CN113434951A - Method, device and system for evaluating anti-ripple interference capability - Google Patents

Method, device and system for evaluating anti-ripple interference capability Download PDF

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CN113434951A
CN113434951A CN202110577303.XA CN202110577303A CN113434951A CN 113434951 A CN113434951 A CN 113434951A CN 202110577303 A CN202110577303 A CN 202110577303A CN 113434951 A CN113434951 A CN 113434951A
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voltage
power supply
voltage component
interference
data
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CN113434951B (en
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范盼
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Zhejiang Geely Holding Group Co Ltd
Ningbo Geely Automobile Research and Development Co Ltd
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Zhejiang Geely Holding Group Co Ltd
Ningbo Geely Automobile Research and Development Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/10Geometric CAD
    • G06F30/15Vehicle, aircraft or watercraft design
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01HMEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H17/00Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves, not provided for in the preceding groups
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M17/00Testing of vehicles
    • G01M17/007Wheeled or endless-tracked vehicles
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/20Design optimisation, verification or simulation
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2119/00Details relating to the type or aim of the analysis or the optimisation
    • G06F2119/10Noise analysis or noise optimisation
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02TCLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
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Abstract

The application relates to a method, a device and a system for evaluating anti-ripple interference capability, wherein the method comprises the following steps: acquiring ripple noise data of an interference source; processing the ripple noise data to obtain a mathematical model of the waveform to be fitted; carrying out signal modulation according to the mathematical model to obtain a fitting waveform; injecting a fitting waveform into a high-voltage component to be tested; acquiring performance data and/or operation data output by a high-voltage component to be detected; and determining the anti-interference capacity degree value of the high-voltage component to be tested based on the performance data and/or the operation data. Therefore, the problem that the influence of the ripple noise on the high-voltage component cannot be evaluated can be solved, and an evaluation scheme is provided for the ripple noise immunity of the high-voltage component.

Description

Method, device and system for evaluating anti-ripple interference capability
Technical Field
The application relates to the technical field of new energy vehicles, in particular to a method, a device and a system for evaluating anti-ripple interference capability.
Background
With the increasing severity of energy and environmental problems, the development of new energy electric vehicles is an effective measure for promoting energy conservation and emission reduction, so that the research of new energy electric vehicles becomes more and more important, but compared with traditional vehicles, the problem of electromagnetic compatibility of new energy electric vehicles is more prominent, and the new energy electric vehicles gradually become a core problem influencing the safety of electric vehicle electronic systems.
The electromagnetic interference problem of the new energy automobile mainly comes from a high-voltage component system, and is mainly caused by the fact that a motor needs to be driven by a large current when running, when the working state of the motor is changed, the current can jump in a short time and a high-power semiconductor switch can be switched, so that rapid current and voltage changes exist in the high-voltage component system, and strong electromagnetic interference noise can be generated.
In the new energy automobile, high-voltage components such as an electric drive system, an On Board Charger (OBC), a DC-DC, a PTC (positive temperature coefficient) heater, an air conditioning compressor, a high-voltage battery and the like form a high-voltage system of the new energy automobile, and the high-voltage system is a core component of the new energy automobile, and the overall performance of the high-voltage system, particularly the high-voltage transient interference resistance of each high-voltage component, has important significance for ensuring the safety performance of the whole automobile.
Under the working condition modes of normal work, starting, running, acceleration and deceleration, charging and the like of a new energy automobile, a power high-voltage wire can generate ripple noise, the noise signal can be transmitted through the high-voltage wire to cause interference on other high-voltage parts, and the safety problem of the whole automobile can be caused.
Disclosure of Invention
The embodiment of the application provides an anti-ripple interference capability assessment method, an anti-ripple interference capability assessment device and an anti-ripple interference capability assessment system, which can solve the problem that the influence of ripple noise on a high-voltage component cannot be assessed, and provide an assessment scheme for the ripple noise anti-interference capability of the high-voltage component.
In one aspect, the present application provides a method for evaluating an anti-ripple interference capability, including:
acquiring ripple noise data of an interference source;
processing the ripple noise data to obtain a mathematical model of the waveform to be fitted;
carrying out signal modulation according to the mathematical model to obtain a fitting waveform;
injecting a fitting waveform into a high-voltage component to be tested;
acquiring performance data and/or operation data output by a high-voltage component to be detected;
and determining the anti-interference capacity degree value of the high-voltage component to be tested based on the performance data and/or the operation data.
Optionally, the ripple noise data includes one or more of a frequency, an amplitude, or an internal oscillation frequency of a noise waveform of the interferer; the interference source comprises one or more of an electric drive system, an on-board charger, a direct current power converter, an on-board heater, an air conditioner compressor or a high-voltage battery;
obtaining ripple noise data of an interferer, comprising:
and sampling ripple noise generated by the interference source to obtain one or more of the frequency, the amplitude or the internal oscillation frequency of the noise waveform.
Optionally, after the signal modulation is performed according to the mathematical model to obtain a fitting waveform and before the fitting waveform is injected into the high-voltage component to be tested, the method further includes:
the fitted waveform is calibrated.
Optionally, determining an anti-interference capability degree value of the high-voltage component to be tested based on the performance data and/or the operation data includes:
acquiring conventional operation data and conventional performance data of a high-voltage component to be tested;
if the matching degree value of the performance data and the conventional performance data is greater than or equal to a first preset value, and the matching degree value of the operation data and the conventional operation data is greater than or equal to a second preset value, determining the anti-interference capacity degree value of the high-voltage component to be detected as a first capacity degree value; or; if the matching degree value of the performance data and the conventional performance data is smaller than or equal to a third preset value, or the matching degree value of the operation data and the conventional operation data is smaller than or equal to a fourth preset value, determining that the anti-interference capacity degree value of the high-voltage component to be detected is a second capacity degree value; wherein the first ability degree value is greater than the second ability degree value.
In another aspect, the present application provides an apparatus for evaluating an anti-ripple interference capability, including:
the sampling module is used for acquiring ripple noise data of the interference source;
the fitting module is used for processing the ripple noise data to obtain a mathematical model of the waveform to be fitted;
the modulation module is used for carrying out signal modulation according to the mathematical model to obtain a fitting waveform;
the injection module is used for injecting the fitting waveform into the high-voltage component to be tested;
the determining module is used for acquiring performance data and/or operation data output by the high-voltage component to be detected and determining the anti-interference capacity degree value of the high-voltage component to be detected based on the performance data and/or the operation data.
Optionally, the sampling module includes a high-voltage power supply, a power supply impedance stabilizing network, a high-voltage bus, an oscilloscope and a high-voltage differential probe;
the first input end of the power supply impedance stabilizing network is connected with a high-voltage power supply, and the first output end of the power supply impedance stabilizing network is used for being connected with an interference source through a high-voltage bus during sampling;
one end of the high-voltage differential probe is connected with the oscilloscope, and the other end of the high-voltage differential probe is respectively connected with the second output end of the power supply impedance stabilizing network.
Optionally, the sampling module further includes a high-voltage power supply load;
the high-voltage power supply load is bridged at the positive end and the negative end of the high-voltage power supply, and the high-voltage power supply load is positioned between the high-voltage power supply and the power supply impedance stabilizing network.
Optionally, the modulation module includes a signal source; the injection module comprises a high-voltage power supply, a power supply impedance stabilizing network, a high-voltage bus, an oscilloscope and a high-voltage differential probe;
the signal source is connected with the second input end of the power supply impedance stabilizing network, and the first output end of the power supply impedance stabilizing network is also used for being connected with the high-voltage component to be tested through the high-voltage bus during testing.
Optionally, the injection module further comprises a balun transformer;
one end of the balun transformer is connected with the signal source, and the other end of the balun transformer is connected across the positive end and the negative end of the second input end of the power supply impedance stabilizing network.
In another aspect, the present application provides an evaluation system for anti-ripple interference capability, which includes the above evaluation device, an interference source, and a high-voltage component to be tested.
The method, the device and the system for evaluating the anti-ripple interference capability have the following beneficial effects:
obtaining ripple noise data of an interference source; processing the ripple noise data to obtain a mathematical model of the waveform to be fitted; carrying out signal modulation according to the mathematical model to obtain a fitting waveform; injecting a fitting waveform into a high-voltage component to be tested; acquiring performance data and/or operation data output by a high-voltage component to be detected; and determining the anti-interference capacity degree value of the high-voltage component to be tested based on the performance data and/or the operation data. Therefore, the problem that the influence of the ripple noise on the high-voltage component cannot be evaluated can be solved, and an evaluation scheme is provided for the ripple noise immunity of the high-voltage component.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic flowchart of an evaluation method for anti-ripple interference capability according to an embodiment of the present application;
fig. 2 is a schematic diagram of an evaluation apparatus for anti-ripple interference capability according to an embodiment of the present application;
fig. 3 is a schematic structural diagram of a sampling module according to an embodiment of the present application;
FIG. 4 is a schematic structural diagram of an injection module according to an embodiment of the present disclosure;
FIG. 5 is a schematic structural diagram of another injection module provided in an embodiment of the present application;
FIG. 6 is a schematic structural diagram of another injection module provided in an embodiment of the present application;
FIG. 7 is a schematic diagram of a target-fit waveform provided by an embodiment of the present application;
fig. 8 is a schematic diagram of an output waveform of a second output terminal of a power impedance stabilizing network according to an embodiment of the present application;
description of reference numerals:
1-a high voltage power supply; 2-a power supply impedance stabilization network; 3-high voltage bus; 4-an oscilloscope; 5-high voltage differential probe; 6-a signal source; 7-high voltage component to be tested; 8-high voltage power supply load; a 9-balun transformer; 10-calibrating the resistance; 11-interference source.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or server that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
In order to solve the problem that the influence of ripple noise on high-voltage components in a vehicle cannot be evaluated, the method, the device and the system for evaluating the anti-ripple interference capability provided by the embodiment of the application can accurately evaluate the influence of the ripple noise on the components to be tested by firstly extracting the ripple noise and then injecting the ripple noise into the components to be tested, and can also be used for evaluating the anti-interference capability of the components to be tested on high-voltage transient noise, thereby providing a new means for evaluating the electromagnetic compatibility of a high-voltage system, improving the test rectification efficiency, and reducing the test cost and the rectification cost.
The following describes a specific embodiment of the method for evaluating the anti-ripple interference capability of the present application, and fig. 1 is a schematic flow chart of the method for evaluating the anti-ripple interference capability provided in the embodiment of the present application, and the present specification provides the method operation steps as in the embodiment or the flow chart, but more or less operation steps may be included based on conventional or non-inventive labor. The order of steps recited in the embodiments is merely one manner of performing the steps in a multitude of orders and does not represent the only order of execution. Specifically, as shown in fig. 1, the method may include:
s101: ripple noise data of the interference source is obtained.
In an embodiment of the present application, the ripple noise data includes one or more of a frequency, an amplitude, or an internal oscillation frequency of a noise waveform of the interference source; the interference source comprises one or more of an electric drive system, an on-board charger, a direct current power converter, an on-board heater, an air conditioner compressor or a high-voltage battery; the interference source is a component which can actually affect the high-voltage component to be tested in the whole vehicle environment.
An optional embodiment for obtaining ripple noise data of an interference source comprises: and sampling a time domain signal of ripple noise generated by the interference source to obtain one or more of the frequency, the amplitude or the internal oscillation frequency of the noise waveform.
In addition, when a plurality of interference sources exist, each interference source can be independently sampled to obtain noise data of each interference source, and then the following steps S103-S111 are respectively executed on the noise data of each interference source, so that the anti-interference capacity of the high-voltage component to be tested on each interference source can be determined; or integrating the noise data of a plurality of interference sources, executing the steps S103-S111 once, and simulating the anti-interference capability of the high-voltage component to be tested when the plurality of interference sources work simultaneously in the actual environment.
Further, in the process of integrating the noise data of multiple interference sources, the position relationship between each interference source and the high-voltage component to be tested in the vehicle environment is considered, and because the influence of the interference sources on the high-voltage component to be tested may be reduced in a distant position relationship, one or more of the frequency, the amplitude or the internal oscillation frequency of the noise waveforms of different interference sources can be adjusted according to different position relationships, so as to obtain noise data more conforming to reality.
S103: and processing the ripple noise data to obtain a mathematical model of the waveform to be fitted.
S105: and carrying out signal modulation according to the mathematical model to obtain a fitting waveform.
S107: and injecting a fitting waveform into the high-voltage component to be tested.
In the embodiment of the application, ripple noise data is processed, the processing comprises mathematical modeling to obtain a mathematical model of a waveform to be fitted, and the mathematical model comprises a time domain formula and parameters of the ripple noise data; then, signal modulation is carried out according to the mathematical model, and programmable waveform generation is carried out to generate fitting waveform; and then injecting a fitting waveform into the high-voltage component to be tested.
In an optional implementation mode, in combination with the frequency, amplitude, internal oscillation frequency and the like of a noise waveform of an interference source, a Curve Fitting module in matlab software is used for data Fitting, mathematical modeling is performed to obtain a mathematical expression of a ripple noise interference signal, and signal modulation is performed according to the mathematical expression to obtain a Fitting waveform.
In an alternative embodiment, after step S105 and before step S107, in order to make the injected fitting waveform consistent with ripple noise data actually generated by the interference source, the method may further include: and S106, calibrating the fitting waveform. And injecting the calibrated fitting waveform into the high-voltage component to be tested.
S109: and acquiring performance data and/or operation data output by the high-voltage component to be tested.
S111: and determining the anti-interference capacity degree value of the high-voltage component to be tested based on the performance data and/or the operation data.
In the embodiment of the application, in order to evaluate the influence of ripple noise on the high-voltage component to be detected, the anti-interference capability range value of the high-voltage component to be detected is determined based on the performance data and/or the operation data by acquiring the performance data and/or the operation data output by the high-voltage component to be detected. The operation data may include communication data of the high-voltage component to be tested, and the performance data may include bus voltage, output current, and the like.
In an alternative embodiment, the performance data and the operation data output by the high-voltage component to be tested are obtained simultaneously, step S111 may include:
acquiring conventional operation data and conventional performance data of a high-voltage component to be tested;
if the matching degree value of the performance data and the conventional performance data is greater than or equal to a first preset value, and the matching degree value of the operation data and the conventional operation data is greater than or equal to a second preset value, determining the anti-interference capacity degree value of the high-voltage component to be detected as a first capacity degree value;
or; if the matching degree value of the performance data and the conventional performance data is smaller than or equal to a third preset value, or the matching degree value of the operation data and the conventional operation data is smaller than or equal to a fourth preset value, determining that the anti-interference capacity degree value of the high-voltage component to be detected is a second capacity degree value; wherein the first ability degree value is greater than the second ability degree value.
Specifically, the conventional operation data and the conventional performance data can be acquired when the high-voltage component to be measured is in an electromagnetic interference free environment; matching the performance data output by the high-voltage component to be tested with the conventional performance data, matching the operation data output by the high-voltage component to be tested with the conventional operation data, comparing the matching degree value of the performance data and the conventional performance data with the size of a first preset value, and comparing the matching degree value of the operation data and the conventional operation data with the size of a second preset value; here, it is assumed that the range of the capability degree value is [0,1], the first preset value and the second preset value are both 0.9, the third preset value and the fourth preset value are both 0.6, the first capability degree value is 1, and the second capability degree value is 0; when the matching degree value of the performance data and the conventional performance data is more than or equal to 0.9 and the matching degree value of the operation data and the conventional operation data is more than or equal to 0.9, determining that the anti-interference capacity degree value of the high-voltage component to be tested is 1; and determining the degree of interference resistance of the high-voltage component to be tested to be 0 as long as the matching degree value of the performance data and the conventional performance data is less than or equal to 0.6, or the matching degree value of the operation data and the conventional operation data is less than or equal to 0.6.
It should be noted that, in the present application, the anti-noise level of the high-voltage component to be tested can be intuitively represented by quantifying the anti-ripple interference capability, and the determination rule in the above specific embodiment may also be adjusted according to practical applications.
On the other hand, the embodiment of the present application further provides an apparatus for evaluating an anti-ripple interference capability, as shown in fig. 2, the apparatus includes:
a sampling module 201, configured to obtain ripple noise data of an interference source;
the fitting module 202 is configured to process the ripple noise data to obtain a mathematical model of a waveform to be fitted;
the modulation module 203 is used for performing signal modulation according to the mathematical model to obtain a fitting waveform;
the injection module 204 is used for injecting the fitting waveform into the high-voltage component to be tested;
the determining module 205 is configured to acquire performance data and/or operation data output by the high-voltage component to be tested, and determine an anti-interference capability degree value of the high-voltage component to be tested based on the performance data and/or the operation data.
The device and the method for evaluating the anti-ripple interference capability provided by the embodiment of the application are based on the same application concept, can achieve the same technical effect, and are not repeated here.
In an alternative embodiment, as shown in fig. 3, the sampling module 201 includes a high voltage power supply 1, a power impedance stabilizing network 2, a high voltage bus 3, an oscilloscope 4, and a high voltage differential probe 5;
a first input end a of the power impedance stabilizing network 2 is connected with the high-voltage power supply 1, and a first output end c of the power impedance stabilizing network 2 is used for being connected with the interference source 11 through the high-voltage bus 3 during sampling;
one end of the high-voltage differential probe 5 is connected with the oscilloscope 4, and the other end of the high-voltage differential probe 5 is respectively connected with the second output end d of the power supply impedance stabilizing network 2.
Specifically, before evaluating the anti-ripple interference capability of the high-voltage component to be tested, a sampling module 201 is first set up, specifically, a first input end a of a power impedance stabilizing network 2 is connected with a high-voltage power supply 1, and a first output end c is connected with an interference source, so as to sample ripple noise data of the interference source 11, and the specific sampling process may refer to the above method embodiment; the power Impedance Stabilization Network 2 (LISN) may also be referred to as an artificial power Network, and the power Impedance Stabilization Network 2 may isolate radio wave interference, provide stable test Impedance, and perform a filtering function.
Specifically, the settings of the oscilloscope 4 can be referred to as follows: the sampling rate is 50MS/S, and the principle of 5 times of sampling bandwidth and the requirement of sampling precision need to be met; the sampling time base is selected to be 50 mu s, so that the waveform of 3 to 5 periods can be clearly displayed on an oscilloscope interface; the coupling mode is AC coupling, and the AC coupling can accurately obtain the ripple noise voltage value.
In an alternative embodiment, as shown in fig. 3, the sampling module 201 further includes a high voltage power supply load 8;
the high-voltage power supply load 8 is bridged at the positive end and the negative end of the high-voltage power supply 1, and the high-voltage power supply load 8 is positioned between the high-voltage power supply 1 and the power supply impedance stabilizing network 2.
Specifically, one end of the high-voltage power supply load 8 is connected to the positive end of the high-voltage power supply 1 and the positive end of the first input end a of the power impedance stabilizing network 2, and the other end of the high-voltage power supply load 8 is connected to the negative end of the high-voltage power supply 1 and the negative end of the first input end a of the power impedance stabilizing network 2.
In an alternative embodiment, as shown in fig. 4, the modulation module 203 includes a signal source 6; the injection module 204 comprises a high-voltage power supply 1, a power supply impedance stabilizing network 2, a high-voltage bus 3, an oscilloscope 4 and a high-voltage differential probe 5;
the signal source 6 is connected with the second input end b of the power impedance stabilizing network 2, and the first output end c of the power impedance stabilizing network 2 is also used for being connected with the high-voltage component 7 to be tested through the high-voltage bus 3 during testing.
Specifically, after the sampling module 201 finishes sampling, the fitting module 202 processes ripple noise data to obtain a mathematical model of a waveform to be fitted; then a modulation module 203 and an injection module 204 are set up, specifically, the first output end c of the power supply impedance stabilizing network 2 is connected with the high-voltage component 7 to be tested, the signal source 6 generates an interference waveform, the interference waveform is injected into the high-voltage component 7 to be tested through the power supply impedance stabilizing network 2 and the high-voltage bus 3, and finally, the performance and state data of the high-voltage component 7 to be tested are monitored and analyzed through the oscilloscope 4 and the high-voltage differential probe 5, so that the evaluation of the anti-ripple interference capability of the high-voltage component 7 to be tested is completed. The evaluation device that this application provided needs earlier to calibrate each instrument before the test, ensures that all instruments are in normal operating condition, guarantees the accuracy of test.
In an alternative embodiment, the supply impedance stabilization network 2 comprises a first supply impedance stabilization sub-network and a second supply impedance stabilization sub-network;
the first power impedance stabilizing sub-network and the second power impedance stabilizing sub-network are identical in structure and are symmetrically arranged.
Specifically, as shown in fig. 3 or 4, the first supply impedance stabilizing sub-network includes a first resistor R1, a second resistor R2, a first capacitor C1, a second capacitor C2, and a first inductor L1;
the first resistor R1, the first capacitor C1 and the first inductor L1 are connected in series, and the second resistor R2 and the second capacitor C2 are connected in parallel with the first resistor R1, the first capacitor C1 and the first inductor L1 which are connected in series;
one end of the second resistor R2 is the positive end of the first input end a of the power impedance stabilizing network 2, and the other end of the second resistor R2 is grounded; one end of the first inductor L1 connected to the first capacitor C1 is the positive end of the first output end C of the supply impedance stabilizing network 2; one end of the first capacitor C1 connected to the first resistor R1 is the positive end of the second input terminal b of the supply impedance stabilizing network 2.
Specifically, the second supply impedance stabilizing sub-network comprises a third resistor R3, a fourth resistor R4, a third capacitor C3, a fourth capacitor C4 and a second inductor L2;
the third resistor R3, the third capacitor C3 and the second inductor L2 are connected in series, and the fourth resistor R4 and the fourth capacitor C4 are connected in parallel with the third resistor R3, the third capacitor C3 and the second inductor L2 which are connected in series;
one end of the fourth resistor R4 is the negative terminal of the first input terminal a of the power impedance stabilizing network 2, and the other end of the fourth resistor R4 is grounded; one end of the second inductor L2 connected to the third capacitor C3 is the negative end of the first output end C of the power impedance stabilizing network 2; one end of the third capacitor C3 connected to the third resistor R3 is the negative end of the second input terminal b of the supply impedance stabilizing network 2.
In an alternative embodiment, the evaluation device further comprises a shielding box; the shielding box is used for placing the power supply impedance stabilizing network 2.
In an alternative embodiment, as shown in fig. 3 or fig. 4, the sampling module 201 and the injection module 204 further include a fifth resistor R5 and a sixth resistor R6;
one end of the fifth resistor R5 is connected to the signal source 6 and the positive end of the second input end b of the power impedance stabilizing network 2, respectively, and the other end of the fifth resistor R5 is grounded;
one end of the sixth resistor R6 is connected to the signal source 6 and the negative end of the second input terminal b of the power impedance stabilizing network 2, and the other end of the sixth resistor R6 is grounded.
Specifically, the resistance values of the fifth resistor R5 and the sixth resistor R6 are 50 Ω.
It should be noted that the structure of the injection module 204 shown in fig. 4 is used for detecting the influence of the differential mode, and therefore, in an alternative embodiment, the injection module 204 further includes a balun 9; the balun transformer 9 shunts the interference signals output by the signal source 6 to be respectively injected into positive and negative ends (HV +/HV-) of the high-voltage component 7 to be tested;
specifically, as shown in fig. 4, one end of the balun transformer 9 is connected to the signal source 6, and the other end of the balun transformer 9 is connected across the positive and negative ends of the second input end b of the power impedance stabilizing network 2.
If an evaluation device is used to detect the influence of the common mode, the balun transformer 9 is not required, and the evaluation device is constructed as shown in fig. 5.
In an alternative embodiment, as shown in fig. 6, the injection module 204 further includes a calibration resistor 10, and the calibration resistor 10 is connected to the first output terminal c of the power impedance stabilizing network 2 through the high-voltage bus 3.
Specifically, before the anti-ripple interference capability of the high-voltage component 7 to be tested is evaluated, the calibration resistor 10 is connected with the positive end and the negative end of the first output end c of the power supply impedance stabilizing network 2 through the high-voltage bus 3, the oscilloscope 4 and the high-voltage differential probe 5 are connected with the second output end d of the power supply impedance stabilizing network 2, the interference waveform output by the signal source 6 is calibrated through the calibration resistor 10, and the waveform of the oscilloscope 4 is observed at the same time, so that the waveform of the second output end d is consistent with the ripple noise data actually generated by the interference source 11 as much as possible. For example, after calibration is performed by the calibration resistor 10, the target fitting waveform modulated by the signal source 6 is shown in fig. 7, and the waveform of the second output end d detected by the oscilloscope 4 is shown in fig. 8, so that the calibration resistor 10 can make the injected fitting waveform have high consistency with ripple noise data actually generated by the interference source 11.
On the other hand, the embodiment of the present application further provides an evaluation system for anti-ripple interference capability, which includes the evaluation device, the interference source and the high-voltage component to be tested in any of the above optional embodiments.
The evaluation system for the anti-ripple interference capability provided by the embodiment of the application is based on the same application concept as the device and the method embodiment.
In summary, according to the method, the device and the system for evaluating the anti-ripple interference capability provided by the embodiment of the application, the ripple noise data is extracted and injected into the high-voltage component to be tested, so that the influence of the ripple noise in the high-voltage system of the whole vehicle on each high-voltage component can be evaluated, and the purpose of evaluating the anti-ripple noise interference capability of each high-voltage component is further achieved.
It should be noted that: the sequence of the embodiments of the present application is only for description, and does not represent the advantages and disadvantages of the embodiments. And specific embodiments thereof have been described above. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results.
The above description is only exemplary of the present application and should not be taken as limiting the present application, as any modification, equivalent replacement, or improvement made within the spirit and principle of the present application should be included in the protection scope of the present application.

Claims (10)

1. A method for evaluating anti-ripple interference capability, comprising:
acquiring ripple noise data of an interference source;
processing the ripple noise data to obtain a mathematical model of a waveform to be fitted;
carrying out signal modulation according to the mathematical model to obtain a fitting waveform;
injecting the fitting waveform into a high-voltage component to be tested;
acquiring performance data and/or operation data output by the high-voltage component to be detected;
and determining the anti-interference capacity degree value of the high-voltage component to be tested based on the performance data and/or the operation data.
2. The method of claim 1, wherein the ripple noise data comprises one or more of a frequency, an amplitude, or an internal oscillation frequency of a noise waveform of the interferer; the interference source comprises one or more of an electric drive system, an on-board charger, a direct current power converter, an on-board heater, an air conditioner compressor or a high-voltage battery;
the acquiring ripple noise data of the interference source comprises:
and sampling ripple noise generated by the interference source to obtain one or more of the frequency, the amplitude or the internal oscillation frequency of the noise waveform.
3. The method of claim 1, wherein after the signal modulation according to the mathematical model to obtain a fitting waveform and before the injecting the fitting waveform into the high-voltage component to be tested, further comprising:
and calibrating the fitting waveform.
4. The method according to claim 3, wherein said determining a tamper resistance capability measure value of said high voltage component under test based on said performance data and/or operational data comprises:
acquiring conventional operation data and conventional performance data of the high-voltage component to be tested;
if the matching degree value of the performance data and the conventional performance data is greater than or equal to a first preset value, and the matching degree value of the operation data and the conventional operation data is greater than or equal to a second preset value, determining that the anti-interference capacity degree value of the high-voltage component to be detected is a first capacity degree value; or; if the matching degree value of the performance data and the conventional performance data is smaller than or equal to a third preset value, or the matching degree value of the operation data and the conventional operation data is smaller than or equal to a fourth preset value, determining that the anti-interference capacity degree value of the high-voltage component to be detected is a second capacity degree value; wherein the first capability degree value is greater than the second capability degree value.
5. An apparatus for evaluating an anti-ripple interference capability, comprising:
the sampling module is used for acquiring ripple noise data of the interference source;
the fitting module is used for processing the ripple noise data to obtain a mathematical model of a waveform to be fitted;
the modulation module is used for carrying out signal modulation according to the mathematical model to obtain a fitting waveform;
the injection module is used for injecting the fitting waveform into the high-voltage component to be tested;
and the determining module is used for acquiring performance data and/or operation data output by the high-voltage component to be tested and determining the anti-interference capacity degree value of the high-voltage component to be tested based on the performance data and/or the operation data.
6. The device of claim 5, wherein the sampling module comprises a high voltage power supply, a power supply impedance stabilization network, a high voltage bus, an oscilloscope, and a high voltage differential probe;
the first input end of the power supply impedance stabilizing network is connected with the high-voltage power supply, and the first output end of the power supply impedance stabilizing network is used for being connected with an interference source through the high-voltage bus during sampling;
one end of the high-voltage differential probe is connected with the oscilloscope, and the other end of the high-voltage differential probe is respectively connected with the second output end of the power supply impedance stabilizing network.
7. The apparatus of claim 6, wherein the sampling module further comprises a high voltage power supply load;
the high-voltage power supply load is bridged at the positive end and the negative end of the high-voltage power supply, and the high-voltage power supply load is positioned between the high-voltage power supply and the power supply impedance stabilizing network.
8. The apparatus of claim 6, wherein the modulation module comprises a signal source; the injection module comprises the high-voltage power supply, the power supply impedance stabilizing network, the high-voltage bus, the oscilloscope and the high-voltage differential probe;
the signal source is connected with the second input end of the power supply impedance stabilizing network, and the first output end of the power supply impedance stabilizing network is also used for being connected with the high-voltage component to be tested through the high-voltage bus during testing.
9. The apparatus of claim 8, wherein the injection module further comprises a balun;
one end of the balun transformer is connected with the signal source, and the other end of the balun transformer is connected across the positive end and the negative end of the second input end of the power supply impedance stabilizing network.
10. An evaluation system for anti-ripple interference capability, comprising the evaluation device of any one of claims 5 to 9, the interference source, and the high-voltage component to be tested.
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