CN113359005B - Clamp and method for testing pin points of PCBA (printed circuit board assembly) - Google Patents

Clamp and method for testing pin points of PCBA (printed circuit board assembly) Download PDF

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Publication number
CN113359005B
CN113359005B CN202110542320.XA CN202110542320A CN113359005B CN 113359005 B CN113359005 B CN 113359005B CN 202110542320 A CN202110542320 A CN 202110542320A CN 113359005 B CN113359005 B CN 113359005B
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pcba
probe
board
testing
fixture
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CN113359005A (en
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涂海涛
薛国荣
冼祖国
梁峰国
蒋三海
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Shenzhen Haichuangjia Technology Co ltd
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Shenzhen Haichuangjia Technology Co ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425Test clips, e.g. for IC's
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00Prospecting or detecting by optical means
    • G01V8/10Detecting, e.g. by using light barriers

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention relates to a fixture and a test method for testing needle points of a PCBA (printed circuit board assembly), wherein the fixture for testing the needle points of the PCBA comprises a lower shell and an upper shell, a first interface needle and a second interface needle are arranged at the bottom of the inner wall of the lower shell, the number of the second interface needles is multiple, the lower shell is movably connected with the upper shell through a hinge and a connecting rod, and a probe board is fixedly connected onto the upper shell through a fixing bolt. The fixture and the test method for testing the pin points of the PCBA have the advantages that due to the fact that the infrared emitter and the infrared receiver are adopted, compared with the prior art, the infrared emitter and the infrared receiver are used, the pin points which are obviously unstable in connection or not welded are detected firstly, the qualified PCBA is detected, and then ICT is used for detection, time is saved, different PCBA can be conveniently detected by replacing different probe plates, and resources are saved.

Description

Clamp and method for testing pin points of PCBA (printed circuit board assembly)
Technical Field
The invention relates to the technical field of PCBA testing, in particular to a fixture and a testing method for testing pins of a PCBA board.
Background
PCBA (Printed Circuit Board Assembly) refers to the whole process of PCB blank Board passing through SMT loading or DIP plug-in. The pin point test is a branch of the PCBA test, and mainly tests the continuity of PAD points (some welding points of electronic components to be welded on the PCB), pins (which are used for welding some electronic components with pins, such as resistors, and the shapes are often holes), gold fingers (which refer to large copper points on the PCB), and other related functional tests.
In-circuit testers (ICTs) are widely used in the PCBA process industry for their excellent testing and inspection performance. The ICT can find problems with solder and components in the PCBA. It has high speed and high stability.
Where electrical probes are used to test Printed Circuit Boards (PCBs) for short circuits, open circuits, resistors, capacitors and other basic quantities to show whether the assembly is manufactured correctly. However, during detection, different probe cards cannot be replaced according to different detection points, different clamps need to be purchased, resources are wasted, the use is not simple and convenient, and for the needle points which are obviously unstable in connection or are not welded, ICT is directly used for detection, and time and resources are wasted.
Disclosure of Invention
Technical problem to be solved
In view of the above disadvantages and shortcomings of the prior art, the present invention provides a fixture for testing pin points of a PCBA board and a testing method thereof, which solve the technical problems that a probe board is fixed on the fixture, which is inconvenient to replace, and no pin points are soldered or soldered and broken, and ICT is directly performed without screening, which wastes resources.
(II) technical scheme
In order to achieve the purpose, the invention adopts the main technical scheme that:
in a first aspect, an embodiment of the present invention provides a fixture for testing pin points of a PCBA board, including a lower housing and an upper housing, wherein a first interface pin and a second interface pin are disposed at a bottom of an inner wall of the lower housing, a plurality of second interface pins are provided, the lower housing is movably connected to the upper housing through a hinge and a connecting rod, the upper housing is fixedly connected to a probe board through a fixing bolt, the probe board is provided with a first probe and a second probe, the upper housing is provided with a placing groove, the probe board is clamped in the placing groove, the placing groove is fixedly connected to elastic pressure bars, the four elastic pressure bars are uniformly distributed on a terminal of the placing groove, four elastic pressure bars are provided with a limiting pressure bar, the four limiting pressure bars are fixedly connected to the same limiting pressure bar, the PCBA board is clamped on the support board, two sides of a top of the support board are respectively provided with an infrared emitter and an infrared receiver, the first interface pin is connected to a device power supply terminal through a first wire, the first probe is connected to a device power supply through a second wire, and the second probe is connected to a second interface pin through a third wire.
According to the clamp for testing the pin points of the PCBA, the contact surfaces of the probes on the probe board and the pin points of the PCBA are protected through the arrangement of the elastic pressing rods and the limiting pressing rods, the abrasion of the probes is reduced, the first probes, the second probes, the first interface pins, the second interface pins and the equipment power supply terminal form a loop through the arrangement of the first conducting wires, the second conducting wires and the third conducting wires, and whether the PCBA is short-circuited or open-circuited or not, and the resistance, the capacitance and other basic quantities can be checked to display whether the assembly is manufactured correctly or not.
Optionally, a first fixing block is fixedly connected to the support plate, a second fixing block is fixedly connected to the upper shell, a first movable groove and a second movable groove are respectively formed in the first fixing block and the second fixing block, an adjusting rod is rotatably connected to the second fixing block, a fixing rod is fixedly connected to the adjusting rod, and the other end of the fixing rod is clamped in the first movable groove. Under the combined action of the first fixing block, the second fixing block, the first movable groove, the second movable groove, the adjusting rod and the like, the first fixing block and the second fixing block can be fixed together, and therefore the PCBA board can be stably contacted with the probe.
Optionally, the carrier plate is made of an antistatic material.
In a second aspect, embodiments of the present invention provide a method of testing a fixture for testing pin points on a PCBA board, including,
s1: selecting a probe board suitable for a PCBA board, and fixing the probe board in a placing groove on the upper shell through a fixing bolt;
s2: connecting the first probe with the equipment power supply terminal by using a second lead, and then connecting the second probe with the second interface pin by using a third lead;
s3: placing the carrier plate with the PCBA board above the placing groove, and pressing the carrier plate downwards to enable the probes to be in contact with the needle points on the PCBA board;
s4: the needle points on the PCBA board are detected using an infrared transmitter and an infrared receiver.
And S4, detecting whether the needle point has obvious unconnected stable traces or not, and detecting by using ICT after the needle point is qualified.
According to the test method of the fixture for testing the pin points of the PCBA, provided by the embodiment of the invention, different positions on the PCBA can be detected by installing different probe plates, and PCBAs with different pin points can also be detected, so that the detection is more convenient.
Alternatively, the probes on the probe card may be shaped as 30 ° sharp needles, two-jaw needles, blunt needles, 4-jaw or 7-jaw needles.
Different probe shapes can detect different needle points. A30-degree pointed needle or two-claw needle is usually selected for detecting the PAD point, a blunt needle or 4-claw and 7-claw needles is usually selected for pins, a pointed needle or 2-claw needles is usually selected for golden fingers, and the shape of the probe can be selected according to actual requirements.
(III) advantageous effects
The invention has the beneficial effects that: according to the fixture and the testing method for testing the pin points of the PCBA, due to the fact that the infrared emitter and the infrared receiver are adopted, compared with the prior art, the infrared emitter and the infrared receiver are used, the pin points which are obviously unstable in connection or not welded are detected, the qualified PCBA is detected, and then ICT is used for detecting, time is saved, different PCBA boards can be conveniently detected by replacing different probe boards, and resources are saved.
Drawings
FIG. 1 is a schematic front view of a fixture and a test method for testing pins of a PCBA board according to an embodiment 1 of the present invention;
FIG. 2 is an enlarged schematic view of the structure at A in FIG. 1;
fig. 3 is a schematic perspective view of the present invention.
[ description of reference ]
1. An upper housing; 2. an equipment power terminal; 3. a lower housing; 4. a first conductive line; 5. a first interface pin; 6. a second interface pin; 7. a second conductive line; 8. a second probe; 9. a first probe; 10. PCBA board; 11. a carrier plate; 12. an infrared emitter; 13. an infrared receiver; 14. a second fixed block; 15. a first fixed block; 16. a first movable slot; 17. a second movable slot; 18. adjusting a rod; 19. elastic pressing rods; 20. and limiting the pressing rod.
Detailed Description
For a better understanding of the present invention, reference will now be made in detail to the present embodiments of the invention, which are illustrated in the accompanying drawings. In which the terms "upper", "lower", etc. are used herein with reference to the orientation of fig. 1.
According to the infrared transmitter 12 and the infrared receiver 13 provided by the embodiment of the invention, the pin points which are obviously connected and are unstable or not welded are detected, the qualified PCBA board 10 is detected, and ICT is used for detection, so that the time is saved, the contact surfaces of the pins of the probe board and the pin points of the PCBA board 10 are protected through the arrangement of the elastic pressing rod 19 and the limiting pressing rod 20, the abrasion of the probes is reduced, and the first probe 9, the second probe 8, the first interface pin 5, the second interface pin 6 and the equipment power supply terminal 2 form a loop through the arrangement of the first lead 4, the second lead 7 and the third lead, so that whether the PCBA board 10 is short-circuited or open-circuited or not and whether the resistance, the capacitance and other basic quantities are detected to show whether the assembly is manufactured correctly or not.
In order to better understand the above technical solutions, exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the invention are shown in the drawings, it should be understood that the invention can be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
Detailed description of the preferred embodiments
Example 1:
referring to fig. 1, 2 and 3, a fixture for testing pin points of a PCBA board, comprises a lower housing 3 and an upper housing 1, the bottom of the inner wall of the lower shell 3 is provided with a first interface needle 5 and a second interface needle 6, the number of the second interface needles 6 is multiple, the lower shell 3 is movably connected with an upper shell 1 through a hinge and a connecting rod, the upper shell 1 is fixedly connected with a probe card through a fixing bolt, the probe card is provided with a first probe 9 and a second probe 8, the upper shell 1 is provided with a placing groove, the probe board is clamped in the placing groove, an elastic pressure rod 19 is fixedly connected in the placing groove, the number of the elastic pressing rods 19 is four, the four elastic pressing rods 19 are uniformly distributed at four corners of the placing groove, the four elastic pressing rods 19 are all provided with limiting pressing rods 20, the four limiting pressing rods 20 are fixedly connected with the same carrier plate 11, the carrier plate 11 is made of antistatic material, the PCBA board 10 is clamped on the carrier plate 11, an infrared emitter 12 and an infrared receiver 13 are respectively arranged on two sides of the top of the carrier plate 11, the first interface pin 5 is connected with the equipment power terminal 2 through a first lead wire 4, the first probe 9 is connected with the equipment power terminal 2 through a second lead wire 7, the second probe 8 is connected with the second interface pin 6 through a third lead wire, through the arrangement of the infrared emitter 12 and the infrared receiver 13, the infrared emitter 12 and the infrared receiver 13 are used for detecting the needle points which are obviously connected unstably or not welded to detect the qualified PCBA board 10, and then the ICT is used for detecting, so that the time is saved, through changing different probe cards, different PCBA boards 10 are conveniently detected, and resources are saved.
The utility model discloses a PCBA probe card, including support plate 11, last fixedly connected with first fixed block 15 of fixedly connected with, go up fixedly connected with second fixed block 14 on the casing 1, first movable groove 16 and second movable groove 17 have been seted up on first fixed block 15 and the second fixed block 14 respectively, it is connected with regulation pole 18 to rotate on the second fixed block 14, fixedly connected with dead lever on the regulation pole 18, the other end joint of dead lever is in first movable groove 16, under the combined action of first fixed block 15, second fixed block 14, first movable groove 16, second movable groove 17 and regulation pole 18 etc., can make first fixed block 15 and second fixed block 14 fix together to can make PCBA board 10 and probe carry out the stationary contact.
Example 2:
referring to fig. 1 and 2, a method of testing a fixture for testing pin points of a PCBA board, comprises,
s1: selecting a probe board suitable for a PCBA board 10, fixing the probe board in a placing groove on an upper shell 1 through a fixing bolt, wherein probes on the probe board can be 30-degree sharp needles, two-claw needles, blunt needles, 4 claws or 7-claw needles, the probes can detect different needle points in different shapes, 30-degree sharp needles or two-claw needles are usually selected for detecting PAD points, blunt needles or 4 claws or 7-claw needles are usually selected for pins, sharp needles or 2-claw needles are usually selected for golden fingers, and the shapes of the probes can be selected according to actual requirements;
s2: connecting the first probe 9 with the equipment power terminal 2 by using a second lead wire 7, and then connecting the second probe 8 with the second interface pin 6 by using a third lead wire;
s3: placing the carrier plate 11 with the PCBA board 10 above the placing groove, pressing the carrier plate 11 downwards, and enabling the probes to be in contact with the needle points on the PCBA board 10 under the limiting and buffering effects of the limiting pressing rod 20 and the elastic pressing rod 19;
s4: during detection, the infrared emitter 12 and the infrared receiver 13 are used for detecting the needle points on the PCBA board 10, whether the needle points have obvious unconnected stable traces or not is determined, and ICT is used for detecting after the needle points are qualified.
Before detection, the adjusting rod 18 can be rotated to slide the adjusting rod 18 from the second movable groove 17 into the first movable groove 16, so that the adjusting rod 18 can be fixed in the second fixed groove, and the contact point between the probe and the needle point can be relatively stable.
In the description of the present invention, it is to be understood that the terms "first", "second", and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or to imply that the number of technical features indicated are in fact significant. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium; either as communication within the two elements or as an interactive relationship of the two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the present invention, unless otherwise expressly stated or limited, a first feature may be "on" or "under" a second feature, and the first and second features may be in direct contact, or the first and second features may be in indirect contact via an intermediate. Also, a first feature "on," "above," and "over" a second feature may be directly or obliquely above the second feature, or simply mean that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the second feature, or may simply mean that the first feature is at a lower level than the second feature.
In the description of the present specification, the description of "one embodiment", "some embodiments", "examples", "specific examples" or "some examples", etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Moreover, various embodiments or examples and features of various embodiments or examples described in this specification can be combined and combined by one skilled in the art without being mutually inconsistent.
Although embodiments of the present invention have been shown and described above, it should be understood that the above embodiments are illustrative and not restrictive, and that those skilled in the art may make changes, modifications, substitutions and alterations to the above embodiments without departing from the scope of the present invention.

Claims (6)

1. A fixture for testing the needle points of PCBA boards comprises a lower shell (3) and an upper shell (1), and is characterized in that a first interface needle (5) and a second interface needle (6) are arranged at the bottom of the inner wall of the lower shell (3), a plurality of second interface needles (6) are arranged, the lower shell (3) is movably connected with the upper shell (1) through a hinge and a connecting rod, a probe board is fixedly connected onto the upper shell (1) through a fixing bolt, a first probe (9) and a second probe (8) are arranged on the probe board, a placing groove is formed in the upper shell (1), the probe board is clamped in the placing groove, different PCBA boards (10) are conveniently detected by replacing different probe boards, an elastic pressure rod (19) is fixedly connected into the placing groove, the number of the elastic pressure rods (19) is four, the four elastic pressure rods (19) are uniformly distributed in four corners of the placing groove, a limiting pressure rod (20) is arranged on the four elastic pressure rods (19), the four limiting pressure rods (20) are fixedly connected with the same limiting pressure rod (11), an infrared emitter (11) and an infrared receiver (12) and an infrared receiver (13) are respectively welded on the top of the same PCBA board, and an infrared receiver (13) are connected with an infrared emitter (12) and a carrier board, and a receiver, the first interface needle (5) is connected with an equipment power terminal (2) through a first lead (4), the first probe (9) is connected with the equipment power terminal (2) through a second lead (7), and the second probe (8) is connected with the second interface needle (6) through a third lead.
2. A fixture for testing pins of a PCBA board, as claimed in claim 1, wherein: the support plate is characterized in that a first fixing block (15) is fixedly connected to the support plate (11), a second fixing block (14) is fixedly connected to the upper shell (1), and a first movable groove (16) and a second movable groove (17) are formed in the first fixing block (15) and the second fixing block (14) respectively.
3. A fixture for testing pins of a PCBA board, as claimed in claim 2, wherein: the second fixing block (14) is rotatably connected with an adjusting rod (18), the adjusting rod (18) is fixedly connected with a fixing rod, and the other end of the fixing rod is clamped in the first movable groove (16).
4. A fixture for testing pins of a PCBA board, as claimed in claim 1, wherein: the material of the carrier plate (11) is made of an antistatic material.
5. A method of testing a fixture for testing pin points of a PCBA board as claimed in any one of claims 1 to 4, comprising,
s1: selecting a probe board suitable for the PCBA board (10), and fixing the probe board in a placing groove on the upper shell (1) through a fixing bolt;
s2: connecting the first probe (9) to the device power terminal (2) using a second wire (7), and then connecting the second probe (8) to the second interface pin (6) using a third wire;
s3: placing the carrier plate (11) with the PCBA (10) above the placing groove, and pressing the carrier plate (11) downwards to make the probes contact with the needle points on the PCBA (10);
s4: the pin points on the PCBA board (10) are detected by using an infrared transmitter (12) and an infrared receiver (13), whether the pin points have obvious unconnected stable marks or not is confirmed, and the pins are detected by using ICT after being qualified.
6. A method of testing a fixture for testing pins of a PCBA board as recited in claim 5, wherein: the probes on the probe board are in the shapes of 30-degree sharp needles, two-claw needles, blunt needles, 4-claw needles or 7-claw needles.
CN202110542320.XA 2021-05-18 2021-05-18 Clamp and method for testing pin points of PCBA (printed circuit board assembly) Active CN113359005B (en)

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