CN113640548B - Electrochemical probe holder suitable for biological atomic force microscope - Google Patents

Electrochemical probe holder suitable for biological atomic force microscope Download PDF

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CN113640548B
CN113640548B CN202110858170.3A CN202110858170A CN113640548B CN 113640548 B CN113640548 B CN 113640548B CN 202110858170 A CN202110858170 A CN 202110858170A CN 113640548 B CN113640548 B CN 113640548B
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atomic force
probe
force microscope
biological
light
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CN113640548A (en
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曲鲁宁
吴森
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Tianjin University
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Tianjin University
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38Probes, their manufacture, or their related instrumentation, e.g. holders

Abstract

The invention relates to the technical field of electrochemical probe clamping equipment, and discloses an electrochemical probe clamp suitable for a biological atomic force microscope. The device can install a special probe of an electrochemical scanning microscope (SECM) on an Atomic Force Microscope (AFM) by arranging the probe clip, so that the existing atomic force microscope on the market can have the SECM function. In addition, the arc-shaped stop block is fixedly arranged at the end part of the limiting slide way, so that water drops flowing back to the upper surface of the arc-shaped stop block along the probe can be stopped at the arc-shaped edge by utilizing the tension of water and cannot break to continue flowing downwards, and the liquid extruded by the end part of the probe can be ensured to smoothly drop in a drop shape.

Description

Electrochemical probe holder suitable for biological atomic force microscope
Technical Field
The invention relates to the technical field of electrochemical probe clamping equipment, in particular to an electrochemical probe clamp holder suitable for a biological atomic force microscope.
Background
Optical means have been the common means of studying life sciences, but resolution has been limited due to the diffraction limit. The Atomic Force Microscope (AFM) has been an important means for life science research due to its advantages of ultra-high resolution and simultaneous mechanical property analysis. The existing Bioscope Resolve type biological microscope has an ultra-large longitudinal scanning range and signal-to-noise ratio, so that the existing Bioscope Resolve type biological microscope is more suitable for measuring cells compared with other atomic force microscopes. When an electrochemical scanning microscope (SECM) is combined on the basis of an atomic force microscope, the morphology imaging can be carried out, and meanwhile, the cell activities such as endocytosis and exocytosis can be observed.
With the continued research to further and expand the use of AFM in life sciences, there is an increasing market demand for incorporating SECM functionality into this type of instrument. However, this atomic force microscope does not have the SECM function, and cannot satisfy the use requirements in this respect.
Disclosure of Invention
In view of the shortcomings of the prior art, it is an object of the present invention to provide an electrochemical probe holder for use in a bio-based atomic force microscope, which can be clamped and fixed on the atomic force microscope to provide a mounting and holding function for a probe specially made for SECM, thereby enabling SECM functionality in the atomic force microscope.
In order to achieve the above purpose, the invention provides the following technical scheme:
electrochemical probe holder suitable for biological type atomic force microscope, wherein, including probe connecting portion, printing opacity portion and holder connecting portion, the holder connecting portion is fixed to be set up in printing opacity portion bottom and is used for being fixed in the microscope with the holder, probe connecting portion fixed connection is in printing opacity portion one side, probe connecting portion includes the spacing slide of two sets of relative settings, be provided with the printing opacity pore on the printing opacity portion.
In the invention, furthermore, the connecting part of the holder comprises two groups of oppositely arranged locking sliding blocks, the cross section of each locking sliding block is in a right-angled triangle shape, and the area of the cross section of each locking sliding block is gradually increased.
In the invention, furthermore, a plurality of groups of bosses are arranged on one side surface of the locking slide block, which is far away from the light transmission part.
In the invention, furthermore, a group of elastic pressing pieces are fixedly arranged on the bottom surface of the probe connecting part, and the elastic expansion direction of each elastic pressing piece is perpendicular to the sliding direction of the limiting slide way.
In the invention, further, the two groups of limiting slide rails are right-angle slide rails.
In the invention, the light-transmitting portion is a truncated cone-shaped light-transmitting portion, and the light-transmitting pore passage is a stepped circular hole.
In the invention, further, the elastic pressing piece is provided as a spring thimble.
In the invention, further, the light transmitting pore passage is provided with a light avoiding groove.
In the invention, furthermore, the top of the limiting slide way is fixedly connected with a guide rail, and the guide rail comprises a weight-reducing inclined end.
In the invention, further, an arc-shaped stop block is fixed at the end part of the limiting slide way, and the outer convex side of the arc surface of the arc-shaped stop block faces one side of the position of the light-transmitting pore passage.
Compared with the prior art, the invention has the beneficial effects that:
the device can install the special probe of an electrochemical scanning microscope (SECM) on an Atomic Force Microscope (AFM) by arranging the probe clip, so that the existing atomic force microscope on the market can have the SECM function and meet the use requirement in the aspect.
In addition, the arc-shaped check block is fixedly arranged at the end part of the limiting slide way, on one hand, the effect of limiting and positioning the loaded probe can be realized, and meanwhile, the water drops flowing back to the upper surface of the arc-shaped check block along the probe can be blocked at the arc edge by the arc surface of the arc-shaped check block by utilizing the tension of water and cannot break to continue flowing downwards, so that the liquid extruded from the end part of the probe can be ensured to smoothly drop in a water drop shape.
Drawings
FIG. 1 is an exploded view of the present invention.
Fig. 2 is a schematic diagram of the general structure of the present invention.
Fig. 3 is a side view of the present invention.
FIG. 4 is a schematic view of the present invention in use after being clamped with a probe.
In the drawings: 1. a light-transmitting portion; 11. a light transmitting channel; 12. a light-shielding groove; 2. a holder connecting portion; 21. locking the sliding block; 22. a boss; 3. a probe connecting portion; 31. a limiting slide way; 32. a weight-reducing inclined end; 33. a spring thimble; 34. an arc-shaped stop block; 35. a circular arc surface; 36. a guide rail; 4. a quartz plate; 51. a probe tip.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When a component is referred to as being "connected" to another component, it can be directly connected to the other component or intervening components may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Referring to fig. 1 to 4, a preferred embodiment of the present invention provides an electrochemical probe holder for a biological atomic force microscope, including a probe connector 3, a light-transmitting portion 1 and a holder connector 2, which are integrally connected to each other, wherein the holder connector 2 is fixedly disposed at the bottom of the light-transmitting portion 1 for fixing the holder to the microscope, the probe connector 3 is fixedly connected to one side of the light-transmitting portion 1, and the light-transmitting portion 1 is a circular truncated cone-shaped structure, which is beneficial for vibration operation in an underwater environment, and a circular truncated cone-shaped stepped hole is formed in the light-transmitting portion 1, so that the mass of the holder of the present invention can be further reduced. By the formula
Figure RE-GDA0003286449210000041
It is known that, among them, the resonant frequency f 0 The mass m of the object is reduced and the rigidity k of the object is increased, but in the scanning of the viscoelastic object such as cells, the scanning frequency is usually reduced to 0.125 kHz-1 kHz, so that the scanning is carried out, and the resonance frequency of the probe clamp is required to be increased, and the material with a large value is selected and the mass m of the probe clamp is optimized as much as possible, so that the mass m of the probe clamp is minimized without influencing the experiment. In the present invention, however, the transparent layer is formedThe light part 1 is internally provided with a circular truncated cone-shaped stepped hole and one end of a guide rail 36 which is used for guiding the probe when the probe is inserted at the top of the limiting slide way 31 is set to be a weight-reducing inclined end 32, and the weight-reducing inclined end is designed for optimally reducing the mass of the probe clamp.
As shown in fig. 1 and 2, the probe connection portion 3 includes two sets of limiting slideways 31 disposed oppositely, the two sets of limiting slideways 31 are right-angle slideways, and thus, two sets of right-angle slideways disposed oppositely and one surface of the probe connection portion 3 can enclose an inverted T-shaped locking space, the locking space is just used for penetrating the slider connection portion of the probe, when the probe completely penetrates, the end portion of the slider connection portion of the probe can abut against the planar end surface of the arc-shaped stopper 34 to achieve limiting, and at this time, the tip of the probe just reaches a predetermined position. In order to further improve the clamping force on the probe, a group of elastic pressing pieces are fixedly arranged on the bottom surface of the probe connecting part 3, and the elastic expansion direction of each elastic pressing piece is perpendicular to the sliding direction of the limiting slide rail 31. In this embodiment, the elastic pressing member selects a pogo pin 33, the pogo pin 33 is fixedly installed in a groove on the bottom surface of the probe connecting portion 3, when a probe penetrates into the probe connecting portion 3, a movable end of the pogo pin 33 abuts against a lower surface of the probe, and the probe is fixed in the limiting slide 31 by elastic force.
As shown in fig. 1 and fig. 2, a light transmitting hole 11 is provided on the light transmitting portion 1, the light transmitting hole 11 is a stepped hole, and the quartz plate 4 can be conveniently mounted on the light transmitting portion 1 in the structural form, so as to facilitate normal performance of the detection test. In addition, in the light path of the scanning laser of the microscope in the present invention, the laser will pass through the probe clamp in the two light paths of the scanning laser, which are irradiated on the probe cantilever and reflected to the photoelectric four-quadrant, so in order to ensure the smoothness of the light path, a light transmitting tunnel 11 needs to be provided, wherein a truncated cone-shaped stepped hole is opened inside the light transmitting portion 1, and also belongs to a part of the light transmitting tunnel 11. And a light shielding groove 12 is also arranged at the part of the light transmitting pore canal 11 through which the laser passes so that all light can be emitted from the inside of the light transmitting pore canal 11.
As shown in fig. 3, it should be considered that the height of the probe clamp determines the position of the probe because the optical path has some aberration during design, and the SUM value is affected when the probe is at different heights, thereby affecting the signal-to-noise ratio of the data. Setting the total height L of the probe holder within 9.0mm ± 0.5mm can result in an increase in signal-to-noise ratio and higher accuracy of experimental results.
As shown in fig. 2, the holder connecting portion 2 includes two sets of locking sliders 21 arranged oppositely, the cross-sectional shape of the locking slider 21 is a right-angled triangle, and the area of the cross-section of the locking slider 21 is gradually increased. And a plurality of groups of bosses 22 are arranged on one side surface of the locking slide block 21 away from the light-transmitting part 1. Set up locking slide 21 to make frictional force crescent when holder connecting portion 2 is fixed to be inserted on the microscope for the little wedge structure form of one section big one end, and then improve the firm in connection degree, set up the boss 22 simultaneously and also can increase the frictional force between the probe clamp of another direction and the microscope, make the probe clamp and be connected more firmly between the microscope through increase frictional force in two mutually perpendicular's direction.
As shown in fig. 1 and 4, an arc stopper 34 is fixed at an end of the position-limiting slide 31, and an outer convex side of an arc surface 35 of the arc stopper 34 faces one side of the position of the light-transmitting duct 11. When the probe tip 51 injects water to the quartz plate 4 due to the arc-shaped stopper 34, the tip of the probe is set obliquely upward at the beginning, so that the water flow extruded in the initial stage flows back along the lower surface of the probe tip 51 and is finally connected to the minimum gap between the probe and the probe clamp, namely, the arc boundary of the upper surface of the arc-shaped stopper 34, and at the position, due to the action of the tension of the recombined water existing in the arc boundary, the water drop does not flow any more and also cannot break, therefore, the water flow extruded by the probe tip 51 in the later stage does not flow back along the lower surface of the probe any more and is easier to form water drop-shaped liquid drops at the outlet to naturally fall on the quartz plate 4.
The above description is intended to describe in detail the preferred embodiments of the present invention, but the embodiments are not intended to limit the scope of the claims of the present invention, and all equivalent changes and modifications made within the technical spirit of the present invention should fall within the scope of the claims of the present invention.

Claims (9)

1. Electrochemical probe holder suitable for biological type atomic force microscope, its characterized in that includes probe connecting portion (3), printing opacity portion (1) and holder connecting portion (2), holder connecting portion (2) are fixed to be set up and are used for being fixed in the microscope with holder (1) bottom, probe connecting portion (3) fixed connection is in printing opacity portion (1) one side, probe connecting portion (3) are including two sets of relative spacing slide (31) that set up, be provided with printing opacity pore (11) on printing opacity portion (1), holder connecting portion (2) are including two sets of relative locking slider (21) that set up, the cross sectional shape of locking slider (21) is a right angle triangle-shaped, the cross sectional area of locking slider (21) increases gradually.
2. The electrochemical probe holder for biological atomic force microscope according to claim 1, characterized in that a plurality of sets of bosses (22) are provided on a side of the locking slider (21) away from the light-transmissive portion (1).
3. The electrochemical probe holder suitable for the biological atomic force microscope as claimed in claim 1, wherein a set of elastic pressing members is fixedly arranged on the bottom surface of the probe connecting part (3), and the elastic expansion direction of the elastic pressing members is perpendicular to the sliding direction of the limiting slide way (31).
4. The electrochemical probe holder for a biological Atomic Force Microscope (AFM) according to claim 3, wherein the two sets of position-limiting slideways (31) are right-angled slideways.
5. The electrochemical probe holder suitable for the biomorphic atomic force microscope as claimed in claim 1, wherein the light-transmitting part (1) is a truncated cone-shaped light-transmitting part (1), and the light-transmitting hole (11) is a stepped circular hole.
6. The electrochemical probe holder for use in biological atomic force microscopes, according to claim 3, is characterized in that the resilient hold down is provided as a pogo pin (33).
7. The electrochemical probe holder suitable for the biological atomic force microscope as claimed in claim 6, wherein the light-transmitting hole (11) is provided with a light-shielding groove (12).
8. The electrochemical probe holder for biological atomic force microscope as claimed in claim 6, wherein the top of the position-limiting slide (31) is fixedly connected with a guide rail (36), and the guide rail (36) comprises a weight-reducing slant end (32).
9. The electrochemical probe holder suitable for the biomorphic atomic force microscope as claimed in claim 6, characterized in that an arc-shaped block (34) is fixed at the end of the limit slide way (31), and the outer convex side of the arc surface (35) of the arc-shaped block (34) faces the position side of the light-transmitting pore canal (11).
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WO2012072507A1 (en) * 2010-11-29 2012-06-07 Technische Universität Wien AFM-SECM sensor
CN105092900A (en) * 2014-05-20 2015-11-25 中国科学院沈阳自动化研究所 Scanning probe clamping device for atomic force microscope
CN107192854A (en) * 2017-04-18 2017-09-22 天津大学 The Z scanner and probe unit and probe unit erector of AFM
CN110530942A (en) * 2019-07-31 2019-12-03 西安交通大学 A kind of clamping of electrochemistry experiment bench microprobe and fixed device
CN112881891A (en) * 2021-01-19 2021-06-01 张雪 Touch control chip simulation pressing test fixture

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US6245204B1 (en) * 1999-03-23 2001-06-12 Molecular Imaging Corporation Vibrating tip conducting probe microscope
CN109932530A (en) * 2019-02-25 2019-06-25 天津大学 A kind of afm scan probe clamper

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012072507A1 (en) * 2010-11-29 2012-06-07 Technische Universität Wien AFM-SECM sensor
CN105092900A (en) * 2014-05-20 2015-11-25 中国科学院沈阳自动化研究所 Scanning probe clamping device for atomic force microscope
CN107192854A (en) * 2017-04-18 2017-09-22 天津大学 The Z scanner and probe unit and probe unit erector of AFM
CN110530942A (en) * 2019-07-31 2019-12-03 西安交通大学 A kind of clamping of electrochemistry experiment bench microprobe and fixed device
CN112881891A (en) * 2021-01-19 2021-06-01 张雪 Touch control chip simulation pressing test fixture

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