CN113654765B - Phase deflection measurement method, system and terminal based on curved screen - Google Patents
Phase deflection measurement method, system and terminal based on curved screen Download PDFInfo
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Abstract
The application is applicable to the technical field of optical measurement and provides a phase deflection measuring method, a phase deflection measuring system and a phase deflection terminal based on a curved screen, wherein the method comprises the following steps: and sequentially displaying the set number of phase shift fringe patterns on the curved surface display screen, controlling the image collector to collect images of the object to be detected, respectively obtaining a first virtual image corresponding to each phase shift fringe pattern, and carrying out three-dimensional surface reconstruction on the object to be detected by adopting a phase deviation operation based on the relative pose relation between the curved surface display screen and the image collector and the first virtual image. The scheme can achieve the acquisition of the complete phase information of the object surface with larger curvature, and improves the reconstruction effect of the three-dimensional shape of the high-reflection object.
Description
Technical Field
The application belongs to the technical field of optical measurement, and particularly relates to a phase deflection measurement method, system and terminal based on a curved screen.
Background
Non-contact, high-precision measurement of specular reflective surfaces has become an important scientific issue in the field of three-dimensional optical measurements. The diffuse reflection structured light measuring method is not applicable any more because the characteristic information of the measured surface cannot be obtained. The phase deflection operation is widely applied to the topography measurement of the surface of a high-reflection object by the advantages of simple principle, low cost, large dynamic measurement range, quick full-field measurement and the like.
In the existing phase deflection operation application, the measurement effect on a relatively flat high-reflection object is optimal, when the high-reflection object to be tested has a large curvature, the high-curvature surface of the object to be tested is affected in the image acquisition process of the object to be tested by a camera, so that the image information acquired by the camera is too little or missing, the complete phase information of the surface of the object cannot be acquired, and the reconstruction of the three-dimensional shape of the object to be tested is affected.
Disclosure of Invention
The embodiment of the application provides a phase deflection measuring method, a phase deflection measuring system and a phase deflection measuring terminal based on a curved screen, which are used for solving the problem that the existing phase deflection measuring system cannot acquire complete phase information of the surface of an object with larger curvature and affects the three-dimensional shape reconstruction of a high-reflection object to be measured.
A first aspect of an embodiment of the present application provides a phase deviation measuring method based on a curved screen, which is applied to a phase deviation measuring system, where the phase deviation measuring system includes: the curved surface display screen and the image collector, the display surface of the curved surface display screen faces to the position where the object to be measured is located, and the phase deviation measuring method comprises the following steps:
sequentially displaying a set number of phase shift fringe patterns on the curved display screen, wherein the phase shift fringe patterns form a first virtual image on the surface of the object to be detected;
Controlling the image collector to collect images of the object to be detected, and respectively obtaining first virtual images corresponding to each phase-shift fringe pattern;
and based on the relative pose relation between the curved display screen and the image collector and the first virtual image, carrying out three-dimensional surface reconstruction on the object to be detected by adopting a phase deflection technology.
A second aspect of embodiments of the present application provides a phase deviation measurement system based on a curved screen, including: the display surface of the curved surface display screen faces to the position of the object to be detected; the phase deviation measurement system further includes:
the display module is used for sequentially displaying a set number of phase shift fringe patterns on the curved display screen, and the phase shift fringe patterns form a first virtual image on the surface of the object to be detected;
the image acquisition module is used for controlling the image acquisition device to acquire images of the object to be detected and respectively obtaining first virtual images corresponding to each phase shift fringe pattern;
and the three-dimensional surface type reconstruction module is used for carrying out three-dimensional surface type reconstruction on the object to be detected by adopting a phase deflection technology based on the relative pose relation between the curved surface display screen and the image collector and the first virtual image.
A third aspect of the embodiments of the present application provides a terminal comprising a memory, a processor and a computer program stored in the memory and executable on the processor, the processor implementing the steps of the method according to the first aspect when executing the computer program.
A fourth aspect of the embodiments of the present application provides a computer-readable storage medium storing a computer program which, when executed by a processor, implements the steps of the method according to the first aspect.
A fifth aspect of the present application provides a computer program product for causing a terminal to carry out the steps of the method of the first aspect described above when the computer program product is run on the terminal.
From the above, in the embodiment of the application, the planar display screen is replaced by the curved display screen based on the traditional phase deflection measurement system, and the irradiation range of the display screen under the same radial dimension is enlarged through the arrangement of the curved display screen, so that the measurement area and the measurement angle of the measured object are expanded, the phase deflection measurement system is ensured to be capable of acquiring the complete phase information of the surface of the object with larger curvature, and the reconstruction effect of the three-dimensional shape of the high-reflection object is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following description will briefly introduce the drawings that are needed in the embodiments or the description of the prior art, it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a phase deviation measurement system according to an embodiment of the present disclosure;
FIG. 2 is a schematic view of radiation range advantage of a curved display screen according to an embodiment of the present application;
FIG. 3 is a flowchart of a method for measuring phase deviation based on a curved screen according to an embodiment of the present application;
fig. 4 is a second flowchart of a phase deviation measuring method based on a curved screen according to an embodiment of the present application;
fig. 5 is a schematic diagram of a cylindrical coordinate system of a curved display screen according to an embodiment of the present application;
FIG. 6 is a second schematic diagram of a phase deviation measurement system according to an embodiment of the present disclosure;
FIG. 7 is a block diagram of a calibration device for position relationships in a phase deviation measurement system provided in an embodiment of the present application;
fig. 8 is a block diagram of a terminal according to an embodiment of the present application.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system configurations, techniques, etc. in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
It should be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It is also to be understood that the terminology used in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It should be further understood that the term "and/or" as used in this specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
As used in this specification and the appended claims, the term "if" may be interpreted as "when..once" or "in response to a determination" or "in response to detection" depending on the context. Similarly, the phrase "if a determination" or "if a [ described condition or event ] is detected" may be interpreted in the context of meaning "upon determination" or "in response to determination" or "upon detection of a [ described condition or event ]" or "in response to detection of a [ described condition or event ]".
In particular implementations, the terminals described in embodiments of the present application include, but are not limited to, other portable devices such as mobile phones, laptop computers, or tablet computers having a touch-sensitive surface (e.g., a touch screen display and/or a touch pad). It should also be appreciated that in some embodiments, the device is not a portable communication device, but a desktop computer having a touch-sensitive surface (e.g., a touch screen display and/or a touch pad).
In the following discussion, a terminal including a display and a touch sensitive surface is described. However, it should be understood that the terminal may include one or more other physical user interface devices such as a physical keyboard, mouse, and/or joystick.
The terminal supports various applications, such as one or more of the following: drawing applications, presentation applications, word processing applications, website creation applications, disk burning applications, spreadsheet applications, gaming applications, telephony applications, video conferencing applications, email applications, instant messaging applications, workout support applications, photo management applications, digital camera applications, digital video camera applications, web browsing applications, digital music player applications, and/or digital video player applications.
Various applications that may be executed on the terminal may use at least one common physical user interface device such as a touch sensitive surface. One or more functions of the touch-sensitive surface and corresponding information displayed on the terminal may be adjusted and/or changed between applications and/or within the corresponding applications. In this way, the common physical architecture (e.g., touch-sensitive surface) of the terminal may support various applications with user interfaces that are intuitive and transparent to the user.
It should be understood that the sequence number of each step in this embodiment does not mean the sequence of execution, and the execution sequence of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the present application.
The embodiment of the application provides a phase deflection measuring method based on a curved surface screen, which is applied to a phase deflection measuring system with the curved surface display screen, wherein the curved surface display screen in the phase deflection measuring system faces to the position of an object to be measured, and an image acquisition is carried out on the object in a visual field range through an image acquisition device, so that in the execution process of the phase deflection measuring method, a phase shift fringe pattern is displayed by the curved surface display screen, a virtual image is formed on the surface of the object to be measured in a larger irradiation range and irradiation angle, and when the image acquisition is carried out on the virtual image formed on the surface of the object to be measured through the image acquisition device, the acquisition of the complete phase information on the surface of the object with larger curvature is realized, and the reconstruction effect of the three-dimensional shape of a high-reflection object is improved.
In order to illustrate the technical solutions described in the present application, the following description is made by specific examples.
The phase deflection measuring method based on the curved surface screen, provided by the embodiment of the application, is applied to a phase deflection measuring system shown in fig. 1.
Specifically, as shown in connection with fig. 1, the phase deviation measuring system includes: the curved surface display screen and the image collector, the display surface of curved surface display screen is towards the position that awaits measuring the object.
The phase deflection measuring system replaces a flat display screen with a curved display screen on the basis of the traditional phase deflection measuring system, and the irradiation range of the display screen under the same radial dimension is enlarged by arranging the curved display screen in combination with the display screen shown in fig. 2, so that the measuring area and the measuring angle of a measured object are enlarged.
The curved display screen can be a spherical screen or even a free-form curved screen, and is customized according to specific measurement objects so as to adapt to measurement requirements. The number of the image collectors is not limited to a specific number, and one or two image collectors can be provided, or a plurality of image collectors can be provided to realize measurement of more complex reflection surfaces.
The image collector is used for collecting images of objects in the field of view, and can be a camera or a video camera, in particular a CCD (charge coupled device ) camera.
The position of the object to be measured is a preset position, and specifically may be a fixed position or an adjustable position for matching with a camera to realize acquisition of multi-phase images.
The measured object placed in the position of the measured object is different objects in different application stages. Specifically, in the calibration stage of the phase deviation measurement system, a plane mirror is placed at the position of the object to be measured.
The plane mirror is placed at the position of the object to be measured and is used for simulating light reflection propagation of the high-reflection object under an ideal state, when a calibration image is displayed in the curved surface display screen, a virtual image of the image appears in the plane mirror, the image collector can collect the curved surface screen virtual image of specular reflection through specular reflection, then the virtual image is photographed and stored so as to realize calibration of the pose relation between the curved surface display screen and the image collector in the phase deflection measuring system in subsequent processing, and the phase deflection measuring system after the pose relation is calibrated can carry out three-dimensional shape measurement on the flat or uneven object to be measured.
In the using stage of the phase deflection measuring system, an object to be measured is placed at the measuring position, and the calibrated phase deflection measuring system is utilized to implement the measuring and three-dimensional surface reconstruction processing process of the object to be measured.
The phase deflection measuring method based on the curved screen will be described in connection with different application stages of the phase deflection measuring system.
Referring to fig. 3, fig. 3 is a flowchart one of a phase deviation measuring method based on a curved screen according to an embodiment of the present application. As shown in fig. 3, the phase deflection measuring method based on the curved screen comprises the following steps:
This process corresponds to the measurement phase of the phase deviation measurement system. Each phase-shift fringe pattern forms a first virtual image on the surface of the object to be measured.
The set number of the phase shift fringe patterns can be set according to the actual phase deviation measurement requirement, for example, three, five, six, etc., so that the image phase decoding can be realized based on the phase shift fringe patterns displayed in sequence.
The phase-shift pattern may be a sinusoidal pattern, in particular a standard sinusoidal annular pattern, in particular applications. The phase-shift fringe pattern forms a virtual image on the surface of the object to be measured, and the phase-shift fringe pattern is influenced by the three-dimensional surface of the object to be measured to generate fringe deformation when projected onto the surface of the object to be measured, so that the image collector can better capture the structural information of the object to be measured.
In one embodiment, when the phase-shift fringe pattern is displayed on the curved display screen, the phase-shift fringe pattern is performed in a manner of sequentially displaying a plurality of phase-shift fringe patterns, and the texture structures of the plurality of phase-shift fringe patterns may be inconsistent.
In the specific implementation, the method can be to generate a set number of pictures of the multi-frequency phase-shift sinusoidal stripes in the horizontal and vertical directions by using computer coding, and display the pictures on the curved screen in sequence.
The object to be detected is a highly reflective object, in particular a highly reflective object with an outer surface with larger curvature, such as a curved screen of a mobile phone or automobile glass with special forms.
When the phase shift fringe pattern is displayed, the displayed image can form a virtual image picture on the surface of the object to be measured in a larger irradiation range and irradiation angle, the measurement area and measurement angle of the object to be measured are expanded, and the surface type measurement requirement of the object with large curvature is met.
When the image collector collects the image of the object to be detected to obtain a virtual image, the image collector collects the virtual image once when the curved display screen displays one phase shift fringe pattern.
Thus, the first virtual image is acquired in accordance with the number of phase-shifted fringe patterns displayed.
Correspondingly, the virtual image collected by the image collector at this time comprises a virtual image which is modulated by the object to be measured and deformed. Therefore, the virtual image acquired by the image acquisition device is a modulation image.
The principle of phase deflection is to determine the gradient information of the mirror surface of the measured object according to the phase information, and determine the three-dimensional surface shape of the measured object by gradient integration or interpolation.
After a group of first virtual images are acquired by an image acquisition device, the specific application process of the phase deviation operation comprises the following steps:
the method comprises the steps that corresponding point matching is conducted by utilizing a first virtual image and a phase shift fringe pattern displayed on a curved surface display screen, specifically, multi-frequency heterodyne principle is utilized to decode and find out pixel points of a virtual image and corresponding pixel points on the curved surface display screen, and corresponding point matching is achieved; and then reconstructing a gradient computer, namely after the correspondence between the imaging image pixel points of the camera and the display image pixel points of the curved surface screen is completed, unifying the coordinates of the virtual image pixel points and the display image pixel points of the screen under the same coordinate system by utilizing the relative pose relation between the curved surface display screen calibrated by the phase deflection measuring system and the image collector, acquiring the surface gradient distribution data of the measured object by a stripe reflection method, and then determining the three-dimensional surface shape of the measured object by gradient integration or interpolation and other methods according to the relation between the virtual image and the display image of the screen.
In the process of reconstructing the three-dimensional surface shape of the object to be detected, the image collector can collect virtual image images of the object to be detected from more angles and a larger range, so that complete phase information of the surface of the object to be detected can be obtained as much as possible, and the reconstruction effect of the three-dimensional shape of the high-reflection object is improved.
Therefore, in the embodiment of the application, the planar display screen is replaced by the curved display screen on the basis of the traditional phase deflection measurement system, the irradiation range of the display screen under the same radial dimension is enlarged through the arrangement of the curved display screen, the measurement area and the measurement angle of the measured object are expanded, the phase deflection measurement system is ensured to be capable of acquiring complete phase information of the surface of the object with larger curvature, and the reconstruction effect of the three-dimensional shape of the high-reflection object is improved.
Different implementations of the phase deflection measurement method based on the curved screen are also provided in the embodiments of the present application.
Referring to fig. 4, fig. 4 is a second flowchart of a phase deviation measuring method based on a curved screen according to an embodiment of the present application. Referring to fig. 4, the phase deflection measuring method based on the curved screen includes:
The process corresponds to a calibration stage of the phase deflection measurement system, in which a determination of the relative pose relationship between the curved display screen and the image collector is achieved. The calibration image forms a second virtual image on the surface of the plane mirror, and the plane mirror is arranged at the position of the object to be measured.
In particular, the calibration image is, for example, a classical checkerboard image, or other calibration image with marker points.
The calibration image can specifically be a pattern with mark points, which is suitable for the size of the screen resolution, generated by programming, and is displayed on the curved display screen in a full-screen display mode.
The pixel coordinates in the calibration image are converted into three-dimensional space coordinates, the three-dimensional space coordinates are a cylindrical coordinate system constructed based on the curved surface display screen, and when the calibration image is projected into the plane mirror, coordinate information transmission can be conducted based on the calibration image coordinate points in the cylindrical coordinate system by correspondingly matching the mark point pixel points in the calibration image under the cylindrical coordinate system of the curved surface display screen, so that curved surface information of the curved surface display screen can be transmitted through the space coordinates under the cylindrical coordinate system of the mark points in the calibration image, and finally, the pose relation between the camera and the curved surface display screen can be accurately obtained.
When the calibration image is projected onto the plane mirror from the curved display screen, the irradiation range is larger, and the calibration image with the mark point also has a larger coverage area in a virtual image in the plane mirror.
The second virtual image also corresponds to the mark point, and the mark point can be obtained by converting a first position coordinate of the mark point in the calibration image under a cylindrical coordinate system through a mirror imaging principle.
Specifically, as an optional implementation manner, the converting, based on the pixel coordinates of the marker point in the calibration image, to obtain a first position coordinate of the marker point in the calibration image under the cylindrical coordinate system of the curved surface display screen, and mapping, based on the first position coordinate, to obtain a second position coordinate of the marker point in the second virtual image includes:
pixel coordinates in the calibration image based on the mark pointsS px ,S py ) Obtaining a first position coordinate (x) of the mark point in the calibration image under the cylindrical coordinate system of the curved surface display screen through a coordinate conversion relation s ,y s ,z s ）：
Wherein, as shown in connection with fig. 5, r is the curvature radius of the curved surface display screen, w is the transverse pixel point value of the curved surface display screen, pp is the pixel point distance in the curved surface display screen, phi is the included angle between the projection line of the connecting line between the mark point and the origin of the column coordinate system on the plane XOZ and the X axis;
After obtaining the first position coordinates of the mark points in the calibration image under the cylindrical coordinate system of the curved surface display screen, mapping to obtain the second position coordinates of the mark points in the second virtual image based on the first position coordinates according to the mirror imaging principle, wherein the second position coordinates are (x) s ,y s ,-z s ）。
The second position coordinate is the same as the first position coordinate in terms of x-axis and y-axis, and the z-axis coordinate values are opposite.
And step 403, controlling the image collector to collect images of the plane mirrors covered with the calibration plates to obtain images of the calibration plates, and collecting images of the plane mirrors not covered with the calibration plates to obtain second virtual images corresponding to the second virtual images.
The calibration plate may specifically be a marking plate with a black and white checkerboard. When the plane mirror is covered with the calibration plate, the image collector collects the image of the plane mirror, the calibration plate image is obtained, the position information of the plane mirror is obtained based on the calibration plate image, so that the pose relation between the image collector and the plane mirror is established, and when the plane mirror is covered with the calibration plate, the image collector collects the image of the plane mirror, the image of the virtual image corresponding to the calibration image in the plane mirror and the curved surface display screen is obtained, and the spatial position information of the virtual curved surface display screen (namely the virtual image of the curved surface display screen reflected in the plane mirror) is obtained based on the collected virtual image.
The image collector can collect the virtual image of the curved surface screen reflected by the mirror surface of the plane mirror, and can select to change the posture of the plane mirror for many times in the process of collecting the virtual image and the calibration plate image so as to store the collected images of the next groups and record more phase information.
The imaging principle of the image collector is usually a pinhole imaging principle, and the pose relationship between the image collector and the virtual image in the plane mirror can be obtained by analyzing the propagation principle of light rays in the pinhole imaging process based on the second position coordinates of the virtual image (namely the virtual image of the curved display screen) of the mark point in the calibration image in the plane mirror and the virtual image obtained by the image collector for image collection of the virtual image in the plane mirror. The position and posture relation between the image collector and the virtual image in the plane mirror can be obtained by analyzing the propagation principle of light rays in the small-hole imaging process based on the calibration plate image obtained by the image collector for image collection of the plane mirror.
As an optional implementation manner, based on the second position coordinates and the imaging principle of the image collector, in combination with the second virtual image, the calculating to obtain the first pose relationship between the image collector and the second virtual image includes:
establishing a nonlinear optimization objective function according to an imaging model of the image collector, and solving to obtain an internal reference matrix of the image collector
Distortion->
And a first translation matrix between the image collector and the second virtual image>
And a first rotation matrix->
：
Wherein P is the second virtual image,
q' is a second position coordinate for an imaging function of the image collector;
and obtaining a first pose relationship based on the first rotation matrix and the first translation matrix.
As shown in fig. 1, for the image collector, it is assumed that a mark point on the curved display screen is denoted as Q, a corresponding virtual image point in the plane mirror is denoted as Q', and an image of the virtual image point in the image collector is denoted as P. Q and Q' are both [ ] for the same pixel coordinateS px ,S py ) The values in the z-axis direction in the three-dimensional space coordinates of Q and Q' are opposite in sign.
The process of establishing and solving the nonlinear optimization objective function according to the imaging model of the image collector can be realized by adopting a Zhang Zhengyou calibration algorithm. After solving, the internal parameters of the image collector and the external parameters of the pose relation of the virtual image in the plane mirror can be obtained simultaneously. In this embodiment, the translation matrix and the rotation matrix are used to indicate the pose relationship between two objects.
Further, when the second pose relationship between the image collector and the plane mirror is obtained by calculation, the second pose relationship between the image collector and the plane mirror may be obtained by adopting a PnP (peer-n-point) algorithm based on the calibration plate image.
After the pose relation of the virtual image in the image collector and the plane mirror and the pose relation between the image collector and the plane mirror are obtained, the pose relation between the image collector and the curved display screen is obtained through conversion based on the attribute of the mirror surface due to the attribute of reflection imaging of the mirror surface.
The first pose relation comprises a first rotation matrix and a first translation matrix, and the second pose relation comprises a second rotation matrix and a second translation matrix. That is, a translation matrix and a rotation matrix are employed to indicate the pose relationship between two objects.
As an optional implementation manner, the calculating based on the first pose relation and the second pose relation and combined with the mirror reflection principle to obtain the relative pose relation between the image collector and the curved display screen comprises the following steps:
Based on the first pose relation and the second pose relation, and combining with a specular reflection principle, a third rotation matrix and a third translation matrix between the image collector and the curved surface display screen are obtained through calculation according to the following relational expression:
wherein ,
is a unitary matrix->
，/>
Is the normal vector of the plane mirror, +.>
Is the distance between the plane mirror and the image collector, < >>
For the first rotation matrix +.>
For the first translation matrix +.>
In the case of a third rotation matrix,
a third translation matrix;
wherein ,
；/>
for the second rotation matrix +.>
Is a second translation matrix;
and obtaining the pose relationship between the image collector and the curved surface display screen based on the third rotation matrix and the third translation matrix.
The method comprises the steps of calculating a normal vector of a plane mirror and a distance between the plane mirror and an image collector based on a second rotation matrix and a second translation matrix through a mirror reflection principle, calculating a third rotation matrix and a third translation matrix between the image collector and a curved surface display screen through a corresponding relation formula based on Householder transformation, and taking the third rotation matrix and the third translation matrix as pose relations between the image collector and the curved surface display screen.
Further, as an alternative embodiment, when there are at least two image collectors in the phase deviation measuring system, as shown in fig. 6, the image collectors include a first image collector (camera 1) and a second image collector (camera 2), where the first image collector and the second image collector have a common field of view, and the position of the object to be measured is located in the common field of view.
It should be noted that, when the image capturing device includes the first image capturing device and the second image capturing device, the executing actions defined in steps 403, 404 and 405 are required to be executed for each image capturing device, so that the relative pose relationship between each image capturing device and the curved display screen is obtained through final calculation.
Correspondingly, when the image collector comprises a first image collector and a second image collector, after the relative pose relationship between the image collector and the curved surface display screen is calculated based on the first pose relationship and the second pose relationship and combined with the specular reflection principle, the method further comprises the following steps:
based on the relative pose relation between the first image collector and the curved surface display screen and the relative pose relation between the second image collector and the curved surface display screen, the relative pose relation between the first image collector and the second image collector is obtained through conversion.
The method comprises the step of converting the pose relationship between two image collectors and the same object based on the pose relationship between the two image collectors. The pose relation between the first image collector and the curved surface display screen, the pose relation between the second image collector and the curved surface display screen and the pose relation between the first image collector and the second image collector can be obtained respectively, the calibration of all the pose relations in the phase deflection measuring system is achieved, and the phase deflection measuring system is further assisted to effectively reconstruct the three-dimension of the measured object in the subsequent stage.
According to the scheme, the curved surface display screen is utilized to replace a common plane display screen, the positions of pixel points on the curved surface screen are described through a definition cylindrical surface coordinate system, the relation between the curved surface display screen and two image collectors is calibrated, the limitation on the curvature and the measurement range of a measurement object is reduced, and when the three-dimensional view fusion is further combined to ensure that a phase deflection measurement system measures a high-reflection object with a larger curvature, a more complete appearance reconstruction result can be obtained.
And 406, sequentially displaying the set number of phase shift fringe patterns on the curved surface display screen.
The phase-shift fringe pattern forms a first virtual image on the surface of the object to be measured.
The specific implementation process of this step is the same as that of step 301 in the foregoing embodiment, and will not be described here again.
The specific implementation process of this step is the same as that of step 302 in the foregoing embodiment, and will not be described here again.
The specific implementation process of this step is the same as that of step 303 in the foregoing embodiment, and will not be described here again.
In the embodiment of the application, the planar display screen is replaced by the curved display screen on the basis of the traditional phase deflection measurement system, the irradiation range of the display screen under the same radial dimension is enlarged through the arrangement of the curved display screen, the measurement area and the measurement angle of a measured object are expanded, meanwhile, the mark point pixel coordinates in the image marked by the screen are converted to the cylindrical coordinate system of the curved display screen, the mark point coordinates of the virtual image corresponding to the mark point pixel coordinates in the plane mirror are obtained, the image acquisition operation of the camera on the plane mirror is combined, the determination of the pose relation between the camera and the curved display screen in the phase deflection measurement system is realized, the phase deflection measurement system is ensured to be capable of obtaining the complete phase information of the surface of the object with larger curvature, and the reconstruction effect of the three-dimensional shape of the high-reflection object is improved.
Referring to fig. 7, fig. 7 is a block diagram of a phase deflection measurement system based on a curved screen according to an embodiment of the present application, and for convenience of explanation, only a portion related to the embodiment of the present application is shown.
The phase deviation measuring system includes: the display surface of the curved surface display screen faces to the position of the object to be detected; the phase deviation measurement system 700 further includes:
the display module 701 is configured to sequentially display a set number of phase shift fringe patterns on the curved display screen, where the phase shift fringe patterns form a first virtual image on the surface of the object to be measured;
the image acquisition module 702 is configured to control the image acquirer to acquire images of the object to be detected, and obtain a first virtual image corresponding to each phase-shift fringe pattern;
the three-dimensional surface reconstruction module 703 is configured to perform three-dimensional surface reconstruction on the object to be measured by using a phase deviation method based on the relative pose relationship between the curved display screen and the image collector and the first virtual image.
The system further comprises:
the calibration module is used for:
displaying a calibration image with a mark point on the curved display screen, wherein the calibration image forms a second virtual image on the surface of a plane mirror, and the plane mirror is arranged at the position of the object to be detected;
Converting to obtain a first position coordinate of the mark point in the calibration image under a cylindrical coordinate system of the curved surface display screen based on a pixel coordinate of the mark point in the calibration image, and mapping to obtain a second position coordinate of the mark point in the second virtual image based on the first position coordinate;
controlling the image collector to collect images of the plane mirrors covered with the calibration plates to obtain calibration plate images, and collecting images of the plane mirrors not covered with the calibration plates to obtain second virtual images corresponding to the second virtual images;
based on the second position coordinates and the imaging principle of the image collector, combining the second virtual image, calculating to obtain a first pose relationship between the image collector and the second virtual image, and based on the calibration plate image and the imaging principle of the image collector, obtaining a second pose relationship between the image collector and the plane mirror;
based on the first pose relation and the second pose relation, and combining a specular reflection principle, calculating to obtain the relative pose relation between the image collector and the curved display screen.
The calibration module is specifically used for:
pixel coordinates of the mark points in the calibration imageS px ,S py ) Obtaining a first position coordinate (x) of the mark point in the calibration image under a cylindrical coordinate system of the curved surface display screen through a coordinate conversion relation s ,y s ,z s ）：
Wherein r is the curvature radius of the curved surface display screen, w is the transverse pixel point value of the curved surface display screen, pp is the pixel point distance in the curved surface display screen, phi is the included angle between the projection line of the connecting line between the mark point and the origin of the cylindrical coordinate system on the plane XOZ and the X axis;
based on the first position coordinates, mapping to obtain second position coordinates (x) of the marker point in the second virtual image s ,y s ,-z s ）。
The calibration module is specifically used for:
establishing a nonlinear optimization objective function according to an imaging model of the image collector, and solving to obtain an internal reference matrix of the image collector
Distortion->
And a first translation matrix between the image collector and the second virtual image
And a first rotation matrix->
：
Wherein P is the second virtual image,
q' is the second position coordinate for the imaging function of the image collector;
and obtaining the first pose relationship based on the first rotation matrix and the first translation matrix.
The first pose relation comprises a first rotation matrix and a first translation matrix, and the second pose relation comprises a second rotation matrix and a second translation matrix; correspondingly, the calibration module is specifically used for:
based on the first pose relation and the second pose relation, and combining a specular reflection principle, a third rotation matrix and a third translation matrix between the image collector and the curved display screen are obtained through calculation according to the following relational expression:
wherein ,
is a unitary matrix->
，/>
For the normal vector of the plane mirror, +.>
For the distance between the mirror and the image acquisition device, < >>
For the first rotation matrix, +.>
For the first matrix of translations,
for the third rotation matrix, +.>
For the third translation matrix;
wherein ,
；/>
for the second rotation matrix, +.>
For the second translation matrix;
and obtaining the pose relation between the image collector and the curved display screen based on the third rotation matrix and the third translation matrix.
Further, the image collector comprises a first image collector and a second image collector, the first image collector and the second image collector have a common field of view range, and the position of the object to be detected is located in the common field of view range.
Wherein, this calibration module is still used for:
based on the relative pose relation between the first image collector and the curved surface display screen and the relative pose relation between the second image collector and the curved surface display screen, the relative pose relation between the first image collector and the second image collector is obtained through conversion.
The phase deflection measuring system based on the curved surface screen can realize the processes of the embodiment of the phase deflection measuring method based on the curved surface screen, and can achieve the same technical effects, and for avoiding repetition, the repeated description is omitted.
Fig. 8 is a block diagram of a terminal according to an embodiment of the present application. As shown in the figure, the terminal 8 of this embodiment includes: at least one processor 80 (only one shown in fig. 8), a memory 81 and a computer program 82 stored in the memory 81 and executable on the at least one processor 80, the processor 80 implementing the steps in any of the various method embodiments described above when executing the computer program 82.
The terminal 8 may be a computing device such as a desktop computer, a notebook computer, a palm computer, a cloud server, etc. The terminal 8 may include, but is not limited to, a processor 80, a memory 81. It will be appreciated by those skilled in the art that fig. 8 is merely an example of the terminal 8 and is not intended to limit the terminal 8, and may include more or fewer components than shown, or may combine certain components, or different components, e.g., the terminal may further include input-output devices, network access devices, buses, etc.
The processor 80 may be a central processing unit (Central Processing Unit, CPU), but may also be other general purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), field programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The memory 81 may be an internal storage unit of the terminal 8, such as a hard disk or a memory of the terminal 8. The memory 81 may also be an external storage device of the terminal 8, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card) or the like, which are provided on the terminal 8. Further, the memory 81 may also include both an internal storage unit and an external storage device of the terminal 8. The memory 81 is used for storing the computer program and other programs and data required by the terminal. The memory 81 may also be used to temporarily store data that has been output or is to be output.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions. The functional units and modules in the embodiment may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of a software functional unit. In addition, specific names of the functional units and modules are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working process of the units and modules in the above system may refer to the corresponding process in the foregoing method embodiment, which is not described herein again.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus/terminal and method may be implemented in other manners. For example, the apparatus/terminal embodiments described above are merely illustrative, e.g., the division of the modules or units is merely a logical function division, and there may be additional divisions when actually implemented, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection via interfaces, devices or units, which may be in electrical, mechanical or other forms.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
The integrated modules/units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the present application may implement all or part of the flow of the method of the above embodiment, or may be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, and when the computer program is executed by a processor, the computer program may implement the steps of each method embodiment described above. Wherein the computer program comprises computer program code which may be in source code form, object code form, executable file or some intermediate form etc. The computer readable medium may include: any entity or device capable of carrying the computer program code, a recording medium, a U disk, a removable hard disk, a magnetic disk, an optical disk, a computer Memory, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), an electrical carrier signal, a telecommunications signal, a software distribution medium, and so forth. It should be noted that the computer readable medium contains content that can be appropriately scaled according to the requirements of jurisdictions in which such content is subject to legislation and patent practice, such as in certain jurisdictions in which such content is subject to legislation and patent practice, the computer readable medium does not include electrical carrier signals and telecommunication signals.
The present application may implement all or part of the procedures in the methods of the above embodiments, and may also be implemented by a computer program product, which when run on a terminal causes the terminal to implement steps in the embodiments of the methods described above.
The above embodiments are only for illustrating the technical solution of the present application, and are not limiting; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.
Claims (9)
1. The phase deflection measuring method based on the curved screen is applied to a phase deflection measuring system, and is characterized in that the phase deflection measuring system comprises: the curved surface display screen and the image collector, the display surface of the curved surface display screen faces to the position where the object to be measured is located, and the phase deviation measuring method comprises the following steps:
Sequentially displaying a set number of phase shift fringe patterns on the curved display screen, wherein the phase shift fringe patterns form a first virtual image on the surface of the object to be detected;
controlling the image collector to collect images of the object to be detected, and respectively obtaining first virtual images corresponding to each phase-shift fringe pattern;
based on the relative pose relationship between the curved display screen and the image collector and the first virtual image, carrying out three-dimensional surface reconstruction on the object to be detected by adopting a phase deflection technique;
the determining mode of the relative pose relation comprises the following steps:
displaying a calibration image with a mark point on the curved display screen, wherein the calibration image forms a second virtual image on the surface of a plane mirror, and the plane mirror is arranged at the position of the object to be detected;
converting to obtain a first position coordinate of the mark point in the calibration image under a cylindrical coordinate system of the curved surface display screen based on a pixel coordinate of the mark point in the calibration image, and mapping to obtain a second position coordinate of the mark point in the second virtual image based on the first position coordinate;
controlling the image collector to collect images of the plane mirrors covered with the calibration plates to obtain calibration plate images, and collecting images of the plane mirrors not covered with the calibration plates to obtain second virtual images corresponding to the second virtual images;
Based on the second position coordinates and the imaging principle of the image collector, combining the second virtual image, calculating to obtain a first pose relationship between the image collector and the second virtual image, and based on the calibration plate image and the imaging principle of the image collector, obtaining a second pose relationship between the image collector and the plane mirror;
based on the first pose relation and the second pose relation, and combining a specular reflection principle, calculating to obtain the relative pose relation between the image collector and the curved display screen.
2. The method of claim 1, wherein the converting, based on the pixel coordinates of the marker point in the calibration image, to obtain a first position coordinate of the marker point in the calibration image in a cylindrical coordinate system of the curved display screen, and mapping, based on the first position coordinate, to obtain a second position coordinate of the marker point in the second virtual image, includes:
pixel coordinates of the mark points in the calibration imageS px ,S py ) Obtaining a first position coordinate (x) of the mark point in the calibration image under a cylindrical coordinate system of the curved surface display screen through a coordinate conversion relation s , y s , z s ）：
Wherein r is the curvature radius of the curved surface display screen, w is the transverse pixel point value of the curved surface display screen, pp is the pixel point distance in the curved surface display screen, phi is the included angle between the projection line of the connecting line between the mark point and the origin of the cylindrical coordinate system on the plane XOZ and the X axis;
based on the first position coordinates, mapping to obtain second position coordinates (x) of the marker point in the second virtual image s ,y s , -z s ）。
3. The method of claim 1, wherein the calculating, based on the second position coordinates and the imaging principle of the image collector, in combination with the second virtual image, a first pose relationship between the image collector and the second virtual image includes:
establishing a nonlinear optimization objective function according to an imaging model of the image collector, and solving to obtain an internal reference matrix of the image collector
Distortion->
And a first translation matrix between said image collector and said second virtual image +.>
And a first rotation matrix->
：
Wherein P is the second virtual image,
q' is the second position coordinate for the imaging function of the image collector;
and obtaining the first pose relationship based on the first rotation matrix and the first translation matrix.
4. The method of claim 1, wherein the first pose relationship includes a first rotation matrix and a first translation matrix, and the second pose relationship includes a second rotation matrix and a second translation matrix; the calculating, based on the first pose relationship and the second pose relationship and combined with a specular reflection principle, the relative pose relationship between the image collector and the curved display screen includes:
based on the first pose relation and the second pose relation, and combining a specular reflection principle, a third rotation matrix and a third translation matrix between the image collector and the curved display screen are obtained through calculation according to the following relational expression:
wherein ,
is a unitary matrix->
，/>
For the normal vector of the plane mirror, +.>
For the distance between the mirror and the image acquisition device, < >>
For the first rotation matrix, +.>
For the firstThe matrix is translated in a direction of translation,
for the third rotation matrix, +.>
For the third translation matrix;
wherein ,
；/>
for the second rotation matrix, +.>
For the second translation matrix;
and obtaining the pose relation between the image collector and the curved surface display screen based on the third rotation matrix and the third translation matrix.
5. The phase deviation measuring method according to claim 1, wherein the image collector comprises a first image collector and a second image collector, the first image collector and the second image collector have a common field of view range, and the position of the object to be measured is located in the common field of view range.
6. The method for measuring phase deviation according to claim 5, wherein after calculating the relative pose relationship between the image collector and the curved display screen based on the first pose relationship and the second pose relationship and combining a specular reflection principle, the method further comprises:
based on the relative pose relation between the first image collector and the curved surface display screen and the relative pose relation between the second image collector and the curved surface display screen, the relative pose relation between the first image collector and the second image collector is obtained through conversion.
7. A curved screen-based phase deviation measurement system, comprising: the display surface of the curved surface display screen faces to the position of the object to be detected; the phase deviation measurement system further includes:
The display module is used for sequentially displaying a set number of phase shift fringe patterns on the curved display screen, and the phase shift fringe patterns form a first virtual image on the surface of the object to be detected;
the image acquisition module is used for controlling the image acquisition device to acquire images of the object to be detected and respectively obtaining first virtual images corresponding to each phase shift fringe pattern;
the three-dimensional surface type reconstruction module is used for carrying out three-dimensional surface type reconstruction on the object to be detected by adopting a phase deflection technology based on the relative pose relation between the curved surface display screen and the image collector and the first virtual image;
the determining mode of the relative pose relation comprises the following steps:
displaying a calibration image with a mark point on the curved display screen, wherein the calibration image forms a second virtual image on the surface of a plane mirror, and the plane mirror is arranged at the position of the object to be detected;
converting to obtain a first position coordinate of the mark point in the calibration image under a cylindrical coordinate system of the curved surface display screen based on a pixel coordinate of the mark point in the calibration image, and mapping to obtain a second position coordinate of the mark point in the second virtual image based on the first position coordinate;
Controlling the image collector to collect images of the plane mirrors covered with the calibration plates to obtain calibration plate images, and collecting images of the plane mirrors not covered with the calibration plates to obtain second virtual images corresponding to the second virtual images;
based on the second position coordinates and the imaging principle of the image collector, combining the second virtual image, calculating to obtain a first pose relationship between the image collector and the second virtual image, and based on the calibration plate image and the imaging principle of the image collector, obtaining a second pose relationship between the image collector and the plane mirror;
based on the first pose relation and the second pose relation, and combining a specular reflection principle, calculating to obtain the relative pose relation between the image collector and the curved display screen.
8. A terminal comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that the processor implements the steps of the method according to any of claims 1 to 6 when the computer program is executed.
9. A computer readable storage medium storing a computer program, characterized in that the computer program when executed by a processor implements the steps of the method according to any one of claims 1 to 6.
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| CN114279360B (en) * | 2021-12-27 | 2023-08-11 | 天津大学 | Method and device for measuring multi-order phase deflection based on telecentric imaging system |
| CN114322838B (en) * | 2021-12-30 | 2023-03-31 | 天津大学 | Small coincidence field multi-eye phase deflection measurement method |
| CN116958410A (en) * | 2023-06-15 | 2023-10-27 | 湖南视比特机器人有限公司 | 3D camera virtual environment platform simulation method based on phase deflection operation |
| CN116883517B (en) * | 2023-09-07 | 2023-11-10 | 华东交通大学 | Camera parameter calibration method without overlapping view fields based on plane mirror |
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