CN113655195B - Probe frame detection platform - Google Patents
Probe frame detection platform Download PDFInfo
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- CN113655195B CN113655195B CN202110038684.4A CN202110038684A CN113655195B CN 113655195 B CN113655195 B CN 113655195B CN 202110038684 A CN202110038684 A CN 202110038684A CN 113655195 B CN113655195 B CN 113655195B
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- 239000000523 sample Substances 0.000 title claims abstract description 99
- 238000001514 detection method Methods 0.000 title claims abstract description 33
- 230000007246 mechanism Effects 0.000 claims abstract description 104
- 238000009434 installation Methods 0.000 claims abstract description 12
- 238000007689 inspection Methods 0.000 claims description 15
- 230000006978 adaptation Effects 0.000 claims description 3
- 230000008844 regulatory mechanism Effects 0.000 claims description 3
- 238000012360 testing method Methods 0.000 claims description 3
- 229910000831 Steel Inorganic materials 0.000 abstract description 7
- 239000010959 steel Substances 0.000 abstract description 7
- 230000006378 damage Effects 0.000 abstract description 2
- 238000004519 manufacturing process Methods 0.000 abstract description 2
- 238000013519 translation Methods 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 230000008569 process Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/204—Structure thereof, e.g. crystal structure
- G01N33/2045—Defects
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B61—RAILWAYS
- B61K—AUXILIARY EQUIPMENT SPECIALLY ADAPTED FOR RAILWAYS, NOT OTHERWISE PROVIDED FOR
- B61K9/00—Railway vehicle profile gauges; Detecting or indicating overheating of components; Apparatus on locomotives or cars to indicate bad track sections; General design of track recording vehicles
- B61K9/08—Measuring installations for surveying permanent way
- B61K9/10—Measuring installations for surveying permanent way for detecting cracks in rails or welds thereof
Abstract
The invention discloses a probe frame detection table, which comprises a bottom frame and a movable bottom plate, wherein a moving mechanism is arranged between the bottom frame and the movable bottom plate, the moving mechanism comprises an X-direction moving mechanism and a Y-direction moving mechanism, the X-direction moving mechanism is arranged on the bottom frame, the Y-direction moving mechanism is arranged on the X-direction moving mechanism, and the movable bottom plate is arranged on the Y-direction moving mechanism; the detection table further comprises a swinging bottom plate, the swinging bottom plate is located above the moving bottom plate, an installation mechanism for installing the probe frame is arranged in the middle of the swinging bottom plate, a Y-direction rotation adjusting mechanism is arranged on one side of the installation mechanism, X-direction rotation adjusting mechanisms are arranged on two sides of the swinging bottom plate, and the X-direction rotation adjusting mechanisms are connected to two sides of the moving bottom plate. The mounting mechanism and the probe frame thereof can accurately adjust translation and rotation in multiple directions, and can finish debugging work of detecting different positions and different types of injuries on a steel rail on one probe frame, thereby providing an adjusting basis for actual production.
Description
Technical Field
The invention relates to the field of metal detection, in particular to a probe frame detection table.
Background
In the technical field of rail flaw detection, a traditional detection device has fewer probes arranged on one probe frame, is difficult to detect the flaws of different positions and different types on one steel rail, and has low adjustment precision.
In view of the above, the present application provides a probe holder inspection table, which is used for detecting a rail of a flaw detection vehicle by placing a probe holder with a plurality of probes on an inspection table and using a sample rail to achieve a set accuracy.
Disclosure of Invention
The invention aims to provide a probe frame detection table aiming at the defects of the prior art.
In order to solve the technical problems, the following technical scheme is adopted:
the utility model provides a probe frame examines test table, includes bottom frame and removal bottom plate, its characterized in that: a moving mechanism is arranged between the bottom frame and the moving bottom plate, the moving mechanism comprises an X-direction moving mechanism and a Y-direction moving mechanism, the X-direction moving mechanism is mounted on the bottom frame, the Y-direction moving mechanism is mounted on the X-direction moving mechanism, and the moving bottom plate is mounted on the Y-direction moving mechanism;
the detection table further comprises a swing bottom plate, the swing bottom plate is located above the moving bottom plate, an installation mechanism for installing a probe frame is arranged in the middle of the swing bottom plate, Y-direction rotation adjusting mechanisms are arranged on one side of the installation mechanism, X-direction rotation adjusting mechanisms are arranged on two sides of the swing bottom plate, and the X-direction rotation adjusting mechanisms are connected to two sides of the moving bottom plate.
Further, installation mechanism includes sliding shaft, fixed axle and sliding bearing seat, sliding bearing seat includes first sliding bearing seat and second sliding bearing seat, first sliding bearing seat fixed mounting in the front side of swing bottom plate, second sliding bearing seat fixed mounting in the rear side of swing bottom plate, install on the first sliding bearing seat the sliding shaft, the sliding shaft passes first sliding bearing seat connects Y is to rotatory adjustment mechanism, install on the second sliding bearing seat the fixed axle, the sliding shaft with fixed axle looks adaptation.
Further, Y includes Y to regulation guide block, Y to adjustment handle and staple bolt to rotatory adjustment mechanism, Y includes first Y to adjustment handle and second Y to adjustment handle, Y is equipped with relative first Y that sets up to adjustment guide block to adjustment handle and second Y to adjustment handle to the upper portion of adjusting the guide block, Y has the sliding shaft to the sub-unit connection of adjusting the guide block, Y presss from both sides tightly through the staple bolt between to regulation guide block and the sliding shaft.
Further, the X-direction rotation adjusting mechanism comprises an X-direction screw rod adjusting assembly, the X-direction screw rod adjusting assembly comprises an X-direction adjusting screw rod swinging block, an X-direction adjusting screw rod, an X-direction adjusting nut and an X-direction screw rod hinge fixing seat, the X-direction adjusting nut comprises a first X-direction adjusting nut and a second X-direction adjusting nut, the X-direction screw rod hinge fixing seat comprises a first X-direction screw rod hinge fixing seat and a second X-direction screw rod hinge fixing seat,
first X to screw rod hinge fixing base fixed mounting in on the swing bottom plate, second X to screw rod hinge fixing base fixed mounting in on the removal bottom plate, first X is to installing X between screw rod hinge fixing base and the second X to the screw rod hinge fixing base to adjusting screw, X is equipped with X to adjusting screw pendulum piece to adjusting screw's upper portion, X inlays in first X to screw rod hinge fixing base to adjusting screw pendulum piece, X is equipped with first X to adjusting nut to adjusting screw pendulum piece's upper portion, X is equipped with second X to adjusting nut to adjusting screw pendulum piece's lower part, first X all install in X is to adjusting nut and second X to adjusting nut on the adjusting screw.
Further, X is still including setting up in the arc track rotating assembly who removes bottom plate and swing bottom plate both sides to rotation regulation mechanism, arc track rotating assembly includes circular arc guide rail riser, arc regulation seat, arc slider connecting seat, arc slider, arc slide rail, circular arc guide rail riser fixed mounting in the both sides of removing the bottom plate, install the arc slide rail on the circular arc guide rail riser, install the arc slider on the arc slide rail, the arc is adjusted the seat set up in the both sides of swing bottom plate, install the arc slider connecting seat on the arc regulation seat, install the arc slider on the arc slider connecting seat.
Further, the Y-direction moving mechanism comprises a Y-direction moving slide block, a Y-direction moving slide rail and a Y-direction fixing plate, the Y-direction moving slide rail is installed on the upper portion of the Y-direction fixing plate, the Y-direction moving slide block is installed on the Y-direction moving slide rail, the Y-direction moving slide block is connected to the bottom of the moving base plate, and the lower portion of the Y-direction fixing plate is connected with the X-direction moving mechanism.
Further, the X-direction moving mechanism comprises an X-direction moving sliding block and an X-direction moving sliding rail, the X-direction moving sliding rail is arranged on the bottom frame, the X-direction moving sliding block is arranged on the X-direction moving sliding rail, and the X-direction moving sliding block is connected with the Y-direction moving mechanism.
Further, the Y-direction moving mechanism is connected with a Y-direction linear adjusting mechanism, the Y-direction linear adjusting mechanism comprises a Y-direction linear adjusting seat, a Y-direction linear adjusting handle, a micrometer and a Y-direction linear stop block, the Y-direction linear adjusting seat comprises a first Y-direction linear adjusting seat and a second Y-direction linear adjusting seat, the Y-direction linear adjusting handle comprises a first Y-direction linear adjusting handle and a second Y-direction linear adjusting handle, the upper part of the Y-direction linear stop block is connected with the movable bottom plate, the lower part of the Y-direction linear stop block is connected with the Y-direction movable slide rail, a first Y-direction linear adjusting seat and a second Y-direction linear adjusting seat are arranged on the side surface of the Y-direction movable slide rail, and a first Y-direction linear adjusting handle and a micrometer are installed on the first Y-direction linear adjusting seat, and a second Y-direction linear adjusting handle is installed on the second Y-direction linear adjusting seat.
Furthermore, a plurality of probes are arranged on the probe frame.
Further, a sample rail is arranged below the probe frame.
Due to the adoption of the technical scheme, the method has the following beneficial effects:
the invention relates to a probe frame detection table, wherein an installation mechanism on the detection table and a probe frame of the detection table can accurately regulate translation and rotation in multiple directions, and can complete debugging work for detecting different positions and different types of injuries on a steel rail on one probe frame, thereby providing an adjustment basis for actual production.
The detection table is characterized in that a probe frame (provided with a plurality of probes) produced in a processing plant is placed on a mounting mechanism, the probe frame is fixed through a sliding shaft and a fixing shaft, a sample rail is placed in a bottom frame, the probe frame is adjusted to be above the sample rail by adjusting an X-direction moving mechanism and a Y-direction moving mechanism, then a first Y-direction linear adjusting handle and a second Y-direction linear adjusting handle are adjusted, the first Y-direction linear adjusting handle and the second Y-direction linear adjusting handle abut against a Y-direction linear stop block, the Y-direction linear stop block is fixedly connected with a movable bottom plate, the positions of the movable bottom plate can be adjusted left and right by screwing the first Y-direction linear adjusting handle and the second Y-direction linear adjusting handle, meanwhile, the moving distance can be accurately read according to a micrometer, and therefore the probe frame can be adjusted to be accurate in the Y-direction linear. Finally, the Y-direction adjusting guide block drives the sliding shaft to rotate in a certain direction by screwing a first Y-direction adjusting handle and a second Y-direction adjusting handle through the Y-direction rotation adjusting mechanism and the X-direction rotation adjusting mechanism, so that the probe frame rotates around the Y-axis direction; through twisting first X to adjusting nut and second X to adjusting nut, cooperation arc slider and arc slide rail can make the part of fixing on the swing bottom plate all around the certain angle of X axle rotation to accomplish probe frame around the certain angle of X axle rotation. Therefore, the probe frame can rotate around the X axis and the Y axis and can accurately move for a certain distance in the Y axis direction, so that the probe frame can ensure that the initial position is right above the steel rail and keep horizontal, and detection errors are avoided.
Drawings
The invention will be further described with reference to the accompanying drawings in which:
FIG. 1 is a schematic perspective view of a probe holder inspection station according to the present invention;
FIG. 2 is a schematic perspective view of another perspective view of a probe holder inspection station according to the present invention;
FIG. 3 is a schematic view of a front view of a probe holder inspection station of the present invention;
FIG. 4 is a schematic diagram of a top view of a probe holder inspection station according to the present invention;
FIG. 5 is a schematic diagram of a side view of a probe holder inspection station according to the present invention;
FIG. 6 is a schematic view of a probe holder of the present invention;
fig. 7 is a schematic structural view of the sample rail of the present invention.
In the figure: 1. the device comprises a bottom frame 11, a movable bottom plate 12, a swinging bottom plate 13, a probe frame 14, a probe 15 and a sample rail;
2. an X-direction moving mechanism, a 21 and X-direction moving slide block, and a 22 and X-direction moving slide rail;
3. a Y-direction moving mechanism, a 31 and Y-direction fixing plate, a 32 and Y-direction moving slide rail and a 33 and Y-direction moving slide block;
4. the mounting mechanism 41, the sliding shaft 42, the fixed shaft 43, the first sliding bearing seat 44 and the second sliding bearing seat;
5. a Y-direction rotation adjusting mechanism, 51, a Y-direction adjusting guide block, 52, a hoop, 53, a first Y-direction adjusting handle, 54 and a second Y-direction adjusting handle;
6. the device comprises an air supply outlet, a swing block of 61 and an X-direction adjusting screw, a first X-direction screw hinge fixing seat, a second X-direction screw hinge fixing seat, a first X-direction adjusting nut, a second X-direction adjusting screw and a 66 and X-direction adjusting screw, wherein the swing block of 62 and X-direction adjusting screws is arranged on the air supply outlet;
7. the circuit module fixing part comprises a circuit module fixing part 71, an arc guide rail vertical plate 72, an arc adjusting seat 73, an arc sliding block connecting seat 74, an arc sliding block 75 and an arc sliding rail;
8. a Y-direction linear adjusting mechanism 81, a micrometer 82, a Y-direction linear stop block 83, a first Y-direction linear adjusting seat 84, a second Y-direction linear adjusting seat 85 and a first Y-direction linear adjusting handle; 86. the second Y-direction linear adjusting handle.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to the accompanying drawings and examples. It should be understood, however, that the description herein of specific embodiments is only intended to illustrate the invention and not to limit the scope of the invention. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present invention.
Referring to fig. 1-7, a probe holder detection table comprises a bottom frame 1 and a moving bottom plate 11, wherein a moving mechanism is arranged between the bottom frame 1 and the moving bottom plate 11, the moving mechanism comprises an X-direction moving mechanism 2 and a Y-direction moving mechanism 3, the X-direction moving mechanism 2 is mounted on the bottom frame 1, the Y-direction moving mechanism 3 is mounted on the X-direction moving mechanism 2, and the moving bottom plate 11 is mounted on the Y-direction moving mechanism 3;
the detection table further comprises a swing bottom plate 12, the swing bottom plate 12 is located above the moving bottom plate 11, the middle of the swing bottom plate 12 is provided with an installation mechanism 4 for installing a probe frame 13, one side of the installation mechanism 4 is provided with a Y-direction rotation adjusting mechanism 5, two sides of the swing bottom plate 12 are provided with an X-direction rotation adjusting mechanism, and the X-direction rotation adjusting mechanism is connected to two sides of the moving bottom plate 11.
Referring to fig. 6, further, a plurality of probes 14 are disposed on the probe holder 13. In the detection table, the number of probes is increased from the original three to 6 or 9, nine probes 14 with the angles of 70 degrees, 45 degrees and 0 degrees can be arranged on the probe frame 13 from left to right,
referring to fig. 7, further, a sample rail 15 is arranged below the probe holder 13. The sample rail 15 is a standard rail, the sample rail 15 is placed below the probe frame 13, the probe 14 on the probe frame 13 is used for detecting, and if the detection result meets the set requirement, the produced probe frame 13 and the produced probe 14 meet the standard, so that the sample rail 15 can be used for rail detection work of a flaw detection vehicle.
Further, installation mechanism 4 includes sliding shaft 41, fixed axle 42 and sliding bearing seat, sliding bearing seat includes first sliding bearing seat 43 and second sliding bearing seat 44, first sliding bearing seat 43 fixed mounting in the front side of swing bottom plate 12, second sliding bearing seat 44 fixed mounting in the rear side of swing bottom plate 12, install on the first sliding bearing seat 43 sliding shaft 41, sliding shaft 41 passes first sliding bearing seat 43 is connected Y is to rotatory adjustment mechanism 5, install on the second sliding bearing seat 44 fixed axle 42, sliding shaft 41 with fixed axle 42 looks adaptation. The mounting mechanism 4 is used for mounting the probe frame 13, the probe frame 13 is provided with a through hole, one end of the probe frame 13 is connected to the fixed shaft 42 through the through hole during detection, the other end of the probe frame 13 is connected to the sliding shaft 41 through the through hole, and therefore the probe frame 13 is well fixed on the mounting mechanism 4 and preparation is made for detection.
Further, the Y-direction rotation adjusting mechanism 5 includes a Y-direction adjusting guide block 51, a Y-direction adjusting handle and an anchor ear 52, the Y-direction adjusting handle includes a first Y-direction adjusting handle 53 and a second Y-direction adjusting handle 54, the first Y-direction adjusting handle 53 and the second Y-direction adjusting handle 54 which are oppositely arranged are arranged on the upper portion of the Y-direction adjusting guide block 51, the lower portion of the Y-direction adjusting guide block 51 is connected with a sliding shaft 41, and the Y-direction adjusting guide block 51 and the sliding shaft 41 are clamped by the anchor ear 52. When the rotation adjustment in the Y-axis direction is needed, the Y-direction adjustment guide block 51 drives the sliding shaft 41 to rotate in a certain direction by screwing the first Y-direction adjustment handle 53 and the second Y-direction adjustment handle 54, so that the probe holder 13 is rotated and adjusted to a proper position by the rotation of the probe holder 13 in the Y-axis direction, and preparation is made for detection.
Further, X is to rotatory adjustment mechanism including X to screw rod adjusting part 6, X is to screw rod adjusting part 6 including X to adjusting screw pendulum piece 61, X to adjusting screw 66, X to adjusting nut and X to screw rod hinge fixing base, X includes first X to adjusting nut 64 and second X to adjusting nut 65 to adjusting nut, X includes first X to screw rod hinge fixing base 62 and second X to screw rod hinge fixing base 63 to screw rod hinge fixing base. The first X-direction screw hinge fixing seat 62 is fixedly installed on the swing base plate 12, the second X-direction screw hinge fixing seat 63 is fixedly installed on the moving base plate 11, an X-direction adjusting screw 66 is installed between the first X-direction screw hinge fixing seat 62 and the second X-direction screw hinge fixing seat 63, an X-direction adjusting screw 66 swing block 61 is arranged on the upper portion of the X-direction adjusting screw 66, the X-direction adjusting screw 66 swing block 61 is embedded in the first X-direction screw hinge fixing seat 62, a first X-direction adjusting nut 64 is arranged on the upper portion of the X-direction adjusting screw 66 swing block 61, a second X-direction adjusting nut 65 is arranged on the lower portion of the X-direction adjusting screw 66 swing block 61, and the first X-direction adjusting nut 64 and the second X-direction adjusting nut 65 are both installed on the X-direction adjusting screw 66.
Further, X is still including setting up in the arc track rotating assembly 7 of moving bottom plate 11 and swing bottom plate 12 both sides to rotation regulation mechanism, arc track rotating assembly 7 includes circular arc guide rail riser 71, arc regulation seat 72, arc slider connecting seat 73, arc slider 74 and arc slide rail 75, circular arc guide rail riser 71 fixed mounting in the both sides of moving bottom plate 11, install arc slide rail 75 on the circular arc guide rail riser 71, install arc slider 74 on the arc slide rail 75, arc regulation seat 72 set up in the both sides of swing bottom plate 12, install arc slider connecting seat 73 on the arc regulation seat 72, install arc slider 74 on the arc slider connecting seat 73. When the X-axis direction rotation adjustment is needed, the swinging bottom plate 12 is suspended relative to the moving bottom plate 11, the first X-direction adjusting nut 64 and the second X-direction adjusting nut 65 are screwed, and the arc-shaped sliding block 74 and the arc-shaped sliding rail 75 are matched, so that parts fixed on the swinging bottom plate 12 can rotate for a certain angle around the X axis, the probe frame 13 rotates for a certain angle around the Y axis, and the probe frame 13 is adjusted to a proper position through rotation of the probe frame 13 around the Y axis, and preparation is made for detection.
Through separately setting up X to screw rod adjusting part 6 and arc track rotating assembly 7, arc track rotating assembly 7 is provided with two pairs, be located the both sides of moving bottom plate 11 and swing bottom plate 12 respectively, X sets up the middle part leading flank at whole test table to screw rod adjusting part 6, not only make things convenient for the measurement personnel to twist and move first X and carry out rotation regulation to adjusting nut 64 and second X to adjusting nut 65, need not place the regulation beside arc track rotating assembly 7, and through separately setting up both, when being convenient for twist and move first X to adjusting nut 64 and second X to adjusting nut 65, produce rotation angle, reach laborsaving effect. In addition, the arc-shaped track rotating assembly 7 is symmetrically designed with the moving bottom plate 11 and the swinging bottom plate 12 as a center, the symmetrically designed structure has the function of fixing the whole detection platform on one hand, the change of the angle of the moving bottom plate 11 in the operation process after the swinging floor rotates to a required angle is prevented, on the other hand, the rotation amount of the arc-shaped sliding block 74 cannot be accurately known by directly moving the accuracy of the adjustment of the X-direction screw rod adjusting assembly 6, the rotation amount of the arc-shaped sliding block 74 is converted into the rotation amount of the nut, and the rotation amount is more easily confirmed, so that the accurate adjustment result is achieved.
Further, the Y-direction moving mechanism 3 includes a Y-direction moving slider 33, a Y-direction moving slide rail 32, and a Y-direction fixing plate 31, the Y-direction moving slide rail 32 is mounted on the upper portion of the Y-direction fixing plate 31, the Y-direction moving slider 33 is mounted on the Y-direction moving slide rail 32, the Y-direction moving slider 33 is connected to the bottom of the moving base plate 11, and the X-direction moving mechanism 2 is connected to the lower portion of the Y-direction fixing plate 31.
Further, the X-direction moving mechanism 2 includes an X-direction moving slider 21 and an X-direction moving slide 22, the X-direction moving slide 22 is disposed on the bottom frame 1, the X-direction moving slider 21 is disposed on the X-direction moving slide 22, and the X-direction moving slider 21 is connected to the Y-direction moving mechanism 3.
Further, the Y-direction moving mechanism 3 is connected with a Y-direction linear adjusting mechanism 8, the Y-direction linear adjusting mechanism 8 comprises a Y-direction linear adjusting seat, a Y-direction linear adjusting handle, a micrometer 81 and a Y-direction linear stop block 82, the Y-direction linear adjusting base comprises a first Y-direction linear adjusting base 83 and a second Y-direction linear adjusting base 84, the Y-direction linear adjustment handle comprises a first Y-direction linear adjustment handle 85 and a second Y-direction linear adjustment handle 86, the upper part of the Y-direction linear block 82 is connected with the movable bottom plate 11, the lower part of the Y-direction linear block 82 is connected with the Y-direction movable slide rail 32, a first Y-direction linear adjusting seat 83 and a second Y-direction linear adjusting seat 84 are arranged on the side surface of the Y-direction movable slide rail 32, a first Y-direction linear adjusting handle 85 and a micrometer 81 are arranged on the first Y-direction linear adjusting seat 83, a second Y-direction linear adjusting handle 86 is mounted on the second Y-direction linear adjusting seat 84. By adjusting the first Y-direction linear adjustment handle 85 and the second Y-direction linear adjustment handle 86, the Y-direction linear stopper 82 is abutted by the first Y-direction linear adjustment handle 85 and the second Y-direction linear adjustment handle 86, the Y-direction linear stopper 82 is fixedly connected with the movable base plate 11, the positions of the movable base plate 11 can be adjusted left and right by screwing the first Y-direction linear adjustment handle 85 and the second Y-direction linear adjustment handle 86, and the moving distance can be accurately read according to the micrometer 81, so that the accurate positions can be adjusted on the Y-direction straight line.
The working principle of the invention is as follows: the detection table is characterized in that a probe frame 13 (provided with a plurality of probes 14) produced by a processing plant is placed on a mounting mechanism 4, the probe frame 13 is fixed through a sliding shaft 41 and a fixing shaft 42, a sample rail 15 is placed in a bottom frame 1, then the probe frame 13 is adjusted above the sample rail 15 through adjusting an X-direction moving mechanism 2 and a Y-direction moving mechanism 3, then a first Y-direction linear adjusting handle 85 and a second Y-direction linear adjusting handle 86 are adjusted, a Y-direction linear block 82 is pressed against the first Y-direction linear adjusting handle 85 and the second Y-direction linear adjusting handle 86, the Y-direction linear block 82 is fixedly connected with a movable bottom plate 11, the position of the movable bottom plate 11 can be adjusted left and right through screwing the first Y-direction linear adjusting handle 85 and the second Y-direction linear adjusting handle 86, the moving distance can be accurately read according to a micrometer 81, and therefore on a Y-direction line, the center of the zero-degree probe is adjusted to be positioned right above the center of the steel rail. Finally, the Y-direction adjusting guide block 51 drives the sliding shaft 41 to rotate in a certain direction by the Y-direction rotation adjusting mechanism 5 and the X-direction rotation adjusting mechanism, specifically, by screwing the first Y-direction adjusting handle 53 and the second Y-direction adjusting handle 54, so that the probe holder 13 rotates around the Y-axis direction; by screwing the first X-direction adjusting nut 64 and the second X-direction adjusting nut 65 and matching the arc-shaped sliding block 74 and the arc-shaped sliding rail 75, parts fixed on the swinging bottom plate 12 can rotate for a certain angle around the X axis, and therefore the probe frame 13 can rotate for a certain angle around the X axis. Therefore, after the probe frame is adjusted to the zero degree and the center of the probe is positioned right above the center of the steel rail, namely after the initial position is confirmed, the probe frame is moved in the X direction to carry out flaw detection, the first Y direction adjusting handle 53 and the second Y direction adjusting handle 54 are continuously adjusted and screwed through the flaw detection result, the first X direction adjusting nut 64 and the second X direction adjusting nut 65 are screwed, and the arc-shaped sliding block 74 and the arc-shaped sliding rail 75 are matched to enable parts fixed on the swinging bottom plate 12 to rotate for a certain angle around the X axis and the Y axis until the flaw detection result meets the requirement. Therefore, the probe frame 13 can rotate around the X axis and the Y axis, and can accurately move for a certain distance in the Y axis direction, so that the probe frame 13 can ensure that the initial position is right above the steel rail and keep horizontal, and detection errors are avoided.
The above is only a specific embodiment of the present invention, but the technical features of the present invention are not limited thereto. Any simple changes, equivalent substitutions or modifications made on the basis of the present invention to solve the same technical problems and achieve the same technical effects are all covered in the protection scope of the present invention.
Claims (9)
1. The utility model provides a probe frame examines test table, includes bottom frame and removal bottom plate, its characterized in that: a moving mechanism is arranged between the bottom frame and the moving bottom plate, the moving mechanism comprises an X-direction moving mechanism and a Y-direction moving mechanism, the X-direction moving mechanism is mounted on the bottom frame, the Y-direction moving mechanism is mounted on the X-direction moving mechanism, and the moving bottom plate is mounted on the Y-direction moving mechanism;
the detection table further comprises a swinging bottom plate, the swinging bottom plate is positioned above the moving bottom plate, an installation mechanism for installing a probe frame is arranged in the middle of the swinging bottom plate, a Y-direction rotation adjusting mechanism is arranged on one side of the installation mechanism, X-direction rotation adjusting mechanisms are arranged on two sides of the swinging bottom plate, and the X-direction rotation adjusting mechanisms are connected to two sides of the moving bottom plate;
installation mechanism includes sliding shaft, fixed axle and sliding bearing seat, sliding bearing seat includes first sliding bearing seat and second sliding bearing seat, first sliding bearing seat fixed mounting in the front side of swing bottom plate, second sliding bearing seat fixed mounting in the rear side of swing bottom plate, install on the first sliding bearing seat the sliding shaft, the sliding shaft passes first sliding bearing seat connects Y is to rotatory adjustment mechanism, install on the second sliding bearing seat the fixed axle, the sliding shaft with fixed axle looks adaptation.
2. A probe holder inspection station as claimed in claim 1, wherein: y includes Y to adjusting guide block, Y to adjustment handle and staple bolt to rotatory adjustment mechanism, Y includes first Y to adjustment handle and second Y to adjustment handle, Y is equipped with relative first Y that sets up to adjusting guide block to adjustment handle and second Y to adjustment handle, Y has the sliding shaft to the sub-unit connection who adjusts the guide block, Y presss from both sides tightly through the staple bolt to adjusting between guide block and the sliding shaft.
3. A probe holder inspection station as claimed in claim 1, wherein: the X-direction rotation adjusting mechanism comprises an X-direction screw rod adjusting assembly, the X-direction screw rod adjusting assembly comprises an X-direction adjusting screw rod swinging block, an X-direction adjusting screw rod, an X-direction adjusting nut and an X-direction screw rod hinge fixing seat, the X-direction adjusting nut comprises a first X-direction adjusting nut and a second X-direction adjusting nut, the X-direction screw rod hinge fixing seat comprises a first X-direction screw rod hinge fixing seat and a second X-direction screw rod hinge fixing seat,
first X to screw rod hinge fixing base fixed mounting in on the swing bottom plate, second X to screw rod hinge fixing base fixed mounting in on the removal bottom plate, first X is to installing X between screw rod hinge fixing base and the second X to the screw rod hinge fixing base to adjusting screw, X is equipped with X to adjusting screw pendulum piece to adjusting screw's upper portion, X inlays in first X to screw rod hinge fixing base to adjusting screw pendulum piece, X is equipped with first X to adjusting nut to adjusting screw pendulum piece's upper portion, X is equipped with second X to adjusting nut to adjusting screw pendulum piece's lower part, first X all install in X is to adjusting nut and second X to adjusting nut on the adjusting screw.
4. A probe holder inspection station as claimed in claim 1 or claim 3, wherein: the X is still including setting up in the arc track rotating assembly who removes bottom plate and swing bottom plate both sides to rotation regulation mechanism, arc track rotating assembly includes circular arc guide rail riser, arc regulation seat, arc slider connecting seat, arc slider and arc slide rail, circular arc guide rail riser fixed mounting in the both sides of removing the bottom plate, install the arc slide rail on the circular arc guide rail riser, install the arc slider on the arc slide rail, the arc is adjusted the seat set up in the both sides of swing bottom plate, install the arc slider connecting seat on the arc regulation seat, install the arc slider on the arc slider connecting seat.
5. A probe holder inspection station as claimed in claim 1, wherein: the Y-direction moving mechanism comprises a Y-direction moving sliding block, a Y-direction moving sliding rail and a Y-direction fixing plate, the Y-direction moving sliding rail is mounted on the upper portion of the Y-direction fixing plate, the Y-direction moving sliding block is mounted on the Y-direction moving sliding rail and connected to the bottom of the moving bottom plate, and the X-direction moving mechanism is connected to the lower portion of the Y-direction fixing plate.
6. A probe holder inspection station as claimed in claim 1 or claim 5, in which: the X-direction moving mechanism comprises an X-direction moving sliding block and an X-direction moving sliding rail, the X-direction moving sliding rail is arranged on the bottom frame, the X-direction moving sliding block is arranged on the X-direction moving sliding rail, and the X-direction moving sliding block is connected with the Y-direction moving mechanism.
7. A probe holder inspection station as claimed in claim 5, wherein: y is connected with Y to rectilinear adjustment mechanism to moving mechanism, Y includes Y to rectilinear adjustment seat, Y to rectilinear adjustment handle, micrometer and Y to the sharp dog to rectilinear adjustment mechanism, Y includes first Y to rectilinear adjustment seat and second Y to rectilinear adjustment seat to the rectilinear adjustment seat, Y includes first Y to rectilinear adjustment handle and second Y to rectilinear adjustment handle, Y connects to the upper portion of rectilinear dog the removal bottom plate, Y is to the sub-unit connection Y of rectilinear dog to the removal slide rail, Y is to the side-mounting of removal slide rail has first Y to rectilinear adjustment seat and second Y to rectilinear adjustment seat, first Y is to installing first Y on the rectilinear adjustment seat to rectilinear adjustment handle and micrometer, second Y is to the rectilinear adjustment seat on installing the second Y and is to the rectilinear adjustment handle.
8. A probe holder inspection station as claimed in claim 1, wherein: and a plurality of probes are arranged on the probe frame.
9. A probe holder inspection station as claimed in claim 1, wherein: and a sample rail is arranged below the probe frame.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
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