CN113640322A - X-Ray detection method, system, equipment and storage medium - Google Patents
X-Ray detection method, system, equipment and storage medium Download PDFInfo
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- CN113640322A CN113640322A CN202110877075.8A CN202110877075A CN113640322A CN 113640322 A CN113640322 A CN 113640322A CN 202110877075 A CN202110877075 A CN 202110877075A CN 113640322 A CN113640322 A CN 113640322A
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- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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Abstract
The application discloses an X-Ray detection method, a system, equipment and a storage medium, wherein the method comprises the following steps: acquiring detection point parameter information of a pattern of a product to be detected; generating an array template of the detection points based on the parameter information of the detection points; adjusting the position relation between the array template and the pattern of the product to be detected; based on the array template that finally confirms, form the measuring path of check point, detect the product that awaits measuring in proper order, through this application the scheme can be directed against different products that await measuring, select the array template to the positional relationship of adjustable array template and the sample pattern that awaits measuring improves detection efficiency.
Description
Technical Field
The present application relates to the field of detection devices, and in particular, to an X-Ray detection method, system, device, and storage medium.
Background
At present, the circuit board needs to be aligned after being processed, whether an internal circuit is broken or not is detected, the existing detection mode is that the circuit board is shot by an X-ray machine usually, and then the shot image is compared with a standard circuit board image, so that whether the circuit board reaches the standard or not is determined, but different circuit boards are different in size or different in display and arrangement of the circuit boards, and standard templates are also different.
Therefore, the prior art has yet to be improved based on the above problems.
Disclosure of Invention
The purpose of this application is to realize the detection of different arrangements or size circuit board.
The technical purpose of the application is realized by the following technical scheme:
in a first aspect of the present application, an X-Ray detection method is disclosed, wherein the method comprises:
acquiring detection point parameter information of a pattern of a product to be detected;
generating an array template of the detection points based on the parameter information of the detection points;
adjusting the position relation between the array template and the pattern of the product to be detected;
and forming a detection path of the detection points based on the finally determined array template, and sequentially detecting the products to be detected.
According to the scheme, the array template of the detection points is generated by acquiring the parameter information of the detection points of the pattern of the product to be detected, the position relation between the array template and the pattern of the sample to be detected is adjusted, after the adjustment is completed, a detection path is formed based on the finally determined array template, the product to be detected is detected, and the measurement precision is guaranteed.
Optionally, the X-Ray detection method further includes:
and presetting and storing the detected standard array template and the corresponding array parameters.
According to the scheme, the standard array template and the corresponding array parameters are stored in advance, so that the array template can be generated conveniently after parameter information of the points to be measured of the pattern to be measured is acquired.
Optionally, in the X-Ray detection method, the method for obtaining the detection point parameter information of the pattern of the product to be detected includes:
acquiring display arrangement information of a pattern of a product to be detected;
and setting array parameters of the detection points.
According to the scheme, the display arrangement information of the patterns of the products to be detected is acquired, the array parameters of the detection points are set, the array templates of the detection points are convenient to generate, and the detection efficiency is guaranteed.
Optionally, in the X-Ray detection method, the method for adjusting the position relationship between the array template and the pattern of the product to be detected includes:
detecting whether a first angle detection point in the array template is aligned with a first corresponding angle of the product pattern or not, and if not, carrying out correction alignment;
detecting whether a sideline connected with the first corner in the array template is aligned with a corresponding sideline of the product pattern, and if not, carrying out correction alignment;
and detecting whether the second angle detection point is aligned with the second corresponding angle of the product pattern, and if not, carrying out correction alignment.
According to the scheme, before detection, the position relation between the array template and the sample pattern to be detected needs to be adjusted, the corner detection point is corrected firstly, then the side is corrected, and then the other corner detection point is corrected, so that the position relation between the array template and the sample pattern to be detected is corresponding, and the detection precision is guaranteed.
In another aspect of the present application, an X-Ray detection system is disclosed, which includes:
the detection point parameter acquisition module is used for acquiring detection point parameter information of a pattern of a product to be detected;
the array template generating module is used for generating an array template of the detection points based on the parameter information of the detection points;
the position relation adjusting module is used for adjusting the position relation between the array template and the pattern of the product to be detected;
and the detection module is used for forming a detection path of the detection points based on the finally determined array template and sequentially detecting the products to be detected.
According to the scheme, the array template of the detection points is generated by acquiring the parameter information of the detection points of the pattern of the product to be detected, the position relation between the array template and the pattern of the sample to be detected is adjusted, after the adjustment is completed, a detection path is formed based on the finally determined array template, the product to be detected is detected, and the measurement precision is guaranteed.
Optionally, the X-Ray detection system further includes:
and the parameter pre-storage module is used for presetting and storing the detected standard array template and the corresponding array parameters.
According to the scheme, the standard array template and the corresponding array parameters are stored in advance, so that the array template can be generated conveniently after parameter information of the points to be measured of the pattern to be measured is acquired.
Optionally, in the X-Ray detection system, the detection point parameter obtaining module includes:
the arrangement information acquisition unit is used for acquiring the display arrangement information of the pattern of the product to be detected;
and the array parameter setting unit is used for setting the array parameters of the detection points.
According to the scheme, the display arrangement information of the patterns of the products to be detected is acquired, the array parameters of the detection points are set, the array templates of the detection points are convenient to generate, and the detection efficiency is guaranteed.
Optionally, the X-Ray detection system, wherein the position relation adjusting module includes:
the first position relation adjusting unit is used for detecting whether a first angle detection point in the array template is aligned with a first corresponding angle of the product pattern or not, and if not, correcting alignment is carried out;
the second position relation adjusting unit is used for detecting whether a sideline connected with the first corner in the array template is aligned with a corresponding sideline of the product pattern or not, and if not, correcting and aligning;
and the third position relation adjusting unit is used for detecting whether the second angle detection point is aligned with the second corresponding angle of the product pattern or not, and if not, correcting and aligning.
According to the scheme, before detection, the position relation between the array template and the sample pattern to be detected needs to be adjusted, the corner detection point is corrected firstly, then the side is corrected, and then the other corner detection point is corrected, so that the position relation between the array template and the sample pattern to be detected is corresponding, and the detection precision is guaranteed.
In another aspect of the present application, an X-Ray detection apparatus is disclosed, wherein the apparatus comprises a memory and a processor, the memory stores a computer program that can be loaded by the processor and execute the X-Ray detection method as described above.
In another aspect of the present application, a storage medium is also disclosed, in which a computer program capable of being loaded by a processor and executing the X-Ray detection method as described above is stored.
In summary, the present application discloses a method, a system, a device and a storage medium for X-Ray detection, wherein the method comprises: acquiring detection point parameter information of a pattern of a product to be detected; generating an array template of the detection points based on the parameter information of the detection points; adjusting the position relation between the array template and the pattern of the product to be detected; based on the array template that finally confirms, form the measuring path of check point, detect the product that awaits measuring in proper order, through this application the scheme can be directed against different products that await measuring, select the array template to the positional relationship of adjustable array template and the sample pattern that awaits measuring improves detection efficiency.
Drawings
FIG. 1 is a flow chart of the steps of the X-Ray detection method described in the present application.
Fig. 2 is a block diagram of the X-Ray detection system according to the present application.
Detailed Description
The present application is described in further detail below with reference to figures 1-2.
The application provides an X-Ray detection method based on circuit boards with different sizes and different circuit board display arrangements to detect the circuit boards, and refers to fig. 1, which is a flow chart of steps of the method, and specifically, the method comprises the following steps:
s1, acquiring detection point parameter information of a pattern of a product to be detected;
s2, generating an array template of the detection points based on the parameter information of the detection points;
s3, adjusting the position relation between the array template and the pattern of the product to be detected;
and S4, forming a detection path of the detection points based on the finally determined array template, and sequentially detecting the products to be detected.
In the embodiment of the application, the detection of the circuit board comprises detection points, the detection points corresponding to different circuit boards are possibly different, the application carries out the detection of the circuit board through X-Ray, firstly, the detection point parameter information of a pattern of a product to be detected is obtained, the detection of the product to be detected is correspondingly detected by obtaining the pattern of the product to be detected, the pattern of the product to be detected corresponds to the product to be detected, after the pattern of the product to be detected is obtained, the detection point parameter information is different due to different arrangement display modes and different circuit board sizes, for example, the positions of the detection points, the number of the detection points and the like, an array template of the detection points is generated based on the detection point parameter information, namely a standard template, and the array template can correspond to each sample to be detected according to the standard template, the detection precision of the sample to be detected is ensured, and the detection point parameters are different due to different samples to be detected, the detection precision can be improved by selecting the array template through the detection point parameters, and in the actual detection process, when a sample to be detected is fed, the display arrangement mode may be different, for example, the relationship between the height and the distance of a standard detection position, the rotation angle relationship and the like, which may cause that the array template and the sample pattern to be detected cannot be accurately superposed, and thus the accurate detection cannot be realized, in the embodiment of the application, based on the above problems, the array template and the product pattern to be detected can be superposed by adjusting the position relationship between the array template and the product pattern to be detected, thereby ensuring the detection precision, compared with the traditional method of adjusting the product to be detected through an auxiliary device such as a manipulator and the like, the scheme of the application is more convenient and higher in adjustment precision, after the position relationship is adjusted, based on the finally determined array template, a detection path can be correspondingly formed, detect each check point of the product to be detected, through this application the scheme not only can improve and detect the precision, simultaneously, easy and simple to handle, the suitability is high.
In the foregoing solution, first, detecting point parameter information of a pattern of a product to be detected is obtained, and then an array template is generated according to the detecting point parameter information, so that how to generate the array template according to the detecting point parameter is specifically described, based on the above problems, in an embodiment of the present application, the X-Ray detection method further includes:
and presetting and storing the detected standard array template and the corresponding array parameters.
In the embodiment of the application, the array template is generated according to the detection point parameter information of the pattern of the product to be detected, namely the array template corresponds to the parameter information of the detection point, when the application is specifically implemented, the standard array template corresponds to the corresponding array parameter and is stored in a preset mode, and in the subsequent detection process, after the parameter information of the detection point is acquired, the array template corresponding to the parameter of the detection point can be generated to detect the sample to be detected, so that the corresponding relation between the pattern of the sample to be detected and the standard array template is ensured, and the detection precision is improved.
In the foregoing solution, in order to generate an array template for detecting a sample to be detected, detection point parameter information of a pattern of a product to be detected needs to be obtained, specifically, an embodiment of the present application discloses a method for obtaining detection point parameter information of a pattern of a product to be detected, including:
acquiring display arrangement information of a pattern of a product to be detected;
and setting array parameters of the detection points.
In the embodiment of the application, because different samples to be tested are different in size, different in display arrangement mode and different in corresponding array templates, when the parameter information of the detection points of the pattern of the product to be tested is obtained, the display arrangement information of the pattern of the product is obtained, and the array parameters of the detection points are set, for example, the product is rectangular, five detection points are arranged on the long side and three detection points are arranged on the short side, so that the display arrangement of the samples to be tested is different, the parameters of the detection points are also different, the XY axis is set by taking the station where the circuit board is placed as a plane, the same product to be tested is possible to appear, five detection points are arranged on the X axis and three detection points are arranged on the Y axis, three detection points are also possible to appear on the X axis and five detection points are arranged on the Y circumference, different display arrangements are arranged, the parameter information of the detection points is also different, therefore, by obtaining the display arrangement information of the pattern of the product, the array parameters of the detection points can be conveniently determined, specifically, the array parameters of the detection points further comprise current and voltage of an X-Ray light tube, the number of the detection points of the XY axis is determined by selecting the detection points according to different circuit board materials and the like, the distance between the detection points on the XY axis needs to be set, and the positions of the detection points are conveniently determined.
In the foregoing solution, it is mentioned that, in specific implementation, due to the difference in display arrangement of the samples to be detected, the samples cannot completely coincide with the array template, and therefore, based on the above problem, the embodiment of the present application further discloses an X-Ray detection method, where the method for adjusting the position relationship between the array template and the pattern of the product to be detected includes:
detecting whether a first angle detection point in the array template is aligned with a first corresponding angle of the product pattern or not, and if not, carrying out correction alignment;
detecting whether a sideline connected with the first corner in the array template is aligned with a corresponding sideline of the product pattern, and if not, carrying out correction alignment;
and detecting whether the second angle detection point is aligned with the second corresponding angle of the product pattern, and if not, carrying out correction alignment.
In the embodiment of the application, in order to improve the adaptability without limiting the feeding of the sample to be detected, after the sample to be detected is fed, the array template is generated after the detection point parameters are obtained, and in order to ensure the detection accuracy of the detection points, the position relationship between the array template and the sample pattern to be detected is determined and adjusted to ensure that the array template is overlapped with the sample pattern to be detected, specifically, the adjustment mode includes obtaining a first angle detection point of the sample to be detected, correcting the first angle detection point and a first correspondence of the array template, judging whether the alignment is performed, if the alignment is not performed, adjusting the array template to align the first angle detection point of the array template and a first correspondence angle of the product pattern, after the alignment, correcting the alignment to determine the first angle and the edge if the edge connected with the first angle is aligned with the edge corresponding to the product pattern, then whether the second corner detection point is aligned with a second corresponding corner of the product pattern is detected, and correction alignment is carried out if the second corner detection point is not aligned, when the method is implemented specifically, the first corner detection point can be an upper left corner, the second corner detection belt can be an upper right corner without limitation, the alignment of the first corner can directly pull the array template for alignment, the first corner is not adjusted because the first corner is aligned, the adjustment of the opposite side can rotate by taking the first corner as a center, so that the side of the array template is overlapped with the corresponding side of the pattern of the sample to be detected, and the adjustment of the second corner can be realized because the first corner and the side are adjusted to be overlapped, when the second corner is adjusted, the corresponding adjustment is the relative size of the array template and the sample to be detected, and the manner of stretching and scaling is adopted, so that the second corner is overlapped with the corresponding corner of the sample to be detected, and the coincidence of the array template and the sample to be detected can be realized, therefore, the detected array template is finally determined, the output path of the detection point is determined according to the final array template, the output result is ensured, and the overall measurement precision is improved.
Based on the above method, the embodiment of the present application further discloses an X-Ray detection system, which refers to fig. 2 and is a structural block diagram of the system, where the X-Ray detection system includes:
a detection point parameter obtaining module 100, configured to obtain detection point parameter information of a pattern of a product to be detected;
the array template generating module 200 is used for generating an array template of the detection points based on the parameter information of the detection points;
the position relation adjusting module 300 is used for adjusting the position relation between the array template and the pattern of the product to be detected;
and the detection module 400 is configured to form a detection path of a detection point based on the finally determined array template, and sequentially detect the products to be detected.
The method comprises the steps of firstly obtaining the detection point parameter information of a product pattern to be detected, detecting the product to be detected, correspondingly detecting the product pattern to be detected by obtaining the product pattern to be detected, wherein the product pattern to be detected corresponds to the product to be detected, after obtaining the product pattern to be detected, the detection point parameter information is different due to different arrangement and display modes and different circuit board sizes, such as the positions of the detection points, the number of the detection points and the like, and based on the detection point parameter information, generating an array template of the detection points, namely a standard template, which can correspond to each sample to be detected according to the standard template, ensuring the detection precision of the sample to be detected, wherein the detection point parameters are different for different samples to be detected, and the detection precision can be improved by selecting the array template according to the detection point parameters, when a sample to be detected is loaded, the display arrangement mode may be different, for example, the relationship between the height and the distance of a standard detection position, the relationship between the rotation angle and the like may cause that the array template and the pattern of the sample to be detected cannot be accurately coincided, and thus the accurate detection cannot be performed, in the embodiment of the present application, based on the above problems, the array template and the pattern of the product to be detected can be coincided by adjusting the position relationship between the array template and the pattern of the product to be detected, so as to ensure the detection accuracy, compared with the conventional method of adjusting the product to be detected by an auxiliary device such as a manipulator, the scheme of the present application is more convenient, and at the same time, the adjustment accuracy is higher, after the position relationship is adjusted, based on the finally determined array template, a detection path can be correspondingly formed, each detection point of the product to be detected can be detected, through the scheme of the present application, the detection accuracy can be improved, meanwhile, the operation is simple and convenient, and the adaptability is high.
The templates of the present application have been described in detail in the method steps, and therefore are not described herein.
Further, the X-Ray detection system, wherein the system further includes:
and the parameter pre-storage module is used for presetting and storing the detected standard array template and the corresponding array parameters.
The above templates of the present application have been described in detail in the method steps, and therefore are not described herein.
Further, the X-Ray detection system, wherein the detection point parameter obtaining module includes:
the arrangement information acquisition unit is used for acquiring the display arrangement information of the pattern of the product to be detected;
and the array parameter setting unit is used for setting the array parameters of the detection points.
The above units of the present application have been described in detail in the method steps, and therefore are not described herein again.
Further, the X-Ray detection system, wherein the position relation adjusting module includes:
the first position relation adjusting unit is used for detecting whether a first angle detection point in the array template is aligned with a first corresponding angle of the product pattern or not, and if not, correcting alignment is carried out;
the second position relation adjusting unit is used for detecting whether a sideline connected with the first corner in the array template is aligned with a corresponding sideline of the product pattern or not, and if not, correcting and aligning;
and the third position relation adjusting unit is used for detecting whether the second angle detection point is aligned with the second corresponding angle of the product pattern or not, and if not, correcting and aligning.
The above units of the present application have been described in detail in the method steps, and therefore are not described herein again.
In another aspect of the present application, an X-Ray detection apparatus is disclosed, wherein the apparatus comprises a memory and a processor, the memory stores a computer program that can be loaded by the processor and execute the X-Ray detection method as described above.
In another aspect of the present application, a storage medium is also disclosed, in which a computer program capable of being loaded by a processor and executing the X-Ray detection method as described above is stored.
The embodiments of the present invention are preferred embodiments of the present application, and the scope of protection of the present application is not limited by the embodiments, so: all equivalent changes made according to the structure, shape and principle of the present application shall be covered by the protection scope of the present application.
Claims (10)
1. An X-Ray detection method, comprising:
acquiring detection point parameter information of a pattern of a product to be detected;
generating an array template of the detection points based on the parameter information of the detection points;
adjusting the position relation between the array template and the pattern of the product to be detected;
and forming a detection path of the detection points based on the finally determined array template, and sequentially detecting the products to be detected.
2. The X-Ray detection method of claim 1, further comprising:
and presetting and storing the detected standard array template and the corresponding array parameters.
3. The X-Ray detection method as claimed in claim 1, wherein the method of obtaining the detection point parameter information of the pattern of the product to be detected comprises:
acquiring display arrangement information of a pattern of a product to be detected;
and setting array parameters of the detection points.
4. The X-Ray detection method of claim 1, wherein the method for adjusting the position relationship between the array template and the pattern of the product to be detected comprises:
detecting whether a first angle detection point in the array template is aligned with a first corresponding angle of the product pattern or not, and if not, carrying out correction alignment;
detecting whether a sideline connected with the first corner in the array template is aligned with a corresponding sideline of the product pattern, and if not, carrying out correction alignment;
and detecting whether the second angle detection point is aligned with the second corresponding angle of the product pattern, and if not, carrying out correction alignment.
5. An X-Ray detection system, comprising:
the detection point parameter acquisition module is used for acquiring detection point parameter information of a pattern of a product to be detected;
the array template generating module is used for generating an array template of the detection points based on the parameter information of the detection points;
the position relation adjusting module is used for adjusting the position relation between the array template and the pattern of the product to be detected;
and the detection module is used for forming a detection path of the detection points based on the finally determined array template and sequentially detecting the products to be detected.
6. An X-Ray detection system according to claim 5, wherein the system further comprises:
and the parameter pre-storage module is used for presetting and storing the detected standard array template and the corresponding array parameters.
7. The X-Ray detection system of claim 5, wherein the detection point parameter acquisition module comprises:
the arrangement information acquisition unit is used for acquiring the display arrangement information of the pattern of the product to be detected;
and the array parameter setting unit is used for setting the array parameters of the detection points.
8. An X-Ray detection system according to claim 5, wherein the positional relationship adjustment module comprises:
the first position relation adjusting unit is used for detecting whether a first angle detection point in the array template is aligned with a first corresponding angle of the product pattern or not, and if not, correcting alignment is carried out;
the second position relation adjusting unit is used for detecting whether a sideline connected with the first corner in the array template is aligned with a corresponding sideline of the product pattern or not, and if not, correcting and aligning;
and the third position relation adjusting unit is used for detecting whether the second angle detection point is aligned with the second corresponding angle of the product pattern or not, and if not, correcting and aligning.
9. An X-Ray detection apparatus comprising a memory and a processor, the memory storing a computer program that can be loaded by the processor and that executes the X-Ray detection method according to any one of claims 1 to 4.
10. A storage medium storing a computer program that can be loaded by a processor and that executes the X-Ray detection method according to any one of claims 1 to 4.
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