CN113466182A - Specular reflectivity measuring method and device for medium-caliber telescope - Google Patents
Specular reflectivity measuring method and device for medium-caliber telescope Download PDFInfo
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- CN113466182A CN113466182A CN202110735752.2A CN202110735752A CN113466182A CN 113466182 A CN113466182 A CN 113466182A CN 202110735752 A CN202110735752 A CN 202110735752A CN 113466182 A CN113466182 A CN 113466182A
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N2021/557—Detecting specular reflective parts on sample
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Abstract
An energy emission subsystem generates emitted light and respectively emits the emitted light to an energy collection subsystem and a measured mirror surface of a telescope, the energy collection subsystem receives the emitted light and reflected light returned after the emitted light is emitted by the measured mirror surface and respectively converts the emitted light and the reflected light into second image data and first image data, and an electric control subsystem determines the reflectivity of the measured mirror surface according to gray values corresponding to the first image data and the second image data.
Description
Technical Field
The invention relates to the technical field of optical device parameter measurement, in particular to a method and a device for measuring the specular reflectivity of a medium-caliber telescope.
Background
The ground-based optical telescope is widely applied to the fields of astronomical observation, aerospace measurement and control, satellite navigation and the like. The performance of the mirror reflectivity of the telescope directly influences the detection capability of the telescope, and the mirror surface of the telescope is coated according to requirements so as to improve the reflectivity of the telescope in a use waveband. The current telescope specular reflectivity measurement mainly adopts the following two modes:
(1) reflectance measurements based on a spectrophotometer. According to the method, the incident light and the reflected light are measured simultaneously after the light source is split, the measuring speed is high, the precision is high, the measuring precision can reach 0.1%, but the mirror surface of the tested telescope needs to be fixed on the test board, the direction of the mirror surface is fixed, the whole test system needs to be ensured to be in a state without stray light interference, factors such as project progress are considered, and the reflectivity measurement is finished by often selecting a mode of replacing the mirror surface of the telescope with a plating film, so that the method is only suitable for the reflectivity measurement of small-size mirror surfaces under laboratory conditions, and the requirement of an external field on the measurement of the reflectivity of the mirror surface of the assembled telescope is difficult to meet;
(2) the personnel visually inspect. After the telescope is deployed in an external field for a long time, the mirror surface exposed in the atmosphere is easy to cause the reduction of the reflection performance due to the attachment of dust, bird droppings or the falling of a film layer, so that the detection capability of the telescope is deteriorated.
Disclosure of Invention
The invention mainly solves the technical problem of providing a method and a device for measuring the specular reflectivity of a medium-caliber telescope, and solves the problem that the specular reflectivity of the telescope cannot be accurately measured when the telescope is used in an external field.
According to a first aspect, there is provided in an embodiment a specular reflectance measurement apparatus for a medium aperture telescope, comprising:
the energy emission subsystem is used for generating emitted light with preset wavelength and emitting the emitted light to the energy collection subsystem;
the energy acquisition subsystem is used for receiving the emitted light, converting the emitted light into second image data and outputting the second image data;
the energy emission subsystem is also used for emitting the emission light with preset wavelength to a measured mirror surface of the telescope;
the energy acquisition subsystem is also used for receiving reflected light returned after the emitted light is reflected by the measured mirror surface, converting the reflected light into first image data and outputting the first image data;
and the electronic control subsystem is used for receiving the first image data and the second image data, determining a gray value corresponding to the first image data and a gray value corresponding to the second image data, and determining the reflectivity of the measured mirror to the emitted light with the preset wavelength according to the gray value corresponding to the first image data and the gray value corresponding to the second image data.
In one embodiment, the electronic control subsystem is further configured to:
controlling an energy emergence subsystem to generate emitted light with a preset wavelength and position information of the energy emergence subsystem and an energy collection subsystem, wherein the position information comprises a pitching angle and a direction angle;
setting camera parameters in the energy collection subsystem to enable the camera parameters to collect image data, wherein the image data comprises first image data and second image data.
In one embodiment, the energy extraction subsystem comprises:
the focal plane assembly is used for generating emitted light with preset wavelength and emitting the emitted light;
the collimation component is used for adjusting the emission direction of the emitted light so that the emitted light is emitted according to a preset light path;
the first two-dimensional adjusting assembly is arranged at the bottom of the collimation assembly and used for adjusting the position information of the collimation assembly, and the position information comprises a pitching angle and an azimuth angle.
In an embodiment, determining the reflectivity of the measured mirror to the emitted light with the preset wavelength according to the gray scale value corresponding to the first image data and the gray scale value corresponding to the second image data includes:
determining the energy value of the emitted light according to the gray value corresponding to the second image data;
determining the energy value of the reflected light according to the gray value corresponding to the first image data;
and determining the reflectivity of the measured mirror surface to the light with the preset wavelength according to the energy value of the emitted light and the energy value of the reflected light.
In one embodiment, the energy harvesting subsystem comprises:
an imaging lens for receiving incident light and focusing the incident light to a COMS camera, the incident light including the emitted light and/or the reflected light;
the CMOS camera is used for imaging the incident light focused by the imaging lens to obtain image data, and the image data comprises first image data and/or second image data.
In one embodiment, the energy exit sub-system further comprises:
the power supply module is used for supplying power to the focal plane assembly, the collimation assembly and the first two-dimensional adjusting assembly;
a first support frame for supporting the energy extraction sub-system.
In one embodiment, the energy harvesting subsystem further comprises:
the second two-dimensional adjusting assembly is arranged at the bottom of the imaging lens and used for adjusting the position information of the imaging lens, and the position information comprises a pitching angle and an azimuth angle;
and the second support frame is used for supporting the energy collection subsystem.
In one embodiment, the specular reflectance measurement device further includes:
the first shell comprises a first upper shell and a first lower shell, and the first upper shell and the first lower shell are installed in a matching mode to form a closed cavity;
the first window is arranged on the end face of the first shell;
the focal plane assembly is arranged in a cavity in the first shell and comprises a light source and a star point target, the light source is connected with the star point target, the light source is used for generating emitting light with preset wavelength, and the emitting light is emitted to the collimation assembly through the star point target;
the collimating assembly is arranged in a cavity in the first shell and comprises a lens barrel seat, a lens barrel, a collimator and an adjustable diaphragm, the lens barrel is fixed on the first shell, the lens barrel is arranged on the lens barrel seat, the collimator is arranged in the cavity in the lens barrel, one end face of the lens barrel is connected with the focal plane assembly, the other end face of the lens barrel is connected with the adjustable diaphragm, the emitted light forms parallel light beams after passing through the collimator in the lens barrel, and the parallel light beams are emitted through a first window in the end face of the shell after passing through the adjustable diaphragm;
the second shell comprises a second upper shell and a second lower shell, and the second upper shell and the second lower shell are installed in a matched mode to form a closed cavity;
the second window is arranged on the end face of the second shell;
the imaging lens and the CMOS camera are arranged in a cavity in the second shell, and the imaging lens is connected with the CMOS camera;
the imaging lens receives incident light through a second window on the end face of the second shell and focuses the incident light to the COMS camera.
According to a second aspect, there is provided in an embodiment a specular reflectance measurement method for a medium aperture telescope, comprising:
the energy emission subsystem generates emitted light with preset wavelength and emits the emitted light to the energy collection subsystem;
the energy collection subsystem receives the emitted light, converts the emitted light into second image data and outputs the second image data;
the energy emission subsystem emits the emission light with preset wavelength to a measured mirror surface of the telescope;
the energy collection subsystem receives reflected light returned after the emitted light is reflected by the measured mirror surface, converts the reflected light into first image data and outputs the first image data;
the electronic control subsystem receives the first image data and the second image data, determines a gray value corresponding to the first image data and a gray value corresponding to the second image data, and determines the reflectivity of the measured mirror to the emitted light with the preset wavelength according to the gray value corresponding to the first image data and the gray value corresponding to the second image data.
In an embodiment, determining the reflectivity of the measured mirror to the emitted light with the preset wavelength according to the gray scale value corresponding to the first image data and the gray scale value corresponding to the second image data includes:
determining the energy value of the emitted light according to the gray value corresponding to the second image data;
determining the energy value of the reflected light according to the gray value corresponding to the first image data;
and determining the reflectivity of the measured mirror surface to the light with the preset wavelength according to the energy value of the emitted light and the energy value of the reflected light.
According to the mirror reflectivity measuring method and device for the medium-caliber telescope, the energy emission subsystem generates the emitted light and respectively emits the emitted light to the energy collection subsystem and the measured mirror surface of the telescope, the energy collection subsystem receives the reflected light which is returned after the emitted light and the emitted light are emitted by the measured mirror surface and respectively converts the emitted light and the reflected light into the second image data and the first image data, and the electronic control subsystem determines the reflectivity of the measured mirror surface according to the gray values corresponding to the first image data and the second image data.
Drawings
FIG. 1 is a schematic structural diagram of a specular reflectivity measurement mechanism for a medium aperture telescope according to an embodiment;
FIG. 2 is a schematic structural diagram of a specular reflectivity measurement mechanism for a medium aperture telescope according to an embodiment;
FIG. 3 is a schematic diagram of an embodiment of an energy extraction subsystem;
FIG. 4 is a schematic diagram of an embodiment of an energy harvesting subsystem;
FIG. 5 is a schematic structural diagram of a device for measuring the reflectivity of a measured mirror surface and a mirror surface of a medium-caliber telescope.
Detailed Description
The present invention will be described in further detail with reference to the following detailed description and accompanying drawings. Wherein like elements in different embodiments are numbered with like associated elements. In the following description, numerous details are set forth in order to provide a better understanding of the present application. However, those skilled in the art will readily recognize that some of the features may be omitted or replaced with other elements, materials, methods in different instances. In some instances, certain operations related to the present application have not been shown or described in detail in order to avoid obscuring the core of the present application from excessive description, and it is not necessary for those skilled in the art to describe these operations in detail, so that they may be fully understood from the description in the specification and the general knowledge in the art.
Furthermore, the features, operations, or characteristics described in the specification may be combined in any suitable manner to form various embodiments. Also, the various steps or actions in the method descriptions may be transposed or transposed in order, as will be apparent to one of ordinary skill in the art. Thus, the various sequences in the specification and drawings are for the purpose of describing certain embodiments only and are not intended to imply a required sequence unless otherwise indicated where such sequence must be followed.
The numbering of the components as such, e.g., "first", "second", etc., is used herein only to distinguish the objects as described, and does not have any sequential or technical meaning. The term "connected" and "coupled" when used in this application, unless otherwise indicated, includes both direct and indirect connections (couplings).
Referring to fig. 1, fig. 1 is a schematic structural diagram of a specular reflectivity measuring apparatus for a medium-aperture telescope according to an embodiment, the specular reflectivity measuring apparatus includes: an energy emission subsystem 10, an energy collection subsystem 20 and an electronic control subsystem 30.
The energy emission subsystem 10 is used for generating the emission light with a predetermined wavelength and emitting the emission light to the energy collection subsystem 20.
The energy extraction subsystem 10 is used to emit radiation of a predetermined wavelength onto the measured mirror surface 40 of the telescope.
In the embodiment, the wavelength of the emitted light generated by the energy emission subsystem is within a wavelength range of 400nm to 1000nm, and the emitted light may sequentially emit wavelengths within a wavelength range of 400nm to 1000nm at equal intervals, for example, the emitted light with corresponding wavelengths is generated every 50nm starting from 400 nm.
The energy emission subsystem 10 in this embodiment includes a focal plane assembly 101, a collimating assembly 102, and a first two-dimensional adjusting assembly, wherein:
the focal plane assembly 101 is used for generating the emitted light with the preset wavelength and emitting the emitted light. In this embodiment, the focal plane assembly 101 provides illumination and a target for the collimation assembly, and the focal plane assembly 101 includes a tungsten halogen lamp light source in combination with a bandpass filter and a star point target. The light source is composed of a halogen tungsten lamp, band-pass filters with the wavelength range of 400 nm-1000 nm and the interval of 50nm, the filters are arranged on a switching wheel inside the light source box to be automatically switched, monochromatic emission light with different preset wavelengths can be provided through the switching filters, and then the monochromatic emission light with different wavelengths is obtained by coupling the light source to an optical fiber and irradiating a star point target.
The collimating assembly 102 is used for adjusting the emitting direction of the emitted light so that the emitted light is emitted according to a predetermined light path. In this embodiment, the collimating assembly 102 includes a collimator and an adjustable diaphragm, and the emitted light emitted by the focal plane assembly passes through the collimator to obtain parallel light, and the diameter of the parallel light beam is adjusted by the adjustable diaphragm.
The first two-dimensional adjusting assembly is arranged at the bottom of the collimation assembly and used for adjusting the position information of the collimation assembly, wherein the position information comprises a pitching angle and an azimuth angle. First two-dimensional adjusting part is used for adjusting the every single move angle and the position angle of alignment subassembly, and indirectly, it can divide the emission of energy outgoing subsystem the every single move angle and the position angle of emission light carry out coarse adjustment, cooperate with the fine tuning of collimation subassembly 102 to promote energy outgoing subsystem emission the accuracy of emission light.
In addition, the energy emergence subsystem that this embodiment provided still includes: the power supply module is used for supplying power to the focal plane assembly, the collimation assembly and the first two-dimensional adjusting assembly; the first support frame is used for supporting the energy emergent subsystem and can adjust the corresponding height according to actual requirements.
In this embodiment, in order to improve the accuracy of the light collected by the energy collection subsystem, the energy emission subsystem projects an infinitely distant star target by using the collimating optical system, and meanwhile, in order to avoid the problem that part of collimated light cannot enter the aperture of the energy collection subsystem due to factors such as large beam width and inaccurate alignment, an adjustable diaphragm is designed in front of the collimating optical system to adjust the diameter of the emergent beam, so that the beam can be ensured to enter the aperture of the energy collection subsystem more easily.
The energy collection subsystem 20 is configured to receive reflected light that is returned after the emitted light is reflected by the measured mirror surface, convert the reflected light into first image data, and output the first image data.
The energy collection subsystem 20 is further configured to receive the emitted light with the preset wavelength emitted by the energy emission subsystem 10, convert the emitted light into second image data, and output the second image data.
In an embodiment, the energy emission subsystem 10 may be controlled to sequentially emit the emitted light with a plurality of predetermined wavelengths to the energy collection subsystem 20 according to a predetermined interval, and the emitted light is directly emitted to the energy collection subsystem without being reflected by the measured mirror surface of the telescope, so as to obtain the second image data corresponding to the plurality of predetermined wavelengths. Then, the energy emission subsystem 10 is controlled to sequentially emit the emitted light with a plurality of preset wavelengths to the measured mirror surface of the telescope according to the preset interval, the reflected light of the emitted light reflected by the measured mirror surface is transmitted to the energy collection subsystem 20, and the first image data corresponding to the plurality of preset wavelengths respectively can be obtained.
In another embodiment, the energy emission subsystem 10 is controlled to emit the emitted light with a predetermined wavelength to the energy collection subsystem, and then emit the emitted light with the same predetermined wavelength to the measured mirror surface of the telescope, and the reflected light of the emitted light reflected by the measured mirror surface is transmitted to the energy collection subsystem 20. And adjusting the preset wavelength of the emitted light emitted by the energy emission subsystem at equal intervals, and repeating the operation to finally obtain the first image data and the second image data corresponding to each preset wavelength.
In the present embodiment, the energy harvesting subsystem 20 includes: an imaging lens 201 and a CMOS camera 202, wherein the imaging lens 201 is configured to receive incident light, and focus the incident light to the CMOS camera, and the incident light includes the emitted light and/or the reflected light. The CMOS camera 202 is configured to image incident light focused by the imaging lens to obtain image data, where the image data includes first image data and/or second image data.
In addition, the energy harvesting subsystem that this embodiment provided still includes: the second two-dimensional adjusting assembly is arranged at the bottom of the imaging lens and used for adjusting the position information of the imaging lens, wherein the position information comprises a pitching angle and an azimuth angle; the second support frame is used for supporting the energy acquisition subsystem.
In this embodiment, the energy collection subsystem adopts a telecentric optical lens (imaging lens) in combination with a CMOS camera, and the telecentric optical path design of the imaging lens can reduce the influence of stray light in the off-axis environment on the gray level of the collected light spots, reduce the difficulty of image data analysis, and improve the calculation accuracy of the reflectivity.
The CMOS camera comprises a photoelectric conversion detector, and incident photons can be converted into electrons on a photosensitive unit of the photoelectric conversion detector according to the working principle of the photoelectric conversion detector, and quantum efficiency QE is equal to ne/npTo express the conversion efficiency of photons to electrons, where neIs the number of electrons, npThe quantum efficiency, which is the number of photons, is determined by the imaging chip of the photoelectric conversion detector. Since the energy value of light is proportional to the number of photons, the photoelectric conversion detector converts the received photons into electrons, and the gray scale value of the output image data is proportional to the number of electrons, so the embodiment can equate the ratio of the energy values of light to the ratio of the gray scale values of the image data.
The electronic control subsystem 30 is configured to determine a gray value corresponding to the second image data and a gray value corresponding to the first image data output by the energy collection subsystem, and determine a reflectivity of the measured mirror with respect to the emitted light with the preset wavelength according to the gray value corresponding to the second image data and the gray value corresponding to the first image data.
In this embodiment, the electronic control subsystem 30 discriminates a star target (a target formed by emitted light or reflected light) in the first image data and the second image data by using a Canny operator and hough circle transformation, and extracts a target image region. And then carrying out multi-frame averaging and drying treatment on the acquired target image area to obtain the gray value of the target image area, namely the gray value corresponding to the target image area in the first image data and the gray value corresponding to the target image area in the second image data.
In an embodiment, determining the reflectivity of the measured mirror to the light with the preset wavelength according to the gray scale value corresponding to the second image data and the gray scale value corresponding to the first image data includes:
determining the energy value of the emitted light according to the gray value corresponding to the second image data; determining the energy value of the reflected light according to the gray value corresponding to the first image data; and determining the reflectivity of the measured mirror surface to the light with the preset wavelength lambda according to the energy value of the emitted light and the energy value of the reflected light.
The reflectivity of the measured mirror to the light with the preset wavelength is obtained according to the following formula:
wherein, Ii(λ) is the energy value of the emitted light of wavelength λ, Ir(λ) the energy value of the reflected light with the wavelength λ, and R (λ) the reflectance of the measured mirror for light with a predetermined wavelength.
In this embodiment, the gray-level value corresponding to the target image area in the second image data is proportional to the energy value of the emitted light, and similarly, the gray-level value corresponding to the target image area in the first image data is proportional to the energy value of the reflected light.
And finally, after the reflectivity of the measured mirror surface of the telescope is measured, the electronic control subsystem generates a measurement result report, stores the measurement result report and generates a report file in a preset format.
Aiming at the telescope assembled in the external field, no measuring instrument for the mirror reflectivity of the external field is available at the present stage, and the invention can solve the problem. The reflectivity of the mirror surface of the existing telescope is usually measured by using a spectrophotometer to measure a small-size mirror surface (a plating film) under the condition of a laboratory before assembly, and the existing telescope cannot be applied to the assembled telescope and is more difficult to support the external field environment. The invention is not only used in the field, but also can master the mirror surface reflectivity condition of the assembled telescope in real time in the earlier development process. The invention has the advantages of light weight, flexible movement and installation, small occupied area, low cost, small requirement on the external light environment and convenient use.
Referring to fig. 2, fig. 2 is a flowchart illustrating a specular reflectivity measuring method for a medium aperture telescope according to an embodiment, the specular reflectivity measuring method includes the following steps:
And 200, the energy acquisition subsystem receives the emitted light with the preset wavelength emitted by the energy emergence subsystem, converts the emitted light into second image data, and outputs the second image data to the electric control subsystem.
And 300, generating emitted light with preset wavelength by the energy outgoing subsystem, and emitting the emitted light to the measured mirror surface of the telescope.
And 500, the electric control subsystem determines a gray value corresponding to the first image data and a gray value corresponding to the second image data output by the energy collection subsystem, and determines the reflectivity of the measured mirror surface to light with a preset wavelength according to the gray value corresponding to the second image data and the gray value corresponding to the first image data.
In an embodiment, determining the reflectivity of the measured mirror to the light with the preset wavelength according to the gray scale value corresponding to the second image data and the gray scale value corresponding to the first image data includes:
determining the energy value of the emitted light according to the gray value corresponding to the second image data;
determining the energy value of the reflected light according to the gray value corresponding to the first image data;
and determining the reflectivity of the measured mirror surface to the light with the preset wavelength according to the energy value of the emitted light and the energy value of the reflected light.
It should be noted that the specular reflectance measurement method provided in this embodiment is a method corresponding to the specular reflectance measurement apparatus provided in the foregoing embodiment, and specific embodiments thereof have been described in detail in the foregoing embodiment, and are not described again here.
Referring to fig. 3 and fig. 4, fig. 3 is a schematic diagram illustrating an embodiment of an energy emission subsystem, wherein (a) in fig. 3 is a schematic diagram illustrating an external structure of the energy emission subsystem, fig. 3 (b) is a schematic diagram illustrating an internal structure of the energy emission subsystem, fig. 4 is a schematic diagram illustrating an embodiment of an energy collection subsystem, wherein (a) in fig. 4 is a schematic diagram illustrating an external structure of the energy collection subsystem, and fig. 4 (b) is a schematic diagram illustrating an internal structure of the energy collection subsystem, wherein the specular reflectivity measuring apparatus includes a first housing 301, a first window 302, a focal plane assembly 303, a collimating assembly 304, an imaging lens 305, a CMOS camera 306, a second housing 307, and a second window 308.
The first casing 301 includes a first upper casing 3011 and a first lower casing 3012, and the first upper casing 3011 and the first lower casing 3012 are mounted in a matching manner to form a sealed cavity.
The first window 302 is provided in an end surface of the first housing 301.
The focal plane assembly 303 is disposed in the cavity of the first housing 301, the focal plane assembly 303 includes a light source and a star point target, the light source is connected to the star point target, the light source is configured to generate an emitting light with a preset wavelength, and the emitting light is emitted to the collimation assembly 304 through the star point target.
The collimating assembly 304 is disposed in a cavity of the first housing 301, the collimating assembly 304 includes a lens barrel base 3041, a lens barrel 3042, a collimator and an adjustable diaphragm 3043, the lens barrel 3041 is fixed on the first housing 301, the lens barrel 3042 is mounted on the lens barrel base 3041, the collimator is disposed in the cavity of the lens barrel 3042, one end surface of the lens barrel 3042 is connected to the focal plane assembly 303, and the other end surface is connected to the adjustable diaphragm 3043, wherein the emitted light passes through the collimator in the lens barrel to form a parallel light beam, and the parallel light beam passes through the adjustable diaphragm and then 3043 and is emitted through a window on the end surface of the first housing.
The second housing 307 includes a second upper housing 3071 and a second lower housing 3072, and the second upper housing 3071 and the second lower housing 3072 are mounted in a matching manner to form a sealed cavity.
The second window 308 is provided in the end surface of the second housing 307.
The imaging lens 305 and the CMOS camera 306 are provided in cavities in the second housing 307, and the imaging lens 305 is connected to the CMOS camera 306.
The imaging lens 305 receives incident light through a second window 308 on the second housing end face and focuses the incident light to the COMS camera 306.
Because the specular reflectivity measuring device provided by the embodiment is used for the medium-caliber telescope, the difference between the height of the specular reflectivity measuring device and the height of the medium-caliber telescope is not large, the energy emergence subsystem in the first shell is supported by the first support frame, the energy collection subsystem in the second shell is supported by the second support frame, and the position information of the energy emergence subsystem and the energy collection subsystem in the specular reflectivity measuring device is adjusted by adjusting the first support frame and the second support frame. Referring to fig. 5, fig. 5 is a schematic structural diagram of the device for measuring the measured mirror surface and the mirror reflectivity of the medium-caliber telescope, wherein the first support frame 401 adjusts the position of the energy emission subsystem 403 through the first two-dimensional adjusting component 402, the second support frame 404 adjusts the position of the energy collection subsystem 406 through the second two-dimensional adjusting component 405, and the direction of the light emitted by the energy emission subsystem 403 and the direction of the incident light received by the energy collection subsystem 406 are both opposite to the measured mirror surface 407 of the telescope.
The present invention has been described in terms of specific examples, which are provided to aid understanding of the invention and are not intended to be limiting. For a person skilled in the art to which the invention pertains, several simple deductions, modifications or substitutions may be made according to the idea of the invention.
Claims (10)
1. A specular reflectance measurement device for use with a medium caliber telescope, comprising:
the energy emission subsystem is used for generating emitted light with preset wavelength and emitting the emitted light to the energy collection subsystem;
the energy acquisition subsystem is used for receiving the emitted light, converting the emitted light into second image data and outputting the second image data;
the energy emission subsystem is also used for emitting the emission light with preset wavelength to a measured mirror surface of the telescope;
the energy acquisition subsystem is also used for receiving reflected light returned after the emitted light is reflected by the measured mirror surface, converting the reflected light into first image data and outputting the first image data;
and the electronic control subsystem is used for receiving the first image data and the second image data, determining a gray value corresponding to the first image data and a gray value corresponding to the second image data, and determining the reflectivity of the measured mirror to the emitted light with the preset wavelength according to the gray value corresponding to the first image data and the gray value corresponding to the second image data.
2. The specular reflectance measurement apparatus of claim 1, wherein the electronic control subsystem is further configured to:
controlling an energy emergence subsystem to generate emitted light with a preset wavelength and position information of the energy emergence subsystem and an energy collection subsystem, wherein the position information comprises a pitching angle and a direction angle;
setting camera parameters in the energy collection subsystem to enable the camera parameters to collect image data, wherein the image data comprises first image data and second image data.
3. The specular reflectance measurement apparatus of claim 1, wherein the energy exit subsystem comprises:
the focal plane assembly is used for generating emitted light with preset wavelength and emitting the emitted light;
the collimation component is used for adjusting the emission direction of the emitted light so that the emitted light is emitted according to a preset light path;
the first two-dimensional adjusting assembly is arranged at the bottom of the collimation assembly and used for adjusting the position information of the collimation assembly, and the position information comprises a pitching angle and an azimuth angle.
4. The specular reflectance measurement apparatus according to claim 1, wherein determining the reflectance of the measured mirror with respect to the emitted light of the predetermined wavelength based on the gray scale value corresponding to the first image data and the gray scale value corresponding to the second image data comprises:
determining the energy value of the emitted light according to the gray value corresponding to the second image data;
determining the energy value of the reflected light according to the gray value corresponding to the first image data;
and determining the reflectivity of the measured mirror surface to the light with the preset wavelength according to the energy value of the emitted light and the energy value of the reflected light.
5. The specular reflectance measurement apparatus of claim 3, wherein the energy harvesting subsystem comprises:
an imaging lens for receiving incident light and focusing the incident light to a COMS camera, the incident light including the emitted light and/or the reflected light;
the CMOS camera is used for imaging the incident light focused by the imaging lens to obtain image data, and the image data comprises first image data and/or second image data.
6. The specular reflectance measurement apparatus of claim 3, wherein the energy exit subsystem further comprises:
the power supply module is used for supplying power to the focal plane assembly, the collimation assembly and the first two-dimensional adjusting assembly;
a first support frame for supporting the energy extraction sub-system.
7. The specular reflectance measurement apparatus of claim 5, wherein the energy harvesting subsystem further comprises:
the second two-dimensional adjusting assembly is arranged at the bottom of the imaging lens and used for adjusting the position information of the imaging lens, and the position information comprises a pitching angle and an azimuth angle;
and the second support frame is used for supporting the energy collection subsystem.
8. The specular reflectance measurement apparatus according to claim 5, wherein the specular reflectance measurement apparatus further comprises:
the first shell comprises a first upper shell and a first lower shell, and the first upper shell and the first lower shell are installed in a matching mode to form a closed cavity;
the first window is arranged on the end face of the first shell;
the focal plane assembly is arranged in a cavity in the first shell and comprises a light source and a star point target, the light source is connected with the star point target, the light source is used for generating emitting light with preset wavelength, and the emitting light is emitted to the collimation assembly through the star point target;
the collimating assembly is arranged in a cavity in the first shell and comprises a lens barrel seat, a lens barrel, a collimator and an adjustable diaphragm, the lens barrel is fixed on the first shell, the lens barrel is arranged on the lens barrel seat, the collimator is arranged in the cavity in the lens barrel, one end face of the lens barrel is connected with the focal plane assembly, the other end face of the lens barrel is connected with the adjustable diaphragm, the emitted light forms parallel light beams after passing through the collimator in the lens barrel, and the parallel light beams are emitted through a first window in the end face of the shell after passing through the adjustable diaphragm;
the second shell comprises a second upper shell and a second lower shell, and the second upper shell and the second lower shell are installed in a matched mode to form a closed cavity;
the second window is arranged on the end face of the second shell;
the imaging lens and the CMOS camera are arranged in a cavity in the second shell, and the imaging lens is connected with the CMOS camera;
the imaging lens receives incident light through a second window on the end face of the second shell and focuses the incident light to the COMS camera.
9. A specular reflectance measurement method for a medium caliber telescope, comprising:
the energy emission subsystem generates emitted light with preset wavelength and emits the emitted light to the energy collection subsystem;
the energy collection subsystem receives the emitted light, converts the emitted light into second image data and outputs the second image data;
the energy emission subsystem emits the emission light with preset wavelength to a measured mirror surface of the telescope;
the energy collection subsystem receives reflected light returned after the emitted light is reflected by the measured mirror surface, converts the reflected light into first image data and outputs the first image data;
the electronic control subsystem receives the first image data and the second image data, determines a gray value corresponding to the first image data and a gray value corresponding to the second image data, and determines the reflectivity of the measured mirror to the emitted light with the preset wavelength according to the gray value corresponding to the first image data and the gray value corresponding to the second image data.
10. The specular reflectance measurement method of claim 9, wherein determining the reflectance of the measured mirror with respect to the emitted light of the predetermined wavelength according to the gray scale value corresponding to the first image data and the gray scale value corresponding to the second image data comprises:
determining the energy value of the emitted light according to the gray value corresponding to the second image data;
determining the energy value of the reflected light according to the gray value corresponding to the second image data;
and determining the reflectivity of the measured mirror surface to the light with the preset wavelength according to the energy value of the emitted light and the energy value of the reflected light.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114047593A (en) * | 2022-01-14 | 2022-02-15 | 中国人民解放军63921部队 | Light-weight SiC primary mirror supporting mechanism of optical measuring equipment |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105911716A (en) * | 2016-04-11 | 2016-08-31 | 中国科学院西安光学精密机械研究所 | Optical path adjusting device and method for measured lens in transfer function test |
| CN110514627A (en) * | 2019-08-26 | 2019-11-29 | 松山湖材料实验室 | Silicon wafer method for measuring reflectance and its measuring device |
| CN211179528U (en) * | 2019-08-26 | 2020-08-04 | 松山湖材料实验室 | Silicon chip reflectivity measuring device |
| CN112834462A (en) * | 2020-12-31 | 2021-05-25 | 中国科学院长春光学精密机械与物理研究所 | Method for measuring reflectivity of reflector |
-
2021
- 2021-06-30 CN CN202110735752.2A patent/CN113466182A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105911716A (en) * | 2016-04-11 | 2016-08-31 | 中国科学院西安光学精密机械研究所 | Optical path adjusting device and method for measured lens in transfer function test |
| CN110514627A (en) * | 2019-08-26 | 2019-11-29 | 松山湖材料实验室 | Silicon wafer method for measuring reflectance and its measuring device |
| CN211179528U (en) * | 2019-08-26 | 2020-08-04 | 松山湖材料实验室 | Silicon chip reflectivity measuring device |
| CN112834462A (en) * | 2020-12-31 | 2021-05-25 | 中国科学院长春光学精密机械与物理研究所 | Method for measuring reflectivity of reflector |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114047593A (en) * | 2022-01-14 | 2022-02-15 | 中国人民解放军63921部队 | Light-weight SiC primary mirror supporting mechanism of optical measuring equipment |
| CN114047593B (en) * | 2022-01-14 | 2022-04-08 | 中国人民解放军63921部队 | Light-weight SiC primary mirror supporting mechanism of optical measuring equipment |
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