CN113656237A - Load voltage sag immunity rating method, system, device and medium - Google Patents
Load voltage sag immunity rating method, system, device and medium Download PDFInfo
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Abstract
The invention discloses a load voltage sag immunity rating method, a system, a device and a medium, wherein the method comprises the following steps: inputting voltage sag immunity test data of equipment; performing segmentation processing on a continuous time axis to obtain a plurality of continuous time intervals on a continuous time dimension; extracting a residual voltage percentile according to the voltage sag immunity test data in each duration interval; drawing an immunity grade line according to the duration interval and the residual voltage percentile; and evaluating the immunity grade of the equipment to be tested according to the immunity grade line. The method adopts the immunity grade line as a reference, evaluates the immunity of the equipment to be tested, is simple and effective, and has good application value for users who do not have laboratory conditions. The invention can be widely applied to the technical field of power grids.
Description
Technical Field
The invention relates to the technical field of power grids, in particular to a load voltage sag immunity rating method, a load voltage sag immunity rating system, a load voltage sag immunity rating device and a load voltage sag immunity rating medium.
Background
In order to improve the production efficiency, the equipment such as an alternating current contactor, a programmable logic controller, a variable frequency speed regulation driver, a computer and the like is more widely applied in the high-precision technology industry. The equipment is sensitive to voltage sag, when the voltage sag occurs in a power supply system, the equipment is shut down to interrupt the production process, and the personal safety is endangered and the national economy loss is caused. Therefore, the immunity to voltage sag for evaluating sensitive loads is very essential for industrial safety production.
At present, a plurality of experts and scholars at home and abroad carry out voltage sag immunity test on single or a plurality of devices, and the expansion of test data samples and the accumulation of test data provide a large amount of data for the evaluation of the voltage sag immunity of sensitive loads. However, at present, the research on the immunity of the sensitive load voltage sag still mainly focuses on the immunity evaluation of a single device or a single industrial link, and the requirement of lateral contrast of the immunity of various types and multi-model devices when a user selects the devices is not met. Some experts and scholars evaluate the immunity of a plurality of devices or a plurality of industrial links, the consideration is comprehensive, but the evaluation method is complex, the evaluation method is contradictory to the simple and effective user requirements of the evaluation method, and meanwhile, the user lacks relevant professional knowledge and does not have laboratory conditions for detailed evaluation.
Disclosure of Invention
In order to solve at least one of the technical problems in the prior art to a certain extent, the present invention provides a load voltage sag immunity rating method, system, device and medium.
The technical scheme adopted by the invention is as follows:
a load voltage sag immunity rating method comprises the following steps:
inputting voltage sag immunity test data of equipment;
performing segmentation processing on a continuous time axis to obtain a plurality of continuous time intervals on a continuous time dimension;
extracting a residual voltage percentile according to the voltage sag immunity test data in each duration interval;
drawing an immunity grade line according to the duration interval and the residual voltage percentile;
and evaluating the immunity grade of the equipment to be tested according to the immunity grade line.
Further, the equipment is single-phase equipment, and the immunity influence factors of the equipment comprise a sag starting angle, output power and an operation state;
the voltage sag immunity test data of the equipment comprise voltage sag immunity test results of various and multi-model equipment under different working conditions;
the voltage sag immunity test result is the duration of immunity of the equipment and the critical value of residual voltage.
Further, the extracting a residual voltage percentile according to the voltage sag immunity test data in each of the duration intervals includes:
defining a plurality of specific percentiles;
and calculating the corresponding residual voltage reference value of each specific percentile in the duration interval.
Further, the residual voltage reference value is calculated by the following method:
arranging the residual voltages in the voltage sag immunity test data of all the devices according to an increasing sequence in the duration interval to obtain a residual voltage array U ═ U1,u2,...,unN is the number of test data;
assuming that the percentile is P%, the position a corresponding to the percentile is:
in the formula
Is an integer-up function, i.e., the largest integer not exceeding the real number x; the percentile P% corresponds to a residual voltage percentile uPIs the a-th element U in the array UaI.e. the reference value of the residual voltage.
Further, the step of drawing an immunity grade line according to the duration interval and the residual voltage percentile comprises:
acquiring an immunity grade line according to the duration interval and the residual voltage percentile;
each percentile corresponds to one immunity degree grade line, and each immunity degree grade line corresponds to one load immunity degree grade.
Further, the assessing the immunity level of the device to be tested according to the immunity level line includes:
acquiring voltage sag immunity test data of equipment to be tested, and acquiring a VTC curve of the equipment to be tested according to the voltage sag immunity test data;
and comparing the VTC curve with the immunity grade line to obtain the immunity grade of the equipment to be tested.
Further, the segmenting the persistent timeline to obtain a plurality of duration intervals in a duration dimension includes:
the continuous time axis is divided into 5 duration intervals, the 5 duration intervals being [10,200 ], [200,500 ], [500,1000 ], [1000,2000 ], [2000,5000], respectively.
The other technical scheme adopted by the invention is as follows:
a load voltage sag immunity rating system comprising:
the data acquisition module is used for inputting voltage sag immunity test data of equipment;
the interval division module is used for carrying out segmentation processing on the continuous time axis to obtain a plurality of continuous time intervals on a continuous time dimension;
the voltage extraction module is used for extracting the residual voltage percentile according to the voltage sag immunity test data in each duration interval;
the grade division module is used for drawing an immunity grade line according to the duration interval and the residual voltage percentile;
and the grade evaluation module is used for evaluating the immunity grade of the equipment to be tested according to the immunity grade line.
The other technical scheme adopted by the invention is as follows:
a load voltage sag immunity rating device comprising:
at least one processor;
at least one memory for storing at least one program;
when executed by the at least one processor, cause the at least one processor to implement the method described above.
The other technical scheme adopted by the invention is as follows:
a storage medium having stored therein a processor-executable program for performing the method as described above when executed by a processor.
The invention has the beneficial effects that: the method adopts the immunity grade line as a reference, evaluates the immunity of the equipment to be tested, is simple and effective, and has good application value for users who do not have laboratory conditions.
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In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following description is made on the drawings of the embodiments of the present invention or the related technical solutions in the prior art, and it should be understood that the drawings in the following description are only for convenience and clarity of describing some embodiments in the technical solutions of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a schematic view of a VTC curve in an embodiment of the present invention;
FIG. 2 is a flow chart of the device voltage sag immunity rating in an embodiment of the present invention;
FIG. 3 is a schematic diagram of load voltage sag immunity grading line according to an embodiment of the present invention;
FIG. 4 is a schematic representation of the immunity rating line of the class A-D devices in the example of the present invention;
FIG. 5 is a VTC curve for a class A device in an embodiment of the present invention;
FIG. 6 is a VTC curve for a class B device in an embodiment of the present invention;
FIG. 7 is a VTC curve for a class C device in an embodiment of the present invention;
FIG. 8 is a VTC curve for a class D device in an embodiment of the present invention;
FIG. 9 is a VTC curve for a class E device in an embodiment of the present invention;
fig. 10 is a flowchart illustrating steps of a method for rating immunity to voltage sag of a load according to an embodiment of the present invention.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention. The step numbers in the following embodiments are provided only for convenience of illustration, the order between the steps is not limited at all, and the execution order of each step in the embodiments can be adapted according to the understanding of those skilled in the art.
In the description of the present invention, it should be understood that the orientation or positional relationship referred to in the description of the orientation, such as the upper, lower, front, rear, left, right, etc., is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.
In the description of the present invention, the meaning of a plurality of means is one or more, the meaning of a plurality of means is two or more, and larger, smaller, larger, etc. are understood as excluding the number, and larger, smaller, inner, etc. are understood as including the number. If the first and second are described for the purpose of distinguishing technical features, they are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.
The voltage sag immunity of the device is described by a Voltage Tolerance Curve (VTC) on a two-dimensional plane of duration-residual voltage, as shown in fig. 1. The device can tolerate a voltage sag event 1 above the VTC curve, but cannot tolerate a voltage sag event 2 below the VTC curve. Most VTC curves exhibit a stepped fold line as shown in fig. 1. Therefore, the key point of the evaluation of the voltage sag immunity level is to determine two different reference values in the dimensions of duration and residual voltage, and draw a plurality of stepped broken lines as voltage sag immunity level lines as the basis of the voltage sag immunity level rating.
The method for grading the immunity of the voltage sag of the equipment based on the percentile method is based on the test data of the immunity of the voltage sag of the equipment, and the specific implementation flow is shown in fig. 2.
As shown in fig. 10, the present embodiment provides a load voltage sag immunity rating method, including the following steps:
and S101, inputting voltage sag immunity test data of the equipment.
The voltage sag immunity test method is based on voltage sag immunity test results of various types and multi-model equipment under different working conditions, wherein the tested equipment is single-phase equipment, and influence factors of the equipment immunity include but are not limited to sag initial angles, output power, running states and the like.
S102, carrying out segmentation processing on the continuous time axis to obtain a plurality of continuous time intervals on a continuous time dimension.
S103, extracting the residual voltage percentile according to the voltage sag immunity test data in each duration interval.
The step requires that a specific percentile is defined first, so as to reflect the residual voltage level which can be tolerated by the equipment, and then the percentile of the residual voltage is calculated as a reference value on the dimension of the residual voltage according to the test result in each duration interval.
The concept of percentiles is introduced when calculating the residual voltage reference value. Statistically, a group of data is sorted from small to large, and a corresponding cumulative percentile is calculated, so that the value of the data corresponding to a certain percentile is called the percentile of the percentile. In the method, the data of the residual voltage composition in the test data is an observation object and is a lower limit value of the tolerable voltage sag of the equipment. And arranging the residual voltages in the voltage sag immunity test data of all the devices in the interval in an increasing order in a given duration interval. For a given percentile P%, there is a corresponding residual voltage percentile uP. As P% increases, the corresponding upIt will also increase. If u ispA lower residual voltage limit value representing a voltage sag event that the device can tolerate, then uPLarger residual voltage ranges indicate that the device can immunize, and the device is less immune. Therefore, by setting different P%, the corresponding u is obtainedPAs a residual voltage reference value, the rating of the immunity of the load voltage sag can be realized.
Arranging the residual voltages in the voltage sag immunity test data of all the devices in an increasing order in a given duration interval to obtain a residual voltage array U ═ U1,u2,...,unN is the number of test data. Assuming that the percentile is P%, the position a corresponding to the percentile is:
in the formula
Is an ceiling function, i.e. the largest integer not exceeding the real number x. The percentile P% corresponds to a residual voltage percentile uPIs the a-th element U in the array UaI.e. the reference value of the residual voltage.
At niA duration interval
Inner corresponding to njOne percentile
Obtained ni×njThe individual residual voltage percentiles, i.e., the residual voltage reference values, may be represented by a table as shown in table 1.
TABLE 1 residual voltage percentile statistical table
And S104, drawing an immunity grade line according to the duration interval and the residual voltage percentile.
Based on the analysis results of the steps S102 to S103, according to the reference values in two dimensions of the duration and the residual voltage, the step-shaped broken line drawn in this step is a voltage sag immunity level line, which is used as a basis for grading the voltage sag immunity.
After the percentile is given, a horizontal line can be drawn according to the residual voltage reference value in each duration interval according to the corresponding row in table 1. And a step-shaped broken line formed by the horizontal lines in each duration interval is the immunity grade line corresponding to the percentile. Each percentile corresponds to one immunity grade line, and each immunity grade line corresponds to one load immunity grade.
And S105, evaluating the immunity grade of the equipment to be tested according to the immunity grade line.
The step requires that voltage sag immunity test data of a specific device (i.e. a device to be tested) is input, a VTC curve of the device is drawn based on the test data, and then the VTC curve of the device to be tested is compared with an immunity grade line. And when the VTC curve of the equipment to be tested is positioned below the immunity level line, considering that the voltage sag immunity of the equipment to be tested meets the corresponding level requirement.
Assuming that a certain immunity level line is shown in fig. 3, when the VTC curve of the device under test is completely located in the area below the voltage sag immunity level line in the graph, the device is considered to meet the immunity level requirement. At this time, the device can be immune to voltage sag events in the region above the voltage sag immunity level line. And when the equipment meets the requirements of a plurality of voltage sag immunity levels, selecting the highest level as a voltage sag immunity level rating result of the equipment. All devices that do not meet the requirements of all the immunity grade lines are individually classified into one grade as a supplement to the results of the immunity grade division with the immunity grade lines.
The above method is explained in detail with reference to specific examples below.
The embodiment provides a device voltage sag immunity rating method based on a percentile method, which comprises the following steps:
s201, inputting equipment voltage sag immunity test data.
The 14 kinds of domestic single-phase equipment are used as test objects, and the kinds of equipment comprise an alternating current contactor, a switching power supply, a lighting lamp, a low-voltage release, a computer and an air conditioner. These domestic equipments have a relatively wide application in the domestic market, each kind of equipment carries out the basic item test of duration, residual voltage and sag initial angle, and some equipments carry out the voltage sag immunity test under different working conditions, as shown in table 2. When the influence of the sag starting angle on the voltage sag immunity of the equipment is tested, the sag starting angles are uniformly 0 degrees, 45 degrees, 90 degrees, 135 degrees, 180 degrees, 225 degrees, 270 degrees and 315 degrees.
TABLE 2 influencing factors of the load VTC curve
And (3) performing a repeated experiment on the 14 kinds of single-phase equipment on a voltage sag immunity test platform to obtain the duration of immunity of the equipment under different working conditions and the critical value of residual voltage. On the duration-residual voltage plane, multiple sets of threshold values are represented in the form of scatters, and the device VTC curve can be obtained by connecting the scatters. A total of 224 sets of instrument VTC curves, 14560 test data, were obtained in the experiment.
S202, segmentation processing is carried out on the continuous time axis.
The CIGRE C4.110 report of Voltage Dip Immunity of Equipment and instrumentation, statistically analyzes the Voltage sag event data and the Equipment Voltage sag Immunity test data in the global range, and the suggested durations corresponding to the inflection points of the Immunity level line are 10ms, 200ms, 500ms, 1000ms, 2000ms and 5000ms, respectively. CIGRE C4.110 reports that the proposed immunity level division data is derived from test data for voltage sag immunity of foreign devices, and therefore, this example refers to the report that duration interval division is performed in the duration dimension, dividing the duration axis into 5 duration intervals, i.e., [10,200 ], [200,500 ], [500,1000 ], [1000,2000 ], [2000,5000 ]. Because most sensitive loads have better tolerance to voltage sag within 10ms of duration, the duration interval of 0-10 ms is not considered.
And S203, extracting the percentile of the residual voltage.
And in the dimension of the residual voltage, extracting the percentile of the residual voltage in each duration interval by combining the test result of the domestic equipment. Appointing 4 percentiles, and respectively taking P1％＝90％、P2％＝70％、P3％＝50％、P4Percent is 30%, the residual voltage reference value for each percentile over 5 duration intervals is calculated in conjunction with equation (1), and the results are shown in table 3. Within the [10,200) ms duration interval, a residual voltage percentile corresponding to a percentile of 90% is 63%, i.e. the residual voltage reference value is 63%. This value represents a residual voltage of 63% or less for at least 90% of the test data over a duration interval of [10,200) ms.
TABLE 3 residual voltage reference values for different duration intervals
And S204, drawing an immunity grade line.
According to table 3, each percentile can be mapped with 5 horizontal lines representing the percentile of the residual voltage within 5 time durations, thereby forming an immunity grade line. When 4 percentiles are specified, 4 lines of immunity rank are obtained. Because the higher percentile obtained immunity grade lines represent the poorer immunity capability of the equipment, the immunity grade lines corresponding to the percentiles of 30%, 50%, 70% and 90% represent the gradual reduction of the immunity grade of the equipment. When these four grades are designated as A, B, C, D, the immunity requirements for grades A to D are shown in FIGS. 3 to 8. On the basis, the established immunity rating rule is as follows:
1) grade A: the devices belonging to the class have the highest voltage sag immunity degree, and the VTC curve of the devices should meet the requirement of P4Percent is 30% corresponding to the requirement of the immunization rating line;
2) grade B: the devices belonging to the class have better voltage sag immunity, and the VTC curve of the devices should meet the requirement of P3Percent is 50% corresponding to the requirement of the immunization rating line;
3) grade C: devices classified in this class possess a moderate level of voltage sag immunity, the VTC curve of which should satisfy P 270% is required for the corresponding immunization rating line;
4) grade D: the devices belonging to this class have a poor immunity to voltage sag, the VTC curve of which should satisfy P1Percent is 90% corresponding to the requirement of the immunity grade line;
5) grade E: devices assigned to this class have the worst voltage sag immunity, and their VTC curves should not meet any immunity class line requirements.
As can be seen from fig. 4, as the immunity level decreases from a to D, the higher the residual voltage reference value in different duration intervals, the narrower the residual voltage range of the voltage sag events that the device can tolerate, and the fewer voltage sag events that the device can immunize.
And S205, evaluating the immunity level of the equipment.
When the user can only obtain a general VTC curve for a specific device, the VTC curve is compared with the a-D level immunity level line in fig. 4. In this embodiment, each device is affected by various working conditions, multiple VTC curves can be obtained, and a VTC curve of a device having a certain representativeness needs to be selected for comparison with the immunity level line. At this time, all the device voltage sag VTC curves tested by each device may be enveloped, points having the minimum duration when the residual voltages are the same are selected, and such points are connected in a line, thereby obtaining an upper envelope of the device VTC curve. All VTC curves of the device under different working conditions are positioned at the lower right of the upper envelope line. Comparing the upper envelope of the VTC curve of the device with the a-D scale immunity scale line in fig. 4, the following device voltage sag immunity scale results were obtained:
1) a level: the device belonging to the level is PC1, the voltage sag immunity of the device is the highest level, the VTC curve meets the requirements of the A-level device immunity level line, and the device can completely immunize voltage sag events above the immunity level line in figure 5.
2) B stage: no device belongs to the level, and the device meeting the requirement of the level can completely immunize against the voltage sag event above the immunity level line in fig. 6;
3) c level: the devices belonging to the class are PS1, PS2 and A3, the voltage sag immunity of the 3 devices is in a medium level, the VTC curve meets the requirement of a class C device immunity grade line, and the devices can be completely immunized against the voltage sag events above the immunity grade line in the graph 7;
4) d stage: the devices belonging to the class are L1, L2, L3, C1 and C3, the 5 devices have poor voltage sag immunity, the VTC curve meets the requirement of a D-class device immunity grade line, and the devices can completely immunize voltage sag events above the immunity grade line in the graph 8;
5) e, grade: the devices belonging to the class are C2, R1, R2, R3 and PS3, the 6 devices have the worst voltage sag immunity, and the VTC curve of the devices cannot meet the requirements of the immunity grade line of the most basic class 2 devices. The VTC curve portion for the 6 devices is above the immunity level line in fig. 9, indicating that the devices are not fully immune to voltage sag events above the immunity level line.
According to the evaluation results, the voltage sag immunity rating line based on the percentile method can classify 14 devices into 4 grades except for the B grade, which indicates that the method has certain feasibility in the immunity rating aspect. The whole grading process is established on the basis of voltage sag immunity test data of the domestic equipment, so that the obtained grading method has good applicability to the domestic equipment.
In summary, compared with the prior art, the present embodiment has the following beneficial effects:
(1) the embodiment is not limited to single equipment or single industrial link immunity evaluation, the obtained immunity grade line has certain reference significance for equipment immunity comparison of users, and the requirement for performing immunity transverse comparison on various and multi-model equipment when the users select the equipment is met.
(2) Although foreign related scholars propose immunity curves with different grades as equipment immunity rating bases, the curves are proposed according to the cognition of foreign experts and scholars on the immunity of foreign brands, and the subjectivity is strong. The immunity grade line provided by the method of the embodiment is calculated according to the test data, so that the evaluation process is objective. In addition, the immunity grade line calculated by adopting the test data of the domestic equipment depends on the immunity test result of the domestic equipment, and compared with the existing immunity curve in foreign countries, the immunity grade line calculated by the method has higher applicability to the immunity evaluation of the domestic equipment.
(3) The method for evaluating the immunity of the equipment based on the immunity grade line is simple and effective, and has a good application value for users without laboratory conditions.
The present embodiment also provides a load voltage sag immunity rating system, including:
the data acquisition module is used for inputting voltage sag immunity test data of equipment;
the interval division module is used for carrying out segmentation processing on the continuous time axis to obtain a plurality of continuous time intervals on a continuous time dimension;
the voltage extraction module is used for extracting the residual voltage percentile according to the voltage sag immunity test data in each duration interval;
the grade division module is used for drawing an immunity grade line according to the duration interval and the residual voltage percentile;
and the grade evaluation module is used for evaluating the immunity grade of the equipment to be tested according to the immunity grade line.
The load voltage sag immunity rating system of the embodiment can execute the load voltage sag immunity rating method provided by the embodiment of the method of the invention, can execute any combination implementation steps of the embodiment of the method, and has corresponding functions and beneficial effects of the method.
The present embodiment also provides a load voltage sag immunity rating apparatus, including:
at least one processor;
at least one memory for storing at least one program;
when executed by the at least one processor, cause the at least one processor to implement the method shown in fig. 10.
The load voltage sag immunity rating device of the embodiment can execute the load voltage sag immunity rating method provided by the embodiment of the method of the invention, can execute any combination implementation steps of the embodiment of the method, and has corresponding functions and beneficial effects of the method.
The embodiment of the application also discloses a computer program product or a computer program, which comprises computer instructions, and the computer instructions are stored in a computer readable storage medium. The computer instructions may be read by a processor of a computer device from a computer-readable storage medium, and executed by the processor, to cause the computer device to perform the method illustrated in fig. 10.
The embodiment also provides a storage medium, which stores instructions or programs capable of executing the load voltage sag immunity rating method provided by the embodiment of the method of the invention, and when the instructions or the programs are run, the method can be executed by any combination of the embodiment of the method, and the method has corresponding functions and beneficial effects.
In alternative embodiments, the functions/acts noted in the block diagrams may occur out of the order noted in the operational illustrations. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality/acts involved. Furthermore, the embodiments presented and described in the flow charts of the present invention are provided by way of example in order to provide a more thorough understanding of the technology. The disclosed methods are not limited to the operations and logic flows presented herein. Alternative embodiments are contemplated in which the order of various operations is changed and in which sub-operations described as part of larger operations are performed independently.
Furthermore, although the present invention is described in the context of functional modules, it should be understood that, unless otherwise stated to the contrary, one or more of the described functions and/or features may be integrated in a single physical device and/or software module, or one or more functions and/or features may be implemented in a separate physical device or software module. It will also be appreciated that a detailed discussion of the actual implementation of each module is not necessary for an understanding of the present invention. Rather, the actual implementation of the various functional modules in the apparatus disclosed herein will be understood within the ordinary skill of an engineer, given the nature, function, and internal relationship of the modules. Accordingly, those skilled in the art can, using ordinary skill, practice the invention as set forth in the claims without undue experimentation. It is also to be understood that the specific concepts disclosed are merely illustrative of and not intended to limit the scope of the invention, which is defined by the appended claims and their full scope of equivalents.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
The logic and/or steps represented in the flowcharts or otherwise described herein, e.g., an ordered listing of executable instructions that can be considered to implement logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device.
More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium could even be paper or another suitable medium upon which the program is printed, as the program can be electronically captured, via for instance optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner if necessary, and then stored in a computer memory.
It should be understood that portions of the present invention may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
In the foregoing description of the specification, reference to the description of "one embodiment/example," "another embodiment/example," or "certain embodiments/examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While embodiments of the present invention have been shown and described, it will be understood by those of ordinary skill in the art that: various changes, modifications, substitutions and alterations can be made to the embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the claims and their equivalents.
While the preferred embodiments of the present invention have been illustrated and described, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (10)
1. A load voltage sag immunity rating method is characterized by comprising the following steps:
inputting voltage sag immunity test data of equipment;
performing segmentation processing on a continuous time axis to obtain a plurality of continuous time intervals on a continuous time dimension;
extracting a residual voltage percentile according to the voltage sag immunity test data in each duration interval;
drawing an immunity grade line according to the duration interval and the residual voltage percentile;
and evaluating the immunity grade of the equipment to be tested according to the immunity grade line.
2. The method according to claim 1, wherein the device is a single-phase device, and the immunity influencing factors of the device include a sag starting angle, an output power and an operation state;
the voltage sag immunity test data of the equipment comprise voltage sag immunity test results of various and multi-model equipment under different working conditions;
the voltage sag immunity test result is the duration of immunity of the equipment and the critical value of residual voltage.
3. The method according to claim 1, wherein the extracting the percentile of residual voltage according to the voltage sag immunity test data in each of the duration intervals comprises:
defining a plurality of specific percentiles;
and calculating the corresponding residual voltage reference value of each specific percentile in the duration interval.
4. The method according to claim 3, wherein the residual voltage reference value is calculated by:
arranging the residual voltages in the voltage sag immunity test data of all the devices according to an increasing sequence in the duration interval to obtain a residual voltage array U ═ U1,u2,...,unN is the number of test data;
assuming that the percentile is P%, the position a corresponding to the percentile is:
in the formula
Is an integer-up function, i.e., the largest integer not exceeding the real number x; the percentile P% corresponds to a residual voltage percentile uPIs the a-th element U in the array UaI.e. the reference value of the residual voltage.
5. The method according to claim 1, wherein the step of plotting the immunity rating line according to the duration interval and the percentile of the residual voltage comprises:
acquiring an immunity grade line according to the duration interval and the residual voltage percentile;
each percentile corresponds to one immunity degree grade line, and each immunity degree grade line corresponds to one load immunity degree grade.
6. The method as claimed in claim 1, wherein the step of rating the immunity of the device under test according to the immunity rating line comprises:
acquiring voltage sag immunity test data of equipment to be tested, and acquiring a VTC curve of the equipment to be tested according to the voltage sag immunity test data;
and comparing the VTC curve with the immunity grade line to obtain the immunity grade of the equipment to be tested.
7. The method according to claim 1, wherein the step of segmenting the duration time axis to obtain a plurality of duration time intervals in the duration time dimension comprises:
the continuous time axis is divided into 5 duration intervals, the 5 duration intervals being [10,200 ], [200,500 ], [500,1000 ], [1000,2000 ], [2000,5000], respectively.
8. A load voltage sag immunity rating system, comprising:
the data acquisition module is used for inputting voltage sag immunity test data of equipment;
the interval division module is used for carrying out segmentation processing on the continuous time axis to obtain a plurality of continuous time intervals on a continuous time dimension;
the voltage extraction module is used for extracting the residual voltage percentile according to the voltage sag immunity test data in each duration interval;
the grade division module is used for drawing an immunity grade line according to the duration interval and the residual voltage percentile;
and the grade evaluation module is used for evaluating the immunity grade of the equipment to be tested according to the immunity grade line.
9. A load voltage sag immunity rating apparatus, comprising:
at least one processor;
at least one memory for storing at least one program;
when executed by the at least one processor, cause the at least one processor to implement the method of any one of claims 1-7.
10. A storage medium having stored therein a program executable by a processor, wherein the program executable by the processor is adapted to perform the method of any one of claims 1-7 when executed by the processor.
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