CN113392936A - Oven fault diagnosis method based on machine learning - Google Patents

Oven fault diagnosis method based on machine learning Download PDF

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CN113392936A
CN113392936A CN202110777869.7A CN202110777869A CN113392936A CN 113392936 A CN113392936 A CN 113392936A CN 202110777869 A CN202110777869 A CN 202110777869A CN 113392936 A CN113392936 A CN 113392936A
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CN113392936B (en
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李清华
张仁军
林涛
黄伟杰
艾克华
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Sichuan Yingchuangli Electronic Technology Co Ltd
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Abstract

The invention discloses an oven fault diagnosis method based on machine learning, which comprises the following steps: s1, acquiring temperature information of heating areas of a faultless oven in a plurality of heating states to form a characteristic data set PA(ii) a S2, acquiring temperature information of heating areas of the fault oven in a plurality of heating states to form a characteristic data set PB(ii) a S3, adding a label to each feature data of the two feature data sets; s4, constructing a classifier by adopting a machine learning method, and training the classifier to obtain a mature classifier; and S5, carrying out fault diagnosis on the oven to be detected based on the trained classifier, and judging whether the oven to be detected has faults or not. The invention can realize the purpose of realizing the temperature fluctuation of different heating points based on the high temperature condition of the oven, the temperature fluctuation condition within a certain time and the temperature fluctuation condition of different heating pointsThe method has higher diagnosis accuracy for the fault diagnosis of the oven.

Description

Oven fault diagnosis method based on machine learning
Technical Field
The invention relates to oven fault diagnosis, in particular to an oven fault diagnosis method based on machine learning.
Background
The oven is a common household appliance in people's life, and before the oven leaves a factory from a manufacturer or after the oven is returned to the factory for maintenance, fault diagnosis needs to be carried out on the oven frequently to judge whether the oven can be used as a qualified product leaving the factory or a qualified product for maintenance; however, at present, the diagnosis method is often to see whether the temperature is higher than the threshold value when the oven is operated at the set temperature.
However, this diagnostic method can diagnose only a high temperature abnormality, cannot diagnose a temperature fluctuation abnormality at different heating points in the heating region, and cannot diagnose a temperature fluctuation abnormality during the heating continuation.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides an oven fault diagnosis method based on machine learning, which can realize fault diagnosis of an oven based on the high-temperature condition of the oven, the temperature fluctuation condition within a certain time and the temperature fluctuation conditions of different heating points and has higher diagnosis accuracy.
The purpose of the invention is realized by the following technical scheme: a machine learning-based oven fault diagnosis method comprises the following steps:
s1, collecting temperature information of heating areas of a plurality of fault-free ovens in a heating state to obtain temperature data of each heating area of the fault-free ovens, extracting characteristic data of each fault-free oven according to the collected information to form a characteristic data set PA
S2, acquiring temperature information of the heating areas of the faulty ovens in a plurality of heating states to obtain temperature data of the heating areas of the faulty ovens, extracting characteristic data of each faulty oven according to the acquired information to form a characteristic data set PB
S3, characteristic data set P is subjected toAIs added with a label y of 0, and the feature data set P is addedBAdding a label to each feature data in1, when the label is y;
s4, adopting a machine learning method to construct a classifier, and according to the feature data set PAAnd a feature data set PBTraining the classifier by the data to obtain a trained classifier;
and S5, carrying out fault diagnosis on the oven to be detected based on the trained classifier, and judging whether the oven to be detected has faults or not.
The step S1 includes the sub-steps of:
s101, for any fault-free oven, arranging a temperature detection array in a heating area of the fault-free oven, wherein the temperature detection array comprises m rows and n columns of m × n temperature sensors; starting a fault-free oven, and entering a heating state after the fault-free oven is preheated for a set time;
s102, temperature acquisition is carried out on a heating area of the faultless oven in a heating state by using a temperature detection array, and an obtained temperature information matrix KA
Figure BDA0003156445740000021
Wherein,
Figure BDA0003156445740000022
the signal is acquired by a temperature sensor in the ith row and the jth column, i is 1,2, and m, j is 1,2, n;
s103, calculating a temperature information matrix KAAverage value of temperature in
Figure BDA0003156445740000023
Figure BDA0003156445740000024
Calculating the discrete degree p of the detection results of different temperature sensorsA
Figure BDA0003156445740000025
S104, repeatedly executing the steps S102 to S103 for T times at different moments in the heating state of the fault-free oven to obtain T temperature average values
Figure BDA0003156445740000026
And calculating T discrete degrees
Figure BDA0003156445740000027
Wherein
Figure BDA0003156445740000028
Represents the average temperature value obtained by the t repeated execution process,
Figure BDA0003156445740000029
represents the discrete degree obtained by the repeated execution process for the T time, wherein T is 1, 2.
S105, constructing characteristic data of the fault-free oven
Figure BDA00031564457400000210
S106, repeating the steps S101 to S105 for each fault-free oven to obtain corresponding characteristic data
Figure BDA00031564457400000211
Forming a feature data set PA
Figure BDA00031564457400000212
Where M represents the total number of non-faulty ovens.
The step S2 includes the following sub-steps:
s201, for any fault oven, arranging a temperature detection array in a heating area of the fault oven, wherein the temperature detection array comprises m rows and n columns of m × n temperature sensors; starting a fault oven, and entering a heating state after the fault oven is preheated for a set time;
s202, utilizing temperature probeMeasuring array, collecting temperature of heating area of fault oven in heating state to obtain temperature information matrix KB
Figure BDA0003156445740000031
Wherein,
Figure BDA0003156445740000032
the signal is acquired by a temperature sensor in the ith row and the jth column, i is 1,2, and m, j is 1,2, n;
s203, calculating a temperature information matrix KBAverage value of temperature in
Figure BDA0003156445740000033
Figure BDA0003156445740000034
Calculating the discrete degree p of the detection results of different temperature sensorsB
Figure BDA0003156445740000035
S204, repeatedly executing the steps S202 to S203 for T times at different moments in the heating state of the fault oven to obtain T temperature average values
Figure BDA0003156445740000036
And calculating T discrete degrees
Figure BDA0003156445740000037
Wherein
Figure BDA0003156445740000038
Represents the average temperature value obtained by the t repeated execution process,
Figure BDA0003156445740000039
represents the discrete degree obtained by the repeated execution process for the T time, wherein T is 1, 2.
S205, constructing characteristic data of a fault oven
Figure BDA00031564457400000310
S206, for each fault oven, repeating the steps S201 to S205 to obtain corresponding characteristic data
Figure BDA00031564457400000311
Forming a feature data set PB
Figure BDA00031564457400000312
Where N represents the total number of failed ovens.
The step S5 includes:
s501, for an oven to be tested, arranging a temperature detection array in a heating area of the oven, wherein the temperature detection array comprises m rows and n columns of m × n temperature sensors; starting the oven to be tested, and entering a heating state after the oven to be tested is preheated for a set time;
s502, temperature acquisition is carried out on a heating area of the oven to be detected in a heating state by using a temperature detection array, and an obtained temperature information matrix KC
Figure BDA0003156445740000041
Wherein,
Figure BDA0003156445740000042
the signal is acquired by a temperature sensor in the ith row and the jth column, i is 1,2, and m, j is 1,2, n;
s503, judging whether temperature information larger than a set threshold exists in the signals collected by the temperature sensors:
if the temperature information larger than the set threshold exists, monitoring the temperature sensor corresponding to the temperature information within the duration h seconds, if the temperature value output by the temperature sensor within the h seconds does not recover below the set threshold, judging that the oven to be tested is in failure, and if the temperature value output by the temperature sensor within the h seconds recovers below the set threshold, entering the step S504;
if the temperature information larger than the set threshold does not exist, directly entering step S504;
s504, calculating a temperature information matrix KCAverage value of temperature in
Figure BDA0003156445740000043
Figure BDA0003156445740000044
Calculating the discrete degree p of the detection results of different temperature sensorsC
Figure BDA0003156445740000045
S505, repeatedly executing the steps S502 to S504 for T times at different moments of the oven to be tested in the heating state to obtain T temperature average values
Figure BDA0003156445740000046
And calculating T discrete degrees
Figure BDA0003156445740000047
Wherein
Figure BDA0003156445740000048
Represents the average temperature value obtained by the t repeated execution process,
Figure BDA0003156445740000049
represents the discrete degree obtained by the repeated execution process for the T time, wherein T is 1, 2.
S205, establishing characteristic data of the oven to be tested
Figure BDA00031564457400000410
S206. calculation
Figure BDA00031564457400000411
Degree of dispersion Q:
Figure BDA00031564457400000412
wherein,
Figure BDA00031564457400000413
judging whether the dispersion degree Q is larger than a preset threshold value:
if so, determining that the oven to be tested has a fault;
if not, go to step S207;
s207, feature data are combined
Figure BDA0003156445740000051
And sending the data into a classifier with mature training, if the classifier outputs 0, determining that the oven to be tested has no fault, and if the classifier outputs 1, determining that the oven to be tested has fault.
The invention has the beneficial effects that: the invention can realize the fault diagnosis of the oven based on the high temperature condition of the oven, the temperature fluctuation condition within a certain time and the temperature fluctuation conditions of different heating points, and has higher diagnosis accuracy.
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FIG. 1 is a flow chart of the method of the present invention.
Detailed Description
The technical solutions of the present invention are further described in detail below with reference to the accompanying drawings, but the scope of the present invention is not limited to the following.
As shown in fig. 1, a method for diagnosing oven faults based on machine learning includes the following steps:
s1, acquiring temperature information of heating areas of a faultless oven in a plurality of heating states to obtain all faultless oven heating areasTemperature data of the heating area of the fault oven, and characteristic data of each fault-free oven are extracted according to the acquired information to form a characteristic data set PA
S2, acquiring temperature information of the heating areas of the faulty ovens in a plurality of heating states to obtain temperature data of the heating areas of the faulty ovens, extracting characteristic data of each faulty oven according to the acquired information to form a characteristic data set PB
S3, characteristic data set P is subjected toAIs added with a label y of 0, and the feature data set P is addedBThe tag y of each feature data in (1);
s4, adopting a machine learning method to construct a classifier and carrying out root feature data set PAAnd a feature data set PBTraining the classifier by the data to obtain a trained classifier;
and S5, carrying out fault diagnosis on the oven to be detected based on the trained classifier, and judging whether the oven to be detected has faults or not.
The step S1 includes the sub-steps of:
s101, for any fault-free oven, arranging a temperature detection array in a heating area of the fault-free oven, wherein the temperature detection array comprises m rows and n columns of m × n temperature sensors; starting a fault-free oven, and entering a heating state after the fault-free oven is preheated for a set time;
s102, temperature acquisition is carried out on a heating area of the faultless oven in a heating state by using a temperature detection array, and an obtained temperature information matrix KA
Figure BDA0003156445740000061
Wherein,
Figure BDA0003156445740000062
the signal is acquired by a temperature sensor in the ith row and the jth column, i is 1,2, and m, j is 1,2, n;
s103, calculating a temperature information matrix KAAverage value of temperature in
Figure BDA0003156445740000063
Figure BDA0003156445740000064
Calculating the discrete degree p of the detection results of different temperature sensorsA
Figure BDA0003156445740000065
S104, repeatedly executing the steps S102 to S103 for T times at different moments in the heating state of the fault-free oven to obtain T temperature average values
Figure BDA0003156445740000066
And calculating T discrete degrees
Figure BDA0003156445740000067
Wherein
Figure BDA0003156445740000068
Represents the average temperature value obtained by the t repeated execution process,
Figure BDA0003156445740000069
represents the discrete degree obtained by the repeated execution process for the T time, wherein T is 1, 2.
S105, constructing characteristic data of the fault-free oven
Figure BDA00031564457400000610
S106, repeating the steps S101 to S105 for each fault-free oven to obtain corresponding characteristic data
Figure BDA00031564457400000611
Forming a feature data set PA
Figure BDA00031564457400000612
Where M represents the total number of non-faulty ovens.
The step S2 includes the following sub-steps:
s201, for any fault oven, arranging a temperature detection array in a heating area of the fault oven, wherein the temperature detection array comprises m rows and n columns of m × n temperature sensors; starting a fault oven, and entering a heating state after the fault oven is preheated for a set time;
s202, temperature acquisition is carried out on a heating area of the fault oven in a heating state by using a temperature detection array, and an obtained temperature information matrix KB
Figure BDA0003156445740000071
Wherein,
Figure BDA0003156445740000072
the signal is acquired by a temperature sensor in the ith row and the jth column, i is 1,2, and m, j is 1,2, n;
s203, calculating a temperature information matrix KBAverage value of temperature in
Figure BDA0003156445740000073
Figure BDA0003156445740000074
Calculating the discrete degree p of the detection results of different temperature sensorsB
Figure BDA0003156445740000075
S204, repeatedly executing the steps S202 to S203 for T times at different moments in the heating state of the fault oven to obtain T temperature average values
Figure BDA0003156445740000076
And calculating T discrete degrees
Figure BDA0003156445740000077
Wherein
Figure BDA0003156445740000078
Represents the average temperature value obtained by the t repeated execution process,
Figure BDA0003156445740000079
represents the discrete degree obtained by the repeated execution process for the T time, wherein T is 1, 2.
S205, constructing characteristic data of a fault oven
Figure BDA00031564457400000710
S206, for each fault oven, repeating the steps S201 to S205 to obtain corresponding characteristic data
Figure BDA00031564457400000711
Forming a feature data set PB
Figure BDA00031564457400000712
Where N represents the total number of failed ovens.
In step S4, the feature data set P is extractedAAnd a feature data set PBThe feature data in the method is used as the input of a classifier, the label corresponding to the feature data is used as the expected output of the classifier to realize the training of the classifier, and a feature data set P is adoptedAAnd a feature data set PBTraining each feature data to obtain a mature classifier;
the step S5 includes:
s501, for an oven to be tested, arranging a temperature detection array in a heating area of the oven, wherein the temperature detection array comprises m rows and n columns of m × n temperature sensors; starting the oven to be tested, and entering a heating state after the oven to be tested is preheated for a set time;
s502, temperature acquisition is carried out on a heating area of the oven to be detected in a heating state by using a temperature detection array, and an obtained temperature information matrix KC
Figure BDA0003156445740000081
Wherein,
Figure BDA0003156445740000082
the signal is acquired by a temperature sensor in the ith row and the jth column, i is 1,2, and m, j is 1,2, n;
s503, judging whether temperature information larger than a set threshold exists in the signals collected by the temperature sensors:
if the temperature information larger than the set threshold exists, monitoring the temperature sensor corresponding to the temperature information within the duration h seconds, if the temperature value output by the temperature sensor within the h seconds does not recover below the set threshold, judging that the oven to be tested is in failure, and if the temperature value output by the temperature sensor within the h seconds recovers below the set threshold, entering the step S504;
if the temperature information larger than the set threshold does not exist, directly entering step S504;
s504, calculating a temperature information matrix KCAverage value of temperature in
Figure BDA0003156445740000083
Figure BDA0003156445740000084
Calculating the discrete degree p of the detection results of different temperature sensorsC
Figure BDA0003156445740000085
S505, repeatedly executing the steps S502 to S504 for T times at different moments of the oven to be tested in the heating state to obtain T temperature average values
Figure BDA0003156445740000086
And calculating T discrete degrees
Figure BDA0003156445740000087
Wherein
Figure BDA0003156445740000088
Represents the average temperature value obtained by the t repeated execution process,
Figure BDA0003156445740000089
represents the discrete degree obtained by the repeated execution process for the T time, wherein T is 1, 2.
S205, establishing characteristic data of the oven to be tested
Figure BDA00031564457400000810
S206. calculation
Figure BDA00031564457400000811
Degree of dispersion Q:
Figure BDA00031564457400000812
wherein,
Figure BDA00031564457400000813
judging whether the dispersion degree Q is larger than a preset threshold value:
if so, determining that the oven to be tested has a fault;
if not, go to step S207;
s207, feature data are combined
Figure BDA0003156445740000091
And sending the data into a classifier with mature training, if the classifier outputs 0, determining that the oven to be tested has no fault, and if the classifier outputs 1, determining that the oven to be tested has fault.
The above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; the above description of the embodiments is only intended to facilitate the understanding of the method of the invention and its core ideas; meanwhile, for a person skilled in the art, according to the idea of the present invention, certain modifications or substitutions may be made in the specific embodiments and the application scope; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.

Claims (4)

1. A machine learning-based oven fault diagnosis method is characterized in that: the method comprises the following steps:
s1, collecting temperature information of heating areas of a plurality of fault-free ovens in a heating state to obtain temperature data of each heating area of the fault-free ovens, extracting characteristic data of each fault-free oven according to the collected information to form a characteristic data set PA
S2, acquiring temperature information of the heating areas of the faulty ovens in a plurality of heating states to obtain temperature data of the heating areas of the faulty ovens, extracting characteristic data of each faulty oven according to the acquired information to form a characteristic data set PB
S3, characteristic data set P is subjected toAIs added with a label y of 0, and the feature data set P is addedBThe tag y of each feature data in (1);
s4, adopting a machine learning method to construct a classifier, and according to the feature data set PAAnd a feature data set PBTraining the classifier by the data to obtain a trained classifier;
and S5, carrying out fault diagnosis on the oven to be detected based on the trained classifier, and judging whether the oven to be detected has faults or not.
2. The machine learning-based oven fault diagnosis method according to claim 1, characterized in that: the step S1 includes the sub-steps of:
s101, for any fault-free oven, arranging a temperature detection array in a heating area of the fault-free oven, wherein the temperature detection array comprises m rows and n columns of m × n temperature sensors; starting a fault-free oven, and entering a heating state after the fault-free oven is preheated for a set time;
s102, temperature acquisition is carried out on a heating area of the faultless oven in a heating state by using a temperature detection array, and an obtained temperature information matrix KA
Figure FDA0003156445730000011
Wherein,
Figure FDA0003156445730000012
the signal is acquired by a temperature sensor in the ith row and the jth column, i is 1,2, and m, j is 1,2, n;
s103, calculating a temperature information matrix KAAverage value of temperature in
Figure FDA0003156445730000013
Figure FDA0003156445730000014
Calculating the discrete degree p of the detection results of different temperature sensorsA
Figure FDA0003156445730000021
S104, repeatedly executing the steps S102 to S103 for T times at different moments in the heating state of the fault-free oven to obtain T temperature average values
Figure FDA0003156445730000022
And calculating T discrete degrees
Figure FDA0003156445730000023
Wherein
Figure FDA0003156445730000024
Represents the average temperature value obtained by the t repeated execution process,
Figure FDA0003156445730000025
represents the discrete degree obtained by the repeated execution process for the T time, wherein T is 1, 2.
S105, constructing characteristic data of the fault-free oven
Figure FDA0003156445730000026
S106, repeating the steps S101 to S105 for each fault-free oven to obtain corresponding characteristic data
Figure FDA0003156445730000027
Forming a feature data set PA
Figure FDA0003156445730000028
Where M represents the total number of non-faulty ovens.
3. The machine learning-based oven fault diagnosis method according to claim 1, characterized in that: the step S2 includes the following sub-steps:
s201, for any fault oven, arranging a temperature detection array in a heating area of the fault oven, wherein the temperature detection array comprises m rows and n columns of m × n temperature sensors; starting a fault oven, and entering a heating state after the fault oven is preheated for a set time;
s202, utilizing a temperature detection array to detect the fault in a heating stateTemperature acquisition is carried out in the heating area of the oven, and an obtained temperature information matrix KB
Figure FDA0003156445730000029
Wherein,
Figure FDA00031564457300000210
the signal is acquired by a temperature sensor in the ith row and the jth column, i is 1,2, and m, j is 1,2, n;
s203, calculating a temperature information matrix KBAverage value of temperature in
Figure FDA00031564457300000211
Figure FDA00031564457300000212
Calculating the discrete degree p of the detection results of different temperature sensorsB
Figure FDA0003156445730000031
S204, repeatedly executing the steps S202 to S203 for T times at different moments in the heating state of the fault oven to obtain T temperature average values
Figure FDA0003156445730000032
And calculating T discrete degrees
Figure FDA0003156445730000033
Wherein
Figure FDA0003156445730000034
Represents the average temperature value obtained by the t repeated execution process,
Figure FDA0003156445730000035
represents the discrete degree obtained by the repeated execution process for the T time, wherein T is 1, 2.
S205, constructing characteristic data of a fault oven
Figure FDA0003156445730000036
S206, for each fault oven, repeating the steps S201 to S205 to obtain corresponding characteristic data
Figure FDA0003156445730000037
Forming a feature data set PB
Figure FDA0003156445730000038
Where N represents the total number of failed ovens.
4. The machine learning-based oven fault diagnosis method according to claim 1, characterized in that: the step S5 includes:
s501, for an oven to be tested, arranging a temperature detection array in a heating area of the oven, wherein the temperature detection array comprises m rows and n columns of m × n temperature sensors; starting the oven to be tested, and entering a heating state after the oven to be tested is preheated for a set time;
s502, temperature acquisition is carried out on a heating area of the oven to be detected in a heating state by using a temperature detection array, and an obtained temperature information matrix KC
Figure FDA0003156445730000039
Wherein,
Figure FDA00031564457300000310
indicating the ith row and jth column of temperature sensorsThe acquired signals, i 1,2, and m, j 1,2, n;
s503, judging whether temperature information larger than a set threshold exists in the signals collected by the temperature sensors:
if the temperature information larger than the set threshold exists, monitoring the temperature sensor corresponding to the temperature information within the duration h seconds, if the temperature value output by the temperature sensor within the h seconds does not recover below the set threshold, judging that the oven to be tested is in failure, and if the temperature value output by the temperature sensor within the h seconds recovers below the set threshold, entering the step S504;
if the temperature information larger than the set threshold does not exist, directly entering step S504;
s504, calculating a temperature information matrix KCAverage value of temperature in
Figure FDA00031564457300000311
Figure FDA0003156445730000041
Calculating the discrete degree p of the detection results of different temperature sensorsC
Figure FDA0003156445730000042
S505, repeatedly executing the steps S502 to S504 for T times at different moments of the oven to be tested in the heating state to obtain T temperature average values
Figure FDA0003156445730000043
And calculating T discrete degrees
Figure FDA0003156445730000044
Wherein
Figure FDA0003156445730000045
To representThe temperature average value obtained by the process of the t repeated execution,
Figure FDA0003156445730000046
represents the discrete degree obtained by the repeated execution process for the T time, wherein T is 1, 2.
S205, establishing characteristic data of the oven to be tested
Figure FDA0003156445730000047
S206. calculation
Figure FDA0003156445730000048
Degree of dispersion Q:
Figure FDA0003156445730000049
wherein,
Figure FDA00031564457300000410
judging whether the dispersion degree Q is larger than a preset threshold value:
if so, determining that the oven to be tested has a fault;
if not, go to step S207;
s207, feature data are combined
Figure FDA00031564457300000411
And sending the data into a classifier with mature training, if the classifier outputs 0, determining that the oven to be tested has no fault, and if the classifier outputs 1, determining that the oven to be tested has fault.
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