CN113686549A - Binocular microscope detection device and method - Google Patents
Binocular microscope detection device and method Download PDFInfo
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- CN113686549A CN113686549A CN202110892328.9A CN202110892328A CN113686549A CN 113686549 A CN113686549 A CN 113686549A CN 202110892328 A CN202110892328 A CN 202110892328A CN 113686549 A CN113686549 A CN 113686549A
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- 238000007689 inspection Methods 0.000 claims description 6
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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- G01M11/0207—Details of measuring devices
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Abstract
The invention discloses a binocular microscope detection device and a method. The technical scheme provided by the invention has the beneficial effects that: the first lens cone and the second lens cone are respectively aligned to two eyepiece cones of a binocular microscope to be detected through an adjusting mechanism, the position of a fixing plate is adjusted through the adjusting mechanism, a division line of a rear division plate in a visual field of a first front lens is overlapped with a division line of a first front division plate, then the second front division plate is rotated to enable the division line of the rear division plate in the visual field of the second front lens to be parallel to the division line of the second front division plate, so that the image surface azimuth difference of a left optical system and a right optical system of the detected binocular microscope can be obtained through the rotation angle of the second front division plate, and finally the direction deviation of the emergent light beam of the left optical system and the right optical system of the detected binocular microscope can be obtained according to the deviation value of the intersection point of the cross division lines of the rear division plate.
Description
Technical Field
The invention relates to the technical field of microscope detection, in particular to a binocular microscope detection device and method.
Background
The binocular microscope (for example, chinese utility model patent with application number CN 200620010426.6) has two types of binocular parallel microscope and binocular non-parallel microscope (for example, stereoscopic microscope), and the detection standard of the binocular microscope requires measurement of the image plane azimuth difference of the left and right optical systems of the binocular microscope and the deviation of the direction of the outgoing beam of the left and right optical systems of the binocular microscope.
In the prior art, a monocular image tilt measuring instrument is adopted to measure the image plane azimuth difference of a left optical system and a right optical system of a binocular microscope, the operation method comprises the steps of firstly placing a cross reticle in the center of the object plane of the binocular microscope to be detected, then aligning the monocular image tilt measuring instrument to a left ocular and leveling, then adjusting the binocular microscope to be detected, enabling the image of the cross reticle in the view field of the monocular image tilt measuring instrument to be superposed with the reticle of the monocular image tilt measuring instrument, then aligning the monocular image tilt measuring instrument to a right ocular and leveling, measuring the included angle between the division line of the cross reticle and the division line of the reticle of the monocular image tilt measuring instrument, thereby judging the image plane azimuth difference of the left optical system and the right optical system of the binocular microscope, the method has to align two ocular lenses in sequence, testing is carried out twice, each time needs bubble leveling, the efficiency is very low, and the function is single, the method can only measure the image plane direction difference of the left and right optical systems of the binocular microscope, and cannot measure the direction deviation of emergent light beams of the left and right optical systems of the binocular microscope.
In the prior art, a fixed binocular is adopted to test the direction deviation of emergent light beams of left and right optical systems of a binocular microscope, and the image plane azimuth difference of the left and right optical systems of the binocular microscope cannot be measured.
In summary, the prior art lacks a measuring device which is convenient to operate and can simultaneously measure the image plane azimuth difference of the left and right optical systems of the binocular microscope and the direction deviation of the emergent light beams of the left and right optical systems.
Disclosure of Invention
In view of the above, it is necessary to provide a binocular microscope detecting apparatus and method, so as to solve the technical problem that there is no measuring apparatus that is convenient to operate and can simultaneously measure the image plane azimuth difference of the left and right optical systems of the binocular microscope and the direction deviation of the emergent light beams of the left and right optical systems in the prior art.
In order to achieve the aim, the invention provides a binocular microscope detection device which comprises a fixing plate, a first front lens, a second front lens, an adjusting mechanism, an angle detection piece and a rear reticle;
the first front lens comprises a first lens barrel and a first front reticle, the first lens barrel is fixed on the fixing plate, and the first front reticle is fixed in the first lens barrel;
the second front lens comprises a second lens barrel and a second front reticle, the second lens barrel is connected to the fixing plate, and the second front reticle is rotatably arranged in the second lens barrel;
the adjusting mechanism is connected with the fixing plate and is used for adjusting the position and the azimuth angle of the fixing plate;
the angle detection piece is connected with the second front reticle and is used for detecting the rotating position of the second front reticle;
the rear reticle is used for being placed in the center of the object plane of the binocular microscope to be detected.
Preferably, the adjusting mechanism comprises a position adjusting piece and an angle adjusting piece, the position adjusting piece is connected with the angle adjusting piece and is used for adjusting the position of the angle adjusting piece in the three-dimensional space, and the angle adjusting piece is connected with the fixing plate and is used for adjusting the azimuth angle of the fixing plate in the three-dimensional space.
Preferably, the position control spare includes bottom plate, pillar, lift sliding sleeve, vertical baffle, horizontal baffle and horizontal sliding sleeve, the pillar vertical fixation in on the bottom plate, the lift sliding sleeve slide set up in on the pillar, be formed with the guide way that extends along the horizontal direction on the lift sliding sleeve, vertical baffle slide set up in the guide way, horizontal baffle extend along the horizontal direction and with vertical baffle vertical fixation connects, horizontal sliding sleeve slide set up in on the horizontal baffle, horizontal sliding sleeve with angle control spare fixed connection.
Preferably, the angle adjusting member comprises a first pin shaft, a first adjusting plate, a second adjusting plate, a first elastic member, a deflection angle adjusting screw, a second elastic member and a pitch angle adjusting screw; the first adjusting plate is rotatably connected with the transverse sliding sleeve through the first pin shaft; the second adjusting plate is hinged with the first adjusting plate and is also connected with the fixing plate; one end of the first elastic piece is connected with the transverse sliding sleeve, and the other end of the first elastic piece is connected with the first adjusting plate; the deflection angle adjusting screw is in threaded connection with the transverse sliding sleeve, and one end of the deflection angle adjusting screw is connected with the first adjusting plate; one end of the second elastic piece is connected with the first adjusting plate, and the other end of the second elastic piece is connected with the second adjusting plate; the pitching angle adjusting screw is in threaded connection with the first adjusting plate, and one end of the pitching angle adjusting screw is connected with the second adjusting plate.
Preferably, the binocular microscope detection device further comprises a fixing screw, and the fixing screw is in threaded connection with the fixing plate and the second adjusting plate.
Preferably, the angle detection piece comprises a connecting plate, a third elastic piece and a reticle adjusting screw; the connecting plate is positioned in the second lens barrel, and one end of the connecting plate is connected with the second front reticle; one end of the third elastic piece is connected with the second lens cone, and the other end of the third elastic piece is connected with the connecting plate; the reticle adjusting screw is in threaded connection with the second lens barrel, one end of the reticle adjusting screw is connected with the connecting plate, and a first dial matched with the reticle adjusting screw is arranged on the second lens barrel.
Preferably, the first barrel is parallel to the second barrel.
Preferably, the second lens barrel is rotatably connected with the fixing plate; the binocular microscope detection device further comprises an included angle adjusting piece, and the included angle adjusting piece is connected with the second lens cone and used for driving the second lens cone to rotate.
Preferably, the included angle adjusting part comprises a second pin shaft, a fourth elastic part and an included angle adjusting screw, the second lens barrel is rotatably connected with the fixing plate through the second pin shaft, one end of the fourth elastic part is connected with the fixing plate, the other end of the fourth elastic part is connected with the second lens barrel, the included angle adjusting screw is in threaded connection with the fixing plate, and one end of the included angle adjusting screw is connected with the second lens barrel.
The invention also provides a binocular microscope detection method, which is suitable for the binocular microscope detection device and comprises the following steps:
placing a rear reticle in the center of the object plane of a binocular microscope to be detected;
the first lens cone and the second lens cone are respectively aligned to two eyepiece cones of a binocular microscope to be detected through an adjusting mechanism;
the direction of the fixing plate is adjusted through the adjusting mechanism, so that the division line of the rear reticle in the view field of the first front mirror is superposed with the division line of the first front reticle;
observing whether the division line of the rear reticle is parallel to the division line of the second front reticle in the visual field of the second front microscope, if not, rotating the second front reticle until the division line of the rear reticle in the visual field of the second front microscope is parallel to the division line of the second front reticle, recording the rotating position of the second front reticle at the moment, and obtaining the azimuth difference of the left and right optical system image surfaces of the detected binocular microscope through the rotating position;
in the view field of the second front-mounted mirror, reading out the deviation value of the division line intersection point of the rear-mounted reticle through the scale on the second front-mounted reticle, and obtaining the direction deviation of the emergent light beams of the left and right optical systems of the detected binocular microscope according to the deviation value.
Compared with the prior art, the technical scheme provided by the invention has the beneficial effects that: the first lens barrel and the second lens barrel are respectively aligned to two eyepiece barrels of a binocular microscope to be detected through an adjusting mechanism, the orientation of a fixing plate is adjusted through the adjusting mechanism, the division line of a rear reticle in the visual field of a first front lens is overlapped with the division line of a first front reticle, the division line of the rear reticle is observed in the visual field of a second front lens, the second front reticle is rotated to enable the division line of the rear reticle in the visual field of the second front lens to be parallel to the division line of the second front reticle, the azimuth difference of a left optical system image surface and a right optical system image surface of the binocular microscope to be detected can be obtained through the rotation angle of the second front reticle, finally, the direction deviation of the left optical system emergent light beam and the right optical system emergent light beam of the binocular microscope to be detected can be obtained according to the deviation value of the intersection point of the cross division lines of the rear reticle, and the azimuth deviation and the operation of the emergent light beam direction of the left optical system and the right optical system of the binocular microscope can be simultaneously measured through the device The operation is convenient.
Drawings
FIG. 1 is a schematic perspective view of a binocular parallel microscope inspection apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic perspective view of the first front mirror, the second front mirror and the angle detector in FIG. 1;
FIG. 3 is a right side view of FIG. 2;
FIG. 4 is a cross-sectional view taken along section A-A of FIG. 3;
FIG. 5 is a schematic perspective view of a binocular nonparallel microscope inspection device according to an embodiment of the present invention (with the adjustment mechanism omitted);
FIG. 6 is a schematic perspective view of the detecting device in FIG. 5 from another viewing angle;
in the figure: 1-fixing plate, 2-first front mirror, 3-second front mirror, 4-adjusting mechanism, 5-angle detecting part, 6-fixing screw, 7-included angle adjusting part, 21-first lens barrel, 22-first front dividing plate, 31-second lens barrel, 32-second front dividing plate, 41-position adjusting part, 411-bottom plate, 412-pillar, 413-lifting sliding sleeve, 414-longitudinal guide plate, 415-transverse guide plate, 416-transverse sliding sleeve, 417-lifting locking screw, 418-longitudinal movement locking screw, 419-transverse movement locking screw, 42-angle adjusting part, 421-first pin shaft, 422-first adjusting plate, 423-second adjusting plate, 424-first elastic part, 425-deflection angle adjusting screw, 426-second elastic part, 427-pitch angle adjusting screw, 51-connecting plate, 52-third elastic part, 53-reticle adjusting screw, 71-second pin shaft, 72-fourth elastic part and 73-included angle adjusting screw.
Detailed Description
The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate preferred embodiments of the invention and together with the description, serve to explain the principles of the invention and not to limit the scope of the invention.
Referring to fig. 1 and 2, the present invention provides a binocular microscope inspection apparatus, which includes a fixing plate 1, a first front mirror 2, a second front mirror 3, an adjusting mechanism 4, an angle detector 5, and a rear reticle (not shown).
Referring to fig. 2 to 4, the first front mirror 2 includes a first barrel 21 and a first front reticle 22, the first barrel 21 is fixed on the fixing plate 1, and the first front reticle 22 is fixed in the first barrel 21.
Referring to fig. 2-4, the second front mirror 3 includes a second barrel 31 and a second front reticle 32, the second barrel 31 is connected to the fixing plate 1, the second front reticle 32 is rotatably disposed in the second barrel 31, and specifically, a rotation plane of the second front reticle 32 is perpendicular to the second barrel 31, it should be understood that the first front mirror 2 and the second front mirror 3 are similar to a telescope structure, and therefore, include a lens group and other components, which are prior art and are not described again in the present invention.
Referring to fig. 1 to 3, the adjusting mechanism 4 is connected to the fixing plate 1 and is used for adjusting the position and the azimuth angle of the fixing plate 1.
Referring to fig. 2 to 4, the angle detector 5 is connected to the second front reticle 32 and is used for detecting a rotation position of the second front reticle 32. The rear reticle is used for being placed in the center of the object plane of the binocular microscope to be detected.
The operation method of the binocular microscope detection device provided by the invention comprises the following steps: (1) placing a rear reticle in the center of the object plane of a binocular microscope to be detected; (2) the first lens cone 21 and the second lens cone 31 are respectively aligned to two eyepiece cones of a binocular microscope to be detected through the adjusting mechanism 4; (3) the direction of the fixed plate 1 is adjusted through the adjusting mechanism 4, so that the division line of the rear reticle in the view field of the first front mirror 2 is superposed with the division line of the first front reticle 22; (4) observing whether the division line of the rear reticle is parallel to the division line of the second front reticle 32 in the visual field of the second front mirror 3, if not, rotating the second front reticle 32 until the division line of the rear reticle in the visual field of the second front mirror 3 is parallel to the division line of the second front reticle 32, recording the rotating position of the second front reticle 32 at the moment, and obtaining the image plane azimuth difference of the left and right optical systems of the detected binocular microscope through the rotating position; (5) in the visual field of the second front lens 3, the deviation value of the intersection point of the cross division lines of the rear reticle is read out through the scales on the second front reticle 32, and the direction deviation of the emergent light beams of the left and right optical systems of the binocular microscope to be detected is obtained according to the deviation value.
The invention makes the first lens cone 21 and the second lens cone 31 respectively aim at two eyepiece cones of a binocular microscope to be detected through the adjusting mechanism 4, then adjusts the orientation of the fixing plate 1 through the adjusting mechanism 4, makes the division line of the rear reticle in the visual field of the first front lens 2 coincide with the division line of the first front reticle 22, then observes the division line of the rear reticle in the visual field of the second front lens 3, and rotates the second front reticle 32 to make the division line of the rear reticle in the visual field of the second front lens 3 parallel to the division line of the second front reticle 32, thereby obtaining the azimuth difference of the left and right optical systems of the binocular microscope to be detected through the rotation angle of the second front reticle 32, and finally obtaining the deviation of the left and right optical system emergent beam directions of the binocular microscope to be detected according to the deviation value of the intersection point of the cross-division lines of the rear reticle, therefore, the device can simultaneously measure the image plane azimuth difference of the left optical system and the right optical system of the binocular microscope and the direction deviation of emergent light beams of the left optical system and the right optical system, and is convenient to operate.
To implement the function of the adjusting mechanism 4, referring to fig. 1-3, in a preferred embodiment, the adjusting mechanism 4 includes a position adjusting member 41 and an angle adjusting member 42, the position adjusting member 41 is connected to the angle adjusting member 42 and is used for adjusting the position of the angle adjusting member 42 in a three-dimensional space, and the angle adjusting member 42 is connected to the fixing plate 1 and is used for adjusting the azimuth angle of the fixing plate 1 in the three-dimensional space.
In order to realize the function of the position adjusting member 41, referring to fig. 1-3, in a preferred embodiment, the position adjusting member 41 includes a bottom plate 411, a support column 412, a lifting sliding sleeve 413, a longitudinal guide 414, a transverse guide 415, and a transverse sliding sleeve 416, the support column 412 is vertically fixed on the bottom plate 411, the lifting sliding sleeve 413 is slidably disposed on the support column 412, a guide slot extending along a horizontal direction is formed on the lifting sliding sleeve 413, the longitudinal guide 414 is slidably disposed in the guide slot, the transverse guide 415 extends along a horizontal direction and is vertically and fixedly connected with the longitudinal guide 414, the transverse sliding sleeve 416 is slidably disposed on the transverse guide 415, the transverse sliding sleeve 416 is fixedly connected with the angle adjusting member 42, the angle adjusting member 42 can be moved up and down by moving the lifting sliding sleeve 413 up and down, the angle adjusting member 42 can be moved in a longitudinal direction by moving the longitudinal guide 414 back and forth, the angle adjusting member 42 can be moved left and right by moving the lateral sliding sleeve 416 left and right, thereby realizing three degrees of freedom movement of the angle adjusting member 42.
In order to facilitate locking the lifting sliding sleeve 413, the longitudinal guide 414 and the transverse sliding sleeve 416, in this embodiment, the position adjusting member 41 further includes a lifting locking screw 417, a longitudinal moving locking screw 418 and a transverse moving locking screw 419, the lifting locking screw 417 is threadedly connected to the lifting sliding sleeve 413, one end of the lifting locking screw 417 abuts against the pillar 412, the longitudinal moving locking screw 418 is threadedly connected to the lifting sliding sleeve 413, one end of the longitudinal moving locking screw 418 abuts against the longitudinal guide 414, the transverse moving locking screw 419 is threadedly connected to the transverse sliding sleeve 416, and one end of the transverse moving locking screw 419 abuts against the transverse guide 415.
To implement the function of the angle adjusting member 42, referring to fig. 1-3, in a preferred embodiment, the angle adjusting member 42 includes a first pin 421, a first adjusting plate 422, a second adjusting plate 423, a first elastic member 424, a swing angle adjusting screw 425, a second elastic member 426, and a pitch angle adjusting screw 427; the first adjusting plate 422 is rotatably connected with the transverse sliding sleeve 416 through the first pin 421; the second adjusting plate 423 is hinged with the first adjusting plate 422, and the second adjusting plate 423 is further connected with the fixed plate 1; one end of the first elastic member 424 is connected to the transverse sliding sleeve 416, and the other end of the first elastic member 424 is connected to the first adjustment plate 422; the deflection angle adjusting screw 425 is in threaded connection with the transverse sliding sleeve 416, and one end of the deflection angle adjusting screw 425 is connected with the first adjusting plate 422; one end of the second elastic member 426 is connected to the first adjustment plate 422, and the other end of the second elastic member 426 is connected to the second adjustment plate 423; the pitch angle adjusting screw 427 is screwed to the first adjusting plate 422, one end of the pitch angle adjusting screw 427 is connected to the second adjusting plate 423, when in use, the yaw angle adjusting screw 425 is rotated to change the yaw angle of the fixing plate 1, and the pitch angle adjusting screw 427 is rotated to change the pitch angle of the fixing plate 1.
For the convenience of assembly and disassembly, referring to fig. 2 and 3, in a preferred embodiment, the binocular microscope inspection apparatus further includes a fixing screw 6, and the fixing screw 6 is in threaded connection with the fixing plate 1 and the second adjusting plate 423.
To realize the function of the angle detecting member 5, please refer to fig. 2-4, in a preferred embodiment, the angle detecting member 5 includes a connecting plate 51, a third elastic member 52 and a reticle adjusting screw 53; the connecting plate 51 is located in the second lens barrel 31, and one end of the connecting plate 51 is connected with the second front reticle 32; one end of the third elastic member 52 is connected to the second barrel 31, and the other end of the third elastic member 52 is connected to the connecting plate 51; reticle adjusting screw 53 with second lens cone 31 threaded connection, reticle adjusting screw 53's one end with connecting plate 51 is connected, be provided with on the second lens cone 31 with reticle adjusting screw 53 matched with first calibrated scale (not shown), when using, rotating reticle adjusting screw 53, reticle adjusting screw 53 promotes connecting plate 51 and removes to drive the leading reticle 32 of second and rotate, simultaneously, the turned angle of reticle adjusting screw 53 is read out to the first calibrated scale of accessible, thereby obtains the optical system image plane azimuth difference about the binocular microscope that is detected.
In order to provide a detection device specifically for binocular parallel microscopy, referring to fig. 1-4, in a preferred embodiment, the first lens barrel 21 is parallel to the second lens barrel 31. Because the two eyepieces of the binocular parallel microscope are parallel, the binocular microscope detection device in the embodiment can be specially used for detecting the binocular parallel microscope.
In order to provide a detection device specially for binocular non-parallel microscopes (such as stereoscopic microscopes), referring to fig. 5 and 6, in a preferred embodiment, the second lens barrel 31 is rotatably connected to the fixing plate 1; binocular microscope detection device still includes contained angle regulating part 7, contained angle regulating part 7 with second lens cone 31 is connected and is used for the drive second lens cone 31 rotates, when using, at first obtains the contained angle of two eyepiece of binocular nonparallel microscope according to the microscopical equipment parameter of binocular nonparallel, and rethread contained angle regulating part 7 drives second lens cone 31 and rotates to the contained angle that makes second lens cone 31 and first lens cone 21 equal the two eyepiece of the binocular nonparallel microscope that are detected, thereby conveniently aims at two eyepiece cones of the binocular nonparallel microscope that wait to detect respectively with first lens cone 21 and second lens cone 31.
In order to specifically realize the function of the included angle adjusting member 7, referring to fig. 5 and 6, in a preferred embodiment, the included angle adjusting member 7 includes a second pin 71, a fourth elastic member 72 and an included angle adjusting screw 73, the second barrel 31 is rotatably connected to the fixing plate 1 via the second pin 71, one end of the fourth elastic member 72 is connected to the fixing plate 1, the other end of the fourth elastic member 72 is connected to the second barrel 31, the included angle adjusting screw 73 is in threaded connection with the fixing plate 1, one end of the included angle adjusting screw 73 is connected to the second barrel 31, and the fixing plate 1 is provided with a second scale which is matched with the included angle adjusting screw 73 to display an included angle between the second barrel 31 and the first barrel 21. In use, angle adjusting screw 73 is rotated to a set position, so that angle adjusting screw 73 pushes second barrel 31 to rotate, so that the angle between second barrel 31 and first barrel 21 reaches a set value.
It should be noted that all reticles in the present invention are cross reticles unless otherwise specified.
The invention also provides a binocular microscope detection method which is suitable for the binocular microscope detection device and comprises the following steps:
placing a rear reticle in the center of the object plane of a binocular microscope to be detected;
the first lens cone 21 and the second lens cone 31 are respectively aligned to two eyepiece cones of a binocular microscope to be detected through the adjusting mechanism 4;
the direction of the fixed plate 1 is adjusted through the adjusting mechanism 4, so that the division line of the rear reticle in the view field of the first front mirror 2 is superposed with the division line of the first front reticle 22;
observing whether the division line of the rear reticle is parallel to the division line of the second front reticle 32 in the visual field of the second front mirror 3, if not, rotating the second front reticle 32 until the division line of the rear reticle in the visual field of the second front mirror 3 is parallel to the division line of the second front reticle 32, recording the rotating position of the second front reticle 32 at the moment, and obtaining the image plane azimuth difference of the left and right optical systems of the detected binocular microscope through the rotating position;
in the visual field of the second front lens 3, the deviation value of the intersection point of the cross division lines of the rear reticle is read out through the scales on the second front reticle 32, and the direction deviation of the emergent light beams of the left and right optical systems of the binocular microscope to be detected is obtained according to the deviation value.
The invention makes the first lens cone 21 and the second lens cone 31 respectively aim at two eyepiece cones of a binocular microscope to be detected through the adjusting mechanism 4, then adjusts the orientation of the fixing plate 1 through the adjusting mechanism 4, makes the division line of the rear reticle in the visual field of the first front lens 2 coincide with the division line of the first front reticle 22, then observes the division line of the rear reticle in the visual field of the second front lens 3, and rotates the second front reticle 32 to make the division line of the rear reticle in the visual field of the second front lens 3 parallel to the division line of the second front reticle 32, thereby obtaining the azimuth difference of the left and right optical systems of the binocular microscope to be detected through the rotation angle of the second front reticle 32, and finally obtaining the deviation of the left and right optical system emergent beam directions of the binocular microscope to be detected according to the deviation value of the intersection point of the cross-division lines of the rear reticle, therefore, the device can simultaneously measure the image plane azimuth difference of the left optical system and the right optical system of the binocular microscope and the direction deviation of emergent light beams of the left optical system and the right optical system, and is convenient to operate.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention.
Claims (10)
1. A binocular microscope detection device is characterized by comprising a fixing plate, a first front lens, a second front lens, an adjusting mechanism, an angle detection piece and a rear reticle;
the first front lens comprises a first lens barrel and a first front reticle, the first lens barrel is fixed on the fixing plate, and the first front reticle is fixed in the first lens barrel;
the second front lens comprises a second lens barrel and a second front reticle, the second lens barrel is connected to the fixing plate, and the second front reticle is rotatably arranged in the second lens barrel;
the adjusting mechanism is connected with the fixing plate and is used for adjusting the position and the azimuth angle of the fixing plate;
the angle detection piece is connected with the second front reticle and is used for detecting the rotating position of the second front reticle;
the rear reticle is used for being placed in the center of the object plane of the binocular microscope to be detected.
2. The binocular microscope detecting device of claim 1, wherein the adjusting mechanism includes a position adjusting member and an angle adjusting member, the position adjusting member is connected with the angle adjusting member and is used for adjusting the position of the angle adjusting member in the three-dimensional space, and the angle adjusting member is connected with the fixing plate and is used for adjusting the azimuth angle of the fixing plate in the three-dimensional space.
3. The binocular microscope detecting device according to claim 2, wherein the position adjusting member includes a bottom plate, a pillar, a lifting sliding sleeve, a longitudinal guide plate, a transverse guide plate and a transverse sliding sleeve, the pillar is vertically fixed on the bottom plate, the lifting sliding sleeve is slidably disposed on the pillar, a guide groove extending along a horizontal direction is formed on the lifting sliding sleeve, the longitudinal guide plate is slidably disposed in the guide groove, the transverse guide plate extends along the horizontal direction and is vertically and fixedly connected with the longitudinal guide plate, the transverse sliding sleeve is slidably disposed on the transverse guide plate, and the transverse sliding sleeve is fixedly connected with the angle adjusting member.
4. The binocular microscope detecting device of claim 3, wherein the angle adjusting member includes a first pin, a first adjusting plate, a second adjusting plate, a first elastic member, a yaw angle adjusting screw, a second elastic member, and a pitch angle adjusting screw;
the first adjusting plate is rotatably connected with the transverse sliding sleeve through the first pin shaft;
the second adjusting plate is hinged with the first adjusting plate and is also connected with the fixing plate;
one end of the first elastic piece is connected with the transverse sliding sleeve, and the other end of the first elastic piece is connected with the first adjusting plate;
the deflection angle adjusting screw is in threaded connection with the transverse sliding sleeve, and one end of the deflection angle adjusting screw is connected with the first adjusting plate;
one end of the second elastic piece is connected with the first adjusting plate, and the other end of the second elastic piece is connected with the second adjusting plate;
the pitching angle adjusting screw is in threaded connection with the first adjusting plate, and one end of the pitching angle adjusting screw is connected with the second adjusting plate.
5. The binocular microscope detecting device of claim 4, further comprising a set screw threadedly coupled to both the fixing plate and the second adjusting plate.
6. The binocular microscope detecting device of claim 1, wherein the angle detecting member includes a connecting plate, a third elastic member, and a reticle adjustment screw;
the connecting plate is positioned in the second lens barrel, and one end of the connecting plate is connected with the second front reticle;
one end of the third elastic piece is connected with the second lens cone, and the other end of the third elastic piece is connected with the connecting plate;
the reticle adjusting screw is in threaded connection with the second lens barrel, one end of the reticle adjusting screw is connected with the connecting plate, and a first dial matched with the reticle adjusting screw is arranged on the second lens barrel.
7. The binocular microscope detecting device of claim 1, wherein the first barrel is parallel to the second barrel.
8. The binocular microscope detecting device of claim 1, wherein the second barrel is rotatably connected with the fixing plate;
the binocular microscope detection device further comprises an included angle adjusting piece, and the included angle adjusting piece is connected with the second lens cone and used for driving the second lens cone to rotate.
9. The binocular microscope detecting device according to claim 8, wherein the angle adjusting member includes a second pin, a fourth elastic member and an angle adjusting screw, the second lens barrel is rotatably connected to the fixing plate via the second pin, one end of the fourth elastic member is connected to the fixing plate, the other end of the fourth elastic member is connected to the second lens barrel, the angle adjusting screw is in threaded connection with the fixing plate, and one end of the angle adjusting screw is connected to the second lens barrel.
10. A binocular microscope inspection method applied to the binocular microscope inspection apparatus according to any one of claims 1 to 9, comprising:
placing a rear reticle in the center of the object plane of a binocular microscope to be detected;
the first lens cone and the second lens cone are respectively aligned to two eyepiece cones of a binocular microscope to be detected through an adjusting mechanism;
the direction of the fixing plate is adjusted through the adjusting mechanism, so that the division line of the rear reticle in the view field of the first front mirror is superposed with the division line of the first front reticle;
observing whether the division line of the rear reticle is parallel to the division line of the second front reticle in the visual field of the second front microscope, if not, rotating the second front reticle until the division line of the rear reticle in the visual field of the second front microscope is parallel to the division line of the second front reticle, recording the rotating position of the second front reticle at the moment, and obtaining the azimuth difference of the left and right optical system image surfaces of the detected binocular microscope through the rotating position;
in the view field of the second front-mounted mirror, reading out the deviation value of the division line intersection point of the rear-mounted reticle through the scale on the second front-mounted reticle, and obtaining the direction deviation of the emergent light beams of the left and right optical systems of the detected binocular microscope according to the deviation value.
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