CN113721085A - Submodule testing device and method - Google Patents
Submodule testing device and method Download PDFInfo
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- CN113721085A CN113721085A CN202010453953.9A CN202010453953A CN113721085A CN 113721085 A CN113721085 A CN 113721085A CN 202010453953 A CN202010453953 A CN 202010453953A CN 113721085 A CN113721085 A CN 113721085A
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- 238000012360 testing method Methods 0.000 title claims abstract description 62
- 238000000034 method Methods 0.000 title abstract description 5
- 238000004891 communication Methods 0.000 claims abstract description 26
- 238000010998 test method Methods 0.000 claims description 8
- 238000004146 energy storage Methods 0.000 claims description 6
- 238000007599 discharging Methods 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 2
- 238000009429 electrical wiring Methods 0.000 abstract description 2
- 238000001514 detection method Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
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- 239000003990 capacitor Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention discloses a submodule testing device and a method, wherein a submodule is in a full-bridge topology or a half-bridge topology, a thyristor is connected in parallel at a port of the submodule, the testing device comprises at least one current output port and at least one pair of communication interfaces, the pair of communication interfaces are a sending interface and a receiving interface, the sending interface and the receiving interface are correspondingly connected with the receiving interface and the sending interface of the submodule, one end of a voltage source in the testing device is connected with one end of the current output port through a current limiting resistor and a switch which are sequentially connected in series, the other end of the voltage source is connected with the other end of the current output port, the current output port is connected in parallel with two ends of the thyristor, and when the submodule is in the half-bridge topology, the testing device also comprises at least one current measuring port which is connected in series with the thyristor. The invention solves the problem of difficult detection of the parallel thyristor of the submodule port, and has the advantages of convenient wiring, no need of changing the electrical wiring of the original equipment and high automation degree.
Description
Technical Field
The invention belongs to the field of flexible power transmission application, and particularly relates to a test technology of a submodule.
Background
In the field of flexible power transmission application, flexible direct current converters, chain type reactive compensation devices and the like are mostly in modular design, submodule topologies are mostly in a half-bridge or full-bridge structure, thyristors are generally required to be connected in parallel at submodule ports for protecting the safety of submodules under fault conditions, and due to topological limitation and the characteristics of the thyristors, the existing submodule testing devices cannot integrate thyristor state testing functions.
Disclosure of Invention
In order to solve the technical problems mentioned in the background art, the present invention provides a submodule testing apparatus and method.
In order to achieve the technical purpose, the technical scheme of the invention is as follows:
the utility model provides a submodule testing arrangement, the submodule piece is full-bridge topology or half-bridge topology, and the port department of submodule piece is parallelly connected has the thyristor, testing arrangement includes at least one current output port and at least a pair of communication interface, and a pair of communication interface indicates send interface and receive interface, send interface and receive interface correspond the receive interface and the send interface of connecting the submodule piece, the one end of the inside voltage source of testing arrangement through the current-limiting resistance and the switch of establishing ties in proper order with current output port's one end links to each other, the other end of voltage source with current output port's the other end links to each other, current output port connects in parallel at the both ends of aforementioned thyristor, when the submodule piece is half-bridge topology, testing arrangement still includes at least one current measurement port, current measurement port establishes ties with aforementioned thyristor.
Furthermore, the testing device further comprises at least one direct current output port, the direct current output port is connected in parallel to two ends of the energy storage element of the submodule, and the direct current output port is provided with a discharging circuit.
Further, the voltage source is an alternating current voltage source or a direct current voltage source.
Further, the switch is a mechanical switch controlled by a relay, or a controllable semiconductor device switch.
Further, the communication interface includes at least one of an ethernet interface, an RS485 interface, and an S232 interface.
Further, the voltage amplitude of the voltage source is lower than the voltage amplitude of the energy storage unit of the submodule.
According to the thyristor test method based on the submodule test device, when a voltage source is an alternating current voltage source and the submodule is in a full-bridge topology, the switch is closed, the voltage of the current output port is detected to be positive, the test device controls the submodule to issue thyristor trigger pulses through the communication interface, if the absolute value of the current flowing through the current limiting resistor before the trigger pulses are issued is smaller than a set value, the value of the current flowing through the current limiting resistor after the trigger pulses are issued is equal to the voltage of the current output port divided by the resistance value of the current limiting resistor, and when the absolute value of the current flowing through the current limiting resistor is smaller than the set value after the voltage of the current output port is detected to finish the first zero crossing after the trigger pulses are issued, the state of the thyristor is judged to be normal, and otherwise the thyristor is judged to be in a fault state.
According to the thyristor test method based on the submodule test device, when a voltage source is an alternating current voltage source and the submodule is in a half-bridge topology, the switch is closed, after the voltage of a current output port is detected to be positive, the test device controls the submodule to issue thyristor trigger pulses through the communication interface, if the absolute value of the current flowing through the thyristor before the trigger pulses are issued is smaller than a set value, the current flowing through the thyristor after the trigger pulses are issued is larger than M times of the current flowing through the current limiting resistor, the value of 0< M <1, and when the absolute value of the current flowing through the thyristor after the voltage of the current output port is detected to complete the first zero crossing after the trigger pulses are issued is smaller than the set value, the state of the thyristor is judged to be normal, and otherwise the thyristor is judged to be in a fault state.
According to the thyristor test method based on the submodule test device, when a voltage source is a direct-current voltage source and the submodule is in a full-bridge topology, the switch is turned on, the test device controls the submodule to send out thyristor trigger pulses through the communication interface, the absolute value of the detected voltage of the current output port is smaller than a set value, the detected current value flowing through the current limiting resistor is equal to the voltage of the current output port divided by the resistance value of the current limiting resistor, after the switch is turned off, the switch is turned on again at an interval time T1, and if the absolute value of the voltage source subtracted from the detected voltage of the current output port is smaller than the set value, the state of the thyristor is judged to be normal, otherwise, the thyristor is judged to be in a fault state; wherein the time length of the thyristor trigger pulse is less than T1.
According to the thyristor test method based on the submodule test device, when a voltage source is a direct-current voltage source and a submodule is in a half-bridge topology, a switch is switched on, the test device controls the submodule to issue thyristor trigger pulses through a communication interface, if the absolute value of current flowing through the thyristor before the trigger pulses are issued is smaller than a set value, the current flowing through the thyristor after the trigger pulses are issued is larger than M times of current flowing through a current limiting resistor, the M is more than 0 and less than 1, the switch is switched off, the switch is switched on again at an interval time T1, the state of the thyristor is judged to be normal, and otherwise, the thyristor is judged to be in a fault state; wherein the time length of the thyristor trigger pulse is less than T1.
Adopt the beneficial effect that above-mentioned technical scheme brought:
(1) the submodule testing device and the method provided by the invention can meet the testing items of the submodule IGBT, the bypass switch, the sampling and the communication and the like, and also have the thyristor state testing function, and have the characteristic of comprehensive testing items;
(2) the submodule testing device and the submodule testing method do not need to change the electrical wiring of the original equipment, and the wiring is simple;
(3) the submodule testing device and the submodule testing method provided by the invention have perfect protection logic, and can automatically and quickly carry out discharge processing on the tested module when the tested module has electrical faults, so that the safety of operators is ensured.
Drawings
FIG. 1 is a schematic diagram of a testing apparatus with a half-bridge topology of the sub-modules;
fig. 2 is a schematic diagram of the testing apparatus when the sub-modules are in a full-bridge topology.
Detailed Description
The technical scheme of the invention is explained in detail in the following with the accompanying drawings.
Fig. 1 is a schematic diagram of the test applied to a half-bridge topology sub-module, and fig. 2 is a schematic diagram of the test applied to a full-bridge topology sub-module. The communication interface of the testing device is integrated on the control board in the figure, and the communication interface of the corresponding tested sub-module is integrated on the control and drive module in the figure. Before testing, the communication port of the sub-module testing device is connected to the communication interface of the tested sub-module. The positive electrode and the negative electrode of the direct current output port are respectively connected to the positive electrode and the negative electrode of the energy storage unit (capacitor in the figure) of the sub-module to be tested. And the current output port of the testing device is connected to the high-voltage terminal of the tested submodule through a lead. When the functions of the IGBT, the bypass switch, the communication and the like are tested, the testing device sends a control instruction to the submodule through a sending interface TX1, receives state information and control instruction execution return information returned by the submodule through a receiving interface RX1, compares an analog quantity value acquired by a measuring port with the returned information, judges the fault of the submodule to be tested if the return information executed by the control instruction is not received or abnormal information is received or the acquired analog quantity value is abnormal, immediately blocks the control instruction and displays detailed fault information, and simultaneously carries out discharging operation on the submodule energy storage unit.
(1) When the voltage source is an alternating current voltage source and the submodule is in a full-bridge topology, the switch K is closed, the voltage Ucom of the current output port is detected to be positive (the positive end connected to the anode of the thyristor is defined to be positive, and the negative end connected with the cathode of the thyristor is defined to be negative), the testing device controls the submodule to issue thyristor trigger pulse through the communication interface, if the absolute value of the current flowing through the current limiting resistor R before the trigger pulse is issued is smaller than a set value, the value of the current flowing through the current limiting resistor R after the trigger pulse is issued is equal to the voltage of the current output port divided by the resistance value of the current limiting resistor, and when the voltage Ucom of the current output port is detected to finish the first zero crossing after the trigger pulse is issued, the absolute value of the current flowing through the current limiting resistor R is smaller than the set value, the state of the thyristor is judged to be normal, otherwise, the thyristor is judged to be in fault.
(2) When the voltage source is an alternating current voltage source and the submodule is in a half-bridge topology, the switch K is closed, the testing device controls the submodule to issue thyristor trigger pulses through the communication interface after detecting that the voltage Ucom of the current output port is positive, if the absolute value of the current flowing through the thyristor before the trigger pulses are issued is smaller than a set value, the current flowing through the thyristor after the trigger pulses are issued is larger than M times of the current flowing through the current limiting resistor R, and the M is more than 0 and less than 1, and when the absolute value of the current flowing through the thyristor after the voltage Ucom of the current output port is detected to finish the first zero crossing after the trigger pulses are issued is smaller than the set value, the state of the thyristor is judged to be normal, otherwise, the thyristor is judged to be in a fault state.
(3) When the voltage source is a direct-current voltage source and the submodule is in a full-bridge topology, switching on a switch K, controlling the submodule to send a thyristor trigger pulse by a testing device through a communication interface, wherein the absolute value of the detected current output port voltage Ucom is smaller than a set value, the detected current value flowing through a current limiting resistor R is equal to the current output port voltage divided by the resistance value of the current limiting resistor, switching off the switch K, switching on the switch K again at an interval time T1, and judging that the state of the thyristor is normal if the absolute value of the voltage U subtracted from the detected current output port voltage Ucom is smaller than the set value, or judging that the thyristor fails; wherein the time length of the thyristor trigger pulse is less than T1.
(4) When the voltage source is a direct-current voltage source and the submodule is in a half-bridge topology, switching on a switch K, controlling the submodule to issue thyristor trigger pulses by the testing device through a communication interface, if the absolute value of current flowing through the thyristor before the trigger pulses are issued is smaller than a set value, the current flowing through the thyristor after the trigger pulses are issued is larger than M times of the current flowing through a current-limiting resistor R, when the absolute value of the current flowing through the thyristor is smaller than the set value, switching off the switch K, switching on the switch K again at an interval time T1, and judging that the state of the thyristor is normal if the absolute value of the current flowing through the thyristor is smaller than the set value, or judging that the thyristor fails; wherein the time length of the thyristor trigger pulse is less than T1.
The embodiments are only for illustrating the technical idea of the present invention, and the technical idea of the present invention is not limited thereto, and any modifications made on the basis of the technical scheme according to the technical idea of the present invention fall within the scope of the present invention.
Claims (10)
1. The utility model provides a submodule piece testing arrangement, the submodule piece is full-bridge topology or half-bridge topology, and the port department of submodule piece is parallelly connected with thyristor, its characterized in that: the testing device comprises at least one current output port and at least one pair of communication interfaces, wherein the pair of communication interfaces are a sending interface and a receiving interface, the sending interface and the receiving interface are correspondingly connected with a receiving interface and a sending interface of a submodule, one end of a voltage source in the testing device is connected with one end of the current output port through a current limiting resistor and a switch which are sequentially connected in series, the other end of the voltage source is connected with the other end of the current output port, the current output port is connected in parallel with two ends of the thyristor, when the submodule is in a half-bridge topology, the testing device further comprises at least one current measuring port, and the current measuring port is connected with the thyristor in series.
2. The sub-module testing apparatus of claim 1, wherein: the testing device further comprises at least one direct current output port, the direct current output port is connected in parallel to two ends of the energy storage element of the submodule, and the direct current output port is provided with a discharging circuit.
3. The sub-module testing apparatus of claim 1, wherein: the voltage source is an alternating current voltage source or a direct current voltage source.
4. The sub-module testing apparatus of claim 1, wherein: the switch is a mechanical switch controlled by a relay or a controllable semiconductor device switch.
5. The sub-module testing apparatus of claim 1, wherein: the communication interface comprises at least one of an Ethernet interface, an RS485 interface and an S232 interface.
6. The sub-module testing apparatus of claim 1, wherein: the voltage amplitude of the voltage source is lower than that of the energy storage unit of the sub-module.
7. A thyristor test method based on the submodule test device of claim 1, characterized in that: when the voltage source is an alternating current voltage source and the submodule is in a full-bridge topology, the switch is switched on, the testing device controls the submodule to issue thyristor trigger pulses through the communication interface after detecting that the voltage of the current output port is positive, if the absolute value of the current flowing through the current limiting resistor before the trigger pulses are issued is smaller than a set value, the value of the current flowing through the current limiting resistor after the trigger pulses are issued is equal to the voltage of the current output port divided by the resistance value of the current limiting resistor, and after the voltage of the current output port is detected to finish the first zero crossing after the trigger pulses are issued, the absolute value of the current flowing through the current limiting resistor is smaller than the set value, the state of the thyristor is judged to be normal, otherwise, the thyristor is judged to be in fault.
8. A thyristor test method based on the submodule test device of claim 1, characterized in that: when the voltage source is an alternating current voltage source and the submodule is in a half-bridge topology, the switch is switched on, after the voltage of the current output port is detected to be positive, the testing device controls the submodule to issue a thyristor trigger pulse through the communication interface, if the absolute value of the current flowing through the thyristor before the trigger pulse is issued is smaller than a set value, the current flowing through the thyristor after the trigger pulse is issued is larger than M times the current flowing through the current limiting resistor, the current is 0< M <1, and after the voltage of the current output port is detected to finish the first zero-crossing after the trigger pulse is issued, the absolute value of the current flowing through the thyristor is smaller than the set value, the state of the thyristor is judged to be normal, otherwise, the thyristor is judged to be in fault.
9. A thyristor test method based on the submodule test device of claim 1, characterized in that: when the voltage source is a direct-current voltage source and the submodule is in a full-bridge topology, the switch is switched on, the testing device controls the submodule to send a thyristor trigger pulse through the communication interface, the absolute value of the detected voltage of the current output port is smaller than a set value, the detected current value flowing through the current limiting resistor is equal to the voltage of the current output port divided by the resistance value of the current limiting resistor, after the switch is switched off, the switch is switched on again at an interval time T1, and if the absolute value of the voltage source subtracted from the detected voltage of the current output port is smaller than the set value, the state of the thyristor is judged to be normal, otherwise, the thyristor is judged to be in a fault; wherein the time length of the thyristor trigger pulse is less than T1.
10. A thyristor test method based on the submodule test device of claim 1, characterized in that: when the voltage source is a direct-current voltage source and the submodule is in a half-bridge topology, the switch is switched on, the testing device controls the submodule to issue thyristor trigger pulses through the communication interface, if the absolute value of current flowing through the thyristor before the trigger pulses are issued is smaller than a set value, the current flowing through the thyristor after the trigger pulses are issued is larger than M times of the current flowing through the current limiting resistor, M is larger than 0 and smaller than 1, the switch is switched off, the switch is switched on again at an interval time T1, the absolute value of the current flowing through the thyristor is smaller than the set value, the state of the thyristor is judged to be normal, and otherwise, the thyristor is judged to be in fault; wherein the time length of the thyristor trigger pulse is less than T1.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115754657A (en) * | 2022-11-24 | 2023-03-07 | 国网江苏省电力有限公司苏州供电分公司 | Serial power module test system and test method |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030090271A1 (en) * | 2001-11-13 | 2003-05-15 | Hurwicz Maxim D. | Portable circuit interrupter shutoff testing device and method |
| CN101806853A (en) * | 2010-05-07 | 2010-08-18 | 许继集团有限公司 | On-line test method and device for high-voltage thyristor |
| CN102694363A (en) * | 2012-05-25 | 2012-09-26 | 贵阳供电局 | Power electronic circuit breaker device |
| KR101373165B1 (en) * | 2012-11-30 | 2014-03-11 | 주식회사 포스코 | Apparatus and method for detecting failure of thyristor |
| CN103645399A (en) * | 2013-11-30 | 2014-03-19 | 许继电气股份有限公司 | Converter valve submodule automatic test system and thyristor test circuit thereof |
| CN203894367U (en) * | 2014-05-09 | 2014-10-22 | 国家电网公司 | Thyristor shunting detection circuit for voltage source transverter |
| US20150309108A1 (en) * | 2014-04-23 | 2015-10-29 | Ge Energy Power Conversion Gmbh | Circuit arrangement with a thyristor circuit, as well as a method for testing the thyristor circuit |
| CN206920550U (en) * | 2017-05-04 | 2018-01-23 | 武汉钢铁有限公司 | A kind of high voltage converter IGCT and trigger circuit test circuit |
| CN108199571A (en) * | 2018-03-05 | 2018-06-22 | 南京南瑞继保电气有限公司 | A kind of converter unit protection circuit and guard method and device |
| CN109728588A (en) * | 2019-03-05 | 2019-05-07 | 国家电网有限公司 | A kind of thyristor sub-controlling unit based on current compensation |
| CN110323933A (en) * | 2019-08-07 | 2019-10-11 | 哈尔滨工业大学 | Flexible DC transmission DC/DC converter with failure blocking ability |
| CN110726916A (en) * | 2019-09-19 | 2020-01-24 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | Automatic testing device and method for breakover voltage of protection thyristor of MMC power module |
| CN110763970A (en) * | 2019-09-19 | 2020-02-07 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | Method for testing breakover voltage of protection thyristor of MMC power module |
-
2020
- 2020-05-26 CN CN202010453953.9A patent/CN113721085A/en active Pending
Patent Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030090271A1 (en) * | 2001-11-13 | 2003-05-15 | Hurwicz Maxim D. | Portable circuit interrupter shutoff testing device and method |
| CN101806853A (en) * | 2010-05-07 | 2010-08-18 | 许继集团有限公司 | On-line test method and device for high-voltage thyristor |
| CN102694363A (en) * | 2012-05-25 | 2012-09-26 | 贵阳供电局 | Power electronic circuit breaker device |
| KR101373165B1 (en) * | 2012-11-30 | 2014-03-11 | 주식회사 포스코 | Apparatus and method for detecting failure of thyristor |
| CN103645399A (en) * | 2013-11-30 | 2014-03-19 | 许继电气股份有限公司 | Converter valve submodule automatic test system and thyristor test circuit thereof |
| US20150309108A1 (en) * | 2014-04-23 | 2015-10-29 | Ge Energy Power Conversion Gmbh | Circuit arrangement with a thyristor circuit, as well as a method for testing the thyristor circuit |
| CN105044585A (en) * | 2014-04-23 | 2015-11-11 | 通用电气能源电力转换有限责任公司 | Circuit arrangement with a thyristor circuit, as well as a method for testing the thyristor circuit |
| CN203894367U (en) * | 2014-05-09 | 2014-10-22 | 国家电网公司 | Thyristor shunting detection circuit for voltage source transverter |
| CN206920550U (en) * | 2017-05-04 | 2018-01-23 | 武汉钢铁有限公司 | A kind of high voltage converter IGCT and trigger circuit test circuit |
| CN108199571A (en) * | 2018-03-05 | 2018-06-22 | 南京南瑞继保电气有限公司 | A kind of converter unit protection circuit and guard method and device |
| CN109728588A (en) * | 2019-03-05 | 2019-05-07 | 国家电网有限公司 | A kind of thyristor sub-controlling unit based on current compensation |
| CN110323933A (en) * | 2019-08-07 | 2019-10-11 | 哈尔滨工业大学 | Flexible DC transmission DC/DC converter with failure blocking ability |
| CN110726916A (en) * | 2019-09-19 | 2020-01-24 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | Automatic testing device and method for breakover voltage of protection thyristor of MMC power module |
| CN110763970A (en) * | 2019-09-19 | 2020-02-07 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | Method for testing breakover voltage of protection thyristor of MMC power module |
Non-Patent Citations (2)
| Title |
|---|
| EUI-CHEOL NHO 等: "Synthetic Test Circuit for Thyristor Valve in HVDC Converter with New High-Current Source", IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 29, no. 7, 1 January 2014 (2014-01-01), pages 3290 - 3296, XP011540382, DOI: 10.1109/TPEL.2013.2279716 * |
| 朱珂 等: "主动扰动技术在停电配电线路相间故障检测中的应用", 电力自动化设备, vol. 37, no. 1, 10 January 2017 (2017-01-10), pages 191 - 196 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115754657A (en) * | 2022-11-24 | 2023-03-07 | 国网江苏省电力有限公司苏州供电分公司 | Serial power module test system and test method |
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