CN113608197B - Optical antenna, manufacturing method thereof and optical phased array chip - Google Patents

Optical antenna, manufacturing method thereof and optical phased array chip Download PDF

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Publication number
CN113608197B
CN113608197B CN202110872998.4A CN202110872998A CN113608197B CN 113608197 B CN113608197 B CN 113608197B CN 202110872998 A CN202110872998 A CN 202110872998A CN 113608197 B CN113608197 B CN 113608197B
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antenna
layer
metal layer
optical
structures
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CN113608197A (en
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吴蓓蓓
金里
路侑锡
冯俊波
朱继光
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United Microelectronics Center Co Ltd
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United Microelectronics Center Co Ltd
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Priority to PCT/CN2022/076391 priority patent/WO2023005192A1/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491Details of non-pulse systems
    • G01S7/4911Transmitters
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/12007Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind forming wavelength selective elements, e.g. multiplexer, demultiplexer
    • G02B6/12009Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind forming wavelength selective elements, e.g. multiplexer, demultiplexer comprising arrayed waveguide grating [AWG] devices, i.e. with a phased array of waveguides

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optics & Photonics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Variable-Direction Aerials And Aerial Arrays (AREA)

Abstract

An optical antenna, a method of manufacturing the same, and an optical phased array chip are provided. The optical antenna includes: a dielectric layer; a plurality of antenna structures located in the dielectric layer and spaced apart from each other in a first direction, each of the plurality of antenna structures extending along a second direction that intersects the first direction; and a metal layer located in the dielectric layer opposite the plurality of antenna structures and extending along the second direction, wherein the metal layer has a non-planar surface facing the plurality of antenna structures such that a first portion of light propagating in each of the plurality of antenna structures that is emitted toward the metal layer is reflected by the non-planar surface and interferes with a second portion of the light that is emitted away from the metal layer.

Description

Optical antenna, manufacturing method thereof and optical phased array chip
Technical Field
The disclosure relates to the technical field of semiconductors, and in particular relates to an optical antenna, a manufacturing method thereof and an optical phased array chip.
Background
The laser radar technology is a high-precision 3D image sensing technology and is widely applied to the fields of automatic driving, robots, unmanned aerial vehicles and the like. The laser radar technology based on the optical phased array utilizes the phased array to realize the steering of the light beam in space, thereby realizing the scanning of the two-dimensional light beam in a pure solid state. The optical antenna is a key device in the optical phased array, and the divergence angle of the light spot and the power of the outgoing light emitted from the optical antenna determine the furthest distance that the laser radar technology can measure in ranging applications.
Disclosure of Invention
According to some embodiments of the present disclosure, there is provided an optical antenna comprising: a dielectric layer; a plurality of antenna structures located in the dielectric layer and spaced apart from each other in a first direction, each of the plurality of antenna structures extending along a second direction that intersects the first direction; and a metal layer located in the dielectric layer opposite the plurality of antenna structures and extending along the second direction, wherein the metal layer has a non-planar surface facing the plurality of antenna structures such that a first portion of light propagating in each of the plurality of antenna structures that is emitted toward the metal layer is reflected by the non-planar surface and interferes with a second portion of the light that is emitted away from the metal layer.
According to some embodiments of the present disclosure, there is provided an optical phased array chip comprising an optical antenna as described above.
There is also provided, in accordance with some embodiments of the present disclosure, a method of manufacturing an optical antenna, including: providing a semiconductor-on-insulator substrate, wherein the semiconductor-on-insulator substrate comprises a first dielectric layer and a semiconductor layer which are stacked with each other; forming a plurality of antenna structures at least by performing a patterning process on the semiconductor layer, the plurality of antenna structures being spaced apart from each other in a first direction, each of the plurality of antenna structures extending along a second direction intersecting the first direction; and forming a second dielectric layer embedded with a metal layer, the second dielectric layer encapsulating the plurality of antenna structures with the first dielectric layer, wherein the metal layer has a non-planar surface facing the plurality of antenna structures such that a first portion of light propagating in each of the plurality of antenna structures that is emitted toward the metal layer is reflected by the non-planar surface and interferes with a second portion of the light that is emitted away from the metal layer.
These and other aspects of the disclosure will be apparent from and elucidated with reference to the embodiments described hereinafter.
Drawings
Further details, features and advantages of the present disclosure are disclosed in the following description of exemplary embodiments, with reference to the following drawings, wherein:
fig. 1A-1C are schematic structural diagrams of an optical antenna 100 of some embodiments of the present disclosure;
fig. 2A is a schematic diagram of far-field amplitude distribution of outgoing light emitted in an optical antenna according to the related art;
fig. 2B is a schematic diagram of far-field amplitude distribution of outgoing light emitted in an optical antenna according to the related art;
fig. 2C is a schematic diagram of far-field amplitude distribution of outgoing light emitted by the optical antenna 100 according to the present disclosure;
fig. 3A-3C are schematic structural diagrams of an optical antenna 300 of some embodiments of the present disclosure;
fig. 4A is a schematic diagram of far-field amplitude distribution of outgoing light emitted in an optical antenna according to the related art;
fig. 4B is a schematic diagram of far-field amplitude distribution of outgoing light emitted in an optical antenna according to the related art;
fig. 4C is a schematic diagram of far-field amplitude distribution of outgoing light emitted by the optical antenna 300 according to the present disclosure;
Fig. 5 is a schematic flow chart of a method 500 of manufacturing an optical antenna according to some embodiments of the present disclosure;
fig. 6A-6E are schematic cross-sectional structural views of semiconductor devices obtained by a method 500 according to some embodiments of the present disclosure;
fig. 7 is a flow chart of a process of forming a second dielectric layer embedded with a metal layer in a method 500 according to some embodiments of the present disclosure;
fig. 8A-8I are schematic cross-sectional structure views of semiconductor devices obtained by a method 500 according to some embodiments of the present disclosure;
fig. 9 is a flow chart of a process of forming a plurality of antenna structures in a method 500 according to some embodiments of the present disclosure; and
fig. 10 is a flow chart of a process of forming a second dielectric layer embedded with a metal layer in a method 500 according to some embodiments of the present disclosure.
Detailed Description
It will be understood that, although the terms first, second, third, etc. may be used herein to describe various elements, components, regions, layers and/or sections, these elements, components, regions, layers and/or sections should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or section from another element, component, region, layer or section. Thus, a first element, component, region, layer or section discussed below could be termed a second element, component, region, layer or section without departing from the teachings of the present disclosure.
Spatially relative terms, such as "under …," "under …," "lower," "under …," "over …," "upper," and the like, may be used herein for ease of description to describe one element or feature's relationship to another element(s) or feature(s) as illustrated in the figures. It will be understood that these spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "under" or "beneath" other elements or features would then be oriented "over" the other elements or features. Thus, the exemplary terms "below …" and "below …" may encompass both orientations above … and below …. Terms such as "before …" or "before …" and "after …" or "followed by" may similarly be used, for example, to indicate the order in which light passes through the elements. The device may be oriented in other ways (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly. In addition, it will also be understood that when a layer is referred to as being "between" two layers, it can be the only layer between the two layers, or one or more intervening layers may also be present.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items, and the phrase "at least one of a and B" means a alone, B alone, or both a and B.
It will be understood that when an element or layer is referred to as being "on," "connected to," "coupled to," or "adjacent to" another element or layer, it can be directly on, connected to, coupled to, or adjacent to the other element or layer, or intervening elements or layers may be present. In contrast, when an element is referred to as being "directly on," "directly connected to," "directly coupled to," or "directly adjacent to" another element or layer, there are no intervening elements or layers present. However, in no event "on …" or "directly on …" should be construed as requiring one layer to completely cover an underlying layer.
Embodiments of the present disclosure are described herein with reference to schematic illustrations (and intermediate structures) of idealized embodiments of the present disclosure. As such, variations from the shapes of the illustrations as a result, for example, of manufacturing techniques and/or tolerances, are to be expected. Thus, embodiments of the present disclosure should not be construed as limited to the particular shapes of regions illustrated herein but are to include deviations in shapes that result, for example, from manufacturing. Thus, the regions illustrated in the figures are schematic in nature and their shapes are not intended to illustrate the actual shape of a region of a device and are not intended to limit the scope of the present disclosure.
Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and/or the present specification and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
As used herein, the term "substrate" may refer to a substrate of a diced wafer, or may refer to a substrate of an uncut wafer. Similarly, the terms chip and die may be used interchangeably unless such an interchange would cause a conflict. It should be understood that the term "film" includes layers and should not be construed to indicate vertical or horizontal thickness unless otherwise indicated. It should be noted that the thicknesses of the material layers of the optical antenna shown in the drawings are only schematic and do not represent actual thicknesses.
The inventor finds that far field intensity of emergent light emitted by the optical antenna is related to the structure of the optical antenna, and far field intensity distribution of the emergent light influences the size of main lobe optical power of the combined beam at different scanning angles after the emergent light is combined into Shu Chengge beams.
According to an aspect of the present disclosure, there is provided an optical antenna, by providing a metal layer in a dielectric layer, and the metal layer has a non-flat surface facing an antenna structure, far-field amplitude distribution of outgoing light emitted via the optical antenna, outgoing main lobe power, and utilization ratio of outgoing light can be optimized.
Fig. 1A is a schematic cross-sectional structure of an optical antenna 100 in a first direction, fig. 1B is a schematic cross-sectional structure of the optical antenna 100 in a second direction, and fig. 1C is a schematic plan structure of an antenna structure in the optical antenna 100 according to some embodiments of the present disclosure.
The structure of the optical antenna 100 is described below with reference to fig. 1A to 1C.
As shown in fig. 1A and 1B, the optical antenna 100 includes a dielectric layer 110 and a plurality of antenna structures 120 located in the dielectric layer 110, the plurality of antenna structures 120 are spaced apart from each other in a first direction, and each antenna structure 120 of the plurality of antenna structures 120 extends along a second direction intersecting the first direction.
According to some embodiments, as shown in fig. 1A-1C, the first direction is an X-direction, the second direction is a Y-direction perpendicular to the X-direction, and the Z-direction is a third direction perpendicular to a plane defined by the first and second directions.
With continued reference to fig. 1A and 1B, the optical antenna 100 further includes a metal layer 130 located in the dielectric layer 110. The metal layer 130 is opposite to the plurality of antenna structures 120 and extends along the second direction.
The metal layer 130 has a non-planar surface facing the plurality of antenna structures 120 such that a first portion of light propagating in each of the plurality of antenna structures 120 that is emitted toward the metal layer 130 reflects off the non-planar surface and interferes with a second portion of the light that is emitted away from the metal layer 130.
As shown in fig. 1B, the light propagating in the antenna structure 120 includes a first portion (as shown by arrow B) and a second portion (as shown by arrow a), wherein the first portion exits facing the metal layer 130 and is reflected by a face of the metal layer 130 facing the antenna structure 120 to form reflected light (as shown by arrow C).
The term "light propagating in the antenna structure" means light transmitted in the antenna structure in the longitudinal direction of the antenna structure, and includes light emitted from one end of the antenna structure to the other end in the longitudinal direction and light emitted from the side surface of the antenna structure.
According to the optical antenna of the embodiment of the disclosure, the metal layer is arranged in the dielectric layer and provided with the non-flat surface facing the antenna structure, so that the first part of light emitted from the antenna structure facing the metal layer is reflected by the non-flat surface to obtain reflected light with various propagation directions. The reflected light is capable of interfering to a different extent with the second portion of light exiting the antenna structure away from the metal layer, thereby optimizing the far field amplitude distribution of the exiting light that is ultimately emitted via the optical antenna, i.e. the exiting light has a higher far field amplitude over a larger scanning angle. Meanwhile, interference between the reflected light and the second part of light emitted from the metal layer due to the fact that the reflected light has a single propagation direction in the XZ plane is avoided, and splitting of far-field amplitude distribution of the emergent light (namely light intensity loss occurs at the central position of a scanning area) is avoided, so that the emergent light has stronger light intensity in a larger scanning angle range after being combined with Cheng Geshu light.
Further, as the metal layer reflects the first part of light emitted towards the metal layer, the reflected light obtained after reflection and the second part of light emitted away from the metal layer have the same or similar propagation direction in the YZ plane, so that the main lobe power of the light emitted from the optical antenna is increased, the main lobe power of the emitted light after combining Cheng Geshu light is further improved, and the utilization rate of the emitted light is improved.
According to some embodiments, the dielectric layer is made of a dielectric material with a lower refractive index, such as silicon dioxide.
According to some embodiments, the material of the antenna structure is a material with a higher refractive index, e.g. silicon or the like.
In some embodiments, the material of the metal layer is a material with high reflectivity, such as titanium nitride, aluminum, copper, gold, and the like, which is not limited herein. By setting the material of the metal layer to be a material with higher reflectivity, the intensity of the reflected light obtained after being reflected by the metal layer is increased, and the emergent main lobe power of the light emitted from the optical antenna is further improved.
In some embodiments, as shown in fig. 1A and 1B, the non-planar surface of the metal layer 130 includes a plurality of concave surfaces 130a disposed side-by-side along the first direction, wherein each concave surface 130a of the plurality of concave surfaces extends along the second direction and is respectively opposite each antenna structure 120 of the plurality of antenna structures 120.
By arranging the uneven surface of the metal layer to be a concave surface opposite to each antenna structure in the plurality of antenna structures, for each antenna structure in the plurality of antenna structures, the first part of light emitted towards the metal layer is reflected by the corresponding concave surface to obtain reflected light, and the light intensity and main lobe power of the combined beam emitted by the optical antenna are further improved.
In some embodiments, as shown in FIG. 1A, concave surface 130a is an arcuate surface.
The concave surface is configured as an arcuate surface such that a first portion of the light propagating in the antenna structure, when directed toward the arcuate surface, has the same or similar optical path length difference throughout a cross-section from the antenna structure to the arcuate surface. Therefore, when the light of the first part is reflected by the metal layer and interferes with the light of the second part emitted by the metal layer, the interference effect is the same or similar at different spatial positions, and the optimization effect of far-field amplitude distribution of the emitted light emitted by the optical antenna is further improved.
It is to be understood that the above-described arrangement of the concave surface of the non-planar surface of the metal layer as an arcuate surface is merely exemplary. It will be appreciated by those skilled in the art that in other embodiments, concave surface 130a may also be configured to have a cross-section in the shape of a "V" or the like, without limitation.
In some embodiments, the radius of curvature of the arcuate surface is greater than 314nm.
In some embodiments, the distances between the metal layer and the plurality of antenna structures are configured such that the optical path difference of the first portion of the reflected light and the second portion of the light is an integer multiple of the wavelength of the light.
With continued reference to fig. 1B, the optical path difference between the reflected light (indicated by arrow C) and the second portion (indicated by arrow a) of the light propagating in the antenna structure 120 after reflection is an integer multiple of the wavelength of the light.
By configuring the distance between the metal layer and the plurality of antenna structures such that the optical path difference of the first portion of the reflected light and the second portion of the light is an integer multiple of the wavelength of the light, when the first portion of the reflected light interferes with the second portion of the light, the interfered light has an enhanced light intensity, further enhancing the optimizing effect of the far field amplitude distribution of the outgoing light emitted via the optical antenna.
In some embodiments, the thickness of the metal layer 130 is greater than or equal to 50nm.
The structure of each of the plurality of antenna structures is exemplarily described below with reference to fig. 1C. According to some embodiments, as shown in fig. 1C, each of the plurality of antenna structures 120 includes a body portion 121 extending along a second direction and a plurality of protruding portions 122 protruding from the body portion 121 in a direction parallel to a plane defined by the first direction and the second direction, the plurality of protruding portions 122 being periodically arranged along the second direction.
Since the refractive index of the dielectric layer is lower than that of the antenna structure, the protruding portion is provided by providing a protruding portion on a side of the antenna structure (i.e., a surface of the body portion in a direction perpendicular to a plane defined by the first direction and the second direction), the protruding portion generating a disturbance to light propagating in the antenna structure. Meanwhile, in the embodiment according to the present disclosure, since the metal layer having the non-flat surface is disposed under the antenna structure, the reflected light obtained after the first portion of the light propagating in the antenna structure is reflected by the non-flat surface has various propagation directions, and the occurrence of splitting of the far field amplitude distribution of the outgoing light emitted via the optical antenna is avoided.
FIG. 2A is a schematic diagram of far-field amplitude distribution of outgoing light emitted from an optical antenna employing the antenna structure of FIG. 1C and without a metal layer disposed in a dielectric layer according to the related art; FIG. 2B is a schematic diagram of far-field amplitude distribution of outgoing light emitted from an optical antenna employing the antenna structure of FIG. 1C and having a metal layer with a planar surface disposed in a dielectric layer, according to the related art; fig. 2C is a schematic diagram of far-field amplitude distribution of outgoing light emitted from the optical antenna 100 according to an embodiment of the present disclosure.
As shown in fig. 2A, for an optical antenna adopting the antenna structure of fig. 1C and not having a metal layer disposed in the dielectric layer, the far-field amplitude distribution of the outgoing light is in a split shape, so that there is a large loss in the central region (extending from 0 ° to the two sides) of the main lobe scanning region. As shown in fig. 2B, for the optical antenna employing the antenna structure of fig. 1C and having a metal layer with a flat surface provided in the dielectric layer, the far-field amplitude distribution of the outgoing light does not appear split-like, but the far-field amplitude distribution appears to have a strong light intensity (concentrated around the scanning angle 0 °) in a small scanning angle range. As shown in fig. 2C, with the optical antenna 100 according to the embodiment of the present disclosure, the far-field amplitude of the outgoing light does not appear split-like, and the far-field amplitude distribution appears to have a strong light intensity over a large scanning angle range.
Fig. 3A is a schematic cross-sectional structure of an optical antenna 300 in a first direction, fig. 3B is a schematic cross-sectional structure of the optical antenna 300 in a second direction, and fig. 3C is a schematic plan structure of an antenna structure in the optical antenna 300 according to some embodiments of the present disclosure.
The structure of the optical antenna 300 is described below with reference to fig. 3A-3C.
As shown in fig. 3A and 3B, an optical antenna 300 according to some embodiments of the present disclosure includes a dielectric layer 310 and a plurality of antenna structures 320 located in the dielectric layer 310, the plurality of antenna structures 320 being spaced apart from each other in a first direction, and each antenna structure 320 of the plurality of antenna structures 320 extending along a second direction intersecting the first direction.
According to some embodiments, as shown in fig. 3A-3C, the first direction is an X-direction, the second direction is a Y-direction perpendicular to the X-direction, and the Z-direction is a third direction perpendicular to a plane defined by the first and second directions.
With continued reference to fig. 3A and 3B, an optical antenna 300 according to an embodiment of the present disclosure further includes a metal layer 330 in the dielectric layer 310. The metal layer 330 is opposite to the plurality of antenna structures 320 and extends along the second direction.
The metal layer 330 has a non-planar surface facing the plurality of antenna structures 320 such that a first portion of light propagating in each of the plurality of antenna structures 320 that exits the metal layer 330 reflects off the non-planar surface and interferes with a second portion of the light that exits away from the metal layer 330.
In the optical antenna according to the embodiment of the disclosure, since the metal layer has the non-planar surface facing the antenna structure, after the first portion of light exiting from the antenna structure facing the metal layer is reflected by the non-planar surface, interference with the second portion of light exiting from the antenna structure facing away from the metal layer can occur, so that far-field amplitude distribution of the exiting light finally exiting via the optical antenna is optimized, that is, the exiting light has a higher far-field amplitude within a larger scanning angle. Thus, the emergent light has stronger light intensity in a larger scanning angle range after combining Cheng Geshu light.
Meanwhile, as the metal layer is arranged to be of a non-planar structure, the first part of light emitted from the antenna structure facing the metal layer has multiple propagation directions in the XZ plane of the reflected light obtained after being reflected by the non-planar surface, so that the phenomenon that the far-field amplitude distribution of the emitted light emitted through the optical antenna is split after the reflected light has the same interference with the second part of light emitted from the metal layer due to the single propagation direction is avoided, namely, the fact that the intensity of the light in a scanning area (for example, at a central position) is avoided.
Further, as the metal layer reflects the first part of light emitted towards the metal layer, the reflected light obtained after reflection and the second part of light emitted away from the metal layer have the same or similar propagation direction in the YZ plane, so that the main lobe power of the light emitted from the optical antenna is increased, the main lobe power of the emitted light after combining Cheng Geshu light is further improved, and the utilization rate of the emitted light is improved.
According to some embodiments, the dielectric layer is made of a dielectric material with a lower refractive index, such as silicon dioxide.
According to some embodiments, the material of the antenna structure is a material with a higher refractive index, e.g. silicon or the like.
In some embodiments, the material of the metal layer is a material with high reflectivity, such as titanium nitride, aluminum, copper, gold, and the like, which is not limited herein. By setting the material of the metal layer to be a material with higher reflectivity, the intensity of the reflected light obtained after being reflected by the metal layer is increased, and the emergent main lobe power of the light emitted from the optical antenna is further improved.
In some embodiments, as shown in fig. 3A, the non-planar surface of the metal layer 330 includes a plurality of convex surfaces 330a disposed side-by-side along a first direction, wherein each convex surface 330a of the plurality of convex surfaces extends along a second direction and is respectively opposite each antenna structure 320 of the plurality of antenna structures 320.
By arranging the uneven surface of the metal layer to be a convex surface opposite to each antenna structure in the plurality of antenna structures, for each antenna structure in the plurality of antenna structures, the first part of light emitted from the metal layer is reflected by the corresponding convex surface to obtain reflected light, and the light intensity and main lobe power of the combined light emitted by the optical antenna are further improved.
In some embodiments, as shown in fig. 3A, convex surface 330a is an arcuate surface.
It is to be understood that the above-described arrangement of the convex surface of the non-planar surface of the metal layer as an arcuate surface is merely exemplary. Those skilled in the art will appreciate that in other embodiments, the convex surface 330a may be provided in other convex shapes, and is not limited herein.
In some embodiments, the distances between the metal layer and the plurality of antenna structures are configured such that the optical path difference of the first portion of the reflected light and the second portion of the light is an integer multiple of the wavelength of the light.
By configuring the distance between the metal layer and the plurality of antenna structures such that the optical path difference of the first portion of the reflected light and the second portion of the light is an integer multiple of the wavelength of the light, when the first portion of the reflected light interferes with the second portion of the light, the interfered light has an enhanced light intensity, further enhancing the optimizing effect of the far field amplitude distribution of the outgoing light emitted via the optical antenna.
In some embodiments, the thickness of the metal layer 330 is greater than or equal to 50nm.
With continued reference to fig. 3A-3C, according to some embodiments, each antenna structure 320 of the plurality of antenna structures 320 includes a first antenna layer 320a and a second antenna layer 320b, the first antenna layer 320a and the second antenna layer 320b facing each other in a direction perpendicular to a plane defined by the first direction and the second direction (i.e., a Z-direction), wherein a refractive index of the first antenna layer is greater than or equal to a refractive index of the second antenna layer.
By providing a second antenna layer opposite to the first antenna layer, and having a refractive index less than or equal to that of the first antenna layer, the second antenna layer has a slight disturbance to the outgoing light emitted from the first antenna layer, a longer optical antenna can be obtained, thereby improving the spot divergence angle after the light of the photosynthetic beam Cheng Geshu emitted from the optical antenna. Meanwhile, when the refractive index of the second antenna layer is smaller than that of the first antenna layer, the disturbance of the emergent light emitted by the first antenna layer is very slight, so that the requirement on the precision of the process is lower in the process of manufacturing the optical antenna. That is, with lower process accuracy, it is still possible to achieve very slight disturbance of the outgoing light emitted from the first antenna layer, so that the reliability and stability of the process manufacturing of the optical antenna can be improved.
According to some embodiments, the dielectric layer is made of a dielectric material with a lower refractive index, for example, silicon dioxide or the like; the first antenna layer is made of a material with high refractive index, for example, silicon or the like; the second antenna layer is made of a material with a refractive index lower than or equal to that of the first antenna layer and higher than that of the dielectric layer, such as silicon nitride, polysilicon and the like.
In some embodiments, as shown in fig. 3C, the second antenna layer 320b includes a plurality of grating structures periodically arranged along the second direction.
According to some embodiments, as shown in fig. 3C, the projection of each of the plurality of grating structures onto the first antenna layer 320a exceeds the footprint of the first antenna layer 320a in a first direction.
According to other embodiments, as shown in fig. 3A-3C, by controlling the distance D between the grating structure and the first antenna layer 320a, the width W of the grating structure, and the length L of the grating structure, the disturbance of the outgoing light emitted by the first antenna layer by the second antenna layer may be further reduced to control the coupling strength, thereby further improving the spot divergence angle after the light of the optical beam Cheng Geshu emitted from the optical antenna.
Fig. 4A is a schematic diagram of far-field amplitude distribution of outgoing light emitted in an optical antenna employing an antenna structure including a first antenna layer and a second antenna layer and not provided with a metal layer in a dielectric layer according to the related art, fig. 4B is a schematic diagram of far-field amplitude distribution of outgoing light emitted in an optical antenna employing an antenna structure including a first antenna layer and a second antenna layer and provided with a metal layer having a flat surface in a dielectric layer according to the related art, and fig. 4C is a schematic diagram of far-field amplitude distribution of outgoing light emitted in an optical antenna 300 according to an embodiment of the present disclosure.
As shown in fig. 4A, for an optical antenna employing an antenna structure including a first antenna layer and a second antenna layer and not having a metal layer provided in a dielectric layer, the outgoing light has a larger light intensity in a smaller scanning angle range. As shown in fig. 4B, for an optical antenna employing an antenna structure including a first antenna layer and a second antenna layer and having a metal layer with a flat surface provided in a dielectric layer, the outgoing light has a large light intensity in a large scanning angle range, but takes a split shape so that there is a large loss in a central region (extending from 0 ° to both sides) of the main lobe scanning region. As shown in fig. 4C, with the optical antenna 300 according to the embodiment of the present disclosure, the far-field amplitude of the outgoing light does not appear split-like, and the far-field amplitude distribution appears to have a strong light intensity over a large scanning angle range.
It will be appreciated that in some embodiments, certain features of the optical antenna 100 described above with respect to fig. 1A-1C and certain features of the optical antenna 300 described with respect to fig. 3A-3C may be combined with one another without conflict. For example, antenna structure 120 in optical antenna 100 may be replaced with antenna structure 320 in optical antenna 300. For another example, the metal layer 130 in the optical antenna 100 may be replaced with the metal layer 330 in the optical antenna 300.
According to another aspect of the present disclosure, there is also provided an optical phased array chip including the optical antenna as described above.
According to another aspect of the present disclosure, there is provided a method of manufacturing an optical antenna, by which an optical antenna manufactured by the manufacturing method, a metal layer is provided in a dielectric layer, and the metal layer has a non-flat surface facing an antenna structure, far-field amplitude distribution of outgoing light emitted via the optical antenna, outgoing main lobe power, and utilization ratio of outgoing light can be optimized. Meanwhile, the method of manufacturing an optical antenna according to the present disclosure may integrate a MEMS manufacturing process.
Fig. 5 illustrates a flow chart of a method 500 of manufacturing an optical antenna according to some embodiments of the present disclosure. Fig. 6A-6E illustrate schematic cross-sectional structures of semiconductor devices obtained using the method 500 according to some embodiments. Fig. 7 illustrates a flow chart of a process for forming a second dielectric layer embedded with a metal layer in a method 500 according to some embodiments.
As shown in fig. 5, the method 500 includes:
step S510: providing a semiconductor-on-insulator substrate, wherein the semiconductor-on-insulator substrate comprises a first dielectric layer and a semiconductor layer which are stacked with each other;
Step S520: forming a plurality of antenna structures at least by performing a patterning process on the semiconductor layer, the plurality of antenna structures being spaced apart from each other in a first direction, each of the plurality of antenna structures extending along a second direction intersecting the first direction; and
step S530: forming a second dielectric layer embedded with a metal layer, the second dielectric layer encapsulating the plurality of antenna structures with the first dielectric layer, wherein the metal layer has a non-planar surface facing the plurality of antenna structures such that a first portion of light propagating in each of the plurality of antenna structures that is emitted toward the metal layer is reflected by the non-planar surface and interferes with a second portion of light emitted from the metal layer that is directed away from the light.
In step S510, as shown in fig. 6A, a semiconductor-on-insulator substrate 600 is provided, wherein the semiconductor substrate 600 includes a first dielectric layer 620 and a semiconductor layer 630 stacked on the dielectric layer. In some embodiments, the semiconductor substrate 600 further includes a supporting substrate layer 610, wherein the first dielectric layer 620 and the semiconductor layer 630 are sequentially stacked on the substrate layer 610.
According to some embodiments, the dielectric layer is made of a dielectric material with a lower refractive index, such as silicon dioxide.
According to some embodiments, the material of the antenna structure is a material with a higher refractive index, e.g. silicon or the like.
According to some embodiments, the semiconductor-on-insulator substrate comprises a silicon-on-insulator substrate, such as an SOI chip or SOG chip, or the like.
It is to be understood that the semiconductor-on-insulator substrate may be a semiconductor substrate in which a chip or a device is formed, or may be a semiconductor substrate in which a chip is not formed, without limitation.
In some embodiments, in step S520, a plurality of antenna structures having the structure of the plurality of antenna structures in the optical antenna described in connection with fig. 1A-1C are formed at least by performing a patterning process on the semiconductor layer 630 on the semiconductor substrate 600. Wherein the plurality of antenna structures are spaced apart from each other in a first direction, each of the plurality of antenna structures extends along a second direction perpendicular to the first direction, and each of the plurality of antenna structures includes a body portion extending along the second direction and a plurality of protruding portions protruding from the body portion in a direction parallel to a plane defined by the first direction and the second direction, the plurality of protruding portions being periodically arranged along the second direction.
In some embodiments, as shown in fig. 6B, a plurality of antenna structures 630a are formed by performing a patterning process on the semiconductor layer 630. The patterning process includes photolithography, etching processes, etc., which are well known to those skilled in the art and will not be described in detail herein.
According to some embodiments, as shown in fig. 7, forming a second dielectric layer embedded with a metal layer in step S530 includes:
step S710: forming a first cover layer covering the first dielectric layer and the plurality of antenna structures, wherein a plurality of portions of the first cover layer opposite to the plurality of antenna structures protrude upwards;
step S720: forming the metal layer at least partially covering the first cover layer; and
step S730: and forming a second covering layer for covering the metal layer, wherein the first covering layer and the second covering layer form the second dielectric layer.
In step S710, as shown in fig. 6C, a first cover layer 621 is formed covering the first dielectric layer 620 and the plurality of antenna structures 620 a. Since the surfaces of the plurality of antenna structures 620a are higher than the surfaces of the first dielectric layer 620, portions of the first cover layer 620 opposite to the plurality of antenna structures 620a protrude upward. In some embodiments, the first cover layer 621 uses the same material layer as the first dielectric layer. According to some embodiments, the first dielectric layer 620 is a silicon oxide layer and the first capping layer 621 is a silicon oxide layer. According to some embodiments, the method of forming the first cover layer 621 includes, but is not limited to, chemical vapor deposition, physical vapor deposition, and the like.
In step S720, as shown in fig. 6D, a metal layer 640 is formed to cover the first cover layer 621. According to some embodiments, the metal layer 640 is made of titanium nitride, aluminum, copper, gold, or other materials with high reflectivity. According to some embodiments, methods of forming metal layer 640 include, but are not limited to, sputter deposition, and the like.
In step S730, as shown in fig. 6E, a second cover layer 622 is formed to cover the metal layer 640. In some embodiments, the second cover layer 622 uses the same material layer as the first cover layer 621 and the first dielectric layer, so that the second dielectric layer formed by the first cover layer 621 and the second cover layer 622 together covers the antenna structure 620a together with the first dielectric layer 620. According to some embodiments, the first dielectric layer 620 is a silicon oxide layer, the first capping layer 621 is a silicon oxide layer, and the second capping layer 622 is a silicon oxide layer. According to some embodiments, the method of forming the second capping layer 622 includes, but is not limited to, forming a second capping material layer using a deposition process, and performing a planarization process on the second capping material layer through a polishing process to form the second capping layer 624. According to some embodiments, the deposition process includes, but is not limited to, chemical vapor deposition, physical vapor deposition, and the like, without limitation. According to some embodiments, the polishing process includes, but is not limited to, chemical mechanical polishing, and the like.
According to some embodiments, after step S530 is completed, further including providing a semiconductor substrate with a device formed thereon, and completing the fabrication of the optical antenna by bonding the semiconductor substrate with a surface of the second dielectric layer and then releasing the supporting substrate layer 610.
Fig. 8A-8I illustrate schematic cross-sectional structures of semiconductor devices obtained using the method 500 according to some embodiments. Fig. 9 illustrates a flow chart of a process of forming a plurality of antenna structures in a method 500 according to some embodiments. Fig. 10 illustrates a flow chart of a process for forming a second dielectric layer embedded with a metal layer in a method 500 according to some embodiments.
In step S510, as shown in fig. 8A, a semiconductor-on-insulator substrate 800 is provided, wherein the semiconductor substrate 800 includes a first dielectric layer 820 and a semiconductor layer 830 stacked on the dielectric layer. In some embodiments, the semiconductor substrate 800 further includes a supporting substrate layer 810, wherein the first dielectric layer 820 and the semiconductor layer 830 are sequentially stacked on the substrate layer 810.
According to some embodiments, the dielectric layer is made of a dielectric material with a lower refractive index, such as silicon dioxide.
According to some embodiments, the material of the antenna structure is a material with a higher refractive index, e.g. silicon or the like.
According to some embodiments, the semiconductor-on-insulator substrate comprises a silicon-on-insulator substrate, such as an SOI substrate or an SOG substrate, or the like.
In some embodiments, in step S520, a plurality of antenna structures having the structure of the plurality of antenna structures in the optical antenna described in connection with fig. 3A-3C are formed at least by performing a patterning process on the semiconductor layer 830 on the semiconductor substrate 800. Wherein each antenna structure of the plurality of antenna structures includes a first antenna layer and a second antenna layer.
Step S520 of forming the plurality of antenna structures is shown in fig. 9. Referring to fig. 9, step S520 includes:
step S910: forming a plurality of first antenna layers spaced apart from each other in the first direction by performing a patterning process on the semiconductor layer;
step S920: forming a first capping layer that covers the first dielectric layer and the plurality of first antenna layers; and
step S930: and forming a plurality of second antenna layers on the first cover layer, wherein each second antenna layer is opposite to each first antenna layer in a direction perpendicular to a plane defined by the first direction and the second direction, and the refractive index of the first antenna layer is larger than or equal to that of the second antenna layer.
In step S910, as shown in fig. 8B, a plurality of first antenna layers 830a spaced apart from each other in a first direction are formed by performing patterning process on the semiconductor layer 830. The patterning process includes photolithography, etching processes, etc., which are well known to those skilled in the art and will not be described in detail herein.
In step S920, as shown in fig. 8C, a first cover layer 821 covering the first dielectric layer 820 and the plurality of first antenna layers 830a is formed. In some embodiments, first cover layer 821 is the same material layer as first dielectric layer 820. According to some embodiments, first dielectric layer 820 is a silicon oxide layer and first capping layer 821 is a silicon oxide layer. According to some embodiments, a method of forming the first cover layer 821 includes, but is not limited to, forming a first cover material layer using a deposition process, and performing a planarization process on the first cover material layer through a grinding process to form the first cover layer 821. According to some embodiments, the deposition process includes, but is not limited to, chemical vapor deposition, physical vapor deposition, and the like, without limitation. According to some embodiments, the polishing process includes, but is not limited to, chemical mechanical polishing, and the like.
In step S930, as shown in fig. 8D, a plurality of second antenna layers 831 are formed on the first cover layer 821, each second antenna layer 831 is opposite to each first antenna 821 layer in a direction perpendicular to a plane defined by the first direction and the second direction, and the refractive index of the first antenna layer 830a is greater than or equal to the refractive index of the second antenna layer 831.
According to some embodiments, the dielectric layer is made of a dielectric material with a lower refractive index, for example, silicon dioxide or the like; the first antenna layer is made of a material with high refractive index, for example, silicon or the like; the second antenna layer is made of a material with a refractive index lower than or equal to that of the first antenna layer and higher than that of the dielectric layer, such as silicon nitride, polysilicon and the like.
According to some embodiments, the method of forming the plurality of second antenna layers 831 on the first cover layer 821 includes, but is not limited to, forming a second antenna material layer using a deposition process, performing a planarization process on the second antenna material layer through a grinding process, and then forming the plurality of second antenna layers 831 through a patterning process. According to some embodiments, the deposition process includes, but is not limited to, chemical vapor deposition, physical vapor deposition, and the like, without limitation. According to some embodiments, the polishing process includes, but is not limited to, chemical mechanical polishing, and the like. According to some embodiments, the patterning process includes photolithography, etching processes, and the like.
In some embodiments, in the above step S520, by controlling the distance between the plurality of second antenna layers 831 and the first antenna layer 830a, and the width and length of each second antenna layer 831 in the plurality of second antenna layers 831, the coupling strength between the plurality of second antenna layers 831 can be controlled, the disturbance of the outgoing light emitted from the first antenna layer by the second antenna layer can be improved, and the spot divergence angle after the light of the photosynthetic beam Cheng Geshu emitted from the optical antenna can be further improved.
Step S530 of forming a second dielectric layer embedded with a metal layer is shown in fig. 10. Referring to fig. 10, step S530 includes:
step S1010: forming a second cover layer covering the first cover layer and the plurality of second antenna layers;
step S1020: performing a patterning process on the second cover layer to form a plurality of ridge bars spaced apart from each other in the first direction, each two adjacent ridge bars of the plurality of ridge bars being located over both sides of a corresponding one of the plurality of second antenna layers;
step S1030: forming a third cover layer on the patterned second cover layer, wherein the third cover layer comprises a plurality of protruding parts which respectively correspond to the plurality of ridge stripes;
step S1040: forming the metal layer at least partially covering the third cover layer; and
step S1050: and forming a fourth cover layer for covering the metal layer, wherein the first cover layer, the second cover layer, the third cover layer and the fourth cover layer form the second dielectric layer.
In step S1010, as shown in fig. 8E, a second cover layer 822 is formed to cover the first cover layer 821 and the plurality of second antenna layers 831. In some embodiments, the second cladding layer 822 is the same material layer as the first cladding layer 821 and the first dielectric layer 820. According to some embodiments, the first dielectric layer 820 is a silicon oxide layer, the first capping layer 821 is a silicon oxide layer, and the second capping layer 822 is a silicon oxide layer. According to some embodiments, the method of forming the second cover layer 822 includes, but is not limited to, forming a second cover material layer using a deposition process, and performing a planarization process on the second cover material layer through a polishing process to form the second cover layer 822. According to some embodiments, the deposition process includes, but is not limited to, chemical vapor deposition, physical vapor deposition, and the like, without limitation. According to some embodiments, the polishing process includes, but is not limited to, chemical mechanical polishing, and the like.
In step S1020, as shown in fig. 8F, a patterning process is performed on the second cover layer 822 to form a plurality of ridge stripes 822a spaced apart from each other in the first direction. Each two adjacent ridges 822a of the plurality of ridges 822a are located over both sides of a corresponding one of the plurality of second antenna layers 831.
In step S1030, as shown in fig. 8G, a third cover layer 823 is formed on the patterned second cover layer 822, the third cover layer 823 including a plurality of protruding portions corresponding to the plurality of ridge stripes 822a, respectively. Since the surfaces of the plurality of ridge stripes 822a are higher than the surfaces of other areas of the second cover layer 822, portions opposite to the plurality of ridge stripes 822a protrude upward to form protrusions, so that portions of the third cover layer 823 opposite to the plurality of antenna structures 820a are recessed downward. In some embodiments, the third cover layer 823 is the same material layer as the second cover layer 822, the first cover layer 821, and the first dielectric layer 820. According to some embodiments, the first dielectric layer 820 is a silicon oxide layer, the first cover layer 821 is a silicon oxide layer, the second cover layer 822 is a silicon oxide layer, and the third cover layer 823 is a silicon oxide layer. According to some embodiments, methods of forming the third cover layer 823 include, but are not limited to, chemical vapor deposition, physical vapor deposition, and the like.
In step S1040, as shown in fig. 8H, a metal layer 840 is formed to at least partially cover the third cover layer 823. According to some embodiments, the metal layer 840 is made of titanium nitride, aluminum, copper, gold, or other materials with high reflectivity. According to some embodiments, methods of forming metal layer 840 include, but are not limited to, sputter deposition, and the like.
In step S1050, as shown in fig. 8I, a fourth capping layer 824 is formed that covers the metal layer 840. In some embodiments, the fourth cover layer 824 and the third cover layer 823, the second cover layer 822, the first cover layer 821 and the first dielectric layer 820 use the same material layer, so that the second dielectric layer formed by the fourth cover layer 824 and the third cover layer 823, the second cover layer 822 and the first cover layer 821 together cover the antenna structure (including the first antenna layer 830a and the second antenna layer 831) together with the first dielectric layer 820. According to some embodiments, the first dielectric layer 820 is a silicon oxide layer, the first cover layer 821 is a silicon oxide layer, the second cover layer 822 is a silicon oxide layer, the third cover layer 823 is a silicon oxide layer, and the fourth cover layer 824 is a silicon oxide layer. According to some embodiments, the method of forming the fourth capping layer 824 includes, but is not limited to, forming a fourth capping material layer using a deposition process, and performing a planarization process on the fourth capping material layer through a polishing process to form the fourth capping layer 824. According to some embodiments, the deposition process includes, but is not limited to, chemical vapor deposition, physical vapor deposition, and the like, without limitation. According to some embodiments, the polishing process includes, but is not limited to, chemical mechanical polishing, and the like.
According to some embodiments, after step S530 is completed, the semiconductor substrate with the device formed therein is bonded to the surface of the second dielectric layer, and then the supporting substrate layer 810 is released, completing the fabrication of the optical antenna.
While the disclosure has been illustrated and described in detail in the drawings and foregoing description, such illustration and description are to be considered illustrative and schematic and not restrictive; the present disclosure is not limited to the disclosed embodiments. Variations to the disclosed embodiments can be understood and effected by those skilled in the art in practicing the claimed subject matter, from a study of the drawings, the disclosure, and the appended claims. In the claims, the word "comprising" does not exclude other elements or steps than those listed and the indefinite article "a" or "an" does not exclude a plurality, and the term "plurality" means two or more. The mere fact that certain measures are recited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to advantage.

Claims (15)

1. An optical antenna, comprising:
a dielectric layer;
a plurality of antenna structures located in the dielectric layer and spaced apart from each other in a first direction, each of the plurality of antenna structures extending along a second direction that intersects the first direction; and
A metal layer located in the dielectric layer opposite the plurality of antenna structures and extending along the second direction,
wherein the metal layer has a non-planar surface facing the plurality of antenna structures such that a first portion of light propagating in each of the plurality of antenna structures that exits facing the metal layer is reflected by the non-planar surface and interferes with a second portion of the light that exits facing away from the metal layer.
2. The optical antenna of claim 1, wherein the non-planar surface of the metal layer has a configuration selected from the group consisting of:
the non-planar surface includes a plurality of concavities juxtaposed along the first direction, wherein each concavity of the plurality of concavities extends along the second direction and is respectively opposite each antenna structure of the plurality of antenna structures; and
the non-planar surface includes a plurality of convex surfaces juxtaposed along the first direction, wherein each of the plurality of convex surfaces extends along the second direction and is respectively opposite each of the plurality of antenna structures.
3. The optical antenna of claim 2, wherein each of the plurality of concave surfaces and each of the plurality of convex surfaces is an arcuate surface.
4. The optical antenna of claim 3, wherein the radius of curvature of the arcuate surface is greater than 314nm.
5. The optical antenna of claim 1, wherein a distance between the metal layer and the plurality of antenna structures is configured such that an optical path difference of the first portion of the reflected light and the second portion of the light is an integer multiple of a wavelength of the light.
6. The optical antenna of claim 1, wherein each of the plurality of antenna structures comprises a body portion extending along the second direction and a plurality of protruding portions protruding from the body portion in a direction parallel to a plane defined by the first direction and the second direction, the plurality of protruding portions being periodically arranged along the second direction.
7. The optical antenna of claim 1, wherein each of the plurality of antenna structures comprises a first antenna layer and a second antenna layer facing each other in a direction perpendicular to a plane defined by the first and second directions, wherein a refractive index of the first antenna layer is greater than or equal to a refractive index of the second antenna layer.
8. The optical antenna of claim 7, wherein the second antenna layer comprises a plurality of grating structures periodically arranged along the second direction.
9. The optical antenna of claim 8, wherein a projection of each grating structure of the plurality of grating structures onto the first antenna layer exceeds an footprint of the first antenna layer in the first direction.
10. The optical antenna of any one of claims 1-9, wherein the metal layer comprises at least one selected from the group consisting of: titanium nitride, aluminum, copper, and gold.
11. The optical antenna according to any one of claims 1 to 9, wherein a thickness of the metal layer is 50nm or more.
12. An optical phased array chip comprising the optical antenna of any of claims 1-11.
13. A method of manufacturing an optical antenna, comprising:
providing a semiconductor-on-insulator substrate, wherein the semiconductor-on-insulator substrate comprises a first dielectric layer and a semiconductor layer which are stacked with each other;
forming a plurality of antenna structures at least by performing a patterning process on the semiconductor layer, the plurality of antenna structures being spaced apart from each other in a first direction, each of the plurality of antenna structures extending along a second direction intersecting the first direction; and
Forming a second dielectric layer embedded with a metal layer, the second dielectric layer encapsulating the plurality of antenna structures with the first dielectric layer, wherein the metal layer has a non-planar surface facing the plurality of antenna structures such that a first portion of light propagating in each of the plurality of antenna structures that is emitted toward the metal layer is reflected by the non-planar surface and interferes with a second portion of the light that is emitted away from the metal layer.
14. The method of claim 13, wherein the forming a second dielectric layer embedded with a metal layer comprises:
forming a first cover layer covering the first dielectric layer and the plurality of antenna structures, wherein a plurality of portions of the first cover layer opposite to the plurality of antenna structures protrude upwards;
forming the metal layer at least partially covering the first cover layer; and
and forming a second covering layer for covering the metal layer, wherein the first covering layer and the second covering layer form the second dielectric layer.
15. The method of claim 13, wherein each of the plurality of antenna structures comprises a first antenna layer and a second antenna layer,
Wherein the forming a plurality of antenna structures comprises:
forming a plurality of first antenna layers spaced apart from each other in the first direction by performing a patterning process on the semiconductor layer;
forming a first capping layer that covers the first dielectric layer and the plurality of first antenna layers; and
forming a plurality of second antenna layers on the first cover layer, each second antenna layer being opposite to each first antenna layer in a direction perpendicular to a plane defined by the first direction and the second direction, the first antenna layer having a refractive index greater than or equal to that of the second antenna layer, an
Wherein, the forming the second dielectric layer embedded with the metal layer comprises:
forming a second cover layer covering the first cover layer and the plurality of second antenna layers;
performing a patterning process on the second cover layer to form a plurality of ridge bars spaced apart from each other in the first direction, each two adjacent ridge bars of the plurality of ridge bars being located over both sides of a corresponding one of the plurality of second antenna layers;
forming a third cover layer on the patterned second cover layer, wherein the third cover layer comprises a plurality of protruding parts which respectively correspond to the plurality of ridge stripes;
Forming the metal layer at least partially covering the third cover layer; and
and forming a fourth cover layer for covering the metal layer, wherein the first cover layer, the second cover layer, the third cover layer and the fourth cover layer form the second dielectric layer.
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