CN113433415A - Automatic test system and method for super capacitor module - Google Patents
Automatic test system and method for super capacitor module Download PDFInfo
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- CN113433415A CN113433415A CN202110783588.2A CN202110783588A CN113433415A CN 113433415 A CN113433415 A CN 113433415A CN 202110783588 A CN202110783588 A CN 202110783588A CN 113433415 A CN113433415 A CN 113433415A
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- 239000003990 capacitor Substances 0.000 title claims abstract description 149
- 238000000034 method Methods 0.000 title claims abstract description 19
- 239000000178 monomer Substances 0.000 claims abstract description 103
- 238000007599 discharging Methods 0.000 claims description 13
- 230000007547 defect Effects 0.000 abstract description 4
- 238000004088 simulation Methods 0.000 abstract description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 238000004146 energy storage Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
- G01R31/016—Testing of capacitors
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
- G05B19/058—Safety, monitoring
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/10—Plc systems
- G05B2219/16—Plc to applications
- G05B2219/163—Domotique, domestic, home control, automation, smart, intelligent house
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- Engineering & Computer Science (AREA)
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- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Automation & Control Theory (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
An automatic test system and method for a super capacitor module comprises: the system comprises a path management module, a PLC (programmable logic controller), a voltage sensor, a current sensor, a signal lamp and a plurality of super capacitor monomers; the voltage sensors correspond to the super capacitor monomers one by one, and the voltage sensors are electrically connected with the corresponding super capacitor monomers; the current sensors correspond to the super capacitor monomers one by one, and the current sensors are electrically connected with the corresponding super capacitor monomers; the signal lamp is electrically connected with the PLC, and the signal lamp is used for indicating whether the test of the super capacitor single body is qualified or not under the control of the PLC; the defects of low efficiency, low reliability and high cost caused by the fact that the simulation application state test of the super capacitor module in the prior art is basically performed manually are effectively overcome.
Description
Technical Field
The application relates to the technical field of super capacitor modules, in particular to an automatic test system and method for a super capacitor module.
Background
The specific details of the supercapacitor module structure depend on the application and use of the supercapacitor. These materials may be slightly different due to manufacturer or specific application requirements. The common feature of all supercapacitors is that they comprise a positive electrode, a negative electrode, and a separator between the two electrodes, with the electrolyte filling the pores of the two electrodes and the separator. The super capacitor is generally used for forming a super capacitor module through series-parallel connection, is used in the fields of power systems, war industry, new energy and the like, is used as an energy storage device to supply power to a load, and basically has different sizes including voltage, capacity and the like according to use occasions. In the production process, the simulation application state test of the super capacitor module is always a difficult problem, and the current state is basically manual operation.
The current manual operation mainly shows the problems of low efficiency, low reliability, high cost and the like.
Disclosure of Invention
In order to solve the problems, the application provides an automatic test system and a transmission method for a super capacitor module, and the defects of low efficiency, low reliability and high cost caused by the fact that the simulation application state test of the super capacitor module in the prior art is basically performed manually are effectively overcome.
In order to overcome the defects in the prior art, the application provides a solution for an automatic test system and a transmission method of a super capacitor module, which comprises the following specific steps:
an automatic test system for a super capacitor module comprises:
the system comprises a path management module, a PLC (programmable logic controller), a voltage sensor, a current sensor, a signal lamp and a plurality of super capacitor monomers;
the voltage sensors correspond to the super capacitor monomers one by one, and the voltage sensors are electrically connected with the corresponding super capacitor monomers;
the current sensors correspond to the super capacitor monomers one by one, and the current sensors are electrically connected with the corresponding super capacitor monomers;
the signal lamp is electrically connected with the PLC, and the signal lamp is used for indicating whether the test of the super capacitor single body is qualified or not under the control of the PLC;
the PLC is electrically connected with a path management module, and the path management module is used for charging and discharging each super capacitor monomer under the control of the PLC and transmitting the information of each super capacitor monomer to the PLC;
and the current sensor and the voltage sensor are both electrically connected with the path management module.
The voltage sensor is used for collecting voltage values of the corresponding super capacitor monomers and transmitting the voltage values to the path management module, and the current sensor is used for collecting charge and discharge current values of the corresponding super capacitor monomers and transmitting the charge and discharge current values to the path management module.
The path management module comprises an MCU chip which is in control connection with the PLC;
the first circuit breakers correspond to the super capacitor monomers one by one, are connected between the corresponding super capacitor monomers and a charging power supply in series, and are electrically connected with the MCU chip;
the second circuit breaker is in one-to-one correspondence with the super capacitor monomers, the second circuit breaker is connected in series between the corresponding super capacitor monomers and the load, and the second circuit breaker is electrically connected with the MCU chip. The MCU chip is used for controlling the opening and closing of the first circuit breaker and the second circuit breaker so as to charge and discharge the corresponding super capacitor monomer.
The signal lamps comprise a red signal lamp and a green signal lamp. And when the red signal lamp is turned on, the corresponding super capacitor single body is unqualified in test, and when the green signal lamp is turned on, the corresponding super capacitor single body is qualified in test.
And the MCU chip stores the capacitance values of all the super capacitor monomers stored in advance.
A method for an automatic test system of a super capacitor module comprises the following processes:
step 1: when a charging power supply is needed to charge the super capacitor single body, the PLC transmits a charging instruction to the MCU chip;
step 2: the MCU chip controls the circuit breaker to be closed to enable the charging power supply to charge the super capacitor monomer;
and step 3: the voltage sensor transmits a real-time voltage value of the corresponding super capacitor monomer to the MCU chip in real time, and the current sensor transmits a charging current value of the corresponding super capacitor monomer to the MCU chip in real time;
and 4, step 4: the MCU chip forwards the real-time voltage value and the charging current value of the super capacitor monomer and the capacitance value of the super capacitor monomer to the PLC controller, the PLC controller starts a timer to time when receiving the real-time voltage value and the charging current value of the super capacitor monomer of the first batch and the capacitance value of the super capacitor monomer, and the timed time is taken as the charging duration;
and 5: after receiving the real-time voltage value and the charging current value of the super capacitor monomer and the capacitance value of the super capacitor monomer, the PLC judges whether the super capacitor monomer meets the standard test requirement or not by combining the charging duration;
step 6: and if the standard test requirements are met, the PLC controller controls the corresponding green signal lamp to be lightened, and if the standard test requirements are not met, the PLC controller controls the corresponding red signal lamp to be lightened.
The method for the automatic test system of the super capacitor module further comprises the following processes:
step 1-1: when a charging power supply is needed to discharge the super capacitor single body, the PLC transmits a discharging instruction to the MCU chip;
step 1-2: the MCU chip controls a circuit breaker II to be closed to discharge the super capacitor monomer;
step 1-3: the voltage sensor transmits a real-time voltage value of the corresponding super capacitor monomer to the MCU chip in real time, and the current sensor transmits a discharge current value of the corresponding super capacitor monomer to the MCU chip in real time;
step 1-4: the MCU chip forwards the real-time voltage value, the charging current value and the capacitance capacity value of the super capacitor monomer to the PLC controller, the PLC controller starts a second timer to time when receiving the real-time voltage value, the discharging current value and the capacitance capacity value of the super capacitor monomer of the first batch, and the timed time is used as the discharging time;
step 1-5: after receiving the real-time voltage value and the discharge current value of the super capacitor monomer and the capacitance value of the super capacitor monomer, the PLC judges whether the super capacitor monomer meets the standard test requirement or not by combining the discharge duration;
step 1-6: and if the standard test requirements are met, the PLC controller controls the corresponding green signal lamp to be lightened, and if the standard test requirements are not met, the PLC controller controls the corresponding red signal lamp to be lightened.
The invention has the beneficial effects that:
the invention automatically measures the super capacitor module within a certain voltage range and a certain capacity range, realizes semi-automatic test, and the personnel only need to clamp the module on a system, and the test system automatically tests the relevant performances of the module, including charging and discharging time, capacity, voltage balance condition and the like, and automatically switches to module discharge, and judges the result through a traffic light after the test is finished, and the result is a green light if the result is qualified, and the result is a red light if the result is not qualified. The defects of low efficiency, low reliability and high cost caused by the fact that the simulation application state test of the super capacitor module in the prior art is basically performed manually are effectively overcome.
Drawings
Fig. 1 is a partial flowchart of a method of an automatic test system for a super capacitor module according to the present application.
Fig. 2 is another partial flowchart of the method of the automatic test system for a super capacitor module according to the present application.
Detailed Description
The present application will be further described with reference to the accompanying drawings and examples.
As shown in fig. 1-2, the automatic test system for super capacitor module includes:
the system comprises a path management module, a PLC (programmable logic controller), a voltage sensor, a current sensor, a signal lamp and a plurality of super capacitor monomers;
the voltage sensors correspond to the super capacitor monomers one by one, and the voltage sensors are electrically connected with the corresponding super capacitor monomers;
the current sensors correspond to the super capacitor monomers one by one, and the current sensors are electrically connected with the corresponding super capacitor monomers;
the signal lamp is electrically connected with the PLC, and the signal lamp is used for indicating whether the test of the super capacitor single body is qualified or not under the control of the PLC;
the PLC is electrically connected with a path management module, and the path management module is used for charging and discharging each super capacitor monomer under the control of the PLC and transmitting the information of each super capacitor monomer to the PLC;
and the current sensor and the voltage sensor are both electrically connected with the path management module.
The voltage sensor is used for collecting voltage values of the corresponding super capacitor monomers and transmitting the voltage values to the path management module, and the current sensor is used for collecting charge and discharge current values of the corresponding super capacitor monomers and transmitting the charge and discharge current values to the path management module.
The path management module comprises an MCU chip which is in control connection with the PLC;
the first circuit breakers correspond to the super capacitor monomers one by one, are connected between the corresponding super capacitor monomers and a charging power supply in series, and are electrically connected with the MCU chip;
the second circuit breaker is in one-to-one correspondence with the super capacitor monomers, the second circuit breaker is connected in series between the corresponding super capacitor monomers and the load, and the second circuit breaker is electrically connected with the MCU chip. The MCU chip is used for controlling the opening and closing of the first circuit breaker and the second circuit breaker so as to charge and discharge the corresponding super capacitor monomer.
The signal lamps comprise a red signal lamp and a green signal lamp. And when the red signal lamp is turned on, the corresponding super capacitor single body is unqualified in test, and when the green signal lamp is turned on, the corresponding super capacitor single body is qualified in test.
And the MCU chip stores the capacitance values of all the super capacitor monomers stored in advance.
A method for an automatic test system of a super capacitor module comprises the following processes:
step 1: when a charging power supply is needed to charge the super capacitor single body, the PLC transmits a charging instruction to the MCU chip;
step 2: the MCU chip controls the circuit breaker to be closed to enable the charging power supply to charge the super capacitor monomer;
and step 3: the voltage sensor transmits a real-time voltage value of the corresponding super capacitor monomer to the MCU chip in real time, and the current sensor transmits a charging current value of the corresponding super capacitor monomer to the MCU chip in real time;
and 4, step 4: the MCU chip forwards the real-time voltage value and the charging current value of the super capacitor monomer and the capacitance value of the super capacitor monomer to the PLC controller, the PLC controller starts a timer to time when receiving the real-time voltage value and the charging current value of the super capacitor monomer of the first batch and the capacitance value of the super capacitor monomer, and the timed time is taken as the charging duration;
and 5: after receiving the real-time voltage value and the charging current value of the super capacitor monomer and the capacitance value of the super capacitor monomer, the PLC judges whether the super capacitor monomer meets the standard test requirement or not by combining the charging duration;
step 6: and if the standard test requirements are met, the PLC controller controls the corresponding green signal lamp to be lightened, and if the standard test requirements are not met, the PLC controller controls the corresponding red signal lamp to be lightened.
The method for the automatic test system of the super capacitor module further comprises the following processes:
step 1-1: when a charging power supply is needed to discharge the super capacitor single body, the PLC transmits a discharging instruction to the MCU chip;
step 1-2: the MCU chip controls a circuit breaker II to be closed to discharge the super capacitor monomer;
step 1-3: the voltage sensor transmits a real-time voltage value of the corresponding super capacitor monomer to the MCU chip in real time, and the current sensor transmits a discharge current value of the corresponding super capacitor monomer to the MCU chip in real time;
step 1-4: the MCU chip forwards the real-time voltage value, the charging current value and the capacitance capacity value of the super capacitor monomer to the PLC controller, the PLC controller starts a second timer to time when receiving the real-time voltage value, the discharging current value and the capacitance capacity value of the super capacitor monomer of the first batch, and the timed time is used as the discharging time;
step 1-5: after receiving the real-time voltage value and the discharge current value of the super capacitor monomer and the capacitance value of the super capacitor monomer, the PLC judges whether the super capacitor monomer meets the standard test requirement or not by combining the discharge duration;
step 1-6: and if the standard test requirements are met, the PLC controller controls the corresponding green signal lamp to be lightened, and if the standard test requirements are not met, the PLC controller controls the corresponding red signal lamp to be lightened.
The present application has been described above in an illustrative manner by way of embodiments, and it will be understood by those skilled in the art that the present disclosure is not limited to the embodiments described above, and various changes, modifications and substitutions can be made without departing from the scope of the present application.
Claims (7)
1. The utility model provides a super capacitor module automatic test system which characterized in that includes:
the system comprises a path management module, a PLC (programmable logic controller), a voltage sensor, a current sensor, a signal lamp and a plurality of super capacitor monomers;
the voltage sensors correspond to the super capacitor monomers one by one, and the voltage sensors are electrically connected with the corresponding super capacitor monomers;
the current sensors correspond to the super capacitor monomers one by one, and the current sensors are electrically connected with the corresponding super capacitor monomers;
the signal lamp is electrically connected with the PLC, and the signal lamp is used for indicating whether the test of the super capacitor single body is qualified or not under the control of the PLC;
the PLC is electrically connected with a path management module, and the path management module is used for charging and discharging each super capacitor monomer under the control of the PLC and transmitting the information of each super capacitor monomer to the PLC;
and the current sensor and the voltage sensor are both electrically connected with the path management module.
2. The automatic test system for the super capacitor module according to claim 1, wherein the voltage sensor is used for collecting a voltage value of the super capacitor monomer corresponding to the voltage sensor and transmitting the voltage value to the path management module, and the current sensor is used for collecting a charge and discharge current value of the super capacitor monomer corresponding to the current sensor and transmitting the charge and discharge current value to the path management module.
3. The automatic test system for the super capacitor module according to claim 1, wherein the path management module comprises an MCU chip in control connection with a PLC controller;
the first circuit breakers correspond to the super capacitor monomers one by one, are connected between the corresponding super capacitor monomers and a charging power supply in series, and are electrically connected with the MCU chip;
the second circuit breaker is in one-to-one correspondence with the super capacitor monomers, the second circuit breaker is connected in series between the corresponding super capacitor monomers and the load, and the second circuit breaker is electrically connected with the MCU chip. The MCU chip is used for controlling the opening and closing of the first circuit breaker and the second circuit breaker so as to charge and discharge the corresponding super capacitor monomer.
4. The automatic test system for the supercapacitor modules according to claim 1, wherein the signal lamps comprise red signal lamps and green signal lamps. And when the red signal lamp is turned on, the corresponding super capacitor single body is unqualified in test, and when the green signal lamp is turned on, the corresponding super capacitor single body is qualified in test.
5. The automatic test system for the super capacitor module according to claim 1, wherein the MCU chip stores the capacitor capacity value of each super capacitor unit stored in advance.
6. A method for an automatic test system of a super capacitor module is characterized by comprising the following processes:
step 1: when a charging power supply is needed to charge the super capacitor single body, the PLC transmits a charging instruction to the MCU chip;
step 2: the MCU chip controls the circuit breaker to be closed to enable the charging power supply to charge the super capacitor monomer;
and step 3: the voltage sensor transmits a real-time voltage value of the corresponding super capacitor monomer to the MCU chip in real time, and the current sensor transmits a charging current value of the corresponding super capacitor monomer to the MCU chip in real time;
and 4, step 4: the MCU chip forwards the real-time voltage value and the charging current value of the super capacitor monomer and the capacitance value of the super capacitor monomer to the PLC controller, the PLC controller starts a timer to time when receiving the real-time voltage value and the charging current value of the super capacitor monomer of the first batch and the capacitance value of the super capacitor monomer, and the timed time is taken as the charging duration;
and 5: after receiving the real-time voltage value and the charging current value of the super capacitor monomer and the capacitance value of the super capacitor monomer, the PLC judges whether the super capacitor monomer meets the standard test requirement or not by combining the charging duration;
step 6: and if the standard test requirements are met, the PLC controller controls the corresponding green signal lamp to be lightened, and if the standard test requirements are not met, the PLC controller controls the corresponding red signal lamp to be lightened.
7. The method for the automatic test system of the super capacitor module as claimed in claim 6, further comprising the following steps:
step 1-1: when a charging power supply is needed to discharge the super capacitor single body, the PLC transmits a discharging instruction to the MCU chip;
step 1-2: the MCU chip controls a circuit breaker II to be closed to discharge the super capacitor monomer;
step 1-3: the voltage sensor transmits a real-time voltage value of the corresponding super capacitor monomer to the MCU chip in real time, and the current sensor transmits a discharge current value of the corresponding super capacitor monomer to the MCU chip in real time;
step 1-4: the MCU chip forwards the real-time voltage value, the charging current value and the capacitance capacity value of the super capacitor monomer to the PLC controller, the PLC controller starts a second timer to time when receiving the real-time voltage value, the discharging current value and the capacitance capacity value of the super capacitor monomer of the first batch, and the timed time is used as the discharging time;
step 1-5: after receiving the real-time voltage value and the discharge current value of the super capacitor monomer and the capacitance value of the super capacitor monomer, the PLC judges whether the super capacitor monomer meets the standard test requirement or not by combining the discharge duration;
step 1-6: and if the standard test requirements are met, the PLC controller controls the corresponding green signal lamp to be lightened, and if the standard test requirements are not met, the PLC controller controls the corresponding red signal lamp to be lightened.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110783588.2A CN113433415A (en) | 2021-07-12 | 2021-07-12 | Automatic test system and method for super capacitor module |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110783588.2A CN113433415A (en) | 2021-07-12 | 2021-07-12 | Automatic test system and method for super capacitor module |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115436824A (en) * | 2022-11-08 | 2022-12-06 | 苏州浪潮智能科技有限公司 | Super capacitor test method and device, electronic equipment and storage medium |
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Application publication date: 20210924 |