CN113447851B - Circuit fault detection system and method - Google Patents
Circuit fault detection system and method Download PDFInfo
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- CN113447851B CN113447851B CN202111001549.9A CN202111001549A CN113447851B CN 113447851 B CN113447851 B CN 113447851B CN 202111001549 A CN202111001549 A CN 202111001549A CN 113447851 B CN113447851 B CN 113447851B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
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Abstract
The invention discloses a circuit fault detection system, which is applied to detecting the connection state of an internal circuit of a pumping source and comprises the following components: to be treatedThe device comprises a pump source to be detected, a heat sink assembly, a circuit detection module, a control module connected with the circuit detection module, and a display module connected with the control module, wherein the pump source to be detected is provided with a plurality of laser diodes connected in series, the laser diodes are installed on the heat sink assembly, and the circuit detection module is electrically connected with the pump source to be detected and the heat sink assembly and is used for collecting the voltage V at the input end of the pump source to be detected+Voltage V at output terminal‑And the voltage V of the heat sink assemblySAnd the control module is used for judging the circuit connection state of the pump source to be detected and outputting a judgment result from the display module, so that whether the laser diodes connected in series are in the leakage short circuit state, the open circuit state and the specific leakage short circuit position or not can be quickly and accurately detected.
Description
Technical Field
The invention belongs to the technical field of laser testing, and particularly relates to a circuit fault detection system and method.
Background
The pumping source of the fiber laser is an excitation source which enables laser working substances to achieve population inversion, and a semiconductor laser with a tail fiber is usually directly coupled into an optical fiber through a fiber coupler, a rare earth element (neodymium Nd, ytterbium Yb or erbium Er) doped optical fiber is used as a laser medium, a reflector and a fiber grating are used as a resonant cavity (the resonant cavity is a section of optical fiber), and the fiber laser can be operated in a pulse and continuous mode. The erbium-doped fiber Laser mainly uses 980nm or 1480nm LD (Laser Diode) as a pumping source, and the ytterbium-doped fiber Laser mainly uses 915nm or 976nm LD as a pumping source. The LD pumping source has the advantages of high efficiency, low noise, stable frequency, long service life, compact structure and the like.
The LD pumping source is internally provided with a plurality of low-power laser diodes which are connected in series and coupled into a single laser fiber through multiple branches. Because the pump source can produce a large amount of heat in the process of emitting the pump light, the pump source is generally arranged on the heat sink assembly, so that the pump source is fixed and can be well radiated. In order to achieve the purpose that the pumping source has high output power, the pumping source generally comprises a plurality of laser diodes, the laser diodes are connected together through a lead, each laser diode is installed on a heat sink assembly through an insulating layer, and poor insulation and even short circuit are easy to occur between the laser diodes and the heat sink assembly. Moreover, as the power required by the pump source is continuously increased, the number of the laser diodes used in the pump source is greatly increased, and the possibility of electric leakage and even short circuit between the laser diodes and the heat sink assembly is more likely to occur, which brings great inconvenience to the production and application of the pump source. Therefore, in the pump source production process, it is necessary to test the insulation between the laser diode and the heat sink assembly, such as quickly determining whether the laser diode connected inside the pump source is in a leakage short circuit or an open circuit state, and confirming the position of the leakage short circuit of the laser diode.
Disclosure of Invention
In view of the foregoing, it is a primary object of the present invention to provide a circuit fault detection system and method for quickly and accurately detecting whether a plurality of laser diodes connected in series in a pump source are at positions of a short circuit, an open circuit, and a specific short circuit.
In a first aspect, a circuit fault detection system provided in an embodiment of the present invention is applied to detect a connection state of an internal circuit of a pump source, and includes:
the device comprises a pump source to be tested and a heat sink assembly, wherein the pump source to be tested is provided with a plurality of laser diodes which are connected in series and the laser diodes are arranged on the heat sink assembly;
a circuit detection module, comprising: a voltage source VdcA current limiting resistor R1A switch K, the positive pole of the voltage source is connected in series with the current limiting resistor R in sequence1The negative electrode of the voltage source is connected with the heat sink assembly, and the circuit detection module is used for collecting the voltage V at the input end of the pump source to be detected+The output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblyS；
A control module, coupled to the circuit detection module, comprising: MCU control unit, differential amplifier circuit, absolute value circuit, the said differential amplifier circuit is used for to the said pumping source input end voltage V to be measured+The output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblySCarrying out differential amplification operation, wherein the absolute value circuit is used for carrying out absolute value operation on the result of the differential amplification operation and feeding back the result of the absolute value operation to the MCU control unit, and the MCU control unit is used for judging the circuit connection state of the pump source to be detected;
a display moduleConnected to the control module for inputting the voltage V of the voltage sourcer+The number n of the laser diodes, and the conduction voltage drop V of a single laser diodedAnd n is a positive integer, and outputs the judgment result of the MCU control unit.
In a second aspect, an embodiment of the present invention provides a circuit fault detection method, which is applied to a circuit fault detection system, and the method includes the steps of:
s10: receiving the number n of laser diodes in the pump source to be tested and the conduction voltage drop V of a single laser diodedN is a positive integer, and the voltage drop V is determined according to the number n of the received laser diodes and the conduction voltage drop V of a single laser diodedObtaining a reference voltage Vf(ii) a Wherein, Vf = n×Vd；
S11: the circuit detection module collects the voltage V at the input end of the pump source to be detected+And the output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblyS；
S12: receiving the voltage V at the input end of the pump source to be tested+And the output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblySAnd carrying out differential amplification and absolute value operation on the voltage value to obtain a differential amplification absolute value voltage value;
and judging the circuit connection state of the pump source to be detected according to the differential amplification absolute value voltage value and outputting a judgment result.
The invention has the beneficial effects that:
the invention provides a circuit fault detection system, which comprises: the device comprises a pump source to be detected, a heat sink assembly, a circuit detection module, a control module connected with the circuit detection module, and a display module connected with the control module, wherein the pump source to be detected is provided with a plurality of laser diodes connected in series, the laser diodes are installed on the heat sink assembly, and the circuit detection module is electrically connected with the pump source to be detected and the heat sink assembly and is used for collecting the voltage V at the input end of the pump source to be detected+Voltage V at output terminal-And the voltage V of the heat sink assemblySAnd feeds back to the controllerA display module for inputting the voltage Vr+The number n of the laser diodes, and the conduction voltage drop V of a single laser diodedN is a positive integer and is fed back to the control module, and the control module is used for judging the circuit connection state of the pumping source to be detected and outputting a judgment result, so that whether a plurality of laser diodes connected in series are in the states of leakage short circuit and open circuit and specific leakage short circuit positions is quickly and accurately detected, the production efficiency of the pumping source is improved, and the application prospect of the pumping source is expanded;
in addition, the invention provides a circuit fault detection method, which is applied to the circuit fault detection system, particularly realizes the quick and accurate detection of whether a plurality of laser diodes connected in series are positioned at the positions of leakage short circuit, open circuit and specific leakage short circuit, and has the advantages of simple operation and high efficiency.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a block diagram of a circuit fault detection system according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a circuit detection module and a pump source to be tested according to an embodiment of the present invention;
FIG. 3 is a block diagram showing a detailed structure of a control module based on the circuit failure detection system of FIG. 1;
FIG. 4 is a schematic diagram based on the structure of the first follower in FIG. 3;
FIG. 5 is a schematic diagram based on the comparator in FIG. 3;
fig. 6 is a schematic flowchart of a circuit fault detection method according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention. When an element is referred to as being "mounted to" another element, it can be directly on the other element or intervening elements may be present; as used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items; in addition, in this specification, the words "first", "second", "third", and "fourth" do not limit data and execution order, but distinguish substantially the same item or similar items in function and action.
Referring to fig. 1, a block diagram of a circuit fault detection system 10 according to an embodiment of the present invention is shown, where the circuit fault detection system 10 includes: the system comprises a pump source module 101, a circuit detection module 102, a control module 103, and a display module 105, wherein the circuit detection module 102 is respectively connected to the pump source module 101 and the control module 103, the control module 103 is connected to the display module 105, and the display module 105 is configured to input user information, and specifically, the system may include: inputting the voltage V of the voltage sourcer+The number n of the laser diodes, and the conduction voltage drop V of a single laser diodedN is a positive integer, and applying the voltage V to the voltage sourcer+The number n of the laser diodes, and the conduction voltage drop V of a single laser diodedAnd feeding back to the control module 103, and meanwhile, outputting the judgment result of the control module 103.
Further, this embodiment further includes: and the sound and light alarm module 106 is connected with the control module 103, and the sound and light alarm module 106 comprises an indicator light (not shown) and a buzzer (not shown).
In some embodiments, the pump source module 101 needs to emit high-power pump light according to practical application requirements, so the number of the laser diodes included in the pump module 101 needs to be increased, including but not limited to the number of the laser diodes illustrated in fig. 2. Because the pump source 1011 that awaits measuring can produce the heat when the emission pump light, and along with laser diode's series connection number increases, the heat that produces also can increase by a wide margin, consequently, it is right to need pump source module 101 dispel the heat, in order to guarantee the pump source that awaits measuring is not burnt and is lost. In this embodiment, the heat sink assembly 1012 is used to dissipate heat of the pump source 1011 to be measured.
Specifically, referring to fig. 2, the pump source module 101 in this embodiment includes: a pump source 1011 to be tested and a heat sink assembly 1012. The pump source 1011 to be tested is provided with a plurality of laser diodes 1011a (1011 a-1011 f) connected in series, the pump source 1011 to be tested is installed on the heat sink assembly 1012, further, in order to avoid electric leakage and even short circuit between the pump source 1011 to be tested and the heat sink assembly 1012, the heat sink assembly 1012 comprises a heat dissipation copper plate shell, an insulating layer 1015 is arranged between the laser diodes 1011a (1011 a-1011 f) and the heat dissipation copper plate shell, the laser diodes 1011a (1011 a-1011 f) are attached to the heat dissipation copper plate shell through the insulating layer 1015, and the laser diodes 1011a (1011 a-1011 f) are connected with one another.
Referring to fig. 2, the circuit detecting module 102 of the present embodiment includes: a voltage source VdcA current limiting resistor R1A switch K, the voltage source VdcThe positive pole of the resistor is connected in series with the current limiting resistor R in sequence1The pump source 1011 to be tested, the switch K, the heat sink component 1012 and the voltage source VdcThe negative pole of the circuit detection module 102 is connected with the heat sink component 1012, and the circuit detection module 102 is used for collecting the voltage V at the input end of the pump source 1011 to be detected+The output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblyS。
In some embodiments, the voltage source VdcFor a voltage source with a current limiting function, it can be based onThe number n of the laser diodes in the pump source 1011 to be tested and the conduction voltage drop V of a single laser diodedAutomatically regulating the output voltage Vr+(ii) a The current limiting resistor R1The adjustable resistor for high power current limiting, including but not limited to adjustable resistor or combination of multiple different resistances in series or in parallel, can be based on the voltage source VdcOutput voltage V ofr+Realize and adjust current-limiting resistance R1To ensure that the pump source 1011 under test and the circuit testing module 102 are not damaged.
Further, referring to fig. 3, in the present embodiment, the control module 103 includes: the MCU control unit 1030, a differential amplifier circuit (not shown), and an absolute value circuit (not shown), wherein the differential amplifier circuit (not shown) and the absolute value circuit (not shown) are used for measuring the voltage V at the input end of the pump source to be measured+The output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblySAnd performing differential amplification and absolute value operation to obtain a differential amplification absolute value voltage value, and feeding back an operation result of the differential amplification absolute value voltage value to the MCU control unit 1030, where the MCU control unit 1030 is configured to determine a circuit connection state of the pump source 1011 to be measured.
The circuit connection state of the pump source 1011 to be tested includes: a normal connection state, a short circuit connection state and an open circuit connection state; the MCU control unit may be a controller with an analog-to-digital converter (ADC).
Specifically, with reference to fig. 3, the differential amplifier circuit of the present embodiment includes: a first differential amplification circuit 1031, a second differential amplification circuit 1032, a third differential amplification circuit 1033, and a fourth differential amplification circuit 1034, the absolute value circuit including: a first absolute value circuit 1035, a second absolute value circuit 1036, a third absolute value circuit 1037, and a fourth absolute value circuit 1038, where the first differential amplifier circuit 1031 is configured to receive the voltage V at the input end of the pump source to be tested+The output end voltage V of the pump source to be tested-And differentially amplifying the voltage to output a first differentially amplified voltage value, the first absolute value being electrically connected to the first differential amplifierA circuit 1035 is connected to the first differential amplifier circuit 1031, and performs an absolute value operation on the received first differential amplified voltage value to output a first differential amplified absolute value voltage value;
the second differential amplifier circuit 1032 is configured to receive the power supply voltage Vr+Voltage V of the heat sink assemblySThe second absolute value circuit 1036 is connected to the second differential amplifier circuit 1032, and performs absolute value operation on the received second differential amplified voltage value to output a second differential amplified absolute value voltage value;
the third differential amplifier circuit 1033 is configured to receive a voltage V at an input end of the pump source to be detected+Voltage V of the heat sink assemblySAnd differentially amplifies the voltage value and outputs a third differentially amplified voltage value, and the third absolute value circuit 1037 is connected to the third differential amplifying circuit 1033 and performs an absolute value operation on the received third differentially amplified voltage value and outputs a third differentially amplified absolute value voltage value;
the fourth differential amplifying circuit 1034 is configured to receive the voltage V at the output end of the pump source to be detected-Voltage V of the heat sink assemblySAnd differentially amplifies the voltage value to output a fourth differentially amplified voltage value, and the fourth absolute value circuit 1038 is connected to the fourth differential amplifying circuit 1034 to perform absolute value operation on the received fourth differentially amplified voltage value to output a fourth differentially amplified absolute value voltage value;
a comparator 1047, a first input end of which is connected to the output end of the third absolute value circuit, a second input end of which is connected to the output end of the fourth absolute value circuit, and an output end of which is connected to the MCU control unit 1030.
In order to make the first differential amplified absolute value voltage value obtained by the first differential amplifier circuit 1031 and the first absolute value circuit 1035, the second differential amplified absolute value voltage value obtained by the second differential amplifier circuit 1032 and the second absolute value circuit 1036, the third differential amplified absolute value voltage value obtained by the third differential amplifier circuit 1033 and the third absolute value circuit 1037, and the fourth differential amplified absolute value voltage value obtained by the fourth differential amplifier circuit 1034 and the fourth absolute value circuit 1038 be inputted into the MCU control unit 1030 independently from each other, so as to satisfy the accurate operation of the MCU control unit 1030, the MCU control unit in this embodiment includes: a 1 st pin, a 2 nd pin, a 3 rd pin, a 4 th pin, a 5 th pin, and a 6 th pin, the 1 st pin is connected to the first absolute value circuit 1035, the 2 nd pin is connected to the second absolute value circuit 1036, the 3 rd pin is connected to the third absolute value circuit 1037, the 4 th pin is connected to the fourth absolute value circuit 1038, the 5 th pin is connected to an output terminal of the comparator 1048, and the 6 th pin is connected to the display module 105.
Further, please continue to refer to fig. 3, in order to enable the control module 103 to receive the voltage V at the input end of the pump source to be tested+The output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblySVoltage source voltage Vr+Before differential amplification operation is performed, the impedance matching and the on-load capability are stably maintained within a certain range, and after the differential amplification operation is performed, the control module 103 further includes: a first limiter circuit 1039, a first follower 1043, a second limiter circuit 1040, a second follower 1044, a third limiter circuit 1041, a third follower 1045, a fourth limiter circuit 1042, and a fourth follower 1046.
Specifically, the first amplitude limiting circuit 1039 is sequentially connected to the first differential amplifying circuit 1031, the first absolute value circuit 1035, and the first follower 1043, the first amplitude limiting circuit 1039 is connected to the circuit detection module 102, the first follower 1043 is connected to the MCU control unit 1030 through the 1 st pin, and the first amplitude limiting circuit 1039 is configured to receive a voltage V at the input terminal of the pump source to be detected+The output end voltage V of the pump source to be tested-Stabilizing the signal within a limited range, and feeding back the result to the first differential amplifier circuit 1031; the first follower 1043 is configured to receive the first differentially amplified absolute voltage value and to implement the controlAnd impedance matching of the module, improvement of loading capacity and transmission of the first differential amplification absolute value voltage value to the MCU control unit 1030.
The second amplitude limiting circuit 1040 is sequentially connected to the second differential amplifying circuit 1032, the second absolute value circuit 1036, and the second follower 1044, the second amplitude limiting circuit 1040 is connected to the circuit detection module 102, the second follower 1044 is connected to the MCU control unit 1030 through a 2 nd pin, and the second amplitude limiting circuit 1040 is configured to receive the power supply voltage Vr+Voltage V of the heat sink assemblySStabilizing the amplitude of the amplified signal within a limited range, and feeding back the result to the second differential amplifier circuit 1032; the second follower 1044 is configured to receive the second differential amplified absolute value voltage value, to implement impedance matching of the control module, to improve a load carrying capability, and to send the second differential amplified absolute value voltage value to the MCU control unit 1030.
The third amplitude limiting circuit 1041 is connected to the third differential amplifying circuit 1033, the third absolute value circuit 1037 and the third follower 1045 in sequence, the third amplitude limiting circuit 1041 is connected to the circuit detection module 102, the third follower 1045 is connected to the MCU control unit 1030 through a 3 rd pin, and the third amplitude limiting circuit 1041 is used for receiving the voltage V at the input end of the pump source to be detected+Voltage V of the heat sink assemblySTo stabilize it within a limited range, and to feed back the result to the third differential amplifier circuit 1033; the third follower 1045 is configured to receive the third differential amplified absolute value voltage value, to implement impedance matching of the control module, to improve a load carrying capability, and to send the third differential amplified absolute value voltage value to the MCU control unit 1030.
The fourth amplitude limiting circuit 1042 is sequentially connected to the fourth differential amplifying circuit 1034, the fourth absolute value circuit 1038, and the fourth follower 1046, the fourth amplitude limiting circuit 1042 is connected to the circuit detecting module 102, the fourth follower 1046 is connected to the MCU control unit 1030 through a 4 th pin, and the fourth amplitude limiting circuit 1038 is configured to receive a voltage V at an output end of the pump source to be detected-Voltage V of the heat sink assemblySTo stabilize within a limited range, and to feed back the result to the fourth differential amplifier circuit 1034; the fourth follower 1046 is configured to receive the fourth differential amplified absolute value voltage value, to implement impedance matching of the control module, to improve a load carrying capability, and to send the fourth differential amplified absolute value voltage value to the MCU control unit 1030.
A first input terminal of the comparator 1047 is connected to an output terminal of the third follower 1045, and a second input terminal thereof is connected to an output terminal of the fourth follower 1046.
In this embodiment, the functions and basic configurations of the first follower 1043, the second follower 1044, the third follower 1045, and the fourth follower 1046 are the same, and therefore the first follower is taken as an example for specific description. Referring to fig. 4 in combination with fig. 3, the first follower 1043 includes: a first operational amplifier U1Current limiting resistor R2Said first operational amplifier U1Receives the first differential amplified absolute value voltage value output from the first absolute value circuit 1035, the first operational amplifier U1Through the current limiting resistor R2Connected to its output terminal, the current limiting resistor R2May be any value, and finally, the first differential amplified absolute voltage value is output from the output terminal of the first operational amplifier U1 through the first follower 1044.
Referring to fig. 5, the comparator 1047 includes: second operational amplifier U2Current limiting resistor R6Current limiting resistor R7Current limiting resistor R8Said second operational amplifier U2The forward end of the resistor is connected with a current limiting resistor R connected in parallel6Current limiting resistor R7In particular, the current limiting resistor R6Is connected with the output end of the third follower 1045, and the current limiting resistor R7Is connected with a reference voltage VrefThe current limiting resistor R6And a current limiting resistor R7Are connected together with said second operational amplifier U2The positive end of the positive end is connected; the pairReference voltage VrefThe comparison reference voltage V is the voltage value generated inside the control module 103refLess than a single laser diode conduction voltage drop VdOf (1); the second operational amplifier U2Is terminated with a current limiting resistor R8In particular, the current limiting resistor R8Is connected with the output terminal of the fourth follower 1046, and the current limiting resistor R8And the output terminal of the second operational amplifier U2The negative terminal of (a) is connected. The current limiting resistor R6Current limiting resistor R7Current limiting resistor R8The impedance matching capability of the comparator 1047 can be improved.
Compared with the prior art, the circuit fault detection system provided by the embodiment of the invention comprises: the device comprises a pump source 1011 to be tested, a heat sink assembly 1012, a circuit detection module 102, a control module 103 connected with the circuit detection module 102, and a display module 105 connected with the control module 103, wherein the pump source 1011 to be tested is provided with a plurality of laser diodes 1011a (1011 a-1011 f) connected in series, the laser diodes (1011 a-1011 f) are installed on the heat sink assembly 1012, and the circuit detection module 102 is electrically connected with the pump source 1011 to be tested and the heat sink assembly 1012 and is used for collecting the voltage V at the input end of the pump source to be tested+Voltage V at output terminal-And the voltage V of the heat sink assemblySAnd feeds back the voltage to the control module 103, and the display module 105 is used for inputting the voltage V of the voltage sourcer+The number n of the laser diodes, and the conduction voltage drop V of a single laser diodedAnd n is a positive integer and is fed back to the control module 105, the control module 105 is used for judging the circuit connection state of the pumping source 1011 to be detected and outputting a judgment result, so that whether a plurality of laser diodes 1011a (1011 a-1011 f) connected in series are in the states of leakage short circuit and open circuit and the specific leakage short circuit position is quickly and accurately detected, the production efficiency of the pumping source is improved, and the application prospect of the pumping source is expanded.
In addition, based on the circuit fault detection system 10, an embodiment of the invention provides a circuit fault detection method, please refer to fig. 6 in combination with fig. 3, the method includes the steps of:
s10: receiving the number n of laser diodes in the pump source to be tested and the voltage value V used by a single laser diodedN is a positive integer, and the voltage drop V is determined according to the number n of the received laser diodes and the conduction voltage drop V of a single laser diodedObtaining a reference voltage Vf(ii) a Wherein, Vf = n×Vd；
S11: the circuit detection module collects the voltage V at the input end of the pump source to be detected+Voltage V-of output end of pump source to be tested and voltage V of heat sink assemblyS；
S12: receiving the voltage V at the input end of the pump source to be tested+And the output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblySAnd carrying out differential amplification and absolute value operation on the voltage value to obtain a differential amplification absolute value voltage value;
and judging the circuit connection state of the pump source to be detected according to the differential amplification absolute value voltage value and outputting a judgment result.
Specifically, in step S12, when the switch K is in a closed state, the voltage V of the input end of the pump source to be tested, which is collected by the circuit detection module 102, is detected+And the output end voltage V of the pump source to be tested-Carrying out differential amplification and absolute value operation to obtain a first differential amplification absolute value voltage value; amplifying the absolute voltage value and the reference voltage value V according to the first differencefAnd (4) judging the circuit connection state of the pump source to be detected and outputting a judgment result.
Further, the step S10 further includes: obtaining a voltage source voltage Vr+(Voltage Source Voltage V)r+ >Reference voltage Vf) Resistance r of current limiting resistor1The step S12 further includes: when the switch K is in a closed state, the obtained voltage V of the voltage source is subjected to voltage regulationr+And the voltage V of the heat sink assembly collected by the circuit detection module 102SAnd carrying out differential amplification and absolute value operation to obtain a second differential amplification absolute value voltage value.
Specifically, the arithmetic operationObtaining the first differential amplification absolute value voltage value and the reference voltage VfIf the ratio is n, judging that the circuit of the pump source to be tested is normally connected, and displaying characters PASS and 0 by the display module if the short circuit or open circuit of the laser diode does not exist;
if the first differential amplification absolute value voltage value and the reference voltage value V are obtained by operationfIs m, wherein m is<If n and m are positive integers, judging that (n-m) laser diodes are short-circuited, and the (m + 1) th laser diode close to the input end of the pump source to be tested leaks electricity, so that the pump source to be tested is short-circuited to the heat sink assembly, and displaying characters FAIL and (m + 1) by a display module;
if the first differential amplification absolute value voltage value and the reference voltage value V are obtained by operationfIs h, wherein h>n and h are positive integers, the OPEN circuit of the pump source to be tested is judged, the OPEN circuit exists between the laser diodes, and the display module displays the character OPEN;
at this time, under the condition that the pump source to be tested is in a normal connection state or in a leakage short circuit state, the absolute value voltage value is amplified according to the first difference, and the resistance value r of the current-limiting resistor1The second differential amplification absolute value voltage value can obtain the current value of the circuit detection module; specifically, the difference between the second differential amplification absolute value and the first differential amplification absolute value is equal to the current limiting resistor R1Resistance value r of1The ratio of (a) to (b) is the detection current value of the circuit detection module.
Or, specifically, the step S10 further includes: obtaining a voltage source voltage Vr+In step S12, the method may further include:
when the switch K is in an off state, the voltage V of the input end of the pump source to be detected, which is acquired by the circuit detection module 102, is detected+And the output end voltage V of the pump source to be tested-Carrying out differential amplification and absolute value operation to obtain a first differential amplification absolute value voltage value; for the power supply voltage Vr+Voltage V of the heat sink assemblySPerforming differential amplification and absolute value operation to obtain a second signalDifferentially amplifying the absolute voltage value; for the voltage V of the input end of the pump source to be tested+Voltage V of the heat sink assemblySCarrying out differential amplification and absolute value operation to obtain a third differential amplification absolute value voltage value; for the output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblySCarrying out differential amplification to obtain a fourth differential amplification absolute value voltage value; and judging the circuit connection state of the pump source 1011 to be tested according to the first differential amplification absolute value voltage value, the second differential amplification absolute value voltage value, the third differential amplification absolute value voltage value and the fourth differential amplification absolute value voltage value and outputting a judgment result.
Further, the step S10 further includes: resistance r of current limiting resistor1In step S12, the method may further include:
if the second differential amplification absolute value voltage value, the third differential amplification absolute value voltage value and the fourth differential amplification absolute value voltage value obtained by operation are equal, judging that the circuit of the pump source to be tested is normally connected, and displaying characters PASS and 0 by a display module if no leakage short circuit or open circuit of the laser diode exists;
in this embodiment, except that the MCU control unit is used to perform logical operation on the obtained second, third, and fourth differential amplified absolute value voltage values, and then determine the circuit connection status of the pumping source, meanwhile, the comparator 1047 may be used to calculate the third differential amplified absolute value voltage value and the fourth differential amplified absolute value voltage value, specifically, if the second differential amplified absolute value voltage value, the third differential amplified absolute value voltage value and the fourth differential amplified absolute value voltage value obtained by calculation are all equal, the comparator 1047 outputs a high level signal, the MCU control unit directly judges that the circuit of the pump source to be tested is normally connected without logical operation, and the display module displays characters PASS and 0 without the short circuit or open circuit of the laser diode;
if the first difference amplification absolute value voltage value and the reference voltage V are obtained by operationfEqual and fourth differentially amplifying absolute valuesIf the voltage value is 0V, judging that the output end of the pump source to be tested has electric leakage, causing short circuit between the output end of the pump source to be tested and the heat sink assembly, and displaying characters FAIL and (n + 1) by a display module;
if the first differential amplification absolute value voltage value and the third differential amplification absolute value voltage value are equal, the fourth differential amplification absolute value voltage value is 0V; at the same time, if the reference voltage V isfThe difference value with the first differential amplification absolute value voltage value is the conduction voltage drop V of a single laser diodedG is a positive integer, judging that the (n-g + 1) th laser diode in the pump source to be tested, which is close to the input end of the pump source to be tested, leaks electricity, so that a short circuit occurs between the output end of the pump source to be tested and the heat sink assembly, and displaying characters FAIL and (n-g + 1) by a display module; at this time, the third differential amplification absolute value voltage value is greater than the fourth differential amplification absolute value voltage value, the comparator 1047 outputs a low-level voltage signal, it can be directly determined that the pump source to be detected has electric leakage, and the display module displays the character FAIL.
If the first differential amplification absolute value voltage value, the third differential amplification absolute value voltage value and the fourth differential amplification absolute value voltage value which are obtained through operation are all 0V, the input end of the pump source to be detected is judged to be in electric leakage, short circuit is caused between the input end of the pump source to be detected and the heat sink assembly, and the display module displays characters FAIL and-1;
at this time, under the condition that the pump source to be tested leaks electricity, the absolute value voltage value is amplified according to the first difference, and the resistance value r of the current-limiting resistor1The second differential amplification absolute value voltage value can obtain the detection current value of the circuit detection module; specifically, the difference between the second differential amplification absolute value and the first differential amplification absolute value is equal to the resistance r of the current limiting resistor1The ratio of (a) to (b) is the current value of the circuit detection module.
Further, the step S12 is followed by a step S13: controlling the sound and light alarm module 105 to give an abnormal alarm;
specifically, if the pump source circuit to be tested is normally connected, the indicator light is turned on green, and the buzzer does not work; and if the pump source circuit to be tested has electric leakage or/and open circuit, the indicator lamp is turned on red, and the buzzer sounds for alarming in a long time.
And finally, when the test of the pump source to be tested is finished, controlling the circuit detection module to stop working.
Compared with the prior art, the circuit fault detection method provided by the embodiment is applied to the circuit fault detection system, and the method includes the following steps: s10: receiving the number n of laser diodes in the pump source to be tested and the conduction voltage drop V of a single laser diodedN is a positive integer, and the voltage drop V is determined according to the number n of the received laser diodes and the conduction voltage drop V of a single laser diodedObtaining a reference voltage Vf(ii) a Wherein, Vf = n×Vd(ii) a S11: the circuit detection module collects the voltage V at the input end of the pump source to be detected+And the output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblyS(ii) a S12: receiving the voltage V at the input end of the pump source to be tested+And the output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblySAnd carrying out differential amplification and absolute value operation on the voltage value to obtain a differential amplification absolute value voltage value; and judging the circuit connection state of the pump source to be detected according to the differential amplification absolute value voltage value and outputting a judgment result. The circuit fault detection method specifically realizes the rapid and accurate detection of whether the laser diodes connected in series are positioned at the positions of the leakage short circuit, the open circuit and the specific leakage short circuit, and has the advantages of simple operation and high efficiency.
The circuit fault detection system and method provided by the embodiment of the present invention are described in detail above, and the principle and the embodiment of the present invention are explained in the present document by applying specific examples, and the description of the above embodiments is only used to help understanding the method of the present invention and the core idea thereof; meanwhile, for those skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.
Claims (10)
1. A pump source circuit fault detection system, comprising:
the device comprises a pump source to be tested and a heat sink assembly, wherein the pump source to be tested is provided with a plurality of laser diodes which are connected in series and the laser diodes are arranged on the heat sink assembly;
a circuit detection module, comprising: a voltage source VdcA current limiting resistor R1A switch K, the positive pole of the voltage source is connected in series with the current limiting resistor R in sequence1The negative electrode of the voltage source is connected with the heat sink assembly, and the circuit detection module is used for collecting the voltage V at the input end of the pump source to be detected+The output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblyS；
A control module, coupled to the circuit detection module, comprising: MCU control unit, differential amplifier circuit, absolute value circuit, the said differential amplifier circuit is used for to the said pumping source input end voltage V to be measured+The output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblySThe absolute value circuit is used for carrying out absolute value operation on the result of the differential amplification operation and feeding back the result of the absolute value operation to the MCU control unit;
a display module connected with the control module for inputting the voltage Vr+The number n of the laser diodes, and the conduction voltage drop V of a single laser diodedAnd n is a positive integer, and outputting the judgment result of the MCU control unit;
the MCU control unit is used for judging the circuit connection state of the pumping source to be detected according to the received absolute value operation result, the voltage Vr + of the voltage source, the number n of the laser diodes and the conduction voltage drop Vd of a single laser diode, wherein if the circuit of the pumping source is in a leakage short circuit state, the specific leakage short circuit position of the laser diodes which are connected in series can be quickly judged.
2. The pump source circuit fault detection system of claim 1, wherein the differential amplification circuit comprises: the first differential amplifier circuit, the second differential amplifier circuit, the third differential amplifier circuit, the fourth differential amplifier circuit, the absolute value circuit includes: a first absolute value circuit, a second absolute value circuit, a third absolute value circuit, a fourth absolute value circuit,
the first differential amplifying circuit is used for receiving the voltage V at the input end of the pump source to be detected+The output end voltage V of the pump source to be tested-The first absolute value circuit is connected with the first differential amplifying circuit, and is used for carrying out absolute value operation on the received first differential amplifying voltage value and outputting a first differential amplifying absolute value voltage value;
the second differential amplifying circuit is used for receiving the voltage V of the voltage sourcer+Voltage V of the heat sink assemblySThe second absolute value circuit is connected with the second differential amplifying circuit, and is used for carrying out absolute value operation on the received second differential amplifying voltage value and outputting a second differential amplifying absolute value voltage value;
the third differential amplifying circuit is used for receiving the voltage V at the input end of the pump source to be detected+Voltage V of the heat sink assemblySThe third absolute value circuit is connected with the third differential amplifying circuit, and is used for carrying out absolute value operation on the received third differential amplifying voltage value and outputting a third differential amplifying absolute value voltage value;
the fourth differential amplifying circuit is used for receiving the voltage V at the output end of the pump source to be detected-Voltage V of the heat sink assemblySAnd differentially amplifying the voltage value to output a fourth differentially amplified voltage value, wherein the fourth absolute value circuit is connected with the fourth differentially amplifying circuit and carries out absolute value operation on the received fourth differentially amplified voltage valueCalculating and outputting a fourth differential amplification absolute value voltage value;
and a first input end of the comparator is connected with the output end of the third absolute value circuit, a second input end of the comparator is connected with the output end of the fourth absolute value circuit, and an output end of the comparator is connected with the MCU control unit.
3. The pump source circuit fault detection system of claim 2, wherein the MCU control unit comprises: the display device comprises a 1 st pin, a 2 nd pin, a 3 rd pin, a 4 th pin, a 5 th pin and a 6 th pin, wherein the 1 st pin is connected with the first absolute value circuit, the 2 nd pin is connected with the second absolute value circuit, the 3 rd pin is connected with the third absolute value circuit, the 4 th pin is connected with the fourth absolute value circuit, the 5 th pin is connected with the output end of the comparator, and the 6 th pin is connected with the display module.
4. The pump source circuit fault detection system of claim 3, wherein the control module comprises:
first amplitude limiting circuit, first follower, first amplitude limiting circuit connects gradually first difference amplifier circuit, first absolute value circuit, first follower, first amplitude limiting circuit with circuit detection module connects, first follower pass through the 1 st pin with the MCU the control unit is connected, first amplitude limiting circuit is used for receiving the pump source input end voltage V that awaits measuring+The output end voltage V of the pump source to be tested-Stabilizing the signal within a limited amplitude, and feeding back the result to the first differential amplifier circuit; the first follower is used for receiving the first differential amplification absolute value voltage value, realizing impedance matching of the control module, improving the load carrying capacity and sending the first differential amplification absolute value voltage value to the MCU control unit;
the second amplitude limiting circuit is sequentially connected with the second differential amplification circuit, the second absolute value circuit and the second follower, and the second amplitude limiting circuit and the second follower are connectedThe circuit detection module is connected, the second follower is connected with the MCU control unit through a No. 2 pin, and the second amplitude limiting circuit is used for receiving the voltage Vr + of the voltage source and the voltage V of the heat sink componentSStabilizing the amplitude of the signal within the limited range, and feeding back the result to the second differential amplifier circuit; the second follower is used for receiving the second differential amplification absolute value voltage value, realizing impedance matching of the control module, improving the load carrying capacity and sending the second differential amplification absolute value voltage value to the MCU control unit;
the third amplitude limiting circuit is connected with the third differential amplification circuit, the third absolute value circuit and the third follower in sequence, the third amplitude limiting circuit is connected with the circuit detection module, the third follower is connected with the MCU control unit through a 3 rd pin, and the third amplitude limiting circuit is used for receiving the voltage V at the input end of the pump source to be detected+Voltage V of the heat sink assemblySStabilizing the amplitude of the signal within the limited range, and feeding back the result to the third differential amplifier circuit; the third follower is used for receiving the third differential amplification absolute value voltage value, realizing impedance matching of the control module, improving the load carrying capacity and sending the third differential amplification absolute value voltage value to the MCU control unit;
the fourth amplitude limiting circuit is connected with the fourth differential amplification circuit, the fourth absolute value circuit and the fourth follower in sequence, the fourth amplitude limiting circuit is connected with the circuit detection module, the fourth follower is connected with the MCU control unit through a 4 th pin, and the fourth amplitude limiting circuit is used for receiving the voltage V at the output end of the pump source to be detected-Voltage V of the heat sink assemblySStabilizing the amplitude of the signal within the limited range, and feeding back the result to the fourth differential amplifier circuit; the fourth follower is used for receiving the fourth differential amplification absolute value voltage value, realizing impedance matching of the control module, improving the load carrying capacity and sending the fourth differential amplification absolute value voltage value to the MCU control unit;
and a first input end of the comparator is connected with an output end of the third follower, and a second input end of the comparator is connected with an output end of the fourth follower.
5. The pump source circuit failure detection system of any of claims 1-4,
the method comprises the following steps: the control module controls the working mode of the sound-light alarm module according to the judgment result;
the heat sink assembly includes: the laser diode is connected in series, and the laser diode is connected between the laser diode and the heat dissipation copper plate shell.
6. A pump source circuit failure detection method applied to the circuit failure detection system according to any one of claims 1 to 5, the method comprising the steps of:
s10: receiving a voltage V of a voltage sourcer+The number n of the laser diodes in the pump source to be tested and the conduction voltage drop V of a single laser diodedN is a positive integer, and the voltage drop V is determined according to the number n of the received laser diodes and the conduction voltage drop V of a single laser diodedObtaining a reference voltage Vf(ii) a Wherein, Vf= n×Vd；
S11: the circuit detection module collects the voltage V at the input end of the pump source to be detected+And the output end voltage V of the pump source to be tested-Voltage V of heat sink assemblyS；
S12: receiving the voltage V at the input end of the pump source to be tested+And the output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblySAnd carrying out differential amplification and absolute value operation on the voltage value to obtain a differential amplification absolute value voltage value;
judging the circuit connection state of the pump source to be detected according to the differential amplification absolute value voltage value and outputting a judgment result; if the circuit of the pumping source is in a leakage short-circuit state, the specific leakage short-circuit positions of the laser diodes which are connected in series can be quickly judged.
7. The pump source circuit failure detection method according to claim 6, wherein in the step S12:
when the switch K is in a closed state, the voltage V of the input end of the pump source to be detected, which is acquired by the circuit detection module, is detected+And the output end voltage V of the pump source to be tested-Carrying out differential amplification and absolute value operation to obtain a first differential amplification absolute value voltage value; amplifying the absolute voltage value and the reference voltage value V according to the first differencefAnd (4) judging the circuit connection state of the pump source to be detected and outputting a judgment result.
8. The pump source circuit failure detection method according to claim 7, wherein in the step S12:
if the first differential amplification absolute value voltage value and the reference voltage V are obtained by operationfIf the ratio is n, judging that the circuit of the pump source to be tested is normally connected, and displaying characters PASS and 0 by the display module if the short circuit or open circuit of the laser diode does not exist;
if the first differential amplification absolute value voltage value and the reference voltage value V are obtained by operationfIs m, wherein m is<If n and m are positive integers, judging that (n-m) laser diodes are short-circuited, and the (m + 1) th laser diode close to the input end of the pump source to be tested leaks electricity, so that the pump source to be tested is short-circuited to the heat sink assembly, and displaying characters FAIL and (m + 1) by a display module;
if the first differential amplification absolute value voltage value and the reference voltage value V are obtained by operationfIs h, wherein h>And n and h are positive integers, the OPEN circuit of the pump source to be detected is judged, the OPEN circuit exists between the laser diodes, and the display module displays the character OPEN.
9. The pump source circuit failure detection method according to claim 6, wherein in the step S12,
when the switch K is in a disconnected state, the voltage V of the input end of the pump source to be detected, which is acquired by the circuit detection module, is detected+And the output end voltage V of the pump source to be tested-Carrying out differential amplification and absolute value operation to obtain a first differential amplification absolute value voltage value; for the voltage V of the voltage sourcer+Voltage V of the heat sink assemblySCarrying out differential amplification and absolute value operation to obtain a second differential amplification absolute value voltage value; for the voltage V of the input end of the pump source to be tested+Voltage V of the heat sink assemblySCarrying out differential amplification and absolute value operation to obtain a third differential amplification absolute value voltage value; for the output end voltage V of the pump source to be tested-Voltage V of the heat sink assemblySCarrying out differential amplification to obtain a fourth differential amplification absolute value voltage value; and judging the circuit connection state of the pump source to be detected according to the first differential amplification absolute value voltage value, the second differential amplification absolute value voltage value, the third differential amplification absolute value voltage value and the fourth differential amplification absolute value voltage value and outputting a judgment result.
10. The pump source circuit failure detection method according to claim 9, wherein in step S12,
if the second differential amplification absolute value voltage value, the third differential amplification absolute value voltage value and the fourth differential amplification absolute value voltage value obtained by operation are equal, judging that the circuit of the pump source to be tested is normally connected, and displaying characters PASS and 0 by a display module if no leakage short circuit or open circuit of the laser diode exists;
if the first difference amplification absolute value voltage value and the reference voltage V are obtained by operationfIf the voltage value of the fourth differential amplification absolute value is equal to 0V, judging that the output end of the pump source to be detected has electric leakage, causing short circuit between the output end of the pump source to be detected and the heat sink assembly, and displaying characters FAIL and (n + 1) by the display module;
if you are good atCalculating that the voltage value of the first differential amplification absolute value is equal to the voltage value of the third differential amplification absolute value, and the voltage value of the fourth differential amplification absolute value is 0V; at the same time, if the reference voltage V isfThe difference value with the first differential amplification absolute value voltage value is the conduction voltage drop V of a single laser diodedG is a positive integer, judging that the (n-g + 1) th laser diode in the pump source to be tested, which is close to the input end of the pump source to be tested, leaks electricity, so that a short circuit occurs between the output end of the pump source to be tested and the heat sink assembly, and displaying characters FAIL and (n-g + 1) by a display module;
if the first differential amplification absolute value voltage value, the third differential amplification absolute value voltage value and the fourth differential amplification absolute value voltage value which are obtained through operation are all 0V, the input end of the pump source to be detected is judged to be in electric leakage, short circuit between the input end of the pump source to be detected and the heat sink assembly is caused, and the display module displays characters FAIL and-1.
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