CN113671357A - Floating time measuring device - Google Patents
Floating time measuring device Download PDFInfo
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- CN113671357A CN113671357A CN202111223810.XA CN202111223810A CN113671357A CN 113671357 A CN113671357 A CN 113671357A CN 202111223810 A CN202111223810 A CN 202111223810A CN 113671357 A CN113671357 A CN 113671357A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2882—Testing timing characteristics
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Abstract
The invention discloses a floating time measuring device which comprises an FPGA (field programmable gate array) board, a multi-channel time measuring board, an alternating current power supply and more than one single-channel floating mode test circuit, wherein the single-channel floating mode test circuit comprises a digital isolation chip and a transformer isolation circuit, one end of the digital isolation chip is connected with a control bus of the FPGA board, and the other end of the digital isolation chip is connected with one channel on the multi-channel time measuring board; one end of the transformer isolation circuit is connected with an alternating current power supply, the other end of the transformer isolation circuit is connected with a test piece DUT, and the test piece DUT is connected with one channel on the multi-channel time measuring board. The invention has high test precision and good stability.
Description
Technical Field
The invention relates to a device which is applied to an IC test system and is specially used for testing the frequency of a floating ground source system.
Background
As shown in FIG. 1, for the conventional time measurement apparatus, the first site of the testing station uses the channels CH1_ A and CH1_ B, and the second site of the testing station uses the channels CH2_ A and CH2_ B
In the same way, the channels CH4_ a and CH4_ B are used by the four site 4 stations of the test station, if one of the several test stations fails to test the fail chip, a large current is suddenly output, which causes the voltage difference between the ground terminal GND of the time measurement TMU board card in the device and the ground on the test device DUT to become large, the voltage difference between the grounds to become large, which causes the test voltages of the other test stations to deviate, and the mutual interference during the test of the multiple test stations is influenced by the change between the grounds. Meanwhile, the situation that the load of the power supply is greatly changed can also cause mutual interference among the test station sites.
The existing test scheme mainly has the defects of large mutual interference between multi-test station sites, poor test precision, poor stability and the like.
Disclosure of Invention
The purpose of the invention is as follows: in order to overcome the defects in the prior art, the invention provides the floating time measuring device with high measuring precision and good stability.
The technical scheme is as follows: in order to achieve the purpose, the invention adopts the technical scheme that:
the utility model provides a float ground time measuring device, includes FPGA board, multichannel time measurement board, alternating current power supply, more than one single channel float ground mode test circuit, the number of single channel float ground mode test circuit is unanimous with the passageway number of multichannel time measurement board, single channel float ground mode test circuit includes digital isolation chip, transformer isolating circuit, wherein:
one end of the digital isolation chip is connected with a control bus of the FPGA board, and the other end of the digital isolation chip is connected with one channel on the multi-channel time measuring board; the control bus and the multi-channel time measuring board are isolated in communication through a digital isolation chip, and independent communication of each channel is achieved.
One end of the transformer isolation circuit is connected with an alternating current power supply, the other end of the transformer isolation circuit is connected with a test piece DUT, and the test piece DUT is connected with one channel on the multi-channel time measuring board; the transformer isolation circuit is used for isolating the input alternating current power supply into potential difference, so that the used power supply is changed into a floating ground source; meanwhile, the single-input multi-stage output is realized through the transformer isolation circuit with each channel independent, and different voltages are provided for each channel.
Preferably: the multi-channel time measurement board comprises more than one time measurement unit.
Preferably: the time measuring unit comprises a window comparator II, a calibration amplifier following precision circuit I, a waveform self-checking circuit, a signal circuit to be detected, a relay I, a direct resistor, a high-frequency low-voltage operational amplifier circuit, a high-voltage low-frequency operational amplifier circuit, a resistor voltage dividing circuit, a relay II, a window comparator I, a calibration amplifier following precision circuit II and a calibration comparison level circuit, wherein:
the input end of the window comparator II is connected with the transformer isolation circuit, the output end of the window comparator II is respectively connected with the first calibration amplifier following precision circuit and the waveform self-checking circuit, and the first calibration amplifier following precision circuit and the waveform self-checking circuit are connected with the signal circuit to be detected.
The circuit for the signals to be detected is connected with an input end of a relay, an output end of the relay is respectively connected with a through resistor, a high-frequency low-voltage operational amplifier circuit and a high-voltage low-frequency operational amplifier circuit, the through resistor and the high-frequency low-voltage operational amplifier circuit are connected with an input end of a relay, and the high-voltage low-frequency operational amplifier circuit is connected with an input end of the relay through a resistor voltage dividing circuit.
And the output end of the second relay is respectively connected with the input end of the second amplifier following precision circuit, the input end of the calibration comparison level circuit and the input end of the first window comparator. And the output end of the first window comparator is respectively connected with the input end of the calibration comparison level circuit and the transformer isolation circuit.
The output end of the calibration comparison level circuit is connected with a test piece DUT, and the two output ends of the calibration amplifier following precision circuit are connected with the test piece DUT.
Preferably: the number of the channels of the multi-channel time measurement plate is 8.
Compared with the prior art, the invention has the following beneficial effects:
the invention has independent channels and less mutual interference influence. Each test station site is an independent test system, the whole test realizes a full-floating mode, and the influence on the tested device cannot generate influence on other test station sites through the ground.
Drawings
Fig. 1 shows a conventional time measuring device.
Fig. 2 is a single-channel floating time measuring device of the present invention.
Fig. 3 is a floating time measuring device of the present invention.
FIG. 4 is a schematic diagram of the floating time measurement of the present invention.
Fig. 5 is a schematic diagram illustrating a deviation between a test value and an actual value of a conventional time measurement device.
Detailed Description
The present invention is further illustrated by the following description in conjunction with the accompanying drawings and the specific embodiments, it is to be understood that these examples are given solely for the purpose of illustration and are not intended as a definition of the limits of the invention, since various equivalent modifications will occur to those skilled in the art upon reading the present invention and fall within the limits of the appended claims.
A floating time measuring device is shown in figures 2-4 and comprises an FPGA plate, a multi-channel time measuring plate, an alternating current power supply and more than one single-channel floating mode test circuit, wherein the number of the single-channel floating mode test circuits is consistent with that of channels of the multi-channel time measuring plate, the number of the channels of the multi-channel time measuring plate is 8, namely the floating time frequency measuring plate with 8 channels is adopted in the invention. The single-channel floating-ground mode test circuit comprises a digital isolation chip and a transformer isolation circuit, wherein:
one end of the digital isolation chip is connected with a control bus of the FPGA board, and the other end of the digital isolation chip is connected with one channel on the multi-channel time measuring board; the control bus and the multi-channel time measuring board are isolated in communication through a digital isolation chip, and independent communication of each channel is achieved.
One end of the transformer isolation circuit is connected with an alternating current power supply, the other end of the transformer isolation circuit is connected with a test piece DUT, and the test piece DUT is connected with one channel on the multi-channel time measuring board; the transformer isolation circuit is used for isolating the input alternating current power supply into potential difference, so that the used power supply is changed into a floating ground source; meanwhile, the single-input multi-stage output is realized through the transformer isolation circuit with each channel independent, and different voltages are provided for each channel.
The multi-channel time measurement board comprises more than one time measurement unit. As shown in fig. 4, the time measuring unit includes a window comparator ii, a first calibration amplifier following precision circuit, a waveform self-checking circuit, a signal circuit to be measured, a first relay, a direct resistor, a high-frequency low-voltage operational amplifier circuit, a high-voltage low-frequency operational amplifier circuit, a resistor divider circuit, a second relay, a window comparator i, a second calibration amplifier following precision circuit, and a calibration comparison level circuit, wherein:
the input end of the window comparator II is connected with the transformer isolation circuit, the output end of the window comparator II is respectively connected with the first calibration amplifier following precision circuit and the waveform self-checking circuit, and the first calibration amplifier following precision circuit and the waveform self-checking circuit are connected with the signal circuit to be detected.
The circuit for the signals to be detected is connected with an input end of a relay, an output end of the relay is respectively connected with a through resistor, a high-frequency low-voltage operational amplifier circuit and a high-voltage low-frequency operational amplifier circuit, the through resistor and the high-frequency low-voltage operational amplifier circuit are connected with an input end of a relay, and the high-voltage low-frequency operational amplifier circuit is connected with an input end of the relay through a resistor voltage dividing circuit.
And the output end of the second relay is respectively connected with the input end of the second amplifier following precision circuit, the input end of the calibration comparison level circuit and the input end of the first window comparator. And the output end of the first window comparator is respectively connected with the input end of the calibration comparison level circuit and the transformer isolation circuit.
The output end of the calibration comparison level circuit is connected with a test piece DUT, and the two output ends of the calibration amplifier following precision circuit are connected with the test piece DUT.
According to the invention, the computer PC is used for controlling the PCIe card to communicate with the FPGA on the board card, and the FPGA controls TDC acquisition of a loop; the power supply is transmitted to the transformer through an alternating current source, and the direct current source output by rectification and filtering is supplied to a loop operational amplifier and other devices for use.
The principle is shown in fig. 4: the tested signal enters the board card, is divided into three gears, is directly connected to the comparator through a first high frequency, enters the comparator after being isolated by the operational amplifier high impedance, enters the comparator after being attenuated by the operational amplifier in a second high frequency and low voltage signal path, and is transmitted to the FPGA through isolation by the comparator after being compared, and then is transmitted to the upper computer.
The 8-channel floating time frequency measurement board is developed for meeting the requirements of the market on SITE (SITE testing technology) tests of multiple circuit test stations in the field of medium and small voltage power management chips and audio processing application, and can improve the time measurement precision and optimize the test stability. The testing efficiency is improved, and the market competitiveness of the product is improved.
In the invention, the mode of independent floating source of each channel and the use of power supply voltage as potential difference are used, and the power supply isolation similar to a transformer ensures that the whole channel is in the mode of floating source, thus the test influence among multiple channels can not exist. The floating-ground frequency measurement mode can solve the problem of low-amplitude frequency measurement under the condition of high voltage.
In the channel floating mode test circuit, realize the full channel floating mode through digital isolation and power isolation with this channel, this test station site is full floating mode when many test station sites are tested, voltage current change in the test does not have the influence to other test station sites, especially can become very little in the influence that the trigger point is flat, if the mode of common ground to test station site test unusual can cause the voltage difference of other test station sites to fluctuate, this fluctuation can lead to the trigger level also can produce the change thereupon, this change influences that the car city result has the deviation.
For example, as shown in fig. 5, the trigger level is set at 0.4V, the MOS transistor jumps at 0.4V, the MOS transistor is turned on, when abnormality occurs in other test station sites, AGND and AGND in the board have a differential pressure of 0.01V, the trigger is turned on at 0.41V, and the trigger is not turned on at 0.4V, so that the test value of 0.41V deviates from the actual value.
The invention realizes the independence of the multi-channel power supply through the independent power supply of each channel, and realizes the independence of multi-channel communication through the independent digital isolation device.
The used power supply is changed into a floating ground source, and the input voltage source is isolated into potential difference by utilizing the isolation effect of the transformer; the voltage source mode of the independent isolation point of each channel and the mode of single-input multi-stage output provide different voltages for the channels. And the digital isolation is used for isolating the control bus through a digital isolation chip.
Each channel is independent, and mutual interference influence is less. As shown in FIG. 2, each test station SITE is an independent test system, the whole test realizes a full-floating mode, and the influence on the device under test does not influence other test stations SITE through the ground.
The above description is only of the preferred embodiments of the present invention, and it should be noted that: it will be apparent to those skilled in the art that various modifications and adaptations can be made without departing from the principles of the invention and these are intended to be within the scope of the invention.
Claims (4)
1. A kind of floating time measuring device, characterized by: including FPGA board, multichannel time measurement board, alternating current power supply, more than one single channel float ground mode test circuit, the number that single channel floats ground mode test circuit is unanimous with the passageway number of multichannel time measurement board, single channel floats ground mode test circuit and includes digital isolation chip, transformer isolating circuit, wherein:
one end of the digital isolation chip is connected with a control bus of the FPGA board, and the other end of the digital isolation chip is connected with one channel on the multi-channel time measuring board; the control bus and the multi-channel time measuring board are isolated in communication through a digital isolation chip, and independent communication of each channel is realized;
one end of the transformer isolation circuit is connected with an alternating current power supply, the other end of the transformer isolation circuit is connected with a test piece DUT, and the test piece DUT is connected with one channel on the multi-channel time measuring board; the transformer isolation circuit is used for isolating the input alternating current power supply into potential difference, so that the used power supply is changed into a floating ground source; meanwhile, the single-input multi-stage output is realized through the transformer isolation circuit with each channel independent, and different voltages are provided for each channel.
2. The floating time measuring device of claim 1, wherein: the multi-channel time measurement board comprises more than one time measurement unit.
3. The floating time measuring device of claim 2, wherein: the time measuring unit comprises a window comparator II, a calibration amplifier following precision circuit I, a waveform self-checking circuit, a signal circuit to be detected, a relay I, a direct resistor, a high-frequency low-voltage operational amplifier circuit, a high-voltage low-frequency operational amplifier circuit, a resistor voltage dividing circuit, a relay II, a window comparator I, a calibration amplifier following precision circuit II and a calibration comparison level circuit, wherein:
the input end of the second window comparator is connected with the transformer isolation circuit, the output end of the second window comparator is respectively connected with the first calibration amplifier following precision circuit and the waveform self-checking circuit, and the first calibration amplifier following precision circuit and the waveform self-checking circuit are connected with a signal circuit to be detected;
the circuit to be tested is connected with an input end of a relay, an output end of the relay is respectively connected with a through resistor, a high-frequency low-voltage operational amplifier circuit and a high-voltage low-frequency operational amplifier circuit, the through resistor and the high-frequency low-voltage operational amplifier circuit are connected with an input end of a relay II, and the high-voltage low-frequency operational amplifier circuit is connected with an input end of the relay II through a resistor voltage dividing circuit;
the output end of the second relay is respectively connected with the input end of the second amplifier following precision circuit, the input end of the calibration comparison level circuit and the input end of the first window comparator; the output end of the first window comparator is respectively connected with the input end of the calibration comparison level circuit and the transformer isolation circuit;
the output end of the calibration comparison level circuit is connected with a test piece DUT, and the two output ends of the calibration amplifier following precision circuit are connected with the test piece DUT.
4. The floating time measuring device of claim 3, wherein: the number of the channels of the multi-channel time measurement plate is 8.
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| CN202111223810.XA CN113671357B (en) | 2021-10-21 | 2021-10-21 | Floating time measuring device |
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| CN202111223810.XA CN113671357B (en) | 2021-10-21 | 2021-10-21 | Floating time measuring device |
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| CN113671357B CN113671357B (en) | 2022-02-15 |
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Address after: 210000 floor 2, building 26, South Park, Jiangsu Kecheng science and Technology Industrial Park, No. 19, Lanhua Road, Pukou District, Nanjing, Jiangsu Province Patentee after: Nanjing Hongtai Semiconductor Technology Co.,Ltd. Address before: 210000 floor 2, building 26, South Park, Jiangsu Kecheng science and Technology Industrial Park, No. 19, Lanhua Road, Pukou District, Nanjing, Jiangsu Province Patentee before: Nanjing Hongtai Semiconductor Technology Co.,Ltd. |
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