected with the test terminal through the test connection line; the test connection line comprises a first metal connection line and a second metal connection line, wherein the first metal connection line and the first metal pad are located on the same layer, and the second metal connection line and the second metal pad are located on the same layer.
Optionally, the test terminal further includes a first branch and a second branch, where the first branch is disposed in the same layer as the first metal pad, and the second branch is disposed in the same layer as the second metal pad; the first metal pad is connected to the first metal connection line through the first branch, and the second metal pad is connected to the second metal connection line through the second branch; the first branch and the second branch are isolated by the insulating layer; the length of the first branch is larger than or equal to a second preset length, and the length of the second branch is larger than or equal to the second preset length.
Optionally, the test main line and the first metal connecting line are disposed on the same layer, and the test main line is directly connected to the first metal connecting line, and the test main line is connected to the second metal connecting line through the transfer hole.
Optionally, the direction of the first metal pad towards the test trace is taken as a first direction, the width of the first branch is gradually narrowed along the first direction, the width of the second branch is gradually narrowed along the first direction, the sum of the minimum width of the first branch, the minimum width of the second branch and the distance between the first branch and the second branch is equal to the width of the test trace, the maximum width of the first branch is equal to the width of the first metal pad, and the maximum width of the second branch is equal to the width of the second metal pad.
Optionally, the width of the first branch is equal to the width of the first metal pad, and the width of the second branch is equal to the width of the second metal pad; taking the direction of the first metal pad facing the test wire as a first direction; the test terminal further comprises a test connecting wire, the first branch and the second branch are connected with the test wiring through the test connecting wire, the width of the test connecting wire in the first direction is gradually reduced, the maximum width of the test connecting wire is equal to the width of the first metal gasket, the width of the second metal gasket and the interval between the first metal gasket and the second metal gasket, and the sum of the first branch, the second branch and the interval between the first metal gasket and the second metal gasket is equal to the maximum width of the test connecting wire in the first direction; the minimum width of the test connecting wire is equal to the width of the test wiring.
Optionally, the test terminal further includes a protection layer, where the protection layer is disposed on the conductive layer, and the protection layer is disposed corresponding to the first metal pad.
Optionally, the protective layer is completely coincident with an orthographic projection of the first metal pad on the substrate of the display panel.
The application also discloses a display panel, including many test wires and a plurality of foretell test terminal, a plurality of test terminal with many test wires one-to-one is connected.
The metal gasket in the test terminal is arranged in a blocking mode, namely the metal gasket is divided into two metal gaskets, the first metal gasket and the second metal gasket are respectively located on different metal layers, but the two metal gaskets are still one test terminal and are simultaneously connected to the same test wiring, and therefore the two metal gaskets are actually the same test signal transmitted. After the metal layers are arranged in blocks and are positioned on different metal layers, even if one metal layer is corroded by water vapor, the metal gasket in the test terminal cannot be completely corroded, after the metal layer is arranged in blocks, for example, after the first metal gasket is corroded, more metal can be continuously corroded due to continuity of metal corrosion, and the second metal gasket is not in direct contact with the first metal gasket and is provided with different layers with the first metal gasket, so that the metal gasket cannot directly spread to the second metal gasket. Even if the first metal gasket is corroded, the second metal gasket is not affected by the first metal gasket, so that the normal operation of the test terminal can be protected, and the corrosion resistance of the test terminal is improved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the application and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain the principles of the application. It is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained from these drawings without inventive faculty for a person skilled in the art. In the drawings:
fig. 1 is a schematic view of a display panel according to a first embodiment of the present application;
FIG. 2 is a schematic top view of a first test terminal of a first embodiment of the present application;
FIG. 3 is a schematic cross-sectional view along AA of FIG. 2 of the present application;
FIG. 4 is a schematic cross-sectional view along BB of FIG. 2 of the present application;
FIG. 5 is a schematic view of a second test terminal of the first embodiment of the present application;
FIG. 6 is a schematic view of a third test terminal of the first embodiment of the present application;
FIG. 7 is a schematic view of a first test terminal of a second embodiment of the present application;
FIG. 8 is a schematic view of a second test terminal of a second embodiment of the present application;
FIG. 9 is a schematic top view of a test terminal according to a third embodiment of the present application;
FIG. 10 is a schematic cross-sectional view of FIG. 9 of the present application along line CC;
fig. 11 is a schematic cross-sectional view of a first test terminal of a third embodiment of the present application.
10, a display panel; 100. a test terminal; 111. a first metal pad; 112. a second metal pad; 113. a first branch; 114. a second branch; 115. a third branch; 116. a fourth branch; 118. an extension; 119. a first insulating layer; 120. a second insulating layer; 121. a first via; 122. a second via; 123. a transfer hole; 130. a conductive layer; 140. a protective layer; 200. testing the wiring; 201. testing a main line; 202. testing the connecting wire; 2021. a first metal connection line; 2022. a second metal connection line; 300. the trace is driven.
Detailed Description
It should be understood that the terminology, specific structural and functional details disclosed herein are merely representative for purposes of describing particular embodiments, but that the application may be embodied in many alternate forms and should not be construed as limited to only the embodiments set forth herein.
In the description of the present application, the terms "first", "second" are used for descriptive purposes only and are not to be construed as indicating relative importance or implicitly indicating the number of technical features indicated. Thus, unless otherwise indicated, features defining "first", "second" may include one or more such features either explicitly or implicitly; the meaning of "plurality" is two or more. The terms "comprises," "comprising," and any variations thereof, are intended to cover a non-exclusive inclusion, such that one or more other features, integers, steps, operations, elements, components, and/or groups thereof may be present or added.
In addition, terms of the azimuth or positional relationship indicated by "center", "lateral", "upper", "lower", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., are described based on the azimuth or relative positional relationship shown in the drawings, are merely for convenience of description of the present application, and do not indicate that the apparatus or element referred to must have a specific azimuth, be configured and operated in a specific azimuth, and thus should not be construed as limiting the present application.
Furthermore, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; either directly or indirectly through intermediaries, or in communication with each other. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art as the case may be.
The present application is described in detail below with reference to the attached drawings and alternative embodiments.
Embodiment one:
as shown in fig. 1, as a first embodiment of the present application, a schematic diagram of a display panel 10 is disclosed, which includes a plurality of test traces 200 and a plurality of test terminals 100, wherein a plurality of the test terminals 100 are connected to a plurality of the test traces 200 in a one-to-one correspondence manner, the test traces 200 are connected to a driving trace 300 inside the display panel 10, and the driving trace 300 may include a data line, a scan line, a gate driving line, a source driving line, a clock signal line, and the like. It should be noted that, the main improvement of the present application is in the structural aspect of the test terminal 100, and the test terminal 100 is not limited to the connection test wire 200, but the wires corresponding to the display panel 10 and requiring connection of the test terminal 100 are applicable, which belongs to the protection scope of the present application. The test terminal 100 is specifically described below:
as shown in fig. 2, which is a schematic top view of the test terminal 100 according to the first embodiment of the present application, further in combination with fig. 3, which shows a schematic cross-sectional view of the test terminal 100 along AA of fig. 2, a test terminal 100 of a display panel 10 is disclosed, the test terminal 100 comprising: a first metal pad 111, a first insulating layer 119, a second metal pad 112, a second insulating layer 120, and a conductive layer 130; a first insulating layer 119 is disposed on the first metal pad 111; a second metal pad 112 is disposed on the first insulating layer 119, the first metal pad 111 and the second metal pad 112 are connected to the same test connection line 202, the first metal pad 111 and the second metal pad 112 are disposed on different metal layers, and the first metal pad 111 and the second metal pad 112 are isolated by the first insulating layer 119; the second insulating layer 120 is disposed on the second metal pad 112, and a plurality of first vias 121 are disposed at positions of the second insulating layer 120 corresponding to the first metal pad 111, the positions of the first metal pad 111 corresponding to the first vias 121 are exposed, a plurality of second vias 122 are disposed at positions of the second insulating layer 120 corresponding to the second metal pad 112, and the positions of the second metal pad 112 corresponding to the second vias 122 are exposed; and a conductive layer 130 disposed on the second insulating layer 120 and electrically connected to the first metal pad 111 through the plurality of first vias 121 and electrically connected to the second metal pad 112 through the plurality of second vias 122. The first via 121 passes through the first insulating layer 119 and the second insulating layer 120, so that the first metal pad 111 is exposed, and the second via 122 passes through the second insulating layer 120 only, so that the second metal pad 112 is exposed. It should be noted that, the conductive layer 130 may be a transparent conductive layer, or may be a metal layer.
The metal pads in the test terminals are arranged in blocks, namely, the metal pads are divided into two metal pads, and the first metal pad 111 and the second metal pad 112 are respectively located in different metal layers, but the two metal pads are still one test terminal and are simultaneously connected to the same test wire 200, so that the two metal pads are actually the same test signal transmitted. The metal layers are arranged in blocks and are positioned on different metal layers, and even if one metal layer is corroded by water vapor, the metal gasket in the test terminal cannot be completely corroded, for example, after the first metal gasket 111 is corroded by blocks, more metal can be continuously corroded due to continuity of metal corrosion, and the second metal gasket 112 is not in direct contact with the first metal gasket 111 and is provided with different layers with the first metal gasket 111, so that the metal gasket cannot directly spread to the second metal gasket 112. Even if the first metal pad 111 is corroded, the second metal pad 112 is not affected by the first metal pad 111, so that normal operation of the test terminal can be protected, and corrosion resistance of the test terminal can be improved. It should be noted that, in this application, the first metal pad 111 and the second metal pad 112 are located in different metal layers, and in this application, the first metal pad 111 is located in a first metal layer, the second metal pad 112 is located in a second metal layer, where the first metal layer is located in the same metal layer as the gate electrode of the thin film transistor in the display panel, and the second metal layer is located in the same metal layer as the source electrode and the drain electrode of the thin film transistor in the display panel.
Specifically, the orthographic projection of the first metal pad 111 and the second metal pad 112 do not coincide. I.e. the first metal pad 111 and the second metal pad 112 are located in different layers, but the orthographic projections on the substrate of the display panel are completely non-overlapping. After first overlapping, at least the exposed area of the first metal pad 111 becomes smaller, resulting in a decrease in the first via 121 provided in the first metal pad 111, and a decrease in the resistance between the first metal pad 111 and the external probe. Moreover, if the first metal pad 111 and the second metal pad 112 are formed, in the process, the insulating layer in the overlapping area of the first metal pad 111 and the second metal pad 112 may have some particles of metal layer material remained, so that the first insulating layer 119 between the first metal pad 111 and the second metal pad 112 breaks down, resulting in direct connection between the first metal pad 111 and the second metal pad 112, and if one of the metal pads is corroded, the other metal pad is corroded simultaneously, resulting in failure of the test terminal. Therefore, the first metal pad 111 and the second metal pad 112 do not coincide at all, and the space L between the orthographic projections of the first metal pad 111 and the second metal pad 112 may be set to be 0um or more and 20um or less. For the interval L of 0um, the first metal pad 111 and the second metal pad 112 are just abutted on projection. But the first insulating layer 119 may have a spacing L between the second metal pad 112 and the orthographic projection of the first metal pad 111 of generally greater than 0um due to the formation of a segment at the boundary of the first metal pad 111. Of course, the sum of the areas of the first metal pad 111 and the second metal pad 112 in the present embodiment is the area of the metal pad in the conventional test terminal, and in the case of increasing the area of the first metal pad 111 or the second metal pad 112, if the area of the whole test terminal is to be ensured not to be increased, there may be a case of partially overlapping the first metal pad 111 and the second metal pad 112. The orthographic projection stated herein refers to a film layer on a substrate of a display panel, for example, a projection of the first metal pad 111 on the substrate is orthographic projection.
Fig. 4 shows a schematic cross-sectional view along BB of fig. 2, specifically a schematic cross-sectional view of test trace 200: the test wiring 200 comprises a test connection line 202 and a test main line 201, and the test main line 201 is connected with the test terminal through the test connection line 202; the test connection line 202 includes a first metal connection line 2021 and a second metal connection line 2022, the first metal connection line 2021 is located at the same layer as the first metal pad 111, and the second metal connection line 2022 is located at the same layer as the second metal pad 112. The first metal pad 111 and the second metal pad 112 are respectively located in different metal layers, so that a section of transition line, namely a test connection line 202, needs to be disposed on the test trace 200, and also a double-layer metal layer is adopted to be disposed and connected with the first metal pad 111 and the second metal pad 112 respectively. And the first metal connection line 2021 and the second metal connection line 2022 are overlapped on the front projection of the display panel.
Specifically, the test main line 201 and the first metal connection line 2021 may be disposed on the same layer, and the test main line 201 is directly connected to the first metal connection line 2021, and the test main line 201 and the second metal connection line 2022 are through the via 123. It should be noted that, the test main line 201 may be a single metal layer or a double metal layer; the test connection line 202 is connected to the single-layer test main line 201 to perform a transition function, and the second metal connection line 2022 may be connected to the first metal layer through the via 123.
Specifically, as shown in fig. 2, the test terminal further includes a first branch 113 and a second branch 114, where the first branch 113 is disposed in the same layer as the first metal pad 111, and the second branch 114 is disposed in the same layer as the second metal pad 112; the first metal pad 111 is connected to the first metal connection line 2021 through the first branch 113, and the second metal pad 112 is connected to the second metal connection line 2022 through the second branch 114; the first branch 113 is isolated from the second branch 114 by the insulating layer; the length M of the first branch 113 is greater than or equal to a second preset length, and the length M of the second branch 114 is greater than or equal to the second preset length. Wherein the first branch 113 and the second branch 114 do not overlap at all on the front projection of the display panel, and may be similar to the design of the first metal pad 111 and the second metal pad 112.
The first metal pad 111 or the second metal pad 112 may be corroded to propagate to the test trace 200, and if the test trace 200 is corroded, the test trace will not be tested first, and the driving trace in the display panel will be affected later, which will cause a larger effect. Thus, by arranging the branches such that the first metal pad 111 and the second metal pad 112 are connected to the test trace 200 through the branches, respectively, even in the case where the first metal pad 111 or the second metal pad 112 is corroded, there is a retarding effect of the first branch 113 or the second branch 114 to prevent corrosion from spreading to the test trace 200 even if corrosion is performed in the direction of the test trace 200. And the length M of the first branch 113 and the second branch 114 is equal to or greater than a second preset length, and the second preset length is tested under the same conditions as described above: after testing the corrosion of the first metal pad 111 at a temperature of 85 degrees celsius and a humidity of 85% rh, the corrosion of the first branch at different lengths, e.g., 10um, 30um, 50um, 70um and 100um, is shown in the following table: wherein, the abscissa in the table represents test time in hours, the ordinate represents different pitches in micrometers, and the table represents resistance test values in ohms. From the above experimental data, it is known that the corrosion propagation of the first branch is better in the case that the second preset length is 50 um.
Table 2: high temperature and high humidity storage verification
Specifically, the width of the first branch 113 is equal to the width of the second branch 114, and the width of the first branch 113 is smaller than the width of the test trace 200; and the distance between the first branch 113 and the second branch 114 is greater than or equal to the first preset length. In general, the width of the metal layer in the test terminal is larger than the width of the test trace 200, and thus, taking the first metal pad 111 and the first branch 113 as an example, the width of the first metal pad 111 is larger than the width of the first branch 113, and there is a sudden change from wide to narrow at the connection position of the first branch 113 and the first metal pad 111, the first branch 113 is narrower, so that the possibility that the corrosion of the first metal pad 111 propagates to the first branch 113 is reduced. The test connection line 202, the first branch 113, the second branch 114, the first metal pad 111, and the second metal pad 112 are identical in length. The inner boundary of the first branch 113 is aligned with the inner boundary of the first metal pad 111, and the inner boundary of the second branch 114 is aligned with the inner boundary of the second metal pad 112; the outer boundaries of the first branch 113 and the second branch 114 are aligned with the boundaries of the test connection line 202, respectively.
As shown in fig. 5, which shows a modification of the first embodiment of the present application, a second application of the test terminal is disclosed, where the test terminal is designed as the test terminal in the figure, and the difference is that the direction of the test trace 200 is different from the direction of the terminal, and the corresponding first branch 113 is connected to one end of the test trace 200, and the second branch 114 is connected to the line of the test connection line 202. In this embodiment, the space between the first branch 113 and the second branch 114 is not limited by the width of the test trace 200, and in general, the connection between the branch and the test trace 200 is formed, the boundary of the line width of the branch is aligned with the boundary of the line width of the test trace 200, for example, in the figure, the boundary of the first branch 113 is aligned with the boundary of the test trace 200, so that the line width of the test trace 200 is limited, and the distance between the first branch 113 and the second branch 114 is limited. While for the solution of the figure the distance between the first branch 113 and the second branch 114 can be made larger. Of course, in the present embodiment, the test connection line 202 may be disposed in a single metal layer, for example, the first metal pad 111 is disposed in the same metal layer, and the second branch 114 connected to the corresponding second metal pad 112 may be electrically connected to the test connection line 202 through the via 123.
It should be noted that, in this embodiment, the first branch 113 and the second branch 114, and the first metal pad 111 and the second metal pad 112 are symmetrically disposed, and the corresponding sizes and shapes are consistent. However, in practical selection, the first and second metal pads 111 and 112, the first and second branches 113 and 114 may be designed in different shapes and sizes according to different designs. The conductive layer 130 covers the first metal pad 111 and the second metal pad 112, and the conductive layer 130 is a monolithic design, so that an external probe contacts the conductive layer during testing to respectively conduct the first metal pad 111 and the second metal pad 112.
As shown in fig. 6, as a second modification of the first embodiment of the present application, a third application of the test terminal is disclosed, in general, the test traces 200 are used to connect the test terminals, and for a motherboard formed by a plurality of display panels, the test traces 200 of each display panel need to be connected together on the motherboard, a test board is disposed on one side of the motherboard, and after the motherboard completes the process, that is, a unified test is performed on each display panel on the motherboard to detect the yield. The test wires 200 connected to the test terminals on the corresponding display panels penetrate the corresponding test terminals, specifically, the metal layer further includes a third branch 115, a fourth branch 116 and an extension portion 118, and the extension portion 118 is the test wire 200; the extension 118 connects the first metal pad 111 and the second metal pad 112 through the third branch 115 and the fourth branch 116, respectively; the third branch 115 and the first branch 113 are disposed on different sides of the first metal pad 111, and the fourth branch 116 and the second branch 114 are disposed on different sides of the second metal pad 112. Because the metal layer has continuity and directionality after corrosion, the directionality, i.e. the metal layer will corrode and spread towards the extending direction of the metal layer, the corresponding test wires 200 connected with the test terminals are required to be provided with branch structures, so as to prevent the test terminals from spreading onto the test wires 200 after corrosion.
Embodiment two:
as shown in fig. 7, as a second embodiment of the present application, a schematic diagram of a test terminal is disclosed, the test terminal includes a first metal pad 111, a first branch 113, a second metal pad 112, a second branch 114, and a test connection line 202 of a test trace 200, where the test connection line 202 may employ the above-mentioned dual-layer metal layer design. Taking the direction of the first metal pad 111 towards the test trace 200 as a first direction, the width of the first branch 113 gradually narrows along the first direction, the width of the second branch 114 gradually narrows along the first direction, the sum of the minimum width of the first branch 113, the minimum width of the second branch 114, the distance between the first branch 113 and the second branch 114 is equal to the width of the test connecting line 202, the maximum width of the first branch 113 is equal to the width of the first metal pad 111, and the maximum width of the second branch 114 is equal to the width of the second metal pad 112.
Specifically, the width of the first branch 113 and the second branch 114 gradually changes, but the boundary of the side, close to the first branch 113 and the second branch 114, is still flush with the first metal pad 111, and the distance between the first branch 113 and the second branch 114 is the same as the distance between the first metal pad 111 and the second metal pad 112, and the boundary of the side, away from the second branch 114, of the first branch 113 gradually extends in the first direction toward the direction close to the second branch 114. In this embodiment, the widths of the first branch 113 and the second branch 114 are gradually reduced in the first direction, so as to achieve the consistency of the widths of the branches and the test trace 200, so as to solve the problem of abrupt resistance at the connection between the test trace 200 and the branches, where the branches are wider than those of the first embodiment, so that the resistances are smaller. And even after one metal pad is corroded, even the corresponding branch is corroded, the metal pad and the branch can work normally through the other metal pad.
As a variation of the second embodiment of the present application, as shown in fig. 8, a schematic diagram of a second test terminal is disclosed, where the test terminal includes a first metal pad 111, a first branch 113, a second metal pad 112, a second branch 114, and a test connection line 202 of a test trace 200, where the test connection line 202 may be designed with a dual-layer metal layer as described above, and the structures are all structures on the metal layer, that is, a metal layer process is adopted. The width of the first branch 113 is equal to the width of the first metal pad 111, and the width of the second branch 114 is equal to the width of the second metal pad 112; the first branch 113 and the second branch 114 are connected to the test main line 201 through the test connection line 202, the width of the test connection line 202 in the first direction is gradually reduced, and the maximum width of the test connection line 202 is equal to the sum of the width of the first metal pad 111, the width of the second metal pad 112 and the distance between the first metal pad 111 and the second metal pad 112; the minimum width of the test connection line 202 is equal to the width of the test main line 201. The embodiment mainly solves the problem of resistance at the branch, and if the branch resistance is large, the embodiment has influence on the test signal, so that the problem of inaccurate test result is caused.
Embodiment III:
as shown in fig. 9 and 10, as a third embodiment of the present application, a schematic diagram of a test terminal is disclosed, which includes a first metal pad 111, a first branch 113, a second metal pad 112, a second branch 114, and a test trace 200. The structure is the same as that of the first and second embodiments, and any one of the structures of the first and second embodiments may be selected, where it is important that the test terminal further includes a protection layer 140, the protection layer 140 is disposed on the conductive layer 130, and the protection layer 140 is disposed corresponding to the first metal pad 111.
In this embodiment, the protection layer 140 is disposed to cover one of the metal pads, here, taking the first metal pad 111 as an example, the exposed position of the first metal pad 111 is covered by the protection layer 140, so that the first metal pad 111 is not exposed. The first metal pad 111 and the second metal pad 112 in the test terminal are separated, but the conductive layer 130 is a whole, and when the external probe contacts with the conductive layer 130 above the second metal pad 112, the external probe is actually electrically connected with the first metal pad 111 and the probe. Through the arrangement of the protective layer 140, one of the metal gaskets can be well protected, so that the possibility of being corroded by water vapor is greatly reduced, and the corrosion resistance is greatly improved. By exposing a part of the metal pads of the test terminal, i.e., the second metal pad 112, and a part of the metal pads of the test terminal, i.e., the first metal pad 111, to cover the protection layer 140, it is possible to achieve both contact with the external probe and protection of a part of the metal pads. And the risk of corrosion of this part of the protected metal pad is still low after corrosion of the metal pad. Further, the protective layer 140 is completely coincident with the orthographic projection of the first metal pad 111. Moreover, it is important that the greater the depth of the first via 121 corresponding to the first metal pad 111 compared to the depth of the second via 122, the greater the risk of corrosion of the first metal pad 111, and thus the risk of corrosion of the first metal pad 111 is greatly reduced by the arrangement of the protective layer 140 on the first metal pad 111 compared to the arrangement of the protective layer 140 on the second metal pad 112. And the second metal pad 112 is less likely to corrode than the first metal pad 111.
Specifically, the width of the first branch 113 is greater than that of the second branch 114, in the solution provided with the protection layer 140, if corrosion occurs, only the exposed second metal pad 112 is more likely to corrode, and the first metal pad 111 and the first branch 113 play a role in transmitting signals finally, so that the width of the first branch 113 is set to be slightly greater, the corresponding resistance is smaller, and the influence on the test signals is smaller. In combination with the figures, it may be achieved that the width of the second branch 114 is made larger. The sizes of the first metal pad 111 and the second metal pad 112 may also be designed in consideration of the actual size of the probe, for example, the area of the first metal pad 111 is smaller than that of the second metal pad 112, and in actual use, the area of the metal layer required by the probe is constant, where it is more desirable that the second metal pad 112 can better transmit signals when contacting with an external probe.
As shown in fig. 11, as a modification of the third embodiment, the first metal pad and the second metal pad partially overlap on the projection of the display panel, and the area of the first metal pad covered by the corresponding protective layer is smaller. The distance H between the corresponding overlapping portions is about 20um.
It should be noted that the present embodiment may be combined with the different designs of the first, second and third embodiments, and the inventive concept of the present application may form a very large number of embodiments, but the application documents are limited in size and cannot be listed one by one, so that the above-described embodiments or technical features may be arbitrarily combined to form new embodiments without conflict, and the original technical effects will be enhanced after the combination of the embodiments or technical features
The technical scheme of the application can be widely applied to various display panels, such as TN (Twisted Nematic) display panels, IPS (In-Plane Switching) display panels, VA (Vertical Alignment) display panels, MVA (Multi-Domain Vertical Alignment) display panels, and of course, other types of display panels, such as OLED (Organic Light-Emitting Diode) display panels, can be also applied to the scheme.
The foregoing is a further detailed description of the present application in connection with specific alternative embodiments, and it is not intended that the practice of the present application be limited to such descriptions. It should be understood that those skilled in the art to which the present application pertains may make several simple deductions or substitutions without departing from the spirit of the present application, and all such deductions or substitutions should be considered to be within the scope of the present application.
Claims (10)
1. A test terminal of a display panel, the display panel comprising a test trace and a test terminal, the test terminal being connected to the test trace, characterized in that,
the test terminal includes:
a first metal pad;
a first insulating layer disposed on the first metal pad;
the first metal pad and the second metal pad are arranged on the first insulating layer, are connected to the same test wiring, are arranged on different layers, and are isolated through the first insulating layer;
the second insulating layer is arranged on the second metal liner, a plurality of first through holes are formed in the second insulating layer, the positions of the first through holes correspond to the positions of the first metal liner, the positions of the first metal liner corresponding to the first through holes are exposed, a plurality of second through holes are formed in the second insulating layer, the positions of the second through holes corresponding to the second metal liner are exposed, and the positions of the second metal liner corresponding to the second through holes are exposed; and
the conductive layer is arranged on the second insulating layer and is electrically connected with the first metal pad and the second metal pad through the first through holes and the second through holes respectively.
2. The test terminal of claim 1, wherein the orthographic projection of the first metal pad and the second metal pad on the substrate of the display panel do not coincide.
3. The test terminal of claim 1, wherein the test trace includes a test connection line and a test main line, the test main line being connected to the test terminal through the test connection line; the test connection line comprises a first metal connection line and a second metal connection line, wherein the first metal connection line and the first metal pad are located on the same layer, and the second metal connection line and the second metal pad are located on the same layer.
4. The test terminal of claim 3, further comprising a first branch and a second branch, the first branch being co-layered with the first metal pad and the second branch being co-layered with the second metal pad;
the first metal pad is connected to the first metal connection line through the first branch, and the second metal pad is connected to the second metal connection line through the second branch; the first branch and the second branch are isolated by the insulating layer; the length of the first branch is larger than or equal to a second preset length, and the length of the second branch is larger than or equal to the second preset length.
5. The test terminal of claim 3, wherein the test main line and the first metal connection line are disposed at the same layer, and the test main line is connected to the first metal connection line, and the test main line is connected to the second metal connection line through a transfer hole.
6. The test terminal of claim 4, wherein a direction of the first metal pad toward the test trace is a first direction, a width of the first branch is gradually narrowed along the first direction, a width of the second branch is gradually narrowed along the first direction, a minimum width of the first branch, a minimum width of the second branch, and a distance between the first branch and the second branch are equal to a width of the test trace, a maximum width of the first branch is equal to a width of the first metal pad, and a maximum width of the second branch is equal to a width of the second metal pad.
7. The test terminal of claim 4, wherein the first branch has a width equal to a width of the first metal pad and the second branch has a width equal to a width of the second metal pad; taking the direction of the first metal pad facing the test wire as a first direction;
the test terminal further comprises a test connecting wire, the first branch and the second branch are connected with the test wiring through the test connecting wire, the width of the test connecting wire in the first direction is gradually reduced, the maximum width of the test connecting wire is equal to the width of the first metal gasket, the width of the second metal gasket and the interval between the first metal gasket and the second metal gasket, and the sum of the first branch, the second branch and the interval between the first metal gasket and the second metal gasket is equal to the maximum width of the test connecting wire in the first direction; the minimum width of the test connecting wire is equal to the width of the test wiring.
8. The test terminal of claim 1, further comprising a protective layer disposed on the conductive layer, the protective layer disposed corresponding to the first metal pad.
9. The test terminal of claim 8, wherein the protective layer is fully coincident with an orthographic projection of the first metal pad on a substrate of the display panel.
10. A display panel comprising a plurality of test traces, wherein the display panel further comprises a plurality of test terminals according to any one of claims 1 to 9, and wherein a plurality of the test terminals are connected to a plurality of the test traces in a one-to-one correspondence.
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| US7014521B1 (en) * | 1999-08-05 | 2006-03-21 | Canon Kabushiki Kaisha | Display panel having a color filter and a protective layer of heat melted material and method of manufacturing the display panel |
| CN102854649A (en) * | 2011-06-30 | 2013-01-02 | 上海天马微电子有限公司 | Liquid crystal display panel, liquid crystal display and manufacturing method of liquid crystal display panel |
| CN103941465A (en) * | 2014-01-29 | 2014-07-23 | 上海天马微电子有限公司 | Color film substrate, display panel and display device |
| US9831171B2 (en) * | 2014-11-12 | 2017-11-28 | Infineon Technologies Ag | Capacitors with barrier dielectric layers, and methods of formation thereof |
| US9773736B2 (en) * | 2015-01-28 | 2017-09-26 | Infineon Technologies Ag | Intermediate layer for copper structuring and methods of formation thereof |
| CN110850651B (en) * | 2019-11-05 | 2022-05-31 | 武汉华星光电技术有限公司 | Display panel and test system |
| CN112670270B (en) * | 2020-12-22 | 2024-01-26 | 武汉天马微电子有限公司 | Display panel and display device |
| CN112987351B (en) * | 2021-02-10 | 2022-08-05 | 深圳市华星光电半导体显示技术有限公司 | Short-circuit bar, display panel and display device |
| CN113035844B (en) * | 2021-02-26 | 2024-05-03 | 武汉天马微电子有限公司 | Display panel and display device |
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